Electron microscope detection sample storing and taking device

Abstract

The utility model discloses an electron microscope detection sample storing and taking device which comprises a storing and taking platform, the storing and taking platform comprises a platform body, a detection groove and a sample channel, and the sample channel is formed in the middle of the upper surface of the platform body. By arranging the conveying structure and the positioning structure, when a sample to be detected is detected, the sample is placed on the right side of the conveying belt in the sample channel, then the rotating handle is manually rotated anticlockwise, and the conveying roller is rotated by rotating the handle, so that the sample on the upper surface is conveyed in the sample channel through the conveying belt; after the sample is conveyed to the position of the detection groove, the sample is subjected to electron microscope detection, and then the rotating handle is continuously rotated anticlockwise, so that the conveying belt continuously conveys the sample until the sample is taken out through the leftmost side of the sample channel, continuous one-way flowing of the sample in the electron microscope detection process is realized, and sample pollution is effectively avoided; and the detection efficiency and precision are improved.

Description

Technical Field

[0001] The utility model relates to the technical field of electron microscope detection, in particular to an electron microscope detection sample access device. Background Art

[0002] Electron microscopy is a technique that uses the high-resolution capabilities of electron microscopes to observe and analyze samples. It uses electron beams instead of visible light to amplify images, allowing scientists to study the microstructure and composition of samples in detail at the nanometer level. This technology includes various types such as transmission electron microscopes (TEM) and scanning electron microscopes (SEM), and is widely used in many fields such as materials science, biology, and medicine. Its steps involve sample preparation, loading, parameter adjustment, imaging observation, and data analysis. It is an indispensable and important tool in modern scientific and technological research.

[0003] In existing electron microscopy technology, the design of the sample access device usually follows the traditional operating mode, that is, the loading and unloading processes of the sample are mainly carried out in the same direction. Specifically, the operator feeds the sample into the detection table from the same direction, and after the detection is completed, the sample is taken out from the same direction. Although this one-way sample access design meets the basic operating requirements to a certain extent, it has some significant limitations. Especially during the sample removal process, due to the direct contact between the sample and the detection table, the detection table is extremely susceptible to contamination by sample residues. This contamination may have an adverse effect on the detection accuracy of subsequent samples, thereby reducing the reliability and efficiency of the overall experiment. Utility Model Content

[0004] One purpose of the present invention is to provide a sample storage and retrieval device for electron microscope detection. The present invention aims to solve the problem raised in the above-mentioned background technology that during the sample removal process, due to the direct contact between the sample and the detection table, the detection table is easily contaminated by sample residues, and this contamination may have an adverse effect on the detection accuracy of subsequent samples, thereby reducing the reliability and efficiency of the overall experiment.

[0005] According to an embodiment of the utility model, an electron microscope detection sample access device includes an access platform, the access platform includes a platform body, a detection slot and a sample channel, the sample channel is opened in the middle part of the upper surface of the platform body, the upper ends of both sides of the sample channel are fixedly connected to the limit plates, the inner middle part of the sample channel is opened, the interior of the sample channel is equipped with a conveying structure, the conveying structure includes a conveying roller and a conveyor belt, two conveying rollers are provided, the two conveying rollers are respectively rotatably connected to the two ends of the sample channel, the two conveying rollers are connected to each other by the conveyor belt, the interior of the detection slot is equipped with a positioning structure, the positioning structure includes a positioning block, the positioning block is slidably connected to the two ends of the detection slot, and a first spring structure and a first telescopic rod structure are respectively installed between the outer surface of the positioning block and the inner surface of the detection slot;

[0006] A self-cleaning structure is installed at one end of the lower surface of the platform body, and the self-cleaning structure includes a second telescopic rod structure, a transmission block and a scraper. The second telescopic rod structure is respectively installed at both ends of the lower surface of the platform body. A second spring structure is provided on the surface of the second telescopic rod structure. A transmission block is installed at the output end of the second telescopic rod structure, and a scraper is fixedly connected to the upper surface of the transmission block.

[0007] Preferably, one end of the conveying roller is fixedly connected to a rotating handle.

[0008] Preferably, mounting holes are provided at three corners of the surface of the platform body.

[0009] Preferably, the cross section of the scraper is a right triangle structure.

[0010] Preferably, sliding grooves are provided on both side surfaces of the interior of the detection groove, and sliding rods are fixedly connected to the interior of the sliding grooves.

[0011] Preferably, a sliding block is slidably connected to the surface of the sliding rod, and the sliding block is fixedly connected to the two side surfaces of the positioning block.

[0012] Preferably, the positioning block is slidably connected to the inside of the detection groove via a sliding block and a sliding rod.

[0013] Preferably, an arc-shaped groove is provided on the inner surface of the positioning block.

[0014] The beneficial effects of the utility model are:

[0015] 1. The utility model has a transmission structure and a positioning structure. When testing a sample to be tested, the sample is placed on the right side of the conveyor belt in the sample channel. The handle is then manually rotated counterclockwise to rotate the conveyor roller, thereby transmitting the sample on the upper surface through the conveyor belt inside the sample channel. After the sample is transmitted to the position of the detection tank, the sample is subjected to electron microscopy detection. The handle is then continued to be rotated counterclockwise to allow the conveyor belt to continue to transmit the sample until the sample is taken out through the leftmost side of the sample channel. This achieves continuous unidirectional flow of the sample during the electron microscopy detection process, effectively avoids sample contamination, and improves detection efficiency and accuracy. At the same time, manual operation is simple, ensuring stable transmission and precise positioning of the sample in the channel. When the sample enters the detection tank, the positioning block is squeezed toward the middle direction by the first spring structure and the first telescopic rod structure of the positioning structure, thereby ensuring that the sample is in the center of the detection tank when it is detected inside the detection tank, thereby improving the accuracy and repeatability of the detection. At the same time, the squeezing action of the spring and the telescopic rod simplifies the sample positioning process, improving operational convenience and experimental efficiency.

[0016] 2. The utility model has a self-cleaning structure. When the sample is spilled on the surface of the conveyor belt due to improper operation or excessive transmission amplitude, the surface of the conveyor belt is cleaned by the scraper installed on the lower surface of the platform body as the conveyor belt continues to transport. At the same time, the second spring structure and the second telescopic rod structure apply force toward the upper end to the scraper and the transmission block, so that the scraper is as close to the surface of the conveyor belt as possible. This ensures that the residual material on the surface of the conveyor belt can be automatically removed while the conveyor belt is running continuously, thereby ensuring the cleanliness of the sample channel, avoiding cross contamination, ensuring the cleaning effect, reducing the maintenance requirements of the equipment, and improving the automation and reliability of the overall operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0018] Figure 1 This is an axonometric diagram of a sample storage and access device for electron microscope detection proposed in the utility model;

[0019] Figure 2 The utility model proposes an electron microscope detection sample access device Figure 1 Enlarged view of point A in the middle;

[0020] Figure 3 This is a three-dimensional schematic diagram of a sample storage and access device for electron microscope detection proposed by the utility model;

[0021] Figure 4This is a three-dimensional schematic diagram of a self-cleaning structure in an electron microscope sample storage and access device proposed by the present invention;

[0022] In the figure: 1. Access platform; 101. Platform body; 102. Sample channel; 103. Limiting plate; 104. Detection slot; 105. Mounting hole; 2. Conveying structure; 201. Conveying roller; 202. Conveyor belt; 203. Rotating handle; 3. Positioning structure; 301. First telescopic rod structure; 302. First spring structure; 303. Sliding slot; 304. Sliding rod; 305. Sliding block; 306. Positioning block; 307. Arc slot; 4. Self-cleaning structure; 401. Second telescopic rod structure; 402. Second spring structure; 403. Transmission block; 404. Scraper. DETAILED DESCRIPTION

[0023] The present invention will now be described in further detail with reference to the accompanying drawings, which are simplified schematic diagrams that illustrate the basic structure of the present invention in a schematic manner.

[0024] refer to Figure 1-4 , a sample access device for electron microscope detection includes an access platform 1, which includes a platform body 101, a detection slot 104 and a sample channel 102. The sample channel 102 is provided in the middle part of the upper surface of the platform body 101, and the upper ends of both sides of the sample channel 102 are fixedly connected to the limiting plates 103, which help to maintain the stability of the sample during the transmission process. The internal middle part of the sample channel 102 is provided with a detection slot 104, which is convenient for the precise positioning of the sample at the detection position. A conveying structure 2 is installed inside the sample channel 102, and the conveying structure 2 includes a conveying roller 201 and a conveyor belt 202. There are two conveying rollers 201, which are rotatably connected to the two ends of the sample channel 102 respectively, realizing the continuous unidirectional flow of the sample. The two conveying rollers 201 are connected to each other by the conveyor belt 202, which improves the smoothness of the sample transmission.

[0025] A positioning structure 3 is installed inside the detection groove 104, and the positioning structure 3 includes a positioning block 306. The positioning block 306 is slidably connected to the two ends of the detection groove 104. A first spring structure 302 and a first telescopic rod structure 301 are respectively installed between the outer surface of the positioning block 306 and the inner surface of the detection groove 104, ensuring the center positioning of the sample during detection and improving the accuracy and repeatability of the detection.

[0026] Example 1: A self-cleaning structure 4 is installed at one end of the lower surface of the platform body 101, and the self-cleaning structure 4 includes a second telescopic rod structure 401, a transmission block 403 and a scraper 404. The second telescopic rod structure 401 is respectively installed at both ends of the lower surface of the platform body 101, which helps to automatically remove residual substances on the conveyor belt 202. A second spring structure 402 is provided on the surface of the second telescopic rod structure 401, and a transmission block 403 is installed at the output end of the second telescopic rod structure 401. The upper surface of the transmission block 403 is fixedly connected to the scraper 404, which realizes the self-cleaning function of the conveyor belt 202 during operation and reduces the risk of cross contamination.

[0027] Example 2: A rotating handle 203 is fixedly connected to one end of the conveying roller 201, which is convenient for manual operation of sample conveying. Mounting holes 105 are provided at the three corners of the surface of the platform body 101, which facilitates the installation and fixation of the equipment. The cross-section of the scraper 404 is a right-angled triangle structure, which enhances the cleaning effect. Sliding grooves 303 are provided on both side surfaces of the interior of the detection groove 104. The interior of the sliding groove 303 is fixedly connected to a sliding rod 304. The surface of the sliding rod 304 is slidably connected to a sliding block 305. The sliding block 305 is fixedly connected to the two side surfaces of the positioning block 306. The positioning block 306 is slidably connected to the interior of the detection groove 104 through the sliding block 305 and the sliding rod 304, which improves the flexibility of sample positioning. The inner surface of the positioning block 306 is provided with an arc groove 307, which further optimizes the positioning accuracy of the sample.

[0028] The process of using the electron microscope to detect the sample access device is as follows: First, place the sample on the right side of the conveyor belt 202 in the sample channel 102, and then manually rotate the handle 203 counterclockwise to rotate the conveyor roller 201, thereby conveying the sample through the conveyor belt 202. After the sample is conveyed to the position of the detection tank 104, it is inspected by the electron microscope. After the inspection is completed, continue to rotate the handle 203 counterclockwise to allow the conveyor belt 202 to continue to convey the sample until the sample is taken out through the leftmost side of the sample channel 102. During this process, the positioning block 306 is squeezed toward the middle direction by the first spring structure 302 and the first telescopic rod structure 301 of the positioning structure 3 to ensure that the sample is in the center position inside the detection tank 104. At the same time, the self-cleaning structure 4 cleans the surface of the conveyor belt 202 through the scraper 404 to ensure the cleanliness of the sample channel 102 and avoid cross contamination. The entire operation process is simple and convenient, which improves the detection efficiency and accuracy.

[0029] The above is only a preferred specific implementation method of the present invention, but the protection scope of the present invention is not limited to this. Any technician familiar with the technical field within the technical scope disclosed by the present invention can make equivalent replacements or changes based on the technical solution and utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A sample storage and access device for electron microscope detection, characterized in that: The invention comprises a storage and access platform (1), wherein the storage and access platform (1) comprises a platform body (101), a detection slot (104) and a sample channel (102); a sample channel (102) is provided in the middle portion of the upper surface of the platform body (101); upper ends of both sides of the sample channel (102) are fixedly connected to a limiting plate (103); a detection slot (104) is provided in the middle portion of the interior of the sample channel (102); a conveying structure (2) is installed inside the sample channel (102); the conveying structure (2) comprises a conveying roller (201) and a conveying belt (202); the conveying roller (201) is provided with two, the two conveying rollers (201) are respectively rotatably connected to the two ends of the sample channel (102), the two conveying rollers (201) are connected to each other through a conveyor belt (202), a positioning structure (3) is installed inside the detection slot (104), the positioning structure (3) includes a positioning block (306), the positioning block (306) is slidably connected to the two ends of the detection slot (104), and a first spring structure (302) and a first telescopic rod structure (301) are respectively installed between the outer surface of the positioning block (306) and the inner surface of the detection slot (104); A self-cleaning structure (4) is installed at one end of the lower surface of the platform body (101), and the self-cleaning structure (4) comprises a second telescopic rod structure (401), a transmission block (403) and a scraper (404). The second telescopic rod structure (401) is respectively installed at both ends of the lower surface of the platform body (101), a second spring structure (402) is provided on the surface of the second telescopic rod structure (401), a transmission block (403) is installed at the output end of the second telescopic rod structure (401), and the scraper (404) is fixedly connected to the upper surface of the transmission block (403).

2. The electron microscope sample storage and access device according to claim 1, characterized in that: One end of the conveying roller (201) is fixedly connected to a rotating handle (203).

3. The electron microscope sample storage and access device according to claim 1, characterized in that: Mounting holes (105) are provided at three corners of the surface of the platform body (101).

4. The electron microscope sample storage and access device according to claim 1, characterized in that: The cross section of the scraper (404) is a right-angled triangle structure.

5. The electron microscope sample storage and access device according to claim 1, characterized in that: Sliding grooves (303) are provided on both sides of the inner surface of the detection groove (104), and a sliding rod (304) is fixedly connected to the inner part of the sliding groove (303).

6. The electron microscope sample storage and access device according to claim 5, characterized in that: The surface of the sliding rod (304) is slidably connected to a sliding block (305), and the sliding block (305) is fixedly connected to the two side surfaces of the positioning block (306).

7. The electron microscope sample storage and access device according to claim 1, characterized in that: The positioning block (306) is slidably connected to the inside of the detection groove (104) via the sliding block (305) and the sliding rod (304).

8. The electron microscope sample storage and access device according to claim 1, characterized in that: An arc-shaped groove (307) is formed on the inner surface of the positioning block (306).

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