Device and system for testing hardware product

Abstract

The embodiment of the utility model provides a device and a system for testing hardware products. The device comprises a fixing tool used for fixing a hardware product to be tested and an adapter plate used for being connected with a test instrument, wherein the hardware product to be tested comprises a safety product; wherein the adapter plate is provided with second contacts which are in one-to-one correspondence with first contacts on a hardware product to be tested; the second contact is connected with the first contact through a data transmission line; the fixing tool and the data transmission line are made of high-temperature-resistant and / or low-temperature-resistant materials. According to the technical scheme of the utility model, the accuracy of the test of the hardware product to be tested is ensured, and the damage of the test instrument caused by the influence of high and low temperature environments is avoided at the same time.

Description

Technical Field

[0001] The embodiments of the present utility model relate to the technical field of testing, and in particular, to a device and a system for testing hardware products. Background Art

[0002] Generally, during the R & D process or before leaving the factory of some hardware products, in order to ensure that the products meet the quality standards, it is necessary to test the performance of the products. For example, it is necessary to test whether the electrical characteristics, transmission protocols, and erasing and writing performance of the products meet the requirements. When conducting tests, in addition to testing the performance of the products in a conventional environment, it is also necessary to test the performance of the products in extreme environments, such as testing the performance of the products in high-temperature and low-temperature environments.

[0003] In the prior art, when testing the performance of products in high-temperature or low-temperature environments, the commonly used method is to put the test products and test instruments into a temperature chamber with a set temperature for testing. However, it cannot be guaranteed that the existing test instruments can work normally in high-temperature and low-temperature environments. Therefore, the accuracy of the test results cannot be guaranteed, and the test instruments may also be damaged. In addition, another commonly used method is to place the test instruments beside the temperature chamber, put the test products into the temperature chamber with a set temperature for heating or cooling, and then take out the test products at the fastest speed for testing. However, this will cause the problem of temperature loss of the test products, making the temperature of the products unable to reach the required test temperature during testing, thereby affecting the accuracy of the test results.

[0004] Therefore, in the prior art, it is difficult to ensure the accuracy of test results when testing product performance in high-temperature or low-temperature environments. Summary of the Utility Model

[0005] To overcome the problems existing in the related art, the embodiments of the present utility model provide a device and a system for testing hardware products.

[0006] According to the first aspect of the embodiments of the present utility model, a device for testing hardware products is provided. The device includes a fixing tooling for fixing the hardware product to be tested and an adapter plate for connecting to a test instrument. The hardware product to be tested includes a security product.

[0007] Wherein, second contacts corresponding one-to-one to the first contacts on the hardware product to be tested are arranged on the adapter plate.

[0008] The second contacts are connected to the first contacts through data transmission lines.

[0009] The fixing tooling and the data transmission lines are made of high-temperature-resistant and / or low-temperature-resistant materials.

[0010] Optionally, in a specific embodiment, the adapter board is used for insertion connection with the test instrument; the size of the adapter board is the same as that of the hardware product to be tested.

[0011] Optionally, in a specific embodiment, the data transmission line is made of any one of the following materials:

[0012] Silicone material, thermoplastic elastomer TPE or butyl rubber.

[0013] Optionally, in a specific embodiment, the number of the second contacts on the adapter board is the same as the number of the first contacts on the hardware product to be tested, and the positions of the second contacts on the adapter board are the same as the positions of the first contacts with the same functions on the hardware product to be tested.

[0014] Optionally, in a specific embodiment, a third contact is further provided on the adapter board, and the third contact is used for connection with the contact on the test instrument;

[0015] moreover, the third contacts are connected to the second contacts in a one-to-one correspondence.

[0016] Optionally, in a specific embodiment, the fixing tooling includes fixing probes for fixing the hardware product to be tested;

[0017] One end of the fixing probe is used for connection with the data transmission line, and the other end of the fixing probe is used for connection with the first contact on the hardware product to be tested;

[0018] The number of the fixing probes, the number of the data transmission lines and the number of the first contacts on the hardware product to be tested are the same.

[0019] Optionally, in a specific embodiment, the fixing probe is made of any one of the following materials:

[0020] Copper, aluminum plated with copper, oxygen-free copper or silver plated with copper.

[0021] Optionally, in a specific embodiment, the fixing tooling includes a fixing area for placing the hardware product to be tested;

[0022] The fixing probes are arranged above the fixing area in a liftable manner, and the fixing probes are aligned with the target area in the fixing area; wherein, the target area is the area corresponding to the first contacts on the hardware product to be tested.

[0023] Optionally, in a specific embodiment, the fixing tooling includes a fixing frame and a fixing plate slidably arranged on the fixing frame, and the fixing plate can slide relative to the fixing frame in the vertical direction;

[0024] The fixed probe is disposed on the fixed plate.

[0025] Optionally, in a specific embodiment, the fixed area is provided with a plurality of fixed sub-areas, and the plurality of fixed sub-areas are arranged in a horizontal direction. One of the fixed sub-areas is used to place one of the hardware products to be tested;

[0026] The fixed probe is slidably disposed on the fixed plate, and the sliding direction of the fixed probe is the same as the arrangement direction of the plurality of fixed sub-areas.

[0027] Optionally, in a specific embodiment, the fixed sub-area is made of any one of the following materials:

[0028] Modified polypropylene material, polycarbonate plastic, polyethersulfone resin or polyamide 66.

[0029] Optionally, in a specific embodiment, a sliding groove extending in the arrangement direction of the fixed sub-areas is provided on the fixed plate;

[0030] The fixed probe is located in the sliding groove and is slidable in the sliding groove.

[0031] Optionally, the fixed frame and the fixed plate are made of any one of the following materials:

[0032] Aluminum alloy material, stainless steel material or titanium alloy material.

[0033] According to a second aspect of the embodiments of the present invention, a system for testing a hardware product is provided. The system includes a test instrument and the device for testing a hardware product according to any one of the first aspects above;

[0034] Wherein, the adapter plate in the device for testing a hardware product is inserted into the test instrument.

[0035] The technical solution provided by the embodiments of the present invention may include the following beneficial effects:

[0036] The device for testing hardware products provided by an embodiment of the present utility model includes a fixing tooling for fixing the hardware product to be tested, and an adapter board for connecting to a testing instrument; wherein, second contacts corresponding one by one to first contacts on the hardware product to be tested are arranged on the adapter board; the second contacts on the adapter board are connected to the first contacts on the hardware product to be tested through a data transmission line, and both the fixing device and the data transmission line are made of heat-resistant and / or low-temperature materials; for the device provided by an embodiment of the present utility model, the adapter board and the hardware product to be tested are connected through a data transmission line, and data information returned by the hardware product to be tested can be received, so that the adapter board can replace the hardware product to be tested to be connected to the testing instrument for testing, while the hardware product to be tested fixed on the fixing tooling is placed in a temperature chamber reaching the testing temperature, ensuring the testing environment of the hardware product to be tested. Since the adapter board is used to replace the hardware product to be tested to be connected to the testing instrument for testing, the testing instrument does not need to be placed in a high-temperature or low-temperature environment, which not only ensures the accuracy of the testing of the hardware product to be tested, but also avoids damage to the testing instrument caused by being affected by the high-temperature or low-temperature environment.

[0037] It should be understood that the above general description and subsequent detailed description are only exemplary and explanatory, and cannot limit the present utility model. Description of the Drawings

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model, the following will briefly introduce the drawings required to be used in the embodiments of the present utility model. It should be understood that for those of ordinary skill in the art, other drawings can also be obtained based on these drawings without creative efforts.

[0039] Figure 1 It is a schematic structural diagram of the device for testing hardware products provided by an embodiment of the present utility model;

[0040] Figure 2 It is a schematic diagram of the contacts arranged on the adapter board and the hardware product to be tested in the device for testing hardware products provided by an embodiment of the present utility model;

[0041] Figure 3 It is a schematic structural diagram of the fixing probe in the device for testing hardware products provided by an embodiment of the present utility model;

[0042] Figure 4 It is a schematic structural diagram of the system for testing hardware products provided by an embodiment of the present utility model.

[0043] The reference numerals in the drawings are represented as follows:

[0044] 100 - Fixed tooling; 200 - Adapter plate; 300 - Data transmission line; 110 - Fixed probe; 120 - Fixed area; 130 - Fixed frame; 140 - Fixed plate; 121 - Fixed sub - area; 141 - Sliding groove; 400 - Test instrument. Detailed implementation manners

[0045] The exemplary embodiments of the present utility model will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present utility model are shown in the drawings, it should be understood that the present utility model can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided so that the present utility model can be more thoroughly understood and the scope of the present utility model can be completely conveyed to those skilled in the art.

[0046] It should be understood that the terms used herein are for the purpose of describing specific exemplary embodiments only and are not intended to be limiting. Unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" as used herein may also include the plural forms. The terms "comprising", "including", "containing", and "having" are inclusive and thus specify the presence of the stated features, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, steps, operations, elements, components, and / or their combinations. The method steps, processes, and operations described herein are not to be construed as necessarily requiring them to be performed in the particular order described or illustrated, unless the execution order is explicitly stated. It should also be understood that additional or alternative steps may be used.

[0047] Although the terms first, second, third, etc. may be used in this document to describe multiple elements or components, these elements or components should not be limited by these terms. These terms may only be used to distinguish one element or component from another. Unless the context clearly indicates otherwise, terms such as "first", "second", and other numerical terms used herein do not imply an order or sequence. Therefore, the first element or component discussed below may be referred to as the second element or component without departing from the teachings of the exemplary embodiments.

[0048] For ease of description, spatial relative relationship terms may be used in this document to describe the relationship of one element or feature shown in the figure to another element or feature, such as "inside", "outside", "inner side", "outer side", "below", "beneath", "above", "upper", etc. Such spatial relative relationship terms are intended to include different orientations of the device in use or operation other than the orientations depicted in the figure.

[0049] First, an embodiment of the present utility model provides a device for testing hardware products, such asFigure 1 As shown, the device includes a fixing fixture 100 for fixing the hardware product to be tested and an adapter plate 200 for connecting with a test instrument;

[0050] The adapter board 200 is provided with second contacts corresponding to the first contacts on the hardware product to be tested;

[0051] The second contact on the adapter board 200 is connected to the first contact on the hardware product to be tested via a data transmission line 300;

[0052] The fixing fixture 100 and the data transmission line 300 are made of high temperature resistant and / or low temperature resistant materials;

[0053] The above-mentioned hardware products to be tested include security products.

[0054] For example, in a specific implementation, the above-mentioned hardware product to be tested may include a security product, or may be some other hardware products, such as a printed circuit board (PCB). In addition, it should be noted that the security product mentioned in the embodiment of the utility model refers to a product used to protect data, information or networks from threats and attacks. For example, the above-mentioned hardware product to be tested may be a small card containing an embedded integrated circuit, which may also be called an integrated circuit card or a contact card. In some specific application scenarios, the above-mentioned hardware product to be tested may be a card used in related equipment in the field of the Internet of Things (such as a car in the Internet of Vehicles), or a card used in a communication device in the field of communications, or may be a card used in related equipment in the field of identity authentication, etc.; in addition, the above-mentioned hardware product to be tested may also be a communication module, a car key or a near field communication card reader (Near Field Communication Reader, NFC reader), etc. It should be noted that here are only exemplary examples of several products that can be tested using the device provided in the embodiment of the utility model, and the products that can be tested using the device provided in the embodiment of the utility model are not limited to this, and are not listed one by one here.

[0055] When testing a hardware product to be tested, the hardware product to be tested needs to be fixed on a fixed tooling 100. Since data is transmitted between the hardware product to be tested and the adapter board 200 via a data line, the adapter board 200 can receive data fed back by the hardware product to be tested based on the test instructions. That is, the data read by the test instrument from the adapter board 200 is consistent with the data read from the hardware product to be tested. Therefore, the adapter board 200 can be used to connect the hardware product to the test instrument instead of the hardware product to be tested to test the performance of the hardware product to be tested.

[0056] Generally, for a hardware product to be tested, there are a certain number of first contacts provided thereon for realizing the connection and communication between the hardware product to be tested and an external circuit. The first contacts are arranged at different positions of the hardware product to be tested. For example, the first contacts on the hardware product to be tested can be symmetrically arranged on both sides of the hardware product to be tested. Different first contacts have different functions. Therefore, in specific implementation, the adapter board 200 is provided with second contacts corresponding one-to-one to the first contacts on the hardware product to be tested, that is, each first contact on the hardware product to be tested has a corresponding second contact on the adapter board, and they have the same function.

[0057] Of course, in some specific implementation manners, the number of second contacts on the adapter board 200 can be the same as the number of first contacts on the hardware product to be tested, or the number of second contacts on the adapter board 200 can be more than the number of first contacts on the hardware product to be tested, as long as each first contact on the hardware product to be tested has a corresponding second contact on the adapter board 200. For example, for an adapter board 200, if it can be used for testing several different types of hardware products to be tested, the second contacts of the adapter board can be set according to the hardware product to be tested with the most first contacts.

[0058] In the embodiment of the present utility model, the first contacts of the hardware product to be tested are connected to the second contacts on the adapter board 200 through the data transmission line 300. And each first contact on the hardware product to be tested is connected to the corresponding second contact on the adapter board 200 through a data transmission line to realize the data transmission between the hardware product to be tested and the adapter board 200.

[0059] In specific implementation, the adapter board 200 can be inserted into a test instrument to realize the connection between the adapter board 200 and the test instrument; for a test instrument with a built-in test fixture, the connection between the adapter board and the test instrument can be realized by clamping the test fixture to the position of the second contacts on the adapter board 200. In a specific application scenario, the adapter board 200 is used for insertion connection with a test instrument. For this scenario, in order to be able to use the adapter board 200 to replace the hardware product to be tested and insert it into the test instrument for testing, the size of the adapter board 200 needs to be the same as the size of the hardware product to be tested. For example, the width, length, and thickness of the adapter board 200 can be the same as the corresponding dimensions of the hardware product to be tested; or, the width and thickness of the adapter board 200 can be consistent with the corresponding dimensions of the hardware product to be tested, as long as the adapter board 200 can be inserted into the test instrument.

[0060] Specifically, the fixing tooling 100 and the data transmission line can be made of low-temperature resistant materials, or can be made of high-temperature resistant materials, or can be made of materials that are resistant to both high and low temperatures. During specific implementation, whether to use only high-temperature resistant or low-temperature resistant materials, or to use materials that are resistant to both low and high temperatures, and the maximum temperature or minimum temperature that the used material can withstand, etc., can all be selected according to actual needs, and the embodiments of the present utility model do not limit this.

[0061] It should be noted that the high temperature or low temperature in the embodiments of the present utility model refers to the temperature that is higher or lower than the conventional test temperature for hardware product testing in the hardware product testing scenario; for example, the high temperature in the embodiments of the present utility model can be a temperature higher than 125 °C, and the low temperature can be a temperature lower than -40 °C; of course, for different types of hardware products to be tested and test requirements, the specific temperature values of the high temperature or low temperature are different. The embodiments of the present utility model do not limit the specific values of the above high temperature or low temperature.

[0062] During specific implementation, in order to achieve data transmission between the adapter board 200 and the test instrument, a third contact is also provided on the adapter board 200, and the third contact is used to contact the contact on the test instrument; moreover, the third contact is connected to the second contact in a one-to-one correspondence.

[0063] That is to say, in the embodiments of the present utility model, two groups of contacts are provided on the adapter board 200, one group of contacts is used to connect with the contacts on the hardware product to be tested, one group of contacts is used to contact the contacts on the test instrument, and there is a connection relationship between the two groups of contacts.

[0064] When testing the hardware product to be tested in a high-temperature (such as higher than 125 °C) environment or a low-temperature (such as lower than -40 °C) environment, the hardware product to be tested is fixed on the fixing tooling 100, and the fixing tooling 100 with the hardware product to be tested is placed in a temperature chamber with the set temperature. Among them, the temperature in the temperature chamber is set to the test required temperature. Connect the adapter board 200 to the test instrument, so that the third contacts on the adapter board 200 are connected to each contact on the test instrument, and the second contacts on the adapter board 200 are connected to the first contacts on the hardware product to be tested through a data transmission line.

[0065] After the test starts, the test instrument sends a test instruction. After the third contact on the adapter board 200 receives the instruction sent by the test instrument, the third contact transmits the test instruction to the second contact, and the second contact transmits it to the corresponding first contact on the hardware product under test through the data transmission line 300. After the hardware product under test receives the test instruction sent by the test instrument, it makes corresponding feedback according to the test instruction and transmits the feedback data to the second contact of the adapter board 200 through the data transmission line 300. The second contact transmits the feedback data to the third contact, and the test instrument reads the feedback data received by the third contact of the adapter board 200, that is, the feedback data of the hardware product under test, and analyzes the function of the hardware product under test based on this feedback data.

[0066] In a specific embodiment, any one or more of the electrical characteristics, data transmission characteristics, erasing and writing performance, power consumption, or communication protocol of the hardware product under test can be tested. The specific test content can be set according to the test requirements of different hardware products under test. In addition, for different test contents, the test instrument sends different test instructions, and the specific instruction content of the test instructions can be set according to the actual test scenario. The specific content of the test instructions will not be elaborated in the embodiments of the present utility model. In addition, it should be noted that when analyzing the function of the hardware product under test based on the feedback data of the hardware product under test, it can be an end device installed with an analysis software client that analyzes based on the above data, such as a computer installed with an analysis software client. Of course, in some specific application scenarios, a computer installed with an analysis software client can also control the test instrument to send different test instructions.

[0067] In the device for testing hardware products provided by the embodiments of the present utility model, the adapter board is connected to the hardware product under test through a data transmission line, and can receive the feedback data returned by the hardware product under test according to the test instruction, so that the adapter board can replace the hardware product under test to be connected to the test instrument for testing. The hardware product under test fixed on the fixing jig is placed in a temperature chamber that reaches the test temperature, ensuring the test environment of the hardware product under test. Since the adapter board is used to replace the hardware product under test to be connected to the test instrument for testing, the test instrument does not need to be placed in a high-temperature or low-temperature environment, which not only ensures the accuracy of the test of the hardware product under test, but also avoids the damage of the test instrument caused by being affected by the high-temperature or low-temperature environment.

[0068] When testing a hardware product to be tested in a high temperature or low temperature environment, it is necessary to place the fixture 100 with the hardware product to be tested fixed in a temperature box with a set temperature. Since one end of the data transmission line 300 is connected to the hardware product to be tested, that is, a part of the data transmission line 300 needs to be placed in the temperature box. Therefore, in order to avoid the high temperature or low temperature environment from affecting the data transmission function of the data transmission line, and thus affecting the accuracy of the test results, in an embodiment of the utility model, the data transmission line 300 is made of high temperature and / or low temperature resistant materials. Specifically, the data transmission line 300 can be made of any one of the following materials:

[0069] Silicone material, Thermoplastic Elastomer (TPE) or butyl rubber.

[0070] Of course, in some specific implementations, the data transmission line 300 may also be made of other materials as long as it can meet the requirements of high temperature resistance and / or low temperature resistance. Here, only several possible materials are listed as examples, which is not a limitation to the solution of the present utility model.

[0071] In a specific implementation, the number of second contacts on the adapter board 200 is the same as the number of first contacts on the hardware product to be tested, and the position of each second contact on the adapter board 200 is the same as the position of a first contact with the same function on the hardware product to be tested.

[0072] Among them, the function of each second contact on the adapter board 200 is the same as the function of each first contact on the hardware product to be tested. In order to facilitate the connection between the first contact on the hardware product to be tested and the second contact on the adapter board 200, the positions of the first contacts and the second contacts with the same function on their respective products are also the same.

[0073] For ease of understanding, the following will take the hardware product to be tested as a card to be tested as an example, and explain it with diagrams. Figure 2As shown, in a specific embodiment, six first contacts, namely C1 - C6, are provided on the hardware product to be tested. Six second contacts C11 - C66 are also provided on the adapter board 200. The function of the first contact C1 is the same as that of the second contact C11, and the position of the first contact C1 on the hardware product to be tested is the same as the position of the second contact C11 on the adapter board. The function of the first contact C2 is the same as that of the second contact C22, and the position of the first contact C2 on the hardware product to be tested is the same as the position of the second contact C22 on the adapter board. The function of the first contact C3 is the same as that of the second contact C33, and the position of the first contact C3 on the hardware product to be tested is the same as the position of the second contact C33 on the adapter board. The function of the first contact C4 is the same as that of the second contact C44, and the position of the first contact C4 on the hardware product to be tested is the same as the position of the second contact C44 on the adapter board. The function of the first contact C5 is the same as that of the second contact C55, and the position of the first contact C5 on the hardware product to be tested is the same as the position of the second contact C55 on the adapter board. The function of the first contact C6 is the same as that of the second contact C66, and the position of the first contact C6 on the hardware product to be tested is the same as the position of the second contact C66 on the adapter board. When connecting the hardware product to be tested and the adapter board 200 through a data transmission line, the first contact and the second contact with the same function are connected by a data transmission line. That is, the first contact C1 and the second contact C11 are connected by a data transmission line, the first contact C2 and the second contact C22 are connected by a data transmission line, and so on. This will not be elaborated one by one in the embodiments of the present invention.

[0074] In addition, it should be noted that Figure 2 The contact schematic diagrams of the adapter board and the hardware product to be tested are only shown for the convenience of understanding that the positions of the second contacts on the adapter board 200 are the same as those of the first contacts with the same function on the hardware product to be tested. In actual application scenarios, there may be more or fewer devices provided on the hardware product to be tested and the adapter board. Figure 2 It is only a schematic diagram of the contact setting, and does not limit the specific structures of the adapter board and the hardware product to be tested.

[0075] In the embodiments of the present invention, by setting the positions of the second contacts on the adapter board 200 to be the same as those of the first contacts with the same function on the hardware product to be tested, when connecting the hardware product to be tested and the adapter board using a data transmission line, it is convenient to find the second contacts corresponding to the first contacts on the hardware product to be tested on the adapter board, and it can also reduce the occurrence of connection errors between the first contacts and the second contacts, thereby improving the accuracy of hardware product testing.

[0076] Such as Figure 1As shown, in the embodiment of the present utility model, a fixed probe 110 for fixing the hardware product to be tested is further provided on the fixing tooling 100; one end of the fixed probe 110 is used to connect with the data transmission line 300, and the other end of the fixed probe 110 is used to connect with the first contact on the hardware product to be tested;

[0077] Among them, the number of probes of the fixed probe 110, the number of data transmission lines, and the number of first contacts on the hardware product to be tested are the same.

[0078] In the embodiment of the present utility model, the hardware product to be tested is fixed on the fixing tooling 100 by the pressing method of the fixed probe 110. The fixed probe 110 is used to fix the hardware product to be tested on the one hand and realize the data transmission between the hardware product to be tested and the data transmission line on the other hand. Therefore, in specific implementation, when the fixed probe 110 fixes the hardware product to be tested, it needs to contact the first contact on the hardware product to be tested. One probe of the fixed probe 110 contacts one first contact on the hardware product to be tested, and the other end of the probe is connected to a data transmission line. Therefore, in the embodiment of the present utility model, the number of probes of the fixed probe 110, the number of data transmission lines, and the number of first contacts on the hardware product to be tested should be the same. For example, if there are 6 first contacts on the hardware product to be tested, the number of probes of the fixed probe and the number of data transmission lines are both 6.

[0079] Specifically, since each probe on the fixed probe 110 needs to contact each first contact on the hardware product to be tested, in a preferred implementation manner, the arrangement of each probe on the fixed probe 110 is the same as the arrangement of each first contact on the hardware product to be tested, and the interval between each probe is the same as the interval between each first contact on the hardware product to be tested.

[0080] For example, for Figure 2 the arrangement of each first contact in the shown hardware product to be tested, Figure 3 shows a fixed probe applicable to Figure 2 the shown hardware product to be tested. As Figure 3 shown, there are 6 probes in the shown fixed probe, and the 6 probes are arranged in two rows, with three probes in each row, and the interval between the probes satisfies that each probe can contact the corresponding first contact on the hardware product to be tested. Figure 3

[0081] Of course, in some specific implementation manners, the fixing tooling 100 can be used to fix multiple different types of hardware products to be tested. For different hardware products to be tested, the number of first contacts provided thereon may be different. Therefore, the number of probes of the fixed probe can be more than the number of first contacts on the hardware product to be tested, so that the fixed probe 110 can be adapted to different types of hardware products to be tested.​

[0082] In addition, it should be noted that in specific implementation, the fixed probe 110 can be set to be liftable above the hardware product to be tested. When it is necessary to fix the hardware product to be tested, the fixed probe 110 is lowered to a position where the probe can contact the first contact of the hardware product to be tested, so as to realize the fixation of the hardware product to be tested. Of course, in specific implementation, the fixed probe 110 can also be set at the side of the card to be tested, etc. The embodiments of the present invention only exemplarily list a specific implementation method that can realize the fixation of the hardware product to be tested, and do not limit the embodiments of the present invention. Any solution that can realize the fixation of the hardware product to be tested through the fixed probe 110 can be applied to the solution of the present invention.

[0083] Since the fixed probe 110 needs to be placed in the temperature chamber during the test of the hardware product to be tested, and the fixed probe is also used to connect the data transmission line 300 and the first contact of the hardware product to be tested, when manufacturing the fixed probe 110, it is necessary to consider both the high-temperature and / or low-temperature characteristics of the fixed probe and the data transmission function of the fixed probe 110. Therefore, in the embodiments of the present invention, the above-mentioned fixed probe 110 can be made of any one of the following materials:

[0084] Copper, aluminum with copper plating on the surface, oxygen-free copper or silver with copper plating on the surface.

[0085] Of course, in some specific implementation manners, the above-mentioned fixed probe 110 can also be made of materials of other materials, as long as it can meet the requirements of high temperature resistance and / or low temperature resistance and data transmission. Here, only several possible materials that can be used to manufacture the fixed probe 110 are exemplarily listed, and it does not limit the solution of the present invention.

[0086] In the embodiments of the present invention, the fixing tooling 100 further includes a fixing area 120 for placing the hardware product to be tested. As Figure 1 shown, the fixed probe 110 is liftably arranged above the fixing area 120, and the fixed probe 110 is aligned with the target area in the fixing area 120, and the target area is the area corresponding to the first contact of the hardware product to be tested.

[0087] That is, in a specific implementation manner, the fixed probe 110 is arranged directly above the target area. In this way, the contact between the fixed probe 110 and the first contact of the hardware product to be tested can be realized only by controlling the lifting of the fixed probe 110.

[0088] As Figure 1As shown in the figure, the above-mentioned fixing tooling 100 includes a fixing frame 130 and a fixing plate 140 slidably arranged on the fixing frame 130, and the fixing plate 140 can slide relative to the fixing frame 130 in the vertical direction; the fixed probe 110 is arranged on the fixing plate 140.

[0089] In a specific embodiment, cylindrical sliding columns can be arranged on the fixing frame 130, and the fixing plate 140 is sleeved on the sliding columns and slides up and down along the sliding columns, thereby driving the lifting of the fixed probe 110; in some other embodiments, slide rails can also be arranged on the inner sides of both ends of the fixing frame 130, and both ends of the fixing plate 140 are arranged in the slide rails, and the fixing plate 140 slides up and down along the slide rails, thereby driving the lifting of the fixed probe 110. Of course, there are also various implementation methods for the solution that the fixing plate 140 is slidably arranged on the fixing frame 130, and the embodiments of the present invention will not list them one by one, as long as the fixing plate 140 can be slidably arranged on the fixing frame 130.

[0090] During specific implementation, the lifting of the fixed probe 110 can be realized by electrically controlling the lifting of the fixing plate 140, or the lifting of the fixing plate 140 can be manually controlled by means of manual remote sensing to realize the lifting of the fixed probe 110, or the fixing plate 140 can be directly dragged up and down to drive the lifting of the fixed probe 110.

[0091] In some cases, it may be necessary to test multiple hardware products to be tested. In this case, usually after testing one hardware product to be tested, the hardware product to be tested is taken off, and then another hardware product to be tested is placed; such an operation process is relatively complicated and the testing efficiency is relatively low; therefore, in order to avoid the problem of relatively low testing efficiency caused by replacing the hardware product to be tested when testing multiple hardware products to be tested. In the embodiments of the present invention, multiple hardware products to be tested can be placed on the fixing tooling at one time.

[0092] In a specific embodiment, as Figure 1 shown, the fixing area 120 of the fixing tooling 100 is provided with a plurality of fixing sub-areas 121, and the plurality of fixing sub-areas 121 are arranged in the horizontal direction, and one fixing sub-area 121 is used to place one hardware product to be tested;

[0093] The fixed probe 110 is slidably arranged on the fixing plate 140, and the sliding direction of the fixed probe 110 is the same as the arrangement direction of the plurality of fixing sub-areas 121.

[0094] Among them, the size of each fixed sub-region 121 is the same as that of the hardware product to be tested. When testing the hardware product to be tested, the hardware product to be tested is placed in the fixed sub-region. If the hardware products to be tested are placed in multiple fixed sub-regions 121, only by moving the fixed probe can the testing of the hardware products to be tested in different fixed sub-regions 121 be realized.

[0095] In specific implementation, there may be a certain interval between multiple fixed sub-regions 121 arranged in the horizontal direction.

[0096] In the embodiment of the present utility model, multiple fixed sub-regions are arranged in the fixed region 120 of the fixed tooling 100. One fixed sub-region can place one hardware product to be tested, and the fixed probe can slide along the arrangement direction of the multiple fixed sub-regions. In this way, multiple hardware products to be tested can be placed on the fixed tooling 100 each time, and the measurement of multiple hardware products to be tested can be realized only by horizontally moving the fixed probe 110, improving the measurement efficiency.

[0097] It should be noted that the fixed frame 130 in the embodiment of the present utility model may include all structures of the fixed tooling except the fixed probe 110 and the fixed sub-region 121.

[0098] To enable the fixed probe 110 to slide along the arrangement direction of the multiple fixed sub-regions, as Figure 1 shown, a sliding groove 141 extending along the arrangement direction of the fixed sub-region is provided on the fixing plate 140. The fixed probe 110 is located in the sliding groove 141, and the fixed probe 110 can slide in the sliding groove 141.

[0099] In specific implementation, after the testing of one hardware product to be tested is completed, by controlling the fixed probe 110 to slide in the sliding groove 141, the fixed probe 110 slides above another hardware product to be tested, and the probe of the fixed probe 110 is aligned with the first contact on the hardware product to be tested, and the fixed probe 110 descends to the position where the probe contacts the first contact of the hardware product to be tested, so as to perform the testing of this hardware product to be tested.

[0100] The material of the fixed sub-region needs to meet the requirements of being able to withstand high temperature and / or low temperature, and at the same time needs to meet the requirement of being able to reduce scratches on the hardware product to be tested. Therefore, in the embodiment of the present utility model, the above fixed sub-region can be made of any one of the following materials:

[0101] Modified polypropylene (PP) material, polycarbonate plastic, polyethersulfone (PES) resin or polyamide (PA) 66.

[0102] In a specific embodiment, to prevent the fixing tooling from deforming, the fixing frame 130 and the fixing plate 140 on the fixing tooling 100 can be made of any one of the following materials:

[0103] Aluminum alloy material, stainless steel material or titanium alloy material.

[0104] In addition, it should be noted that in the embodiments of the present invention, since the adapter plate 200 does not need to be placed in a high-temperature or low-temperature environment, the adapter plate 200 does not need to be made of high-temperature-resistant and / or low-temperature-resistant materials. In specific implementation, it can be made of a flame-retardant material of FR-4 (Flame Retardant Material Grade 4, FR-4), such as a metal substrate, a ceramic substrate, a polymer substrate, etc.

[0105] The device for testing hardware products provided by the embodiments of the present invention has at least the following beneficial effects: it not only ensures the accuracy of the test of the hardware product to be tested, but also avoids the damage of the test instrument caused by being affected by a high-temperature or low-temperature environment; multiple hardware products to be tested can be measured simultaneously each time, improving the test efficiency.

[0106] Corresponding to the device for testing hardware products provided by the embodiments of the present invention, based on the same idea, the embodiments of the present invention also provide a system for testing hardware products, as Figure 4 shown, the system includes a test instrument 400 and the device for testing hardware products provided by the embodiments of the present invention;

[0107] Among them, the adapter plate 200 in the device for testing hardware products is connected to the test instrument 400.

[0108] As Figure 4 shown, the fixing sub-region 121 on the fixing tooling 100 is used to place the hardware product to be tested, the probe of the fixing probe 110 contacts the first contact of the hardware product to be tested, the other end of the fixing probe 110 is connected to the data transmission line 300, the data transmission line 300 contacts the second contact on the adapter plate 200, the adapter plate 200 is inserted into the test instrument 400, so that the third contact on the adapter plate 200 contacts the contact on the test instrument, and the second contact on the adapter plate is connected to the corresponding third contact.

[0109] Among them, Figure 4 Only an exemplary description is made based on the connection between the adapter plate 200 and the test instrument 400 being an insertion connection, and it is not a limitation on the connection manner between the adapter plate 200 and the test instrument 400. In specific applications, the specific connection manner between the adapter plate 200 and the test instrument 400 can be selected according to the actual scenario requirements.

[0110] Among them, the above-mentioned test instrument 400 can be a common Micropross MP300 TC3 test instrument. Of course, when conducting tests, other test instruments can also be selected. The specific types and models of the above-mentioned test instruments are not limited in the present utility model.

[0111] Among them, for the functions and specific implementation manners of each component in the system for testing hardware products provided by the embodiments of the present utility model, reference can be made to the foregoing embodiments of the device for testing hardware products, and details are not described herein again.

[0112] The above are only the preferred specific implementation manners of the present utility model, but the protection scope of the present utility model is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed by the present utility model should be covered within the protection scope of the present utility model. Therefore, the protection scope of the present utility model shall be subject to the protection scope of the claims.

Claims

1. A device for testing hardware products, characterized in that, The device includes a fixing tooling for fixing the hardware product to be tested and an adapter board for connecting to a test instrument, and the hardware product to be tested includes a security product; Wherein, second contacts corresponding one-to-one to the first contacts on the hardware product to be tested are arranged on the adapter board; The second contacts and the first contacts are connected through a data transmission line; The fixing tooling and the data transmission line are made of high-temperature resistant and / or low-temperature resistant materials; 2. The device according to claim 1, characterized in that, The adapter board is used for insertion connection with the test instrument; The size of the adapter board is the same as that of the hardware product to be tested; 3. The device according to claim 1, characterized in that The data transmission line is made of any one of the following materials: Silicone material, thermoplastic elastomer TPE or butyl rubber; 4. The device according to any one of claims 1 to 3, characterized in that The number of the second contacts on the adapter board is the same as the number of the first contacts on the hardware product to be tested, and the positions of the second contacts on the adapter board are the same as the positions of the first contacts with the same functions on the hardware product to be tested; 5. The device according to any one of claims 1 to 3, characterized in that, A third contact is further arranged on the adapter board, and the third contact is used for connecting with the contact on the test instrument; Moreover, the third contacts and the second contacts are connected one-to-one; 6. The device according to any one of claims 1 to 3, characterized in that The fixing tooling includes fixing probes for fixing the hardware product to be tested; One end of the fixing probe is used for connecting with the data transmission line, and the other end of the fixing probe is used for connecting with the first contact on the hardware product to be tested; The number of the fixing probes, the number of the data transmission lines and the number of the first contacts on the hardware product to be tested are the same; 7. The device according to claim 6, characterized in that, The fixing probe is made of any one of the following materials: Copper, aluminum plated with copper, oxygen-free copper or silver plated with copper; 8. The device according to claim 6, characterized in that, The fixing tooling includes a fixing area for placing the hardware product to be tested; The fixing probe is arranged above the fixing area in a liftable manner, and the fixing probe is aligned with the target area in the fixing area; wherein, the target area is the area corresponding to the first contact on the hardware product to be tested; 9. The device according to claim 8, characterized in that The fixing tooling includes a fixing frame and a fixing plate slidably arranged on the fixing frame, and the fixing plate can slide relative to the fixing frame in the vertical direction; The fixing probe is arranged on the fixing plate; 10. The device according to claim 9, characterized in that A plurality of fixing sub-areas are arranged in the fixing area, and the plurality of fixing sub-areas are arranged in the horizontal direction, and one fixing sub-area is used for placing one hardware product to be tested; The fixing probe is slidably arranged on the fixing plate, and the sliding direction of the fixing probe is the same as the arrangement direction of the plurality of fixing sub-areas; 11. The device according to claim 10, wherein, The fixing sub-area is made of any one of the following materials: Modified polypropylene material, polycarbonate plastic, polyethersulfone resin or polyamide 66; 12. The device according to claim 10, characterized in that, A sliding groove extending along the arrangement direction of the fixing sub-areas is arranged on the fixing plate; The fixing probe is located in the sliding groove and can slide in the sliding groove; 13. The device according to claim 9, characterized in that, The fixing frame and the fixing plate are made of any one of the following materials: Aluminum alloy material, stainless steel material or titanium alloy material; 14. A system for testing hardware products, characterized in that, The system includes a test instrument and the device for testing the hardware product according to any one of claims 1-13; Among them, the adapter board in the device for testing hardware products is connected to the test instrument.

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