Multifunctional adjustable test bench
By designing a multi-function adjustable test bench, using X and Y axis fine adjustment and rotation adjustment, the coaxial problem of infrared and spectral confocal probes is solved, achieving the accuracy of probe measurement and the convenience of multiple sets of data acquisition.
Patent Information
- Application Number
- CN202422202420.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-09
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2034-09-09
AI Technical Summary
In existing thickness measurement experiments, the upper and lower coaxiality of infrared and spectral confocal probes is high, but processing and assembly errors lead to inaccurate measurement results, and a multi-functional adjustable test bench is needed to solve this problem.
A multi-functional adjustable test test bench is designed, including a center frame, upper and lower mounting plate, servo controller, drive motor, screw, fine-tuning device and probe. Through fine-tuning and rotation adjustment of X and Y axis, the probe is ensured to be consistent in the coaxiality of the probe and is suitable for a variety of probe models.
The accuracy of probe measurement is achieved, and the installation board replacement is reduced due to probe model replacement. The detection platform can move at a constant speed from left to right, making it convenient for multiple sets of data acquisition.
Smart Images

Figure CN223258870U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of test benches, in particular to a multifunctional adjustable test bench. Background Art
[0002] Thickness gauging is a test used to measure the surface or internal thickness of an object. It is widely used in various fields, including manufacturing, construction, aerospace, chemical engineering, and shipbuilding. Infrared and spectral confocal probes are commonly used for thickness gauging. Both probes utilize a through-beam method, emitting laser light for measurement. Therefore, high vertical coaxiality is required. Machining and assembly errors can lead to inaccurate measurement results. Therefore, the measurement platform requires lateral fine-tuning on the X and Y axes, as well as rotational fine-tuning on those axes. Therefore, a multifunctional, adjustable test bench is needed to address this problem. Summary of the Invention
[0003] The purpose of the utility model is to solve the shortcomings of the prior art and to propose a multifunctional adjustable test bench.
[0004] In order to achieve the above purpose, the present invention adopts the following technical solutions:
[0005] A multifunctional adjustable test bench comprises a main body, wherein a center frame, an upper mounting plate and a lower mounting plate are provided in the main body, and a servo controller is placed in the main body, a drive motor is fixedly mounted on one end of the center frame, and the output shaft of the drive motor is connected to a lead screw through the center frame, a movable frame is connected to the outer side of the lead screw by a thread, and a detection platform is fixedly mounted on one side of the movable frame, an upper fine-tuning device and a lower fine-tuning device are connected and mounted on the upper mounting plate and the lower mounting plate respectively, and an infrared probe and a spectral confocal probe are connected and mounted in the upper fine-tuning device and the lower fine-tuning device;
[0006] The upper fine-tuning device and the lower fine-tuning device include a Y-axis fine-tuning dovetail stage, and one side of the Y-axis fine-tuning dovetail stage is slidably connected to the X-axis fine-tuning dovetail stage, and the bottom of the X-axis fine-tuning dovetail stage is slidably connected to a fixed seat, one side of the fixed seat is connected and installed with a first adjustment plate, and one side of the first adjustment plate is connected and installed with a second adjustment plate, and a probe hole is opened in the second adjustment plate.
[0007] Preferably, the upper mounting plate and the lower mounting plate are both provided with several groups of mounting holes, each group of mounting holes has four mounting holes, and are distributed in a rectangular array, so that the upper fine-tuning device and the lower fine-tuning device can be installed at different positions as needed, thereby changing the position of the probe.
[0008] Preferably, fasteners are provided on the outside of the X-axis fine-tuning dovetail stage and the fixed seat, and the fasteners are connected to the Y-axis fine-tuning dovetail stage and the X-axis fine-tuning dovetail stage through the X-axis fine-tuning dovetail stage and the fixed seat respectively, so as to fix the X-axis fine-tuning dovetail stage and the fixed seat during fine-tuning to prevent position displacement.
[0009] Preferably, the fixing seat and the first adjustment plate are both provided with connecting holes, and the connecting holes are positioned opposite to the first adjustment plate and the second adjustment plate. The connecting holes are designed with a long strip structure, and the rotational position of the first adjustment plate and the second adjustment plate can be fine-tuned through the connecting holes.
[0010] Preferably, fine-tuning blocks are connected and installed in the fixing seat and the first adjustment plate for positioning.
[0011] Preferably, the probe holes are provided in several groups, with two holes in each group, and the diameters and spacings are different, so as to install probes of different models.
[0012] The beneficial effects of the utility model are:
[0013] 1. The upper and lower fine-tuning devices can be used to keep the probe coaxiality as consistent as possible to meet the probe measurement requirements.
[0014] 2. The structural design of the second adjustment plate can adapt to a variety of probe models, thus reducing the need to replace the mounting plate when changing the probe model.
[0015] 3. The detection platform can move left and right at a constant speed to facilitate the collection of multiple sets of data for analysis. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 This is a 3D structural diagram of a multifunctional adjustable test bench proposed in the utility model;
[0017] Figure 2 This is a front structural diagram of a multifunctional adjustable test bench proposed by the present invention;
[0018] Figure 3 This is a schematic diagram of the connection structure of a fine-tuning device in a multifunctional adjustable test bench proposed by the present invention;
[0019] Figure 4 This is a front structural schematic diagram of a first adjustment plate in a multifunctional adjustable test bench proposed by the present invention;
[0020] Figure 5 This is a schematic diagram of the back structure of the first adjustment plate in a multifunctional adjustable test bench proposed by the present invention.
[0021] In the figure: 1. Main body; 2. Center frame; 3. Upper mounting plate; 4. Lower mounting plate; 5. Servo controller; 6. Drive motor; 7. Screw; 8. Moving frame; 9. Detection platform; 10. Upper fine-tuning device; 11. Lower fine-tuning device; 12. Infrared probe; 13. Spectral confocal probe; 14. Y-axis fine-tuning dovetail stage; 15. X-axis fine-tuning dovetail stage; 16. Fixed seat; 17. First adjustment plate; 18. Second adjustment plate; 19. Probe hole position. DETAILED DESCRIPTION
[0022] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.
[0023] Example: Refer to Figure 1-5 , a multifunctional adjustable test bench comprises a main body 1, a center frame 2, an upper mounting plate 3 and a lower mounting plate 4 are arranged in the main body 1, and a servo controller 5 is placed in the main body 1, a driving motor 6 is fixedly mounted on one end of the center frame 2, and the output shaft of the driving motor 6 is connected to a screw rod 7 through the center frame 2, the outer side of the screw rod 7 is connected to a movable frame 8 by a thread, and a detection platform 9 is fixedly mounted on one side of the movable frame 8, an upper fine-tuning device 10 and a lower fine-tuning device 11 are respectively connected and installed on the upper mounting plate 3 and the lower mounting plate 4, and a plurality of groups of mounting holes are opened on the upper mounting plate 3 and the lower mounting plate 4, each group of mounting holes has four mounting holes, and they are distributed in a rectangular array, so that the upper fine-tuning device 10 and the lower fine-tuning device 11 can be installed at different positions according to needs, thereby changing the position of the probe, and an infrared probe 12 and a spectral confocal probe 13 are connected and installed in the upper fine-tuning device 10 and the lower fine-tuning device 11;
[0024] The upper fine-tuning device 10 and the lower fine-tuning device 11 include a Y-axis fine-tuning dovetail stage 14, and one side of the Y-axis fine-tuning dovetail stage 14 is slidably connected to the X-axis fine-tuning dovetail stage 15, and the bottom of the X-axis fine-tuning dovetail stage 15 is slidably connected to the fixed seat 16. Fasteners are provided on the outside of the X-axis fine-tuning dovetail stage 15 and the fixed seat 16, and the fasteners are connected to the Y-axis fine-tuning dovetail stage 14 and the X-axis fine-tuning dovetail stage 15 respectively through the X-axis fine-tuning dovetail stage 15 and the fixed seat 16, which can fix the X-axis fine-tuning dovetail stage 15 and the fixed seat 16 during fine-tuning to prevent position deviation. A first adjustment plate 17 is connected and installed on one side of the fixed seat 16. , fine-tuning blocks are connected and installed in the fixing seat 16 and the first adjustment plate 17 for positioning, and a second adjustment plate 18 is connected and installed on one side of the first adjustment plate 17, and the fixing seat 16 and the first adjustment plate 17 are provided with connecting holes, and the position of the connecting holes is opposite to the first adjustment plate 17 and the second adjustment plate 18. The connecting holes are designed with a long strip structure, and the rotation position of the first adjustment plate 17 and the second adjustment plate 18 can be fine-tuned through the connecting holes. Probe holes 19 are provided in the second adjustment plate 18, and there are several groups of probe holes 19, two in each group, and the diameters and spacings are different, so that probes of different models can be installed.
[0025] Working principle: During installation, first determine the approximate positions on the upper mounting plate 3 and the lower mounting plate 4, and connect the upper fine-tuning device 10 and the lower fine-tuning device 11 to the upper mounting plate 3 and the lower mounting plate 4 respectively through the mounting holes, and install different types of probes such as the infrared probe 12 or the spectral confocal probe 13 on the second adjustment plate 18. During this period, the height of the probe can be adjusted in the Y-axis direction through the Y-axis fine-tuning dovetail stage 14, and the position of the probe can be adjusted on the X-axis using the X-axis fine-tuning dovetail stage 15. The position of the first adjustment plate 17 and the second adjustment plate 18 can also be fine-tuned using the connecting holes on the fixing seat 16 and the first adjustment plate 17, so as to ensure that the detection position of the probe corresponds to the detection platform 9. Finally, the drive motor 6 is turned on by the servo controller 5, and the screw rod 7 is controlled to rotate to make the movable frame 8 drive the detection platform 9 to move, thereby performing detection on the detection product on the detection platform 9.
[0026] The contents not described in detail in this specification belong to the prior art known to those skilled in the art.
[0027] The standard parts used in this utility model can all be purchased from the market, and special-shaped parts can be customized according to the description in the specification and drawings. The specific connection methods of each part adopt conventional means such as mature bolts, rivets, welding, etc. in the existing technology. The machinery, parts and equipment all adopt conventional models in the existing technology, and the circuit connection adopts the conventional connection method in the existing technology, which will not be described in detail here.
[0028] The above is only a preferred specific implementation method of the present invention, but the protection scope of the present invention is not limited to this. Any technician familiar with the technical field within the technical scope disclosed by the present invention can make equivalent replacements or changes based on the technical solution and utility model concept of the present invention, which should be covered by the protection scope of the present invention.
Claims
1. A multifunctional adjustable test bench, comprising a main body (1), characterized in that: The main body (1) is provided with a center frame (2), an upper mounting plate (3) and a lower mounting plate (4), and a servo controller (5) is placed in the main body (1); a driving motor (6) is fixedly mounted on one end of the center frame (2), and the output shaft of the driving motor (6) is connected to a screw rod (7) through the center frame (2); the outer side of the screw rod (7) is connected to a moving frame (8) through a thread, and a detection platform (9) is fixedly mounted on one side of the moving frame (8); an upper fine-tuning device (10) and a lower fine-tuning device (11) are connected and mounted on the upper mounting plate (3) and the lower mounting plate (4), respectively, and an infrared probe (12) and a spectral confocal probe (13) are connected and mounted in the upper fine-tuning device (10) and the lower fine-tuning device (11); The upper fine-tuning device (10) and the lower fine-tuning device (11) include a Y-axis fine-tuning dovetail platform (14), and one side of the Y-axis fine-tuning dovetail platform (14) is slidably connected to an X-axis fine-tuning dovetail platform (15), and the bottom of the X-axis fine-tuning dovetail platform (15) is slidably connected to a fixed seat (16), one side of the fixed seat (16) is connected and installed with a first adjustment plate (17), and one side of the first adjustment plate (17) is connected and installed with a second adjustment plate (18), and a probe hole (19) is opened in the second adjustment plate (18).
2. A multifunctional adjustable test bench according to claim 1, characterized in that: The upper mounting plate (3) and the lower mounting plate (4) are both provided with a plurality of groups of mounting holes, each group of mounting holes has four mounting holes, and are distributed in a rectangular array.
3. The multifunctional adjustable test bench according to claim 1, characterized in that: The outer sides of the X-axis fine-tuning dovetail platform (15) and the fixed seat (16) are both provided with fasteners, and the fasteners are connected to the Y-axis fine-tuning dovetail platform (14) and the X-axis fine-tuning dovetail platform (15) through the X-axis fine-tuning dovetail platform (15) and the fixed seat (16), respectively.
4. The multifunctional adjustable test bench according to claim 1, characterized in that: The fixing seat (16) and the first adjustment plate (17) are both provided with connection holes, and the connection holes are located opposite to the first adjustment plate (17) and the second adjustment plate (18), and the connection holes are designed in a long strip structure.
5. The multifunctional adjustable test bench according to claim 1, characterized in that: Fine-tuning blocks are connected and installed in the fixing seat (16) and the first adjustment plate (17).
6. The multifunctional adjustable test bench according to claim 1, characterized in that: The probe holes (19) are arranged in several groups, with two in each group, and having different diameters and spacings.