Modularized NAND flash test verification tool and equipment

Abstract

The utility model discloses a modularized NAND flash test verification tool and equipment, which comprises an FPGA expansion card, an SSD chip evaluation board and an NAND flash daughter board, NAND flash particles are pasted on the NAND flash daughter board, the FPGA expansion card and the SSD chip evaluation board are respectively connected with the NAND flash daughter board, the FPGA expansion card is used for carrying out prototype test on the NAND flash particles, and the SSD chip evaluation board is used for carrying out the prototype test on the NAND flash particles. And the SSD chip evaluation board is used for carrying out function test on the returned SSD chip and carrying out compatibility verification on the NAND flash particles. Different FPGA expansion cards or SSD chip evaluation boards do not need to be replaced in the testing process, only the NAND flash daughter boards need to be correspondingly replaced, verification of different types of NAND flash particles can be completed, resources of the FPGA expansion cards, the evaluation boards and the NAND flash particles are saved, maintenance is convenient, operation is easy and convenient, and consistency of configuration parameters of the NAND flash particles after FPGA prototype verification and chip returning can be guaranteed.

Description

Technical Field

[0001] The utility model relates to the technical field of SSD controller development, and in particular to a modular NAND flash test and verification tool and equipment. Background Art

[0002] NAND flash is the primary storage medium in mainstream SSD systems and the most expensive key component in the entire SSD product. Its packaging options include BGA132 / BGA152, BGA272 / BGA252, BGA316, and BGA154. During SSD controller development, the early design phase requires full system prototype verification on an FPGA environment system, and functional testing on an evaluation board after chip return. Both stages require compatible NAND flash chips. Traditionally, NAND flash is directly mounted on an FPGA expansion card or on a post-chip evaluation board. Because NAND flash comes in a variety of packaging formats and SSD controllers often need to accommodate multiple generations and support multiple channels and controller elements, this necessitates the development of multiple different types of expansion cards and evaluation boards. The latest generation NAND flash chips are often in short supply, making this a cumbersome and wasteful approach. Utility Model Content

[0003] The purpose of the utility model is to provide a modular NAND flash test verification tool and equipment, aiming to solve the technical problems of the existing NAND flash test verification being cumbersome and wasting resources.

[0004] In order to solve the above technical problems, the purpose of this utility model is achieved through the following technical solutions:

[0005] In a first aspect, the utility model provides a modular NAND flash test and verification tool, including an FPGA expansion card, an SSD chip evaluation board, and a NAND flash daughter board. The NAND flash daughter board is provided with NAND flash particles. The FPGA expansion card and the SSD chip evaluation board are respectively connected to the NAND flash daughter board. The FPGA expansion card is used to perform prototype testing on the NAND flash particles. The SSD chip evaluation board is used to perform functional testing on the SSD chip after it is returned and to verify the compatibility of the NAND flash particles.

[0006] Furthermore, the FPGA expansion card and the SSD chip evaluation board are both provided with connectors, and the NAND flash daughter board is provided with gold fingers, which are plugged into the connectors to connect the FPGA expansion card or the SSD chip evaluation board to the NAND flash daughter board.

[0007] Furthermore, the connector is an M.2 female socket, and the gold finger is an M.2 gold finger.

[0008] Furthermore, the NAND flash particles include several different types, and the NAND flash daughter boards and the NAND flash particles constitute different types of NAND flash daughter boards.

[0009] Furthermore, the FPGA expansion card also includes an FPGA chip, which is communicatively connected to the NAND flash particles to form an FPGA prototype, and the FPGA prototype is used to test the interface compatibility and performance of the NAND flash particles.

[0010] Furthermore, the SSD chip evaluation board is further provided with an SSD controller chip, and the SSD controller chip is connected to the SSD chip evaluation board and the NAND flash particles respectively.

[0011] Furthermore, the NAND flash daughter board is provided with a mounting hole, and a base plate is further provided below the NAND flash daughter board. The base plate is provided with a positioning hole, and the positioning hole is fixedly connected to the mounting hole by a screw.

[0012] Furthermore, the interface between the connector and the gold finger includes a plurality of power signals and input and output signals.

[0013] Furthermore, it also includes a control system, which is connected to the FPGA expansion card and the SSD chip evaluation board respectively, and is used to receive and process test data from both, and display or record test results.

[0014] In a second aspect, the present invention further provides a modular NAND flash test and verification device, comprising the modular NAND flash test and verification tool as described in any one of the above embodiments.

[0015] Compared with the prior art, the present invention has the following advantages: By designing a NAND flash daughterboard, different types of NAND flash chips are mounted on the NAND flash daughterboard. The M.2 interface is used as the physical interface of the NAND flash daughterboard, and M.2 female connectors are designed on both the FPGA expansion card and the SSD chip evaluation board. Both adopt a unified signal definition, enabling verification of NAND flash chips with different packages and topologies. Compared with the prior art, which directly mounts NAND flash chips on the FPGA expansion card and the SSD chip evaluation board, the present invention eliminates the need to replace different FPGA expansion cards or SSD chip evaluation boards during testing. Instead, the NAND flash daughterboards need only be replaced to complete verification of different types of NAND flash chips. This approach not only conserves resources such as FPGA expansion cards, evaluation boards, and NAND flash chips, but also facilitates maintenance and operation, ensuring consistency in NAND flash chip configuration parameters during FPGA prototype verification and after chip return. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 A schematic structural diagram of a modular NAND flash test and verification tool provided by an embodiment of the present utility model;

[0018] Figure 2 A schematic diagram of the framework for connecting the FPGA expansion card and the NAND flash daughter board of the modular NAND flash test and verification tool provided in an embodiment of the present utility model;

[0019] Figure 3 A schematic diagram of the framework for connecting an SSD chip evaluation board and a NAND flash daughter board of a modular NAND flash test and verification tool provided by an embodiment of the present invention;

[0020] Figure 4 This is a schematic diagram of the interface circuit of the modular NAND flash test and verification tool provided by an embodiment of the utility model.

[0021] Reference numerals:

[0022] 1. FPGA expansion card; 2. SSD chip evaluation board; 3. NAND flash daughter board; 31. Mounting holes; 4. NAND flash chip; 5. Connector; 6. Gold finger. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0024] It will be understood that when used in this specification and the appended claims, the terms “comprises” and “comprising” indicate the presence of described features, integers, steps, operations, elements and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups thereof.

[0025] It should also be understood that the terms used in this utility model specification are only for the purpose of describing specific embodiments and are not intended to limit the utility model. As used in this utility model specification and the appended claims, the singular forms "a", "an" and "the" are intended to include plural forms unless the context clearly indicates otherwise.

[0026] It should be further understood that the term “and / or” used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0027] See also Figures 1 to 4 The specific embodiment of the utility model discloses a modular NAND flash test and verification tool, including an FPGA expansion card 1, an SSD chip evaluation board 2 and a NAND flash daughter board 3. NAND flash particles 4 are attached to the NAND flash daughter board 3. The FPGA expansion card 1 and the SSD chip evaluation board 2 are respectively connected to the NAND flash daughter board 3. The FPGA expansion card 1 is used to perform prototype testing on the NAND flash particles 4. The SSD chip evaluation board 2 is used to perform functional testing on the SSD chip after it is returned and to verify the compatibility of the NAND flash particles 4.

[0028] Specifically, before the SSD controller's hardware design is finalized and tape-out occurs, a functional prototype can be quickly built using an FPGA (field programmable gate array). FPGAs allow developers to simulate or implement all the logic functions of the SSD controller through programming, eliminating the need to wait for actual chip manufacturing. Prototype verification on FPGAs can identify and resolve design issues such as interface incompatibilities, logic errors, and performance bottlenecks early on, reducing the number and cost of subsequent iterations. Because the SSD controller needs to communicate with NAND flash devices 4, the FPGA prototype must correctly implement the interface with the NAND flash devices 4. This includes ensuring compatibility with electrical characteristics, timing requirements, and command sets. Furthermore, the FPGA prototype can be used to test the SSD controller's interaction performance with NAND flash devices 4 of different models, capacities, and speeds, including read and write speeds, response time, and power consumption, to evaluate the controller's overall performance.

[0029] In this embodiment, the NAND flash daughterboard 3 is inserted into the FPGA expansion card 1. The FPGA expansion card 1 connects to the NAND flash daughterboard 3 via a high-speed interface (such as an M.2 interface or PCIe interface). The FPGA implements the logic functions of the SSD controller. Within the FPGA environment, a full system prototype of the SSD controller is verified, including key metrics such as data transfer rate, error correction capability, and power management. Simulation tools or real-world data can also be used to stress test the SSD controller to ensure its stability and reliability under various workloads.

[0030] Furthermore, after the SSD controller chip is manufactured, detailed functional testing is required on an evaluation board to ensure that all design functions work as expected. The stability and reliability of the SSD controller are evaluated by running it for a long time and simulating various workloads. In addition, the compatibility of the SSD controller with a variety of common and special NAND flash particles4 on the market needs to be tested on the evaluation board.

[0031] In summary, this modular NAND flash test and verification tool implements prototype testing and functional testing of NAND flash chips through the combination of FPGA expansion card 1, SSD chip evaluation board 2, and test daughter board. By designing a replaceable NAND flash daughter board 3, it not only saves resources such as FPGA expansion card 1, evaluation board, and NAND flash chip 4, but also facilitates maintenance.

[0032] like Figure 1-3As shown, the FPGA expansion card 1 and the SSD chip evaluation board 2 are both provided with a connector 5, and the NAND flash daughter board 3 is provided with a gold finger 6, which is plugged into the connector 5 to connect the FPGA expansion card 1 or the SSD chip evaluation board 2 with the NAND flash daughter board 3.

[0033] Specifically, when the gold finger 6 is in full contact with the connector 5, the FPGA expansion card 1 or the SSD chip evaluation board 2 can send test signals and control commands to the NAND flash chip under test on the test daughter board through the connector 5. The test signals and control commands are transmitted through the electrical connection between the gold finger 6 and the connector 5, thereby implementing the test and control of the NAND flash chip 4 under test.

[0034] like Figure 1 As shown, the connector 5 is an M.2 female socket, and the gold finger 6 is an M.2 gold finger.

[0035] Specifically, M.2 is a standard connector interface, originally called NGFF (Next Generation Form Factor). It is a protocol published by the PCI-SIG association, led by HP, and is known as the PCI Express M.2 Specification. The M.2 interface is designed to support multiple modules / cards on the same connector, including but not limited to SSDs and wireless network cards. With its small size, low profile, and high integration, the M.2 interface has become a common expansion interface in modern computer systems.

[0036] In this embodiment, the M.2 interface is used on the NAND flash daughterboard 3 as a physical interface, and an M.2 female connector is designed on the FPGA expansion card 1 or the evaluation board after the chip is returned. Both use a unified signal definition. Through this connection method of the M.2 gold finger 6 and the female connector, the NAND flash daughterboard 3 can be easily replaced, and the FPGA expansion card 1 or the SSD chip evaluation board 2 can be shared. This improves the efficiency of SSD controller FPGA prototype verification and returned NAND flash chip 4 testing, and ensures the consistency of NAND flash chip 4 configuration parameters after the chip is returned.

[0037] like Figure 2-3 As shown, the NAND flash particles 4 are of different types, and the NAND flash daughter boards 3 and the NAND flash particles 4 constitute different types of NAND flash daughter boards 3 .

[0038] Specifically, NAND flash chips 4 are the primary storage medium in mainstream SSD systems and are also the most costly, key component in the entire SSD product. They are packaged in various types, including BGA132 / BGA152, BGA272 / BGA252, BGA316, and BGA154. The NAND flash daughterboard 3 utilizes a modular design, packaging the test circuits and interfaces for different NAND flash chip types 4 into independent modules. When testing different types of NAND flash chips 4, simply replace the corresponding test module, improving the flexibility and scalability of the test system.

[0039] In a usable embodiment, the FPGA expansion card 1 further includes an FPGA chip, which is communicatively connected to the NAND flash particles 4 to form an FPGA prototype, and the FPGA prototype is used to test the interface compatibility and performance of the NAND flash particles 4 .

[0040] Specifically, in this embodiment, the FPGA prototype system consists of an FPGA expansion card 1, NAND flash devices 4, and necessary testing equipment. In this system, the FPGA expansion card 1 establishes a communication connection with the NAND flash devices 4 on the NAND flash daughterboard 3 through its FPGA chip, and then tests the device under test according to pre-set test logic. The testing equipment monitors the testing process, records test data, and evaluates the interface compatibility and performance of the NAND flash devices 4.

[0041] In a usable embodiment, the SSD chip evaluation board 2 is further provided with an SSD controller chip, and the SSD controller chip is connected to the SSD chip evaluation board 2 and the NAND flash particle 4 respectively.

[0042] Specifically, during the functional testing phase, the SSD controller chip itself is tested. This phase occurs after the SSD controller chip is returned to the designer, meaning it has been manufactured and returned to the designer. At this point, the designer will install the SSD controller chip on an evaluation board and connect it to the NAND flash daughterboard 3 and other test equipment through the interface circuits on the evaluation board. Testers will load the SSD controller firmware and test program onto the evaluation board and perform functional testing on the SSD controller chip. In addition to testing the SSD controller chip itself, compatibility testing is also required to ensure that it can adapt to different brands and models of NAND flash chips 4.

[0043] like Figure 1As shown, the NAND flash daughter board 3 is provided with a mounting hole 31, and a base plate (not shown in the figure) is further provided below the NAND flash daughter board 3. The base plate is provided with a positioning hole, and the positioning hole and the mounting hole 31 are fixedly connected by screws.

[0044] Specifically, after the gold fingers 6 on the NAND flash daughterboard 3 are correctly inserted into the connector 5 on the FPGA expansion card 1 or the SSD chip evaluation board 2, the NAND flash daughterboard 3 is stably mounted on the baseboard by designing the mounting holes 31 and positioning holes and using screws to secure the connection. This securement prevents the NAND flash daughterboard 3 from moving or falling off when subjected to vibration, impact, or other external forces, thereby protecting the NAND flash chips 4 and their circuits from damage.

[0045] like Figure 2-4 As shown, the interface between the connector 5 and the gold finger 6 includes several power signals and input and output signals.

[0046] Specifically, in this embodiment, a set of M.2 interfaces defines 2-channel, 4CE NFC IO signals and four power signals: VCC, VCCQ, VREF, and VPP. 2-channel refers to two channels of NAND flash signals, and 4CE refers to chip select signals that can connect four NAND flash devices per channel. The M.2 gold fingers of the NAND flash daughterboard 3 and the M.2 female connector of the FPGA expansion card 1 or SSD chip evaluation board 2 are both defined in this way. The power signal is transmitted from the FPGA expansion card 1 or SSD chip evaluation board 2 to the NAND flash daughterboard 3 to provide a stable power supply. The NFC IO signals are bidirectional, enabling signal transmission and power supply between devices and ensuring compatibility between devices.

[0047] In this embodiment, the modular NAND flash test verification tool also includes a control system, which is connected to the FPGA expansion card 1 and the SSD chip evaluation board 2 respectively, for receiving and processing test data from both, and displaying or recording test results.

[0048] The present invention also provides a modular NAND flash test and verification device, including the modular NAND flash test and verification tool as described in the above embodiment.

[0049] Specifically, by integrating modular NAND flash test and verification tooling into the test and verification equipment, automated testing of NAND flash chips 4 and their associated circuits can be achieved. Furthermore, due to the modular design, individual modules in the test and verification equipment can be independently replaced or upgraded, reducing testing costs. When a module fails or requires an update, only the corresponding module needs to be replaced, rather than the entire equipment. This significantly reduces test equipment maintenance costs.

[0050] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and such modifications or substitutions are intended to be within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be subject to the scope of protection of the claims.

Claims

1. A modular NAND flash test and verification tool, characterized in that: The system includes an FPGA expansion card, an SSD chip evaluation board, and a NAND flash daughter board. The NAND flash daughter board is provided with NAND flash particles. The FPGA expansion card and the SSD chip evaluation board are respectively connected to the NAND flash daughter board. The FPGA expansion card is used to perform prototype testing on the NAND flash particles. The SSD chip evaluation board is used to perform functional testing on the SSD chip after it is returned and to verify the compatibility of the NAND flash particles.

2. The modular NAND flash test and verification tool according to claim 1, characterized in that: The FPGA expansion card and the SSD chip evaluation board are both provided with connectors, and the NAND flash daughter board is provided with gold fingers, which are plugged into the connectors to connect the FPGA expansion card or the SSD chip evaluation board with the NAND flash daughter board.

3. The modular NAND flash test and verification tool according to claim 2, characterized in that: The connector is an M.2 female socket, and the gold finger is an M.2 gold finger.

4. The modular NAND flash test and verification tool according to claim 1, characterized in that: The NAND flash particles include several different types, and the NAND flash daughter boards and the NAND flash particles constitute different types of NAND flash daughter boards.

5. The modular NAND flash test and verification tool according to claim 1, characterized in that: The FPGA expansion card further includes an FPGA chip, which is communicatively connected to the NAND flash particles to form an FPGA prototype, and the FPGA prototype is used to test the interface compatibility and performance of the NAND flash particles.

6. The modular NAND flash test and verification tool according to claim 1, characterized in that: The SSD chip evaluation board is further provided with an SSD controller chip, and the SSD controller chip is connected to the SSD chip evaluation board and the NAND flash particles respectively.

7. The modular NAND flash test and verification tool according to claim 1, characterized in that: The NAND flash daughter board is provided with a mounting hole, and a base plate is further provided below the NAND flash daughter board. The base plate is provided with a positioning hole, and the positioning hole is fixedly connected to the mounting hole by screws.

8. The modular NAND flash test and verification tool according to claim 2, characterized in that: The interface between the connector and the gold finger includes a plurality of power signals and input and output signals.

9. The modular NAND flash test and verification tool according to claim 1, characterized in that: It also includes a control system, which is connected to the FPGA expansion card and the SSD chip evaluation board respectively, and is used to receive and process test data from both, and display or record test results.

10. A modular NAND flash test and verification device, characterized in that: It comprises the modular NAND flash test and verification tool as described in any one of claims 1-9.

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