Light-operated calibration tool

Abstract

The utility model relates to a light-operated calibration tool. The light-operated calibration tool particularly comprises the controllable photoresistor branch circuit, the controllable resistance value of the controllable photoresistor branch circuit can be accurately calculated by means of the known resistor branch circuit and the voltage measurement branch circuit, and then the light-operated calibration tool can be accurately calibrated by means of the characteristics that the resistance value of a photoresistor in the controllable photoresistor branch circuit is controllable when the photoresistor is illuminated and the resistance value of the photoresistor is stable. Any required accurate resistance value is provided for calibration, a standard resistor disc does not need to be replaced frequently, damage to a calibration instrument is avoided, safety is improved, meanwhile, testing of resistance values in different ranges of the to-be-tested equipment can be completed with high flexibility, and finally high-safety, flexible and accurate dynamic calibration of the to-be-tested equipment is achieved.

Description

Technical Field

[0001] The utility model is applicable to the technical field of calibration detection, and particularly relates to a light-controlled calibrator. Background Art

[0002] At present, the I-V mode of a semi-automatic probe station is often used to detect the electrical properties of superconducting devices. During the detection of the electrical properties of superconducting devices, resistance testing is particularly important in the superconducting process, and the stability and accuracy of the test results directly affect the yield of the tested products. Therefore, in order to ensure the credibility of the test results of the equipment, it is necessary to calibrate different range ranges of the probe station with resistors of different resistances before formally testing the equipment to be tested.

[0003] Currently, the calibration of the probe station mainly relies on standard resistance chips. However, at present, on the one hand, the resistance value specifications of the existing standard resistance chips in the market are few and the resistance values are discrete, resulting in insufficient calibration flexibility. On the other hand, there are also large errors in the accuracy and specifications of the existing standard resistance chips, resulting in poor accuracy of the current calibration. On the third hand, the specifications of the existing standard resistance chips in the market, especially the height, are not unified. During the process of calibrating the probe station with standard resistance chips of different resistance values, it is easy to damage the equipment due to the specification differences of the standard resistance chips during the replacement of the standard resistance chips.

[0004] Therefore, the current calibration scheme for the probe station has problems of insufficient safety, flexibility, and accuracy. Summary of the Utility Model

[0005] In view of this, an embodiment of the utility model provides a light-controlled calibrator to solve the technical problems of insufficient safety, inflexibility, and inaccuracy in the current calibration method.

[0006] The utility model provides a light-controlled calibrator, which includes a power supply branch, a to-be-tested device selection connection branch, a known resistance branch, a controllable photosensitive resistance branch, a first voltage measurement branch, and a second voltage measurement branch;

[0007] The positive terminal of the power supply branch is connected to the input end of the to-be-tested device selection connection branch, the negative terminal of the power supply branch is grounded, the output end of the to-be-tested device selection connection branch is connected to the input end of the controllable photosensitive resistance branch, the output end of the controllable photosensitive resistance branch is connected to the input end of the known resistance branch, and the output end of the known resistance branch is grounded;

[0008] The second voltage measurement branch is connected in parallel with the controllable photosensitive resistance branch, and the first voltage measurement branch is connected in parallel with the to-be-tested device selection connection branch.

[0009] The beneficial effects of the utility model compared with the prior art are:

[0010] For the power supply branch, the branch for selecting the device under test, the known resistor branch, the controllable photosensitive resistor branch, the first voltage measurement branch, and the second voltage measurement branch of the light control calibration tool of the present utility model, by means of the known resistor branch and the voltage measurement branch therein, the controllable resistance value of the controllable photosensitive resistor branch can be accurately calculated. Then, by utilizing the characteristics that the photosensitive resistor in the controllable photosensitive resistor branch has a controllable resistance value under light illumination and its own resistance value is stable, any required accurate resistance value for calibration can be achieved by adjusting the light intensity received by the photosensitive resistor in the controllable photosensitive resistor branch. Instead of frequently replacing the standard resistor chip as in the prior art, it can avoid damage to the calibration instrument and improve safety. At the same time, it can accurately test different range resistance values of the device under test with high flexibility, and finally achieve high-safety, flexible, and accurate dynamic calibration of the device under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0012] Figure 1 FIG. 1 is a schematic circuit structure diagram of a light control calibration tool provided by an embodiment of the present utility model;

[0013] Figure 2 FIG. 2 is a schematic flow chart of a light control dynamic calibration method provided by an embodiment of the present utility model. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0014] The following will clearly and completely describe the technical solutions in the embodiments of the present utility model with reference to the drawings in the embodiments of the present utility model. Obviously, the described embodiments are some, but not all, of the embodiments of the present utility model. All other embodiments obtained by those of ordinary skill in the art without creative efforts based on the embodiments of the present utility model belong to the scope of protection of the present utility model.

[0015] It should be understood that the present utility model can be implemented in different forms and should not be construed as limited to the embodiments presented herein. On the contrary, providing these embodiments will make the disclosure thorough and complete, and will fully convey the scope of the present utility model to those skilled in the art. In the drawings, for clarity, the dimensions and relative dimensions of layers and regions may be exaggerated. The same reference numerals denote the same elements throughout the drawings.

[0016] It should be understood that when an element or layer is referred to as "on", "adjacent to", "connected to" or "coupled to" another element or layer, it can be directly on, adjacent to, connected or coupled to the other element or layer, or there may be intervening elements or layers. In contrast, when an element is referred to as "directly on", "directly adjacent to", "directly connected to" or "directly coupled to" another element or layer, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Thus, without departing from the teachings of the present invention, the first element, component, region, layer or part discussed below may be denoted as the second element, component, region, layer or part.

[0017] Spatial relationship terms such as "under", "below", "lower", "beneath", "above", "upper", etc. are used herein for convenience in describing the relationship of one element or feature shown in the figures to other elements or features. It should be understood that, in addition to the orientation shown in the figures, spatial relationship terms are intended to include different orientations of the device in use and operation. For example, if the device in the figures is flipped, then an element or feature described as "under" or "beneath" or "below" another element or feature will be oriented "above" the other element or feature. Thus, the exemplary terms "under" and "below" can include both an upper and a lower orientation. The device may be otherwise oriented (rotated 90 degrees or other orientations) and the spatial descriptors used herein are to be interpreted accordingly.

[0018] The purpose of the terms used herein is only to describe specific embodiments and is not a limitation of the present invention. As used herein, the singular forms "a", "an" and "the" are also intended to include the plural forms unless the context clearly dictates otherwise. It should also be understood that the terms "comprising" and / or "including", when used in this specification, specify the presence of the stated features, integers, steps, operations, elements and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups. As used herein, the term "and / or" includes any and all combinations of the associated listed items.

[0019] To fully understand the present invention, detailed structures and steps will be set forth in the following description in order to explain the technical solutions proposed by the present invention. The preferred embodiments of the present invention are described in detail below. However, in addition to these detailed descriptions, the present invention may have other embodiments.

[0020] Such asFigure 1 As shown, it is a schematic circuit diagram of a light-controlled calibration tool provided by an embodiment of the present utility model, which includes a power supply branch 101, a switch branch 102, a test device selection branch 103, a known resistor branch 104, a controllable photosensitive resistor branch 105, a first voltage measurement branch 106, and a second voltage measurement branch 107;

[0021] Among them, the negative terminal of the power supply branch 101 is grounded, the positive terminal of the power supply branch 101 is connected to one end of the switch branch 102, the other end of the switch branch 102 is connected to the input end of the test device selection branch 103, the output end of the test device selection branch 103 is connected to the input end of the controllable photosensitive resistor branch 105, the output end of the controllable photosensitive resistor branch 105 is connected to the input end of the known resistor branch 104, and the output end of the known resistor branch 104 is grounded.

[0022] And, the second voltage measurement branch 107 is connected in parallel with the controllable photosensitive resistor branch 105, and the first voltage measurement branch 106 is connected in parallel with the test device selection branch 103.

[0023] The light-controlled calibration tool shown in this embodiment particularly includes the controllable photosensitive resistor branch 105. Since the resistance value of the photosensitive resistor is directly affected by the light intensity and is controllable, the method of changing the light intensity received by the photosensitive resistor can be used to purposefully change the resistance value of the photosensitive resistor. By using the known resistance value of the known resistor branch 104 and the voltage on the known resistor branch calculated by the power supply branch and the two voltage measurement branches, the loop current of the entire light-controlled calibration tool is calculated. Then, by using the loop current and the voltage measured by the second voltage measurement branch, the resistance value of the controllable photosensitive resistor branch is calculated. Thus, the sensitivity and stability of the photosensitive resistor are used to adjust and change the resistance, obtaining an ideal calibration resistor with an accurately known resistance value. When changing the resistance value of the resistor required for calibration, it is not necessary to replace standard resistor chips with different resistance values as in the prior art, but only to change the light intensity. This avoids the damage of the calibration instrument that may be caused by frequently replacing standard resistor chips, improves safety, and at the same time improves calibration flexibility and calibration efficiency.

[0024] Since the function of the above-mentioned switch branch 102 is only to control the power-on and power-off of the overall loop of the calibration tool, in other embodiments, the light-controlled calibration tool may not include the above-mentioned switch branch 102. At this time, the positive terminal of the power supply branch 101 is directly connected to the input end of the test device selection branch 103.

[0025] In this way, the overall structure of the light-controlled calibration tool can be simplified, reducing costs while improving reliability.

[0026] In one embodiment, the controllable photoresistor branch 105 includes an adjustable current source, a light-emitting diode, and a photoresistor. The output terminal of the adjustable current source is connected to the positive electrode of the light-emitting diode, the negative electrode of the light-emitting diode is connected to the input terminal of the adjustable current source, and the resistance value of the photoresistor is controlled by the illumination intensity of the light-emitting diode, that is, the photoresistor is arranged adjacent to the light-emitting diode, and the photoresistor receives the light emitted by the light-emitting diode.

[0027] In this embodiment, by changing the magnitude of the current output by the adjustable current source, the magnitude of the illumination intensity emitted by the light-emitting diode can be changed, thereby controlling the resistance value of the photoresistor by changing the magnitude of the illumination intensity, and realizing flexible regulation of the overall resistance value of the controllable photoresistor branch. The adjustable current source in this embodiment includes Figure 1 the two-stage current output shown, that is, current stage I source1 and current stage I source2 . In other embodiments, other adjustable current source forms can also be selected according to requirements, and specific limitations are not provided in this embodiment.

[0028] Of course, in other embodiments, regarding the controllable photoresistor branch 105, it can also be as Figure 1 shown. The optocoupler 1 is used to generate light excitation, and then the light-receiving part in the optocoupler 1 controls the magnitude of the current flowing through the light-emitting diode, thereby controlling the magnitude of the illumination intensity received by the photoresistor. By means of this light-electric-optical conversion process, the stability of the light intensity is improved, thereby improving the stability and accuracy of the resistance value of the controllable photoresistor branch 105 used for calibration, and improving the calibration effect.

[0029] Preferably, the optocoupler 1, the light-emitting diode, and the photoresistor are all arranged in the light-shielding housing 2.

[0030] In one embodiment, the branch 103 for connecting the device under test includes a first single-pole double-throw switch K2 and a second single-pole double-throw switch K3. The moving end of the first single-pole double-throw switch K2 is connected to the input end of the branch 103 for connecting the device under test, the moving end of the second single-pole double-throw switch K3 is connected to the output end of the branch 103 for connecting the device under test, the first fixed end of the first single-pole double-throw switch K2 is connected to the first fixed end of the second single-pole double-throw switch K3, that is, the directly connected ends of the switch K2 and the switch K3 as Figure 1 shown, the second fixed end of the first single-pole double-throw switch K2 is also the c end as Figure 1 shown, and the second fixed end of the second single-pole double-throw switch K3 is also the d end as Figure 1 shown, which are used to connect the two ends of the device under test, that is, the DUT as Figure 1 shown.

[0031] Using two single-pole double-throw switches to form the selected connection branch 103 of the device under test in the above manner, it is possible to adjust the resistance value of the controllable photosensitive resistor branch 105 in both cases of connecting the device under test DUT and not connecting the device under test DUT by connecting both switches to the first fixed end or the second fixed end simultaneously, further improving the calibration flexibility of the optical control calibrator.

[0032] In one embodiment, the power supply branch 101 is as Figure 1 shown and includes a power supply U1, and the power supply U1 is a probe station power supply. The positive pole of the probe station power supply is connected to the positive terminal of the power supply branch, and the negative pole of the probe station power supply is connected to the negative terminal of the power supply branch.

[0033] Utilizing the excellent voltage supply stability of the probe station power supply can further ensure the accuracy of the resistance value of the controllable photosensitive resistor branch 105 calculated using Ohm's law, thereby improving the calibration accuracy.

[0034] In one embodiment, the set known resistor branch 104 includes a first resistor R1 as Figure 1 shown, and the first voltage measurement branch 106 includes a first voltmeter V1, and the second voltage measurement branch 107 includes a second voltmeter V2.

[0035] Furthermore, in a preferred embodiment, the second voltage measurement branch further includes a first on-off switch K4, and the first on-off switch K4 is connected in series with the second voltmeter V2 in the second voltage measurement branch.

[0036] Considering that the resistance value of the photosensitive resistor is inversely proportional to the light intensity, when the current source is not working, the photosensitive resistor has a large resistance due to no illumination, and the voltage across it is large at this time. If the second voltmeter V2 is always connected in parallel with the photosensitive resistor, there may be a possibility of damaging the second voltmeter V2 because the voltage across the photosensitive resistor is large and may exceed the range of the second voltmeter V2. Therefore, by the additionally provided first on-off switch K4, it is possible to control whether the second voltmeter V2 is connected in parallel with the controllable photosensitive resistor branch 105, avoiding damage to the second voltmeter V2.

[0037] It should be noted that in the above embodiment, the first voltage measurement branch 106 is directly connected in parallel with the selected connection branch 103 of the device under test. In other embodiments, it is easy to understand that the first voltage measurement branch 106 can also be as Figure 1 shown, connected in parallel with the device under test DUT, and the two parallel connection methods will not cause any change in the results.

[0038] As Figure 2 shown, it is a schematic flowchart of an optical control dynamic calibration method applied to the above optical control calibrator provided by an embodiment of the present invention, and the method includes the following steps.

[0039] In step S201, control the selection connection branch of the device under test to connect to the device under test. Based on the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, the second voltage measured by the second voltage measurement branch, and the resistance value of the known resistance branch, determine the loop current flowing through the known resistance branch.

[0040] As Figure 1 shown, since the calibration tool is to test and calibrate the device under test, first control the selection connection branch 103 of the device under test to connect to the device under test DUT, and close the switch branch 102 when the switch branch 102 is included in the overall circuit structure of the optical control calibration tool, and close the first on-off switch K4 when the second voltage measurement branch includes the first on-off switch K4. Then, based on the power supply voltage of the power supply branch, the first voltage measured by the first voltage measurement branch, and the second voltage measured by the second voltage measurement branch, determine the voltage on the known resistance branch. And since the resistance of the known resistance branch is known, the current flowing through the known resistance branch can be calculated based on Ohm's law. Since other branches are in series with the known resistance branch, the current flowing through the known resistance branch is the overall loop current of the optical control calibration tool.

[0041] Among them, the current flowing through the known resistance branch is:

[0042]

[0043] Among them, I is the current flowing through the known resistance branch, that is, the loop current, R1 is the resistance value of the known resistance branch, U1 is the power supply voltage of the power supply branch, V1 is the first voltage measured by the first voltage measurement branch, and V2 is the second voltage measured by the second voltage measurement branch.

[0044] In step S{202}, based on the loop current and the second voltage, determine the controllable resistance value of the controllable photosensitive resistance branch. Based on the loop current and the first voltage, determine the resistance of the device under test.

[0045] After determining the current of the overall loop of the optical control calibration tool, the controllable resistance value of the controllable photosensitive resistance branch can be calculated according to the second voltage measured by the second voltage measurement branch:

[0046]

[0047] Among them, R L is the controllable resistance value of the controllable photosensitive resistance branch;

[0048] And, based on the loop current and the first voltage measured by the first voltage measurement branch, the resistance value of the device under test can be calculated:

[0049]

[0050] wherein, R DUT is the resistance of the device under test.

[0051] Step S203: Change the controllable resistance value of the controllable photosensitive resistor branch, and determine the resistance of the device under test correspondingly after each change of the controllable resistance value of the controllable photosensitive resistor branch, so as to complete the test of different range resistance values of the device under test.

[0052] Since the measurement requirement for the device under test is to complete the calibration test of different range resistance values, and the initial controllable resistance value of the controllable photosensitive resistor branch is probably not the desired one either, after obtaining the initial controllable resistance value of the controllable photosensitive resistor branch, it is necessary to change the controllable resistance value of the controllable photosensitive resistor branch. The purpose is to adjust the controllable resistance value of the controllable photosensitive resistor branch to the resistance value required for calibration, and determine the resistance of the device under test again correspondingly after each change of the controllable resistance value of the controllable photosensitive resistor branch, so as to complete the test of different range resistance values of the device under test.

[0053] The beneficial effects that can be achieved in this embodiment have been described in the above embodiment of the optical control calibration tool, so they will not be repeated here.

[0054] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A light-controlled calibrator, characterized in that, It includes a power supply branch, a branch for selecting the device under test, a known resistor branch, a controllable photoresistor branch, a first voltage measurement branch, and a second voltage measurement branch; The positive terminal of the power supply branch is connected to the input end of the branch for selecting the device under test, the negative terminal of the power supply branch is grounded, the output end of the branch for selecting the device under test is connected to the input end of the controllable photoresistor branch, the output end of the controllable photoresistor branch is connected to the input end of the known resistor branch, and the output end of the known resistor branch is grounded; The second voltage measurement branch is in parallel with the controllable photoresistor branch, and the first voltage measurement branch is in parallel with the branch for selecting the device under test.

2. The optical control calibration device according to claim 1, characterized in that, The controllable photoresistor branch includes an adjustable current source, a light-emitting diode, and a photoresistor; The output end of the adjustable current source is connected to the positive electrode of the light-emitting diode, the negative electrode of the light-emitting diode is connected to the input end of the adjustable current source, and the resistance value of the photoresistor is controlled by the light intensity of the light-emitting diode.

3. The optical control calibrator according to claim 1, characterized in that The branch for selecting the device under test includes a first single-pole double-throw switch and a second single-pole double-throw switch. The moving end of the first single-pole double-throw switch is connected to the input end of the branch for selecting the device under test, the moving end of the second single-pole double-throw switch is connected to the output end of the branch for selecting the device under test. The first fixed end of the first single-pole double-throw switch is connected to the first fixed end of the second single-pole double-throw switch. The second fixed end of the first single-pole double-throw switch and the second fixed end of the second single-pole double-throw switch are used to connect the two ends of the device under test.

4. The optical control calibrator according to claim 1, wherein The power supply branch includes a probe station power supply. The positive electrode of the probe station power supply is connected to the positive terminal of the power supply branch, and the negative electrode of the probe station power supply is connected to the negative terminal of the power supply branch.

5. The optical control calibration device according to claim 1, characterized in that, The known resistor branch includes a first resistor, and the resistance value of the first resistor is selected manually.

6. The optical control calibration device according to claim 1, characterized in that, The first voltage measurement branch includes a first voltmeter, and the second voltage measurement branch includes a second voltmeter.

7. The optical control calibration device according to claim 6, characterized in that The second voltage measurement branch also includes a first connection.

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