Electronic component pin testing mechanism

Abstract

The utility model discloses an electronic component pin testing mechanism, and relates to the technical field of electronic component detection. The electronic component pin testing mechanism comprises a mechanical arm and a bearing base arranged on the mechanical arm, a pin testing probe is arranged at the bottom of the bearing base, and a distance adjusting mechanism used for adjusting the position of the pin testing probe is arranged on the bearing base. The distance adjusting mechanism comprises a double-thread screw rod rotatably connected to the bearing base and an adjusting block slidably connected to the interior of the bearing base, and a butt joint assembly is arranged between the pin test probe and the adjusting block. According to the electronic element pin testing mechanism, through the design of the distance adjusting mechanism, the distance between the two groups of pin testing probes can be conveniently adjusted, and meanwhile, through the design of the butt joint assembly, the damaged and faulted pin testing probes can be conveniently and rapidly replaced and maintained.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component detection, in particular to an electronic component pin testing mechanism. Background Art

[0002] When the electronic component pin testing mechanism is working, the electronic component to be tested is first transported to the test position through the conveying mechanism, and then the robotic arm drives the probe in the detection mechanism to start physical and electrical testing of the pins. After the test is completed, the control system records the test results and judges and evaluates the test results according to preset standards.

[0003] In traditional electronic component pin testing mechanisms, the spacing adjustment operation of the probes is not convenient, and screws and slide rails are usually used to fix the position. The test spacing of each batch of electronic components may be different. Therefore, when adjusting the spacing, a wrench or screwdriver is required to adjust the position. This adjustment operation is time-consuming and labor-intensive, and the probes are not easy to replace quickly when they are subsequently damaged or fail. In view of the shortcomings of the existing technology, the utility model provides an electronic component pin testing mechanism to solve the above problems. Utility Model Content

[0004] In response to the deficiencies in the prior art, the present invention provides an electronic component pin testing mechanism. Through the design of a spacing adjustment mechanism, the spacing between two groups of pin test probes can be easily adjusted, so that the pin test probes can perform pin tests on electronic components with different spacings. The spacing adjustment mechanism has a simple structure, stable operation, and easy operation. At the same time, combined with the design of the docking assembly, the pin test probes can be easily replaced on the adjustment block of the spacing adjustment mechanism. Therefore, the pin test probes can be easily and quickly replaced to adapt to the testing of multiple models of electronic components. At the same time, it is also convenient to quickly replace and maintain damaged and faulty pin test probes, ensuring that the testing mechanism is easy to use and meets usage requirements.

[0005] To achieve the above objectives, the present invention is implemented through the following technical solutions: an electronic component pin testing mechanism, comprising a robotic arm and a supporting base disposed on the robotic arm, a pin testing probe being disposed at the bottom of the supporting base, and a spacing adjustment mechanism for adjusting the position of the pin testing probe being disposed on the supporting base;

[0006] The spacing adjustment mechanism includes a double-threaded screw rotatably connected to the bearing base and an adjustment block slidably connected to the inside of the bearing base, the pin test probe is movably clamped at the bottom of the adjustment block, and the double-threaded screw is threadedly connected to the adjustment block;

[0007] A docking assembly is provided between the pin test probe and the adjustment block.

[0008] Preferably, the docking assembly includes a docking seat provided at the bottom of the adjustment block and a locking seat provided on the pin test probe, the locking seat is fixedly connected to a clamping block, and the clamping block is movably clamped in the interior of the docking seat.

[0009] Preferably, a locking rod is movably connected to the interior of the locking seat, a locking hole is opened inside the docking seat, and the locking rod passes through the clamping block and is movably inserted into the locking hole.

[0010] Preferably, a slider is slidably connected to the interior of the locking seat, a spring is fixedly connected between the slider and the locking seat, the slider is fixedly connected to the locking rod, and a push handle is provided on the slider.

[0011] Preferably, a limiting sliding groove corresponding to the adjustment block is provided on the bearing base.

[0012] Preferably, the double-threaded screw is provided with a rotating handle.

[0013] The utility model discloses an electronic component pin testing mechanism, which has the following beneficial effects:

[0014] The electronic component pin testing mechanism facilitates adjustment of the spacing between two groups of pin test probes through the design of the spacing adjustment mechanism, thereby enabling the pin test probes to perform pin tests on electronic components with different spacings. The spacing adjustment mechanism has a simple structure, stable operation, and convenient operation. Simultaneously, the design of the docking assembly facilitates replacement of the pin test probes on the adjustment block of the spacing adjustment mechanism, thereby enabling the pin test probes to be easily and quickly replaced to adapt to the testing of multiple models of electronic components. At the same time, it also facilitates rapid replacement and maintenance of damaged and faulty pin test probes, thereby ensuring that the testing mechanism is easy to use and meets usage requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0016] Figure 1 This is a first perspective diagram of the overall structure of the utility model;

[0017] Figure 2 This is the second perspective of the overall structural diagram of the utility model;

[0018] Figure 3 This is a cross-sectional view of the load-bearing base of the utility model;

[0019] Figure 4 This is a disassembly diagram of the adjustment block of the utility model;

[0020] Figure 5 It is a cross-sectional view of the locking seat of the utility model.

[0021] In the figure: 1. Robotic arm; 2. Bearing base; 21. Limiting slide; 3. Pin test probe; 4. Spacing adjustment mechanism; 41. Double-threaded screw; 42. Adjustment block; 43. Rotating handle; 5. Docking assembly; 51. Docking seat; 511. Locking hole; 52. Locking seat; 521. Locking rod; 522. Slider; 523. Spring; 524. Push handle; 53. Block. DETAILED DESCRIPTION

[0022] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention are clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of the present invention.

[0023] The embodiment of the present application solves the problem that the spacing adjustment operation of the probes in traditional electronic component pin testing mechanisms is not convenient by providing an electronic component pin testing mechanism. Screws and slide rails are usually used to fix the position. The test spacing of each batch of electronic components may be different. Therefore, when adjusting the spacing, a wrench or screwdriver is required to adjust the position. This adjustment operation is time-consuming and labor-intensive, and the probes are not easy to replace quickly when they are damaged or fail later.

[0024] In order to better understand the above technical solution, the above technical solution will be described in detail below with reference to the accompanying drawings and specific implementation methods.

[0025] The utility model discloses an electronic component pin testing mechanism according to the attached Figure 1-5 As shown, it includes a robotic arm 1 and a supporting base 2 arranged on the robotic arm 1, a pin test probe 3 is provided at the bottom of the supporting base 2, and a spacing adjustment mechanism 4 for adjusting the position of the pin test probe 3 is provided on the supporting base 2; a limiting slide 21 corresponding to the adjustment block 42 is opened on the supporting base 2, and the adjustment block 42 is limited by the provided limiting slide 21;

[0026] The spacing adjustment mechanism 4 includes a double-threaded screw 41 rotatably connected to the supporting base 2 and an adjustment block 42 slidably connected to the interior of the supporting base 2. The pin test probe 3 is movably engaged with the bottom of the adjustment block 42. The double-threaded screw 41 is threadedly connected to the adjustment block 42. A rotating handle 43 is provided on the double-threaded screw 41. The rotating handle 43 makes the rotation operation of the double-threaded screw 41 convenient.

[0027] When adjusting the position of the pin test probe 3, the double-threaded screw 41 can be directly rotated. When the double-threaded screw 41 rotates, the adjustment block 42 moves, and the adjustment block 42 drives the pin test probe 3 to move, thereby adjusting the spacing of the pin test probe 3;

[0028] A docking assembly 5 is provided between the pin test probe 3 and the adjustment block 42 .

[0029] The device facilitates adjustment of the spacing between the two groups of pin test probes 3 through the design of the spacing adjustment mechanism 4, thereby enabling the pin test probes 3 to perform pin tests on electronic components with different spacings. The spacing adjustment mechanism 4 has a simple structure, stable operation, and easy operation. At the same time, combined with the design of the docking component 5, the pin test probes 3 are easy to replace on the adjustment block 42 of the spacing adjustment mechanism 4. Therefore, the pin test probes 3 can be easily and quickly replaced to adapt to the testing of multiple models of electronic components. At the same time, it is also convenient to quickly replace and maintain damaged and faulty pin test probes 3, ensuring that the test mechanism is easy to use and meets usage requirements.

[0030] The docking assembly 5 includes a docking seat 51 provided at the bottom of the adjustment block 42 and a locking seat 52 provided on the pin test probe 3. A clamping block 53 is fixedly connected to the locking seat 52, and the clamping block 53 is movably clamped in the interior of the docking seat 51.

[0031] The docking assembly 5 has a simple structure. The design of the docking assembly 5 makes it easy to assemble and disassemble the pin test probe 3 on the adjustment block 42. When installing the pin test probe 3, the clamping block 53 and the docking seat 51 can be directly clamped.

[0032] The locking seat 52 is internally movably connected with a locking rod 521, and a locking hole 511 is opened inside the docking seat 51. The locking rod 521 passes through the block 53 and is movably inserted into the locking hole 511. The locking seat 52 is internally slidably connected with a slider 522. A spring 523 is fixedly connected between the slider 522 and the locking seat 52. The slider 522 and the locking rod 521 are fixedly connected, and a push handle 524 is provided on the slider 522.

[0033] In the docking assembly 5, through the design of the locking seat 52 and the locking rod 521, the position of the clamping block 53 and the docking seat 51 is locked after clamping, and is fixed and stable after locking, thereby ensuring the stable installation of the pin test probe 3. When clamping the clamping block 53 and the docking seat 51, the push handle 524 is first toggled so that the push handle 524 drives the slider 522 and the locking rod 521 to move as a whole and squeeze the spring 523. When the clamping block 53 and the docking seat 51 are clamped, the push handle 524 is released, the spring 523 is reset and pushes the slider 522 and the locking rod 521 to move, so that the locking rod 521 is inserted into the locking hole 511, completing the clamping and locking of the clamping block 53 and the docking seat 51.

[0034] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and improvements may be made to the present invention without departing from the spirit and scope of the present invention. Such changes and improvements are intended to fall within the scope of the present invention. The scope of protection claimed in this invention is defined by the appended claims and their equivalents.

Claims

1. An electronic component pin testing mechanism, comprising a robotic arm (1) and a supporting base (2) arranged on the robotic arm (1), wherein a pin testing probe (3) is provided at the bottom of the supporting base (2), characterized in that: The bearing base (2) is provided with a spacing adjustment mechanism (4) for adjusting the position of the pin test probe (3); The spacing adjustment mechanism (4) comprises a double-threaded screw (41) rotatably connected to the bearing base (2) and an adjustment block (42) slidably connected inside the bearing base (2); the pin test probe (3) is movably clamped at the bottom of the adjustment block (42); and the double-threaded screw (41) is threadedly connected to the adjustment block (42); A docking assembly (5) is provided between the pin test probe (3) and the adjustment block (42).

2. An electronic component pin testing mechanism according to claim 1, characterized in that: The docking assembly (5) comprises a docking seat (51) arranged at the bottom of the adjustment block (42) and a locking seat (52) arranged on the pin test probe (3); a clamping block (53) is fixedly connected to the locking seat (52); and the clamping block (53) is movably clamped inside the docking seat (51).

3. An electronic component pin testing mechanism according to claim 2, characterized in that: The locking seat (52) is internally movably engaged with a locking rod (521), a locking hole (511) is provided inside the docking seat (51), and the locking rod (521) passes through the clamping block (53) and is movably engaged in the locking hole (511).

4. The electronic component pin testing mechanism according to claim 3, characterized in that: The locking seat (52) is internally slidably connected to a slider (522), a spring (523) is fixedly connected between the slider (522) and the locking seat (52), the slider (522) and the locking rod (521) are fixedly connected, and a push handle (524) is provided on the slider (522).

5. The electronic component pin testing mechanism according to claim 1, characterized in that: The bearing base (2) is provided with a limiting sliding groove (21) corresponding to the adjustment block (42).

6. The electronic component pin testing mechanism according to claim 1, characterized in that: The double-threaded screw rod (41) is provided with a rotating handle (43).

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