Debugging table for axial angle-digital converter

Abstract

The utility model discloses a debugging table for an axial angle-digital converter. The debugging table comprises an analog signal board, a test conversion board, a test equipment unit and a test upper computer, the analog signal board is used for providing a high-precision single / double-speed rotary transformer or selsyn standard signal source for a product to be tested; the test conversion board is used for converting the received high-precision single / double-speed rotary transformer or selsyn into various different parameter values of a product to be tested and outputting the parameter values for the test equipment unit and the test upper computer to collect; the test equipment unit is used for providing a direct-current power supply and an excitation signal for the analog signal board and the product to be tested, testing parameters output by the test conversion board and sending a test result to the test upper computer; the test upper computer is used for sending instructions to the analog signal board, the test conversion board and the test equipment unit, judging whether various parameters of the to-be-tested product are qualified or not according to the parameters returned by the test conversion board and the test equipment unit, and drawing a full-angle real-time inspection oscillogram of the to-be-tested product; therefore, quality defects in a product production debugging stage can be found in time.

Description

Technical Field

[0001] The utility model belongs to the technical field of batch production debugging and full-parameter automatic testing of shaft-angle-digital converters, in particular to a shaft-angle-digital converter debugging platform. Background Art

[0002] Currently, parameter testing for existing shaft-to-digital converters during debugging is primarily manual, resulting in low test efficiency, incomplete test parameters, and potential quality risks. This is especially true during mass production debugging, as a large amount of data parameters must be recorded, leading to generally low debugging efficiency. The few debugging platforms that have implemented automated testing during the debugging process primarily use imported equipment for their core parameter testing equipment, such as rotary transformers or synchro standard signal sources. These devices lack independent control, resulting in expensive platform construction and high maintenance costs. Furthermore, parameter testing only performs power-on parameter testing, and the product's static impedance test during power-off cannot be simultaneously considered. Key angular accuracy testing uses a step-by-step method, making full-angle, no-dead-angle testing impossible. Consequently, parameter testing is incomplete and production process defects cannot be promptly and effectively eliminated. Utility Model Content

[0003] The purpose of the present utility model is to improve the circuit structure and test host computer of the test bench, and build a full-parameter axis-to-digital converter automatic debugging bench based on an independently designed analog signal board that meets the product debugging needs, so as to improve the parameter testing efficiency and quality defect screening capability of the axis-to-digital converter batch production debugging, and at the same time, significantly reduce the construction cost of the axis-to-digital converter debugging bench and improve the maintainability of the commonly used debugging bench.

[0004] The technical solution for achieving the purpose of the utility model is: a shaft-to-digital converter debugging platform, which is used to test various functions and parameters of the shaft-to-digital converter during production debugging, including an analog signal board, a test conversion board, a test equipment unit, and a test host computer;

[0005] The analog signal board is used to provide a high-precision single / dual-speed rotary transformer or synchro standard signal source for the product to be tested;

[0006] The test conversion board is used to convert the received high-precision single / dual-speed rotary transformer or synchro into various parameter values of the product to be tested for output, which are collected by the test equipment unit and the test host computer;

[0007] The test equipment unit is used to provide a DC power supply and an excitation signal to the analog signal board and the product to be tested, and at the same time test the parameters output by the test conversion board and send the test results to the test host computer;

[0008] The test host computer is used to send instructions to the analog signal board, test conversion board and test equipment unit, judge whether the various parameters of the product to be tested are qualified according to the parameters returned by the test conversion board and test equipment unit, and draw a full-angle real-time inspection waveform diagram of the product to be tested.

[0009] Furthermore, after receiving the instruction from the test host computer, the test equipment unit outputs a DC power supply and an excitation signal to provide rated voltage for the normal operation of the product to be tested, and sends some parameter test values of the product to be tested to the test host computer for processing through the serial interface.

[0010] Furthermore, the analog signal board includes a first programmable logic device FPGA, a dual-channel, high-precision DRC and DSC converter, a resistor network unit and a first relay group; the dual-channel, high-precision DRC and DSC converter includes four converters, namely a first high-precision digital-resolver converter DRC, a second high-precision digital-resolver converter DRC, a first high-precision digital-auto-synchro converter DSC and a second high-precision digital-auto-synchro converter DSC;

[0011] The first programmable logic device FPGA is used to receive instructions from the test host computer and provide static digital angle values or dynamic digital angle values with constant speed changes for the dual-channel, high-precision DRC and DSC according to the requirements of the test items;

[0012] The resistor network unit adapts the excitation voltage of the received signal source through the adaptation resistor and the second relay group, and sends the excitation voltage to the dual-channel, high-precision DRC and DSC to provide an adapted reference voltage for the rated signal required for their output;

[0013] The dual-channel, high-precision DRC and DSC converter receives the digital value provided by the first programmable logic device FPGA and the reference voltage adapted by the resistor network unit, and provides an analog output of a single / dual-speed resolver signal or a synchro signal with high static angular accuracy or dynamic rotation for the product under test through real-time conversion within the converter's internal circuit;

[0014] The first relay group is used to connect or disconnect the analog signals output by the dual-channel, high-precision DRC and DSC converters with the subsequent product to be tested according to the instructions of the first programmable logic device FPGA.

[0015] Furthermore, the test conversion board includes an interface socket of the product to be tested, a second programmable logic device FPGA, a third relay group and connection terminals;

[0016] The interface socket of the product to be tested is provided with a power supply, an excitation signal, a standard analog shaft angle signal, a control signal, and various pins for outputting signals to be tested, and converts the received standard analog shaft angle signal into signal outputs of various parameter values to be tested according to the instructions of the second programmable logic device FPGA. The pins of the interface socket of the product to be tested are respectively connected to the analog signal board, the test equipment unit, the second programmable logic device FPGA, and the third relay group, receive the standard analog shaft angle signal from the analog signal board and the instructions of the second programmable logic device FPGA, and output various parameter signals to be tested.

[0017] The second programmable logic device FPGA is used to receive instructions from the test host computer and output instructions to adjust the working state of the product under test and the switch gating of the third relay group according to the test process; at the same time, the collected output angle digital quantity of the product under test is sent to the test host computer for processing;

[0018] The third relay group is used to connect the corresponding output signal end of the product to be tested with the connection terminal of the subsequent stage through the closing of the relay switch, so as to facilitate the signal collection test of the test equipment unit.

[0019] Furthermore, the interface socket of the product to be tested adopts a double-row locking socket as the motherboard interface of the adapter board of the product to be tested.

[0020] Furthermore, the test equipment unit includes a DC test power supply, an excitation signal source, a digital multimeter and an oscilloscope;

[0021] The DC test power supply is used to receive instructions from the test host computer, provide the required DC power supply voltage for the product to be tested, and feed back the tested power supply current value to the test host computer;

[0022] The excitation signal source is used to receive instructions from the test host computer, output AC signals of different frequencies and amplitudes according to the model of the product to be tested, and provide reference signals for the analog signal board and the test conversion board;

[0023] The digital multimeter is used to receive instructions from the test host computer and feed back the tested resistance and voltage parameter values to the test host computer for processing;

[0024] The oscilloscope is used to receive instructions from the test host computer and feed back the digital level and pulse width values of the tested functional signal to the test host computer for processing.

[0025] Furthermore, the test host computer is also used to configure the test equipment unit and the analog signal board through serial port communication.

[0026] Compared with the prior art, the present invention has the following significant advantages:

[0027] (1) Automated testing replaces manual testing, enabling power-off impedance testing and real-time drawing of angular accuracy waveforms, reducing parameter test omissions, making parameter testing more comprehensive, and significantly improving product debugging efficiency and debugging process quality.

[0028] (2) The independently built high-precision analog signal board can directly adjust the single-speed and dual-speed shaft angle simulation signal sources through the test host computer, thus achieving independence from the dependence on imported shaft angle simulators, reducing the construction cost of the test system and improving the maintainability of the debugging platform.

[0029] The present invention is described in further detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 The figure is a functional block diagram of a shaft-to-digital converter debugging station in one embodiment.

[0031] Figure 2 FIG. 1 is a schematic diagram of a resistor network unit of an analog signal board in an embodiment. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0033] It should be noted that if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by this utility model.

[0034] In one embodiment, combined Figure 1, provides a shaft-to-digital converter debugging platform, which is used to test various functions and parameters of the shaft-to-digital converter during production debugging, including an analog signal board, a test conversion board, a test equipment unit, and a test host computer;

[0035] The analog signal board 1 is used to receive the excitation signal of the test equipment unit and output static or dynamic modes according to the instructions of the test host computer, providing a high-precision single / dual-speed rotary transformer or synchro standard signal source for the product to be tested;

[0036] The test conversion board 2 is used to convert the received high-precision single / dual-speed rotary transformer or synchro into various parameter values of the product to be tested for output, which are collected by the test equipment unit and the test host computer;

[0037] The test equipment unit 3 is used to provide a DC power supply and an excitation signal to the analog signal board and the product to be tested, and to test the parameters output by the test conversion board and send the test results to the test host computer;

[0038] The test host computer 4 is used to send instructions to the analog signal board, the test conversion board and the test equipment unit, judge whether the various parameters of the product to be tested are qualified according to the parameters sent back by the test conversion board and the test equipment unit, and draw a full-angle real-time inspection waveform diagram of the product to be tested, so that the debugging personnel can check the full-angle conversion function of the product to be tested in real time.

[0039] Furthermore, in one embodiment, after receiving the instruction from the test host computer, the test equipment unit 3 outputs a DC power supply and an excitation signal to provide a rated voltage for the normal operation of the product to be tested, and sends some parameter test values of the product to be tested to the test host computer for processing through a serial interface.

[0040] Furthermore, in one embodiment, the analog signal board 1 includes a first programmable logic device FPGA5, a dual-channel, high-precision DRC and DSC converter, a resistor network unit 10, and a first relay group 11; the dual-channel, high-precision DRC and DSC converter includes four converters, namely a first high-precision digital-resolver converter DRC6, a second high-precision digital-resolver converter DRC7, a first high-precision digital-auto-synchro converter DSC8, and a second high-precision digital-auto-synchro converter DSC9;

[0041] The first programmable logic device FPGA5 is used to receive instructions from the test host computer 4 and provide static digital angle values or dynamic digital angle values with constant speed changes for the dual-channel, high-precision DRC and DSC according to the requirements of the test items;

[0042] The resistor network unit 10, combined with Figure 2 , adapting the excitation voltage of the received signal source through the adaptation resistor 12 and the second relay group 13, sending the excitation voltage to the dual-channel, high-precision DRC and DSC, and providing an adapted reference voltage for the rated signal required for its output;

[0043] Here, the resistor network unit receives the excitation voltage V output by the signal source Rhi-Rli , and according to the actual voltage Vout of the product to be tested 测 , select the appropriate resistor Rx according to the following formula, and after being controlled by the relay, connect it to the DRC and DSC converters to provide a fixed reference voltage for the high-precision converter.

[0044]

[0045] The dual-channel, high-precision DRC and DSC converter receives the digital value provided by the first programmable logic device FPGA and the reference voltage adapted by the resistor network unit, and provides a single / dual-speed resolver signal or synchro signal with high static angular accuracy or dynamic rotation for the product under test through real-time conversion within the converter's internal circuit, thereby replacing imported high-precision shaft angle simulators.

[0046] The first relay group 11 is used to connect or disconnect the analog signals output by the dual-channel, high-precision DRC and DSC converters with the subsequent product under test according to the instructions of the first programmable logic device FPGA.

[0047] Furthermore, in one embodiment, the test conversion board 2 includes a product interface socket 14 to be tested, a second programmable logic device FPGA 15 , a third relay group 16 and a connection terminal 17 ;

[0048] The product under test interface socket 14 is provided with a power supply, an excitation signal, a standard analog shaft angle signal, a control signal, and various pins for outputting signals to be tested. In accordance with the instructions of the second programmable logic device FPGA 15, the received standard analog shaft angle signal is converted into a signal output of various parameter values to be tested. The pins of the product under test interface socket are respectively connected to the analog signal board, the test equipment unit, the second programmable logic device FPGA, and the third relay group. It receives the standard analog shaft angle signal from the analog signal board and the instructions of the second programmable logic device FPGA, and outputs various parameter signals to be tested.

[0049] Here preferably, the interface socket of the product to be tested adopts a double-row locking socket as the motherboard interface of the adapter board of the product to be tested, which is convenient for replacement and transfer of different models of products.

[0050] The second programmable logic device FPGA 15 is used to receive instructions from the test host computer and output instructions to adjust the working state of the product under test and the switch gating of the third relay group according to the test process; at the same time, the collected output angle digital quantity of the product under test is sent to the test host computer for processing;

[0051] The third relay group 16 is used to connect the corresponding output signal end of the product to be tested with the connection terminal of the subsequent stage by closing the relay switch, so as to facilitate the signal collection test of the test equipment unit.

[0052] Furthermore, in one embodiment, the test equipment unit 3 includes a DC test power supply 18, an excitation signal source 19, a digital multimeter 20, and an oscilloscope 21;

[0053] The DC test power supply 18 is used to receive instructions from the test host computer, provide the required DC power supply voltage for the product to be tested, and feed back the tested power supply current value to the test host computer;

[0054] The excitation signal source 19 is used to receive instructions from the test host computer and output AC signals of different frequencies and amplitudes according to the model of the product to be tested, providing reference signals for the analog signal board and the test conversion board;

[0055] The digital multimeter 20 is used to receive instructions from the test host computer and feed back the tested resistance, voltage and other parameter values to the test host computer for processing;

[0056] The oscilloscope 21 is used to receive instructions from the test host computer and feed back numerical values such as the digital level and pulse width of the tested functional signal to the test host computer for processing.

[0057] Furthermore, in one embodiment, the test host computer is provided with a test equipment setting area, a parameter judgment setting area, a test item selection area, an angle data storage area, and a test data storage area. The test host computer communicates with test equipment such as a DC power supply, a signal source, a digital multimeter, an oscilloscope, and an analog signal board via a computer serial port. The test host computer configures the test equipment and analog signal board through the parameter and condition selection in the test equipment setting area to provide a rated working environment for the product to be tested; the parameter criterion setting area sets the qualified criterion for the performance parameters of the product to be tested, so that the test host computer can compare the collected parameter test values with the set qualified criterion to determine whether the relevant parameters are qualified; the test item selection area has 15 parameters and functional test items for the debugging personnel to choose, including power pin to ground resistance, power current, static angle accuracy, speed voltage, busy signal, resolution control check, 180° step check, power-on self-excitation check, prohibition function check, enable function check, byte selection function check, fault indication signal check, forward and reverse signal check, zero-crossing signal check, and full-angle output real-time check. The test item sends corresponding instructions to the analog signal board to adjust the output of the analog signal, adjusts the test conversion board to put the product to be tested in the corresponding working or power-off state, and then adjusts the test conversion board and the test equipment to test and collect various parameters and functions of the product, compares the collected test results with the test criteria set by the test host computer, determines whether the test results of various parameters of the product to be tested are qualified, and outputs the test data to the data buffer area; the angle data display area displays the current angle value during static angle accuracy test and the dynamic angle value during full-angle output real-time inspection in real time, and draws the angle transformation curve during full-angle output real-time inspection on the dynamic display time axis; when test data output is required, the test data storage area saves the test data as an EXCEL format file according to the selected storage path.

[0058] It should be noted that any technical features of the software program that may be implied in the present invention, the implementation of whose functions belong to the existing technology, the essence of the solution is to propose and improve the composition and connection relationship of the hardware parts, and does not involve improvements to the software program itself.

[0059] The utility model adopts self-produced high-precision DRC and DSC converters as the core components for generating standard rotary transformer or synchro signal sources, which solves the dependence on expensive foreign imported equipment during batch production and debugging of shaft-to-digital converters; the debugging platform adopts a structured design concept, with a simple circuit and easy maintenance and upgrading; the test host computer performs 360° full-angle real-time testing on the output angle value of the product to be tested and draws the test results into a waveform, which solves the test blind spots existing in the existing angular precision step test, improves the test quality of the product, and makes it more intuitive for the debugger to observe the results during debugging, which is more efficient.

[0060] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are only illustrative of the principles of the present invention. Without departing from the spirit and scope of the present invention, any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included in the scope of protection of the present invention.

Claims

1. A shaft-to-digital converter debugging platform, characterized in that: This debugging station is used to test the functions and parameters of the axis-to-digital converter during production debugging. It includes an analog signal board, a test conversion board, a test equipment unit, and a test host computer. The analog signal board is used to provide a high-precision single / dual-speed rotary transformer or synchro standard signal source for the product to be tested; The test conversion board is used to convert the received high-precision single / dual-speed rotary transformer or synchro into various parameter values of the product to be tested for output, which are collected by the test equipment unit and the test host computer; The test equipment unit is used to provide a DC power supply and an excitation signal to the analog signal board and the product to be tested, and at the same time test the parameters output by the test conversion board and send the test results to the test host computer; The test host computer is used to send instructions to the analog signal board, test conversion board and test equipment unit, judge whether the various parameters of the product to be tested are qualified according to the parameters returned by the test conversion board and test equipment unit, and draw a full-angle real-time inspection waveform diagram of the product to be tested.

2. The axis-to-digital converter debugging platform according to claim 1, characterized in that: After receiving the instruction from the test host computer, the test equipment unit outputs a DC power supply and an excitation signal to provide rated voltage for the normal operation of the product to be tested, and sends some parameter test values of the product to be tested to the test host computer for processing through a serial interface.

3. The axis-to-digital converter debugging platform according to claim 1, characterized in that: The analog signal board includes a first programmable logic device FPGA, a dual-channel, high-precision DRC and DSC converter, a resistor network unit and a first relay group; the dual-channel, high-precision DRC and DSC converter includes four converters, namely a first high-precision digital-resolver converter DRC, a second high-precision digital-resolver converter DRC, a first high-precision digital-auto-synchro converter DSC and a second high-precision digital-auto-synchro converter DSC; The first programmable logic device FPGA is used to receive instructions from the test host computer and provide static digital angle values or dynamic digital angle values with constant speed changes for the dual-channel, high-precision DRC and DSC according to the requirements of the test items; The resistor network unit adapts the excitation voltage of the received signal source through the adaptation resistor and the second relay group, and sends the excitation voltage to the dual-channel, high-precision DRC and DSC to provide an adapted reference voltage for the rated signal required for their output; The dual-channel, high-precision DRC and DSC converter receives the digital value provided by the first programmable logic device FPGA and the reference voltage adapted by the resistor network unit, and provides an analog output of a single / dual-speed resolver signal or a synchro signal with high static angular accuracy or dynamic rotation for the product under test through real-time conversion within the converter's internal circuit; The first relay group is used to connect or disconnect the analog signals output by the dual-channel, high-precision DRC and DSC converters with the subsequent product to be tested according to the instructions of the first programmable logic device FPGA.

4. The axis-to-digital converter debugging platform according to claim 3, characterized in that: The test conversion board includes an interface socket of a product to be tested, a second programmable logic device FPGA, a third relay group and connection terminals; The interface socket of the product to be tested is provided with a power supply, an excitation signal, a standard analog shaft angle signal, a control signal, and various pins for outputting signals to be tested, and converts the received standard analog shaft angle signal into signal outputs of various parameter values to be tested according to the instructions of the second programmable logic device FPGA. The pins of the interface socket of the product to be tested are respectively connected to the analog signal board, the test equipment unit, the second programmable logic device FPGA, and the third relay group, receive the standard analog shaft angle signal from the analog signal board and the instructions of the second programmable logic device FPGA, and output various parameter signals to be tested. The second programmable logic device FPGA is used to receive instructions from the test host computer and output instructions to adjust the working state of the product to be tested and the switch gating of the third relay group according to the test process; At the same time, the collected digital output angle of the product to be tested is sent to the test host computer for processing; The third relay group is used to connect the corresponding output signal end of the product to be tested with the connection terminal of the subsequent stage through the closing of the relay switch, so as to facilitate the signal collection test of the test equipment unit.

5. The axis-to-digital converter debugging platform according to claim 4, characterized in that: The interface socket of the product to be tested adopts a double-row locking socket as the motherboard interface of the adapter board of the product to be tested.

6. The axis-to-digital converter debugging platform according to claim 4, characterized in that: The test equipment unit includes a DC test power supply, an excitation signal source, a digital multimeter and an oscilloscope; The DC test power supply is used to receive instructions from the test host computer, provide the required DC power supply voltage for the product to be tested, and feed back the tested power supply current value to the test host computer; The excitation signal source is used to receive instructions from the test host computer, output AC signals of different frequencies and amplitudes according to the model of the product to be tested, and provide reference signals for the analog signal board and the test conversion board; The digital multimeter is used to receive instructions from the test host computer and feed back the tested resistance and voltage parameter values to the test host computer for processing; The oscilloscope is used to receive instructions from the test host computer and feed back the digital level and pulse width values of the tested functional signal to the test host computer for processing.

7. The axis-to-digital converter debugging platform according to claim 4, characterized in that: The test host computer is also used to configure the test equipment unit and the analog signal board through serial communication.

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