Consumable chip testing device

Abstract

The utility model relates to the technical field of consumable chip testing, in particular to a consumable chip testing device, which comprises a testing table, a testing box is arranged on the testing table, a sliding rail is arranged at the top end of the testing box, an electric sliding block is arranged on the sliding rail, an L-shaped frame is arranged on the electric sliding block, a push plate is arranged at the bottom end of the L-shaped frame, and the push plate is connected with the testing box. A storage groove is formed in one end of the test box, a T-shaped groove is formed between the storage groove and the other end of the test box, a through groove is formed between the T-shaped groove and the top end of the test box, a sliding plate is arranged on the T-shaped groove, a positioning groove is formed in one side of the sliding plate, and a butt joint groove is formed in the bottom end of the positioning groove. According to the structure, automatic assemblies such as the electric sliding block, the L-shaped frame and the push plate are used for completing butt joint testing of chips, manual operation steps are reduced, and human errors possibly occurring in the traditional manual chip placing process are avoided.

Description

Technical Field

[0001] The utility model relates to the technical field of consumable chip testing, in particular to a consumable chip testing device. Background Art

[0002] As we all know, manual operation is a common practice in the traditional consumable chip testing process. This method has many shortcomings: manual placement of chips requires operators to position and fix them one by one, which is extremely inefficient for batch testing tasks. Human factors may lead to inaccurate placement or operational errors, especially for small or delicate chips. Even a slight deviation will affect the test results. During manual operation, chips can easily be damaged due to improper holding or placement, especially sensitive components. Once damaged, they cannot be repaired, resulting in a waste of resources. Since each placement is manual, it is difficult to ensure that the position of the chip is exactly the same during each test. This position deviation will lead to inaccurate and non-repeatable test data. During manual placement, the contact between the chip and the test equipment may be unstable. Especially under high-voltage or high-frequency testing conditions, poor contact will seriously affect the validity of the test results. Therefore, it is necessary to propose a solution to this technical problem. Utility Model Content

[0003] (1) Technical problems solved

[0004] In view of the deficiencies in the prior art, the utility model provides a consumable chip testing device.

[0005] (2) Technical solution

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a consumable chip testing device, comprising a test bench, a test box is provided on the test bench, a slide rail is provided on the top of the test box, an electric slider is provided on the slide rail, an L-frame is provided on the electric slider, a push plate is provided at the bottom end of the L-frame, a storage slot is provided at one end of the test box, a T-shaped slot is provided between the storage slot and the other end of the test box, a through slot is provided between the T-shaped slot and the top end of the test box, a slide plate is provided on the T-shaped slot, a positioning slot is provided on one side of the slide plate, a docking slot is provided at the bottom end of the positioning slot, and a card slot is provided on the other side of the slide plate. A detection groove is provided at the bottom end of the T-shaped groove, a detection plate is provided on the detection groove, a lifting mechanism is provided between the detection plate and the detection groove, a positioning hole is provided on one side of the T-shaped groove, a fastening groove is provided on the positioning hole, a fastening plate is provided on the fastening groove, an inclined block is provided between the fastening plate and the positioning hole, a guide mechanism and an elastic support mechanism are provided between the fastening plate and the fastening groove, an adjustment hole is provided on the fastening plate, a limit slot is provided on the adjustment hole, a limit block is provided on the limit slot, a telescopic mechanism is provided on the outside of the test box, and the output end of the telescopic mechanism passes through the adjustment hole and is connected to the limit block.

[0007] Furthermore, the present invention is improved in that the guide mechanism includes a guide groove and a guide block, the guide groove is opened on one side of the fastening groove, the guide block is slidably connected to the guide groove, and the guide block is connected to the fastening plate.

[0008] Furthermore, the present invention is improved in that the elastic support mechanism is a spring, one end of the spring is connected to the fastening groove, and the other end of the spring is connected to the fastening plate.

[0009] Furthermore, the present invention is improved in that the telescopic mechanism and the lifting mechanism are both electric telescopic rods.

[0010] Furthermore, the present invention is improved in that the guide mechanisms are provided with two and are symmetrically arranged.

[0011] Furthermore, the present invention is improved in that the guide groove and the guide block are both T-shaped structures.

[0012] Furthermore, the present invention is improved in that a rubber pad is provided on the push plate.

[0013] Furthermore, the present invention is improved in that two elastic support mechanisms are provided and are symmetrically arranged.

[0014] (3) Beneficial effects

[0015] Compared with the prior art, the present invention provides a consumable chip testing device with the following features:

[0016] Beneficial effects:

[0017] The consumable chip testing device uses automated components such as an electric slider, an L-frame, and a push plate to complete the chip docking test, reducing manual operation steps and avoiding human errors that may occur in the traditional manual chip placement process. Automated processing can reduce the number of operators, especially when a large number of chips need to be tested, which can greatly reduce labor costs. The positioning groove on the slider is designed to match the chip size, ensuring that the chip can be accurately placed in the same position for each test, improving the repeatability and consistency of the test results. The detection board is docked with the chip through the docking groove, ensuring stable and reliable contact between the detection board and the chip for each test, reducing test errors caused by poor contact. The electric slider and telescopic mechanism can complete the loading and unloading of the chip in a short time, speeding up the test cycle, and is suitable for efficient testing needs in large-scale production environments. Through the automated process, multiple chip tests can be completed in one cycle, reducing waiting time and intermediate links, and further improving the overall test speed. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the structure of the utility model Figure 1 ;

[0019] Figure 2 This is a schematic diagram of the structure of the utility model Figure 2 ;

[0020] Figure 3 For this utility model Figure 1 The enlarged left half-section of the test box;

[0021] Figure 4 For this utility model Figure 1 A top view of the enlarged structure of the test box in the middle.

[0022] In the figure: 1. Test bench; 2. Test box; 3. Slide rail; 4. Electric slider; 5. L-frame; 6. Push plate; 7. Slide plate; 8. Inspection plate; 9. Lifting mechanism; 10. Fastening plate; 11. Inclined block; 12. Limit block; 13. Telescopic mechanism; 14. Guide groove; 15. Guide block; 16. Spring. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0024] See also Figure 1-4 The utility model is a consumable chip testing device, comprising a test table 1, a test box 2 is provided on the test table 1, a slide rail 3 is provided on the top of the test box 2, an electric slider 4 is provided on the slide rail 3, an L frame 5 is provided on the electric slider 4, a push plate 6 is provided at the bottom end of the L frame 5, a storage slot is provided at one end of the test box 2, a T-shaped slot is provided between the storage slot and the other end of the test box 2, a through slot is provided between the T-shaped slot and the top of the test box 2, a slide plate 7 is provided on the T-shaped slot, a positioning slot is provided on one side of the slide plate 7, a docking slot is provided at the bottom end of the positioning slot, a card slot is provided on the other side of the slide plate 7, a detection slot is provided at the bottom end of the T-shaped slot, and the detection A detection plate 8 is provided on the slot, and a lifting mechanism 9 is provided between the detection plate 8 and the detection slot. A positioning hole is provided on one side of the T-shaped slot, a fastening slot is provided on the positioning hole, a fastening plate 10 is provided on the fastening slot, an inclined block 11 is provided between the fastening plate 10 and the positioning hole, a guide mechanism and an elastic support mechanism are provided between the fastening plate 10 and the fastening slot, an adjustment hole is provided on the fastening plate 10, a limiting slot is provided on the adjusting hole, a limiting block 12 is provided on the limiting slot, and a telescopic mechanism 13 is provided on the outside of the test box 2, and the output end of the telescopic mechanism 13 passes through the adjustment hole and is connected to the limiting block 12. In this embodiment, the positioning slot provided on one side of the slide 7 is aligned with the position to be tested The size of the consumable chip is adapted, the chip is placed in the positioning groove, and then the slide plate 7 is placed in the T-slot, and the electric slider 4 is used to slide linearly on the slide rail 3, and the electric slider 4 drives the L frame 5 to move linearly, and the L frame 5 pushes the slide plate 7 through the through slot by the push plate 6. The slide plate 7 moves linearly in the T-slot, and the slide plate 7 contacts and pushes the inclined block 11. The inclined block 11 is squeezed into the positioning hole, and the elastic support mechanism is squeezed and contracted. When the card slot of the slide plate 7 is aligned with the inclined block 11, the elastic support force of the elastic support mechanism can make the inclined block 11 directly against the card slot. At this time, the slide plate 7 is fixed in the T-slot, the electric slider 4 is closed, and then the detection plate 8 is moved upward by using the lifting mechanism 9, and the detection plate 8 is passed through After the test is completed, the lifting mechanism 9 is controlled to move the detection plate 8 downward, and then the output end of the telescopic mechanism 13 is controlled to retract and move the limit block 12, so that the limit block 12 drives the fastening plate 10 to move, and the elastic support mechanism is squeezed and deformed, so that the inclined block 11 can leave the card slot and enter the positioning hole, and then the electric slider 4 is controlled to move, and the push plate 6 continues to push the slide plate 7 close to the storage slot. The personnel removes the slide plate 7 through the storage slot, and then takes out the chip in the positioning slot on the slide plate 7, so as to quickly complete the chip test operation, solve the problem of personnel manually placing the chip and damaging the chip, and ensure the stability and reliability of the chip test.

[0025] In this solution, the guide mechanism includes a guide groove 14 and a guide block 15. The guide groove 14 is opened on one side of the fastening groove. The guide block 15 is slidably connected to the guide groove 14. The guide block 15 is connected to the fastening plate 10. When the fastening plate 10 moves, the guide block 15 is driven to move. The guide block 15 moves linearly in the guide groove 14, thereby making the fastening plate 10 move linearly more stably.

[0026] In this solution, the elastic support mechanism is a spring 16, one end of the spring 16 is connected to the fastening groove, and the other end of the spring 16 is connected to the fastening plate 10. By using the elastic support mechanism as a spring 16, the fastening plate 10 can be better elastically supported, and the fastening plate 10 can be better elastically supported to ensure that the inclined block 11 is firmly against the slot.

[0027] In this solution, the telescopic mechanism 13 and the lifting mechanism 9 are both electric telescopic rods, which have the characteristic of high movement precision, so that the present structure can be used with high precision control.

[0028] In this solution, the guide mechanisms are provided with two and are symmetrically arranged. By providing two and symmetrically arranged guide mechanisms, the fastening plate 10 can be moved linearly better.

[0029] In this solution, the guide groove 14 and the guide block 15 are both T-shaped structures. Through the T-shaped guide groove 14 and the guide block 15, the guide block 15 can be placed out of the guide groove 14 to ensure the stability of the guide block 15 in the guide groove 14.

[0030] In this solution, a rubber pad is provided on the push plate 6 , and the rubber pad contacts the slide plate 7 , thereby preventing the push plate 6 from bumping into and damaging the slide plate 7 .

[0031] In this solution, two elastic support mechanisms are provided and are symmetrically arranged. By providing two symmetrically arranged elastic support mechanisms, the elastic support effect of the fastening plate 10 can be improved.

[0032] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A consumable chip testing device, comprising a test bench (1), characterized in that: The test bench (1) is provided with a test box (2), a slide rail (3) is provided at the top of the test box (2), an electric slider (4) is provided on the slide rail (3), an L frame (5) is provided on the electric slider (4), a push plate (6) is provided at the bottom of the L frame (5), a storage slot is provided at one end of the test box (2), a T-shaped slot is provided between the storage slot and the other end of the test box (2), a through slot is provided between the T-shaped slot and the top of the test box (2), a slide plate (7) is provided on the T-shaped slot, a positioning slot is provided on one side of the slide plate (7), a docking slot is provided at the bottom end of the positioning slot, a card slot is provided on the other side of the slide plate (7), a detection slot is provided at the bottom end of the T-shaped slot, and the detection slot is provided. A detection plate (8) is provided on the measuring slot, a lifting mechanism (9) is provided between the detection plate (8) and the detection slot, a positioning hole is provided on one side of the T-shaped slot, a fastening slot is provided on the positioning hole, a fastening plate (10) is provided on the fastening slot, an inclined block (11) is provided between the fastening plate (10) and the positioning hole, a guide mechanism and an elastic support mechanism are provided between the fastening plate (10) and the fastening slot, an adjustment hole is provided on the fastening plate (10), a limiting slot is provided on the adjustment hole, a limiting block (12) is provided on the limiting slot, a telescopic mechanism (13) is provided on the outside of the test box (2), an output end of the telescopic mechanism (13) passes through the adjustment hole and is connected to the limiting block (12).

2. A consumable chip testing device according to claim 1, characterized in that: The guide mechanism comprises a guide groove (14) and a guide block (15), wherein the guide groove (14) is opened on one side of the fastening groove, the guide block (15) is slidably connected to the guide groove (14), and the guide block (15) is connected to the fastening plate (10).

3. A consumable chip testing device according to claim 2, characterized in that: The elastic support mechanism is a spring (16), one end of the spring (16) is connected to the fastening groove, and the other end of the spring (16) is connected to the fastening plate (10).

4. The consumable chip testing device according to claim 3, characterized in that: The telescopic mechanism (13) and the lifting mechanism (9) are both electric telescopic rods.

5. The consumable chip testing device according to claim 4, characterized in that: The guide mechanisms are provided with two and are symmetrically arranged.

6. The consumable chip testing device according to claim 5, characterized in that: The guide groove (14) and the guide block (15) both have a T-shaped structure.

7. The consumable chip testing device according to claim 6, characterized in that: A rubber pad is provided on the push plate (6).

8. The consumable chip testing device according to claim 7, characterized in that: The elastic support mechanisms are provided with two and are symmetrically arranged.

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