Test device

Abstract

The utility model provides test equipment which is suitable for testing electronic equipment. The testing equipment comprises a conveying device, a material taking device, a first testing device and a second testing device which are arranged on a rack. The conveying device comprises two conveying rails used for conveying the electronic equipment. The material taking device is movably arranged on the rack and used for taking and placing electronic equipment. The plurality of first testing devices are distributed on the rack to form a plurality of testing areas, and the plurality of testing areas comprise a current testing area used for current testing and an OTG testing area used for OTG testing. The second testing device is used for TF card testing of the electronic equipment and comprises a jacking discharging mechanism, a testing plate connecting mechanism and a TF card testing pulling and inserting mechanism. The jacking discharging mechanism is arranged between the two conveying rails in a lifting mode and used for placing electronic equipment, the test board connecting mechanism is movably arranged on the rack and can be electrically connected to the electronic equipment, and the TF card test plugging mechanism is movably arranged on one side of the conveying mechanism and used for TF card testing of the electronic equipment.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic equipment production and testing, in particular to a testing device. Background Art

[0002] All electronic devices undergo various tests before leaving the factory. These tests, including OTG testing, TF card testing, and voltage and current testing, all require the device under test to be electrically connected to a test fixture. OTG is primarily used for data exchange between different devices or mobile devices, alleviating the inconvenience of exchanging data between multiple memory cards. TF cards are extremely small flash memory cards, boasting excellent features such as small size, fast data transfer speeds, hot-swappability, and large capacity, making them widely used in various portable electronic devices.

[0003] In the prior art, OTG testing, TF card testing, voltage testing, and current testing of electronic devices are performed on different test fixtures, and are generally performed by workers manually plugging and unplugging. The work intensity is relatively high, and manual work requires multiple electrical plugging and unplugging operations. A single plugging and unplugging action takes about 2.5 seconds, and the plugging and unplugging action alone for testing each electronic device takes a long time. In addition, manual operation has the problem of non-standard operating techniques, the test head is damaged quickly, and the cost of consumables is high. On the other hand, manual operation is not fool-proof and is prone to problems such as missed tests and repeated tests.

[0004] Therefore, it is necessary to provide a test equipment that can automatically load materials and automatically perform multiple tests. Utility Model Content

[0005] The purpose of the utility model is to provide a testing device which can automatically load materials and automatically perform multiple tests.

[0006] To achieve the above-mentioned object, the present invention provides a testing device suitable for testing electronic equipment, comprising:

[0007] A conveying device, comprising a conveying mechanism for conveying electronic equipment, wherein the conveying mechanism comprises two conveying tracks for conveying electronic equipment;

[0008] A material taking device for taking and placing electronic equipment is movably arranged on the rack;

[0009] A plurality of first test devices are distributed on the rack to form a plurality of test areas, the plurality of test areas including a current test area for current testing and an OTG test area for OTG testing;

[0010] The second testing device is used for TF card testing of electronic devices, including a lifting and unloading mechanism, a test board connection mechanism and a TF card test and plug-in mechanism. The lifting and unloading mechanism is arranged between two conveying tracks in a lifting manner for placing electronic devices, the test board connection mechanism is movably arranged on the rack and can be electrically connected to the electronic device, and the TF card test and plug-in mechanism is movably arranged on one side of the conveying mechanism for TF card testing of electronic devices.

[0011] Compared with the existing technology, the testing equipment of the present invention can perform electrical tests such as current test, OTG test and TF card test on electronic equipment on one device at the same time, and can automatically load and unload materials without missing tests or repeating tests. It has a high degree of automation and greatly improves efficiency.

[0012] Preferably, the lifting and unloading mechanism is arranged between the two conveying rails, including a lifting component and a unloading component. The unloading component is arranged on the lifting component. The lifting component moves to drive the unloading component to move up and down between the two conveying rails to place the inspected electronic equipment into the conveying rails for conveyance.

[0013] Preferably, the test board connection mechanism includes a base and a transfer test assembly, the base is slidably arranged on the frame, the transfer test assembly is installed on the base, and the base drives the transfer test assembly to slide close to the electronic device and plug into the electronic device to electrically connect with the electronic device.

[0014] Preferably, the TF card test and plug-in mechanism is arranged on one side of the lifting and unloading mechanism. The TF card test and plug-in mechanism includes a TF card test component and a pushing component. The TF card test component is arranged at the output end of the pushing component. The pushing component moves to drive the TF card test component to be plugged into the electronic device.

[0015] Preferably, the conveying device further comprises a lifting and positioning mechanism located on one side of the second testing device, the lifting and positioning mechanism being arranged between the two conveying rails, and the lifting and positioning mechanism being operated to lift the electronic equipment on the conveying rails for the material taking device to take the material.

[0016] Preferably, the plurality of first test devices all include a discharge positioning mechanism, which includes a discharge position for placing the electronic device, and a plurality of positioning components are provided around the discharge position, which operate to position the electronic device on the discharge position.

[0017] Preferably, the first testing device also includes a test plug mechanism movably arranged on one side of the discharge positioning mechanism, the test plug mechanism includes a first fixed seat, a sliding assembly and a test plug assembly, the test plug assembly is slidably arranged on the first fixed seat by the sliding assembly, and the test plug assembly slides along the sliding assembly to approach and plug into the electronic equipment on the discharge position.

[0018] Preferably, the conveying device further comprises an NG transfer mechanism provided on one side of the conveying mechanism, and the NG transfer mechanism is used to transfer electronic equipment that fails the inspection.

[0019] Preferably, the picking device includes a transverse moving mechanism, a longitudinal moving mechanism and a picking mechanism, the longitudinal moving mechanism is arranged on the transverse moving mechanism, and the picking mechanism is arranged on the longitudinal moving mechanism. The transverse moving mechanism and the longitudinal moving mechanism are used to enable the picking mechanism to pick up electronic equipment on the conveying mechanism and place it in the OTG test area for OTG testing, and then place the electronic equipment that has passed the test in the current test area for current testing, and then place the electronic equipment that has passed the test in the second test device for TF card testing.

[0020] Preferably, the material picking mechanism includes a clamping claw power component and a clamping claw assembly, and the clamping claw power component is actuated to drive the clamping claw assembly to clamp the electronic device. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0022] Figure 1 It is a structural diagram of a testing device provided in one embodiment of the present utility model.

[0023] Figure 2 yes Figure 1 Structural subdivision diagram of the first test device and the second test device.

[0024] Figure 3 yes Figure 2 Structural diagram of the first test device.

[0025] Figure 4 yes Figure 3 Structural diagram of the test plug-in mechanism.

[0026] Figure 5 yes Figure 2 Structural diagram of the middle transmission device and the second testing device.

[0027] Figure 6 yes Figure 5 Structural diagram of the transmission device.

[0028] Figure 7 yes Figure 5 Structural diagram of the second test device.

[0029] Figure 8 yes Figure 1 Structural diagram of the center reclaiming mechanism.

[0030] Description of reference numerals:

[0031] 100. Test equipment; 101. Rack; 102. Electronic equipment;

[0032] 10. Conveying device; 11. Conveying mechanism; 111. Conveying track; 12. Lifting and positioning mechanism; 13. NG transfer mechanism;

[0033] 20. First test device; 201. OTG test area; 202. Current test area; 21. Second fixing seat; 22. Discharge positioning mechanism; 221. Discharge position; 222. Positioning assembly; 23. Test plug-in mechanism; 231. First fixing seat; 232. Sliding assembly; 233. Test power assembly; 234. Test plug-in assembly;

[0034] 30. Second test device; 31. Lifting and unloading mechanism; 311. Unloading assembly; 312. Lifting assembly; 32. Test board connection mechanism; 321. Base; 322. Transfer test assembly; 33. TF card test and plug-in machine; 331. TF card test assembly; 332. Pushing assembly;

[0035] 40. Material taking device; 41. Horizontal moving mechanism; 42. Longitudinal moving mechanism; 43. Material taking mechanism; 431. Gripping jaw power assembly; 432. Gripping jaw assembly. DETAILED DESCRIPTION

[0036] In order to explain the technical content and structural features of the present invention in detail, the following is a further description in conjunction with the embodiments and the accompanying drawings.

[0037] See also Figure 1 and Figure 2The present invention provides a test device 100 suitable for testing an electronic device 102. The electronic device 102 includes a variety of mobile terminals such as mobile phones, tablets, and learning machines. When the electronic device 102 is tested, it is wrapped in a protective cover, which can effectively protect the electronic device 102 without affecting the test. The test device 100 includes a conveying device 10, a material picking device 40, a first test device 20, and a second test device 30 arranged on a rack 101. The conveying device 10 includes a conveying mechanism 11 for conveying the electronic device 102. The conveying mechanism 11 includes two conveying rails 111 for conveying the electronic device 102. The material picking device 40 is movably arranged on the rack 101 for taking and placing the electronic device 102. A plurality of first test devices 20 are distributed on the rack 101 to form a plurality of test areas. The plurality of test areas include a current test area 202 for current testing and an OTG test area 201 for OTG testing. It may also include a voltage test area or other electrical test areas. The second test device 30 is used for TF card testing of the electronic device 102. The second test device 30 includes a lifting and unloading mechanism 31, a test board connection mechanism 32 and a TF card test plug-in mechanism 33. Among them, the lifting and unloading mechanism 31 is arranged between the two conveying tracks 111 of the conveying mechanism 11 in a lifting manner, and is used to place the electronic device 102 so that the TF card test can be performed. The test board connection mechanism 32 is movably arranged on the rack 101 and can be electrically connected to the electronic device 102. The TF card test plug-in mechanism 33 is movably arranged on one side of the conveying mechanism 11, and the TF card test plug-in mechanism 33 can be used for TF card testing of the electronic device 102. Compared with the prior art, the test device 100 of the present invention can perform electrical tests such as current testing, OTG testing and TF card testing on the electronic device 102 on one device at the same time, and can automatically load and unload materials without missing tests or repeated tests. It has a high degree of automation and greatly improves efficiency.

[0038] See also Figures 5 to 7In some optional embodiments, the lifting and unloading mechanism 31 is disposed between the two conveyor rails 111. The lifting and unloading mechanism 31 includes a lifting assembly 312 and a unloading assembly 311, with the unloading assembly 311 disposed on the lifting assembly 312. The lifting assembly 312 operates to drive the unloading assembly 311 to move up and down between the two conveyor rails 111. It is understood that after the electronic devices 102 undergo TF card testing on the unloading assembly 311, qualified electronic devices 102 continue to be transported along the conveyor rails 111 to subsequent processes, while unqualified electronic devices 102 are unloaded from the NG transfer mechanism 13 via the retrieving device 40. Specifically, the lifting assembly 312 lifts the unloading assembly 311 to enable the electronic devices 102 on the unloading assembly 311 to undergo positioning testing. After the test is completed, the lifting assembly 312 drives the unloading assembly 311 to descend below the conveyor rails 111. The conveyor rails 111 then receive the electronic devices 102 and transport them to the next process.

[0039] See also Figure 7 In some optional embodiments, the test board connection mechanism 32 includes a base 321 and a transfer test assembly 322. The base 321 is slidably arranged on the frame 101 and close to the conveying tracks 111 on both sides. The transfer test assembly 322 is installed on the base 321, and the base 321 drives the transfer test assembly 322 to slide close to the electronic device 102 and plug into the electronic device 102 to be electrically connected to the electronic device 102. Exemplarily, the base 321 can be installed on the slide rail assembly, and then the base 321 is driven by a cylinder to slide along the slide rail assembly, so that the transfer test assembly 322 can be plugged into the electronic device 102 and electrically connected to the electronic device 102.

[0040] See also Figure 7 In some optional embodiments, a TF card test and plug-in mechanism 33 is provided on one side of the lifting and unloading mechanism 31. Specifically, the TF card test and plug-in mechanism 33 includes a TF card test component 331 and a pushing component 332. The TF card test component 331 is provided at the output end of the pushing component 332. The pushing component 332 moves to drive the TF card test component 331 to be plugged into the electronic device 102. It can be understood that after the electronic device 102 is firmly placed on the unloading component 311, the pushing component 332 drives the TF card test component 331 to be plugged into the corresponding position of the electronic device 102 to perform a TF card test. Among them, the pushing component 332 can ensure the pushing stroke and pushing pressure of the TF card test component 331 to prevent damage to the TF card test component 331 or the electronic device 102.

[0041] See also Figure 5 and Figure 6In some optional embodiments, the conveying device 10 further includes a lifting and positioning mechanism 12 located on one side of the second testing device 30. Specifically, the lifting and positioning mechanism 12 is disposed between the two conveying rails 111. The lifting and positioning mechanism 12 operates to lift the electronic device 102 on the conveying rails 111 for the material picking device 40 to pick up. It is understandable that when the electronic device 102 is conveyed on the two conveying rails 111 and reaches above the lifting and positioning mechanism 12, the lifting and positioning mechanism 12 is lifted upward to lift the electronic device 102 onto the lifting and positioning mechanism 12, and the material picking mechanism 43 picks up the electronic device 102 from the lifting and positioning mechanism 12. The electronic device 102 is then placed in the OTG test area 201. The electronic device 102 that passes the test is picked up from the OTG test area 201 by the material picking mechanism 43 and placed in the current test area 202. The electronic device 102 that passes the test in the current test area 202 is placed by the material picking mechanism 43 on the discharge assembly 311 of the second test device 30 for TF card testing. The electronic device 102 that passes the TF card test is transferred to the next process via the conveying mechanism 11. Any electronic device 102 that fails the test in any of the test processes is picked up by the material picking mechanism 43 and placed in the NG transfer mechanism 13 for unloading.

[0042] See also Figures 2 to 4 In some optional embodiments, each of the multiple first testing devices 20 includes a discharge positioning mechanism 22. Specifically, the discharge positioning mechanism 22 includes a second fixed base 21, which is provided with a discharge position 221 for placing the electronic device 102. Multiple positioning assemblies 222 are disposed around the discharge position 221. These multiple positioning assemblies 222 operate to position the electronic device 102 on the discharge position 221. It will be appreciated that multiple positioning assemblies 222 are disposed around the discharge position 221. The structures of these multiple positioning assemblies 222 may be the same or different, but each of these positioning assemblies 222 can be movable toward or away from the discharge position 221. When the picking mechanism 43 places the picked-up electronic device 102 on the discharge position 221, the multiple positioning assemblies 222 around the discharge position 221 operate simultaneously, not only pushing the electronic device 102 to the appropriate position, but also positioning the electronic device 102 on the discharge position 221.

[0043] See also Figures 2 to 4In some optional embodiments, the first testing device 20 further includes a test plug mechanism 23 movably disposed on one side of the discharge positioning mechanism 22. The test plug mechanism 23 is plugged into the electronic device 102 on the discharge position 221 to electrically connect the test plug mechanism 23 to the electronic device 102, thereby enabling electrical tests such as OTG testing, current testing, or voltage testing. The specific electrical test is set by a specific program. The test plug mechanism 23 includes a first fixed seat 231, a sliding assembly 232, a test power assembly 233, and a test plug assembly 234. The test plug assembly 234 is slidably disposed on the first fixed seat 231 via the sliding assembly 232, and the first fixed seat 231 is disposed on the second fixed seat 21. The test power assembly 233 is actuated to drive the test plug assembly 234 to slide along the sliding assembly 232 to approach and plug into the electronic device 102 on the discharge position 221.

[0044] See also Figure 5 and Figure 6 In some optional embodiments, the conveying device 10 further includes an NG transfer mechanism 13 disposed on one side of the conveying mechanism 11 , and the NG transfer mechanism 13 is used to transfer the electronic devices 102 that fail the inspection.

[0045] See also Figure 1 and Figure 8 In some optional embodiments, the picking device 40 includes a transverse moving mechanism 41, a longitudinal moving mechanism 42 and a picking mechanism 43. The longitudinal moving mechanism 42 is arranged on the transverse moving mechanism 41, and the picking mechanism 43 is arranged on the longitudinal moving mechanism 42. The specific number of the picking mechanisms 43 can be set according to actual use needs. Specifically, the transverse moving mechanism 41 and the longitudinal moving mechanism 42 enable the picking mechanism 43 to pick up the electronic device 102 on the conveying mechanism 11 and place it in the OTG test area 201 for OTG testing, and then place the qualified electronic device 102 in the current test area 202 for current testing, and then place the qualified electronic device 102 in the second testing device 30 for TF card testing. The unqualified electronic devices 102 detected during the test are all picked up by the picking mechanism 43 and placed in the NG transfer mechanism 13 for unloading. The material picking mechanism 43 includes a gripper power assembly 431 and a gripper assembly 432. The gripper power assembly 431 operates to drive the gripper assembly 432 to grip the electronic device 102. The specific number of the gripper power assembly 431 and the gripper assembly 432 is also set according to actual use requirements.

[0046] like Figures 1 to 8As shown, the test equipment 100 of the present invention can be used to test a variety of electronic devices 102. The test equipment 100 includes a conveying device 10, a material picking device 40, a first test device 20 and a second test device 30 arranged on a rack 101. The conveying device 10 includes a conveying mechanism 11 and an NG transfer mechanism 13. The conveying mechanism 11 includes two conveying tracks 111 for conveying electronic devices 102. The NG transfer mechanism 13 is used to convey electronic devices 102 that fail the inspection. The material picking device 40 is movably arranged on the rack 101 for taking and placing electronic devices 102. The first test device 20 is distributed on the rack 101 to form a plurality of test areas for electrical testing. The second test device 30 is used for TF card testing of electronic devices 102. The second test device 30 includes a lifting and unloading mechanism 31, a test board connection mechanism 32 and a TF card test plug-in mechanism 33. Specifically, the electronic device 102 is transported via the conveying mechanism 11, and the picking mechanism 43 picks up the electronic device 102 on the lifting and positioning mechanism 12 in the conveying mechanism 11. Then, the electronic device 102 first undergoes an OTG test in the OTG test area 201. The OTG test area 201 includes multiple first test devices 20, each of which can perform an OTG test on one electronic device 102 at a time. The picking mechanism 43 fills the OTG test area 201 with multiple electronic devices 102 according to a certain rule, and then the electronic devices 102 that have passed the test are picked up from the OTG test area 201 by the picking mechanism 43 and placed in the current test area 202. The electronic devices 102 that have passed the test in the current test area 202 are placed by the picking mechanism 43 on the discharge assembly 311 of the second test device 30 for TF card testing. The electronic devices 102 that have passed the TF card test are transported to the next process via the conveying mechanism 11. Of course, other electrical tests can also be performed on the electronic device 102 on the test equipment 100 according to actual test needs. Any unqualified electronic device 102 detected during any testing process is picked up by the pick-up mechanism 43 and placed in the NG transfer mechanism 13 for unloading. Compared to the prior art, the test device 100 of the present invention can simultaneously perform electrical tests such as current testing, OTG testing, and TF card testing on electronic devices 102 on a single device. It can also automatically load and unload materials without missing or repeating tests, resulting in a high degree of automation and greatly improved efficiency.

[0047] The above disclosure is only a preferred embodiment of the present invention and cannot be used to limit the scope of the rights of the present invention. Therefore, equivalent changes made according to the claims of the present invention are all within the scope covered by the present invention.

Claims

1. A test device, suitable for testing electronic equipment, characterized in that: Included on the rack: A conveying device, comprising a conveying mechanism for conveying the electronic device, wherein the conveying mechanism comprises two conveying tracks for conveying the electronic device; A material taking device for taking and placing the electronic equipment, movably arranged on the rack; A plurality of first test devices are distributed on the rack to form a plurality of test areas, wherein the plurality of test areas include a current test area for current testing and an OTG test area for OTG testing; The second testing device is used for TF card testing of the electronic device, including a lifting and unloading mechanism, a test board connection mechanism and a TF card test plug-in mechanism. The lifting and unloading mechanism is arranged between the two conveying tracks in a lifting manner for placing the electronic device, the test board connection mechanism is movably arranged on the rack and can be electrically connected to the electronic device, and the TF card test plug-in mechanism is movably arranged on one side of the conveying mechanism for TF card testing of the electronic device.

2. The testing device according to claim 1, characterized in that The lifting and unloading mechanism includes a lifting component and a unloading component. The unloading component is arranged on the lifting component. The lifting component moves to drive the unloading component to move up and down between the two conveying rails to place the electronic equipment after inspection into the conveying rails for conveyance.

3. The testing device according to claim 1, wherein: The test board connection mechanism includes a base and a transfer test assembly. The base is slidably arranged on the frame, and the transfer test assembly is installed on the base. The base drives the transfer test assembly to slide close to the electronic device and plug into the electronic device to electrically connect with the electronic device.

4. The testing device according to claim 1, wherein: The TF card test and plug-in mechanism is arranged on one side of the lifting and unloading mechanism. The TF card test and plug-in mechanism includes a TF card test component and a pushing component. The TF card test component is arranged at the output end of the pushing component. The pushing component moves to drive the TF card test component to be plugged into the electronic device.

5. The testing device according to claim 1, characterized in that The conveying device also includes a lifting and positioning mechanism located on one side of the second testing device, and the lifting and positioning mechanism is arranged between the two conveying rails. The lifting and positioning mechanism is activated to lift the electronic device on the conveying rail for the material picking device to pick up the material.

6. The testing device according to claim 1, wherein: The plurality of first testing devices all include a discharge positioning mechanism, which includes a discharge position for placing the electronic device. A plurality of positioning components are arranged around the discharge position, and the plurality of positioning components operate to position the electronic device on the discharge position.

7. The testing device according to claim 6, characterized in that The first testing device also includes a test plug mechanism movably arranged on one side of the discharge positioning mechanism, the test plug mechanism includes a first fixed seat, a sliding assembly and a test plug assembly, the test plug assembly is slidably arranged on the first fixed seat by the sliding assembly, and the test plug assembly slides along the sliding assembly to approach and plug into the electronic device on the discharge position.

8. The testing device according to claim 1, wherein: The conveying device further includes an NG transfer mechanism disposed on one side of the conveying mechanism, and the NG transfer mechanism is used to transfer the electronic equipment that fails the inspection.

9. The testing device according to claim 1, characterized in that The picking device includes a transverse moving mechanism, a longitudinal moving mechanism and a picking mechanism. The longitudinal moving mechanism is arranged on the transverse moving mechanism, and the picking mechanism is arranged on the longitudinal moving mechanism. The transverse moving mechanism and the longitudinal moving mechanism are used to enable the picking mechanism to pick up the electronic device on the conveying mechanism and place it in the OTG test area for OTG testing, and then place the electronic device that has passed the test in the current test area for current testing, and then place the electronic device that has passed the test in the second testing device for TF card testing.

10. The testing device according to claim 9, characterized in that The material picking mechanism includes a clamping claw power component and a clamping claw component, and the clamping claw power component is actuated to drive the clamping claw component to clamp the electronic device.

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