Probe socket

Abstract

The utility model relates to the technical field of chip testing, and discloses a probe socket. A probe assembly of the probe socket comprises a grounding probe and a test probe, the grounding probe is configured to abut against an external grounding contact, and the test probe surrounds the outer side of the grounding probe and is configured to abut against an external test contact; each of the grounding probe and the test probe comprises a mounting section and a tail section which are connected with each other, and the tail section is embedded in the mounting section and can stretch out and draw back relative to the mounting section; the diameter of the tail section is smaller than that of the mounting section which is arranged on the socket body; the retaining plate is arranged on the socket body, a retaining through hole is formed in the retaining plate, the inner diameter of the retaining through hole is smaller than the diameter of the mounting section and larger than the diameter of the tail section, the tail section can be arranged in the retaining through hole in a penetrating mode, the end, away from the mounting section, of the tail section is arranged on the side, away from the socket body, of the retaining plate in a protruding mode, and the end, away from the tail section, of the retaining plate is arranged on the socket body in a protruding mode. The inclined deviation of the tail section can be effectively reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a probe socket. Background Art

[0002] A probe socket, also known as a test socket, is a key tool used to test integrated circuits (ICs) during the semiconductor manufacturing process. Attached to a test board, it provides a physical interface that allows the chip under test to be electrically connected to the test equipment, enabling various performance and functional tests. During testing, the IC chip under test is placed on the base of the test socket and then held in place by a robotic arm or capping mechanism. At this point, the individual pins of the IC chip under test come into contact with the probe contacts within the test socket, forming an electrical connection.

[0003] However, the existing probe socket still has some defects, such as Figure 1 As shown, after the elastic probe 1 (pogo pin) is installed in the probe slot 21 of the test socket 2, the probe tail 11 of the elastic probe 1 can be elastically extended and retracted, so the probe tail 11 cannot be precisely positioned. When the probe tail 11 contacts the PCB test board pin 31 of the PCB test board substrate 3, the probe tail 11 is prone to tilt and offset, affecting the stability of the test yield and reducing the service life of the PCB test board substrate 3.

[0004] Therefore, there is an urgent need for a probe socket to solve the above problems. Utility Model Content

[0005] Based on the above, the purpose of the present invention is to provide a probe socket that can support and position the tail section of the probe, thereby effectively reducing the tilt offset of the tail section, ensuring test stability and the service life of the PCB test board substrate.

[0006] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0007] Probe socket, including:

[0008] Socket body;

[0009] A probe assembly comprising a grounding probe and a test probe, wherein the grounding probe is configured to abut an external grounding contact, and the test probe is disposed around the outside of the grounding probe and configured to abut an external test contact; the grounding probe and the test probe each comprise a mounting section and a tail section connected to each other, the tail section being embedded in the mounting section and being retractable relative to the mounting section; the tail section having a diameter smaller than that of the mounting section, the mounting section being disposed on the socket body, and having an end distal to the tail section protruding from the socket body;

[0010] A retaining plate is arranged on the socket body, and a retaining through hole is provided on the retaining plate. The inner diameter of the retaining through hole is smaller than the diameter of the mounting section and larger than the diameter of the tail section. The tail section can be passed through the retaining through hole, and the end of the tail section away from the mounting section is protruded on the side of the retaining plate away from the socket body.

[0011] As a preferred solution of the probe socket, the socket body is provided with a first mounting groove, and the mounting section of the test probe is placed in the first mounting groove.

[0012] As a preferred solution of the probe socket, the probe socket is further provided with a mounting block, the mounting block is arranged between the socket body and the retaining plate, and the grounding probe is embedded in the mounting block.

[0013] As a preferred solution of the probe socket, two mounting blocks are provided, and the two mounting blocks are spaced apart along the length direction of the socket body.

[0014] As a preferred solution of the probe socket, the socket body is provided with a second mounting groove, and the mounting block is arranged in the second mounting groove; the mounting block is provided with a third mounting groove, and the mounting section of the grounding probe is placed in the third mounting groove.

[0015] As a preferred solution for the probe socket, the retaining plate is provided with a first connecting hole, the socket body is provided with a second connecting hole, and the connecting piece can be passed through the first connecting hole and threadedly connected to the second connecting hole.

[0016] As a preferred solution of the probe socket, the socket body is provided with at least two positioning posts, the retaining plate is provided with at least two first positioning holes, and the positioning posts can be passed through the first positioning holes in a one-to-one correspondence.

[0017] As a preferred solution of the probe socket, the positioning post can be protruded from a side of the retaining plate away from the socket body.

[0018] As a preferred solution of the probe socket, the length of the end of the tail section away from the mounting section protruding from the retaining plate accounts for 1 / 5-1 / 4 of the length of the tail section.

[0019] As a preferred solution for the probe socket, an avoidance notch is provided on the retaining plate.

[0020] The beneficial effects of the utility model are:

[0021] The utility model provides a grounding probe and a test probe, which are respectively used to connect to the ground pin of the PCB test board substrate to achieve grounding, and to connect to the test pin of the PCB test board substrate to test the IC chip to be tested. The installation sections of the grounding probe and the test probe are arranged on the socket body, so as to achieve the installation of the grounding probe and the test probe. At the same time, the probe socket is also provided with a retaining plate, which is provided with a retaining through-hole. The tail section with a diameter smaller than the mounting section can be placed in the retaining through-hole and protrudes on the side of the retaining plate away from the socket body to abut against the PCB test board pin of the PCB test board substrate. Since the inner diameter of the retaining through-hole is smaller than the diameter of the mounting section and larger than the diameter of the tail section, the provision of the retaining plate can not only support the tail section and reduce the offset that occurs when the tail section abuts against the PCB test board substrate; at the same time, the provision of the retaining plate can also prevent the probe from falling off relative to the socket body; in addition, the retaining plate can also prevent the edge of the PCB test board pin from being excessively stressed due to the tail deviation, thereby effectively extending the service life of the PCB test board substrate. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following is a brief introduction to the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the contents of the embodiments of the present invention and these drawings without paying any creative work.

[0023] Figure 1 It is a cross-sectional view of a probe socket and a PCB test board substrate in the prior art;

[0024] Figure 2 This is a cross-sectional view of a probe socket and a PCB test board substrate provided by a specific embodiment of the present utility model;

[0025] Figure 3 It is an exploded schematic diagram of a probe socket provided in a specific embodiment of the present utility model.

[0026] In the picture:

[0027] 1. Spring probe; 11. Probe tail; 2. Test socket; 21. Probe slot; 3. PCB test board base; 31. PCB test board pins;

[0028] 100, socket body; 110, first mounting slot; 120, second mounting slot; 130, second connecting hole; 140, positioning post; 150, third connecting hole;

[0029] 201, ground probe; 202, test probe; 210, installation section; 220, tail section; 230, test section;

[0030] 300, retaining plate; 310, retaining through hole; 320, first connecting hole; 321, connecting member; 330, first positioning hole; 340, avoidance notch;

[0031] 400, mounting block; 401, third mounting slot. DETAILED DESCRIPTION

[0032] The following describes in detail embodiments of the present invention. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to explain the present invention, and should not be construed as limiting the present invention.

[0033] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of this utility model and simplify the description. They do not indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. The terms "first position" and "second position" refer to two different positions.

[0034] Unless otherwise expressly specified or limited, the terms "mounted," "connected," "connect," and "fixed" should be interpreted broadly. For example, they may refer to fixed or removable connections; mechanical or electrical connections; direct or indirect connections through an intermediary; and internal communication between two components or the interaction between two components. Those skilled in the art will understand the specific meanings of these terms in this utility model based on specific circumstances.

[0035] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Moreover, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0036] The technical solution of the present invention will be further described below with reference to the accompanying drawings and through specific implementation methods.

[0037] like Figure 2 and Figure 3 As shown, this embodiment provides a probe socket, which includes a socket body 100, a probe assembly and a retaining plate 300; the probe assembly includes a grounding probe 201 and a test probe 202, the grounding probe 201 is configured to abut against an external grounding contact, and the test probe 202 is arranged around the outside of the grounding probe 201 and is configured to abut against an external test contact; the grounding probe 201 and the test probe 202 each include a mounting section 210 and a tail section 220 connected to each other, the tail section 220 is embedded in the mounting section 210, and can be extended relative to the mounting section 210. shrinkage; the diameter of the tail section 220 is smaller than the diameter of the mounting section 210, and the mounting section 210 is arranged on the socket body 100; the retaining plate 300 is arranged on the socket body 100, and a retaining through hole 310 is provided on the retaining plate 300. The inner diameter of the retaining through hole 310 is smaller than the diameter of the mounting section 210 and larger than the diameter of the tail section 220. The tail section 220 can be passed through the retaining through hole 310, and the end of the tail section 220 away from the mounting section 210 is protruded on the side of the retaining plate 300 away from the socket body 100, and the end away from the tail section 220 is protruded from the socket body 100.

[0038] A grounding probe 201 and a test probe 202 are provided, respectively, for contacting an external ground contact and an external test contact. The external ground contact can be a ground pin on the PCB test board substrate 3, and the external test contact can be a test pin on the PCB test board substrate 3. The mounting sections 210 of the grounding probe 201 and the test probe 202 are provided on the socket body 100 to facilitate mounting of the grounding probe 201 and the test probe 202. Furthermore, the test probe 202 is positioned around the test probe 202, making the arrangement of the probes more compact. The probe socket also includes a retaining plate 300 with a retaining hole 310. The tail section 220, which has a smaller diameter than the mounting section 210, can be positioned within the retaining hole 310 and protrudes from the retaining plate 300 on the side of the socket body 100 away from the mounting section 210, for contact with the PCB test board pins 31 of the PCB test board substrate 3. The end of the mounting section 210, which is distal to the tail section 220, protrudes from the socket body 100 for contact with the pins of the IC chip under test. Because the inner diameter of the retaining hole 310 is smaller than the diameter of the mounting section 210 and larger than the diameter of the tail section 220, the retaining plate 300 supports the tail section 220, reducing deflection that occurs when the tail section 220 contacts the PCB test board substrate 3. Furthermore, the retaining plate 300 prevents the probe 1 from falling off the socket body 100. Furthermore, the retaining plate 300 prevents excessive stress on the edges of the PCB test board pins 31 caused by tail section deflection, thereby effectively extending the service life of the PCB test board substrate 3.

[0039] It is understood that multiple grounding probes 201 and test probes 202 are provided, and each is specifically configured as a spring probe. A test section 230 is provided at the end of the probe's mounting section 210, away from the tail section 220. The test section 230 protrudes from the side of the socket body 100 away from the retaining plate 300 and is configured to abut against the pins of the IC chip under test to perform testing on the IC chip under test.

[0040] Preferably, the length of the end of the tail section 220 away from the mounting section 210 protruding from the retaining plate 300 should not be too long as the length of the tail section 220 to ensure the supporting effect of the retaining plate 300 on the tail section 220. In this embodiment, the length of the end of the tail section 220 away from the mounting section 210 protruding from the retaining plate 300 accounts for 1 / 5-1 / 4 of the length of the tail section 220.

[0041] Specifically, in order to achieve the connection between the test probe 202 and the socket body 100 , the socket body 100 is provided with a first mounting groove 110 , and the mounting sections 210 of the test probe 202 are placed in the first mounting groove 110 in a one-to-one correspondence.

[0042] In this embodiment, the probe socket is further provided with a mounting block 400, which is disposed between the socket body 100 and the retaining plate 300. The ground probe 201 is embedded in the mounting block 400. The mounting block 400 is used to integrate multiple ground probes 201, facilitating installation while also reducing electrical interference between the ground probes 201 and the test probes 202.

[0043] Furthermore, in order to realize the connection between the mounting block 400 and the socket body 100, the socket body 100 is provided with a second mounting groove 120, and the mounting block 400 is arranged in the second mounting groove 120; in order to realize the connection between the grounding probe 201 and the mounting block 400, the mounting block 400 is provided with a third mounting groove 401, and the mounting section 210 of the grounding probe 201 is placed in the third mounting groove 401.

[0044] Optionally, two mounting blocks 400 are provided to realize the installation of multiple grounding probes 201 , and the two mounting blocks 400 are spaced apart along the length direction of the socket body 100 , which is a more reasonable design.

[0045] As an optional solution for the probe socket, the retaining plate 300 is provided with a first connecting hole 320, and the socket body 100 is provided with a second connecting hole 130. The connecting piece 321 can be passed through the first connecting hole 320 and threadedly connected to the second connecting hole 130 to realize the connection between the retaining plate 300 and the socket body 100.

[0046] Preferably, the socket body 100 is provided with at least two positioning posts 140, and the retaining plate 300 is provided with at least two first positioning holes 330. The positioning posts 140 can be inserted into the first positioning holes 330 in a one-to-one correspondence. The provision of the positioning posts 140 can effectively guide the connection between the retaining plate 300 and the socket body 100, ensuring that the tail section 220 of the probe can accurately pass through the retaining holes. Optionally, the positioning posts 140 and the socket body 100 are detachably connected to facilitate processing and production.

[0047] In this embodiment, the positioning column 140 can be protruded from the side of the retaining plate 300 away from the socket body 100. This arrangement allows the positioning column 140 to not only be used for positioning when the retaining plate 300 is installed, but also to play a connecting role when the probe socket is connected to the PCB test board substrate 3, thereby ensuring the accuracy of the contact between the probe and the PCB test board pin 31 of the PCB test board substrate 3.

[0048] Furthermore, a third connection hole 150 is provided on the socket body 100 for connection with the PCB test board substrate 3 .

[0049] Preferably, the retaining plate 300 is provided with an escape notch 340 for escaping components on the PCB test board substrate 3 , and is also helpful in reducing the weight of the probe socket.

[0050] The assembly and use process of the above-mentioned probe socket is as follows: connect the detection probe, mounting block 400, grounding probe 201 and positioning post 140 to the socket body 100; connect the retaining plate 300 to the socket body 100 under the positioning of the positioning post 140 to form a probe socket; then install the socket body 100 and the retaining plate 300 as a whole on the PCB test board substrate 3 under the positioning of the positioning post 140, and finally press the IC chip to be tested to the test section 230 for testing.

[0051] The above contents are only preferred embodiments of the present invention. For ordinary technicians in this field, according to the concept of the present invention, there may be changes in the specific implementation methods and application scope. The content of this specification should not be understood as limiting the present invention.

Claims

1. Probe socket, characterized in that, include: Socket body (100); A probe assembly comprises a grounding probe (201) and a test probe (202), wherein the grounding probe (201) is configured to abut against an external grounding contact, and the test probe (202) is arranged outside the grounding probe (201) and configured to abut against an external test contact; the grounding probe (201) and the test probe (202) each comprise a mounting section (210) and a tail section (220) connected to each other, the tail section (220) being embedded in the mounting section (210) and capable of retracting relative to the mounting section (210); the diameter of the tail section (220) is smaller than the diameter of the mounting section (210), and the mounting section (210) is arranged on the socket body (100), and one end away from the tail section (220) is protruded from the socket body (100); A retaining plate (300) is arranged on the socket body (100), and a retaining through hole (310) is provided on the retaining plate (300). The inner diameter of the retaining through hole (310) is smaller than the diameter of the mounting section (210) and larger than the diameter of the tail section (220). The tail section (220) can be inserted into the retaining through hole (310), and one end of the tail section (220) away from the mounting section (210) is protruded on a side of the retaining plate (300) away from the socket body (100).

2. The probe socket according to claim 1, wherein: The socket body (100) is provided with a first mounting groove (110), and the mounting section (210) of the test probe (202) is placed in the first mounting groove (110).

3. The probe socket according to claim 1, wherein: The probe socket is further provided with a mounting block (400), the mounting block (400) being arranged between the socket body (100) and the retaining plate (300), and the grounding probe (202) being embedded in the mounting block (400).

4. The probe socket according to claim 3, wherein: Two mounting blocks (400) are provided, and the two mounting blocks (400) are spaced apart along the length direction of the socket body (100).

5. The probe socket according to claim 3, wherein: The socket body (100) is provided with a second mounting groove (120), and the mounting block (400) is arranged in the second mounting groove (120); the mounting block (400) is provided with a third mounting groove (401), and the mounting section (210) of the grounding probe (201) is placed in the third mounting groove (401).

6. The probe socket according to claim 1, wherein: The retaining plate (300) is provided with a first connecting hole (320), the socket body (100) is provided with a second connecting hole (130), and the connecting member (321) can be passed through the first connecting hole (320) and threadedly connected to the second connecting hole (130).

7. The probe socket according to claim 1, wherein: The socket body (100) is provided with at least two positioning columns (140), and the retaining plate (300) is provided with at least two first positioning holes (330), and the positioning columns (140) can be passed through the first positioning holes (330) in a one-to-one correspondence.

8. The probe socket according to claim 7, wherein: The positioning column (140) can be protruded on a side of the retaining plate (300) away from the socket body (100).

9. The probe socket according to any one of claims 1 to 8, characterized in that: The length of one end of the tail section (220) away from the mounting section (210) protruding from the retaining plate (300) accounts for 1 / 5-1 / 4 of the length of the tail section (220).

10. The probe socket according to any one of claims 1 to 8, characterized in that: The retaining plate (300) is provided with an avoidance notch (340).

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