Detection tool and electronic component testing device

Abstract

The utility model provides a detection tool and an electronic component testing device, and the detection tool comprises a detection clamping jaw, the two opposite sides of the detection clamping jaw and / or the end part of the detection clamping jaw are / is provided with conduction parts, the detection clamping jaw can move close to or far away from an electronic component in a first direction, and the detection clamping jaw can clamp the electronic component; the conduction part is in contact with the contact of the electronic component and is conducted; or, the detection clamping jaw can abut against the electronic element in the first direction, so that the conduction part is in contact with the contact of the electronic element and is conducted with the contact of the electronic element. The detection tool provided by the embodiment of the utility model can be suitable for the electronic components with the contacts facing different directions.

Description

Technical Field

[0001] The present application belongs to the field of testing technology, and more specifically, relates to a testing tool and an electronic component testing device. Background Art

[0002] Film capacitors require testing before shipment to ensure product quality and prevent defective products from entering the market. During testing, a test probe is typically moved to contact the film capacitor's contacts, and the test circuit is connected to the test probe to perform the test.

[0003] However, different film capacitor products have contacts oriented in different directions: some are perpendicular to the length of the test probe, while others are shaped like a sheet and parallel to the length of the test probe. When the contact is parallel to the length, the thin sheet structure makes it difficult for the test probe to contact the contact, making the test impossible. Utility Model Content

[0004] An embodiment of the present application provides a detection tool that can be applied to electronic components with contacts facing different directions.

[0005] The technical solution adopted in the embodiment of the present application is to provide a testing tool for testing electronic components, the testing tool comprising:

[0006] A detection clamp, wherein a conductive portion is provided on the opposite sides of the detection clamp and / or the end of the detection clamp, and the detection clamp can be moved along a first direction close to or away from the electronic component, and the detection clamp can clamp the electronic component so that the conductive portion contacts and conducts with the contact of the electronic component; or, the detection clamp can abut the electronic component along the first direction so that the conductive portion contacts and conducts with the contact of the electronic component.

[0007] Furthermore, the detection clamp includes a first driver and two detection fingers, the detection fingers are both the conductive parts, the first driver can move along the first direction, the two detection fingers are arranged on the first driver, the first driver is used to drive the two detection fingers to move closer to or away from each other, the end of one detection finger away from the first driver can abut the contact along the first direction, or the two detection fingers can move closer to each other to clamp the contact.

[0008] Furthermore, one end of the detection finger close to the contact is bent into an L shape and is provided with a first contact end surface and a second contact end surface, the first contact end surface is perpendicular to the first direction, the second contact end surface is perpendicular to the first contact end surface, and the second contact end surfaces of the two detection fingers are arranged opposite to each other.

[0009] Furthermore, the detection clamp also includes two mounting connectors, the mounting connector includes a fixed section and a mounting section bent and connected to the fixed section, the fixed section is connected to the first driver, the mounting section extends from the fixed section in a direction away from the other mounting connector, and the detection clamp finger is adjustably arranged on the mounting section along the length direction of the mounting section.

[0010] Furthermore, the mounting section is provided with a plurality of tooth-groove structures, and the end of the detection clamping finger away from the contact point is provided with a tooth structure that can match and clamp with the tooth-groove structure.

[0011] Furthermore, the detection tooling further includes a second driver for driving the detection clamp to move along the first direction.

[0012] Furthermore, the detection tool also includes an elastic buffer component, one end of the elastic buffer component is connected to the second driver, and the other end is connected to the first driver.

[0013] Furthermore, the elastic buffer assembly includes a first connecting member, a guide rod, an elastic member and a second connecting member, the first connecting member is arranged on the first driver, the second connecting member is arranged on the second driver, the guide rod is arranged along the first direction, one end of the guide rod is fixedly connected to one of the first connecting member and the second connecting member, the other end of the guide rod is slidably passed through the other, and the elastic member is arranged between the first connecting member and the second connecting member.

[0014] Furthermore, the detection clamps are provided in plurality and are respectively arranged on both sides of the electronic component.

[0015] The embodiment of the present application further provides an electronic component testing device, comprising a feeding conveyor line, a screening mechanism, an empty pallet conveyor line, a pallet lowering mechanism, a pallet lifting mechanism, and a detection tool as described in any one of the above items;

[0016] The loading conveyor line is used to convey the tray carrying the electronic components and pass through the inspection tooling;

[0017] The empty pallet conveyor line is located below the loading conveyor line and has a conveying direction opposite to that of the loading conveyor line. The empty pallet conveyor line is used to convey empty pallets;

[0018] The pallet lowering mechanism is connected to the conveying end of the loading conveyor line and the input front end of the empty pallet conveyor line, and is used to transfer the pallet from the loading conveyor line to the empty pallet conveyor line;

[0019] The screening mechanism is provided above the tray lowering mechanism, and is used to remove the electronic components on the tray and transport the electronic components to a good product area or a defective product area according to the detection results;

[0020] The pallet lifting mechanism connects the conveying end of the empty pallet conveyor line and the input front end of the loading conveyor line, and is used to transfer the pallet from the empty pallet conveyor line to the loading conveyor line.

[0021] The beneficial effect of the detection tooling provided by the embodiment of the present application is that: a detection clamp is provided in the detection tooling of the embodiment of the present application, and the detection clamp can move along a first direction close to or away from the contact of the electronic component. During detection, the detection clamp can move along the first direction and then abut on the contact to perform detection. If the contact is parallel to the first direction, the detection clamp can move along the first direction close to the contact, and then clamp the contact and then perform detection. The design of using the detection clamp to directly abut or clamp the contact can adapt to electronic component contacts of different structures without guaranteeing the accuracy and reliability of the test, which makes the device applicable to various types of electronic component testing and has strong versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0023] Figure 1 A schematic diagram of the three-dimensional structure of the detection tooling provided in an embodiment of the present application;

[0024] Figure 2 A partial view of the inspection tool provided in an embodiment of the present application;

[0025] Figure 3 Another partial view of the inspection tool provided in an embodiment of the present application;

[0026] Figure 4 A schematic diagram of the three-dimensional structure of an electronic component testing device provided in an embodiment of the present application;

[0027] Figure 5 A side view of an electronic component testing device provided in an embodiment of the present application;

[0028] Figure 6 This is a simplified schematic diagram of the tray flow of the electronic component testing device provided in an embodiment of the present application.

[0029] Among them, the reference numerals in the figures are:

[0030] 1. Electronic component testing device;

[0031] 11. Feeding conveyor line;

[0032] 12. Inspection tooling; 121. Inspection gripper; 1211. First actuator; 1212. Inspection gripper finger; 12121. First contact end surface; 12122. Second contact end surface; 12123. Tooth structure; 1213. Mounting connector; 12131. Fixing section; 12132. Mounting section; 12133. Tooth-slot structure; 122. Second actuator; 123. Elastic buffer assembly; 1231. First connector; 1232. Elastic member; 1233. Second connector; 124. Frame; 125. Moving mechanism;

[0033] 13. Screening mechanism; 14. Empty pallet conveyor line; 15. Pallet lowering mechanism; 16. Pallet lifting mechanism;

[0034] 2. Electronic components; 21. Contacts;

[0035] 3. Pallet. DETAILED DESCRIPTION

[0036] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0037] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0038] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on this application.

[0039] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0040] See also Figure 2 and Figure 3 The detection tool 12 provided in the embodiment of the present application is now described. The detection tool 12 provided in the embodiment of the present application is used to detect electronic components 2.

[0041] During the inspection process of the electronic component 2, if the position of the electronic component 2 is offset during the inspection, it may cause inaccurate inspection results. Therefore, a tray 3 is used to position the electronic component 2. The tray 3 is provided with a specific positioning structure. For example, the tray 3 may have a groove that matches the shape of the electronic component 2. For example, for a rectangular electronic component 2, the tray 3 may have a rectangular groove. The electronic component 2 can be placed exactly in this groove, thereby maintaining a stable position during the inspection process. If there are holes on the electronic component 2, there may be positioning pins on the tray 3 corresponding to these holes. The positioning pins can be inserted into the holes of the electronic component 2 to fix the position of the electronic component 2.

[0042] The detection tooling 12 includes a detection jaw 121, and conductive parts are provided on the opposite sides of the detection jaw 121 and / or the ends of the detection jaw 121. The detection jaw 121 can move closer to or away from the electronic component along the first direction. The detection jaw 121 can clamp the electronic component 2 so that the conductive part contacts and conducts with the contact 21 of the electronic component 2; or, the detection jaw 121 can abut the electronic component 2 along the first direction so that the conductive part contacts and conducts with the contact 21 of the electronic component 2.

[0043] It can be understood that the position of the detection jaw 121 corresponds to the contact 21 of the electronic component 2, and can move closer to or away from the contact 21 along the first direction. The detection jaw 121 can clamp or release. The detection jaw 121 can clamp the contact 21 or abut the contact 21 along the first direction.

[0044] The position of the detection jaw 121 corresponds to the contact 21 of the electronic component 2, which means that the detection jaw 121 can accurately contact the position of the contact 21 of the electronic component 2 after approaching. The first direction can be the up-down direction, and the detection jaw 121 can move closer to or farther away from the contact 21 of the electronic component 2 along this direction. For example, when the detection jaw 121 needs to contact the contact 21 of the electronic component 2 for testing, it can move downward along the up-down direction to approach the contact 21, and then move upward away from the contact 21 after the test is completed.

[0045] The detection jaws 121 can be clamped or released. When open, they create space for the contacts 21 of the electronic component 2. Alternatively, they can be opened so that only one side of the jaws contacts the contacts 21. To tighten the contacts 21, the jaws 121 can be closed, firmly gripping them. For example, the jaws 121 can resemble a pair of pliers, with the opening and clamping actions achieved through mechanical movement.

[0046] If the contact 21 of the electronic component 2 is parallel to the first direction, for example, the contact 21 is a horizontal metal sheet, the detection jaw 121 can move along the first direction (vertical direction) to approach the contact 21, and then clamp the contact 21 to perform the test. If the contact 21 is perpendicular to the first direction, the detection jaw 121 can move along the first direction and then abut against the contact 21 to perform the test. For example, if the contact 21 is a metal column perpendicular to the vertical direction, the detection jaw 121 can move downward and directly abut against the metal column to perform the test.

[0047] Based on the above structure, the detection jig 12 of the embodiment of the present application can adapt to the contacts 21 of electronic components 2 with different structures. Because there are many types of electronic components 2, the shapes, directions and positions of the contacts 21 may be different, and the flexibility of the detection jaws 121 can ensure that it can make effective contact with various types of contacts 21, which makes the device applicable to various types of electronic component 2 testing and has strong versatility. Whether it is a small electronic component 2 or a large electronic component 2, whether the contact 21 is parallel to the first direction or perpendicular to the first direction, the detection jig 12 can perform effective detection. Secondly, by directly contacting the contacts 21 with the detection jaws 121 for detection, the generation of errors can be reduced and the authenticity of the detection results can be ensured.

[0048] In some embodiments, the inspection tool 12 further includes a frame 124 and a moving mechanism 125. The moving mechanism 125 can move laterally and longitudinally on the frame 124. The inspection jaw 121 is mounted on the moving mechanism 125 and can move with the movement of the moving mechanism 125, thereby transferring between the inspection station and the standby station. Specifically, the moving mechanism 125 includes a horizontal drive and a vertical drive, specifically a horizontal motor and a vertical motor.

[0049] Furthermore, the detection clamp 121 includes a first driver 1211 and two detection clamping fingers 1212, and the detection clamping fingers 121 are all the conductive parts. The first driver 1211 can move along the first direction, and the two detection clamping fingers 1212 are arranged on the first driver 1211. The first driver 1211 is used to drive the two detection clamping fingers 1212 to approach or move away from each other. The end of one detection clamping finger 1212 away from the first driver 1211 can abut the contact 21 along the first direction, or the two detection clamping fingers 1212 can approach each other to clamp the contact 21.

[0050] The two detection clamping fingers 1212 are mounted on the first driver 1211, and their movement is controlled by the first driver 1211. When the first driver 1211 is in operation, the two detection clamping fingers 1212 can move closer to or farther from each other as needed, thereby achieving clamping or loosening. The first driver 1211 can be a clamping claw cylinder.

[0051] The detection clamping finger 1212 is usually a slender component made of metal material, which can be conductive and has a certain strength and hardness and can withstand the pressure and friction during the detection process.

[0052] When one end of a detection finger 1212 away from the first driver 1211 needs to abut against the contact 21 along the first direction, the first driver 1211 will drive the detection finger 1212 to move along the first direction until the end of the detection finger 1212 contacts the contact 21 of the electronic component 2. For example, if the first direction is the up-down direction, when detecting a contact 21 of the electronic component 2 that is perpendicular to the up-down direction, the first driver 1211 will push the detection finger 1212 downward so that the end of the detection finger 1212 contacts the contact 21.

[0053] When the two detection clamping fingers 1212 need to approach each other to clamp the contact 21, the first driver 1211 first moves in a first direction to bring the two detection clamping fingers 1212 close to the contact 21. Then, the first driver 1211 drives the two detection clamping fingers 1212 to move toward the center until they tightly clamp the contact 21 of the electronic component 2. For example, when detecting a vertically placed sheet-shaped contact 21, the two detection clamping fingers 1212 can move from both sides toward the center to clamp the contact 21.

[0054] Furthermore, one end of the detection clamp finger 1212 close to the contact 21 is bent into an L shape and is provided with a first contact end surface 12121 and a second contact end surface 12122, the first contact end surface 12121 is perpendicular to the first direction, the second contact end surface 12122 is perpendicular to the first contact end surface 12121, and the second contact end surfaces 12122 of the two detection clamp fingers 1212 are arranged opposite to each other.

[0055] The end of the detection finger 1212 close to the contact 21 is bent into an L shape, and the first contact end surface 12121 is perpendicular to the first direction. Assuming that the first direction is the up-down direction, then the first contact end surface 12121 is horizontal, and it corresponds to the horizontally placed contact 21. If the electronic component 2 is a thin film capacitor, there are some metal contacts 21 on it that are flat on the surface of the thin film capacitor. These contacts 21 are horizontally placed contacts 21. At this time, the first contact end surface 12121 is parallel to the end surface of the contact 21, and the two can be stably abutted.

[0056] The second contact end surface 12122 is perpendicular to the first contact end surface 12121. Continuing with the first direction as an example of the up-down direction, the second contact end surface 12122 is vertical. The second contact end surfaces 12122 of the two detection clamping fingers 1212 are arranged relative to each other, which means that when the two detection clamping fingers 1212 are close to each other, the contacts 21 are clamped by the two second contact end surfaces 12122. When the second contact end surface 12122 contacts the contacts 21, the corresponding contacts 21 are placed vertically. For example, in some electronic components 2 (such as film capacitors), there are some flaky and vertically arranged contacts 21. The second contact end surfaces 12122 of the two detection clamping fingers 1212 are arranged relative to each other, and when they are close to each other, these vertically placed contacts 21 can be clamped from both sides.

[0057] Furthermore, the detection clamp 121 also includes two mounting connectors 1213, the mounting connector 1213 includes a fixed section 12131 and a mounting section 12132 bent and connected to the fixed section 12131, the fixed section 12131 is connected to the first driver 1211, and the mounting section 12132 extends from the fixed section 12131 in a direction away from the other mounting connector 1213, and the detection clamp finger 1212 is adjustably arranged on the mounting section 12132 along the length direction of the mounting section 12132.

[0058] The fixing section 12131 is the portion that connects the mounting connector 1213 to the first actuator 1211. For example, the fixing section 12131 can be a metal rod that is fixedly connected to the first actuator 1211 via bolts or welding. The function of the fixing section 12131 is to firmly secure the mounting connector 1213 to the first actuator 1211, ensuring the stability of the entire detection jaw 121.

[0059] The mounting section 12132 is connected to the fixed section 12131 by a bend. Assuming the fixed section 12131 is horizontal, the mounting section 12132 can be a portion that slopes downward or extends vertically from the fixed section 12131. For example, the mounting section 12132 can be a long metal strip that bends at a right angle to the fixed section 12131. The mounting section 12132 extends from the fixed section 12131 away from the other mounting connector 1213, providing space for the detection finger 1212 to be installed.

[0060] The detection finger 1212 can be positioned on the mounting section 12132, allowing the detection jaw 121 to adapt to the different positions of the electronic component 2 contacts 21. For example, if the electronic component 2 contacts 21 are located relatively close to the edge, the detection finger 1212 can be moved toward one end of the mounting section 12132 to bring it closer to the contacts 21. If the contacts 21 are located in the middle, the detection finger 1212 can be adjusted to the middle of the mounting section 12132. The position adjustment can be achieved by using a bolt and a slotted hole. The mounting section 12132 can be provided with multiple slotted holes, and the detection finger 1212 is connected to the mounting section 12132 by bolts passing through the slotted holes.

[0061] In addition to adjustable position, the detection fingers 1212 can also adjust the degree of clamping force. This is because different electronic component 2 contacts 21 may require different clamping forces. For example, for some fragile contacts 21, a smaller clamping force is required to avoid damage; while for some contacts 21 that require more stable contact, the clamping force can be appropriately increased.

[0062] Based on the above structure, the design of the mounting connector 1213 enables the detection clamping finger 1212 to have adjustable position and clamping degree, thereby improving the versatility and adaptability of the detection tooling 12 and meeting the detection requirements of the contacts 21 of different electronic components 2.

[0063] Furthermore, the mounting section 12132 is provided with a plurality of tooth-groove structures 12133, and the end of the detection finger 1212 away from the contact 21 is provided with a tooth structure 12123 that can be matched and clamped with the tooth-groove structure 12133. Through the cooperation between the tooth-groove structure 12133 and the tooth structure 12123, a detachable connection between the detection finger 1212 and the mounting section 12132 can be achieved, making it convenient to adjust the position of the detection finger 1212 on the mounting section 12132. When the position of the detection finger 1212 needs to be adjusted, it is only necessary to pull the tooth structure 12123 on the detection finger 1212 out of the tooth-groove structure 12133 on the mounting section 12132, move it to the appropriate position, and then snap the tooth structure 12123 into the corresponding tooth-groove structure 12133. This connection method is simple and convenient, and the position can be adjusted quickly, thereby improving the flexibility and adaptability of the detection tooling 12.

[0064] In addition, the cooperation between the tooth groove structure 12133 and the tooth structure 12123 can also provide a good clamping force, ensuring that the detection clamping finger 1212 will not loosen or shift during the detection process, thereby ensuring the accuracy and reliability of the detection.

[0065] Specifically, the tooth groove structure 12133 can be provided with a plurality of rectangular grooves or dovetail grooves arranged at intervals. Correspondingly, the tooth structure 12123 is a plurality of rectangular teeth or a plurality of dovetail teeth.

[0066] Furthermore, the inspection tool 12 also includes a second driver 122 for driving the inspection clamp 121 to move along the first direction. The second driver 122 enables the inspection clamp 121 to move toward or away from the contact 21 of the electronic component 2 along the first direction. For example, after the electronic component 2 is placed in the inspection position, the second driver 122 is activated, pushing the inspection clamp 121 downward along the first direction, toward the contact 21 of the electronic component 2. After the inspection is completed, the second driver 122 reverses direction, driving the inspection clamp 121 upward, away from the contact 21.

[0067] During testing, the second driver 122 first moves the testing jaw 121 to the appropriate position, allowing the testing fingers 1212 to contact the contact 21. If the contact 21 is perpendicular to the first direction, the testing fingers 1212 can directly contact the contact 21 for testing. If the contact 21 is parallel to the first direction, after the testing fingers 1212 approach the contact 21, the first driver 1211 drives the two testing fingers 1212 toward each other to clamp the contact 21. This design ensures that the testing jaw 121 can perform accurate testing operations based on the different conditions of the contact 21.

[0068] Specifically, the second driver 122 may be an electric push rod, a cylinder, or a linear motor.

[0069] Furthermore, the detection tool 12 also includes an elastic buffer component 123, one end of which is connected to the second driver 122, and the other end is connected to the first driver 1211. The elastic buffer component 123 is used to prevent the detection jaw 121 from applying excessive pressure when it moves along the first direction and abuts against the contact point 21.

[0070] When the detection jaw 121 approaches the contact 21 of the electronic component 2 under the push of the second driver 122, without the elastic buffer assembly 123, the excessive thrust or rapid movement of the second driver 122 may cause the detection jaw 121 to apply excessive pressure to the contact 21, thereby damaging the electronic component 2. The elastic buffer assembly 123 can absorb excess pressure when the detection jaw 121 contacts the contact 21, keeping the pressure of the detection jaw 121 on the contact 21 within an appropriate range, ensuring good contact without damaging the electronic component 2.

[0071] Specifically, the elastic buffer component 123 can be a spring, a rubber shock-absorbing block or a gas spring.

[0072] In some embodiments, the elastic buffer assembly 123 includes a first connecting member 1231, a guide rod, an elastic member 1232 and a second connecting member 1233. The first connecting member 1231 is arranged on the first driver 1211, and the second connecting member 1233 is arranged on the second driver 122. The guide rod is arranged along the first direction, one end of the guide rod is fixedly connected to one of the first connecting member 1231 and the second connecting member 1233, and the other end of the guide rod is slidably passed through the other, and the elastic member 1232 is arranged between the first connecting member 1231 and the second connecting member 1233.

[0073] The first connecting member 1231 is provided on the first driver 1211. It can be a metal sheet, a block structure, or a connecting component of other shapes, and is used to connect to other parts of the elastic buffer assembly 123. For example, the first connecting member 1231 can be a metal strip fixed to the first driver 1211 by welding or bolting.

[0074] The second connecting member 1233 is provided on the second driver 122. Similar to the first connecting member 1231, it can be a connecting member of different shapes. For example, the second connecting member 1233 can be a trapezoidal metal block fixed to the second driver 122 by screws.

[0075] The guide rod is positioned along the first direction to guide and limit the direction of movement. For example, the guide rod can be a slender metal cylindrical rod. If the first direction is up and down, the guide rod is positioned vertically. The upper end of the guide rod can be welded to the second connecting member 1233, and the lower end can pass through a hole in the first connecting member 1231, allowing the first connecting member 1231 to slide up and down along the guide rod.

[0076] The elastic member 1232 is disposed between the first connecting member 1231 and the second connecting member 1233. The elastic member 1232 may be a spring, a rubber column, or other elastic component. For example, the elastic member 1232 may be a compression spring. When the distance between the first connecting member 1231 and the second connecting member 1233 changes, the spring is compressed, thereby generating an elastic force.

[0077] When the detection jaw 121 moves in the first direction toward the contact 21 of the electronic component 2 under the action of the second driver 122, if the pressure is too great, the distance between the first connecting member 1231 and the second connecting member 1233 will decrease, causing the elastic member 1232 to be compressed. The compression of the elastic member 1232 will generate a reverse elastic force, which will act on the first connecting member 1231 and the second connecting member 1233, thereby slowing the movement of the detection jaw 121 and reducing the pressure on the contact 21 of the electronic component 2. When the pressure decreases, the elastic member 1232 will gradually return to its original state, returning the detection jaw 121 to the appropriate position. This achieves a buffering effect on the movement of the detection jaw 121 and protects the electronic component 2 from damage caused by excessive pressure.

[0078] Furthermore, the detection clamps 121 are provided in plurality and are respectively provided on both sides of the electronic component 2. If the electronic component 2 has contacts 21 on both sides, in order to fully detect these contacts 21, detection clamps 121 are provided on both sides of the electronic component 2.

[0079] When the lower detection jaw 121 moves upward to contact the contact 21, it generates an upward force on the electronic component 2. Without the upper detection jaw 121 to press firmly, the electronic component 2 may be lifted upward, causing positional deviation and affecting the accuracy of the test. The upper detection jaw 121, on the other hand, can apply downward pressure to firmly press the electronic component 2 against the tray 3, ensuring that the electronic component 2 maintains a stable position during the test process. This ensures that the lower detection jaw 121 can accurately contact the contact 21 for testing, improving the reliability of the test.

[0080] Correspondingly, in order to enable the lower detection claw 121 to move upward smoothly to abut against the contact 21, the tray 3 is provided with holes for the lower detection claw 121 to pass through. When performing a test, the lower detection claw 121 can extend upward through these holes and contact the contact 21 on the lower side of the electronic component 2.

[0081] The embodiment of the present application further provides an electronic component testing device 1, comprising a feeding conveyor line 11, a screening mechanism 13, an empty pallet conveyor line 14, a pallet lowering mechanism 15, a pallet lifting mechanism 16, and a detection tooling 12 as described in any one of the above items;

[0082] The loading conveyor line 11 is used to transport the tray 3 carrying the electronic components 2 and pass through the inspection tool 12. The staff puts the electronic components 2 to be tested on the empty tray 3 on the loading conveyor line 11, and then the loading conveyor line 11 automatically transports the tray 3 carrying the electronic components 2 to the inspection tool 12 for inspection.

[0083] The empty pallet conveyor line 14 is located below the loading conveyor line 11 and has a conveying direction opposite to that of the loading conveyor line 11 . The empty pallet conveyor line 14 is used to convey empty pallets 3 .

[0084] The pallet lowering mechanism 15 connects the conveying end of the loading conveyor line 11 and the input front end of the empty pallet conveyor line 14 , and is used to transfer the pallet 3 from the loading conveyor line 11 to the empty pallet conveyor line 14 .

[0085] The screening mechanism 13 is located above the tray lowering mechanism 15 and is used to remove the electronic components 2 from the tray 3 and move them to the good or bad area based on the inspection results. The screening mechanism 13 can be a mechanical claw or a three-axis mechanism and a suction cup assembly.

[0086] The pallet lifting mechanism 16 connects the conveying end of the empty pallet conveyor line 14 and the input front end of the loading conveyor line 11 , and is used to transfer the pallet 3 from the empty pallet conveyor line 14 to the loading conveyor line 11 .

[0087] The following is the flow process of the tray 3 in the electronic component testing device 1:

[0088] First, a tray 3 carrying electronic components 2 is placed on a loading conveyor line 11. A tooling worker places the electronic components 2 to be tested into the tray 3. The loading conveyor line 11 transports the tray 3 to a testing tool 12, which then tests the electronic components 2 on the tray 3.

[0089] When the tray 3 reaches the end of the feeding conveyor line 11, it enters the tray lowering mechanism 15. Above the tray lowering mechanism 15 is a screening mechanism 13. When the tray 3 passes through this mechanism, the screening mechanism 13 removes the electronic components 2 on the tray 3 that have completed the inspection and transports the electronic components 2 to the good product area or the defective product area according to the inspection results. At this time, the tray 3 becomes an empty tray 3.

[0090] The pallet lowering mechanism 15 transfers the pallet 3 from the higher loading conveyor line 11 to the input front end of the empty pallet conveyor line 14 located below and in the opposite conveying direction. Reverse conveying starts from the empty pallet conveyor line 14.

[0091] The empty pallet 3 is continuously conveyed on the empty pallet conveyor line 14. When it reaches the conveying end of the empty pallet conveyor line 14, it enters the pallet lifting mechanism 16. The pallet lifting mechanism 16 transfers the empty pallet 3 from the empty pallet conveyor line 14 to the input front end of the loading conveyor line 11, allowing the empty pallet 3 to return to the loading conveyor line 11 and start a new round of circulation to carry new electronic components 2 to be tested.

[0092] The electronic component testing device 1 of the embodiment of the present application includes the detection tool 12 in any of the above embodiments, and thus has the beneficial effects brought by the detection tool 12 in any of the above embodiments, which will not be described in detail here.

[0093] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A testing tool for testing electronic components, characterized in that: The detection tooling comprises: A detection clamp, wherein a conductive portion is provided on the opposite sides of the detection clamp and / or the end of the detection clamp, and the detection clamp can be moved along a first direction close to or away from the electronic component, and the detection clamp can clamp the electronic component so that the conductive portion contacts and conducts with the contact of the electronic component; or, the detection clamp can abut the electronic component along the first direction so that the conductive portion contacts and conducts with the contact of the electronic component.

2. The detection tool according to claim 1, characterized in that: The detection clamp includes a first driver and two detection fingers, and the detection fingers are both the conductive parts. The first driver can move along the first direction. The two detection fingers are arranged on the first driver. The first driver is used to drive the two detection fingers to move closer to or away from each other. The end of one detection finger away from the first driver can abut the contact along the first direction, or the two detection fingers can move closer to each other until they clamp the contact.

3. The detection tool according to claim 2, characterized in that: One end of the detection finger close to the contact is bent into an L shape and is provided with a first contact end surface and a second contact end surface. The first contact end surface is perpendicular to the first direction, and the second contact end surface is perpendicular to the first contact end surface. The second contact end surfaces of the two detection fingers are arranged opposite to each other.

4. The detection tool according to claim 2, characterized in that: The detection clamp also includes two mounting connectors, which include a fixed section and a mounting section bent and connected to the fixed section. The fixed section is connected to the first driver, and the mounting section extends from the fixed section in a direction away from the other mounting connector. The detection clamp finger is adjustably arranged on the mounting section along the length direction of the mounting section.

5. The detection tool according to claim 4, characterized in that: The mounting section is provided with a plurality of tooth-groove structures, and the end of the detection clamping finger away from the contact point is provided with a tooth structure that can match and clamp with the tooth-groove structure.

6. The detection tool according to claim 2, characterized in that: The detection tool further includes a second driver for driving the detection clamp to move along the first direction.

7. The detection tool according to claim 6, characterized in that: The detection tool further includes an elastic buffer component, one end of which is connected to the second driver, and the other end of which is connected to the first driver.

8. The detection tool according to claim 7, characterized in that: The elastic buffer assembly includes a first connecting member, a guide rod, an elastic member and a second connecting member. The first connecting member is provided on the first driver, the second connecting member is provided on the second driver, the guide rod is arranged along the first direction, one end of the guide rod is fixedly connected to one of the first connecting member and the second connecting member, the other end of the guide rod is slidably passed through the other, and the elastic member is provided between the first connecting member and the second connecting member.

9. The detection tool according to any one of claims 1 to 8, characterized in that: There are multiple detection clamps, which are respectively arranged on both sides of the electronic component.

10. An electronic component testing device, characterized in that: It comprises a feeding conveyor line, a screening mechanism, an empty pallet conveyor line, a pallet lowering mechanism, a pallet lifting mechanism and a detection tool as described in any one of claims 1 to 9; The loading conveyor line is used to convey the tray carrying the electronic components and pass through the inspection tooling; The empty pallet conveyor line is located below the loading conveyor line and has a conveying direction opposite to that of the loading conveyor line. The empty pallet conveyor line is used to convey empty pallets; The pallet lowering mechanism is connected to the conveying end of the loading conveyor line and the input front end of the empty pallet conveyor line, and is used to transfer the pallet from the loading conveyor line to the empty pallet conveyor line; The screening mechanism is provided above the tray lowering mechanism, and is used to remove the electronic components on the tray and transport the electronic components to a good product area or a defective product area according to the detection results; The pallet lifting mechanism connects the conveying end of the empty pallet conveyor line and the input front end of the loading conveyor line, and is used to transfer the pallet from the empty pallet conveyor line to the loading conveyor line.

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