Novel IGBT (Insulated Gate Bipolar Translator) module electrical contact test fixture

Abstract

The utility model discloses a novel IGBT module electrical contact test fixture. The novel IGBT module electrical contact test fixture comprises a bearing plate used for bearing a tested IGBT module; the lateral electrical switching structure is formed on the upper edge of the bearing plate and used for being electrically connected with lateral contacts of the tested IGBT module, switching the lateral contacts of the tested IGBT module into front contacts and limiting the maximum distance of the tested IGBT module moving towards the upper edge on the bearing plate. The two positioning pieces are formed on the two sides of the lateral electrical switching structure and are used for positioning the tested IGBT module; the front electrical connection structure covers the front surface of the tested IGBT module and is used for being electrically connected with a contact on the front surface of the tested IGBT module; the push rod is formed on the lower edge of the bearing plate and can push the tested IGBT module to the lateral electrical switching structure to form contact. According to the utility model, the automatic test of a new product can be realized, the test efficiency is greatly improved, and the device can be directly installed on an existing tool in a covering manner, so that the transformation cost of the device is greatly reduced.

Description

Technical Field

[0001] The utility model relates to the field of semiconductors, in particular to a novel IGBT module electrical contact test fixture. Background Art

[0002] IGBT, short for Insulated Gate Bipolar Transistor, is a high-performance semiconductor device commonly used in power electronics. It combines the high input impedance of a metal oxide semiconductor field effect transistor (MOSFET) with the low on-state voltage drop of a bipolar junction transistor (BJT).

[0003] During the IGBT module terminal inspection process, existing test equipment for end-product electrical testing can only move up and down perpendicular to the module plane to establish electrical contact with the front of the product. With the advancement of IGBT modules, a new type of IGBT module has emerged. The positive terminal of this new IGBT product is located on the side of the module frame, while the layout of other test terminals and signal pins remains unchanged. Existing IGBT automated test equipment can only move up and down perpendicular to the module plane, making it impossible to electrically connect to the positive terminal of this new IGBT module product, making it unsuitable for end-product electrical testing of this new IGBT module product.

[0004] In view of the above problems, it is necessary to design a new type of electrical contact test fixture, which enables the fixture to move up and down in the vertical direction perpendicular to the module plane, and to simultaneously form contact with the front terminal signal and side terminal of the product, thereby meeting the requirements of automated testing. Utility Model Content

[0005] The Summary of the Utility Model introduces a series of simplified concepts, which are simplifications of existing technologies in the field and are further described in detail in the Detailed Description of the Utility Model. The Summary of the Utility Model of this utility model is not intended to limit the key features and essential technical features of the claimed technical solution, nor is it intended to determine the scope of protection of the claimed technical solution.

[0006] The technical problem to be solved by the present invention is to provide a fixture that can be applied to a new IGBT module (referring to an IGBT module with the positive terminal located on the side of the module frame) and can be used for automated electrical contact testing of the IGBT module without changing the existing test fixture structure.

[0007] In order to solve the above technical problems, the utility model provides a new IGBT module electrical contact test fixture, including:

[0008] A carrier board 1, which is used to carry the IGBT module under test;

[0009] A lateral electrical transfer structure 2 is formed on the upper edge of the carrier plate 1 and is used to electrically connect the lateral contacts of the IGBT module under test, transferring the lateral contacts of the IGBT module under test to the front contacts. It also limits the maximum distance that the IGBT module under test can move toward the upper edge of the carrier plate 1;

[0010] Two positioning members 3, formed on both sides of the lateral electrical transfer structure 2, for positioning the IGBT module under test;

[0011] A front electrical connection structure 4, whose cover is mounted on the front of the IGBT module under test and is used to electrically connect to the contacts on the front of the IGBT module under test;

[0012] The push rod 5 is formed on the lower edge of the carrier plate 1 and can push the IGBT module under test toward the lateral electrical transfer structure 2 to form contact.

[0013] Preferably, the novel IGBT module electrical contact test fixture is further improved, and the carrier plate 1 is made of insulating material.

[0014] Preferably, the novel IGBT module electrical contact test fixture is further improved, and the lateral electrical transfer structure 2 includes:

[0015] A fixing row 2.1 made of insulating material and fixedly connected to the carrier plate 1;

[0016] Multiple groups of signal pins pass through and are fixed in the fixed row 2.1, each group of signal pins corresponding to a contact on the side of the IGBT module;

[0017] The transfer contacts 2.2 are formed on the top surface of the fixed row 2.1 and are electrically connected to the signal pins in a one-to-one correspondence.

[0018] Preferably, the novel IGBT module electrical contact test fixture is further improved, and each group of signal pins consists of at least 3 signal pins.

[0019] Exemplarily, three groups of signal pins are provided, each group having five signal pins, and the position of each signal pin corresponds to the electrical contact of the positive terminal on the side of the new IGBT module.

[0020] Preferably, the novel IGBT module electrical contact test fixture is further improved, and the positioning member 3 is a positioning pin that can be inserted into the positioning hole of the carrier plate 1 .

[0021] Preferably, the novel IGBT module electrical contact test fixture is further improved, and the positioning pins are made of insulating material.

[0022] Preferably, the novel IGBT module electrical contact test fixture is further improved, and the front electrical connection structure 4 is formed on the front sides of the upper and lower ends of the IGBT module being tested.

[0023] Preferably, the novel IGBT module electrical contact test fixture is further improved, wherein the push rod 5 has a damping structure and a locking structure. The damping structure prevents the lateral electrical transfer structure from making rigid contact with the IGBT under test, which could damage the IGBT. The locking structure locks the IGBT and the lateral electrical transfer structure after they form contact, preventing shaking.

[0024] The use process of this utility model is as follows:

[0025] First, pull the push rod to the maximum distance, place the IGBT to be tested between the fixed parts of the carrier plate, push the push rod to make the lateral electrical transfer structure and the side terminal of the IGBT to be tested come into contact, and lock the push rod;

[0026] At this time, the front electrical connection structure also comes into contact with the front terminal of the IGBT under test, and the test angle is activated to perform the automated electrical test.

[0027] The utility model can achieve contact with the front and side terminals of new IGBT products on existing tooling, thereby realizing automated testing of new products and greatly improving testing efficiency. In addition, the utility model can be directly installed on the existing tooling cover, thereby greatly reducing the cost of equipment modification. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The drawings of the present invention are intended to illustrate the general characteristics of the methods, structures and / or materials used in specific exemplary embodiments of the present invention, supplementing the description in the specification. However, the drawings of the present invention are schematic diagrams not drawn to scale and may not accurately reflect the precise structure or performance characteristics of any given embodiment. The drawings of the present invention should not be interpreted as defining or limiting the range of values ​​or properties covered by the exemplary embodiments of the present invention. The present invention is further described in detail below in conjunction with the drawings and specific embodiments:

[0029] Figure 1 It is a schematic diagram of the overall structure of the utility model.

[0030] Figure 2 It is a schematic diagram of the lateral electrical transfer structure of the utility model.

[0031] Description of Reference Numerals

[0032] Loading plate 1

[0033] Lateral electrical transfer structure 2

[0034] Positioning piece 3

[0035] Front electrical connection structure 4

[0036] Putt 5

[0037] Tested IGBT module 6. DETAILED DESCRIPTION

[0038] The following describes the implementation of the present invention through specific embodiments. Those skilled in the art can fully understand the other advantages and technical effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through different specific embodiments. The details in this specification can also be applied based on different viewpoints and various modifications or changes can be made without departing from the overall design concept of the utility model. It should be noted that, unless there is a conflict, the following embodiments and the features therein can be combined with each other. The following exemplary embodiments of the present invention can be implemented in a variety of different forms and should not be interpreted as being limited to the specific embodiments described herein. It should be understood that these embodiments are provided to make the disclosure of the present invention thorough and complete, and to fully convey the technical solutions of these exemplary embodiments to those skilled in the art. It should be understood that when an element is referred to as being "connected" or "coupled" to another element, the element can be directly connected or coupled to the other element, or there can be an intermediate element. In contrast, when an element is referred to as being "directly connected" or "directly coupled" to another element, there is no intermediate element. The same figure numbers always represent the same elements throughout the drawings.

[0039] First embodiment;

[0040] refer to Figure 1 As shown, the utility model provides a new IGBT module electrical contact test fixture, including:

[0041] A carrier board 1, which is used to carry the IGBT module under test;

[0042] A lateral electrical transfer structure 2 is formed on the upper edge of the carrier plate 1 and is used to electrically connect the lateral contacts of the IGBT module under test, transferring the lateral contacts of the IGBT module under test to the front contacts. It also limits the maximum distance that the IGBT module under test can move toward the upper edge of the carrier plate 1;

[0043] Two positioning members 3, formed on both sides of the lateral electrical transfer structure 2, for positioning the IGBT module under test;

[0044] A front electrical connection structure 4, whose cover is mounted on the front of the IGBT module under test and is used to electrically connect to the contacts on the front of the IGBT module under test;

[0045] The push rod 5 is formed on the lower edge of the carrier plate 1 and can push the IGBT module under test toward the lateral electrical transfer structure 2 to form contact.

[0046] The supporting plate 1 is made of insulating material.

[0047] Second embodiment;

[0048] refer to Figure 1 Combine Figure 2 As shown, the utility model provides a new IGBT module electrical contact test fixture, including:

[0049] A carrier board 1, which is used to carry the IGBT module under test;

[0050] The lateral electrical transfer structure 2 is formed on the upper edge of the carrier plate 1 and is used to electrically connect the lateral contacts of the tested IGBT module, converting the lateral contacts of the tested IGBT module to the front contacts. It also limits the maximum distance that the tested IGBT module can move toward the upper edge of the carrier plate 1. The lateral electrical transfer structure 2 includes:

[0051] A fixing row 2.1 made of insulating material, which is fixedly connected to the carrier plate 1, for example, by screws;

[0052] Multiple groups of signal pins pass through and are fixed in the fixed row 2.1, each group of signal pins corresponding to a contact on the side of the IGBT module;

[0053] Transfer contacts 2.2, formed on the top surface of the fixed row 2.1, electrically connected to each signal pin in a one-to-one correspondence;

[0054] Each group of signal pins consists of at least 3 signal pins;

[0055] Two positioning members 3, formed on both sides of the lateral electrical transfer structure 2, for positioning the IGBT module under test;

[0056] The front electrical connection structure 4 is covered on the front of the IGBT module under test and is used to electrically connect to the contacts on the front of the IGBT module under test. The front electrical connection structure 4 is formed on the upper and lower front ends of the IGBT module under test.

[0057] The push rod 5 is formed on the lower edge of the carrier plate 1 and can push the IGBT module under test toward the lateral electrical transfer structure 2 to form contact.

[0058] The carrier plate 1 is made of insulating material, and the positioning member 3 is a positioning pin that can be inserted into the positioning hole of the carrier plate 1 , and the positioning pin is made of insulating material.

[0059] Preferably, the design in the first embodiment and the second embodiment is two push rods 5, which are respectively located at the two side edges of the lower part of the supporting plate, and the push rod 5 has a damping structure and a locking structure.

[0060] Unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by those skilled in the art to which the present invention belongs. It will also be understood that, unless expressly defined herein, terms such as those defined in general dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant art, rather than being interpreted in an ideal or overly formal sense.

[0061] The present invention has been described in detail above through specific implementation methods and examples, but these do not constitute limitations of the present invention. Without departing from the principles of the present invention, those skilled in the art may make many variations and improvements, which should also be considered as the scope of protection of the present invention.

Claims

1. A new IGBT module electrical contact test fixture, characterized in that: include: A carrier plate (1) for carrying the IGBT module to be tested; A lateral electrical transfer structure (2) is formed on the upper edge of the carrier plate (1) and is used to electrically connect the lateral contacts of the tested IGBT module, transfer the lateral contacts of the tested IGBT module to the front contacts, and also limit the maximum distance that the tested IGBT module can move toward the upper edge on the carrier plate (1); Two positioning members (3) formed on both sides of the lateral electrical transfer structure (2) and used for positioning the IGBT module to be tested; A front electrical connection structure (4), the cover of which is mounted on the front of the IGBT module being tested and is used to electrically connect to the contacts on the front of the IGBT module being tested; A push rod (5) is formed on the lower edge of the carrier plate (1) and can push the tested IGBT module toward the lateral electrical transfer structure (2) to form contact.

2. The novel IGBT module electrical contact test fixture according to claim 1, characterized in that: The carrying plate (1) is made of insulating material.

3. The novel IGBT module electrical contact test fixture according to claim 1, characterized in that: The lateral electrical transfer structure (2) includes: A fixing row (2.1) made of insulating material and fixedly connected to the carrier plate (1); Multiple groups of signal pins pass through and are fixed in the fixed row (2.1), each group of signal pins corresponding to a contact on the side of the IGBT module; The transfer contacts (2.2) are formed on the top surface of the fixed row (2.1) and are electrically connected to the signal pins in a one-to-one correspondence.

4. The novel IGBT module electrical contact test fixture according to claim 3, characterized in that: Each group of signal pins consists of at least 3 signal pins.

5. The novel IGBT module electrical contact test fixture according to claim 1, characterized in that: The positioning piece (3) is a positioning pin that can be inserted into the positioning hole of the carrier plate (1).

6. The novel IGBT module electrical contact test fixture according to claim 5, characterized in that: The positioning pins are made of insulating material.

7. The novel IGBT module electrical contact test fixture according to claim 1, characterized in that: The front electrical connection structure (4) is formed on the upper and lower front sides of the IGBT module being tested.

8. The novel IGBT module electrical contact test fixture according to claim 1, characterized in that: The push rod (5) has a damping structure and a locking structure.

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