IGBT (Insulated Gate Bipolar Translator) module turn-on test system

Abstract

The utility model provides an IGBT module opening test system comprising a control unit used for generating a test signal; the IGBT driving module test unit is connected with the control unit and the to-be-tested IGBT module, and is used for controlling the to-be-tested IGBT module to be switched on or switched off according to the test signal, receiving a feedback signal of the IGBT driving module and sending the feedback signal to the control unit; the IGBT power module test unit is connected with the control unit and the to-be-tested IGBT module and used for controlling the to-be-tested IGBT module to be switched on or switched off according to the test signal; the analog quantity output unit is connected with the control unit and the IGBT module to be tested and is used for converting the PWM signal sent by the control unit into voltage analog quantity and current analog quantity so as to drive the IGBT module to be tested; and the ADC acquisition unit is connected with the to-be-tested IGBT module and is used for acquiring the voltage digital quantity and the current digital quantity of the to-be-tested IGBT module. According to the utility model, the rapid test of the IGBT module can be realized.

Description

Technical Field

[0001] The utility model belongs to the technical field of IGBT module testing, and particularly relates to an IGBT module turn-on testing system. Background Art

[0002] With the continuous development of modern electronic technology and the wide application of power electronic devices, IGBT modules have become one of the indispensable key components of power electronic devices. Detecting the turn-on and failure modes of IGBT modules is a necessary measure to solve the faults and damages of power electronic devices.

[0003] At present, there is no detection tool for IGBT modules in fault handling, and only the power module can be disassembled for inspection. This process is relatively complex and takes a long time, which is not conducive to emergency judgment and disposal in case of emergency. Content of the Utility Model

[0004] In order to overcome the above technical defects, the utility model provides an IGBT module turn-on testing system, which can realize the rapid testing of IGBT modules.

[0005] The utility model is implemented according to the following technical solutions:

[0006] An IGBT module turn-on testing system includes:

[0007] A control unit for generating a test signal;

[0008] An IGBT drive module test unit connected to the control unit and the IGBT module to be tested, for controlling the IGBT module to be tested to turn on or off according to the test signal, and receiving the feedback signal of the IGBT drive module and sending it to the control unit;

[0009] An IGBT power module test unit connected to the control unit and the IGBT module to be tested, for controlling the IGBT module to be tested to turn on or off according to the test signal;

[0010] An analog quantity output unit connected to the control unit and the IGBT module to be tested, for converting the PWM signal sent by the control unit into voltage analog quantity and current analog quantity to drive the IGBT module to be tested;

[0011] An ADC acquisition unit connected to the IGBT module to be tested, for acquiring the voltage digital quantity and current digital quantity of the IGBT module to be tested.

[0012] As a further improvement of the utility model, the IGBT drive module test unit includes: a first drive chip, a transmitter and a receiver, and the test signal includes: a pulse width electrical signal;

[0013] The first driving chip is connected to the control unit to receive the test signal. The transmitter is connected to the first driving chip and the IGBT module to be tested. The receiver is connected to the first driving chip and the IGBT module to be tested.

[0014] The first driving chip drives the transmitter and the receiver according to the test signal. The transmitter converts the pulse-width electrical signal into an optical signal. The IGBT module to be tested is turned on or off according to the optical signal. The receiver receives the feedback signal of the IGBT module to be tested.

[0015] As a further improvement of the present utility model, the IGBT power module test unit includes: a second driving chip and a first optocoupler.

[0016] The first optocoupler is connected to the control unit and the second driving chip. The first optocoupler obtains the pulse-width electrical signal from the control unit and sends it to the second driving chip. The IGBT module to be tested is connected to the second driving chip and is turned on or off according to the pulse-width electrical signal.

[0017] As a further improvement of the present utility model, the analog quantity output unit includes: at least one voltage analog quantity output circuit and at least one current analog quantity output circuit. The voltage analog quantity output circuit and the current analog quantity output circuit are both connected to the control unit and are used to convert the PWM signal sent by the control unit into a voltage analog quantity and a current analog quantity.

[0018] As a further improvement of the present utility model, the voltage analog quantity output circuit includes: a second optocoupler and a first analog quantity conversion chip.

[0019] The input end of the second optocoupler is connected to the control unit. The first analog quantity conversion chip is respectively connected to the output end of the second optocoupler and the IGBT module to be tested.

[0020] As a further improvement of the present utility model, the current analog quantity output circuit includes: a third optocoupler and a second analog quantity conversion chip.

[0021] The input end of the third optocoupler is connected to the control unit. The second analog quantity conversion chip is respectively connected to the output end of the third optocoupler and the IGBT module to be tested.

[0022] As a further improvement of the present utility model, the ADC acquisition unit includes: a first analog-to-digital conversion chip, a second analog-to-digital conversion chip, and a voltage division detection circuit.

[0023] The voltage division detection circuit is connected to the IGBT module to be tested, and the first analog-to-digital conversion chip is connected to the control unit and the voltage division detection circuit, and is used to collect the digital voltage quantity of the IGBT module to be tested and send it to the control unit;

[0024] The second analog-to-digital conversion chip is connected to the control unit and the IGBT module to be tested, and is used to collect the digital voltage quantity and the digital current quantity of the IGBT module to be tested and send them to the control unit.

[0025] As a further improvement of the present invention, the present invention further includes: a display unit, connected to the control unit, and is used to display the feedback signal, the digital voltage quantity, and the digital current quantity.

[0026] As a further improvement of the present invention, the present invention further includes: a power supply unit, connected to the control unit, the IGBT drive module test unit, the IGBT power module test unit, the analog quantity output unit, and the ADC acquisition unit, and provides a working power supply for the control unit, the IGBT drive module test unit, the IGBT power module test unit, the analog quantity output unit, and the ADC acquisition unit.

[0027] As a further improvement of the present invention, at least one group of the IGBT drive module test units and at least one group of the IGBT power module test units are provided.

[0028] Compared with the prior art, the present invention has the following beneficial effects: by setting the IGBT drive module test unit, the IGBT power module test unit, and the IGBT power module test unit to test the IGBT module, the drive test, power test, and turn-on test of the IGBT drive module can be realized, making the test simpler and easier to operate. Description of the Drawings

[0029] The following further details the specific implementation manners of the present invention in conjunction with the drawings, where:

[0030] Figure 1 is the overall structural schematic diagram of the IGBT module turn-on test system described in the present invention;

[0031] Figure 2 is the structural schematic diagram of the IGBT drive module test unit described in the present invention;

[0032] Figure 3 is the structural schematic diagram of the IGBT power module test unit described in the present invention;

[0033] Figure 4Schematic diagram of the voltage analog output circuit of the present utility model;

[0034] Figure 5 Schematic diagram of the current analog output circuit of the present utility model;

[0035] Figure 6 Schematic diagram of the connection of the first analog-to-digital conversion chip U9 of the present utility model;

[0036] Figure 7 Schematic diagram of the structure of the voltage division detection circuit of the present utility model;

[0037] Figure 8 Schematic diagram of the connection of the second analog-to-digital conversion chip U10 of the present utility model.

[0038] Explanation of reference numerals: 1, control unit; 2, IGBT drive module test unit; 3, IGBT power module test unit; 4, analog output unit; 5, ADC acquisition unit; 51, voltage division detection circuit; 6, display unit; 7, power supply unit; 100, IGBT module to be tested. Detailed implementation manners

[0039] The following describes the preferred embodiments of the present utility model with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present utility model, and are not used to limit the present utility model.

[0040] The present utility model provides an IGBT module turn-on test system, as Figure 2 shown, including: a control unit 1, an IGBT drive module test unit 2, an IGBT power module test unit 3, an analog output unit 4, and an ADC acquisition unit 5; wherein, the control unit 1 is used to generate a test signal; the IGBT drive module test unit 2 is connected to the control unit 1 and the IGBT module 100 to be tested, and is used to control the IGBT module 100 to be tested to turn on or off according to the test signal, and receive the feedback signal of the IGBT drive module and send it to the control unit 1; the IGBT power module test unit 3 is connected to the control unit 1 and the IGBT module 100 to be tested, and is used to control the IGBT module 100 to be tested to turn on or off according to the test signal, and receive the second feedback signal of the IGBT module 100 to be tested and send it to the control unit 1; the analog output unit 4 is connected to the control unit 1, and is used to convert the PWM signal sent by the control unit 1 into a voltage analog quantity and a current analog quantity; the ADC acquisition unit 5 is connected to the control unit 1, and is used to convert the voltage analog quantity and the current analog quantity into a voltage digital quantity and a current digital quantity.

[0041] In one of the embodiments, the control unit 1 is implemented by using an ATSAMD21G series chip. The control unit 1 includes: the chip and its peripheral circuits, constituting the minimum unit of the single-chip microcomputer.

[0042] As Figure 2 shown, the IGBT drive module test unit 2 is used to test the drive board in the IGBT module 100 to be tested. It includes: a first drive chip, a transmitter, and a receiver. The test signal includes: a pulse-width electrical signal. The first drive chip is connected to the control unit 1 to receive the test signal. The transmitter is connected to the first drive chip and the IGBT module 100 to be tested. The receiver is connected to the first drive chip and the IGBT module 100 to be tested. The first drive chip drives the transmitter and the receiver according to the test signal. The transmitter converts the pulse-width electrical signal into an optical signal. The IGBT module 100 to be tested is turned on or off according to the optical signal. The receiver receives the feedback signal of the IGBT module 100 to be tested.

[0043] Preferably, the transmitter can be implemented by using a T-1521Z fiber optic transmitter, and the receiver can be implemented by using an R-2521Z fiber optic receiver. In Figure 2 it shows the structure of the multi-channel IGBT drive module test unit 2. FC2, FC4, FC6, and FC8 are transmitters, FC1, FC3, FC5, and FC7 are receivers. The first drive chip is implemented by using an SN75451 chip. In Figure 2 it, U1 and U2 are the first drive chips.

[0044] The control unit 1 outputs a pulse-width electrical signal with a frequency of 730HZ to the T-1521Z fiber optic transmitter, converts the pulse-width electrical signal into an optical signal to control the IGBT drive board to perform on-off operations. The R-2521Z fiber optic receiver is responsible for receiving the feedback signal of the IGBT drive module.

[0045] As Figure 3 shown, the IGBT power module test unit 3 is used to test the power module in the IGBT module 100 to be tested. It includes: a second drive chip U3 and a first optocoupler U5. The second drive chip U3 is connected to the IGBT module 100 to be tested and the input end of the first optocoupler U5. The output end of the first optocoupler U5 is connected to the control unit 1. The first optocoupler U5 obtains the pulse-width electrical signal from the control unit 1 and sends it to the second drive chip U3. The IGBT module 100 to be tested is connected to the second drive chip U3 and is turned on or off according to the pulse-width electrical signal.

[0046] Preferably, the second drive chip U3 is implemented by using a UCC2751DBVR chip.

[0047] The control unit 1 outputs a pulse-width electrical signal with a frequency of 730HZ to the second drive chip U3, and directly controls the IGBT module 100 to be tested to perform on-off operations with the pulse-width electrical signal.

[0048] Furthermore, the analog output unit 4 can be used to test the IGBT single tubes and drive boards in the IGBT module 100 to be tested, including: at least one voltage analog output circuit and at least one current analog output circuit. Both the voltage analog output circuit and the current analog output circuit are connected to the control unit 1 and are used to convert the PWM signal sent by the control unit 1 into a voltage analog quantity and a current analog quantity.

[0049] In one embodiment, considering that there are fewer IGBT modules driven by current, four voltage analog output circuits and one current analog output circuit are provided.

[0050] As Figure 4 shown, the voltage analog output circuit includes: a second optocoupler U4 and a first analog conversion chip U6; the input end of the second optocoupler U4 is connected to the control unit 1, and the first analog conversion chip U6 is respectively connected to the output end of the second optocoupler U4 and the IGBT module 100 to be tested.

[0051] As Figure 5 shown, the current analog output circuit includes: a third optocoupler U7 and a second analog conversion chip U8; the input end of the third optocoupler U7 is connected to the control unit 1, and the second analog conversion chip U8 is respectively connected to the output end of the third optocoupler U7 and the IGBT module 100 to be tested.

[0052] Both the first analog conversion chip U6 and the second analog conversion chip U8 are implemented using the GP8101S chip. The first analog conversion chip U6 linearly converts the PWM signal sent by the control unit 1 into an analog voltage output of 0-5V or 0-10V; the second analog conversion chip U8 linearly converts the PWM signal sent by the control unit 1 into an analog current output signal of 0 / 4-20mA to drive the IGBT module 100 to be tested. Here, the IGBT module 100 to be tested can include single IGBTs or other modules of IGBTs.

[0053] As Figures 6 to 8As shown in the figure, when using the IGBT power module test unit 2 and the analog output unit to test the IGBT module 3 to be tested, the ADC acquisition unit 5 is used to acquire the feedback signal of the IGBT module 100 to be tested and convert it into a digital signal. It includes: the first analog-to-digital conversion chip U9, the second analog-to-digital conversion chip U10, and the voltage division detection circuit 51; the voltage division detection circuit 51 is connected to the IGBT module to be tested, the first analog-to-digital conversion chip U9 is connected to the control unit 1 and the voltage division detection circuit 51, and is used to collect the voltage digital quantity of the IGBT module 100 to be tested and send it to the control unit 1; the second analog-to-digital conversion chip U10 is connected to the control unit 1 and the IGBT module 100 to be tested, and is used to collect the current digital quantity of the IGBT module 100 to be tested and send it to the control unit 1.

[0054] Preferably, multiple channels can be set for acquisition. Since both the first analog-to-digital conversion chip U9 and the second analog-to-digital conversion chip U10 can achieve multi-channel acquisition, a number of voltage division detection circuits 51 are correspondingly equipped. The voltage division detection circuit 51 is used to collect the primary circuit voltage of the IGBT module 100 to be tested.

[0055] The first analog-to-digital conversion chip U9 is implemented by the ADS1115 chip, and the second analog-to-digital conversion chip U10 is implemented by the ina226 chip. The ADS1115 chip is a precision 16-bit voltage analog-to-digital converter that can convert analog signals into digital signals. It uses an 2 I2C interface for communication and has four single-ended or two differential input channels. The control unit 1 obtains the voltage digital quantity of the IGBT module 100 to be tested from the first analog-to-digital conversion chip U9; INA226 is a current shunt and power monitor with an I2C TM interface that can directly read the current in amperes and the power data in watts, and communicates with the main control unit 1 through the 2 I2C interface to obtain the voltage digital quantity and current digital quantity of the IGBT module 100 to be tested.

[0056] The utility model further includes: a display unit 6 connected to the control unit 1, which is used to display the feedback signal, voltage digital quantity, and current digital quantity.

[0057] The utility model further includes: a power supply unit 7, which is connected to the control unit 1, the IGBT drive module test unit 2, the IGBT power module test unit 3, the analog output unit 4, and the ADC acquisition unit 5, and provides working power for the control unit 1, the IGBT drive module test unit 2, the IGBT power module test unit 3, the analog output unit 4, and the ADC acquisition unit 5.

[0058] As a further improvement of the utility model, at least one set of IGBT drive module test unit 2 and at least one set of IGBT power module test unit 3 are provided.

[0059] The above are only the preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included within the protection scope of the present application.

Claims

1. An IGBT module turn-on test system, characterized in that, Comprising: A control unit for generating test signals; An IGBT drive module test unit, connected to the control unit and the IGBT module to be tested, for controlling the IGBT module to be tested to turn on or off according to the test signal and receiving the feedback signal of the IGBT drive module and sending it to the control unit; An IGBT power module test unit, connected to the control unit and the IGBT module to be tested, for controlling the IGBT module to be tested to turn on or off according to the test signal; An analog quantity output unit, connected to the control unit and the IGBT module to be tested, for converting the PWM signal sent by the control unit into voltage analog quantity and current analog quantity to drive the IGBT module to be tested; An ADC acquisition unit, connected to the IGBT module to be tested, for acquiring the voltage digital quantity and current digital quantity of the IGBT module to be tested.

2. The IGBT module turn-on test system according to claim 1, characterized in that The IGBT drive module test unit includes: a first drive chip, a transmitter and a receiver, and the test signal includes: a pulse width electrical signal; The first drive chip is connected to the control unit to receive the test signal, the transmitter is connected to the first drive chip and the IGBT module to be tested, and the receiver is connected to the first drive chip and the IGBT module to be tested; The first drive chip drives the transmitter and the receiver according to the test signal, the transmitter converts the pulse width electrical signal into an optical signal, the IGBT module to be tested turns on or off according to the optical signal, and the receiver receives the feedback signal of the IGBT module to be tested.

3. The IGBT module turn-on test system according to claim 2, wherein, The IGBT power module test unit includes: a second drive chip, a first optocoupler; The first optocoupler is connected to the control unit and the second drive chip, the first optocoupler obtains the pulse width electrical signal from the control unit and sends it to the second drive chip, and the IGBT module to be tested is connected to the second drive chip and turns on or off according to the pulse width electrical signal.

4. The IGBT module turn-on test system according to claim 1, characterized in that, The analog quantity output unit includes: at least one voltage analog quantity output circuit and at least one current analog quantity output circuit, and the voltage analog quantity output circuit and the current analog quantity output circuit are both connected to the control unit for converting the PWM signal sent by the control unit into voltage analog quantity and current analog quantity.

5. The IGBT module turn-on test system according to claim 4, characterized in that, The voltage analog quantity output circuit includes: a second optocoupler, a first analog quantity conversion chip; The input end of the second optocoupler is connected to the control unit, and the first analog quantity conversion chip is respectively connected to the output end of the second optocoupler and the IGBT module to be tested.

6. The IGBT module turn-on test system according to claim 4, characterized in that, The current analog quantity output circuit includes: a third optocoupler, a second analog quantity conversion chip; The input end of the third optocoupler is connected to the control unit, and the second analog quantity conversion chip is respectively connected to the output end of the third optocoupler and the IGBT module to be tested.

7. The IGBT module turn-on test system according to claim 1, wherein The ADC acquisition unit includes: a first analog-to-digital conversion chip, a second analog-to-digital conversion chip, and a voltage division detection circuit; The voltage division detection circuit is connected to the IGBT module to be tested. The first analog-to-digital conversion chip is connected to the control unit and the voltage division detection circuit, and is used to collect the digital voltage quantity of the IGBT module to be tested and send it to the control unit; The second analog-to-digital conversion chip is connected to the control unit and the IGBT module to be tested, and is used to collect the digital current quantity of the IGBT module to be tested and send it to the control unit.

8. The IGBT module turn-on test system according to claim 5, characterized in that, It further includes: A display unit, connected to the control unit, and is used to display the feedback signal, the digital voltage quantity, and the digital current quantity.

9. The IGBT module turn-on test system according to any one of claims 1-7, characterized in that, It further includes: A power supply unit, connected to the control unit, the IGBT driver module test unit, the IGBT power module test unit, the analog quantity output unit, and the ADC acquisition unit, and provides working power for the control unit, the IGBT driver module test unit, the IGBT power module test unit, the analog quantity output unit, and the ADC acquisition unit.

10. The IGBT module turn-on test system according to claim 1, characterized in that, At least one group of the IGBT driver module test units and at least one group of the IGBT power module test units are provided.

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