Concave surface defect identification device of lamp cover plate

Abstract

The embodiment of the utility model discloses a concave surface defect identification device of a lamp cover plate. The concave surface defect identification device comprises a concave surface image acquisition module, an annular light source illumination module, a backlight source illumination module and a concave surface defect identification module, the annular light source lighting module and the backlight source lighting module are located on the two opposite sides of a to-be-detected cover plate respectively, the concave image obtaining module is located on the side, away from the to-be-detected cover plate, of the annular light source lighting module, and the central axes of the to-be-detected cover plate, the annular light source lighting module, the backlight source lighting module and the concave image obtaining module are located on the same straight line. The concave surface of the to-be-detected cover plate faces the concave surface image acquisition module; light rays emitted by the annular light source illumination module obliquely irradiate the concave surface of the cover plate to be detected, and light rays emitted by the backlight source illumination module uniformly irradiate the convex surface of the cover plate to be detected. According to the concave surface defect identification device, the defect on the concave surface of the lamp cover plate can be rapidly, reliably and accurately identified, and the identification efficiency and accuracy of the defect are effectively improved.

Description

Technical Field

[0001] The embodiment of the utility model relates to the field of visual imaging technology, and in particular to a device for identifying concave surface defects of a lamp cover. Background Art

[0002] During the production of lamp covers, various defects are unavoidable due to equipment and process limitations, affecting the performance and lifespan of the final product. Therefore, before the lamp covers are officially put into use, a defect detection process must be introduced to prevent defective lamp covers from affecting the final performance of the entire product and causing irreparable losses.

[0003] Currently, defect detection for lamp covers is often achieved through manual or mechanical inspection. Manual inspection introduces unnecessary additional steps into production and assembly, hindering the implementation of fully automated production and assembly. It also increases labor costs. Furthermore, manual inspection is slow, making online testing impossible. Its reliability cannot be guaranteed, and it is prone to human error. Mechanical inspection is difficult to detect smaller defects through direct photography. Furthermore, lamp cover defects vary widely, making it impossible to detect all of them using a single mechanical inspection system. This makes the process difficult and lacks versatility. Utility Model Content

[0004] The embodiment of the present utility model provides a device for identifying concave surface defects of a lamp cover, which can quickly, reliably and accurately identify concave surface defects of the lamp cover, thereby effectively improving the performance and life of the lamp cover and the overall product.

[0005] The embodiment of the utility model provides a concave surface defect recognition device for a lamp cover, comprising a concave surface image acquisition module, a ring light source lighting module, a backlight lighting module and a concave surface defect recognition module;

[0006] The annular light source lighting module and the backlight source lighting module are respectively located on two sides of the cover plate to be inspected, away from each other; the concave surface image acquisition module is located on a side of the annular light source lighting module away from the cover plate to be inspected; the central axis of the cover plate to be inspected, the annular light source lighting module, the backlight source lighting module and the concave surface image acquisition module are located on the same straight line, and the concave surface of the cover plate to be inspected faces the concave surface image acquisition module;

[0007] The concave surface defect recognition module is electrically connected to the concave surface image acquisition module;

[0008] The light emitted by the annular light source illumination module is obliquely irradiated on the concave surface of the cover plate to be inspected, and the light emitted by the backlight source illumination module is uniformly irradiated on the convex surface of the cover plate to be inspected.

[0009] Optionally, the annular light source lighting module includes an annularly arranged substrate and a plurality of lamp beads;

[0010] The annular layout base plate is arranged obliquely, and the height of the annular layout base plate on the side corresponding to the central axis of the cover plate to be inspected is higher than the height of the annular layout base plate on the side corresponding to the central axis away from the cover plate to be inspected;

[0011] Each of the lamp beads is arranged on a side of the annular layout base plate close to the cover plate to be inspected, and the light emitted by each of the lamp beads is inclined toward the concave surface of the cover plate to be inspected.

[0012] Optionally, the lamp beads are distributed at different positions of the annular layout substrate, and the angle between the illumination angle of each lamp bead and the first plane is 60°; wherein, the first plane is perpendicular to the straight line corresponding to the central axis of the cover plate to be inspected.

[0013] Optionally, the plurality of lamp beads include a plurality of groups of lamp beads, the projections of each group of lamp beads on the annular layout substrate are arranged in a circular pattern, and the centers of the circles formed by the projections of each group of lamp beads on the annular layout substrate coincide with each other.

[0014] Optionally, the lamp beads include white point light sources with a color temperature range of 6450-6550K.

[0015] Optionally, the annular light source lighting module includes a first inner diameter and a first outer diameter, and the cover plate to be inspected includes a second outer diameter;

[0016] The first inner diameter is smaller than the first outer diameter, and the first inner diameter is larger than the second outer diameter.

[0017] Optionally, in the straight line direction corresponding to the central axis of the cover plate to be inspected, the distance between the concave surface of the cover plate to be inspected and the concave surface image acquisition module ranges from 200 mm to 260 mm.

[0018] Optionally, in the straight line direction corresponding to the central axis of the cover plate to be inspected, the distance between the concave surface of the cover plate to be inspected and the annular light source illumination module ranges from 30 mm to 90 mm.

[0019] Optionally, in the straight line direction corresponding to the central axis of the cover plate to be inspected, the distance between the concave surface of the cover plate to be inspected and the backlight illumination module ranges from 0 to 60 mm.

[0020] Optionally, the concave surface image acquisition module includes a camera and a lens;

[0021] The camera is electrically connected to the concave surface defect recognition module, the lens is mounted on the camera, and the lens is located on a side of the camera close to the annular light source lighting module.

[0022] An embodiment of the utility model provides a concave surface defect recognition device for a lamp cover, which includes a concave surface image acquisition module, a ring light source lighting module, a backlight source lighting module and a concave surface defect recognition module; the ring light source lighting module and the backlight source lighting module are respectively located on two sides of the cover plate to be inspected that are away from each other, and the concave surface image acquisition module is located on a side of the ring light source lighting module away from the cover plate to be inspected, and the central axes of the cover plate to be inspected, the ring light source lighting module, the backlight source lighting module and the concave surface image acquisition module are located on the same straight line, and the concave surface of the cover plate to be inspected faces the concave image acquisition module; the concave surface defect recognition module is electrically connected to the concave surface image acquisition module; the light emitted by the ring light source lighting module is obliquely irradiated on the concave surface of the cover plate to be inspected, and the light emitted by the backlight source lighting module is uniformly irradiated on the convex surface of the cover plate to be inspected. The concave surface defect recognition device reasonably arranges the positions of the cover plate to be inspected, the annular light source lighting module, the backlight source lighting module and the concave surface image acquisition module, and the light emitted by the annular light source lighting module is obliquely irradiated on the concave surface of the cover plate to be inspected, and the light emitted by the backlight source lighting module is evenly irradiated on the convex surface of the cover plate to be inspected. The light emitted by the annular light source lighting module and the backlight source lighting module can both cover the surface of the cover plate to be inspected, and the concave surface image acquisition module can receive the light reflected by the concave surface of the cover plate to be inspected, and then the concave surface defect recognition module recognizes the defects on the concave surface of the cover plate to be inspected, which is conducive to quickly, reliably and accurately realizing the recognition of defects on the concave surface of the lamp cover plate, effectively improving the recognition efficiency and accuracy of defects on the concave surface of the lamp cover plate, simple operation, easy use, saving the recognition time of defects on the concave surface of the lamp cover plate, and improving the service performance and life of the lamp cover plate and the overall product. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0024] Figure 1 This is a schematic structural diagram of a device for identifying concave surface defects of a lamp cover provided by an embodiment of the present utility model;

[0025] Figure 2 This is a schematic cross-sectional view of a ring-shaped light source lighting module provided by an embodiment of the present utility model;

[0026] Figure 3 This is a schematic diagram of the structure of a ring light source lighting module provided by an embodiment of the present utility model when viewed from above;

[0027] Figure 4 and Figure 5It is a schematic image diagram of the concave surface defects of two lamp cover plates provided by the embodiments of the present utility model. DETAILED DESCRIPTION

[0028] The present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are intended only to illustrate the present invention and are not intended to limit the present invention. It should also be noted that, for ease of description, the accompanying drawings only illustrate portions relevant to the present invention, not all of its components.

[0029] The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. It should be noted that the directional words such as "upper", "lower", "left", and "right" described in the embodiments of the present invention are described based on the angles shown in the accompanying drawings and should not be understood as limitations on the embodiments of the present invention. In addition, in the context, it is also necessary to understand that when it is mentioned that an element is formed "on" or "under" another element, it can not only be formed directly "on" or "under" another element, but can also be formed indirectly "on" or "under" another element through an intermediate element. The terms "first", "second", etc. are only used for descriptive purposes and do not indicate any order, quantity or importance, but are only used to distinguish different components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0030] The term "including" and its variations used in the present invention are open inclusions, that is, "including but not limited to". The term "based on" means "based at least in part on". The term "one embodiment" means "at least one embodiment".

[0031] It should be noted that the concepts of "first" and "second" mentioned in this utility model are only used to distinguish the corresponding contents, and are not used to limit the order or mutual dependence.

[0032] It should be noted that the modifications of "one" and "multiple" mentioned in the present invention are illustrative rather than restrictive. Those skilled in the art should understand that unless otherwise clearly indicated in the context, it should be understood as "one or more".

[0033] Figure 1 This is a schematic diagram of the structure of a concave defect recognition device for a lamp cover provided by an embodiment of the present utility model. Figure 1 As shown, the concave surface defect recognition device includes a concave surface image acquisition module 10, a ring light source lighting module 20, a backlight lighting module 40 and a concave surface defect recognition module ( Figure 1(not shown); the annular light source lighting module 20 and the backlight source lighting module 40 are respectively located on two sides of the cover plate to be inspected that are away from each other, and the concave surface image acquisition module 10 is located on the side of the annular light source lighting module 20 away from the cover plate to be inspected 30. The central axis of the cover plate to be inspected 30, the annular light source lighting module 20, the backlight source lighting module 40 and the concave surface image acquisition module 10 are located on the same straight line, and the concave surface of the cover plate to be inspected 30 faces the concave surface image acquisition module 10; the concave surface defect recognition module is electrically connected to the concave surface image acquisition module 10; the light emitted by the annular light source lighting module 20 is obliquely irradiated on the concave surface of the cover plate to be inspected 30, and the light emitted by the backlight source lighting module 40 is uniformly irradiated on the convex surface of the cover plate to be inspected 30.

[0034] Specifically, the concave surface defect identification device can be applied to the process of identifying defects contained in the concave surface of the lamp cover of a 3D glass watch. Exemplarily, the surface of the lamp cover is curved and may include convex and concave surfaces that diverge from each other. Exemplarily, the concave surface of the lamp cover includes an ink area (a black ink area and a white ink area) and a central transparent circular area. Defects contained in the concave surface of the lamp cover may be located in the ink area or the central transparent circular area. Exemplarily, the types of defects contained in the concave surface of the lamp cover include overprinting / overprinting, ink displacement, ink incompleteness, ink discoloration, concave bright printing, dirt, jagged deformation, dot-shaped defects, linear scratches, foreign matter, and chipping. It will be understood that the concave surface defect identification device in this embodiment can not only identify whether there is a defect on the concave surface of the lamp cover, but can also further determine the type of defect contained in the concave surface of the lamp cover. The concave surface defect identification device includes a concave surface image acquisition module 10, a ring light source lighting module 20, a backlight lighting module 40, and a concave surface defect identification module. Among them, the annular light source lighting module 20 and the backlight source lighting module 40 are respectively located on two sides of the cover plate to be inspected that are away from each other, and the concave image acquisition module 10 is located on the side of the annular light source lighting module 20 away from the cover plate to be inspected 30. The concave surface of the cover plate to be inspected faces the concave image acquisition module 10, that is, the concave surface of the cover plate to be inspected 30 faces the annular light source lighting module 20, and the light emitted by the annular light source lighting module 20 can cover the concave surface of the cover plate to be inspected 30, and the light emitted by the backlight source lighting module 40 can cover the convex surface of the cover plate to be inspected 30. In this way, the concave surface of the cover plate 30 to be inspected is covered by the light emitted by the annular light source illumination module 20. The provision of the backlight illumination module 40 also improves the contrast between the image of the concave surface of the cover plate 30 to be inspected and the ambient image, thereby ensuring that defects on the concave surface of the cover plate 30 to be inspected are completely covered by the light emitted by the annular light source illumination module 20. The light reflected by the concave surface of the cover plate 30 to be inspected can also be received by the concave surface image acquisition module 10, which facilitates accurate identification of defects on the concave surface of the cover plate 30 to be inspected. Furthermore, the concave surface defect recognition module is electrically connected to the concave surface image acquisition module 10. The concave surface image acquisition module 10 can transmit the received light reflected by the concave surface of the cover plate 30 to the concave surface defect recognition module in the form of an optical signal, so that the concave surface defect recognition module can subsequently identify and detect the location and type of defects on the concave surface of the cover plate 30 to be inspected based on the optical signal, which also facilitates improving the production quality of the concave surface of the cover plate 30 to be inspected.It is understood that the size of the illumination area of ​​the annular light source illumination module 20 can be determined based on the size of the concave surface of the cover plate 30 to be inspected, the size of the illumination area of ​​the backlight source illumination module 40 can be determined based on the size of the concave surface of the cover plate 30 to be inspected, and the size of the image acquisition field of view of the concave surface image acquisition module 10 can be determined based on the size of the concave surface of the cover plate 30 to be inspected. For example, the illumination area of ​​the annular light source illumination module 20 can be greater than or equal to the area of ​​the concave surface of the cover plate 30 to be inspected, the illumination area of ​​the backlight source illumination module 40 can be greater than or equal to the area of ​​the concave surface of the cover plate 30 to be inspected, and the image acquisition field of view of the concave surface image acquisition module 10 can be greater than or equal to the area of ​​the concave surface of the cover plate 30 to be inspected. In addition, for covers 30 to be inspected with different concave surface areas, the sizes of the illumination area of ​​the annular light source illumination module 20, the illumination area of ​​the backlight source illumination module 40, and the image acquisition field of view of the concave surface image acquisition module 10 can be adjusted accordingly, so that the concave surface defect recognition device in this embodiment is applicable to the recognition process of defects contained in the concave surfaces of the light covers of various 3D glass watches.

[0035] Furthermore, the concave surface image acquisition module 10 is located on the side of the annular light source illumination module 20 away from the cover plate 30 to be inspected. The central axes of the cover plate 30 to be inspected, the annular light source illumination module 20, the backlight illumination module 40, and the concave surface image acquisition module 10 are aligned. The light emitted by the annular light source illumination module 20 is obliquely incident on the concave surface of the cover plate 30 to be inspected, while the light emitted by the backlight illumination module 40 is uniformly illuminated on the convex surface of the cover plate 30 to be inspected. This effectively avoids the situation where the light emitted by the annular light source illumination module 20 is perpendicularly incident on the concave surface of the cover plate 30 to be inspected, resulting in the light reflected from the concave surface of the cover plate 30 to be inspected not being fully received by the coaxially arranged concave surface image acquisition module 10. This also avoids the situation where the image corresponding to the concave surface of the cover plate 30 to be inspected has a low contrast with the surrounding image, thereby avoiding the problem of low recognition accuracy of defects on the concave surface of the cover plate 30 to be inspected, and further improving the clarity of the image captured of defects on the concave surface of the cover plate 30 to be inspected. It should be noted that the central axes of the cover plate to be inspected 30, the annular light source illumination module 20, the backlight illumination module 40, and the concave image acquisition module 10 are coaxially arranged. For example, the central axis of the cover plate to be inspected 30 can be understood as a central axis that is parallel to or approximately parallel to the thickness direction of the cover plate to be inspected 30, and the shape of the cover plate to be inspected 30 is symmetrical about this central axis. For example, the central axis of the annular light source illumination module 20 can be understood as a central axis that is parallel to or approximately parallel to the thickness direction of the annular light source illumination module 20, and the shape of the annular light source illumination module 20 is symmetrical about this central axis. For example, the central axis of the backlight illumination module 40 can be understood as a central axis that is parallel to or approximately parallel to the thickness direction of the backlight illumination module 40, and the shape of the backlight illumination module 40 is symmetrical about this central axis. For example, the central axis of the concave image acquisition module 10 can be understood as a central axis parallel to or approximately parallel to the thickness direction of the concave image acquisition module 10, and the shape of the concave image acquisition module 10 is symmetrical about the central axis. Figure 1 In the figure, a straight line coaxial with the cover plate to be inspected 30, the annular light source lighting module 20, the backlight source lighting module 40 and the concave image acquisition module 10 is represented by a vertical dotted line. The straight line is also the central axis of the cover plate to be inspected 30, the central axis of the annular light source lighting module 20, the central axis of the backlight source lighting module 40 and the central axis of the concave image acquisition module 10, and will not be further described later.

[0036] In addition, illustratively, the cover plate 30 to be inspected can be placed on a carrier substrate. Exemplarily, the carrier substrate can be fixed on a side of the annular light source illumination module 20 away from the concave surface image acquisition module 10, and the carrier substrate can be located between the annular light source illumination module 20 and the backlight illumination module 40. Alternatively, the carrier substrate can be slidably disposed between the annular light source illumination module 20 and the backlight illumination module 40 to drive the position of the cover plate 30 to be inspected to move. Exemplarily, the specific identification process of the concave surface defect identification device can be as follows: first, the cover plate 30 to be inspected is placed on the carrier substrate, and the central axis of the cover plate 30 to be inspected, the annular light source illumination module 20, the backlight illumination module 40, and the concave surface image acquisition module 10 are aligned, and the concave surface of the cover plate 30 to be inspected containing the defect faces the annular light source illumination module 20 and the concave surface image acquisition module 10. Afterwards, the annular light source lighting module 20 and the backlight source lighting module 40 are turned on simultaneously. The light emitted by the annular light source lighting module 20 is obliquely irradiated on the concave surface of the cover plate 30 to be inspected, and the light emitted by the backlight source lighting module 40 is evenly irradiated on the convex surface of the cover plate 30 to be inspected, so that the light emitted by the annular light source lighting module 20 can cover the entire concave surface of the cover plate 30 to be inspected. The contrast between the image corresponding to the concave surface of the cover plate 30 to be inspected and the environmental image is improved, and the light reflected by the concave surface of the cover plate 30 to be inspected is not affected and is received by the concave surface image acquisition module 10. Among them, since the concave surface of the cover plate 30 to be inspected includes a black ink area and a white ink area, it is necessary to expose the image twice for acquisition. For example, the value corresponding to the first exposure can be 5000μs, and the value corresponding to the second exposure can be 20000μs. In addition, the number of exposures for image acquisition and the exposure value corresponding to each image acquisition can be determined according to actual needs. This embodiment is only an example and is not limited here. Finally, the concave surface defect recognition module can analyze and determine the image of the defects contained in the concave surface of the cover plate 30 to be inspected based on the light reflected by the concave surface of the cover plate 30 to be inspected, so as to facilitate the subsequent determination of the defect type, etc. For example, the defect recognition can be achieved based on the comparison of data such as the shape contour and grayscale difference.

[0037] The technical solution in the embodiment of the utility model is that the concave surface defect recognition device includes a concave surface image acquisition module, a ring light source lighting module, a backlight source lighting module and a concave surface defect recognition module; the ring light source lighting module and the backlight source lighting module are respectively located on two sides of the cover plate to be inspected that are away from each other, and the concave surface image acquisition module is located on the side of the ring light source lighting module away from the cover plate to be inspected, and the central axes of the cover plate to be inspected, the ring light source lighting module, the backlight source lighting module and the concave surface image acquisition module are located on the same straight line, and the concave surface of the cover plate to be inspected faces the concave image acquisition module; the concave surface defect recognition module is electrically connected to the concave surface image acquisition module; the light emitted by the ring light source lighting module is obliquely irradiated on the concave surface of the cover plate to be inspected, and the light emitted by the backlight source lighting module is evenly irradiated on the convex surface of the cover plate to be inspected. The concave surface defect recognition device reasonably arranges the positions of the cover plate to be inspected, the annular light source lighting module, the backlight source lighting module and the concave surface image acquisition module, and the light emitted by the annular light source lighting module is obliquely irradiated on the concave surface of the cover plate to be inspected, and the light emitted by the backlight source lighting module is evenly irradiated on the convex surface of the cover plate to be inspected. The light emitted by the annular light source lighting module and the backlight source lighting module can both cover the surface of the cover plate to be inspected, and the concave surface image acquisition module can receive the light reflected by the concave surface of the cover plate to be inspected, and then the concave surface defect recognition module recognizes the defects on the concave surface of the cover plate to be inspected, which is conducive to quickly, reliably and accurately realizing the recognition of defects on the concave surface of the lamp cover plate, effectively improving the recognition efficiency and accuracy of defects on the concave surface of the lamp cover plate, simple operation, easy use, saving the recognition time of defects on the concave surface of the lamp cover plate, and improving the service performance and life of the lamp cover plate and the overall product.

[0038] Optionally, Figure 2 This is a schematic cross-sectional view of a ring-shaped light source lighting module provided by an embodiment of the present invention. Figure 1 and Figure 2 As shown, the annular light source lighting module 20 includes an annular layout substrate 21 and a plurality of lamp beads 22; the annular layout substrate 21 is arranged at an angle, and the height of the straight line side of the annular layout substrate 21 corresponding to the central axis of the cover plate to be inspected 30 is higher than the height of the straight line side of the annular layout substrate 21 corresponding to the central axis away from the cover plate to be inspected 30; each lamp bead 22 is arranged on a side of the annular layout substrate 21 close to the cover plate to be inspected 30, and the light emitted by each lamp bead 22 is inclined toward the concave surface of the cover plate to be inspected 30.

[0039] Specifically, the annular light source lighting module 20 includes an annular layout substrate 21 and a plurality of lamp beads 22. The annular layout substrate 21 is tilted, and the height of the straight line corresponding to the central axis of the annular layout substrate 21 close to the cover plate 30 to be inspected is higher than the height of the straight line corresponding to the central axis of the annular layout substrate 21 away from the cover plate 30 to be inspected. In other words, the annular layout substrate 21 is an annular cone structure (which can be understood as a trumpet shape), and the middle area surrounded by the annular layout substrate 21 is a hollow area. The light reflected by the concave surface of the cover plate 30 to be inspected can be incident on the concave image acquisition module 10 through the hollow area. Each lamp bead 22 is arranged on the side of the annular layout substrate 21 close to the cover plate 30 to be inspected, and the light emitted by each lamp bead 22 is tilted toward the concave surface of the cover plate 30 to be inspected. In this way, the light emitted by each lamp bead 22 can cover the concave surface of the cover plate 30 to be inspected, which is beneficial to the recognition accuracy of defects contained in the concave surface of the cover plate 30 to be inspected. For example, the lamp beads 22 can be evenly arranged on one side of the annular layout base plate 21 close to the cover plate to be inspected 30. For example, the specification of the annular light source lighting module 20 can be CST-R18060.

[0040] Continue to refer Figure 2 The annular light source lighting module 20 further includes a supporting substrate 23 , which is integrally formed with the annular layout substrate 21 , and the supporting substrate 23 is located on a side of the annular layout substrate 21 close to the concave image acquisition module 10 .

[0041] Optionally, continue to refer to Figure 1 and Figure 2 The lamp beads 22 are distributed at different positions of the annular layout substrate 21, and the angle between the illumination angle of each lamp bead 22 and the first plane is 60°; wherein the first plane is perpendicular to the straight line corresponding to the central axis of the cover plate 30 to be inspected.

[0042] Specifically, the lamp beads 22 are distributed in different directions of the annular layout base plate 21. In this way, the light emitted by each lamp bead 22 can cover the concave surface of the cover plate 30 to be inspected, which is beneficial to the recognition accuracy of defects contained in the concave surface of the cover plate 30 to be inspected. The angle between the illumination angle of each lamp bead 22 and the first plane is 60°. In other words, it can be understood that the light emission angle of each lamp bead 22 is 60°. In addition, the illumination angle of each lamp bead 22 can also be determined according to the area size of the concave surface of the cover plate 30 to be inspected and the distance between the lamp bead 22 and the cover plate 30 to be inspected. This embodiment is only an example and is not limiting.

[0043] Optionally, Figure 3 This is a schematic diagram of the structure of a ring light source lighting module provided by an embodiment of the present utility model when viewed from above. Figure 1 、 Figure 2 and Figure 3As shown, the plurality of lamp beads 22 include a plurality of groups of lamp beads 22 , the projections of each group of lamp beads 22 on the annular substrate 21 are arranged in a circular pattern, and the centers of the circles formed by the projections of the groups of lamp beads 22 on the annular substrate 21 coincide with each other.

[0044] Specifically, the plurality of lamp beads 22 may include multiple groups of lamp beads 22, with the projections of each group of lamp beads 22 on the annular layout substrate 21 being arranged in a circular pattern. That is, the plurality of lamp beads 22 are arranged in rows on a side surface of the annular layout substrate 21 that is close to the cover plate 30 to be inspected. For example, four rows of lamp beads 22 may be provided on a side surface of the annular layout substrate 21 that is close to the cover plate 30 to be inspected, with each row of lamp beads 22 forming a group of lamp beads 22, and the projections of the group of lamp beads 22 on the annular layout substrate 21 being arranged in a circular pattern.

[0045] Optionally, continue to refer to Figure 1 and Figure 2 The lamp bead 22 includes a white point light source with a color temperature range of 6450-6550K. For example, the lamp bead 22 can be an LED lamp with a white light source. For example, the color temperature of the lamp bead 22 can be 6500K.

[0046] Optionally, continue to refer to Figure 1 and Figure 2 The annular light source lighting module 20 includes a first inner diameter D1 and a first outer diameter D2, and the cover plate to be inspected 30 includes a second outer diameter D3; wherein the first inner diameter D1 is smaller than the first outer diameter D2, and the first inner diameter D1 is larger than the second outer diameter D3.

[0047] Specifically, the first inner diameter D1 is smaller than the first outer diameter D2, meaning that the annular layout base plate 21 is a hollow annular structure. The first inner diameter D1 is larger than the second outer diameter D3. This allows the light emitted by the annular light source illumination module 20 to cover the concave surface of the cover plate 30 to be inspected, improving the accuracy of identifying defects contained in the concave surface of the cover plate 30 to be inspected. For example, the first inner diameter D1 can be 126 mm, the first outer diameter D2 can be 180 mm, and the second outer diameter D3 can be 23 mm.

[0048] Optionally, continue to refer to Figure 1 , the backlight illumination module 40 includes a surface light source with relatively high uniformity. Exemplarily, the surface light source can be a square light-emitting surface of 70×70 mm. Exemplarily, the surface light source can be a patch-type lamp bead covered with a reflective surface plus a diffuser structure. Exemplarily, the surface light source can be a white surface light source with a color temperature range of 6450-6550K. Exemplarily, the color temperature of the surface light source can be 6500K. Exemplarily, the specification of the backlight illumination module 40 can be CST-HFS7070-W.

[0049] Optionally, continue to refer to Figure 1In the straight line direction corresponding to the central axis of the cover plate 30 to be inspected, the distance L1 between the concave surface of the cover plate 30 to be inspected and the concave surface image acquisition module 10 is in the range of 200-260 mm.

[0050] Specifically, the distance L1 between the concave surface of the cover plate 30 to be inspected and the concave surface image acquisition module 10 can be understood as the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the concave surface image acquisition module 10 close to the concave surface of the cover plate 30 to be inspected. Alternatively, for example, the distance L1 between the concave surface of the cover plate 30 to be inspected and the concave surface image acquisition module 10 can be understood as the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the concave surface image acquisition module 10 away from the concave surface of the cover plate 30 to be inspected. In this embodiment, the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the concave surface image acquisition module 10 close to the concave surface of the cover plate 30 to be inspected is used as the distance L1 between the concave surface of the cover plate 30 to be inspected and the concave surface image acquisition module 10. For example, the distance L1 between the concave surface of the cover plate 30 to be inspected and the concave image acquisition module 10 in the linear direction corresponding to the central axis of the cover plate 30 to be inspected can be the focal length of the concave image acquisition module 10. That is, the cover plate 30 to be inspected is placed at the focal length position of the concave image acquisition module 10. For example, the distance L1 between the concave surface of the cover plate 30 to be inspected and the concave image acquisition module 10 in the linear direction corresponding to the central axis of the cover plate 30 to be inspected can be 230 mm.

[0051] Optionally, continue to refer to Figure 1 In the straight line direction corresponding to the central axis of the cover plate to be inspected 30, the distance L2 between the concave surface of the cover plate to be inspected 30 and the annular light source lighting module 20 is in the range of 30-90 mm.

[0052] Specifically, the distance L2 between the concave surface of the cover plate 30 to be inspected and the annular light source illumination module 20 can be understood as the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the annular light source illumination module 20 that is close to the concave surface of the cover plate 30 to be inspected. Alternatively, by way of example, the distance L2 between the concave surface of the cover plate 30 to be inspected and the annular light source illumination module 20 can be understood as the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the annular light source illumination module 20 that is away from the concave surface of the cover plate 30 to be inspected. In this embodiment, the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the annular light source illumination module 20 that is close to the concave surface of the cover plate 30 to be inspected is used as the distance L2 between the concave surface of the cover plate 30 to be inspected and the annular light source illumination module 20. It is understood that placing the annular light source illumination module 20 too high or too low will affect the light reflected back to the concave surface image acquisition module 10. Only by placing the annular light source illumination module 20 within a certain appropriate height range can the contrast between the defective area and the intact area be improved, thereby imaging the defects on the concave surface of the cover plate 30 to be inspected. For example, the distance L2 between the concave surface of the cover plate 30 to be inspected and the annular light source illumination module 20, along the straight line corresponding to the central axis of the cover plate 30 to be inspected, can be 60 mm.

[0053] Optionally, continue to refer to Figure 1 In the straight line direction corresponding to the central axis of the cover plate to be inspected 30 , the distance L3 between the concave surface of the cover plate to be inspected 30 and the backlight illumination module 40 ranges from 0 to 60 mm.

[0054] Specifically, the distance L3 between the concave surface of the cover plate 30 to be inspected and the backlight illumination module 40 can be understood as the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the backlight illumination module 40 close to the concave surface of the cover plate 30 to be inspected. Alternatively, for example, the distance L3 between the concave surface of the cover plate 30 to be inspected and the backlight illumination module 40 can be understood as the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the backlight illumination module 40 away from the concave surface of the cover plate 30 to be inspected. In this embodiment, the distance between the top of the concave surface of the cover plate 30 to be inspected and the end of the backlight illumination module 40 close to the concave surface of the cover plate 30 to be inspected is used as the distance L3 between the concave surface of the cover plate 30 to be inspected and the backlight illumination module 40. It is understood that placing the backlight illumination module 40 too high or too low will affect the light reflected back to the concave surface image acquisition module 10. Only by placing the backlight illumination module 40 within a certain appropriate height range can the contrast between the defective area and the intact area be improved, thereby imaging the defects on the concave surface of the cover plate 30 to be inspected. For example, the distance L3 between the concave surface of the cover plate 30 to be inspected and the backlight illumination module 40 in the direction of the line corresponding to the central axis of the cover plate 30 to be inspected can be 30 mm.

[0055] Optionally, continue to refer to Figure 1The concave surface image acquisition module 10 includes a camera 11 and a lens 12; the camera 11 is electrically connected to the concave surface defect recognition module, the lens 12 is mounted on the camera 11, and the lens 12 is located on the side of the camera 11 close to the annular light source lighting module 20.

[0056] Specifically, the concave surface image acquisition module 10 includes a camera 11 and a lens 12. Among them, the lens 12 can adjust the accuracy of the acquired image, such as magnification 5X, 10X, 20X, etc. The camera 11 can receive the light reflected by the concave surface of the cover plate 30 to be inspected, and transmit it to the concave surface defect recognition module, so that the concave surface defect recognition module can identify the position and type of defects on the concave surface of the cover plate 30 to be inspected based on the light signal. Exemplarily, the specifications of the camera 11 can be A5B57MG200, 25 million pixels black and white, and the resolution of the camera 11 can be 5120×5120. Exemplarily, the specifications of the lens 12 can be MFA121-U70, the field of view of the lens 12 can be 35×35mm, and the pixel accuracy of the lens 12 can be 7μm / pix.

[0057] Based on the concave surface defect identification device in this embodiment, Figure 4 and Figure 5 Schematic diagram of the concave surface defects of two lamp covers provided by the embodiment of the present invention. Figure 4 As shown in FIG. 1 , the defect type in the image of the concave surface defect of the lamp cover obtained is concave bright print; Figure 5 As shown in FIG. 1 , the defect type in the image of the concave surface defect of the lamp cover obtained is ink incompleteness. The images of the concave surface defects of the lamp cover corresponding to other defect types are not given one by one.

[0058] Note that the above are only preferred embodiments of the present invention and the technical principles employed. Those skilled in the art will appreciate that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments, combinations, and substitutions are possible for those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments and may include many other equivalent embodiments without departing from the scope of the present invention. The scope of the present invention is determined by the scope of the appended claims.

Claims

1. A device for identifying concave surface defects of a lamp cover, characterized in that: It includes a concave surface image acquisition module, a ring light source lighting module, a backlight lighting module and a concave surface defect recognition module; The annular light source lighting module and the backlight source lighting module are respectively located on two sides of the cover plate to be inspected, away from each other; the concave surface image acquisition module is located on a side of the annular light source lighting module away from the cover plate to be inspected; the central axis of the cover plate to be inspected, the annular light source lighting module, the backlight source lighting module and the concave surface image acquisition module are located on the same straight line, and the concave surface of the cover plate to be inspected faces the concave surface image acquisition module; The concave surface defect recognition module is electrically connected to the concave surface image acquisition module; The light emitted by the annular light source illumination module is obliquely irradiated on the concave surface of the cover plate to be inspected, and the light emitted by the backlight source illumination module is uniformly irradiated on the convex surface of the cover plate to be inspected.

2. The concave surface defect identification device according to claim 1, characterized in that: The annular light source lighting module includes an annularly arranged substrate and a plurality of lamp beads; The annular layout base plate is arranged obliquely, and the height of the annular layout base plate on the side corresponding to the central axis of the cover plate to be inspected is higher than the height of the annular layout base plate on the side corresponding to the central axis away from the cover plate to be inspected; Each of the lamp beads is arranged on a side of the annular layout base plate close to the cover plate to be inspected, and the light emitted by each of the lamp beads is inclined toward the concave surface of the cover plate to be inspected.

3. The concave surface defect identification device according to claim 2, characterized in that: The lamp beads are distributed at different positions of the annular layout substrate, and the angle between the illumination angle of each lamp bead and the first plane is 60°; wherein, the first plane is perpendicular to the straight line corresponding to the central axis of the cover plate to be inspected.

4. The concave surface defect identification device according to claim 2, characterized in that: The plurality of lamp beads include a plurality of groups of lamp beads, the projections of each group of lamp beads on the annular layout substrate are arranged in a circular pattern, and the centers of the circles formed by the projections of the lamp beads of each group on the annular layout substrate coincide with each other.

5. The concave surface defect identification device according to claim 2, characterized in that: The lamp beads include white point light sources with a color temperature range of 6450-6550K.

6. The concave surface defect identification device according to claim 1, characterized in that: The annular light source lighting module comprises a first inner diameter and a first outer diameter, and the cover plate to be inspected comprises a second outer diameter; The first inner diameter is smaller than the first outer diameter, and the first inner diameter is larger than the second outer diameter.

7. The concave surface defect identification device according to claim 1, characterized in that: In the straight line direction corresponding to the central axis of the cover plate to be inspected, the distance between the concave surface of the cover plate to be inspected and the concave surface image acquisition module ranges from 200 mm to 260 mm.

8. The concave surface defect identification device according to claim 1, characterized in that: In the straight line direction corresponding to the central axis of the cover plate to be inspected, the distance between the concave surface of the cover plate to be inspected and the annular light source lighting module ranges from 30 mm to 90 mm.

9. The concave surface defect identification device according to claim 1, characterized in that: In the straight line direction corresponding to the central axis of the cover plate to be inspected, the distance between the concave surface of the cover plate to be inspected and the backlight illumination module ranges from 0 to 60 mm.

10. The concave surface defect identification device according to claim 1, characterized in that: The concave image acquisition module includes a camera and a lens; The camera is electrically connected to the concave surface defect recognition module, the lens is mounted on the camera, and the lens is located on a side of the camera close to the annular light source lighting module.

Images