Test probe and test system comprising same

Abstract

The utility model discloses a test probe, which is used for being connected with a connector terminal and comprises a first probe, a second probe and a third probe, and the first probe sequentially comprises a first guide section, a first pressing part and a first connecting section along the length direction of the first probe; the second probe and the first probe are correspondingly arranged, and the second probe sequentially comprises a second guiding section, a second pressing part and a second connecting section in the length direction of the second probe; the fixing piece is used for connecting the first connecting section and the second connecting section; wherein the first pressing part and the second pressing part are close to each other and are used for being in contact with a connector terminal, and a first gap is formed between the first connecting section and the second connecting section. According to the utility model, the contact impedance can be eliminated, the test precision is improved, and the qualified rate of products is improved. The utility model also discloses a test system comprising the test probe.

Description

Technical Field

[0001] The utility model relates to the technical field of circuit board testing, and particularly relates to a test probe and a test system including the same. Background Art

[0002] With the continuous progress and development of society, various technical levels are constantly improving. Flexible printed circuit boards are favored due to their excellent characteristics such as light weight, thin thickness, convenient installation, and free bending and folding. By embedding circuit designs on flexible and thin plastic sheets, a large number of precision components can be stacked and embedded in narrow and limited spaces, thus forming flexible circuits.

[0003] After the production of flexible printed circuit boards, testing is required to check whether the resistance values of the product circuits are qualified. Currently, the testing of flexible printed circuit boards is generally carried out through connectors. By connecting the flexible printed circuit board to the connector and the connector to the testing instrument, the testing instrument can perform circuit testing on the flexible printed circuit board. As Figure 1 shown, Figure 1 is a connector in the prior art. The connector 101 has multiple connector terminals 102, and the testing instrument end is provided with multiple test probes 103. Among them, the connector 101 is connected to the flexible circuit board to be detected so that the internal circuits of the two are connected. By connecting the probe 103 to the connector terminal 102, the testing instrument can complete the circuit testing of the flexible printed circuit board.

[0004] In the prior art, when measuring resistance values, there are two testing methods for the testing system: one is the four-wire testing method, in which two wires are connected to each end of the resistor. Specifically, the test signal is introduced into two of the wires, and the other two wires return the signal; the other is the two-wire testing method, in which one wire is connected to each end of the resistor, and the resistance value between the two wires is measured. Since the two-wire testing method will generate contact resistance and the measurement accuracy is low, while the four-wire testing method can eliminate contact resistance and the measurement is more accurate, the four-wire testing method is currently more commonly used.

[0005] Currently, the probe 103 connected to the connector terminal 102 is cylindrical. By sleeving the probe 103 on the connector terminal 102, the electrical connection with the connector 101 is realized. This probe 103 is actually a wire and cannot achieve four-wire testing, resulting in low testing accuracy. Summary of the Utility Model

[0006] In view of this, the utility model aims to provide a test probe and a test system including the same, which can eliminate contact impedance, improve testing accuracy, and improve the qualification rate of products.

[0007] To solve the above technical problems, an embodiment of the present utility model provides a test probe for connecting with a connector terminal, comprising:

[0008] A first probe, which sequentially includes a first guiding section, a first pressing section, and a first connecting section along its length direction;

[0009] A second probe, which is arranged corresponding to the first probe, and sequentially includes a second guiding section, a second pressing section, and a second connecting section along its length direction;

[0010] A fixing member for connecting the first connecting section and the second connecting section;

[0011] Wherein, the first pressing section and the second pressing section are close to each other and are used to contact the connector terminal, and there is a first gap between the first connecting section and the second connecting section.

[0012] In a preferred embodiment of the above technical solution, there is a second gap between the first pressing section and the second pressing section, and the second gap is smaller than the first gap.

[0013] In a preferred embodiment of the above technical solution, the front ends of the first guiding section and the second guiding section are arranged to extend in directions away from each other.

[0014] In a preferred embodiment of the above technical solution, the first connecting section sequentially includes a first elastic part, a first connecting part, a first tail part, and a second tail part from the first pressing section backward, the second connecting section sequentially includes a second elastic part, a second connecting part, a third tail part, and a fourth tail part from the second pressing section backward, and the fixing member is used to connect the first connecting part and the second connecting part.

[0015] In a preferred embodiment of the above technical solution, the first guiding section forms a first chamfer with respect to the length direction of the first probe, the second guiding section forms a second chamfer with respect to the length direction of the second probe, and the angles of the first chamfer and the second chamfer are both 45 - 55°.

[0016] In a preferred embodiment of the above technical solution, both the first probe and the second probe are plate-shaped, the width of the first elastic part is greater than the width of the first connecting part, and the width of the second elastic part is greater than the width of the second connecting part.

[0017] In a preferred embodiment of the above technical solution, the width of the first tail part is greater than the width of the second tail part and the width of the first connecting part, and the width of the third tail part is greater than the width of the fourth tail part and the width of the second connecting part.

[0018] In a preferred embodiment of the above technical solution, the front end of the first guiding section and / or the second guiding section is arc-shaped.

[0019] In a preferred embodiment of the above technical solution, the first probe and the second probe are symmetrically arranged with respect to the axial section of the fixing member.

[0020] An embodiment of the present utility model also provides a test system, including the test probe as described above.

[0021] As described above, the test probe and the test system including the same according to the present utility model are in contact with the connector terminal through the first pressing portion of the first probe and the second pressing portion of the second probe, and a first gap is provided between the first connection section of the first probe and the second connection section of the second probe. Therefore, the two terminals connected to the same connector terminal are separated, which is equivalent to two lead wires led out. Thus, when connecting the test probe to the interface end of the test instrument, a connector terminal can lead out two completely independent lines, so that four-wire testing can be achieved, and then the contact impedance can be eliminated, the test accuracy can be improved, and the product qualification rate can be improved. In addition, since the test probe is in contact connection with the connector terminal and does not need to be sleeved on the probe, the connector terminal can be avoided from being bent during the contact process, ensuring the good appearance of the connector terminal. Description of the Drawings

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained according to these drawings without creative efforts. In the drawings, the parts are not necessarily drawn to actual scale.

[0023] Figure 1 Showing a three-dimensional structural schematic diagram of a connector and a probe used in the prior art;

[0024] Figure 2 Showing a three-dimensional structural schematic diagram of a test probe provided by an embodiment of the present utility model;

[0025] Figure 3 Showing a side view of a test probe provided by an embodiment of the present utility model;

[0026] Figure 4 Showing a three-dimensional structural schematic diagram of a test probe and a connector provided by an embodiment of the present utility model. Detailed Embodiments

[0027] The following specific embodiments illustrate the embodiments of the present utility model. Those skilled in the art can easily understand other advantages and effects of the present utility model from the content disclosed in this specification.

[0028] Reference is now made to the accompanying drawings to describe exemplary embodiments of the present invention. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are provided to disclose the present invention in detail and completely, and to fully convey the scope of the present invention to those skilled in the art. The terms in the exemplary embodiments shown in the drawings are not intended to limit the present invention.

[0029] Unless otherwise specified, the terms used herein, including scientific and technical terms, have the ordinary meaning understood by those skilled in the art. Additionally, it can be understood that terms defined in a commonly used dictionary should be construed as having a meaning consistent with the context of their relevant fields, and should not be construed as having an idealized or overly formal meaning.

[0030] It should be noted that if there are directional indications (such as up, down, left, right, front, back...) involved in the embodiments of the present invention, then such directional indications are only used to explain the relative positional relationship, movement conditions, etc. between components in a specific posture (as shown in the drawings). If this specific posture changes, then the directional indications will also change accordingly.

[0031] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, then such descriptions of "first", "second", etc. are only for descriptive purposes and should not be construed as indicating or implying their relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one such feature. Additionally, the technical solutions between various embodiments can be combined with each other, but it must be based on the ability of those of ordinary skill in the art to implement. When the combination of technical solutions results in contradictions or cannot be implemented, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0032] An embodiment of the present invention provides a test probe for connecting to a connector terminal. As Figure 2 and Figure 3 shown, Figure 2 and Figure 3 are respectively a perspective view and a side view of a test probe provided by an embodiment of the present invention. As Figure 4 shown, Figure 4 is a perspective view of a test probe and a connector 101 provided by an embodiment of the present invention. In this embodiment, the test probe includes: a first probe 1, a second probe 2, and a fixing member 3 for connecting the first probe 1 and the second probe 2. The front ends of the first probe 1 and the second probe 2 are in contact connection with the connector terminal 102, and the tail ends are connected to a test instrument, thereby realizing the transmission of current during testing.

[0033] The first probe 1 sequentially includes a first guiding section 11, a first pressing section 12, and a first connecting section along its length direction; the second probe 2 is arranged corresponding to the first probe 1, and the second probe 2 sequentially includes a second guiding section 21, a second pressing section 22, and a second connecting section along its length direction. Among them, the first pressing section 12 and the second pressing section 22 are close to each other and are used to contact the connector terminal 102. Thus, when inserting the connector terminal 102, the first pressing section 12 and the second pressing section 22 displace in the direction away from each other and contact the connector terminal 102; when removing the connector terminal 102, the first pressing section 12 and the second pressing section 22 displace in the direction close to each other.

[0034] The fixing member 3 fixedly connects the first connecting section and the second connecting section, and a first gap L1 is provided between the first connecting section and the second connecting section. Preferably, the fixing member 3 fixes the first probe 1 and the second probe 2 in the fixing member 3 by injection molding. The fixing member 3 spaces the two terminals apart, and the contact resistance can be eliminated.

[0035] In this embodiment, the connector terminal 102 is inserted between the first probe 1 and the second probe 2, and contacts the connector terminal 102 through the first pressing section 12 of the first probe 1 and the second pressing section 22 of the second probe 2. And a first gap L1 is provided between the first connecting section of the first probe 1 and the second connecting section of the second probe 2. Therefore, the two terminals connected to the same connector terminal 102 are separated, which is equivalent to two lead wires led out. Thus, when connecting the test probe to the interface end of the test instrument, one connector terminal 102 can lead out two completely independent lines, so that four-wire testing can be realized, and further the contact impedance can be eliminated, the test accuracy can be improved, and the product qualification rate can be improved; in addition, since the test probe is in contact connection with the connector terminal 102 and does not need to be sleeved on the connector terminal 102, the connector terminal 102 can be avoided from being bent during the contact process, ensuring the beauty of the product.

[0036] Specifically, in this embodiment, the fixing member 3 is made of an insulating material, and the first probe 1 and the second probe 2 are made of a conductive material, so that the first probe 1 and the second probe 2 can conduct current. Preferably, the first probe 1 and the second probe are made of beryllium copper, and the fixing member 3 is made of polyoxymethylene plastic, which is not only easy to mold, but also has the advantages of high strength and high rigidity.

[0037] Furthermore, in this embodiment, a second gap L2 is provided between the first pressing section 12 and the second pressing section 22, and the second gap L2 is smaller than the first gap L1.

[0038] Specifically, in a state where the connector terminal 102 is not inserted, there is a second gap L2 between the first pressing portion 12 and the second pressing portion 22, and the second gap L2 is smaller than the first gap L1. Thus, it is convenient to insert the connector terminal 102 between the first probe 1 and the second probe 2, and it can ensure that the first pressing portion 12 and the second pressing portion 22 are in close contact with the connector terminal 102.

[0039] It should be noted that in other embodiments, in a state where the connector terminal 102 is not inserted, the first pressing portion 12 and the second pressing portion 22 may also be in contact with each other.

[0040] Furthermore, the front ends of the first guiding section 11 and the second guiding section 21 are arranged to extend in directions away from each other. Thus, the closer the first guiding section 11 and the second guiding section 21 are to the front end, the greater the distance between them. The front ends of the first guiding section 11 and the second guiding section 21 are separated from each other by a certain distance, which can provide a guiding effect for the insertion of the connector terminal 102, so as to facilitate the insertion of the connector terminal 102.

[0041] Preferably, the front ends of the first guiding section 11 and the second guiding section 21 are arc-shaped, which can prevent the probes from damaging the connector terminal 102 or scratching the connector.

[0042] Furthermore, in the present embodiment, the first connecting section sequentially includes a first elastic portion 13, a first connecting portion 14, a first tail portion 15, and a second tail portion 16 from the first pressing portion 12 backward, and the second connecting section sequentially includes a second elastic portion 23, a second connecting portion 24, a third tail portion 25, and a fourth tail portion 26 from the second pressing portion 22 backward. The fixing member 3 is used to connect the first connecting portion 14 and the second connecting portion 24.

[0043] Specifically, the first elastic portion 13 is provided after the first pressing portion 12, and the second elastic portion 23 is provided after the second pressing portion 22, so as to facilitate the displacement of the first pressing portion 12 and the second pressing portion 22 in directions close to and away from each other, and further facilitate the insertion of the connector terminal 102. In this embodiment, the first connecting portion 14, the first tail portion 15, and the second tail portion 16 and the second connecting portion 24, the third tail portion 25, and the fourth tail portion 26 are arranged to be parallel to each other, so as to completely separate the first probe 1 and the second probe 2.

[0044] Furthermore, the first guiding section 11 forms a first chamfer α with respect to the length direction of the first probe 1, and the second guiding section 21 forms a second chamfer with respect to the length direction of the second probe 2. The angles of the first chamfer α and the second chamfer are both 22° - 28°. Preferably, the angles of the first chamfer α and the second chamfer are both 25°. Thus, it is beneficial for the connector terminal 102 to be inserted between the first probe 1 and the second probe 2 and prevent damage to the probes or the connector terminal 102.

[0045] In this embodiment, as Figure 3 shown, the first guiding section 11 slopes backward and downward from the front end to the first pressing section 12 and then backward from the first pressing section 12, and the first elastic section 13 gradually slopes upward to extend horizontally. The second guiding section 21 slopes backward and upward from the front end to the second pressing section 22 and then backward from the second pressing section 22, and the second elastic section 23 gradually slopes downward to extend horizontally. The first guiding section 11 and the first elastic section 13 form a depression at the first pressing section 12, and the second guiding section 21 and the second elastic section 23 form a depression at the second pressing section 22.

[0046] Furthermore, the distance between the front end of the first guiding section 11 and the front end of the second guiding section 21 is 0.8 - 1.2 mm, preferably 1.0 mm, so that it can be connected to more types of connector ends and meet more test requirements.

[0047] Furthermore, both the first probe 1 and the second probe 2 are plate-shaped, the width of the first elastic section 13 is greater than the width of the first connecting section 14, and the width of the second elastic section 23 is greater than the width of the second connecting section 24. Thus, during the injection molding process of the first connecting section 14 and the second connecting section 24 with the fixing member 3, it is beneficial to exclude excess liquid.

[0048] Furthermore, the width of the first tail 15 is greater than the width of the second tail 16 and the width of the first connecting section 14, and the width of the third tail 25 is greater than the width of the fourth tail 26 and the width of the second connecting section 24. Thus, if the test probe rotates during use, it can avoid damaging the connector terminal 102 and is also convenient for installation and positioning.

[0049] Furthermore, the first probe 1 and the second probe 2 are symmetrically arranged on both sides of the axial section of the fixing member 3 with respect to the axial section. This symmetrical arrangement can ensure that when the connector terminal 102 is inserted, both the first probe 1 and the second probe 2 can maintain good contact with it.

[0050] During use, the connector terminal 102 is inserted between the first guiding section 11 and the second guiding section 21 and extends inward, passing through the second gap L2 between the first pressing section 12 and the second pressing section 22, to between the first elastic section 13 and the second elastic section 23. Thus, the first pressing section 12 contacts and presses the connector terminal 102, and there is a first gap L1 between the first connecting section and the second connecting section, and they are fixedly connected through the fixing member 3. The first tail 15, the second tail 16 are separated from the third tail 25 and the fourth tail 26, so that the first probe 1 and the second probe 2 are completely separated, forming two completely independent electrical circuits.

[0051] According to the test probe provided by the present utility model, the first probe 1 and the second probe 2 are in contact connection with the connector terminal 102, and there is a gap between the tails of the first probe 1 and the second probe 2, so that two completely independent circuits can be formed, thereby eliminating the contact resistance, improving the test accuracy, and increasing the qualified rate of products. In addition, since the test probe is in contact connection with the connector terminal and does not need to be sleeved on the probe, the connector terminal can be prevented from being bent during the contact process, ensuring the intact appearance of the connector terminal.

[0052] An embodiment of the present utility model further provides a test system, including the test probe as described above.

[0053] The above embodiments are only illustrative of the principles and effects of the present utility model, and are not intended to limit the present utility model. Any person familiar with this technology can modify or change the above embodiments without departing from the spirit and scope of the present utility model. Therefore, all equivalent modifications or changes completed by those with ordinary knowledge in the technical field under the spirit and technical idea disclosed by the present utility model should still be covered by the claims of the present utility model.

Claims

1. A test probe for connecting with a connector terminal, characterized in that, Comprising: A first probe, the first probe sequentially includes a first guiding section, a first pressing portion, and a first connecting section along its length direction; A second probe, the second probe is arranged corresponding to the first probe, and the second probe sequentially includes a second guiding section, a second pressing portion, and a second connecting section along its length direction; A fixing member for connecting the first connecting section and the second connecting section; Wherein, the first pressing portion and the second pressing portion are close to each other and are used for contacting the connector terminal, and a first gap is provided between the first connecting section and the second connecting section.

2. The test probe according to claim 1, wherein A second gap is provided between the first pressing portion and the second pressing portion, and the second gap is smaller than the first gap.

3. The test probe according to claim 2, wherein The front ends of the first guiding section and the second guiding section are arranged to extend in a direction away from each other.

4. The test probe according to any one of claims 1 to 3, characterized in that, The first connecting section sequentially includes a first elastic portion, a first connecting portion, a first tail portion, and a second tail portion from the first pressing portion backward, and the second connecting section sequentially includes a second elastic portion, a second connecting portion, a third tail portion, and a fourth tail portion from the second pressing portion backward, and the fixing member is used for connecting the first connecting portion and the second connecting portion.

5. The test probe according to claim 4, characterized in that, The first guiding section forms a first chamfer with respect to the length direction of the first probe, the second guiding section forms a second chamfer with respect to the length direction of the second probe, and the angles of the first chamfer and the second chamfer are both 22° - 28°.

6. The test probe according to claim 4, characterized in that, Both the first probe and the second probe are plate-shaped, the width of the first elastic portion is greater than the width of the first connecting portion, and the width of the second elastic portion is greater than the width of the second connecting portion.

7. The test probe according to claim 4, wherein The width of the first tail portion is greater than the width of the second tail portion and the width of the first connecting portion, and the width of the third tail portion is greater than the width of the fourth tail portion and the width of the second connecting portion.

8. The test probe according to claim 1, wherein, The front end of the first guiding section and / or the second guiding section is arc-shaped.

9. The test probe according to claim 1, wherein The first probe and the second probe are symmetrically arranged with respect to the axial section of the fixing member.

10. A test system, characterized in that, Comprising the test probe according to any one of claims 1 to 9.

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