Debugging switching device

Abstract

The utility model relates to the technical field of electronic equipment, and discloses a debugging switching device, which comprises a mounting module, a connecting module and a flexible circuit board. The connecting module comprises a probe support and at least one row of probes, the probe support comprises a first arc-shaped surface, a second arc-shaped surface and a mounting surface, the first arc-shaped surface and the second arc-shaped surface are opposite and have the same bending direction, the mounting surface is connected between the first arc-shaped surface and the second arc-shaped surface, and the probes are mounted on the probe support. Each row of probes comprises a plurality of probes, the plurality of probes in each row are arranged along the arc extension direction of the first arc-shaped surface and / or the second arc-shaped surface, and one end of each probe protrudes out of the mounting surface so as to be in contact with each measuring point in the product. One end of the flexible circuit board is installed in the probe support and connected with the probes, and the other end of the flexible circuit board is used for being connected with a debugging board. The mounting module is used for detachably mounting the connecting module on a product. The debugging switching device is suitable for debugging of small-size cylindrical products.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic devices, and particularly relates to a debugging adapter device. Background Art

[0002] In the R & D and trial production stage of electronic devices such as smart speakers, it is usually necessary to debug their functions and transmit the debugging data. During the debugging process, the smart speaker needs to be in the whole machine state, that is to say, when debugging, the smart speaker is a assembled structure. At this time, a debugging adapter device is needed to connect the inside of the whole machine with the external debugging board for function debugging.

[0003] For a small-sized cylindrical smart speaker, the installation area of the debugging adapter device inside the smart speaker is located between the functional component area and the redundant area of the cloth pressing. When assembled, the space of its debugging adapter device installation area is limited. The existing debugging adapter device is equipped with a plurality of test probes distributed in a rectangular array, resulting in a large occupied space of the debugging adapter device and being unable to be applied to the debugging of small-sized cylindrical smart speakers. Summary of the Utility Model

[0004] The utility model provides a debugging adapter device, which can reduce the occupied space of the debugging adapter device in the product and is applicable to the debugging of small-sized cylindrical products.

[0005] The utility model provides a debugging adapter device, which includes an installation module, a connection module and a flexible circuit board;

[0006] The connection module includes a probe holder and at least one row of probes. The probe holder includes a first arc surface, a second arc surface and an installation surface. The first arc surface and the second arc surface are arranged oppositely, and the bending directions of the first arc surface and the second arc surface are the same. The installation surface is connected between the first arc surface and the second arc surface, and the at least one row of probes is installed on the probe holder;

[0007] Each row of the probes includes a plurality of probes, and the plurality of probes in each row are arranged along the arc extension direction of the first arc surface and / or the second arc surface. One end of each probe protrudes from the installation surface, and one end of each probe is used to contact each measuring point inside the product;

[0008] One end of the flexible circuit board is installed in the probe holder and connected to the other ends of the probes, and the other end of the flexible circuit board is used to connect to a debugging board;

[0009] The installation module is connected to the side of the probe holder away from the installation surface, and the installation module is used to detachably install the connection module on the product.

[0010] The debugging adapter device provided by the present utility model, the connection module is used to contact the measuring points reserved in the product, and the installation module is used to install the connection module on the product, so as to ensure stable contact between the connection module and the measuring points during the debugging process. The installation module can also be used to remove the connection module from the product after the debugging is completed. By designing the first arc surface and the second arc surface on the probe holder, specifically when the debugging adapter device is assembled on the product in the debugging adapter installation area between the functional element area and the redundant area of the cloth pressing, the first arc surface and the second arc surface can be bent towards the functional element area. At this time, the probe holder can be closely attached to the inner wall of the redundant area of the cloth pressing to match the overall shape of the product, so as not to waste the space of the debugging adapter installation area. And, arranging each row of probes along the extending direction of the first arc surface and / or the second arc surface, in the case of the same radial dimension, the arrangement in the shape of an arc can accommodate more probes, thereby further reducing the radial dimension of the debugging adapter device (that is, the dimension in the arrangement direction of the functional element area and the redundant area of the cloth pressing). Therefore, the debugging adapter device in the present utility model can reduce the size and is suitable for debugging small-sized cylindrical products.

[0011] In some possible implementation schemes, the arc length of the first arc surface is greater than the arc length of the second arc surface. When the number of rows of the probes is greater than or equal to 2, along the arrangement direction from the first arc surface to the second arc surface, the number of probes in each row of the probes decreases in sequence.

[0012] In some possible implementation schemes, the installation module includes a buckle module and a buckle bracket. The buckle bracket is fixed on the side of the probe holder away from the installation surface, and the buckle module is connected to the buckle bracket;

[0013] The buckle module includes a buckle connection plate and at least two elastic wall buckles connected to the buckle connection plate. Each elastic wall buckle is used for clamping with the product.

[0014] In some possible implementation schemes, the installation module further includes a spring. The two ends of the spring are respectively connected to the buckle connection plate and the buckle bracket, and the buckle connection plate can move relative to the buckle bracket along the extending direction of the probe.

[0015] In some possible implementation schemes, a sliding mechanism is provided between the buckle connection plate and the buckle bracket. The sliding mechanism is used to enable the buckle bracket to move relative to the buckle connection plate along the extending direction of the probe.

[0016] In some possible embodiments, the sliding mechanism includes a first sliding hole provided in the snap connection plate, and at least a part of the snap bracket is located within the first sliding hole; or

[0017] The sliding mechanism includes a first sliding hole provided in the snap bracket, and at least a part of the snap connection plate is located within the first sliding hole;

[0018] Wherein, the extending direction of the first sliding hole is the same as the extending direction of the probe.

[0019] In some possible embodiments, the sliding mechanism further includes two snap windows and two overlapping portions;

[0020] When the first sliding hole is provided in the snap connection plate, the two snap windows are provided on opposite sides of the snap connection plate, the snap windows communicate with the first sliding hole, the two overlapping portions are provided on opposite sides of the snap bracket, and each overlapping portion is movably mounted within the snap window relative to the snap window along the extending direction of the probe;

[0021] When the first sliding hole is provided in the snap bracket, the two snap windows are provided on opposite sides of the snap connection plate, the snap windows communicate with the first sliding hole, the two overlapping portions are provided on opposite sides of the snap connection plate, and each overlapping portion is movably mounted within the snap window relative to the snap window along the extending direction of the probe.

[0022] In some possible embodiments, the mounting module further includes a movable snap, the snap connection plate is provided with a second sliding hole, the first end of the movable snap is located within the second sliding hole and can move relative to the extending direction of the second sliding hole, and the second end of the movable snap is used for snap connection with the product.

[0023] In some possible embodiments, the mounting module further includes a snap cover plate, the snap cover plate is located on the side of the snap connection plate facing the probe bracket, and the snap cover plate is detachably connected to the snap connection plate;

[0024] A limiting plate is provided at a position of the movable snap near the first end, the limiting plate is located between the snap cover plate and the snap connection plate, and both sides of the limiting plate are in contact with the snap cover plate and the snap connection plate respectively.

[0025] In some possible embodiments, sliding aids are respectively provided on both sides of the limiting plate, one sliding aid is used to reduce the friction between the limiting plate and the snap connection plate, and the other sliding aid is used to reduce the friction between the limiting plate and the snap cover plate. Brief Description of the Drawings

[0026] Figure 1 FIG. 1 is a schematic structural diagram of the debugging adapter device assembled to a product in an embodiment of the present utility model;

[0027] Figure 2 FIG. 2 is a schematic overall structural diagram of the debugging adapter device in an embodiment of the present utility model;

[0028] Figure 3 FIG. 3 is an exploded structural diagram of the debugging adapter device in an embodiment of the present utility model;

[0029] Figure 4 FIG. 4 is a schematic top view structural diagram of the debugging adapter device in an embodiment of the present utility model;

[0030] Figure 5 FIG. 5 is a schematic position structural diagram of the debugging adapter device when assembled to a product in an embodiment of the present utility model;

[0031] Figure 6 FIG. 6 is a schematic structural diagram of a snap module in an embodiment of the present utility model;

[0032] Figure 7 FIG. 7 is a schematic structural diagram of another perspective of the debugging adapter device assembled to a product in an embodiment of the present utility model.

[0033] In the figures:

[0034] 10 - product; 11 - functional element area; 12 - redundant area for wrapping cloth pressing; 13 - first snap fastener; 14 - second snap fastener; 100 - installation module; 110 - snap module; 111 - snap connection plate; 1111 - first connection plate; 1112 - second connection plate; 112 - elastic wall snap; 113 - first sliding hole; 114 - snap window; 115 - second sliding hole; 120 - snap cover plate; 130 - movable snap; 131 - limiting plate; 140 - spring; 150 - snap bracket; 151 - overlapping part; 160 - assisting slide; 200 - connection module; 210 - probe bracket; 211 - first arc surface; 212 - second arc surface; 213 - installation surface; 220 - probe. Detailed Description of the Embodiments

[0035] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. Based on the embodiments in the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.

[0036] ReferenceFigure 1 and Figure 2 In the embodiment of the present utility model, the debugging adapter device can be used for debugging small-sized cylindrical products 10. Specifically, the debugging adapter device may include an installation module 100, a connection module 200, and a flexible circuit board (not shown in the figure). Among them, the connection module 200 is used to contact the measurement points reserved in the product 10, and the flexible circuit board is electrically connected to the connection module 200 to facilitate obtaining and processing the data of the contact between the connection module 200 and the measurement points. The installation module 100 is used to fix the connection module 200 in the product 10.

[0037] Reference Figure 3 and Figure 4 and, the connection module 200 includes a probe holder 210 and at least one row of probes 220. The probe holder 210 includes opposite first arc surface 211 and second arc surface 212, and an installation surface 213 connected between the first arc surface 211 and the second arc surface 212. The bending directions of the first arc surface 211 and the second arc surface 212 are the same. Each row of probes 220 includes a plurality of probes 220, and the arrangement direction of each row of probes 220 is the same as the arc extension direction of the first arc surface 211 and / or the second arc surface 212. In addition, the installation surface 213 is provided with installation holes corresponding to each probe 220 one by one. One end of each probe 220 protrudes from the surface of the installation surface 213, and the other end of the probe 220 can pass through the installation hole and be fixed to the probe holder 210, so that the end of the probe 220 can contact the measurement points reserved in the product 10.

[0038] One end of the flexible circuit board can be fixedly connected to the inside of the probe holder 210 and is electrically connected to one end of each probe 220 located in the installation hole. Exemplarily, the flexible circuit board is connected to the side of the probe holder 210 away from the installation surface 213. One end of each probe 220 away from the installation surface 213 passes through the probe holder 210 and is connected to one end of the flexible circuit board, so as to achieve a stable electrical connection between the probe 220 and the flexible circuit board. The other end of the flexible circuit board can also be used to connect to a debugging board, and the test board obtains the data of each measurement point in the product 10 through the flexible circuit board, thereby completing the debugging.

[0039] In this embodiment, in combination with Figure 4 and Figure 5 , Figure 4 and Figure 5The structure of two rows of probes 220 is shown. The arc length of the first arc surface 211 is greater than that of the second arc surface 212, and the number of probes 220 in the row of probes 220 close to the first arc surface 211 is greater than the number of probes 220 in the row of probes 220 close to the second arc surface 212. It should be noted that in actual applications, the design of the number of rows of probes 220 can be carried out according to the number of probes 220 and the size of the product 10. For example, when the number of probes 220 is small, the probes 220 can be designed as one row, and when the number of probes 220 is large, the probes 220 can be designed as two rows, three rows, four rows, and so on. Moreover, when multiple rows of probes 220 are provided, along the arrangement direction from the first arc surface 211 to the second arc surface 212, the number of probes 220 in each row of probes 220 can be gradually reduced, so as to fit the contour design of the mounting surface 213, thereby enabling more probes 220 to be installed in a limited space, so as to reduce the occupied space of the connection module 200.

[0040] When the debugging adapter is installed on the product 10, the second arc surface 212 is closer to the central axis of the product 10 than the first arc surface 211. Since the installation area of the product 10 for installing the debugging adapter is located between the functional element area 11 and the wrapping cloth pressing redundancy area 12, the functional element area 11 is arranged close to the center, and the wrapping cloth pressing redundancy area 12 is arranged close to the edge. The shorter arc length of the second arc surface 212 can reduce the interference effect on the functional element area 11. Also, since there are no functional elements in the wrapping cloth pressing redundancy area 12, designing the arc length of the second arc surface 212 close to the wrapping cloth pressing redundancy area 12 to be longer can increase the number of probes 220 in the row of probes 220 close to the first arc surface 211 within a reasonable range, so as to make up for the number of probes 220 in the row of probes 220 close to the second arc surface 212 and ensure that the total number of probes 220 is sufficient.

[0041] In addition, since the debugging adapter device in this embodiment is applied to the cylindrical product 10, both the first arc surface 211 and the second arc surface 212 are bent towards the central axis of the product 10, and the overall cloth pressing redundancy area 12 is also circular. At this time, the first arc surface 211 can be as close as possible to the inner wall of the cloth pressing redundancy area 12 and cooperate with the overall shape of the product 10, so as not to waste the space inside the product 10. Since the probes 220 are arranged along the extending direction of the first arc surface 211, in the case of the same radial dimension, the arrangement method in this embodiment can arrange more probes 220 in the circumferential direction of the product 10, so as to facilitate reducing the dimension in the radial direction. Here, the radial direction can also be understood as the arrangement direction of the cloth pressing redundancy area 12, the debugging adapter device installation area, and the functional element area 11 inside the product 10. Therefore, it can also be understood that the debugging adapter device in this embodiment can reduce its dimension in the arrangement direction of the cloth pressing redundancy area 12 and the functional element area 11, so as to meet the installation requirements of the debugging adapter device for small-sized products 10. Referring again to Figure 3 , the installation module 100 may include a buckle module 110, a buckle cover plate 120, a movable buckle 130, a spring 140, and a buckle bracket 150. Among them, the buckle bracket 150 is fixedly connected to the side of the probe bracket 210 away from the installation surface 213, the buckle module 110 is connected to the buckle bracket 150, and both the buckle cover plate 120 and the movable buckle 130 are connected to the buckle module 110.

[0042] Specifically, referring together to Figure 3 and Figure 6 , the buckle module 110 includes a buckle connection plate 111 and at least two elastic wall buckles 112 connected to the buckle connection plate 111. The buckle connection plate 111 may include a first connection plate 1111 and a second connection plate 1112 that are perpendicular to each other. The elastic wall buckles 112 are arranged on the second connection plate 1112, and the first connection plate 1111 is perpendicular to the extending direction of the probe 220. The buckle connection plate 111 and the elastic wall buckles 112 may be, for example, an injection-molded integral structure to facilitate ensuring the overall structural stability of the buckle module 110.

[0043] A sliding mechanism is further provided between the buckle connection plate 111 and the buckle bracket 150. This sliding mechanism can be used to enable the buckle bracket 150 to move relative to the buckle connection plate 111 along the extending direction of the probe 220, so as to facilitate installing the connection module 200 on the product 10. As an alternative implementation, as Figure 3 and Figure 6As shown, the sliding mechanism may include a first sliding hole 113 provided in the buckle bracket 150. The first sliding hole may be provided at the bottom of the second connecting plate 1112. The extending direction of the first sliding hole 113 is the same as that of the probe 220. A part of the buckle bracket 150 extends into the first sliding hole 113, and the buckle bracket 150 can also move relative to the first sliding hole 113 along the extending direction of the first sliding hole 113. The two ends of the spring 140 are respectively connected to the buckle bracket 150 and the second connecting plate 1112. When the buckle bracket 150 moves relative to the first sliding hole 113, the spring 140 will be stretched or compressed, thereby generating elastic deformation.

[0044] There may be two springs 140, and the two springs 140 are respectively located on both sides of the buckle bracket 150 to ensure that the buckle bracket 150 can be evenly stressed.

[0045] In addition, the sliding mechanism may further include two clamping windows 114 and two overlapping parts 151. Among them, the two clamping windows 114 are respectively provided on opposite sides of the second connecting plate 1112, and the two clamping windows 114 are located on both sides of the first sliding hole 113. Each clamping window 114 communicates with the first sliding hole 113. The two overlapping parts 151 are provided on the top of the buckle bracket 150 and on opposite sides of the buckle bracket 150. The arrangement direction of the two overlapping parts 151 is the same as that of the two clamping windows 114. When the buckle bracket 150 is located in the first sliding hole 113, the two overlapping parts 151 are respectively installed in the two clamping windows 114. It should be noted that when the buckle bracket 150 moves relative to the first sliding hole 113, the overlapping part 151 can move relative to the clamping window 114. When the buckle bracket 150 is relatively fixed to the first sliding hole 113, the two overlapping parts 151 respectively overlap on the bottoms of the two clamping windows 114. Thus, through the cooperation of the overlapping part 151 and the clamping window 114, not only can the buckle bracket 150 and the second connecting plate 1112 be limited, but also only relative movement can occur between the second connecting plate 1112 and the buckle bracket 150 along a preset direction.

[0046] Or, as another implementation, the sliding mechanism may also include a first sliding hole extending along the extending direction of the probe 220, two clamping windows and two overlapping parts (not shown in the figure). At this time, the first sliding hole is provided on the buckle bracket 150, the two clamping windows are provided on opposite sides of the buckle connecting plate 111, and the two clamping windows are both communicated with the first sliding hole. The two overlapping parts are provided on opposite sides of the buckle connecting plate 111. Each overlapping part can be installed in a clamping window, and each overlapping part can also move relative to the clamping window along the extending direction of the probe 220. In addition, the other structures of the buckle bracket 150 and the buckle connecting plate 111 are the same as Figure 3 and Figure 6The structure shown is the same, so it will not be described again.

[0047] Continuing to refer to Figure 3 and Figure 6 , the first connecting plate 1111 is provided with a second sliding hole 115. The first end of the movable buckle 130 is located in the second sliding hole 115, and the movable buckle 130 can move relative to the first connecting plate 1111 along the extending direction of the second sliding hole 115. The buckle cover plate 120 is located on the side of the first connecting plate 1111 facing the test module. The buckle cover plate 120 is arranged parallel to the first connecting plate 1111, and the buckle cover plate 120 is detachably connected to the first connecting plate 1111. Exemplarily, the buckle cover plate 120 can be relatively fixed by screws. A limiting plate 131 is provided at a position of the movable buckle 130 near its first end. When the first end of the movable buckle 130 is located in the second sliding hole 115, the limiting plate 131 is located between the first connecting plate 1111 and the buckle cover plate 120, so that the first connecting plate 1111 and the buckle cover plate 120 cooperate to limit the movable buckle 130, ensuring that the movable buckle 130 will not move relative to the first connecting plate 1111 along the extending direction of the probe 220.

[0048] In this embodiment, as Figure 1 and Figure 7 shown, the elastic wall buckle 112 can be engaged with the first engaging buckle 13 provided inside the product 10, and the second end of the movable buckle 130 can be engaged with the second engaging buckle 14 provided inside the product 10. To ensure that the movable buckle 130 will not displace in the height direction of the probe 220 during the movement, both sides of the limiting plate 131 can be in contact with the first connecting plate 1111 and the buckle cover plate 120 respectively, so as to fully limit the limiting plate 131. In addition, to facilitate the movement of the movable buckle 130 in the second sliding hole 115, sliding assistance pieces 160 can be respectively arranged on both sides of the limiting plate 131. The sliding assistance piece 160 located between the limiting plate 131 and the first connecting plate 1111 can be used to reduce the friction coefficient between the limiting plate 131 and the first connecting plate 1111, and the sliding assistance piece 160 located between the limiting plate 131 and the buckle cover plate 120 can be used to reduce the friction coefficient between the limiting plate 131 and the buckle cover plate 120. The material of the sliding assistance piece 160 can be, for example, polyethylene terephthalate (PET).

[0049] It can be understood that in this embodiment, by setting a plurality of buckles, the debugging adapter device is assembled with the product. Compared with the existing technology of using nuts for locking, the debugging adapter device in this embodiment is convenient to assemble and disassemble, which is conducive to improving the debugging efficiency.

[0050] Specifically, when assembling the debugging adapter device to the product 10, the movable buckle 130 is misaligned with the second engaging buckle 14 of the product 10 at the initial position. At this time, the elastic wall buckle 112 can be manually pressed first, so that the elastic wall buckle 112 is engaged with the first engaging buckle 13 inside the product 10, thereby installing the debugging adapter device into the debugging adapter installation area inside the product 10. Then, the movable buckle 130 is toggled so that the movable buckle 130 moves relative to the second sliding hole 115 until it corresponds to the position of the second engaging buckle 14 inside the product 10, and the movable buckle 130 and the second engaging buckle 14 are engaged. When the debugging adapter device is installed into the product 10, after the probe 220 contacts the measurement point, the probe 220 receives an upward moving force, thereby compressing the spring 140. At this time, the spring 140 is deformed by the force, generating a force that causes the probe 220 to move downward. In this way, under the action of the spring 140, the probe 220 can maintain stable contact with the measurement point.

[0051] After the debugging is completed, first toggle the movable buckle 130 to the initial position, and then press the elastic wall buckle 112 with your finger to complete the disassembly of the debugging adapter device, which is simple and convenient.

[0052] Obviously, those skilled in the art can make various changes and modifications to the embodiments of the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention is also intended to include these modifications and variations.

Claims

1. A debugging adapter device, characterized in that, It includes an installation module, a connection module, and a flexible circuit board; The connection module includes a probe holder and at least one row of probes. The probe holder includes a first arc surface, a second arc surface, and an installation surface. The first arc surface and the second arc surface are arranged oppositely, and the bending directions of the first arc surface and the second arc surface are the same. The installation surface is connected between the first arc surface and the second arc surface, and the at least one row of probes is installed on the probe holder; Each row of the probes includes a plurality of probes. The plurality of probes in each row are arranged along the arc extension direction of the first arc surface and / or the second arc surface. One end of each probe protrudes from the installation surface, and one end of each probe is used to contact each measurement point inside the product; One end of the flexible circuit board is installed inside the probe holder and is connected to the other ends of the probes. The other end of the flexible circuit board is used to connect to a debugging board; The installation module is connected to the side of the probe holder away from the installation surface, and the installation module is used to detachably install the connection module on the product.

2. The debugging adapter device according to claim 1, characterized in that The arc length of the first arc surface is greater than the arc length of the second arc surface. When the number of rows of the probes is greater than or equal to 2, along the arrangement direction from the first arc surface to the second arc surface, the number of probes in each row of probes decreases in sequence.

3. The debugging adapter device according to claim 1, characterized in that, The installation module includes a snap module and a snap bracket. The snap bracket is fixed to the side of the probe holder away from the installation surface, and the snap module is connected to the snap bracket; The snap module includes a snap connection plate and at least two elastic wall snaps connected to the snap connection plate. Each elastic wall snap is used to engage with the product.

4. The debugging adapter device according to claim 3, characterized in that The installation module further includes a spring. The two ends of the spring are respectively connected to the snap connection plate and the snap bracket, and the snap connection plate can move relative to the snap bracket along the extension direction of the probe.

5. The debugging adapter device according to claim 3 or 4, characterized in that A sliding mechanism is provided between the snap connection plate and the snap bracket, and the sliding mechanism is used to enable the snap bracket to move relative to the snap connection plate along the extension direction of the probe.

6. The debugging adapter device according to claim 5, characterized in that, The sliding mechanism includes a first sliding hole provided on the snap connection plate, and at least a part of the snap bracket is located inside the first sliding hole; or The sliding mechanism includes a first sliding hole provided on the snap bracket, and at least a part of the snap connection plate is located inside the first sliding hole; Wherein, the extension direction of the first sliding hole is the same as the extension direction of the probe.

7. The debugging adapter device according to claim 6, characterized in that, The sliding mechanism further includes two clamping windows and two overlapping parts; When the first sliding hole is provided on the snap connection plate, the two clamping windows are provided on opposite sides of the snap connection plate. The clamping windows are communicated with the first sliding hole. The two overlapping parts are provided on opposite sides of the snap bracket. Each overlapping part is movably installed in the clamping window relative to the clamping window along the extension direction of the probe; When the first sliding hole is provided on the buckle bracket, the two clamping windows are provided on opposite sides of the buckle connection plate. The clamping windows are in communication with the first sliding hole. The two overlapping portions are provided on opposite sides of the buckle connection plate. Each of the overlapping portions is movably mounted in the clamping window relative to the clamping window along the extending direction of the probe.

8. The debugging adapter device according to claim 3, characterized in that The installation module further includes a movable buckle. The buckle connection plate is provided with a second sliding hole. The first end of the movable buckle is located in the second sliding hole and is movable relative to the extending direction of the second sliding hole. The second end of the movable buckle is used for clamping with the product.

9. The debugging adapter device according to claim 8, wherein The installation module further includes a buckle cover plate. The buckle cover plate is located on the side of the buckle connection plate facing the probe bracket. The buckle cover plate is detachably connected to the buckle connection plate. A limiting plate is provided at a portion of the movable buckle near the first end. The limiting plate is located between the buckle cover plate and the buckle connection plate, and both sides of the limiting plate are in contact with the buckle cover plate and the buckle connection plate respectively.

10. The debugging adapter device according to claim 9, characterized in that, Auxiliary sliding pieces are respectively provided on both sides of the limiting plate. One auxiliary sliding piece is used for reducing the friction between the limiting plate and the buckle connection plate, and the other auxiliary sliding piece is used for reducing the friction between the limiting plate and the buckle cover plate.

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