High-speed capacitor testing device with reduced appearance

Abstract

The utility model discloses a high-speed capacitor testing device with a reduced appearance, which comprises a testing track, a capacitor carrying disc is arranged on the testing track in a sliding manner, and the testing track is at least provided with a leakage current testing station, an alternating current testing station and a capacitor screening station; the number of the alternating current test stations is one or more than one, so that only a part of capacitors in the capacitor carrying disc are tested. According to the utility model, in an ESR test station or a test station containing an ESR, namely an alternating current test station, a step-by-step repeated test device is used, so that a smaller one-time test quantity is realized, and the special requirement of testing a capacitor is met. The purpose is achieved without a method of increasing the number of test stations in the length direction of the test track, so that the length of the test device is shortened.

Description

Technical Field

[0001] The utility model relates to a high-speed capacitance testing device with a reduced appearance. Background Art

[0002] Capacitor production automatic test equipment typically has DC test parameters, such as withstand voltage and leakage current (insulation resistance), and AC test parameters, such as capacity, loss, and ESR. To improve test efficiency (or test speed), multiple test stations are usually used to test these two major test parameters separately. The DC test section has charging and leakage current test stations, while the AC test section has integrated or separate capacity, loss, and ESR test stations. The test contacts with ESR test items usually use a four-wire method.

[0003] In the existing high-speed automatic capacitor testing technology, such as the patent authorization publication number: CN217774870U, a high-speed test device for a large number of capacitors, in the disclosed technology, the capacitor is placed in a positioning tool (capacitor carrier), the capacitor carrier is divided into 2 positioning groove areas, and the carrier is placed horizontally on the test track, with the purpose of minimizing the length of the test device. The above test stations are arranged on the test track so that the carrier moves along the test track and passes through each test station on the track in turn. For the ESR test station, in order to ensure that the capacitor electrode is in good contact with the external elastic contact device (such as an elastic probe), it is not possible to contact the electrodes of a large number of capacitors at one time like the DC test station. The patent adopts an additional station, and uses multiple leakage current test stations to test a part of the capacitor in the capacitor carrier respectively, and finally completes the test of all the capacitors in the carrier. For the application requirement of measuring the ESR value of a small number of capacitors at one time, this layout will significantly increase the length of the equipment, greatly increasing the floor space cost of the equipment. Now there is a need for a device that can reduce the length of a capacitor high-speed automatic tester. Utility Model Content

[0004] The present invention aims to overcome the shortcomings of the prior art by providing a high-speed capacitor test device with a reduced size. The device utilizes a step-and-repeat tester within an ESR test station or a test station containing ESR, thereby achieving a smaller number of tests at once and meeting the special requirements of capacitor testing. This objective is achieved without increasing the number of test stations along the length of the test track, thereby shortening the length of the test device.

[0005] To achieve the above-mentioned purpose, the technical solution of the present invention is to design a high-speed capacitor testing device with a reduced size, comprising a test track, on which a capacitor carrier is slidably arranged, and on which at least a leakage current test station, an AC test station, and a capacitor screening station are provided; one or more AC test stations are provided to test only a portion of the capacitor in the capacitor carrier. The present invention comprises a test track, on which a capacitor carrier is slidably arranged, and on which at least a leakage current test station, an AC test station, and a capacitor screening station are provided; one or more AC test stations are provided to test only a portion of the capacitor in the capacitor carrier.

[0006] A further technical solution is that the four-wire probe array equipped with each AC test station only tests a small part of the total capacitance carried by the AC test station at a time, and the four-wire probe array tests the total capacitance carried by the AC test station in a step-by-step repetitive manner.

[0007] A further technical solution is that the AC test station is an integrated test station including three parameters: capacity, loss and ESR; or the AC test station is composed of a capacity test station, a loss test station and an ESR test station; or the AC test station is only an ESR test station.

[0008] A further technical solution is that the leakage current test station is equipped with a probe array, while the AC test station is equipped with a four-wire probe array; the four-wire probe array is mounted on a drive mechanism that can move vertically and horizontally; the number of four-wire probe arrays in the AC test station is smaller than that in the leakage current test station. A larger number of channels has no effect on DC test accuracy, but does affect AC test accuracy. To ensure AC test accuracy, the number of parallel connected channels in the AC test must be reduced. Therefore, the number of four-wire probe arrays in the AC test station is smaller than that in the leakage current test station.

[0009] A further technical solution is that an aging needle plate is also provided in conjunction with the capacitor carrier so that the capacitor carrier and the aging needle plate form an aging fixture for use in an aging device.

[0010] The advantages and beneficial effects of the present invention include: reducing the length of the equipment and significantly reducing the equipment's floor space costs. The above device utilizes a step-and-repeat test device within an ESR test station, or a test station containing ESR, to achieve a smaller number of tests at once, meeting the specific requirements of capacitor testing. This is achieved without increasing the number of test stations along the length of the test track, thereby shortening the length of the test apparatus. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1This is a schematic diagram of a high-speed capacitor testing device with a reduced size according to the present invention;

[0012] Figure 2 yes Figure 1 Side view of

[0013] Figure 3 yes Figure 1 Top view of .

[0014] In the figure: 1. Test track; 2. Capacitor carrier; 3. Linear screw module; 4. 4-wire probe array; 5. Mechanism; 6. Carrier box positioning assembly. DETAILED DESCRIPTION

[0015] The following embodiments are used to further describe the specific embodiments of the present invention in conjunction with the accompanying drawings and examples. The following embodiments are only used to more clearly illustrate the technical solutions of the present invention and are not intended to limit the scope of protection of the present invention.

[0016] like Figures 1 to 3As shown, the utility model is a high-speed capacitor testing device with a reduced size, including a test track 1, a capacitor carrier 2 that can move on the test track 1, and a leakage current test station, a capacity loss and ESR test station, a capacitor screening station, etc. are provided on the test track. The capacity loss and ESR test stations can be separated, that is, a test station specifically for testing ESR is provided, or it can be an integrated test station for three parameters including ESR (i.e., an AC test station); or the AC test station is only an ESR test station. The leakage current test station is provided with a probe array, and the ESR dedicated test station or the integrated test station including ESR is provided with a 4-wire probe array 4. The 4-wire probe array is mounted on a mechanism 5 that can move vertically and horizontally (the mechanism 5 realizes lateral movement and vertical movement respectively through two linear screw modules 3; the 4-wire probe array 4 is fixedly connected to the actuating member of the vertical linear screw module 3, and the fixing member of the vertical linear screw module 3 is fixedly connected to the actuating member of the horizontal linear screw module 3, so that when the horizontal linear screw module 3 moves, the vertical linear screw module 3 moves laterally, thereby driving the 4-wire probe array 4 to move laterally, and when the vertical linear screw module 3 moves, the 4-wire probe array 4 moves up and down; The linear screw module 3 of the material carrier box positioning assembly is fixed above the fixing part of the horizontal linear screw module 3. When the linear screw module 3 of the material carrier box positioning assembly 6 is actuated, the material carrier box positioning assembly moves up and down. The capacitor carrier box can be manually slid to the desired station, and then the linear screw module 3 of the material carrier box positioning assembly 6 is actuated to move the material carrier box positioning assembly upward. The horizontal linear screw module 3 is actuated to move the vertical linear screw module 3 horizontally to the 4-wire probe array 4 located above the capacitor carrier box, and then the vertical linear screw module 3 is actuated to move the 4-wire probe array 4 downward. The number of test channels of the 4-wire probe array (the 4-wire probe array is moved up and down by the linear screw module 3) provided in the ESR or ESR-containing test station is less than the number of test channels of the leakage current station probe array. The probe card of the ESR test station or the test station including ESR (i.e., the 4-wire probe array 4) is pressed on multiple capacitor electrodes in the capacitor carrier 2 at one time. After the test is completed, the capacitor carrier of this station and the probe card are relatively displaced so that the capacitors at other positions in the carrier contact the probe card, and the ESR or AC parameter test including the ESR value of this part of the capacitor is continued until all the capacitors in the carrier are tested.

[0017] There can be more than one ESR or ESR-containing test station, which only tests a portion of the capacitors in the carrier. The probe card equipped with each station only tests a smaller portion of the capacitors covered by the station at a time. The probe card tests all the capacitors covered by the station in a step-by-step and repeated manner.

[0018] The 4-wire probe array is mounted on a mechanism that can move up and down. The capacitor carrier can not only move between (different) workstations, but also move horizontally within the range of the ESR-specific test station and the integrated test station including ESR. In coordination with the up and down movement of the probe card, it contacts each part of the capacitor in the carrier in a step-by-step and repetitive manner to complete the ESR test of all capacitors (i.e., AC test).

[0019] The capacitor carrier plate can also be combined with the aging needle plate to form an aging fixture for use in an aging device.

[0020] The above device uses a step-and-repeat test device within an ESR test station or a test station containing ESR to achieve a smaller number of one-time tests to meet the special requirements of capacitor testing (improved test accuracy of capacitor parameters). This goal is achieved without increasing the number of test stations along the length of the test track, thereby shortening the length of the test device.

[0021] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as within the scope of protection of the present invention.

Claims

1. A high-speed capacitor testing device with a reduced size, characterized in that: The invention comprises a test track on which a capacitor carrier is slidably arranged. The test track is provided with at least a leakage current test station, an AC test station and a capacitor screening station. One or more AC test stations are provided to realize testing of only a part of the capacitor in the capacitor carrier.

2. The high-speed capacitor testing device with a reduced size according to claim 1, characterized in that: The four-wire probe array provided with each AC test station only tests a small portion of the total capacitance carried by the AC test station at a time, and the four-wire probe array tests the total capacitance carried by the AC test station in a step-by-step repetitive manner.

3. The high-speed capacitor testing device with a reduced size according to claim 2, characterized in that: The AC test station is an integrated test station including three parameters: capacity, loss and ESR; or the AC test station is composed of a capacity test station, a loss test station and an ESR test station; or the AC test station is only an ESR test station.

4. The high-speed capacitor testing device with a reduced size according to claim 3, characterized in that: The leakage current test station is equipped with a probe array, and the AC test station is equipped with a four-wire probe array; the four-wire probe array is installed on a drive mechanism that can move up and down and horizontally; the number of four-wire probe arrays in the AC test station is less than the number of probe arrays in the leakage current test station.

5. The high-speed capacitor testing device with a reduced size according to claim 4, characterized in that: An aging needle plate is also provided in conjunction with the capacitor carrier to enable the capacitor carrier and the aging needle plate to form an aging fixture for use in an aging device.

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