Novel thread needle jig

By adopting a stacked structure and wear-resistant fabric layer design in the circuit board test fixture, the problems of probe loosening and falling are solved, the stability and testing efficiency of the fixture are improved, and the maintenance costs are reduced.

CN223284261UActive Publication Date: 2025-08-29HUIZHOU QIJIA ELECTRONICS
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Patent Information

Application Number
CN202422391236.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-30
Publication Date
2025-08-29
Estimated Expiration
2034-09-30

AI Technical Summary

Technical Problem

The probes of existing circuit board test fixtures are prone to loosening and falling off after long-term use, resulting in low testing efficiency and difficult maintenance.

Method used

A new type of thread needle fixture is designed, adopting a bottom-up stacked base, seat plate, guide plate and panel structure. The probe passes through the wear-resistant fabric layer and friction-attach the probe through the wear-resistant fabric layer to prevent loosening. A through groove and sink groove are provided on the guide plate to reduce friction and wear.

Benefits of technology

Effectively prevent the probe from falling off after long-term use, improve the stability and service life of the fixture, reduce maintenance costs, and ensure the accuracy and efficiency of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of circuit board testing jigs, in particular to a novel wire needle jig which is characterized in that a plurality of supporting columns penetrating through a clamping plate and a first guide plate are arranged on a base, a plurality of layers of second guide plates are connected to the tops of the supporting columns, and a panel for probes to penetrate out is arranged on the top of the second guide plate on the top layer. The probe penetrates through the base, the clamping plate, the first guide plate, the second guide plate and the panel, the surface, facing the base, of the clamping plate is provided with a groove, the groove is provided with a wear-resistant cloth layer for the probe to penetrate through, the wear-resistant cloth layer is used for friction clamping of the probe, the probe is prevented from loosening after long-term use, and the service life of the probe is prolonged. And the wear-resistant cloth layer does not wear the probe, so that the problem that the probe is easy to fall off from the through hole of the wire needle jig after being used for a long time is solved, the probe is prevented from falling off, the stability of the wire needle jig during use is improved, and the maintenance cost of the jig is reduced.
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Description

Technical Field

[0001] The present application relates to the technical field of circuit board testing fixtures, and in particular to a novel wire needle fixture. Background Art

[0002] Circuit board testing typically uses a dedicated test fixture designed based on the circuit board and used for open circuit, short circuit, and resistance testing. Currently, test fixtures typically consist of a support base and a multi-layered needle holder. The holder has multiple slots through which multiple test probes pass. As BGA test points on circuit boards become increasingly dense, the probes on test fixtures are also becoming increasingly dense. After prolonged up-and-down movement, the probes inserted into the needle tray can become loose and fall from the upper mold. For molds with a large number of densely packed probes, probe drops are frequent and difficult to repair, resulting in low testing efficiency. Utility Model Content

[0003] In order to solve the above technical problems, the present application provides a new thread needle fixture, including a base, a positioning plate, and several layers of first guide plates stacked from bottom to top, a plurality of support columns passing through the positioning plate and the first guide plate are arranged on the base, and several layers of second guide plates are connected to the top of the support columns. A panel for the probe to pass through is arranged on the top of the second guide plate on the top layer, and a groove is provided on the surface of the positioning plate facing the base, and a wear-resistant cloth layer for the probe to pass through is provided in the groove.

[0004] Preferably, the distance between the first guide plate on the top layer and the second guide plate on the bottom layer is 14-17 mm.

[0005] Preferably, a plurality of guide posts are provided on the base, and the guide posts are passed through the positioning plate, the first guide plate, the second guide plate and the panel.

[0006] Preferably, the base, the positioning plate and the plurality of layers of first guide plates are provided with a recessed groove for the probe to pass through.

[0007] Preferably, several layers of the second guide plates are provided with through slots for the probes to pass through.

[0008] Preferably, the outer periphery of the probe is covered with an insulating layer.

[0009] Preferably, the support column is detachably connected to the base, the second guide plate and the panel by bolts.

[0010] From the above, it can be seen that the application provided by the present application can obtain the following beneficial effects: by arranging a plurality of support columns on the base that are passed through the positioning plate and the first guide plate, a plurality of layers of second guide plates are connected to the top of the support columns, and a panel for the probe to pass through is arranged on the top of the top second guide plate, the probe is passed through the base, the positioning plate, the first guide plate, the second guide plate and the panel, and a groove is provided on the surface of the positioning plate facing the base, and a wear-resistant cloth layer for the probe to pass through is provided in the groove, and then the probe is rubbed and positioned by the wear-resistant cloth layer to prevent the probe from loosening after long-term use, and the wear-resistant cloth layer will not cause wear to the probe, thereby solving the problem that the probe is easy to fall from the through hole of the thread needle jig after long-term use, preventing the probe from falling, improving the stability of the thread needle jig during use, and reducing the maintenance cost of the jig. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] To more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for describing the embodiments of the present application or the prior art. Obviously, the drawings described below are only part of the embodiments of the present application. For those skilled in the art, other drawings can be derived from these drawings without inventive effort.

[0012] Figure 1 This is a schematic diagram of a new thread needle fixture according to an embodiment of the present application. DETAILED DESCRIPTION

[0013] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0014] Example

[0015] In order to solve the above technical problems, this embodiment provides a new needle fixture, such as Figure 1As shown, it includes a base 10, a positioning plate 20, and several layers of first guide plates 30 stacked from bottom to top, and several support columns 40 are arranged on the base 10 and passed through the positioning plate 20 and the first guide plate 30. Several layers of second guide plates 50 are connected to the top of the support columns 40, and a panel 60 for the probe to pass through is arranged on the top of the top second guide plate 50. The probe is passed through the base 10, the positioning plate 20, the first guide plate 30, the second guide plate 50 and the panel 60. The positioning plate 20 is provided with a groove 21 on the surface facing the base 10, and a wear-resistant cloth layer 22 for the probe to pass through is provided in the groove 21, and then the probe is rubbed and positioned by the wear-resistant cloth layer 22 to prevent the probe from loosening after long-term use, and the wear-resistant cloth layer 22 will not cause wear to the probe, thereby solving the problem that the probe is easy to fall out of the through hole of the thread needle fixture after long-term use, preventing the probe from falling, improving the stability of the thread needle fixture during use, and reducing the maintenance cost of the fixture.

[0016] In the above solution, the wear-resistant cloth layer 22 can also be replaced with materials such as sponge pads, so as to have a certain friction limit on the probe without wearing the probe, preventing the probe from loosening and falling after long-term use of the fixture, thereby increasing the service life of the fixture.

[0017] Specifically, the distance between the top first guide plate 30 and the bottom second guide plate 50 is 14-17 mm. Preferably, the distance between the top first guide plate 30 and the bottom second guide plate 50 is 15 mm. By forming an overhead space between the first guide plate 30 and the second guide plate 50, the friction between the probe and the guide plates is reduced while ensuring sufficient height of the needle guide, thus preventing damage to the probe caused by long-term use.

[0018] Furthermore, the base 10, retaining plate 20, panel 60, and multiple layers of first guide plates 30 are provided with recessed grooves 11 for the probe to pass through. The probe passes through holes in the base 10, retaining plate 20, and multiple layers of first guide plates 30. The recessed grooves 11 reduce the contact area between the base 10, retaining plate 20, and multiple layers of first guide plates 30 and the probe, thereby guiding and limiting the probe while minimizing probe wear and reducing probe maintenance costs. In some implementations, the ratio of the depth of the recessed groove 11 to the thickness of each plate is 4:5.

[0019] Furthermore, several layers of the second guide plates 50 are provided with through slots 51 for the probes to pass through. Since the second guide plates 50 are located in the middle, to further reduce friction on the probes, each second guide plate 50 is provided with through slots 51 for the probes to pass through. These slots 51 reduce friction between the probes and the various plate layers, thereby reducing probe wear and effectively preventing probe jamming and puncturing, ensuring test effectiveness.

[0020] Furthermore, there are at least four support columns 40, and two support columns 40 are longer, and the other two support columns 40 are shorter. The two shorter support columns 40 are supported on the second guide plate 50 at the bottom layer, and the two longer support columns 40 are supported on the second guide plate 50 at the top layer, so that the overall support structure is stable.

[0021] Furthermore, the base 10 is provided with a number of guide posts 70, which are inserted into the positioning plate 20, the first guide plate 30, the second guide plate 50 and the panel 60. The support posts 40 are detachably connected to the base 10, the second guide plate 50 and the panel 60 by bolts, so that the number of board layers of the needle fixture can be increased or decreased according to actual test requirements. The guide posts 70 facilitate positioning when disassembling and assembling the board layers, meeting the test requirements of circuit boards of different specifications, and are convenient for disassembly and maintenance, thereby extending the service life of the test fixture. Among them, the base 10 is detachably connected to the positioning plate 20 by bolts, and the wear-resistant cloth layer 22 can be regularly replaced according to the length of use to ensure the positioning effect of the probe.

[0022] Furthermore, the outer periphery of the probe is coated with an insulating layer. Since the probe is relatively slender, when the probe contacts the circuit board, the probe will bend slightly, and the densely arranged probes are likely to contact each other, resulting in inaccurate testing. To this end, the outer periphery of the probe is covered with an insulating layer. Exemplarily, the insulating layer can be an insulating film. After the insulating film is covered on the outer periphery of the probe, it can insulate the contact between the probes, prevent the contact between the probes during the test and cause a short circuit, avoid inaccurate test results, improve the accuracy of the test, and meet the current testing requirements for densely packed PCB contacts.

[0023] To sum up, this solution is to provide a plurality of support columns on the base that are passed through the positioning plate and the first guide plate, several layers of second guide plates are connected to the top of the support columns, and a panel for the probe to pass through is provided on the top of the top second guide plate. The probe is passed through the base, the positioning plate, the first guide plate, the second guide plate and the panel. The positioning plate is provided with a groove on the surface facing the base, and a wear-resistant cloth layer for the probe to pass through is provided in the groove. The probe is then rubbed in place by the wear-resistant cloth layer to prevent the probe from loosening after long-term use, and the wear-resistant cloth layer will not cause wear to the probe, thereby solving the problem that the probe is easy to fall from the through hole of the thread needle jig after long-term use, preventing the probe from falling, improving the stability of the thread needle jig during use, and reducing the maintenance cost of the jig.

[0024] The above-described embodiments do not constitute a limitation on the scope of protection of this technical solution. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the above-described embodiments shall be included in the scope of protection of this technical solution.

Claims

1. A new type of needle fixture, characterized by: The invention comprises a base (10), a positioning plate (20), and several layers of first guide plates (30) stacked from bottom to top; a plurality of support columns (40) are arranged on the base (10) and are inserted into the positioning plate (20) and the first guide plate (30); a plurality of second guide plates (50) are connected to the top of the support columns (40); a panel (60) for the probe to pass through is arranged on the top of the second guide plate (50) on the top layer; a groove (21) is provided on the surface of the positioning plate (20) facing the base (10); and a wear-resistant cloth layer (22) for the probe to pass through is arranged in the groove (21).

2. The new thread needle fixture according to claim 1, characterized in that: The distance between the first guide plate (30) on the top layer and the second guide plate (50) on the bottom layer is 14-17 mm.

3. The new thread needle fixture according to claim 1, characterized in that: A plurality of guide posts (70) are provided on the base (10), and the guide posts (70) are inserted through the positioning plate (20), the first guide plate (30), the second guide plate (50) and the panel (60).

4. The new thread needle jig according to claim 3, characterized in that: The base (10), the positioning plate (20) and the plurality of first guide plates (30) are provided with a sink groove (11) for the probe to pass through.

5. The new thread needle fixture according to claim 3 is characterized in that: Several layers of the second guide plates (50) are provided with through slots (51) for the probes to pass through.

6. The new thread needle jig according to claim 1, characterized in that: The outer periphery of the probe is covered with an insulating layer.

7. The new thread needle jig according to claim 1, characterized in that: The support column (40) is detachably connected to the base (10), the second guide plate (50) and the panel (60) via bolts.