Refrigeration performance detection table for semiconductor refrigerator

Abstract

The utility model provides a semiconductor refrigerator refrigeration performance test bench, which relates to the technical field of semiconductor refrigerator production, and comprises a test bench main body, the top of the test bench main body close to the back side is connected with a thermal insulation box cover through a hinge, and the front side of the thermal insulation box cover is fixedly connected with a sealing block. A detection chamber is formed in the detection table main body, the sealing block is adaptively clamped with the detection chamber, electric push rods are fixedly connected to the corners of the periphery of the bottom of the detection chamber, a bearing table is fixedly connected to the output ends of the electric push rods, and a semiconductor refrigerator body is clamped to the center of the top of the bearing table; according to the utility model, through the design, the refrigeration effect of the refrigerator in a limited space can be effectively detected, so that the accuracy of the detection effect can be effectively ensured.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor refrigerator production, in particular to a semiconductor refrigerator refrigeration performance testing platform. Background Art

[0002] Semiconductor cooler, also known as thermoelectric cooler, is a heat pump. Its advantage is that it has no sliding parts. It is used in some places where space is limited, reliability is high, and there is no refrigerant pollution. The operation of the semiconductor cooler uses direct current. It can both cool and heat. By changing the polarity of the direct current, the cooling or heating can be determined on the same cooler. This effect is produced by the principle of thermoelectricity.

[0003] In the prior art, a semiconductor refrigerator is a device that can achieve cooling or heating. During the production process of the existing semiconductor refrigerator, the refrigeration performance of the refrigerator needs to be tested. Only after the refrigeration performance is qualified can it be put on the market. The refrigeration effect of the existing semiconductor refrigerator is generally tested through a test bench, and the sealing performance of the test bench is poor, so it is easy to cause deviations in the refrigeration performance test results of the semiconductor refrigerator. Therefore, we propose a semiconductor refrigerator refrigeration performance test bench. Utility Model Content

[0004] The purpose of the present utility model is to solve the shortcomings in the prior art. A semiconductor refrigerator is a device that can realize cooling or heating. However, during the production process of the existing semiconductor refrigerator, it is necessary to test the refrigeration performance of the refrigerator. Only after the refrigeration performance is qualified can it be put on the market. The refrigeration effect of the existing semiconductor refrigerator is generally tested through a test bench, and the sealing performance of the test bench is poor, which easily leads to deviations in the test results of the refrigeration performance of the semiconductor refrigerator.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] A semiconductor refrigerator refrigeration performance test bench includes a test bench body, a heat preservation box cover is hingedly connected to the top of the test bench body near the back, a sealing block is fixedly connected to the front of the heat preservation box cover, a test chamber is opened inside the test bench body, and the sealing block is adapted to be snap-fitted to the test chamber, electric push rods are fixedly connected to the corners of the bottom of the test chamber, the output ends of the electric push rods are fixedly connected to a supporting platform, the semiconductor refrigerator body is snap-fitted to the top center of the supporting platform, and a temperature sensor is fixedly connected to the inside of the test chamber near the left front.

[0007] As a preferred solution of the present invention, a vent is provided on the front of the sealing block, and the vent passes through the insulation box cover, and an electric sliding door is slidably connected to the inner side of the vent and inside the sealing block.

[0008] The technical effect of adopting the above further solution is that, through the provision of the vents, the vents facilitate the semiconductor cooler body to discharge heat from the detection chamber when it is in operation.

[0009] As a preferred solution of the present invention, a ventilation pipe is fixedly connected to the right side of the detection platform body, the ventilation pipe is connected to the detection chamber, a ventilation fan is fixedly connected to the inside of the ventilation pipe, and a sealing cover is clamped on the right side of the ventilation pipe.

[0010] The technical effect of adopting the above further scheme is: through the setting of the ventilation fan, the ventilation fan can ventilate the inside of the detection room after the semiconductor refrigerator is tested. By ventilating the inside of the detection room, the cold air inside the detection room can be quickly discharged, making it convenient for the next semiconductor refrigerator to be tested.

[0011] As a preferred solution of the present invention, a controller is fixedly connected to the front side of the detection platform body, and the temperature sensor is controlled by the controller.

[0012] As a preferred solution of the present invention, a plurality of guide grooves are equidistantly provided on both sides of the support platform, and spring dampers are fixedly connected inside the guide grooves.

[0013] As a preferred solution of the present invention, a clamping plate is clamped on the top of the semiconductor cooler body near both sides, and the bottom of the clamping plate is fixed with a guide roller corresponding to the guide groove, and the guide roller is slidably connected to the guide groove, and the bottom of the guide roller is fixed to the top of the spring damper.

[0014] As a preferred solution of the present invention, a power socket is fixedly connected to the back of the detection chamber near the top, and the semiconductor cooler body is electrically connected to the power socket, and the power socket is powered by an external power supply.

[0015] The technical effect of adopting the above further solution is: by providing the power supply socket, it is convenient to power the semiconductor refrigerator, thereby ensuring the normal operation of the semiconductor refrigerator.

[0016] Compared with the prior art, the beneficial effects of the present invention are:

[0017] In the present utility model, through the setting of the detection chamber, the detection chamber can effectively confine the semiconductor refrigerator body within a certain space, and the detection chamber can be effectively sealed in conjunction with the thermal insulation box cover and the sealing block. In this way, the cooling speed of the semiconductor refrigerator body in the detection chamber can be effectively detected by the temperature sensor, so that the cooling performance can be quickly detected, and the accuracy of the test results can be effectively guaranteed. The semiconductor refrigerator body can be effectively and conveniently fixed in the center of the detection chamber through the supporting platform and the electric push rod. In this way, it can be effectively guaranteed that the detection chamber can be evenly covered, thereby ensuring the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the overall structure of the utility model;

[0019] Figure 2 This is a schematic diagram of the structure of the ventilation fan of the utility model;

[0020] Figure 3 This is a schematic diagram of the structure of the spring damper of the utility model.

[0021] Legend: 1. Test bench body; 11. Ventilation duct; 12. Ventilation fan; 13. Sealing cover; 14. Controller; 2. Insulation box cover; 3. Sealing block; 31. Ventilation port; 32. Electric sliding door; 4. Test chamber; 41. Power supply socket; 5. Electric push rod; 6. Support platform; 61. Guide groove; 62. Spring damper; 7. Semiconductor refrigerator body; 71. Clamping plate; 72. Guide roller; 8. Temperature sensor. DETAILED DESCRIPTION

[0022] The following will combine the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0023] To facilitate understanding of the present invention, the present invention will be described more comprehensively below with reference to relevant references, and several embodiments of the present invention are given. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0024] It should be noted that when an element is referred to as being "fixed on" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used in this article are for illustrative purposes only.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used herein in the specification of this invention are for the purpose of describing specific embodiments only and are not intended to limit this invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0026] Example 1

[0027] like Figure 1-3 As shown, the utility model provides a technical solution: a semiconductor refrigerator refrigeration performance test bench, including a test bench main body 1, the top of the test bench main body 1 is connected to an insulation box cover 2 by a hinge near the back, the front of the insulation box cover 2 is fixedly connected to a sealing block 3, a test chamber 4 is opened inside the test bench main body 1, and the sealing block 3 is adapted to be snap-fitted to the test chamber 4, electric push rods 5 are fixedly connected to the corners around the bottom of the test chamber 4, the output end of the electric push rod 5 is fixedly connected to a supporting platform 6, a semiconductor refrigerator body 7 is snap-fitted to the top center of the supporting platform 6, and a temperature sensor 8 is fixedly connected to the inside of the test chamber 4 near the left front, which can effectively detect the temperature change inside the test chamber 4.

[0028] Example 2

[0029] like Figure 1-3 As shown, a vent 31 is provided on the front of the sealing block 3, and the vent 31 passes through the insulation box cover 2. An electric sliding door 32 is slidably connected to the inner side of the vent 31 and located inside the sealing block 3. The electric sliding door 32 can effectively control the opening and closing of the vent 31.

[0030] A ventilation pipe 11 is fixedly connected to the right side of the test bench body 1 . The ventilation pipe 11 is connected to the test chamber 4 . A ventilation fan 12 is fixedly connected to the inside of the ventilation pipe 11 . A sealing cover 13 is clamped to the right side of the ventilation pipe 11 .

[0031] A controller 14 is fixedly connected to the front of the detection platform body 1 , and the temperature sensor 8 is controlled by the controller 14 . The controller 14 can effectively display and store the temperature displayed by the temperature sensor 8 .

[0032] A plurality of guide grooves 61 are equidistantly provided on both sides of the support platform 6 . Spring dampers 62 are fixedly connected to the inside of the guide grooves 61 . The spring dampers 62 can effectively provide clamping force for the clamping plate 71 .

[0033] The top of the semiconductor cooler body 7 is clamped with a clamping plate 71 near both sides, and the bottom of the clamping plate 71 is fixed with a guide roller 72 corresponding to the guide groove 61, and the guide roller 72 is slidingly connected to the guide groove 61, and the bottom of the guide roller 72 is fixed to the top of the spring damper 62. The guide roller 72 facilitates the connection between the clamping plate 71 and the spring damper 62.

[0034] A power socket 41 is fixedly connected to the back of the detection chamber 4 near the top, and the semiconductor cooler body 7 is electrically connected to the power socket 41 , and the power socket 41 is powered by an external power source.

[0035] The utility model working process: when using a semiconductor refrigerator refrigeration performance test bench, first, take out the semiconductor refrigerator body 7 to be tested, after taking it out, lift the clamping plate 71 upward, after lifting, place both sides of the semiconductor refrigerator body 7 on the bottom of the clamping plate 71, then, under the action of the spring damper 62, the guide roller 72 slides downward in the guide groove 61, driving the clamping plate 71 to clamp the semiconductor refrigerator body 7, after the fixation is completed, the electric push rod 5 drives the carrier 6 to descend, and after the carrier 6 descends, the semiconductor refrigerator body 7 is placed on the bottom of the clamping plate 71. The refrigerator body 7 is connected to the power supply socket 41 to be energized, and the semiconductor refrigerator body 7 is controlled to cool. Subsequently, the thermal insulation box cover 2 is closed, and the sealing block 3 is adapted to be engaged with the detection chamber 4. At this time, the electric sliding door 32 is opened to provide ventilation and cooling for the semiconductor refrigerator body 7. At the same time, the temperature sensor 8 detects the temperature changes in the detection chamber 4 in real time, and the staff can observe it through the controller 14. The utility model is designed to effectively detect the cooling effect of the refrigerator in a limited space, thereby effectively ensuring the accuracy of the detection effect.

[0036] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A semiconductor refrigerator refrigeration performance test bench, comprising a test bench body (1), characterized in that: The top of the detection platform body (1) is connected to an insulation box cover (2) through a hinge near the back, and a sealing block (3) is fixed to the front of the insulation box cover (2). A detection chamber (4) is opened inside the detection platform body (1), and the sealing block (3) is adapted to be clamped with the detection chamber (4). Electric push rods (5) are fixed to the corners around the bottom of the detection chamber (4), and the output end of the electric push rod (5) is fixed to a supporting platform (6). A semiconductor refrigerator body (7) is clamped at the top center of the supporting platform (6). A temperature sensor (8) is fixed to the inside of the detection chamber (4) near the left front.

2. The semiconductor refrigerator refrigeration performance test bench according to claim 1, characterized in that: A vent (31) is provided on the front of the sealing block (3), and the vent (31) passes through the thermal insulation box cover (2). An electric sliding door (32) is slidably connected to the inner side of the vent (31) and located inside the sealing block (3).

3. The semiconductor refrigerator refrigeration performance test bench according to claim 1, characterized in that: A ventilation pipe (11) is fixedly connected to the right side of the detection platform body (1), and the ventilation pipe (11) is communicated with the detection chamber (4). A ventilation fan (12) is fixedly connected to the inside of the ventilation pipe (11), and a sealing cover (13) is clamped on the right side of the ventilation pipe (11).

4. The semiconductor refrigerator refrigeration performance testing platform according to claim 1, characterized in that: A controller (14) is fixedly connected to the front of the detection platform body (1), and the temperature sensor (8) is controlled by the controller (14).

5. The semiconductor refrigerator refrigeration performance test bench according to claim 1, characterized in that: A plurality of guide grooves (61) are equidistantly provided on both sides of the bearing platform (6), and spring dampers (62) are fixedly connected inside the guide grooves (61).

6. The semiconductor refrigerator refrigeration performance test bench according to claim 5, characterized in that: The top of the semiconductor cooler body (7) is clamped with a clamping plate (71) near both sides, and the bottom of the clamping plate (71) is fixed with a guide roller (72) corresponding to the guide groove (61), and the guide roller (72) is slidably connected to the guide groove (61), and the bottom of the guide roller (72) is fixed to the top of the spring damper (62).

7. The semiconductor refrigerator refrigeration performance testing platform according to claim 1, characterized in that: A power socket (41) is fixedly connected to the back of the detection chamber (4) near the top, and the semiconductor cooler body (7) is electrically connected to the power socket (41), and the power socket (41) is powered by an external power supply.

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