Test fixture

Abstract

The utility model provides a test fixture, and relates to the field of circuit board testing. The test fixture comprises an upper needle carrier plate, an upper frame, a lower needle carrier plate, a lower frame and a connecting member, and the upper frame is detachably connected above the upper needle carrier plate; the lower needle carrier plate is positioned below the upper needle carrier plate and is used for bearing a to-be-tested piece; the lower frame is detachably connected below the lower needle carrier plate; the upper needle carrier plate is detachably assembled with the lower needle carrier plate in a limiting manner through the positioning piece, so that a to-be-tested piece is limited between the upper needle carrier plate and the lower needle carrier plate; the connecting component is located below the lower frame, the connecting component comprises a PCB, a plurality of connectors inserted into the top surface of the PCB and an interface contact assembly with a plurality of elastic ejector pins, one end of each elastic ejector pin is electrically connected to the bottom surface of the PCB, and the other end of each elastic ejector pin is electrically connected to the interface contact; the connecting end of the to-be-tested piece is detachably connected with the connector in a pluggable mode. By adopting the scheme, the cost can be saved, and the working time and time consumption of wire harness cleaning by a winding worker are reduced.

Description

Technical Field

[0001] The present disclosure relates to the field of circuit board testing, and in particular to a test fixture. Background Art

[0002] An essential fixture in the laptop motherboard production process is the ATE (Automatic Test Equipment) jig, used to test the functional integrity of the integrated circuits on the PCB. This jig requires exceptionally high precision and is extremely challenging to design and develop. Currently, only a dozen or so companies in the industry can fully develop this fixture independently. To monopolize their customer base, each company has different standards for the framework, making each jig custom-developed. This represents over 20% of all laptop manufacturers' annual jig costs. This inability to reuse existing jigs creates significant cost pressure for end-user factories. The jig framework itself accounts for over 20% of the total cost of the jig. Utility Model Content

[0003] The present disclosure provides a test fixture to at least solve the above technical problems existing in the prior art.

[0004] According to a first aspect of the present disclosure, a test fixture is provided, comprising: an upper needle carrier plate, an upper frame, a lower needle carrier plate, a lower frame and a connecting member, wherein the upper frame is detachably connected to the upper portion of the upper needle carrier plate; the lower needle carrier plate is located below the upper needle carrier plate and is used to carry a piece to be tested; the lower frame is detachably connected to the lower portion of the lower needle carrier plate; the upper needle carrier plate is assembled with the lower needle carrier plate in a detachable position via a positioning member to limit the piece to be tested between the two; the connecting member is located below the lower frame, and the connecting end of the piece to be tested is detachably plugged and unplugged electrically connected to at least part of the structure of the connecting member.

[0005] In one embodiment, the connecting component includes a PCB board, a plurality of connectors plugged into the top surface of the PCB board, and an interface contact assembly with a plurality of elastic ejector pins, one end of each elastic ejector pin is electrically connected to the bottom surface of the PCB, and the other end of each elastic ejector pin is electrically connected to the interface contact; the connection end of the test piece is detachably plugged into and connected to the connector.

[0006] In one embodiment, the connecting component further includes an interface board, and the lower needle carrier board is electrically connected to the interface board via the PCB board.

[0007] In one possible implementation manner, the interface plate is located between the elastic ejector pins and the interface contacts, and the elastic ejector pins are plugged between the PCB board and the interface plate.

[0008] In one embodiment, the elastic ejector pin includes an interface pin and a probe-type connector connected above the interface pin.

[0009] In one embodiment, the probe connector is connected to the bottom surface of the PCB board.

[0010] In one possible implementation manner, the connector on the PCB board adopts a plug-in female socket.

[0011] In one embodiment, a through hole for plugging and unplugging wires is formed in the middle of the lower frame, and the projected area of ​​the through hole along its own axial direction is larger than the projected area of ​​the connecting member along its own height direction.

[0012] In one embodiment, the lower frame is provided with a vertical panel enclosure around its periphery, an installation gap is left between the vertical panel enclosure located at the front side and the work surface, and the connecting member is provided below the lower frame through the installation gap.

[0013] In one embodiment, the upper frame is detachably enclosed by a plurality of mounting plates to form a closed frame structure.

[0014] The test fixture disclosed herein utilizes an upper needle carrier plate, a lower needle carrier plate, and a connecting member with a connector to facilitate the testing application of the DUT. The components of the overall test fixture can be assembled and disassembled, which reduces the overall fixture cost, saves fixture delivery time, and can match the testing applications of different models of DUTs.

[0015] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and other objects, features and advantages of the exemplary embodiments of the present disclosure will become readily understood by reading the detailed description below with reference to the accompanying drawings, in which several embodiments of the present disclosure are shown by way of example and not limitation, wherein:

[0017] In the drawings, the same or corresponding reference numerals denote the same or corresponding parts.

[0018] Figure 1 A schematic diagram of the overall axial structure of the test fixture according to an embodiment of the present disclosure is shown;

[0019] Figure 2 A schematic cross-sectional view of a connecting member in a test fixture according to an embodiment of the present disclosure is shown;

[0020] Figure 3 A schematic diagram of the assembly structure of the lower frame and connecting components of the test fixture according to an embodiment of the present disclosure is shown;

[0021] Figure 4A schematic cross-sectional structure diagram of an elastic ejector pin in a test fixture according to an embodiment of the present disclosure is shown.

[0022] Description of the numbers in the figure:

[0023] 001-test fixture; 10-upper needle carrier; 20-upper frame; 30-lower needle carrier; 40-part to be tested; 50-lower frame; 60-connecting component; 51-via position; 52-vertical plate enclosure; 61-PCB board; 62-connector; 63-elastic ejector pin; 631-interface pin; 632-probe connector; 64-interface contact; 65-interface board. DETAILED DESCRIPTION

[0024] To make the purposes, features, and advantages of the present disclosure more apparent and understandable, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present disclosure without creative work shall fall within the scope of protection of the present disclosure.

[0025] With the widespread use of electronic devices, the public's demand for them is increasing. Electronic devices include desktop computers, laptops, flat-panel display devices, and mobile devices. Laptops, with their ease of use, are often the preferred choice for mobile office work. The production process for existing laptops requires a series of production tests to ensure stable overall device performance. Signal testing is a fundamental step, but existing jigs for testing the functional integrity of integrated circuits on PCBs are expensive, requiring additional man-hours to clean the wiring harnesses.

[0026] To alleviate the above problems, refer to Figures 1-4 The embodiment of the present disclosure provides a test fixture 001, which can save fixture costs and is convenient for assembly and disassembly.

[0027] Specifically, the test fixture 001 includes: an upper needle carrier plate 10, a lower needle carrier plate 30 and a connecting member 60 located below the lower needle carrier plate 30, wherein the part to be tested 40 is located on the lower needle carrier plate 30, and the lower needle carrier plate 30 is located below the upper needle carrier plate 10. The upper needle carrier plate 10 can be assembled with the lower needle carrier plate 30 in a detachable position through a positioning member to limit the part to be tested 40 between the two. Furthermore, considering the convenient operation of the test fixture 001, the test fixture 001 also includes an upper frame 20 and a lower frame 50. The upper frame 20 is detachably connected to the upper part of the upper needle carrier 10, and the upper frame 20 can drive the upper needle carrier 10 to move toward or away from the lower needle carrier 30; the lower frame 50 is detachably connected to the lower part of the lower needle carrier 30, and the lower frame 50 is used to support the lower needle carrier 30, and the lower frame 50 is pre-set with a reserved space for the passage of wires. In this way, the test piece 40 can be electrically plugged and unplugged with the connecting member 60 through the reserved space.

[0028] The upper and lower needle carriers 10 and 30 serve as signal transmission carriers, while the upper frame 20 connects to the upper needle carrier 10 and is insulated. The lower frame 50 connects to the lower needle carrier 30 and is insulated. Furthermore, the lower frame 50 provides a path for the wiring harness connecting to the device under test 40. Therefore, the lower frame 50 has a hollow structure to facilitate the direct passage of the wiring harness.

[0029] The test fixture 001 disclosed in the present invention has a convenient structure and is easy to assemble and disassemble, and can alleviate the problems of redundant wire accumulation and high fixture cost in the prior art.

[0030] Specifically, the connecting member 60 includes a PCB board 61 and a plurality of connectors 62 plugged into the top surface of the PCB board 61. The connecting member 60 is detachably plugged and electrically connected to the connection end of the test piece 40 through the connector 62 provided on itself. Exemplarily, the connector 62 adopts a standard connector 62 that matches the connection end of the test piece 40. Exemplarily, the connector 62 adopts a plug-in female socket. In this way, it can adapt to the plug-in connection of different models of the test piece 40. In addition, the connecting member 60 also includes an interface contact 64 assembly with a plurality of elastic ejector pins 63, one end of each elastic ejector pin 63 is electrically connected to the bottom surface of the PCB, and the other end of each elastic ejector pin 63 is electrically connected to the interface contact 64; in this way, each elastic ejector pin 63 can be connected in real time with the connector 62 on the corresponding PCB board 61 and the connection end of the test piece 40 to complete the circuit board testing process.

[0031] Considering the structural stability of the connecting member 60, the connecting member 60 of the disclosed embodiment also includes an interface plate 65. The lower needle carrier 30 is electrically connected to the interface plate 65 via the PCB board 61. The interface plate 65 is located between the ejector pins and the interface contacts 64, and the ejector pins are plugged between the PCB board 61 and the interface plate 65. In this way, the lower needle carrier 30 is connected to the connector 62 (i.e., the female socket) on the PCB board 61 via the horns and the flat cable, and then connected to the interface plate 65 via the elastic ejector pins 63. In actual work, the winder only needs to wind the lower needle carrier 30, and one end of the interface plate 65 only needs to plug and unplug the horn. The test machine frame only needs to unplug the horn to achieve the sharing of various types of DUTs 40.

[0032] The plug-in female socket and the elastic ejector pin 63 are both welded to the top and bottom surfaces of the PCB board 61 during the assembly process.

[0033] Specifically, the elastic ejector pin 63 includes an interface pin 631 and a probe-type connector 632 connected above the interface pin 631. The interface pin 631 is electrically connected to the PCB board 61 through the probe-type connector 632. The overall structural performance is highly stable.

[0034] It should be noted that the probe connector 632 is connected to the bottom surface of the PCB 61, and the female connector is connected to the top surface of the PCB 61. Test signals can communicate with the connection end of the device under test 40 through the interface pins 631, the probe connector 632, the PCB 61, and the female connector, thus smoothly performing signal testing. This overall structure avoids the problem of the prior art where the lower frame 50 and the lower pin carrier 30 are directly connected by wires, requiring time-consuming disassembly, cleaning, and rewinding of the wires.

[0035] In order to realize the direct plugging and unplugging of the wiring harness, a through-hole position 51 for plugging and unplugging wires is provided in the middle of the lower frame 50. The embodiment of the present disclosure does not limit the shape and number of the through-hole position 51. For example, the through-hole position 51 can adopt an integral large-hole structure, or, depending on the degree of aggregation of the plugging and unplugging positions, it is considered to set the through-hole position 51 as a plurality of spaced holes. Furthermore, the projected area of ​​the through-hole position 51 along its own axial direction is larger than the projected area of ​​the connecting member 60 along its own height direction. In this way, the connecting member 60 can remain directly below the lower frame 50, and the connector 62 on the connecting member 60 is always located directly below the lower frame 50, which is convenient for the immediate plugging and unplugging of the wiring harness, and no extra time is required to clean the wiring harness.

[0036] In addition, the lower frame 50 is surrounded by a vertical panel enclosure 52. A mounting gap is left between the vertical panel enclosure 52 on the front side and the work surface. The connecting member 60 is installed below the lower frame 50 through the mounting gap. This mounting gap is highly related to the installation space of the connecting member 60 and is determined according to actual application requirements.

[0037] When applying the test fixture 001 of the embodiment of the present disclosure, considering the complete stability of the entire device, the upper frame 20 is detachably enclosed by multiple mounting plates to form a closed frame structure, which facilitates the disassembly and maintenance of various components and has low assembly costs.

[0038] In summary, the test fixture 001 of the embodiment of the present disclosure, which uses the upper needle carrier plate 10, the lower needle carrier plate 30 and the connecting member 60 with the connector 62, can facilitate the test application of the device under test 40. The components of the overall test fixture 001 can be assembled and disassembled, which reduces the overall fixture cost, saves fixture delivery time, and can match the test applications of different models of devices under test 40.

[0039] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in this disclosure can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions of this disclosure can be achieved. This is not a limitation herein.

[0040] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. Throughout the present disclosure, "plurality" means two or more, unless otherwise specifically defined.

[0041] The above description is merely a specific embodiment of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this disclosure should be included in the scope of protection of the present disclosure. Therefore, the scope of protection of the present disclosure should be based on the scope of protection of the claims.

Claims

1. A test fixture, characterized in that: include: Upper needle carrier plate; an upper frame, the upper frame being detachably connected to the upper needle carrier plate; A lower needle carrier plate, located below the upper needle carrier plate, for carrying a piece to be tested; a lower frame, the lower frame being detachably connected to the lower needle carrier plate; The upper needle carrier plate is assembled with the lower needle carrier plate in a detachable limiting manner via a positioning member, so as to limit the workpiece to be tested between the upper needle carrier plate and the lower needle carrier plate; The connecting member is located below the lower frame, and the connecting end of the test piece is electrically connected to at least a portion of the connecting member in a detachable pluggable manner.

2. The test fixture according to claim 1, characterized in that: The connecting component includes a PCB board, multiple connectors plugged into the top surface of the PCB board, and an interface contact assembly with multiple elastic ejector pins, one end of each elastic ejector pin is electrically connected to the bottom surface of the PCB, and the other end of each elastic ejector pin is electrically connected to the interface contact; the connection end of the test piece is detachably plugged into and connected to the connector.

3. The test fixture according to claim 2, characterized in that: The connecting component further includes an interface board, and the lower needle carrier board is electrically connected to the interface board through the PCB board.

4. The test fixture according to claim 3, characterized in that: The interface board is located between the elastic ejector pins and the interface contacts, and the elastic ejector pins are plugged between the PCB board and the interface board.

5. The test fixture according to claim 2, characterized in that: The elastic ejector pin includes an interface pin and a probe-type connector connected above the interface pin.

6. The test fixture according to claim 5, characterized in that: The probe type connector is connected to the bottom surface of the PCB board.

7. The test fixture according to claim 2, wherein: The connector on the PCB board adopts a plug-in female socket.

8. The test fixture according to claim 1, wherein: A through hole for plugging and unplugging wires is formed in the middle of the lower frame, and the projection area of ​​the through hole along its own axial direction is larger than the projection area of ​​the connecting member along its own height direction.

9. The test fixture according to claim 1, wherein: The lower frame is provided with a vertical plate enclosure around its periphery, and an installation gap is left between the vertical plate enclosure located at the front side and the work surface, and the connecting member is provided below the lower frame through the installation gap.

10. The test fixture according to claim 1, wherein: The upper frame is detachably enclosed by a plurality of mounting plates to form a closed frame structure.

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