Integrated three-temperature memory testing machine

Abstract

The utility model discloses an integrated three-temperature memory testing machine. The integrated three-temperature memory testing machine comprises a testing cabinet, an airflow instrument, an air blowing module, a heat shield, a tester and an electric control system, the airflow instrument and the electric control system are arranged in the test cabinet, the tester is arranged on the test cabinet, the tester is sleeved with a heat shield, the heat shield, the blowing module and the airflow instrument are sequentially communicated, and the electric control system is connected with the airflow instrument and the tester; according to the integrated three-temperature memory testing machine, an integrated scheme is adopted, the low-medium-high airflow instrument, the tester and the electric control system are integrated in the testing cabinet, and the blowing module and the heat shield are carried to impact a tested device with high-speed gas, so that low-medium-high environment temperature control is realized; therefore, the manual single-machine small-sized three-temperature memory testing machine is miniaturized, modularized, capable of being operated by a single machine and comprehensive in function, and fills the blank that no small-sized three-temperature memory testing machine exists in the market.

Description

Technical Field

[0001] The utility model belongs to the technical field of memory testing, and more specifically, it belongs to an integrated three-temperature memory testing machine. Background Art

[0002] In the field of memory testing, a memory testing machine is a device for testing the performance and lifespan of memory chips or memory modules. The test environment temperature has a significant impact on the test results, and there is an increasing demand in the industry for testing machines equipped with three-temperature devices (used to control the temperature of the test environment and achieve three relative temperatures: low temperature - medium temperature - high temperature).

[0003] Common memory testing machines are usually very large in size, and the supporting three-temperature devices for such memory testing machines are generally also very large in volume. They are only suitable for large-scale automated equipment and cannot meet the needs of laboratory single-machine small-scale platforms. Currently, there is a gap in the market for manual single-machine small-scale memory testing machines with three-temperature incubators. Summary of the Utility Model

[0004] In view of this, the purpose of the present utility model is to overcome the deficiencies in the prior art and provide an integrated three-temperature memory testing machine. The present application provides the following technical solutions:

[0005] An integrated three-temperature memory testing machine includes a test cabinet, an airflow meter, a blowing module, a heat insulation cover, a tester, and an electric control system;

[0006] The airflow meter and the electric control system are arranged inside the test cabinet. The tester is arranged on the test cabinet, and a heat insulation cover is sleeved on the tester. The heat insulation cover, the blowing module, and the airflow meter are connected in sequence, and the electric control system is respectively connected to the airflow meter and the tester.

[0007] In a possible embodiment, a movable support arm is arranged on the test cabinet, and the movable support arm is connected to the blowing module to adjust the position of the blowing module through the movable support arm.

[0008] In a possible embodiment, a display is further arranged on the test cabinet, and the display is connected to the electric control system.

[0009] In a possible embodiment, an air dryer is further included. The air dryer is arranged inside the test cabinet, the air dryer is connected to the airflow meter, and the electric control system is connected to the air dryer.

[0010] In a possible embodiment, the airflow meter is connected to the blowing module through an air delivery pipe.

[0011] In a possible embodiment, the electronic control system includes a computer and an electronic control box, and the computer and the electronic control box are arranged inside the test cabinet.

[0012] In summary, due to the adoption of the above technical solutions, the beneficial effects of the present utility model are as follows:

[0013] The integrated three-temperature memory tester of the present utility model adopts an integrated solution, integrating low, medium, and high airflow meters, a tester, and an electronic control system inside the test cabinet, and is equipped with a blowing module and a heat insulation cover to impact the device under test with high-speed gas, realizing the control of low, medium, and high ambient temperatures. Therefore, the present utility model is a small-sized, modular, single-machine-operable, and fully functional manual single-machine small three-temperature memory tester, filling the gap in the market where there is no small three-temperature memory tester.

[0014] To make the above objects, features, and advantages of the present application more obvious and understandable, the following specifically enumerates preferred embodiments and, in conjunction with the accompanying drawings, makes the following detailed description. Description of the Drawings

[0015] To more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings required for use in the embodiments. It should be understood that the following drawings only show some embodiments of the present utility model, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other related drawings can also be obtained based on these drawings.

[0016] Figure 1 is a three-dimensional structural schematic diagram of the present utility model.

[0017] Figure 2 is a three-dimensional structural schematic diagram of the present utility model from another perspective.

[0018] Reference numerals: 1 - test cabinet; 2 - airflow meter; 3 - blowing module; 4 - heat insulation cover; 5 - tester; 6 - electronic control system; 7 - display; 8 - air dryer; 9 - movable support arm; 10 - air delivery pipe. Detailed Embodiments

[0019] The following details the embodiments of the present application. The examples of the embodiments are shown in the drawings, where the same or similar reference numerals represent the same or similar elements or elements with the same or similar functions from beginning to end. The embodiments described below with reference to the drawings are exemplary and are only used to explain the present application and should not be construed as limiting the present application.

[0020] In this application, unless otherwise clearly specified or limited, terms such as "installed", "connected", "linked", "fixed", etc. shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0021] In this application, unless otherwise clearly specified or limited, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may mean that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "beneath" and "underneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.

[0022] Please refer to Figure 1-2 As shown, an integrated three-temperature memory tester provided in this embodiment includes a test cabinet 1, an air flow meter 2, a blowing module 3, a heat shield 4, a tester 5 and an electric control system 6; the air flow meter 2 and the electric control system 6 are arranged in the test cabinet 1, the tester 5 is arranged on the test cabinet 1, a heat shield 4 is sleeved on the tester 5, the heat shield 4, the blowing module 3 and the air flow meter 2 are connected in sequence, and the electric control system 6 is respectively connected to the air flow meter 2 and the tester 5.

[0023] An active support arm 9 is arranged on the test cabinet 1, and the active support arm 9 is connected to the blowing module 3 to adjust the position of the blowing module 3 through the active support arm 9; a display 7 is also arranged on the test cabinet 1, and the display 7 is connected to the electric control system 6; the air flow meter 2 is communicated with the blowing module 3 through an air delivery pipe 10; the electric control system 6 includes a computer and an electric control box, and the computer and the electric control box are arranged in the test cabinet 1.

[0024] In the above embodiment, as Figure 1The following is a three-dimensional structural schematic diagram of the present utility model. The integrated three-temperature memory tester of the present utility model comprises a test cabinet 1, a tester 5, an airflow meter 2, a blowing module 3, an electric control system 6 and a display 7. Among them, the test cabinet 1 is used to carry the entire device, the tester 5 is installed on the test cabinet 1, and there can be various models of the tester 5. By equipping different models of test boards, the testing of different memory particles can be achieved. The test board is installed in the test cabinet 1. Just by connecting the power connector of the electric control system 6 in the test cabinet 1, the working state can be achieved. At the same time, the test board is convenient to change models. Only need to remove the screws fixing the test board, disconnect the power connector and communication connection, and then lift it by hand.

[0025] An air flow meter 2 is installed inside the test cabinet 1. The air flow meter 2 is a device commonly used in the prior art for high, medium, and low temperature shock tests on semiconductor devices. Its working principle is to use a compressed air machine to produce high or low temperature gases, and the high-speed gases directly impact the device under test to achieve high, medium, and low temperature control. The air flow meter 2 is installed inside the test cabinet. An air delivery pipe 10 is installed on the air flow meter 2. The air delivery pipe 10 extends from the inside of the test cabinet 1 through the upper panel of the test cabinet 1 and is connected to the blowing module 3. The blowing module 3 supplies gas in the vertical direction up and down. In other possible embodiments, the blowing module 3 can also be a cabinet that supplies gas to the test board in the horizontal direction. It can provide a three-temperature environment by covering the heat insulation cover 4 over a specific test area in a flip-up or drawer-pull manner. The blowing module 3 of this embodiment is installed on the test cabinet through a movable support arm 9 and can be moved to any position to meet the test requirements of different test areas of different test motherboards. A heat insulation cover 4 is provided below the blowing module 3. When testing, the heat insulation cover 4 is covered on the test area. The present utility model can replace the corresponding heat insulation cover 4 according to the size of the test area required by different motherboard test modules, and can also correspond to different heat insulation covers 4 according to different products to be tested. For example, the product to be tested can be a memory module or a memory chip. At the same time, the entire set of equipment is equipped with a corresponding electronic control system 6 and a display 7. The display 7 is set on the test cabinet. The electronic control system 6 includes a computer and an electronic control box, which are installed inside the test cabinet and are used to control the communication and power connection of each device. Therefore, the integrated three-temperature memory tester of the present utility model adopts an integrated solution, integrating the low, medium, and high air flow meters 2, the tester 5, and the electronic control system 6 inside the test cabinet 1, and is equipped with the blowing module 3 and the heat insulation cover 4 to impact the device under test with high-speed gases to achieve low, medium, and high environmental temperature control. Therefore, the present utility model is a small, modular, single-machine-operable, and fully functional manual single-machine small three-temperature memory tester, filling the gap in the market for the lack of small three-temperature memory testers. At the same time, the integrated three-temperature memory tester meets the multi-scenario use requirements. One device can meet the memory test, reducing the messy placement of equipment and forming a whole. The electronic control box inside can integrate all the power consumption requirements in the machine table and distribute the power required by each electrical component in the equipment, making the equipment more concise, reducing wiring, and working more stably.

[0026] When using the present utility model, insert the memory module to be tested into the slot of the tester 5, move the blowing module 3 of the air flow meter 2 to cover the heat insulation cover 4 over the memory tester 5 area, operate the computer, start the memory test software, select the test program as needed, select the appropriate test environment temperature, the air flow meter 2 starts to introduce high-speed gases to ensure the test environment temperature, and start the test. After the test is completed, move the heat insulation cover 4 away and take out the memory module.

[0027] In an alternative solution of the above embodiment, an air dryer 8 is further included. The air dryer 8 is disposed in the test cabinet 1. The air dryer 8 is communicated with the air flow meter 2, and the electric control system 6 is connected to the air dryer 8.

[0028] In this alternative solution, the present utility model further provides an air dryer 8 in the test cabinet 1. Since the air flow meter 2 has high requirements for the dryness and cleanliness of the input gas, if compressed air that does not meet the standard requirements is introduced, condensation will form at the air outlet end, causing damage to the test board. Therefore, the present utility model integrates the air dryer 8 in the test cabinet 1 and connects it to the air flow meter 2. Therefore, the present utility model is applicable to some sites where there is no compressed air condition that meets the standard requirements, greatly expanding the applicable range of the device.

[0029] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present application. Those of ordinary skill in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present application.

Claims

1. An integrated three-temperature memory tester, characterized in that: It includes a test cabinet, an air flow meter, a blowing module, a heat shield, a tester and an electric control system; The air flow meter and the electric control system are arranged inside the test cabinet, the tester is arranged on the test cabinet, a heat shield is sleeved on the tester, the heat shield, the blowing module and the air flow meter are communicated in sequence, and the electric control system is respectively connected to the air flow meter and the tester.

2. An integrated three-temperature memory tester according to claim 1, characterized in that: A movable support arm is arranged on the test cabinet, and the movable support arm is connected to the blowing module to adjust the position of the blowing module through the movable support arm.

3. An integrated three-temperature memory tester according to claim 1, characterized in that: A display is further arranged on the test cabinet, and the display is connected to the electric control system.

4. An integrated three-temperature memory tester according to claim 1, characterized in that: It further includes an air dryer, the air dryer is arranged inside the test cabinet, the air dryer is communicated with the air flow meter, and the electric control system is connected to the air dryer.

5. An integrated three-temperature memory tester according to claim 1, characterized in that: The air flow meter is communicated with the blowing module through an air delivery pipe.

6. The integrated three-temperature memory tester according to claim 1, characterized in that: The electric control system includes a computer and an electric control box, and the computer and the electric control box are arranged inside the test cabinet.

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