High-compatibility test probe

Abstract

The utility model discloses a high-compatibility test probe, which comprises a hollow shell assembly and a central probe coaxially and fixedly arranged in the shell assembly through an insulating medium, and the shell assembly is arranged on a flange fixing piece in a floating manner through a first spring; the shell assembly comprises a main shell and a first outer conductor which is installed on a test section of the main shell in a floating mode through a second spring, an adjusting sleeve is further arranged between the main shell and the first outer conductor, and the floating stroke of the first outer conductor can be adjusted. According to the high-compatibility test probe provided by the utility model, the effective stroke of the first outer conductor can be adjusted through the adjusting sleeve, so that the connector to be tested and the test probe are prevented from being deformed due to excessive overstock, and good electrical contact between the test probe and the inner and outer conductors of the connector to be tested is ensured; accurate testing of various connectors with different structural designs is realized.

Description

Technical Field

[0001] The utility model belongs to the technical field of electric connectors, and in particular relates to a test probe. Background Art

[0002] With the rapid development of communication information technology, mobile phones have become an indispensable part of people's daily lives. During RF circuit conduction testing in the mobile communications and consumer electronics industries, ensuring that the RF test probe and the corresponding switch test socket are aligned coaxially and centrally is crucial for achieving stable and reliable test results. To test the performance of the coaxial connector sockets currently used in mobile phone testing, a corresponding test connector is required.

[0003] like Figure 6 and Figure 7 As shown, there are two connectors with different structural designs from the same series. Figure 6 The insulator of the connector is higher than the outer conductor. Figure 7 The insulator of the connector is lower than the outer conductor; the outer conductor has no fixed contact surface, relying on an arc-shaped spring-type outer conductor to achieve elastic contact. The height difference between the inner and outer conductors of different coaxial connector styles varies. Considering that the connector outer conductor is made through a stamping process, the initial outer diameter of the connector outer conductor often varies, with a tolerance of ±0.20. When ordinary test probes are used to test connectors beyond their effective working range, they can easily cause plastic deformation of the connector's inner and outer conductors. Therefore, it is necessary to design a highly compatible test probe that can simultaneously meet the testing requirements of multiple types of connector structures. Utility Model Content

[0004] The purpose of the utility model is to provide a high-compatibility test probe to solve the problems of the prior art.

[0005] To achieve the above objectives, the present invention provides the following technical solutions:

[0006] A high-compatibility test probe comprises a hollow shell assembly and a center probe coaxially fixedly mounted in the shell assembly via an insulating medium. The shell assembly is floatingly mounted on a flange fixing member via a first spring. The shell assembly comprises a main shell and a first outer conductor on a test section of the main shell floatingly mounted via a second spring. An adjustment sleeve is also provided between the main shell and the first outer conductor to adjust the floating stroke of the first outer conductor.

[0007] Furthermore, the housing assembly further comprises a fixed sleeve, one end of which is coaxially fixedly sleeved on the test section of the main housing, and the other end of which is threadedly connected to the adjusting sleeve.

[0008] Furthermore, the housing assembly further includes a second outer conductor, one end of the second outer conductor is fixedly connected to the fixed sleeve, and the other end of the second outer conductor is slidably connected to the first outer conductor.

[0009] Furthermore, the insulating medium includes a first insulator provided between the main housing and the center probe, a second insulator provided between the fixed sleeve and the center probe, and a third insulator provided between the second outer conductor and the center probe.

[0010] Furthermore, the output section of the main housing is provided with an external thread for convenient connection with an interface of a signal output device, and a first limit platform is further provided below the external thread.

[0011] Furthermore, the flange fixing member further includes a floating cavity capable of accommodating the first spring, and one end of the first spring abuts against the end surface of the fixing sleeve, and the other end abuts against the inner bottom surface of the floating cavity.

[0012] Furthermore, a second limiting platform with an outer diameter larger than the inner diameter of the floating cavity is provided in the middle of the fixed sleeve to cooperate with the first limiting platform to limit the floating range of the shell assembly.

[0013] Furthermore, the first outer conductor is a hollow stepped sleeve, and a first pair of cavities and a second pair of cavities with stepped transitions are provided inside the first outer conductor. The first pair of cavities is located below the second pair of cavities, and the inner diameter of the first pair of cavities is larger than the inner diameter of the second pair of cavities.

[0014] Furthermore, the inner walls of the first pair of insertion cavities and the second pair of insertion cavities partially expand outward to form guiding inclined surfaces with a certain inclination angle.

[0015] Furthermore, the end of the second outer conductor is provided with a third limiting platform capable of abutting against the inner shoulder of the first outer conductor, and the lower end surface of the adjusting sleeve can abut against the outer shoulder of the first outer conductor.

[0016] Compared with the existing technology, the beneficial technical effects are:

[0017] The high-compatibility test probe provided by the present invention can adjust the effective stroke of the first outer conductor by adjusting the sleeve, thereby preventing the connector to be tested and the test probe from being deformed due to excessive compression, ensuring that the test probe has good electrical contact with the inner and outer conductors of the connector to be tested, and realizing accurate testing of connectors with various different structural designs. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The drawings described below are only some embodiments. A person skilled in the art can derive other drawings based on these drawings without inventive effort. In the drawings:

[0019] Figure 1 A schematic diagram of the overall structure of a high-compatibility test probe provided by an embodiment of the utility model;

[0020] Figure 2 An exploded diagram of a high-compatibility test probe provided by an embodiment of the present utility model;

[0021] Figure 3 A cross-sectional view of a high-compatibility test probe provided by an embodiment of the present utility model;

[0022] Figure 4 A cross-sectional view of a high-compatibility test probe provided by an embodiment of the present utility model when testing a connector in which the dielectric protrudes beyond the outer conductor;

[0023] Figure 5 A cross-sectional view of a high-compatibility test probe provided by an embodiment of the present utility model when testing a connector whose dielectric is lower than the outer conductor;

[0024] Figure 6 A schematic diagram of the structure of a connector in which the insulator is higher than the outer conductor;

[0025] Figure 7 This is a schematic diagram of the structure of a connector in which the insulator is higher than the outer conductor.

[0026] In the accompanying drawings, the components represented by the reference numerals are as follows:

[0027] 1-main shell, 101-external thread, 102-first limit platform, 2-fixing sleeve, 201-second limit platform, 202-adjusting thread 3-adjusting sleeve, 301-fourth limit platform, 4-first outer conductor, 401-first pair of insertion cavities, 402-second pair of insertion cavities, 403-guide ramp, 5-second outer conductor, 501-third limit platform, 6-flange fixing part, 601-fixing plate, 602-mounting sleeve, 7-first spring, 8-second spring, 9-center measuring needle, 901-first insulator, 902-second insulator, 903-third insulator, 10-outer conductor, 11-inner conductor, 12-insulator DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0029] The present invention provides a highly compatible test probe, comprising a test piece body and a flange fixing member 6. The test piece body comprises a hollow housing assembly and a center stylus 9. The center stylus 9 is coaxially fixedly mounted within the housing assembly via an insulating medium, and the housing assembly is floatingly mounted on the flange fixing member 6 via a first spring 7. Specifically:

[0030] like Figures 1 to 5 As shown, in this embodiment, the housing assembly includes a main housing 1, a fixing sleeve 2, an adjusting sleeve, a first outer conductor 4, and a second outer conductor 5.

[0031] The main housing 1 is a hollow, cylindrical structure that provides a stable external framework for the main probe, protecting its internal components from external physical damage and electromagnetic interference. The upper section (i.e., the output section) of the main housing 1 features external threads 101 for convenient connection to the interface of a signal output device. A first stop 102 is located below these threads. The lower section (i.e., the test section) of the main housing 1 features a fixed sleeve 2 for mounting the first outer conductor 4.

[0032] The flange fixing member 6 is coaxially sleeved on the lower section of the main housing 1. It comprises a fixing plate 601 and a mounting sleeve 602. A through-hole is defined in the center of the fixing plate 601, through which the lower section of the main housing 1 passes. Mounting holes are provided on either side of the fixing plate 601, allowing the test probe to be secured to the test equipment via bolts. The mounting sleeve 602 houses a floating cavity that accommodates a first spring 7. This first spring 7 is a compression spring, one end of which abuts the end surface of the fixing sleeve 2 and the other end abuts the inner bottom surface of the floating cavity. When in the standby state, the first stop 102 of the main housing 1 abuts the fixing plate 601 under the elastic force of the first spring 7. During testing, the housing assembly floats upward relative to the flange fixing member 6. The elastic force provided by the first spring 7 ensures that the test probe maintains a certain pressure when in contact with the object being tested, ensuring a good electrical connection while also preventing the object being overly squeezed and deformed, thereby extending the service life of the test probe.

[0033] One end of the fixed sleeve 2 is coaxially fixed to the lower section of the main housing 1 by riveting. A second stop 201, with an outer diameter larger than the inner diameter of the floating cavity, is located in the middle of the fixed sleeve 2. This second stop cooperates with the first stop 102 to limit the floating range of the housing assembly. A second outer conductor 5 is coaxially fixedly connected to the other end of the fixed sleeve 2.

[0034] The first outer conductor 4 is a hollow stepped sleeve, serving as the outer conductor that directly mates with the center stylus 9 for mating with the connector under test. The first outer conductor 4 is coaxially sleeved onto the second outer conductor 5. One end of the second spring 8 abuts the second outer conductor 5, while the other end abuts the fixed sleeve 2, allowing the first outer conductor 4 to slide up and down along the second outer conductor 5. Furthermore, the lower end (the mating end) of the first outer conductor 4 is internally provided with a first pair of insertion cavities 401 and a second pair of insertion cavities 402, each with a stepped transition. The first pair of insertion cavities 401 is located below the second pair of insertion cavities 402, and the inner diameter of the first pair of insertion cavities 401 is larger than that of the second pair of insertion cavities 402, accommodating testing of coaxial connectors with a wider range of shapes and structures. Portions of the inner walls of the first and second pairs of insertion cavities 401 and 402 are expanded outward to form a guide ramp 403 with a predetermined angle, facilitating mating of the first outer conductor 4 with the outer conductor 10 of the connector under test during testing and minimizing wear.

[0035] As a preferred embodiment, the end of the second outer conductor 5 is provided with a third limit platform 501 that can abut against the internal shoulder of the first outer conductor 4, and the lower end of the fixed sleeve 2 is also provided with an adjusting thread, the adjusting sleeve is threadedly connected to the fixed sleeve 2, and the lower end surface of the adjusting sleeve (i.e., the fourth limit platform 301) can abut against the external shoulder of the first outer conductor 4. By rotating the adjusting sleeve, the distance between the fourth limit platform 301 and the external shoulder can be adjusted, thereby controlling the effective stroke of the first outer conductor 4 (i.e., controlling the height difference between the first outer conductor 4 and the center probe 9), avoiding the outer conductor 10, inner conductor 11, insulator 12 of the connector to be tested, and the claw piece or center probe 9 of the first outer conductor 4 of the test probe from being excessively pressed and deformed, ensuring that the test probe has good electrical contact with the inner and outer conductors 10 of the connector to be tested, and realizing accurate testing of connectors with various different structural designs.

[0036] The center stylus 9 is made of a metallic conductive material in a needle-like shape, and its lower end is a test probe that directly contacts the high-frequency terminal of the product to be tested. The insulating medium comprises a first insulator 901, a second insulator 902, and a third insulator 903. The first insulator 901 is disposed within the output section of the main housing 1 to isolate the inner wall of the main housing 1 from the center stylus 9 and to secure the position of the center stylus 9. The second insulator 902 and the third insulator 903 are disposed between the fixed sleeve 2 and the center stylus 9 and between the second outer conductor 5 and the center stylus 9, respectively, to maintain the center stylus 9 on the same axis as the housing assembly and prevent the center stylus 9 from deflecting during insertion.

[0037] The above-described embodiments merely represent implementation methods of the present invention. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements fall within the scope of protection of the present invention. Therefore, the scope of protection of the present utility model patent shall be determined by the appended claims.

Claims

1. A high-compatibility test probe, comprising a hollow housing assembly and a center probe (9) coaxially fixedly mounted in the housing assembly via an insulating medium, wherein the housing assembly is floatingly mounted on a flange fixing member (6) via a first spring (7); characterized in that: The housing assembly comprises a main housing (1) and a first outer conductor (4) on a test section of the main housing (1) that is floatingly mounted via a second spring (8); an adjustment sleeve is further provided between the main housing (1) and the first outer conductor (4) to adjust the floating stroke of the first outer conductor (4).

2. A high compatibility test probe according to claim 1, characterized in that: The housing assembly further comprises a fixed sleeve (2), one end of which is coaxially fixedly sleeved on the test section of the main housing (1), and the other end of which is threadedly connected to the adjustment sleeve.

3. The high-compatibility test probe according to claim 2, characterized in that: The housing assembly further comprises a second outer conductor (5), one end of the second outer conductor (5) being fixedly connected to the fixed sleeve (2) and the other end being slidably connected to the first outer conductor (4).

4. The high-compatibility test probe according to claim 3, characterized in that: The insulating medium comprises a first insulator (901) provided between the main housing (1) and the center measuring needle (9), a second insulator (902) provided between the fixed sleeve (2) and the center measuring needle (9), and a third insulator (903) provided between the second outer conductor (5) and the center measuring needle (9).

5. The high-compatibility test probe according to claim 1, characterized in that: The output section of the main housing (1) is provided with an external thread (101) for convenient connection with an interface of a signal output device, and a first limiting platform (102) is further provided below the external thread (101).

6. The high-compatibility test probe according to claim 2, characterized in that: The flange fixing member (6) also includes a floating cavity capable of accommodating the first spring (7), one end of the first spring (7) abuts against the end surface of the fixing sleeve (2), and the other end abuts against the inner bottom surface of the floating cavity.

7. The high-compatibility test probe according to claim 6, characterized in that: A second limiting platform (201) having an outer diameter greater than the inner diameter of the floating cavity is provided in the middle of the fixed sleeve (2) to cooperate with the first limiting platform (102) to limit the floating range of the housing assembly.

8. The high-compatibility test probe according to claim 3, characterized in that: The first outer conductor (4) is a hollow stepped sleeve. A first pair of insertion cavities (401) and a second pair of insertion cavities (402) with stepped transitions are provided inside the first outer conductor (4). The first pair of insertion cavities (401) is located below the second pair of insertion cavities (402), and the inner diameter of the first pair of insertion cavities (401) is larger than the inner diameter of the second pair of insertion cavities (402).

9. The high-compatibility test probe according to claim 8, characterized in that: Part of the inner walls of the first pair of insertion cavities (401) and the second pair of insertion cavities (402) expand outwards to form guiding inclined surfaces (403) with a certain inclination angle.

10. The high-compatibility test probe according to claim 8, characterized in that: The end of the second outer conductor (5) is provided with a third limiting platform (501) capable of abutting against the inner shoulder of the first outer conductor (4), and the lower end surface of the adjustment sleeve can abut against the outer shoulder of the first outer conductor (4).

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