DOE laser collimation test mechanism

By designing a DOE laser alignment test mechanism and using limit lines and press-fixing columns to position and detect the lenses on the circuit board, the problem of inconsistent aiming of the DOE laser aiming light was solved, achieving higher aiming accuracy and manufacturing efficiency.

CN223346417UActive Publication Date: 2025-09-16NANJING BILIN INTELLIGENT IDENTIFICATION TECH CO LTD
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Patent Information

Application Number
CN202422908598.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-28
Publication Date
2025-09-16
Estimated Expiration
2034-11-28

AI Technical Summary

Technical Problem

In the prior art, the collimation and aiming consistency of the DOE laser aiming light soldered on the circuit board is poor, resulting in poor debugging consistency during the use of the equipment, and the lack of testing after production results in the need to disassemble and replace the finished product, which is a wasteful process.

Method used

A DOE laser alignment test mechanism is designed, which includes a support test platform and a test target surface. The lens on the PCBA board is positioned and tested by limit lines and pressing fixed columns. The cross coordinate lines and deflection lines are used to limit the light angle, and the offset is calculated to improve the aiming accuracy.

Benefits of technology

The aiming consistency of the DOE laser aiming light soldered on the circuit board is improved, the disassembly and replacement process in the finished product stage is reduced, and the inspection efficiency in the manufacturing stage is improved.

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Abstract

The utility model relates to a DOE laser collimation test mechanism, which comprises a support test platform and a test target surface, the support test platform is provided with a positioning hole for allowing a lens of a PCBA board to extend out, and the top of the support test platform is provided with a pressing fixing column for pressing the back of the PCBA board. The pressing fixing column is connected to the top of the supporting test platform through a movable support. The test target surface is located right below the support test platform and is parallel to the support test platform, and a limit line is carved on the test target surface. According to the scheme, after DOE laser aiming lamps welded to a circuit board are detected and screened through the testing tool of the DOE laser collimation testing mechanism, the aiming consistency of finished equipment is remarkably improved, and after a user uses aiming instructions, the installation and debugging consistency can be high.
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Description

Technical Field

[0001] The utility model relates to the technical field of optical lens testing, in particular to a DOE laser alignment testing mechanism. Background Art

[0002] DOE stands for Diffractive Optical Elements, which is a series of movable lenses in a photolithography machine, mainly used to generate the light source required for photolithography. In actual applications, the light source of a photolithography machine has about 4,000 lenses. There are two ways to install laser collimation aiming lights on the market. One is to use structural parts to fix it on the outer casing, and the other is to weld it on the circuit board. The patent proposed in this application is mainly for the second method (DOE laser aiming light welded on the circuit board). DOE collimation aiming laser lights are all tested by the factory before leaving the factory to meet the design standard of 0.5 to 1° deviation. After assembling the product, the aiming function is retested, but the aiming collimation is not measured.

[0003] DOE laser alignment testing is typically performed by the factory before shipment; post-production alignment testing is not performed. For products where the DOE laser aiming light is soldered to the PCB, the accuracy of the aiming is often inconsistent across all products. The aiming accuracy of different devices can vary significantly, with deviations of up to ±5° (measured at a 30cm test distance, a ±5° deviation results in a 52.5mm vertical offset error). In actual use, customers often experience poor consistency in their device testing. Utility Model Content

[0004] The purpose of the present invention is to provide a DOE laser alignment test mechanism to solve the problems encountered in the above-mentioned background technology.

[0005] To achieve the above purpose, the technical solution of the utility model is as follows:

[0006] A DOE laser alignment test mechanism includes a support test platform and a test target surface. The support test platform is provided with a positioning hole to accommodate the extension of the PCBA lens. A pressing and fixing column is mounted on the top of the support test platform to press the back of the PCBA. The pressing and fixing column is connected to the top of the support test platform via a movable bracket. The test target surface is located directly below and parallel to the support test platform, and limit lines are engraved on the test target surface.

[0007] In the above solution, the distance between the support test platform and the test target surface is -cm. As a preferred solution, the distance between the support test platform and the test target surface is cm.

[0008] In the above solution, the limit lines include a cross-coordinate line and an offset range line. The cross center of the cross-coordinate line is located directly below the center of the positioning hole. The offset range line is circular with the cross center of the cross-coordinate line as the center of the circle. In addition, the limit lines also include a deflection line. The deflection line is X-shaped, and its center point coincides with the cross center of the cross-coordinate line.

[0009] Compared with existing technologies, the present invention offers the following advantages: By using this DOE laser alignment test fixture to test and screen DOE laser aiming lamps soldered to circuit boards, the aiming consistency of finished devices is significantly improved. Users can achieve high consistency during installation and commissioning using the aiming indicator. Furthermore, the alignment of laser lamps can be checked during the manufacturing phase, avoiding the time-consuming process of disassembling and replacing the finished device. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] The disclosure of the present invention is described with reference to the accompanying drawings. It should be understood that the drawings are for illustrative purposes only and are not intended to limit the scope of protection of the present invention. In the accompanying drawings, the same reference numerals are used to refer to the same components. Among them:

[0011] Figure 1 It is a structural diagram of the utility model;

[0012] Figure 2 Schematic diagram of the limit line of the test target surface in the present utility model;

[0013] Numbers in the figure: 1-PCBA board; 2-pressing fixing column; 3-support test platform; 4-aiming schematic line; 5-test target surface; 6-cross coordinate line; 7-offset range line; 8-deflection limit line. DETAILED DESCRIPTION

[0014] In order to make the technical means, creative features, objectives and effects of the present invention easier to understand, the present invention will now be further described in detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, and therefore only show the relevant components of the present invention.

[0015] According to the technical solution of the present invention, without changing the essential spirit of the present invention, those skilled in the art may propose a variety of interchangeable structural methods and implementation methods. Therefore, the following specific embodiments and drawings are merely illustrative of the technical solution of the present invention and should not be regarded as the entire present invention or as a limitation or restriction of the technical solution of the present invention.

[0016] The technical solution of the present utility model is further described in detail below with reference to the accompanying drawings and embodiments.

[0017] like Figure 1 The figure shows a DOE laser alignment test mechanism, comprising a support test platform 3 and a test target surface 5. The support test platform 3 has a positioning hole for accommodating the lens of the PCBA board 1. This positioning hole primarily serves to position the lens of the laser alignment aiming light. A pressing and fixing column 2 is mounted on the top of the support test platform 3 to press against the back of the PCBA board 1. The pressing and fixing column 2 is connected to the top of the support test platform 3 via a movable bracket.

[0018] Using existing electric cylinders, corresponding guide posts are installed on the top of the test platform 3 to act as guides for linearly pushing the pressing and fixing posts 2. The cylinder's output then drives the pressing and fixing posts 2 up and down, causing them to press against the back of the PCBA 1, thereby determining the distance between the lens on the PCBA 1 and the test target surface 5 below. In actual production, linear driving of the pressing and fixing posts 2 is a common actuation method, and can be accomplished using electric cylinders, hydraulic cylinders, or manual operation.

[0019] The distance between the support test platform 3 and the test target surface 5 is 15-30 cm. During implementation, it is preferred that the distance between the support test platform 3 and the test target surface 5 is 20 cm. This distance is convenient for calculation, convenient for personnel to observe, and takes up little space.

[0020] The test target surface 5 is located directly below and parallel to the support test platform 3. There are limit lines on the test target surface 5. After the lens of the PCBA board 1 extends through the positioning hole, the light is irradiated onto the limit line. Figure 1 The middle irradiation line is shown as the aiming schematic line 4 , and the irradiation line is mapped onto the test target surface 5 .

[0021] See also Figure 2 The limit lines include a cross-coordinate line 6 and an offset range line 7. The center of the cross of cross-coordinate line 6 is located directly below the center of the positioning hole. The offset range line 7 is circular, with the center of the cross of cross-coordinate line 6 as the center. The cross-coordinate line 6 and the offset range line 7 define the range of the angle of light irradiated by the lens of PCBA board 1. In addition, the limit lines also include a deflection line 8. Deflection line 8 is X-shaped, with its center point coinciding with the center of the cross of cross-coordinate line 6. Deflection line 8 is used to determine whether the angle of light irradiated by the lens of PCBA board 1 is within a reasonable deflection angle.

[0022] For ease of understanding, this DOE laser alignment test mechanism is actually a set of test fixtures. Through this fixture, the welding DOE laser alignment standard lamp test can accurately test the laser lamp welding deviation. By fixing the support test platform 3 at a height of 20cm, the laser lamp in the lens of PCBA board 1 is perpendicular to the plane. After the laser aiming light is turned on, the pattern will be evenly projected to the bottom. Through trigonometric functions It can be calculated that the offset angle required for the lens of PCBA board 1 does not exceed 1.5°, which is tan1.5°*200mm=5.24mm. Aim the laser light at the center point on the test target surface 5 at the bottom of the test fixture and draw a circular mark with a radius of 5.25mm to limit the offset limit. For each board, it can be tested and the maximum offset can be limited.

[0023] Using this DOE laser alignment tester to test a DOE laser aiming light soldered to PCBA board 1 ensures a high degree of assembly consistency. Under the same 200mm test conditions, the offset error is significantly less than the 52.5mm error at 5°, resulting in a threefold improvement in aiming accuracy. This translates to: tan5° / tan1.5°≈3.34.

[0024] Therefore, after using this DOE laser alignment test fixture to inspect and screen DOE laser aiming lamps soldered to circuit boards, the aiming consistency of finished devices has been significantly improved. After using the aiming indicator, users can achieve high consistency during installation and commissioning. Furthermore, the alignment of laser lamps can be checked during the manufacturing stage, avoiding the time-consuming process of disassembling and replacing the finished device.

[0025] The specific implementation methods described above further illustrate the purpose, technical solutions and beneficial effects of the utility model in detail. It should be understood that the above description is only a specific implementation method of the utility model and is not intended to limit the scope of protection of the utility model. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the utility model should be included in the scope of protection of the utility model.

Claims

1. A DOE laser alignment test mechanism, characterized by: The invention comprises a supporting test platform (3) and a test target surface (5); the supporting test platform (3) is provided with a positioning hole for accommodating the extension of a lens of a PCBA board (1); a pressing fixing column (2) for pressing the back of the PCBA board (1) is installed on the top of the supporting test platform (3); the test target surface (5) is located directly below the supporting test platform (3) and is parallel to the supporting test platform (3); and a limit line is engraved on the test target surface (5).

2. A DOE laser alignment test mechanism according to claim 1, characterized in that: The distance between the support test platform (3) and the test target surface (5) is 15-30 centimeters.

3. The DOE laser alignment test mechanism according to claim 2, characterized in that: The distance between the support test platform (3) and the test target surface (5) is 20 centimeters.

4. The DOE laser alignment test mechanism according to claim 1, characterized in that: The limit line includes a cross coordinate line (6) and an offset range line (7), wherein the cross center of the cross coordinate line (6) is located directly below the center of the positioning hole, and the offset range line (7) is circular, with the cross center of the cross coordinate line (6) as the center of the circle.

5. The DOE laser alignment test mechanism according to claim 4, characterized in that: The limit line also includes a deflection line (8), which is X-shaped, and the center point of the deflection line coincides with the cross center of the cross coordinate line (6).

6. The DOE laser alignment test mechanism according to claim 1, characterized in that: The pressing and fixing column (2) is connected to the top of the supporting test platform (3) via a movable bracket.