Integrated circuit testing device

Abstract

The utility model discloses an integrated circuit testing device. The integrated circuit testing device comprises a testing bottom plate and a rectangular frame fixedly installed on the testing bottom plate. A supporting plate is arranged in the rectangular frame, and a lifting structure used for driving the supporting plate to ascend and descend is installed on the testing bottom plate. The rectangular frame comprises four frame plates, each frame plate is provided with a vertically-through sliding groove, a sliding plate is arranged in each sliding groove in a sliding fit mode, a plurality of clamping blocks arranged at intervals are fixed to one side of each sliding plate, chucks are fixed to the ends of the clamping blocks, clamping openings are formed in the chucks, and receding openings communicated with the sliding grooves are formed in the positions, right opposite to the chucks, of the frame plates; the test bottom plate is provided with a synchronization structure used for driving the four sliding plates to act synchronously. The integrated circuit testing device has the advantages that the positioning precision can be improved, the testing efficiency is further improved, and the stability is high.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit testing, in particular to an integrated circuit testing device. Background Art

[0002] An integrated circuit is a miniature electronic device. Using a specific process, the components required for a circuit, such as transistors, diodes, resistors, capacitors, and inductors, are interconnected along with wiring. These components are fabricated on one or several small semiconductor wafers or dielectric substrates and then packaged within a housing, resulting in a miniature structure that performs the desired circuit functions. Functional testing of electronic products typically involves testing the integrated circuits themselves.

[0003] When performing functional testing on integrated circuits, the traditional positioning method is mechanical positioning, which relies on positioning pins. However, this positioning method is affected by factors such as assembly and wear, resulting in insufficient positioning accuracy and reduced test efficiency. Summary of the Invention

[0004] In view of the above-mentioned deficiencies in the prior art, the technical problem to be solved by this patent application is how to provide an integrated circuit testing device with high stability that can improve positioning accuracy and thereby improve testing efficiency.

[0005] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0006] An integrated circuit testing device comprises a testing base plate and a rectangular frame fixedly mounted on the testing base plate;

[0007] A support plate is provided in the rectangular frame, and a lifting structure for driving the support plate to be lifted and lowered is installed on the test base plate;

[0008] The rectangular frame includes four frame plates, each of which is provided with a sliding groove extending vertically therethrough, a slide plate being slidably fitted in the sliding groove, a plurality of spaced clamping blocks being fixed to one side of the slide plate, a clamping head being fixed to the end of the clamping block, the clamping head being provided with a clamping opening, and a clearance opening communicating with the sliding groove being provided on the frame plate opposite the clamping head;

[0009] The test base plate is provided with a synchronization structure for driving the four slides to move synchronously.

[0010] In this way, a test device is placed at the test station. When testing an integrated circuit, the integrated circuit is placed in a rectangular frame, and the pallet supports the integrated circuit. Then, the synchronous structure drives the four slides to move inward synchronously. The slides drive the clamping block and the chuck to move inward. The chuck clamps and positions the integrated circuit. After that, the integrated circuit can be functionally tested by the test equipment. After the test is completed, the synchronous structure drives the chuck to move outward synchronously, releasing the clamping of the integrated circuit. Then, the lifting structure drives the pallet to rise, so that the integrated circuit moves to the top of the rectangular frame. The operator can then remove the tested integrated circuit.

[0011] The lifting structure includes four cylinders fixedly mounted on the test base plate, and the cylinders are arranged in a rectangular shape. The cylinder rods of the cylinders are arranged upward and fixedly connected to the support plate.

[0012] The synchronization structure includes a connecting plate fixedly mounted on the lower end of the slide, a sliding rod is vertically fixed to the connecting plate, and a sliding hole is provided in the frame plate for sliding engagement with the sliding rod;

[0013] Four end wheel axles and four steering wheel axles are rotatably mounted on the test base plate, end pulleys are fixedly mounted on the end wheel axles, and steering pulleys are fixedly mounted on the steering wheel axles. The end pulleys and the steering pulleys are connected through the same synchronous belt. A motor bracket is fixedly mounted on the test base plate, and a servo motor is fixedly mounted on the motor bracket. The output shaft of the servo motor is fixedly connected to the upper end of one of the steering wheel axles;

[0014] The sliding rod and the synchronous belt are fixedly connected via a connecting block.

[0015] Wherein, the clamp is made of rubber material.

[0016] Wherein, both sides of the clamping opening are arranged to be inclined outwards.

[0017] In summary, the integrated circuit testing device has the advantages of being able to improve positioning accuracy, thereby improving testing efficiency, and having high stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 The figure is a structural diagram of an integrated circuit testing device according to the present invention.

[0019] Figure 2 for Figure 1 Schematic diagram of the structure after removing the pallet.

[0020] Figure 3 for Figure 2 Schematic diagram of another orientation after removing the test base plate.

[0021] Figure 4Schematic diagram of the slide, clamping block and chuck. DETAILED DESCRIPTION

[0022] The present invention is further described in detail below with reference to the accompanying drawings. In the description of the present invention, it should be understood that the directions or positional relationships indicated by directional terms such as "upper, lower" and "top, bottom" are generally based on the directions or positional relationships shown in the accompanying drawings and are intended only to facilitate the description of the present invention and simplify the description. Unless otherwise indicated, these directional terms do not indicate or imply that the devices or components referred to must have a specific direction or be constructed and operated in a specific direction, and therefore should not be understood as limiting the scope of protection of the present invention; the directional terms "inside" and "outside" refer to the inside and outside relative to the outline of each component itself.

[0023] like Figure 1-4 As shown, an integrated circuit testing device includes a test base plate 1 and a rectangular frame 2 fixedly mounted on the test base plate;

[0024] A support plate 3 is provided in the rectangular frame, and a lifting structure for driving the support plate to move up and down is installed on the test base plate;

[0025] The rectangular frame includes four frame plates, each of which is provided with a sliding groove 4 extending vertically therethrough, in which a slide plate 5 is slidably fitted, and a plurality of spaced clamping blocks 6 are fixed to one side of the slide plate, and a clamping head 7 is fixed to the end of the clamping block, and the clamping head has a clamping opening, and the frame plate has a clearance opening in communication with the sliding groove opposite the clamping head;

[0026] The test base plate is provided with a synchronization structure for driving the four slides to move synchronously.

[0027] In this way, a test device is placed at the test station. When testing an integrated circuit, the integrated circuit is placed in a rectangular frame, and the pallet supports the integrated circuit. Then, the synchronous structure drives the four slides to move inward synchronously. The slides drive the clamping block and the chuck to move inward. The chuck clamps and positions the integrated circuit. After that, the integrated circuit can be functionally tested by the test equipment. After the test is completed, the synchronous structure drives the chuck to move outward synchronously, releasing the clamping of the integrated circuit. Then, the lifting structure drives the pallet to rise, so that the integrated circuit moves to the top of the rectangular frame. The operator can then remove the tested integrated circuit.

[0028] By setting up the synchronous structure, the integrated circuit can be clamped synchronously in four directions, which improves the accuracy and further improves the efficiency of subsequent testing.

[0029] During implementation, the lifting structure includes four cylinders 8 fixedly mounted on the test base plate and arranged in a rectangular shape, with cylinder rods of the cylinders facing upward and fixedly connected to the support plate. The cylinders drive the support plate to move and achieve lifting of the support plate.

[0030] During implementation, the synchronization structure includes a connecting plate 9 fixedly mounted on the lower end of the slide, a sliding rod 10 is vertically fixed to the connecting plate, and a sliding hole is provided on the frame plate for sliding engagement with the sliding rod;

[0031] Four end axles and four steering axles are rotatably mounted on the test base plate, end pulleys 11 are fixedly mounted on the end axles, and steering pulleys 12 are fixedly mounted on the steering axles. The end pulleys and the steering pulleys are connected by the same synchronous belt 13. A motor bracket is fixedly mounted on the test base plate, and a servo motor 14 is fixedly mounted on the motor bracket. The output shaft of the servo motor is fixedly connected to the upper end of one of the steering axles;

[0032] The sliding rod and the synchronous belt are fixedly connected via a connecting block.

[0033] In this way, the servo motor drives one of the steering wheel shafts to rotate, and then drives the steering pulley and the end pulley to rotate through the synchronous belt, and drives the slide rod to move through the synchronous belt to achieve synchronous movement of the four slides.

[0034] During implementation, the clamp is made of rubber material, which can avoid damaging the integrated circuit and better ensure the quality of the integrated circuit.

[0035] During implementation, the two sides of the clamping opening are tilted outwards, so as to improve the positioning accuracy when clamping the integrated circuit.

[0036] Finally, it should be noted that those skilled in the art may make various modifications and variations to the present invention without departing from the spirit and scope of the present invention. Thus, if such modifications and variations fall within the scope of the claims and their equivalents, the present invention is intended to include such modifications and variations.

Claims

1. An integrated circuit testing device, characterized in that: It includes a test base plate and a rectangular frame fixedly mounted on the test base plate; A support plate is provided in the rectangular frame, and a lifting structure for driving the support plate to be lifted and lowered is installed on the test base plate; The rectangular frame includes four frame plates, each of which is provided with a sliding groove extending vertically therethrough, a slide plate being slidably fitted in the sliding groove, a plurality of spaced clamping blocks being fixed to one side of the slide plate, a clamping head being fixed to the end of the clamping block, the clamping head being provided with a clamping opening, and a clearance opening communicating with the sliding groove being provided on the frame plate opposite the clamping head; The test base plate is provided with a synchronization structure for driving the four slides to move synchronously.

2. The integrated circuit testing device according to claim 1, wherein: The lifting structure includes cylinders fixedly mounted on the test base plate. Four cylinders are provided and arranged in a rectangular shape. Cylinder rods of the cylinders are arranged upward and fixedly connected to the supporting plate.

3. The integrated circuit testing device according to claim 2, wherein: The synchronization structure includes a connecting plate fixedly mounted on the lower end of the slide plate, a sliding rod is vertically fixed to the connecting plate, and the frame plate is provided with a sliding hole that is slidably engaged with the sliding rod; Four end wheel axles and four steering wheel axles are rotatably mounted on the test base plate, end pulleys are fixedly mounted on the end wheel axles, and steering pulleys are fixedly mounted on the steering wheel axles. The end pulleys and the steering pulleys are connected through the same synchronous belt. A motor bracket is fixedly mounted on the test base plate, and a servo motor is fixedly mounted on the motor bracket. The output shaft of the servo motor is fixedly connected to the upper end of one of the steering wheel axles; The sliding rod and the synchronous belt are fixedly connected via a connecting block.

4. The integrated circuit testing device according to claim 1, wherein: The clamping head is made of rubber material.

5. The integrated circuit testing device according to claim 1, wherein: The two sides of the clamping opening are arranged to be inclined outwards.

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