Withstand voltage test device of metallized film for capacitor

Abstract

The utility model relates to the technical field of voltage withstanding testing of capacitor metallized films, in particular to a voltage withstanding testing device of a capacitor metallized film, which comprises a base, a mounting bracket, a conductive component and a height adjusting mechanism, and is characterized in that the height adjusting mechanism comprises a fixed rod, a sliding bearing and a sliding plate; the installation support is fixedly connected to the base, the fixing rod is arranged between the base and the installation support, the sliding bearing is arranged on the fixing rod in a sleeving mode, a first through hole is formed in the sliding plate, and the sliding bearing is fixedly connected into the first through hole; the first through hole is formed in the sliding plate, the sliding bearing is fixedly connected into the first through hole, and the sliding bearing is slidably connected to the fixing rod, so that the metal rod fixedly connected to the sliding plate moves on the fixing rod along with the sliding plate, and the distance between the metal circular truncated cone and the metal rod is changed; the device can be used for carrying out voltage withstanding tests on metallized films with different thicknesses.

Description

Technical Field

[0001] The present application relates to the technical field of withstand voltage testing of metallized films for capacitors, and in particular to a withstand voltage testing device for metallized films for capacitors. Background Art

[0002] Capacitor films are widely used in the manufacture of capacitors in electronic devices to store charge or regulate circuit voltage. Their characteristics include fast charge and discharge speeds, high stability, low loss, and a long service life. Capacitor films also have a low temperature coefficient and excellent capacitance stability, making them suitable for applications under various operating temperature conditions.

[0003] However, the existing technology cannot perform accurate voltage withstand tests on capacitor films of different thicknesses, and the capacitor film will produce certain deformation under high pressure, which will affect the final voltage withstand test value. To this end, we designed a voltage withstand test device for metallized films used in capacitors. Utility Model Content

[0004] The embodiment of the present application provides a voltage withstand test device for a metallized film for a capacitor, which can solve the technical problem that accurate voltage withstand tests cannot be performed on capacitor films of different thicknesses, and that the capacitor film will produce certain deformation under high pressure, thereby affecting the final voltage withstand test value.

[0005] An embodiment of the present application provides a voltage withstand test device for a metallized film for a capacitor, including a base, a mounting bracket, a conductive component, and a height adjustment mechanism. The height adjustment mechanism includes a fixed rod, a sliding bearing, and a sliding plate. The mounting bracket is fixedly connected to the base, the fixed rod is arranged between the base and the mounting bracket, and the two ends of the fixed rod are respectively fixedly connected to the mounting bracket and the base. The sliding bearing is sleeved on the fixed rod and the sliding bearing is slidably connected to the fixed rod. A first through hole is provided on the sliding plate, and the sliding bearing is fixedly connected to the first through hole. The conductive component is used to power on the device for a voltage withstand test.

[0006] When the metallized film is subjected to a voltage resistance test using the above-mentioned technical solution in the embodiment of the present application, the tester can adjust the distance between the metal rod and the metal frustum through the height adjustment mechanism, place metallized films of different thicknesses between the metal rod and the metal frustum, press the two ends of the metallized film through the pressure plate, and then conduct electricity to the metal rod and the metal frustum to perform a voltage resistance test on the metallized film.

[0007] The above technical solutions in the embodiments of the present application have at least the following technical effects:

[0008] 1. The present application provides a first through hole on the sliding plate, in which the sliding bearing is fixedly connected, and the sliding bearing is slidably connected to the fixed rod, so that the metal rod fixedly connected to the sliding plate moves on the fixed rod as the sliding plate moves, thereby changing the distance between the metal frustum and the metal rod, so that the device can perform pressure resistance tests on metallized films of different thicknesses.

[0009] 2. This application sets a pressure plate on the base, so that the metallized film will not be easily deformed in the high-pressure environment of the pressure test, thereby affecting the accuracy of the pressure test value of the metallized film. At the same time, support feet are also set on the base, which can make the device more stable during the pressure test and make the test results more accurate.

[0010] In some embodiments, a gasket is further sleeved on the sliding bearing, and the bottom surface of the gasket abuts against the sliding plate.

[0011] In some embodiments, the conductive component includes a metal rod, a metal frustum and a terminal. A second through hole is also provided on the sliding plate. The metal rod is arranged in the second through hole. The metal frustum is fixedly connected to the base, and the metal frustum is located directly below the metal rod. The terminal is fixedly connected to the end of the base away from the metal frustum.

[0012] In some embodiments, a threaded hole is formed on one end of the metal rod away from the metal cone, and the metal rod is connected to the second through hole by a bolt.

[0013] In some embodiments, the metal rod and the metal cone are both provided with binding posts, and the conductive component further includes a connecting wire, one end of the connecting wire is connected to the wiring terminal, and the other end of the connecting wire is connected to the binding post.

[0014] In some embodiments, a pressure plate is provided on the base, and the pressure plate is connected to the base by bolts.

[0015] In some embodiments, the bottom surface of the base is further provided with support feet, and the support feet are made of rubber material. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or descriptions of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0017] Figure 1 A schematic structural diagram of a withstand voltage test device for a metallized film for a capacitor provided in an embodiment of the present application;

[0018] Figure 2 A schematic structural diagram of a withstand voltage test device for a metallized film for a capacitor provided in an embodiment of the present application from another perspective;

[0019] Figure 3 A schematic diagram of the sliding plate structure of a voltage withstand testing device for a metallized film for a capacitor provided in an embodiment of the present application.

[0020] Among them, the figure marks in the figure are: 1. base; 12. support foot; 13. pressure plate; 2. mounting bracket; 3. conductive component; 31. metal rod; 32. metal frustum; 33. terminal; 4. height adjustment mechanism; 41. fixing rod; 42. sliding bearing; 43. sliding plate; 431. first through hole; 432. second through hole; 5. gasket; 6. terminal; 7. threaded hole; 8. wire. DETAILED DESCRIPTION

[0021] In order to make the technical problems, technical solutions and beneficial effects to be solved by this application more clearly understood, this application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application belongs; the terms used herein are for the purpose of describing specific embodiments only and are not intended to limit this application. The terms "including" and "having" and any variations thereof in the specification and claims of this application and the accompanying drawings are intended to cover non-exclusive inclusions.

[0023] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0024] Capacitor film is widely used in the manufacture of capacitors in electronic devices to store charge or regulate circuit voltage. Its characteristics include fast charging and discharging speed, high stability, low loss and long service life. Capacitor film also has a low temperature coefficient and excellent capacitance stability, suitable for applications under various operating temperature conditions. However, if used for a long time in a high voltage, high temperature and high humidity environment, film capacitors may experience open circuit failure, resulting in reduced capacity, so the voltage resistance performance test of capacitor film is particularly important.

[0025] The metallized film withstand voltage test device in the related art cannot perform accurate withstand voltage tests on capacitor films of different thicknesses, and the capacitor film will produce a certain deformation under high pressure, thereby affecting the final withstand voltage test value.

[0026] Based on this, in order to improve the problem in the related art that it is impossible to perform accurate voltage resistance tests on capacitor films of different thicknesses, and that the capacitor film will produce certain deformation under high pressure, thereby affecting the final voltage resistance test value, the embodiment of the present application provides the following solution.

[0027] See also Figures 1 to 3 A withstand voltage test device for a metallized film used for a capacitor includes a base 1, a mounting bracket 2, a conductive component 3, and a height adjustment mechanism 4. The height adjustment mechanism 4 is used for the tester to adjust the distance between the metal rod 31 and the metal frustum 32 according to the thickness of the metallized film. The mounting bracket 2 is used to fix the height adjustment mechanism 4, and the conductive component 3 is used to energize the test device for a withstand voltage test.

[0028] See also Figures 1 to 3 The height adjustment mechanism 4 includes a fixed rod 41, a sliding bearing 42, and a sliding plate 43. The mounting bracket 2 is fixedly connected to the base 1. The fixed rod 41 is arranged between the base 1 and the mounting bracket 2, and the two ends of the fixed rod 41 are respectively fixedly connected to the mounting bracket 2 and the base 1. The sliding bearing 42 is sleeved on the fixed rod 41, and the sliding bearing 42 is slidably connected to the fixed rod 41. A first through hole 431 is opened on the sliding plate 43, and the sliding bearing 42 is fixedly connected in the first through hole 431. A gasket 5 is also sleeved on the sliding bearing 42, and the bottom surface of the gasket 5 abuts against the sliding plate 43. A pressing plate 13 is provided on the base 1, and the pressing plate 13 is connected to the base 1 by bolts. The bottom surface of the base 1 is also provided with a supporting foot 12, and the supporting foot 12 is made of rubber material.

[0029] With such an arrangement, before conducting a pressure test on the metallized film, the metallized film is placed on the test device. The measuring staff can lift the sliding plate 43 by hand according to the thickness of the metallized film to be measured. At this time, the sliding bearing 42 is fixedly connected to the first through hole 431 of the sliding plate 43. Due to the upward force given by the measuring staff's hand, the sliding bearing 42 will carry the sliding plate 43 upward along the fixed rod 41. At this time, the measuring staff uses the other hand to place the metallized film to be measured on the metal frustum 32, and then lowers the sliding plate 43 so that the metal rod 31 on the sliding plate 43 abuts against the metallized film. When this step is completed, the nut fixed on the pressure plate 13 is loosened, and then the pressure plate 13 is lifted, and the two ends of the metallized film are placed under the pressure plate 13, and then the nut is tightened so that the two ends of the metallized film are pressed.

[0030] The effect of this arrangement is that, by opening a first through hole 431 on the sliding plate 43, the sliding bearing 42 is fixedly connected in the first through hole 431, and the sliding bearing 42 is slidably connected to the fixed rod 41, so that the metal rod 31 fixedly connected to the sliding plate 43 moves on the fixed rod 41 along with the sliding plate 43, thereby changing the distance between the metal frustum 32 and the metal rod 31, so that this device can perform pressure resistance tests on metallized films of different thicknesses, and the two ends of the metallized film are pressed by the pressure plate 13, so that the metallized film will not be easily deformed in the high-pressure environment of the pressure resistance test, thereby affecting the accuracy of the pressure resistance test value of the metallized film. At the same time, a supporting foot 12 is also provided on the base 1, which can make this device more stable during the pressure resistance test and make the test results more accurate.

[0031] See also Figures 1 to 3 The above-mentioned conductive component 3 includes a metal rod 31, a metal cone 32 and a terminal 33. The sliding plate 43 also has a second through hole 432. The metal rod 31 is arranged in the second through hole 432. The metal cone 32 is fixedly connected to the base 1, and the metal cone 32 is located directly below the metal rod 31. The terminal 33 is fixedly connected to the base 1 at one end away from the metal cone 32. Both the metal rod 31 and the metal cone 32 are provided with a terminal 6. The conductive component 3 also includes a connecting wire 8, one end of the connecting wire 8 is connected to the terminal 33, and the other end of the connecting wire 8 is connected to the terminal 6.

[0032] In this way, after the metallized film is fixed on the test device, the tester connects one end of the power cord to the withstand voltage tester and the other end of the power cord to the terminal 33. At this time, take two wires 8 again, connect one end of the two wires 8 to the two terminal 33 respectively, and the other end of the two wires 8 to the terminal 6 on the metal rod 31 and the metal cone 32 respectively. Then fix the power cord and all the wires 8, and power on the test device. When the test device is powered on, a high-voltage electric field will be generated between the metal rod 31 and the metal cone 32. The generated high-voltage electric field will act on the surface of the metallized film. The withstand voltage tester continuously adjusts the output voltage and current of the high-voltage power supply to enhance the high-voltage electric field of the metallized film. At this time, by detecting the changes in voltage and current values, it is possible to determine whether the film is broken down or ruptured, and at the same time test the highest withstand voltage value of the measured metallized film.

[0033] The effect of this setting is that by connecting the voltage withstand tester to the test device, the tester can accurately adjust the output voltage and current, so that the device's voltage withstand test value for the metallized film is more accurate. At the same time, when measuring the voltage withstand value of the metallized film, the measurement personnel can remotely control and observe the test, reducing human contact and making the test safer.

[0034] From the above, we can see that the working principle of this application is as follows:

[0035] Before conducting a pressure test on the metallized film, the metallized film is placed on the test device. The measuring staff can lift the sliding plate 43 by hand according to the thickness of the metallized film to be measured. At this time, the sliding bearing 42 is fixedly connected to the first through hole 431 of the sliding plate 43. Due to the upward force applied by the measuring staff, the sliding bearing 42 will move the sliding plate 43 upward along the fixed rod 41. At this time, the measuring staff uses the other hand to place the metallized film to be measured on the metal frustum 32, and then lowers the sliding plate 43 so that the metal rod 31 on the sliding plate 43 abuts against the metallized film. When this step is completed, the nut fixed on the pressing plate 13 is loosened, and then the pressing plate 13 is lifted, and the two ends of the metallized film are placed under the pressing plate 13, and then the nut is tightened so that the two ends of the metallized film are pressed tightly.

[0036] After the metallized film is fixed on the test device, the tester connects one end of the power cord to the voltage tester and the other end of the power cord to the terminal 33. At this time, take two wires 8 again, connect one end of the two wires 8 to the two terminal 33 respectively, and the other end of the two wires 8 to the terminal 6 on the metal rod 31 and the metal cone 32 respectively. Then fix the power cord and all the wires 8, and power on the test device. When the test device is powered on, a high-voltage electric field will be generated between the metal rod 31 and the metal cone 32. The generated high-voltage electric field will act on the surface of the metallized film. The voltage tester continuously adjusts the output voltage and current of the high-voltage power supply to enhance the high-voltage electric field of the metallized film. At this time, by detecting the changes in voltage and current values, it is possible to determine whether the film has broken down or ruptured, and at the same time test the highest voltage withstand value of the measured metallized film.

[0037] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A withstand voltage test device for a metallized film for a capacitor, characterized in that: The invention comprises a base (1), a mounting bracket (2), a conductive component (3) and a height adjustment mechanism (4); the height adjustment mechanism (4) comprises a fixed rod (41), a sliding bearing (42) and a sliding plate (43); the mounting bracket (2) is fixedly connected to the base (1); the fixed rod (41) is arranged between the base (1) and the mounting bracket (2); and the two ends of the fixed rod (41) are respectively fixedly connected to the mounting bracket (2) and the base (1); the sliding bearing (42) is sleeved on the fixed rod (41), and the sliding bearing (42) is slidably connected to the fixed rod (41); a first through hole (431) is opened on the sliding plate (43); the sliding bearing (42) is fixedly connected in the first through hole (431); and the conductive component (3) is used to energize the device for a withstand voltage test.

2. The withstand voltage test device for a metallized film for a capacitor according to claim 1, characterized in that: A gasket (5) is also sleeved on the sliding bearing (42), and the bottom surface of the gasket (5) abuts against the sliding plate (43).

3. The withstand voltage test device for a metallized film for a capacitor according to claim 1, characterized in that: The conductive component (3) comprises a metal rod (31), a metal truncated cone (32), and a connecting terminal (33). The sliding plate (43) is further provided with a second through hole (432). The metal rod (31) is arranged in the second through hole (432). The metal truncated cone (32) is fixedly connected to the base (1), and the metal truncated cone (32) is located directly below the metal rod (31). The connecting terminal (33) is fixedly connected to the end of the base (1) away from the metal truncated cone (32).

4. The withstand voltage test device for a metallized film for a capacitor according to claim 3, characterized in that: A threaded hole (7) is provided on one end of the metal rod (31) away from the metal truncated cone (32), and the metal rod (31) is connected to the second through hole (432) via a bolt.

5. The withstand voltage test device for a metallized film for a capacitor according to claim 4, characterized in that: The metal rod (31) and the metal cone (32) are both provided with a terminal (6). The conductive component (3) further comprises a connecting wire (8), one end of the connecting wire (8) is connected to the terminal (33), and the other end of the connecting wire (8) is connected to the terminal (6).

6. The withstand voltage test device for a metallized film for a capacitor according to claim 3, characterized in that: A pressing plate (13) is provided on the base (1), and the pressing plate (13) is connected to the base (1) via bolts.

7. The withstand voltage test device for a metallized film for a capacitor according to claim 6, characterized in that: The bottom surface of the base (1) is further provided with a supporting foot (12), and the supporting foot (12) is made of rubber material.

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