Matrix type precision resistor resistance value test fixture
By designing a matrix-type precision resistor test fixture, using slide rails and positioning devices to ensure the consistency of the tested products at the test position, and adopting appropriate probe testing methods, the problem of resistance testing in multi-chip resistor products was solved, and precise process control was achieved.
Patent Information
- Application Number
- CN202420743886.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-11
- Publication Date
- 2025-09-09
- Estimated Expiration
- 2034-04-11
AI Technical Summary
The existing technology makes it difficult to perform resistance testing during the semi-finished production process of multi-chip resistor products, especially since the uncertainty of the test position of precision resistors causes the test results to exceed the tolerance range, and the handheld probe method is not easy to achieve precise control of the resistance value of the semi-finished product during the process.
A matrix-type precision resistor test fixture is designed, which uses components such as a base, a slide rail, a positioning device, and a probe holder. The coordination of the positioning needle and the slide rail ensures the consistency of the tested product at the test position. A two-probe or four-probe test method is used, and the test method is selected according to the resistance size to reduce test errors.
It achieves accurate resistance testing of semi-finished products in the manufacturing process of multi-chip resistors, improves test accuracy and consistency, reduces test errors, and meets the resistance control requirements for precision resistors in the manufacturing process.
Smart Images
Figure CN223320431U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of test fixtures in the chip passive component industry, and in particular to a matrix type precision resistor resistance value test fixture. Background Art
[0002] Currently, resistance testing in the resistor industry primarily involves testing individual finished products. Testing semi-finished products during production is more difficult, especially during the multi-piece production process. This makes it difficult to control the resistance of semi-finished products during production. Some products are tested using handheld probes, but for precision resistors, the uncertainty in the test position can be significant enough to cause the product's resistance to exceed tolerance. Therefore, the development of new test fixtures is necessary. Utility Model Content
[0003] Purpose of the utility model: In order to solve the above problems, the utility model provides a matrix type precision resistor resistance test fixture, which solves the accuracy requirements of the resistance test of semi-finished products in the process of multi-chip resistor products and better achieves process control.
[0004] Technical solution: To achieve the above-mentioned purpose, the matrix-type precision resistor resistance test fixture described in the present invention includes a base, a first slide rail located on the top of the base, a movable plate supported on and moving along the first slide rail, a second slide rail located on the top of the movable plate, a product clamping platform supported on and moving along the second slide rail, a probe bracket suspended above the product clamping platform, and a probe extending downward from the probe bracket; the first slide rail and the second slide rail are arranged perpendicular to each other.
[0005] Furthermore, there are provided a first positioning device for positioning the movable plate and a second positioning device for positioning the product clamping platform; the first positioning device is installed on the base and is located on one side of the movable plate and includes a retractable first positioning pin, and a row of first positioning holes at the same height are provided on the side of the movable plate, and the first positioning pin is inserted into a certain first positioning hole to position the movable plate on the first slide rail; the second positioning device is installed on the movable plate and is located on one side of the product clamping platform and includes a retractable second positioning pin, and a row of second positioning holes at the same height are provided on the side of the product clamping platform, and the second positioning pin is inserted into a certain second positioning hole to position the product clamping platform on the second slide rail.
[0006] Furthermore, the spacing between two adjacent first positioning holes is the same as the spacing between the products to be tested on the product clamping platform in the first direction, and the spacing between two adjacent second positioning holes is the same as the spacing between the products to be tested on the product clamping platform in the second direction; the first direction is the extension direction of the first slide rail, and the second direction is the extension direction of the second slide rail.
[0007] Furthermore, the probe bracket and the product clamping platform are made of insulating materials.
[0008] Furthermore, the test probe includes a voltage probe and a current probe.
[0009] Furthermore, it also includes a lifting rod located on one side of the product clamping platform, and the probe bracket is installed on the lifting rod and moves up and down through the lifting rod.
[0010] Furthermore, the product clamping platform is provided with positioning pins in rows and columns for positioning the product to be tested.
[0011] Beneficial effects: Compared with the existing technology, the present invention has the following significant effects: when the measured resistance is aligned with the test probe position, the positioning pin is inserted into the corresponding positioning hole, so that the product clamping platform reaches a steady state on the slide rail; at the same time, the position of the positioning hole is designed according to the spacing of the measured products, ensuring the consistency of the test position of each measured product, and reducing the test error caused by the inconsistency of the test position of each measured product. BRIEF DESCRIPTION OF THE DRAWINGS
[0012] Figure 1 It is a schematic diagram of the structure of the utility model.
[0013] Figure 2 This is a schematic diagram of the probe structure of the two-probe testing method described in the present invention.
[0014] Figure 3 This is a schematic diagram of the probe structure of the four-probe testing method described in the present invention.
[0015] Figure 4 This is a structural schematic diagram of the product clamping platform of the utility model.
[0016] Figure 5 This is a schematic diagram of the second slide rail structure of the present invention.
[0017] Figure 6 This is a schematic diagram of the first slide rail structure of the present utility model.
[0018] Figure 7 This is a structural schematic diagram of the second positioning device of the present invention.
[0019] Figure 8 This is a structural schematic diagram of the first positioning device of the present utility model. DETAILED DESCRIPTION
[0020] This utility model discloses a matrix type precision resistor value test fixture. Figures 1 to 8As shown, the following is a further detailed description of a matrix-type precision resistor resistance test fixture provided by the utility model: a matrix-type precision resistor resistance test fixture includes a base 1, a first slide rail 6 located on the top of the base, a movable plate 8 carried on the first slide rail 6 and moving along the first slide rail, a second slide rail 4 located on the top of the movable plate 8, a product clamping platform 3 carried on the second slide rail 4 and moving along the second slide rail, a probe bracket 2 suspended above the product clamping platform 3, a probe 2-1 extending downward from the probe bracket 2, and a lifting rod 9 located on one side of the product clamping platform 3. The probe bracket 2 is installed on the lifting rod 9 and moves up and down through the lifting rod 9; the first slide rail 6 and the second slide rail 4 are arranged perpendicular to each other; positioning pins 3-1 are arranged in rows and columns on the product clamping platform 3 for positioning The product to be tested; there is also a first positioning device 7 for positioning the movable plate 8, and a second positioning device 5 for positioning the product clamping platform 3. The first positioning device 7 is installed on the base and is located on one side of the movable plate 8 and includes a retractable first positioning pin 7-2. A row of first positioning holes 7-1 located at the same height are provided on the side of the movable plate 8. The first positioning pin 7-2 is inserted into a certain first positioning hole 7-1 to position the movable plate 8 on the first slide rail 6; the second positioning device 5 is installed on the movable plate 8 and is located on one side of the product clamping platform 3 and includes a retractable second positioning pin 5-2. A row of second positioning holes 5-1 located at the same height are provided on the side of the product clamping platform 3. The second positioning pin 5-2 is inserted into a certain second positioning hole 5-1 to position the product clamping platform 3 on the second slide rail 4. The spacing between two adjacent first positioning holes 7-1 is the same as the spacing of the tested products on the product clamping platform 3 in the first direction. The spacing between two adjacent second positioning holes 5-1 is the same as the spacing of the tested products on the product clamping platform 3 in the second direction. The first direction is the extension direction of the first slide rail 6, and the second direction is the extension direction of the second slide rail 4. The tested products are neatly arranged in a matrix, and the product clamping platform 3 is equipped with positioning holes or positioning edges corresponding to the tested products. The position tolerance of the second and first slide rails is ≤0.05mm, and the travel range is 100-200mm, both selected according to the different product sizes. The diameter of the positioning pins is 1-2mm, and the specific size is selected according to the matrix spacing of the tested products. The spacing between the positioning holes is synchronized with the spacing between the tested products. Among them, the base 1 serves as the support of the fixture, and is made of a material with a higher density such as bakelite and synthetic stone. The weight should be within the range of 1 to 2 kg to ensure that the operation of the fixture is not disturbed by vibration; the probe bracket 2 is made of insulating materials such as bakelite, synthetic stone, and acrylic; the product clamping platform 3 is made of insulating materials such as bakelite, synthetic stone, and acrylic to prevent short circuits.
[0021] Different test methods are used according to the resistance of the product being tested: (1) Figure 2As shown, the resistance of the product under test is greater than 1Ω and the two-probe test method is used: the distance between the two electrodes is 2-1: the size of 0805 and above is equal to the inner size of the two electrodes + 0.4mm, that is, the inner margin of the two probes; the size below 0805 is equal to the inner size of the two electrodes + 0.2mm, that is, the inner margin of the two probes. (2) Figure 3 As shown, the resistance of the tested product is less than 1Ω and the four-probe test method is used: the 2-2 spacing between the two electrode probes: for sizes 0805 and above, it is equal to the inner size of the two electrodes + 0.4mm, that is, the inner margin of the two probes; for sizes below 0805, it is equal to the inner size of the two electrodes + 0.2mm, that is, the inner margin of the two probes; the spacing between the current probe and the voltage probe: the minimum spacing is selected while meeting the processing strength of the probe hole, and the center of the voltage and current probes is aligned with the center of the product width.
[0022] The probe holder 2 moves downward, and the test probe contacts the product under test. All columns of a row are tested in sequence. After the last column is tested, the second slide rail 4 is reset to the first column, and the first slide rail 6 is slid to the second row. The test starts from the first column of the second row and continues to the last column in sequence. This process is repeated until all products under test on the product holding platform are tested. The products under test are moved left and right, forward and backward by the first and second slide rails, so that each product under test on the product holding platform 3 is aligned with the position of the test probe. When the measured resistance is aligned with the position of the test probe, the positioning pin on the first slide rail is accurately inserted into the positioning hole by the spring force, so that the product under test reaches a steady state on the slide rail. At the same time, the position of the positioning hole is designed according to the spacing of the products under test, ensuring the consistency of the test position of each product under test and reducing the test error caused by the inconsistency of the test position of each product under test. For products under test with a resistance value of more than 1Ω, a two-probe test method is used, and the probe part structure is simple. For products under test with a resistance value of less than 1Ω, a four-probe test method is used, which reduces the tolerance caused by the test probe contacting the resistance of the product under test and more accurately tests precision low-resistance resistors.
Claims
1. A matrix type precision resistor resistance test fixture, characterized in that: The invention comprises a base (1), a first slide rail (6) located on the top of the base, a movable plate (8) supported on the first slide rail (6) and moving along the first slide rail, a second slide rail (4) located on the top of the movable plate (8), a product clamping platform (3) supported on the second slide rail (4) and moving along the second slide rail, a probe bracket (2) suspended above the product clamping platform (3), and a probe (2-1) extending downward from the probe bracket (2); the first slide rail (6) and the second slide rail (4) are arranged perpendicular to each other, and are provided with a first positioning device (7) for positioning the movable plate (8) and a second positioning device (5) for positioning the product clamping platform (3); the first positioning device (7) is installed on the base and is located at One side of the movable plate (8) includes a retractable first positioning pin (7-2), and the side of the movable plate (8) is provided with a row of first positioning holes (7-1) located at the same height. The first positioning pin (7-2) is inserted into a certain first positioning hole (7-1) to position the movable plate (8) on the first slide rail (6); the second positioning device (5) is installed on the movable plate (8) and is located on one side of the product clamping platform (3) and includes a retractable second positioning pin (8-2), and the side of the product clamping platform (3) is provided with a row of second positioning holes (8-1) located at the same height. The second positioning pin (8-2) is inserted into a certain second positioning hole (8-1) to position the product clamping platform (3) on the second slide rail (4).
2. The matrix type precision resistor resistance test fixture according to claim 1, characterized in that: The spacing between two adjacent first positioning holes (7-1) is the same as the spacing between the tested products arranged on the product clamping platform (3) in the first direction, and the spacing between two adjacent second positioning holes (8-1) is the same as the spacing between the tested products arranged on the product clamping platform (3) in the second direction; the first direction is the extension direction of the first slide rail (6), and the second direction is the extension direction of the second slide rail (4).
3. The matrix type precision resistor value test fixture according to claim 1 or 2, characterized in that: The probe bracket (2) and the product clamping platform (3) are made of insulating materials.
4. The matrix type precision resistor resistance test fixture according to claim 1 or 2, characterized in that: The probes include a voltage probe and a current probe.
5. The matrix type precision resistor resistance test fixture according to claim 1 or 2, characterized in that: It also includes a lifting rod (9) located on one side of the product clamping platform (3), and the probe bracket (2) is installed on the lifting rod (9) and moves up and down through the lifting rod (9).
6. The matrix type precision resistor resistance test fixture according to claim 3, characterized in that: Positioning pins (3-1) are arranged in rows and columns on the product clamping platform (3) for positioning the product to be tested.