Rocking tray feeding type electrical property detection device suitable for surface-mounted diodes

Abstract

The utility model relates to the technical field of diode testing devices, and discloses a wobble plate feeding type electrical detection device for surface-mounted diodes, which specifically comprises a surface-mounted diode wobble plate, a surface-mounted diode turnover plate and a detection device, and the detection device comprises a moving mechanism and a detection mechanism. The moving mechanism is provided with a main support, a controller with a touch screen and a Y-axis motor are arranged in a fixing base to drive an overturning disc objective table above a Y-axis sliding mechanism to move, the upper end of the main support is connected with an X-axis sliding mechanism, an X-axis motor is arranged in the X-axis sliding mechanism, and a Z-axis sliding mechanism is arranged in the direction perpendicular to the X-axis sliding mechanism. A Z-axis motor is installed in the Z-axis sliding mechanism and on the upper portion of the X-axis sliding mechanism, and a vacuum chuck is installed at the lower end of the Z-axis sliding mechanism and connected with the lower portion of a vacuum chuck base. The detection mechanism comprises a diode electrode fixing seat, a poor contact discharging box, a good product discharging box and a defective product discharging box. According to the utility model, the automation degree of production is improved, and the working efficiency and the detection accuracy are improved.

Description

Technical Field

[0001] The utility model relates to the technical field of surface mount diode detection devices, in particular to a rocking tray loading type electrical detection device for surface mount diodes. Background Art

[0002] After cutting and bending surface-mount diodes, stress from the cutting and bending press can cause poor electrical properties, impacting production. To improve the electrical yield during this process, manufacturers typically conduct regular sampling tests on approximately 100 surface-mount diodes after cutting and bending. Currently, manufacturers typically test each diode manually, and given the small size of surface-mount diodes, manual testing is inefficient, time-consuming, and labor-intensive, leading to errors in both mixing and processing. Summary of the Invention

[0003] The technical problem to be solved by this utility model is to automatically detect the electrical status of surface-mount diodes and automatically classify the test results. To overcome the shortcomings of the existing technology, a rocking tray loading type electrical test device suitable for surface-mount diodes is provided. The utility model comprises a surface-mount diode rocking tray 2, a surface-mount diode flip tray 3, and a test device.

[0004] The detection device includes a moving mechanism and a detection mechanism. The moving mechanism is provided with a main bracket fixed base 192 with a touch screen controller 17 inside. The main bracket fixed base 192 is provided with a Y-axis sliding mechanism 132 inside. The flip disk carrier 161 is slidably connected to the Y-axis sliding mechanism 132. The left and right ends of the flip disk carrier are respectively provided with flip disk carrier positioning guide columns 162. The main bracket fixed base 192 is provided with a Y-axis motor 131, which drives the flip disk carrier 2 above the Y-axis sliding mechanism 132 to move up and down in the horizontal direction.

[0005] A main bracket 191 is provided on the left and right sides of the main bracket fixed base 192, the upper end of the main bracket is connected to the X-axis sliding mechanism 122, and an X-axis motor 121 is provided inside the interior, which drives the Z-axis sliding mechanism 142 to move left and right, and the X-axis sliding mechanism 122 is connected to the Z-axis sliding mechanism 142 in a vertical direction. A Z-axis motor 141 is installed inside the Z-axis sliding mechanism 142 and on the upper part of the X-axis sliding mechanism 122, and a vacuum suction pen seat 151 is installed at the lower end of the Z-axis sliding mechanism 142, and a vacuum suction pen 152 is connected below it, and the vacuum suction pen 152 is driven by the Z-axis motor to move up and down.

[0006] The detection mechanism includes a diode electrode fixing seat 11, a contact defective product discharge box 181, a good product discharge box 183, and a defective product discharge box 182. The diode electrode fixing seat 11 is installed on the upper part of the main bracket fixed base 192, and a positive test electrode 111 and a negative test electrode 112 are installed inside. The electrodes are electrically connected to a diode tester for diode testing to form a Kelvin test circuit.

[0007] The defective product discharge box 181, the good product discharge box 183 and the defective product discharge box 182 are placed in the upper fixed area of ​​the main bracket fixed base, and a fixing device is installed at the bottom so that they can be taken out and installed.

[0008] Preferably, the touch screen controller 17 is the controller of the detection device, which interacts through the touch screen, the user issues instructions, and the detection status is displayed. The controller is connected to the X-axis motor 121, the Y-axis motor 131, the Z-axis motor 141 and the vacuum suction pen 5 by electrical signals.

[0009] Preferably, the structure of the surface-mounted diode rocker 2 is a shell structure with a hollow interior, a rocker diode positioning groove 23 is provided on the upper plane, and a surrounding edge with a height higher than the surface-mounted diode is provided around the upper plane. There is a gap in the surrounding edge as a rocker discharge port 24, and a rocker vacuum inlet 21 is provided in the middle part of the surface-mounted diode rocker 2 connected to the inner cavity. A vacuum hole is provided in the rocker diode positioning groove 23 to communicate with the inner cavity, and the rocker diode positioning groove 23 can be fitted with the front of the surface-mounted diode 25, and rocker positioning guide pillars 22 are respectively installed at the left and right ends of the surrounding edge.

[0010] Preferably, the cross-section of the surface-mounted diode flip plate 3 is a solid "convex" shape with the middle part higher than the left and right ends, and the height is the same as the height of the edge of the surface-mounted diode rocker 2. A surface-mounted diode positioning groove 32 is provided in the middle part, which has a one-to-one correspondence with the rocker diode positioning groove 23 on the surface-mounted diode rocker 2. Surface-mounted diode flip plate positioning holes 31 are provided at the left and right ends, and the specific positions correspond to the rocker positioning guide pillars 22.

[0011] Preferably, the surface mount diode flip plate positioning hole 31 is also used in conjunction with the flip plate carrier positioning guide column 162 on the flip plate carrier 161 to fix the surface mount diode flip plate 3 on the flip plate carrier 161 for movement.

[0012] Preferably, heat sinks are installed on the exterior of the X-axis motor 121 , the Y-axis motor 131 , and the Z-axis motor 141 , that is, on the housings corresponding to the X-axis sliding mechanism 122 , the Y-axis sliding mechanism 132 , and the Z-axis sliding mechanism 142 .

[0013] Preferably, the positive test electrode 111 and the negative test electrode 112 are both made of highly elastic beryllium copper material, which are deformed under the action of the vacuum suction pen 152 and fully contact the electrodes of the surface-mounted diode 25 .

[0014] Compared with the prior art, the present invention has the following beneficial effects:

[0015] The utility model simplifies the preparation work of the test by designing a vacuum adsorption rocking plate. The rocking plate can be used to adjust the directions of a large number of surface-mount diodes at one time, with simple operation and high accuracy.

[0016] The utility model drives the vacuum suction pen to move the surface-mounted diode to the diode electrode fixing seat for electrical testing through the X-axis sliding mechanism, the Y-axis sliding mechanism, and the Z-axis sliding mechanism, and classifies the diodes according to the test results, thereby realizing full-process automation, improving work efficiency and test accuracy, and being able to timely perform statistics on the test results and calculate the qualified rate of the batch inspection, thereby improving the degree of digitization and automation of production and accelerating the efficiency of testing and production. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0018] Figure 1 This is a structural diagram of a rocking tray loading type electrical property testing device suitable for surface mount diodes according to the present invention;

[0019] Figure 2 This is a schematic diagram of the structure of a surface mount diode rocker in a rocker loading type electrical property testing device suitable for surface mount diodes of the utility model;

[0020] Figure 3 This is a schematic diagram of the structure of a surface mount diode flip disk in a rocking tray loading type electrical property testing device suitable for surface mount diodes in the utility model;

[0021] Figure 4 This is a schematic structural diagram of a diode electrode fixing seat of a rocking tray loading type electrical property testing device suitable for surface mount diodes of the utility model;

[0022] Figure 5 This is a schematic diagram of the structure of a surface-mount diode in a rocking tray loading type electrical property testing device suitable for surface-mount diodes of the utility model;

[0023] In the figure: 11, two-tube electrode holder; 111, positive test electrode; 112, negative test electrode;

[0024] 121, X-axis motor; 122, X-axis sliding mechanism; 131, Y-axis motor; 132, Y-axis sliding mechanism;

[0025] 141. Z-axis motor; 142. Z-axis sliding mechanism; 151. Vacuum pen holder; 152. Vacuum pen;

[0026] 161. Flip plate carrier; 162. Flip plate carrier positioning guide post; 17. Controller with touch screen;

[0027] 181. Contact with the discharge box for defective products; 182. Contact with the discharge box for defective products; 183. Contact with the discharge box for good products;

[0028] 191. Main bracket; 192. Main bracket fixing base;

[0029] 2. Surface mount diode rocker; 21. Racking plate vacuum inlet; 22. Racking plate positioning guide pin; 23. Racking plate diode positioning slot; 24. Racking plate discharge port; 25. Surface mount diode; 251. Surface mount diode front; 252. Surface mount diode bottom;

[0030] 3. Surface mount diode flip plate; 31. Surface mount diode flip plate positioning hole; 32. Surface mount diode positioning groove; DETAILED DESCRIPTION

[0031] For example, certain words are used in the specification and claims to refer to specific components. Those skilled in the art should understand that hardware manufacturers may use different terms to refer to the same component. This specification and claims do not use differences in names as a way to distinguish components, but use differences in the functions of the components as the criteria for distinction. For example, "including" mentioned throughout the specification and claims is an open term, so it should be interpreted as "including but not limited to". "Approximately" means that within an acceptable error range, those skilled in the art can solve the technical problem within a certain error range and basically achieve the technical effect.

[0032] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "horizontal", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings and are only used to facilitate the description of the present invention and simplify the description. They do not indicate or imply that the devices or elements referred to must have a specific direction, be constructed or operate in a specific direction. Therefore, they should not be understood as limiting the present invention.

[0033] In this utility model, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integral connection; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; and internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on specific circumstances.

[0034] The following is combined with Figure 1-5 The specific implementation process of the rocker-loading electrical property detection device suitable for surface-mount diodes of the present invention is described in detail, but it is not intended to limit the present invention.

[0035] Place the surface-mount diodes 25 in batches into the surface-mount diode rocker 2, connect the rocker vacuum inlet 21 to the vacuum, and start shaking the surface-mount diode rocker 2. During the shaking process, the surface-mount diodes 25 rock back and forth in the surface-mount diode rocker 2. Since there are vacuum holes in the rocker diode positioning grooves 23, when the front surface 251 of the surface-mount diode falls into the diode positioning grooves 23, it will be adsorbed by the vacuum. When the bottom surface 252 of the surface-mount diode falls into the rocker diode positioning grooves 23, it will not be adsorbed due to structural problems. Repeatedly shake the surface-mount diode rocker 2 until all surface-mount diode positioning grooves 23 have fallen into the surface-mount diodes 25, and pour out the excess surface-mount diodes 25 along the rocker discharge port 24.

[0036] Attach the SMD diode flip plate 3 upside down onto the SMD diode rocker 2, and secure it by threading the rocker positioning guide pins 22 through the flip plate positioning holes 31, ensuring that the rocker diode positioning grooves 23 and the flip plate positioning grooves 32 completely overlap. Flip the two together, and place the SMD diode flip plate 3 underneath the SMD diode rocker 2. Disconnect the vacuum pump connected to the rocker vacuum inlet 21, and allow the SMD diodes 25 in the SMD diode rocker 2 to drop into their corresponding SMD diode positioning grooves 32, with the front faces 251 facing upward.

[0037] The surface mount diode flip plate 3 with the surface mount diodes 25 filled in the surface mount diode positioning grooves 32 is placed on the flip plate carrier in the detection device, and the flip plate carrier positioning columns 17 are passed through the flip plate positioning holes 31 to position the surface mount diode flip plate 3.

[0038] Click the start button on the touch screen of the touch screen controller 17 to start the detection device. The flip stage 2 drives the surface mount diode flip disk 3 to move to the set position along the Y-axis slide 3 under the drive of the Y-axis motor 131. At this time, the vacuum suction pen 152 is located vertically above the middle position of the first row of surface mount diode positioning grooves 32 in the surface mount diode flip disk 3. Then, the vacuum suction pen 152 is driven by the X-axis motor 121 and moves along the X-axis sliding mechanism 122 to directly above the first surface mount diode 25 in the upper left corner of the surface mount diode flip disk 3.

[0039] Driven by the Z-axis motor 141, the vacuum pen 152 moves along the Z-axis sliding mechanism 142 until it contacts the surface-mount diode 25. The vacuum pen 152 activates, attracting the surface-mount diode 25 and moving it upward along the Z-axis sliding mechanism 142 back to the Z-axis raised position. The X-axis motor 121 activates, moving the vacuum pen 152 and the attached surface-mount diode 25 along the X-axis sliding mechanism 122 to above the diode electrode holder 11.

[0040] In this embodiment, the diode electrode holder 11 contains two positive test electrodes 111 and two negative test electrodes 112, arranged in parallel with a gap between them. Both electrodes are constructed from highly elastic beryllium copper, allowing them to deform under the action of a test probe, effectively contacting the electrodes of the surface-mount diode 25. This creates an electrical connection, which is then transmitted to the diode tester via wires.

[0041] During testing, the Z-axis motor drives the vacuum pen 152 with the surface-mounted diode 25 adsorbed thereon to move the surface-mounted diode 25 into the diode electrode holder 11 , so that the positive and negative electrodes of the surface-mounted diode 25 contact the positive and negative test electrodes.

[0042] After receiving the relevant action completion signal, the touchscreen controller 17 activates the test portion, and the diode tester starts testing. Upon completion, it returns an end signal (EOT) and a BIN signal indicating whether the tested diode is good, defective, or has a contact defect. This signal is returned to the touchscreen controller 17, and the relevant information is displayed on the touchscreen. After the controller receives the end signal (EOT), it activates the Z-axis motor 141, driving the vacuum pen 152 and the attached diode to lift along the Z-axis slide mechanism 8.

[0043] The controller analyzes the received diode electrical test result BIN signal.

[0044] If the test result is good, that is, if the good BIN signal is received, the X-axis motor drives the diode attached to the vacuum pen 152 along the X-axis slide mechanism 122 to the top of the good discharge box 183 and wait. The vacuum pen 152 is disconnected, and the tested surface-mount diode 25 freely falls into the good discharge box 183.

[0045] If the test result is defective, that is, if a defective BIN signal is received, the X-axis motor drives the diode attached to vacuum pen 152 along X-axis slide mechanism 122 to wait above defective product discharge box 182. Vacuum pen 152 is disconnected from the vacuum, and the tested surface-mount diode 25 freely falls into defective product discharge box 182.

[0046] If the test result indicates a defective product (i.e., a defective product BIN signal is received), the X-axis motor drives the diode attached to vacuum pen 152 along X-axis slide mechanism 122 to wait above defective product discharge box 181. Vacuum pen 152 is disconnected from the vacuum, and the tested surface-mount diode 25 freely falls into defective product discharge box 181.

[0047] After the X-axis motor 121 drives the vacuum suction pen 152 to return to its initial position, it drives the vacuum suction pen to move above the first row and second column of the surface mount diode positioning groove 32 in the surface mount diode flip plate 3, and continues the automated operations of material removal, testing, and discharge until the testing of the first row of materials is completed.

[0048] Subsequently, the vacuum pen 152 returns to its initial position driven by the X-axis motor 121, and the Y-axis motor 131 is activated to move the SMD diode flip plate 3 on the flip plate carrier 161 to the second row of SMD diode positioning grooves 32. The test process is repeated until all SMD diodes in the flip plate are tested.

[0049] The above describes the embodiments of the present invention in detail with reference to the accompanying drawings. However, the present invention is not limited to the above embodiments. Various changes can be made within the scope of knowledge possessed by ordinary technicians in the relevant technical field without departing from the purpose of the present invention.

Claims

1. A rocker-type electrical testing device for surface-mount diodes, characterized by: It comprises a surface-mounted diode shaking plate (2), a surface-mounted diode flip plate (3) and a detection device (1); The detection device (1) comprises a moving mechanism and a detection mechanism; The moving mechanism is provided with a main support fixed base (192) with a touch screen controller (17) inside, a Y-axis sliding mechanism (132) is provided inside the main support fixed base (192), a flip disk carrier (161) is slidably connected to the Y-axis sliding mechanism (132), and flip disk carrier positioning guide pillars (162) are respectively provided on the left and right ends of the flip disk carrier. A Y-axis motor (131) is installed inside the main support fixed base (192) to drive the flip disk carrier (161) above the Y-axis sliding mechanism (132) to move forward and backward on the horizontal plane. A main bracket (191) is connected to an X-axis sliding mechanism (122) at its upper end, an X-axis motor (121) being provided inside the main bracket to drive a Z-axis sliding mechanism (142) to move in a left-right direction, the X-axis sliding mechanism (122) is connected to the Z-axis sliding mechanism (142) in a sliding direction perpendicular to the X-axis sliding mechanism (122), a Z-axis motor (141) is installed inside the Z-axis sliding mechanism (142) and on the upper part of the X-axis sliding mechanism (122), a vacuum pen holder (151) is installed at the lower end of the Z-axis sliding mechanism (142), a vacuum pen (152) being connected below the Z-axis sliding mechanism (142), and the vacuum pen (152) is driven by the Z-axis motor to move in an up-down direction; The detection mechanism comprises a diode electrode fixing seat (11), a contact defective product discharge box (181), a good product discharge box (183), and a bad product discharge box (182); the diode electrode fixing seat (11) is mounted on the upper part of the main bracket fixed base (192) for performing diode testing; the contact defective product discharge box (181), the good product discharge box (183), and the bad product discharge box (182) are placed in a fixed area on the upper part of the main bracket fixed base, and a fixing device is installed at the bottom so that they can be taken out and installed.

2. The rocker-loading electrical testing device for surface-mount diodes according to claim 1, characterized in that: The touch screen controller (17) is a controller of the detection device. Interaction is performed through the touch screen, and the user issues instructions to display the detection status. The controller is connected to the X-axis motor (121), the Y-axis motor (131), the Z-axis motor (141) and the vacuum suction pen (152) for electrical signals.

3. The rocker-loading electrical testing device for surface-mount diodes according to claim 1, characterized in that: The structure of the surface-mount diode rocker (2) is a shell structure with a hollow interior, a rocker diode positioning groove (23) is provided on the upper plane, and a surrounding edge with a height higher than the surface-mount diode is provided around the upper plane, and a gap exists in the surrounding edge as a rocker discharge port (24), and a rocker vacuum inlet (21) is provided in the middle of the surface-mount diode rocker (2) connected to the inner cavity, a vacuum hole is provided in the rocker diode positioning groove (23) and is connected to the inner cavity, and the rocker diode positioning groove (23) can be fitted with the front of the surface-mount diode (25), and the structure of the surface-mount diode rocker (2) is that rocker positioning guide pillars (22) are respectively installed at the left and right ends of the surrounding edge.

4. A rocker-loading electrical testing device for surface-mount diodes according to claim 1 or 3, characterized in that: The cross section of the surface-mounted diode flip disk (3) is in a solid "convex" shape, with the middle portion being higher than the left and right ends, and the height being the same as the height of the surrounding edge of the surface-mounted diode shaking disk (2). The middle portion is provided with a surface-mounted diode positioning groove (32) which corresponds one-to-one with the shaking disk diode positioning groove (23) on the surface-mounted diode shaking disk (2). The left and right ends are provided with surface-mounted diode flip disk positioning holes (31), the specific positions of which correspond to the shaking disk positioning guide pillars (22).

5. The rocker-loading electrical testing device for surface-mount diodes according to claim 4, characterized in that: The surface-mounted diode flip disk positioning hole (31) is also used in conjunction with the flip disk carrier positioning guide column (162) on the flip disk carrier (161) to achieve the goal of fixing the surface-mounted diode flip disk (3) on the flip disk carrier (161) for movement.

6. The rocker-loading electrical testing device for surface-mount diodes according to claim 1, characterized in that: Heat sinks are installed on the exterior of the X-axis motor (121), the Y-axis motor (131), and the Z-axis motor (141), i.e., on the housings corresponding to the X-axis sliding mechanism (122), the Y-axis sliding mechanism (132), and the Z-axis sliding mechanism (142).

7. The rocker-loading electrical testing device for surface-mount diodes according to claim 1, characterized in that: A positive electrode test electrode (111) and a negative electrode test electrode (112) are fixed inside the diode electrode fixing seat (11), and both are connected to a diode tester via wires to form a Kelvin test circuit.

8. The rocker-loading electrical testing device for surface-mount diodes according to claim 7, characterized in that: The positive electrode test electrode (111) and the negative electrode test electrode (112) are both made of highly elastic beryllium copper material, and are deformed under the action of the vacuum pen (152) to fully contact the electrodes of the surface-mounted diode (25).

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