Semiconductor test sorting machine

Abstract

The utility model discloses a semiconductor test sorter, including bearing platform, transportation subassembly and clamping subassembly, the upper surface of bearing platform is fixedly connected with the tester, the upper surface of bearing platform is provided with semiconductor piece to be tested, the transportation subassembly includes mounting rack, No.1 motor, first screw, threaded block, electric telescopic link and spacing plate, and the clamping subassembly includes the mounting rack, No.1 motor, first screw, threaded block, electric telescopic link and spacing plate. The conveying assembly comprises a mounting frame, the rear surface of the mounting frame is fixedly connected with a first motor, the output end of the first motor is fixedly connected with a first screw, the side surface of the first screw is in threaded connection with a threaded block, and the clamping assembly comprises a fixing plate, a side plate, a second motor, a second screw and a clamping plate. According to the semi-conductor transportation device, the semi-conductors can be lightly placed above the tester for testing in a clamping mode, a traditional conveying belt transportation mode is replaced for inspection, the semi-conductors are not prone to falling or colliding in the transportation process, and the safety of semi-conductor transportation is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor sorting machines, in particular to a semiconductor testing sorting machine. Background Art

[0002] With the continuous advancement of semiconductor technology, the integration and complexity of chips are increasing, and the quality and performance requirements of semiconductor devices are becoming more stringent. During the semiconductor production process, a large number of semiconductor chips need to be accurately inspected and sorted to ensure product quality and reliability.

[0003] However, the devices used to transport semiconductors in current semiconductor testing and sorting machines usually adopt conveyor belt transportation. Although this method can continuously transport semiconductors for testing and sorting, due to the precision of the structure of semiconductors, it is very easy for them to be damaged if they fall onto the platform after being transported by the conveyor belt. After searching, it was found that the technical solution provided by the utility model with application number CN202321135143.4 also has the above-mentioned problems. Utility Model Content

[0004] The purpose of the present utility model is to solve at least one of the technical problems existing in the prior art and to provide a semiconductor testing and sorting machine. Through a transport component and a clamping component, semiconductors can be gently placed on top of a tester for testing by clamping, replacing the traditional conveyor belt transportation method for inspection, and making it difficult for semiconductors to fall or bump during transportation, thereby greatly improving the safety of semiconductor transportation.

[0005] The utility model also provides a semiconductor test sorting machine having the above-mentioned structure, a support platform, a transport component and a clamping component, wherein the upper surface of the support platform is fixedly connected to a tester, and the upper surface of the support platform is provided with a semiconductor to-be-tested component;

[0006] The transport assembly includes a mounting frame, a No. 1 motor, a first screw, a threaded block, an electric telescopic rod and a limit plate, the rear surface of the mounting frame is fixedly connected to the No. 1 motor, the output end of the No. 1 motor is fixedly connected to the first screw, the side surface of the first screw is threadedly connected to the threaded block, the lower surface of the threaded block is fixedly connected to the electric telescopic rod, and the upper surface of the threaded block is fixedly connected to the limit plate;

[0007] The clamping assembly includes a fixed plate, a side plate, a No. 2 motor, a second screw and a clamping plate. The lower surface of the fixed plate is fixedly connected to the side plate, the front surface of the side plate is fixedly connected to the No. 2 motor, the output end of the No. 2 motor is fixedly connected to the second screw, and the side surface of the second screw is threadedly connected to the clamping plate.

[0008] According to the semiconductor test and sorting machine, the upper surface of the support platform is fixedly connected to the mounting frame, and the side surface of the first screw is rotatably connected to the mounting frame.

[0009] According to the semiconductor test and sorting machine, the inner wall of the mounting frame is provided with a slide rail, and the outer surface of the slide rail is slidably connected to the limiting plate.

[0010] According to the semiconductor test and sorting machine, the lower end of the electric telescopic rod is fixedly connected to the fixed plate, and the tester, the first motor, the electric telescopic rod, and the second motor are all electrically connected to an external power supply.

[0011] According to the semiconductor test sorting machine, the upper surface of the clamping plate is slidably connected to the fixed plate, and the number of the clamping plates is two and they are distributed front to back.

[0012] According to the semiconductor testing and sorting machine, the side plate is fixedly connected to a limiting rod inside, and there are two limiting rods distributed on the left and right. The side surface of the limiting rod is slidably connected to the clamping plate to make the sliding of the clamping plate more stable.

[0013] According to the semiconductor test and sorting machine, a storage box is provided on the upper surface of the support platform for storing semiconductors that have passed the test.

[0014] According to the semiconductor test and sorting machine, the lower surface of the support platform is fixedly connected with universal wheels, and the number of the universal wheels is four and they are distributed in a rectangular array, which increases flexibility and facilitates movement.

[0015] Additional aspects and advantages of the present invention will be given in part in the following description and will become apparent from the following description or learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The present invention will be further described below with reference to the accompanying drawings and embodiments;

[0017] Figure 1 This is the overall structure diagram of a semiconductor test and sorting machine of the present utility model;

[0018] Figure 2 This is a structural diagram of a clamping assembly of a semiconductor test and sorting machine according to the present invention;

[0019] Figure 3 This is a structural diagram of a transport component of a semiconductor test and sorting machine according to the present invention;

[0020] Figure 4 for Figure 1 A magnified schematic diagram of the structure in the middle.

[0021] Legend:

[0022] 1. Support platform; 2. Tester; 3. Semiconductor DUT; 4. Transport assembly; 5. Clamping assembly; 6. Mounting frame; 7. Motor No. 1; 8. First screw; 9. Threaded block; 10. Electric telescopic rod; 11. Limit plate; 12. Slide rail; 13. Fixed plate; 14. Side panel; 15. Motor No. 2; 16. Second screw; 17. Clamping plate; 18. Limit rod; 19. Storage box; 20. Universal wheel. DETAILED DESCRIPTION

[0023] This section will describe in detail the specific embodiments of the present invention. The preferred embodiments of the present invention are shown in the accompanying drawings. The purpose of the accompanying drawings is to supplement the description of the text part of the specification with graphics, so that people can intuitively and vividly understand each technical feature and overall technical solution of the present invention, but it cannot be understood as a limitation on the scope of protection of the present invention.

[0024] Reference Figure 1-4 The present invention provides a semiconductor test sorting machine in accordance with an embodiment of the present invention, which includes a platform 1, a transport component 4 and a clamping component 5. A tester 2 is fixedly connected to the upper surface of the platform 1, a semiconductor test piece 3 is provided on the upper surface of the platform 1, a storage box 19 is provided on the upper surface of the platform 1, and a universal wheel 20 is fixedly connected to the lower surface of the platform 1. There are four universal wheels 20 distributed in a rectangular array.

[0025] The transport assembly 4 includes a mounting frame 6, a No. 1 motor 7, a first screw 8, a threaded block 9, an electric telescopic rod 10 and a limit plate 11. The rear surface of the mounting frame 6 is fixedly connected to the No. 1 motor 7, the output end of the No. 1 motor 7 is fixedly connected to the first screw 8, the side surface of the first screw 8 is threadedly connected to the threaded block 9, the lower surface of the threaded block 9 is fixedly connected to the electric telescopic rod 10, the upper surface of the threaded block 9 is fixedly connected to the limit plate 11, the upper surface of the platform 1 is fixedly connected to the mounting frame 6, and the side surface of the first screw 8 is rotatably connected to the mounting frame 6.

[0026] The clamping assembly 5 includes a fixed plate 13, a side plate 14, a No. 2 motor 15, a second screw 16 and a splint 17. The lower end of the electric telescopic rod 10 is fixedly connected to the fixed plate 13, the lower surface of the fixed plate 13 is fixedly connected to the side plate 14, the front surface of the side plate 14 is fixedly connected to the No. 2 motor 15, the output end of the No. 2 motor 15 is fixedly connected to the second screw 16, and the side surface of the second screw 16 is threadedly connected to the splint 17. The tester 2, the No. 1 motor 7, the electric telescopic rod 10, and the No. 2 motor 15 are all electrically connected to the external power supply. The upper surface of the splint 17 is slidably connected to the fixed plate 13. There are two splints 17 and they are distributed front to back. The inside of the side plate 14 is fixedly connected with a limit rod 18. There are two limit rods 18 and they are distributed left to right. The side surface of the limit rod 18 is slidably connected to the splint 17.

[0027] Working principle: After placing the semiconductor device under test 3 on the upper surface of the support platform 1, start the No. 1 motor 7 to drive the first screw 8 to rotate. Through the threaded connection with the threaded block 9, the first screw 8 pushes the threaded block 9 to move directly above the semiconductor device under test 3 during the rotation. Then, turn off the first screw 8 and start the electric telescopic rod 10 and the No. 2 motor 15. The electric telescopic rod 10 lowers the fixed plate 13. The No. 2 motor 15 drives the second screw 16 to rotate, making the two clamping plates 17 approach each other and clamp the semiconductor device under test 3. Then, start the electric telescopic rod 10 again to lower the semiconductor device under test 3. The semiconductor device under test 3 is pulled up, and the No. 1 motor 7 is started to drive the first screw 8 to rotate, so that the fixing plate 13 is located directly above the tester 2. The electric telescopic rod 10 is started to lower the semiconductor device under test 3, and the No. 2 motor 15 is started to rotate and open the two clamping plates 17 to achieve placement. Through the transport component 4 and the clamping component 5, the semiconductor device under test 3 can be gently placed on the top of the tester 2 for testing by clamping, replacing the traditional conveyor belt transportation method for inspection. It also makes it difficult for semiconductors to fall or bump during transportation, greatly improving the safety of semiconductor transportation.

[0028] The embodiments of the present invention are described in detail above with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Various changes can be made within the scope of knowledge possessed by ordinary technicians in the technical field without departing from the purpose of the present invention.

Claims

1. A semiconductor test sorting machine, characterized in that: include: A support platform (1), a transport component (4) and a clamping component (5); the upper surface of the support platform (1) is fixedly connected to a tester (2); and the upper surface of the support platform (1) is provided with a semiconductor test piece (3); The transport assembly (4) comprises a mounting frame (6), a No. 1 motor (7), a first screw (8), a threaded block (9), an electric telescopic rod (10) and a limit plate (11); the rear surface of the mounting frame (6) is fixedly connected to the No. 1 motor (7); the output end of the No. 1 motor (7) is fixedly connected to the first screw (8); the side surface of the first screw (8) is threadedly connected to the threaded block (9); the lower surface of the threaded block (9) is fixedly connected to the electric telescopic rod (10); and the upper surface of the threaded block (9) is fixedly connected to the limit plate (11); The clamping assembly (5) comprises a fixed plate (13), a side plate (14), a second motor (15), a second screw (16) and a clamping plate (17); the lower surface of the fixed plate (13) is fixedly connected to the side plate (14); the front surface of the side plate (14) is fixedly connected to the second motor (15); the output end of the second motor (15) is fixedly connected to the second screw (16); and the side surface of the second screw (16) is threadedly connected to the clamping plate (17).

2. A semiconductor test and sorting machine according to claim 1, characterized in that: The upper surface of the support platform (1) is fixedly connected to the mounting frame (6), and the side surface of the first screw rod (8) is rotatably connected to the mounting frame (6).

3. A semiconductor test and sorting machine according to claim 1, characterized in that: The inner wall of the mounting frame (6) is provided with a slide rail (12), and the outer surface of the slide rail (12) is slidably connected to the limiting plate (11).

4. A semiconductor test and sorting machine according to claim 1, characterized in that: The lower end of the electric telescopic rod (10) is fixedly connected to the fixed plate (13), and the tester (2), the first motor (7), the electric telescopic rod (10), and the second motor (15) are all electrically connected to an external power supply.

5. The semiconductor test and sorting machine according to claim 1, characterized in that: The upper surface of the clamping plate (17) is slidably connected to the fixed plate (13), and there are two clamping plates (17) distributed front to back.

6. The semiconductor test and sorting machine according to claim 1, characterized in that: The side plate (14) is internally fixedly connected with a limiting rod (18), the number of the limiting rods (18) is two and they are distributed on the left and right sides, and the side surfaces of the limiting rods (18) are slidably connected to the clamping plate (17).

7. The semiconductor test and sorting machine according to claim 1, characterized in that: A storage box (19) is provided on the upper surface of the support platform (1).

8. The semiconductor test and sorting machine according to claim 1, characterized in that: Universal wheels (20) are fixedly connected to the lower surface of the support platform (1), and the number of the universal wheels (20) is four and they are distributed in a rectangular array.

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