SMT (Surface Mount Technology) first workpiece automatic detection equipment

Abstract

The utility model relates to the technical field of automation equipment, in particular to SMT (Surface Mount Technology) first workpiece automatic detection equipment, which comprises an equipment body, and the equipment body comprises a rack, and a probe detection mechanism, a clamping mechanism, a first driving mechanism, a second driving mechanism and a detector which are respectively arranged above the rack; the probe detection mechanism is arranged above the clamping mechanism; the clamping mechanism is connected above the first driving mechanism, and the clamping mechanism is used for fixing a circuit board; the first driving mechanism is used for driving the clamping mechanism to move; the second driving mechanism is used for driving the probe detection mechanism to move; and the detector is connected to the probe detection mechanism and is used for detecting the resistance value, the capacitance value and the inductance value of the circuit board through the probe detection mechanism. The utility model provides the SMT first workpiece automatic detection equipment which replaces manual detection and improves the detection precision and efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of automation equipment, in particular to an SMT first piece automatic detection device. Background Art

[0002] Automation refers to the process by which machinery, equipment, systems, processes, production, and management processes achieve desired goals through automated detection, information processing, analysis, judgment, and manipulation and control, with minimal or no direct human involvement, in accordance with human requirements. Automation technology is widely used in industry, agriculture, military affairs, scientific research, transportation, commerce, healthcare, services, and the home. The adoption of automation not only liberates people from heavy physical labor, some mental labor, and harsh and dangerous working environments, but also expands human function, significantly improves labor productivity, and enhances humanity's ability to understand and transform the world. Therefore, automation is a crucial condition and a significant hallmark of modernization in industry, agriculture, national defense, and science and technology.

[0003] At present, the traditional SMT first-article inspection solution is to manually test the actual values of components such as capacitors and resistors. This not only makes the inspection efficiency relatively low, but also makes it easy for humans to misjudge the measurement results and cannot keep complete records. Utility Model Content

[0004] Based on this, the purpose of the present invention is to provide an SMT first-article automatic inspection device that replaces manual inspection and improves inspection accuracy and efficiency.

[0005] The utility model adopts the following technical solutions:

[0006] A first-article automatic inspection device for SMT includes a device body, which includes a frame, a probe detection mechanism, a clamping mechanism, a first drive mechanism, a second drive mechanism, and a detector respectively arranged above the frame; the probe detection mechanism is arranged above the clamping mechanism; the clamping mechanism is connected to the top of the first drive mechanism, and the clamping mechanism is used to fix the circuit board; the first drive mechanism is used to drive the clamping mechanism to move; the second drive mechanism is used to drive the probe detection mechanism to move; the detector is connected to the probe detection mechanism, and the detector is used to detect the resistance value, capacitance value, and inductance value of the circuit board through the probe detection mechanism.

[0007] A further improvement to the above technical solution is that the probe detection mechanism includes a movable bracket, a lifting guide rail electric cylinder, a rotating platform, an adjustment buffer assembly, several test probes and a visual detection assembly; the movable bracket is movably connected to the second driving mechanism; the lifting guide rail electric cylinder is arranged on one side of the movable bracket; the rotating platform is arranged on one side of the lifting guide rail electric cylinder, and the rotating platform is used to rotate the adjustment buffer assembly and several test probes; the several test probes are arranged at the bottom of the adjustment buffer assembly; the visual detection assembly is arranged on one side of the movable bracket.

[0008] A further improvement to the above technical solution is that the adjustment buffer assembly includes an adjustment motor, a first slider, a second slider, a first L-shaped block, a first probe block, a second L-shaped block, and a second probe block; the output end of the adjustment motor is connected to an adjustment gear, the inner side of the first slider is connected to a first rack, the inner side of the second slider is connected to a second rack, and the adjustment gear is respectively connected to the first rack and the second rack; the first L-shaped block is movably connected to the first probe block through a linear guide, and a first spring column is connected between the bottom of the first L-shaped block and the top of the first probe block; the second L-shaped block is movably connected to the second probe block through a linear guide, and a second spring column is connected between the bottom of the second L-shaped block and the top of the second probe block; the first probe block and the second probe block are respectively connected to the upper part of the test probe.

[0009] A further improvement to the above technical solution is that the adjustment buffer assembly further includes a slide rail, and the first slider and the second slider are respectively movably connected to the slide rail.

[0010] A further improvement to the above technical solution is that the visual inspection component includes a detection camera and a detection lighting, and the detection camera is arranged on the upper part of the movable bracket; there are two detection lightings, and the two detection lightings are respectively arranged on both sides of the lower part of the movable bracket, and the detection camera is arranged on the upper part of the two detection lightings.

[0011] A further improvement to the above technical solution is that the clamping mechanism includes a clamping platform, a sliding guide rail, a clamping sliding rod, and a clamping fixed rod, and the clamping platform is movably connected to the first driving mechanism; the number of the sliding guide rails is set to two, and the two sliding guide rails are respectively arranged on both sides of the clamping platform; the clamping sliding rod is movably connected to the sliding guide rail, and a first movable shaft is provided on one side of the clamping sliding rod, and a plurality of first clamping claws are provided on the upper surface of the first movable shaft, and a first locking knob is connected to one side of the first clamping claw; a second movable shaft is provided on one side of the clamping fixed rod, and a plurality of second clamping claws are provided on the upper surface of the second movable shaft, and a second locking knob is connected to one side of the second clamping claw.

[0012] A further improvement to the above technical solution is that both ends of the clamping sliding rod are respectively connected to a third locking knob, and the third locking knob is connected to the sliding guide rail.

[0013] A further improvement to the above technical solution is that the first driving mechanism is a first linear module, the bottom of the first driving mechanism is connected to a mounting platform, and the mounting platform is arranged inside the frame.

[0014] A further improvement to the above technical solution is that the second driving mechanism is a second linear module, which is connected to the mounting platform and is arranged across the top of the first driving mechanism.

[0015] A further improvement to the above technical solution is that the detector is electrically connected to a display screen, and the display screen is connected to the frame.

[0016] The beneficial effects of the utility model are:

[0017] The utility model is provided with a probe detection mechanism, a clamping mechanism, a first drive mechanism, a second drive mechanism and a detector, which automatically measures the values of resistance, capacitance and inductance on a circuit board, and automatically detects whether the appearance and polarity of components such as chips, diodes and transistors are correct through machine vision. The detection process does not require human participation. The detector automatically detects, automatically determines whether it is qualified, and automatically records the measurement results, thereby greatly improving the reliability and efficiency of the detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the structure of the SMT first piece automatic detection equipment of the present utility model;

[0019] Figure 2 for Figure 1 A schematic diagram of the structure of the probe detection mechanism and the second drive mechanism of the SMT first-article automatic inspection equipment;

[0020] Figure 3 for Figure 2 Schematic diagram of the structure of the probe detection mechanism of the SMT first-article automatic inspection equipment;

[0021] Figure 4 for Figure 1 Schematic diagram of the structure of the adjustment buffer component of the SMT first-article automatic inspection equipment;

[0022] Figure 5 for Figure 4 A partial enlarged view of circle A of the adjustment buffer component;

[0023] Figure 6 for Figure 1 Schematic diagram of the structure of the clamping mechanism of the SMT first-article automatic inspection equipment;

[0024] Figure 7 for Figure 6 A partial enlarged view of circle B of the clamping mechanism;

[0025] Figure 8 for Figure 6 A partial enlarged view of circle C of the clamping mechanism.

[0026] The numbers in the figure are:

[0027] 10. Equipment body; 11. Frame; 12. First drive mechanism; 13. Second drive mechanism; 14. Detector; 15. Display screen; 16. Mounting platform; 20. Probe detection mechanism; 21. Movable bracket; 22. Lifting guide rail electric cylinder; 23. Rotating platform; 24. Test probe; 30. Clamping mechanism; 31. Clamping platform; 32. Sliding guide rail; 40. Adjustment buffer assembly; 41. Adjustment motor; 411. Adjustment gear; 42. First slider; 421. First rack; 43. Second slider; 431. Second rack; 44. First L-shaped connector; 441. First spring column; 45. First probe connector; 46. Second L-shaped connector; 461. Second spring column; 47. Second probe connector; 48. Linear guide rail; 49. Slide rail; 50. Visual inspection assembly; 51. Inspection camera; 52. Inspection lighting; 60. Clamping sliding rod; 61. First movable axis; 62. First clamping jaw; 63. First locking knob; 64. Third locking knob; 70. Clamping fixed rod; 71. Second movable axis; 72. Second clamping jaw; 73. Second locking knob. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0029] In the description of this utility model, it should be noted that the terms "vertical," "upper," "lower," and "horizontal," etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of this utility model and simplify the description. They are not intended to indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," "third," and "fourth" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0030] It should also be noted that, in the description of the present invention, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections, direct connections, connections through an intermediate medium, or internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0031] like Figures 1 to 8 As shown, an embodiment of the present invention relates to an SMT first-piece automatic detection equipment, including an equipment body 10, the equipment body 10 includes a frame 11, a probe detection mechanism 20, a clamping mechanism 30, a first drive mechanism 12, a second drive mechanism 13 and a detector 14 respectively arranged above the frame 11; the probe detection mechanism 20 is arranged above the clamping mechanism 30; the clamping mechanism 30 is connected to the top of the first drive mechanism 12, and the clamping mechanism 30 is used to fix the circuit board; the first drive mechanism 12 is used to drive the clamping mechanism 30 to move; the second drive mechanism 13 is used to drive the probe detection mechanism 20 to move; the detector 14 is connected to the probe detection mechanism 20, and the detector 14 is used to detect the resistance value, capacitance value and inductance value of the circuit board through the probe detection mechanism 20.

[0032] Furthermore, the probe detection mechanism 20 includes a movable bracket 21, a lifting guide rail electric cylinder 22, a rotating platform 23, an adjustment buffer assembly 40, a plurality of test probes 24 and a visual detection assembly 50; the movable bracket 21 is movably connected to the second drive mechanism 13; the lifting guide rail electric cylinder 22 is arranged on one side of the movable bracket 21; the rotating platform 23 is arranged on one side of the lifting guide rail electric cylinder 22, and the rotating platform 23 is used to rotate the adjustment buffer assembly 40 and a plurality of test probes 24; the plurality of test probes 24 are arranged at the bottom of the adjustment buffer assembly 40; the visual detection assembly 50 is arranged on one side of the movable bracket 21, and the visual detection assembly 50 is used to detect chips, diodes, and transistors on the circuit board through a visual camera. Specifically, an adjustment buffer assembly 40 and a plurality of test probes 24 are provided, and the test probes 24 achieve smooth up and down movement through the linear guide 48 of the adjustment buffer assembly 40, thereby improving the accuracy of detection.

[0033] Furthermore, the adjustment buffer assembly 40 includes an adjustment motor 41, a first slider 42, a second slider 43, a first L-shaped block 44, a first probe block 45, a second L-shaped block 46, and a second probe block 47; the output end of the adjustment motor 41 is connected to an adjustment gear 411, the inner side of the first slider 42 is connected to a first rack 421, the inner side of the second slider 43 is connected to a second rack 431, and the adjustment gear 411 is connected to the first rack 421 and the second rack 431 respectively; The first L-shaped connector 44 is movably connected to the first probe connector 45 via a linear guide 48. A first spring column 441 is connected between the bottom of the first L-shaped connector 44 and the top of the first probe connector 45. The second L-shaped connector 46 is movably connected to the second probe connector 47 via a linear guide 48. A second spring column 461 is connected between the bottom of the second L-shaped connector 46 and the top of the second probe connector 47. The first and second probe connectors 45, 47 are respectively connected to the upper portions of the test probes 24. Specifically, according to the size of the component to be tested, the width of the test probe 24 is automatically adjusted by adjusting the motor 41, the adjustment gear 411, the first slider 42, the second slider 43, the first rack 421, and the second rack 431; when testing the resistance, capacitance, and inductance on the circuit board, the linear guide 48, the first spring column 441, and the second spring column 461 ensure that the pressure applied by the test probe 24 to the resistance, capacitance, and inductance is constant, ensuring that no components are lost and the measurement repeatability is guaranteed.

[0034] Furthermore, the adjustment buffer assembly 40 further includes a slide rail 49, and the first slider 42 and the second slider 43 are movably connected to the slide rail 49. Specifically, the adjustment motor 41 drives the adjustment gear 411 to rotate, causing the first rack 421 and the second rack 431 to move in opposite directions, respectively moving the first slider 42 and the second slider 43 on the slide rail 49 to move away from or closer to each other, which is highly practical.

[0035] Furthermore, the visual inspection assembly 50 includes an inspection camera 51 and an inspection light 52. The inspection camera 51 is located above the movable bracket 21. Two inspection lights 52 are provided, one on each side of the lower portion of the movable bracket 21, and the inspection camera 51 is located above the two inspection lights 52. Specifically, the inspection camera 51 is used to inspect components such as chips, diodes, and transistors on a circuit board to determine their appearance and polarity. The inspection light 52 is also provided to increase the brightness during inspection and improve detection accuracy.

[0036] Furthermore, the clamping mechanism 30 includes a clamping platform 31, a sliding guide rail 32, a clamping sliding rod 60, and a clamping fixed rod 70, and the clamping platform 31 is movably connected to the first driving mechanism 12; the number of the sliding guide rails 32 is set to two, and the two sliding guide rails 32 are respectively arranged on both sides of the clamping platform 31; the clamping sliding rod 60 is movably connected to the sliding guide rail 32, and a first movable shaft 61 is provided on one side of the clamping sliding rod 60, and a plurality of first clamping claws 62 are provided on the upper surface of the first movable shaft 61, and a first locking knob 63 is connected to one side of the first clamping claw 62; a second movable shaft 71 is provided on one side of the clamping fixed rod 70, and a plurality of second clamping claws 72 are provided on the upper surface of the second movable shaft 71, and a second locking knob 73 is connected to one side of the second clamping claw 72. Specifically, the test circuit board is effectively fixed by the clamping mechanism 30 for detection; when working, one side of the circuit board is clamped by the second clamping claw 72 of the clamping fixing rod 70 and fixed by the second locking knob 73. According to the size of the circuit board, the sliding clamping sliding rod 60 is adjusted so that the distance between the clamping sliding rod 60 and the clamping fixing rod 70 matches the size of the circuit board. The first clamping claw 62 clamps the other side of the circuit board. After the adjustment is completed, the first locking knob 63 locks the first clamping claw 62 to complete the fixation.

[0037] Furthermore, third locking knobs 64 are connected to both ends of the clamping slide bar 60, and the third locking knobs 64 are connected to the sliding guide rail 32. Specifically, the clamping slide bar 60 is adjusted according to the size of the circuit board and moves on the sliding guide rail 32. When the size of the circuit board matches, the third locking knobs 64 are locked to fix the clamping slide bar 60, effectively ensuring the stability of the fixation.

[0038] Furthermore, the first drive mechanism 12 is a first linear module, the bottom of which is connected to a mounting platform 16, which is located inside the frame 11. The second drive mechanism 13 is a second linear module, which is connected to the mounting platform 16 and is located across from the first drive mechanism 12. The first drive mechanism 12 drives the clamping mechanism 30 to move to meet the detection requirements; the second drive mechanism 13 drives the probe detection mechanism 20 to move, further meeting the detection requirements, and has strong practicality.

[0039] Furthermore, the detector 14 is electrically connected to a display screen 15, which is connected to the frame 11. Specifically, the detector 14 is connected to the detection system to achieve automatic detection, automatic qualification determination, and automatic recording of measurement results, effectively improving the reliability and efficiency of detection. The detector 14 displays the values detected by the probe detection mechanism 20 on the display screen 15 for easy viewing by the operator.

[0040] The utility model is provided with a probe detection mechanism 20, a clamping mechanism 30, a first drive mechanism 12, a second drive mechanism 13 and a detector 14, which automatically measures the values of resistance, capacitance and inductance on a circuit board, and automatically detects whether the appearance and polarity of components such as chips, diodes and transistors are correct through machine vision. The detection process does not require human participation. The detector 14 automatically detects, automatically determines whether it is qualified, and automatically records the measurement results, thereby greatly improving the reliability and efficiency of the detection.

[0041] The above merely represents the preferred technical solution of the present invention. While the description is relatively specific and detailed, it should not be construed as limiting the scope of the patent. It should be noted that a person skilled in the art may make various modifications and improvements without departing from the concept of the present invention, and the present invention is intended to encompass such modifications and variations.

Claims

1. An SMT first piece automatic detection equipment, characterized in that: The device comprises a main body, which comprises a frame, a probe detection mechanism, a clamping mechanism, a first driving mechanism, a second driving mechanism and a detector respectively arranged above the frame; the probe detection mechanism is arranged above the clamping mechanism; the clamping mechanism is connected to the top of the first driving mechanism, and the clamping mechanism is used to fix the circuit board; the first driving mechanism is used to drive the clamping mechanism to move; the second driving mechanism is used to drive the probe detection mechanism to move; the detector is connected to the probe detection mechanism, and the detector is used to detect the resistance value, capacitance value and inductance value of the circuit board through the probe detection mechanism.

2. The SMT first piece automatic inspection equipment according to claim 1, characterized in that: The probe detection mechanism includes a movable bracket, a lifting guide rail electric cylinder, a rotating platform, an adjustment buffer assembly, several test probes and a visual detection assembly; the movable bracket is movably connected to the second driving mechanism; the lifting guide rail electric cylinder is arranged on one side of the movable bracket; the rotating platform is arranged on one side of the lifting guide rail electric cylinder, and the rotating platform is used to rotate the adjustment buffer assembly and several test probes; the several test probes are arranged at the bottom of the adjustment buffer assembly; the visual detection assembly is arranged on one side of the movable bracket.

3. The SMT first piece automatic inspection equipment according to claim 2, characterized in that: The adjustment buffer assembly includes an adjustment motor, a first slider, a second slider, a first L-shaped connection block, a first probe connection block, a second L-shaped connection block, and a second probe connection block; the output end of the adjustment motor is connected to an adjustment gear, the inner side of the first slider is connected to a first rack, the inner side of the second slider is connected to a second rack, and the adjustment gear is connected to the first rack and the second rack respectively; the first L-shaped connection block is movably connected to the first probe connection block through a linear guide, and a first spring column is connected between the bottom of the first L-shaped connection block and the top of the first probe connection block; the second L-shaped connection block is movably connected to the second probe connection block through a linear guide, and a second spring column is connected between the bottom of the second L-shaped connection block and the top of the second probe connection block; the first probe connection block and the second probe connection block are respectively connected to the upper part of the test probe.

4. The SMT first piece automatic inspection equipment according to claim 3, characterized in that: The adjustment buffer assembly further includes a slide rail, and the first slider and the second slider are movably connected to the slide rail respectively.

5. The SMT first piece automatic inspection equipment according to claim 3, characterized in that: The visual inspection component includes a detection camera and a detection lighting. The detection camera is arranged on the upper part of the movable bracket; there are two detection lightings, which are respectively arranged on both sides of the lower part of the movable bracket, and the detection camera is arranged on the upper part of the two detection lightings.

6. The SMT first piece automatic inspection equipment according to claim 1, characterized in that: The clamping mechanism includes a clamping platform, a sliding guide rail, a clamping sliding rod, and a clamping fixed rod, and the clamping platform is movably connected to the first driving mechanism; the number of the sliding guide rails is set to two, and the two sliding guide rails are respectively arranged on both sides of the clamping platform; the clamping sliding rod is movably connected to the sliding guide rail, and a first movable shaft is provided on one side of the clamping sliding rod, and a plurality of first clamping claws are provided on the upper surface of the first movable shaft, and a first locking knob is connected to one side of the first clamping claw; a second movable shaft is provided on one side of the clamping fixed rod, and a plurality of second clamping claws are provided on the upper surface of the second movable shaft, and a second locking knob is connected to one side of the second clamping claw.

7. The SMT first piece automatic inspection equipment according to claim 6, characterized in that: The two ends of the clamping sliding rod are respectively connected with a third locking knob, and the third locking knob is connected to the sliding guide rail.

8. The SMT first piece automatic inspection equipment according to claim 1, characterized in that: The first driving mechanism is a first linear module. The bottom of the first driving mechanism is connected to a mounting platform, and the mounting platform is arranged inside the frame.

9. The SMT first piece automatic inspection equipment according to claim 1, characterized in that: The second driving mechanism is a second linear module, which is connected to the mounting platform and is arranged across the top of the first driving mechanism.

10. The SMT first piece automatic inspection equipment according to claim 1, characterized in that: The detector is electrically connected to a display screen, and the display screen is connected to the frame.

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