Double-source constant current system and experimental index detection system
The current sampling module and precision control technology of the dual-source constant current system solve the problem of insufficient current control accuracy of existing constant current sources within a wide measurement range, and achieve high-precision current output and circuit protection under electromagnetic interference.
Patent Information
- Application Number
- CN202421978854.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-14
- Publication Date
- 2025-09-23
- Estimated Expiration
- 2034-08-14
AI Technical Summary
Existing constant current sources are difficult to achieve precise constant current control of 0.01A within a wide measurement range, and the current control accuracy is insufficient.
A dual-source constant current system is adopted, including a current Hr sampling module and a current Sr sampling module, which are used for wide-scale and small-scale current sampling respectively. Precision control is performed through a four-channel AD conversion module and a single-chip microcomputer step control module, and combined with a power output module, accurate output of wide-scale and small-scale current is achieved.
The control accuracy of wide-range current output is significantly improved, achieving precise constant current control of 0.01A within the range of 1000A, and avoiding damage to the test circuit caused by laboratory electromagnetic interference.
Smart Images

Figure CN223377376U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of electronic circuit applications, in particular to a dual-source constant current system and an experimental index detection system. Background Art
[0002] In the field of electronics, the accuracy of current control is crucial to ensuring device performance and reliability. Precision constant current power supply technology, as a technology that can provide highly stable and accurate current output, has been widely used in multiple industrial fields.
[0003] In the fields of precision measuring instruments, medical equipment, scientific research and experimental testing, etc., precision constant current power supply technology has significant advantages in current control accuracy, response speed, and long-term stability. In scenarios such as battery charging, capacitor charging, and electromagnetic field formation, precision constant current power supply technology is also involved, requiring precision constant current circuits and constant current power supplies. Even if existing constant current power supplies rely on precision components, they cannot achieve precise control of wide and small measurements. For example, a constant current source with a range of 1000A cannot achieve constant current control of 0.01A. Therefore, the industry needs to design a constant current power supply solution or power supply system to meet the technical requirements of the above application scenarios. Utility Model Content
[0004] The technical problem to be solved by the present invention is: how to design a constant current power supply solution or power supply system that can solve the problem of insufficient current control accuracy in a large-scale constant current source and significantly improve the control accuracy of a wide range of current output.
[0005] Therefore, in order to solve the above problems, the embodiment of the present invention proposes a dual-source constant current system and an experimental index detection system, which can solve the problem of insufficient current control accuracy in a large-scale constant current source and significantly improve the control accuracy of a wide-scale current output. In the first aspect, the embodiment of the present invention proposes a dual-source constant current system, wherein the dual-source constant current system is connected to a special device for providing current to the special device, and the dual-source constant current system includes: a current Hr sampling module, a current Sr sampling module, a four-channel AD conversion module, a single-chip microcomputer grading control module, a four-channel DA conversion module, and a power output module; the current Hr sampling module is connected to the four-channel AD conversion module, the current Sr sampling module is connected to the four-channel AD conversion module, the four-channel AD conversion module is connected to the single-chip microcomputer grading control module, the single-chip microcomputer grading control module is connected to the four-channel DA conversion module, the four-channel DA conversion module is connected to the power output module, the power output module is connected to the current Hr sampling module and the current Sr sampling module respectively, and the power output module is also connected to the special device.
[0006] A further technical solution is that the power output module of the dual-source constant current system includes a constant current Hr power module, a constant current Sr power module, and a coupling output module; the four-channel DA conversion module is connected to the constant current Hr power module, the four-channel DA conversion module is connected to the constant current Sr power module, the constant current Hr power module is respectively connected to the current Hr sampling module and the coupling output module, the constant current Hr power module is respectively connected to the constant current Sr power module and the coupling output module, and the coupling output module is connected to the dedicated equipment. In the above solution, the current Hr sampling module is a High-Range current sampling module for wide measurement; the current Sr sampling module is a Small-Range current sampling module for small measurement.
[0007] Its further technical solution is that the dual-source constant current system also includes a human-machine operation module, and the human-machine operation module is connected to the single-chip microcomputer grading control module to realize the user's grading control of the single-chip microcomputer. Among them, the analog-to-digital conversion ADC of the single-chip microcomputer is generally a 0 to 10V range, that is, the current of 0 to 1000A will be converted into a 0 to 10V signal through the sensor. In order to improve the resolution within 10A, it is necessary to add a 0 to 10V corresponding to 0 to 10A sensor; for this, according to the scope of use, it is necessary to switch the signal processing of the two sensors, that is, it is necessary to realize the user's grading control of the single-chip microcomputer. Furthermore, for currents below 10A, a small current sensor is used, and for currents above 10A, a large current sensor is used. By extension, multiple sensors can also be used for grading detection.
[0008] In the second aspect, the embodiment of the present invention also proposes an experimental index detection system, which is used to test the parameter indicators of special equipment in the electromagnetic interference environment of the laboratory. The special equipment is connected to the dual-source constant current system as described in the first aspect, and the input current of the special equipment is derived from the dual-source constant current system; the test special equipment is also connected to a device Hr test circuit and a device Sr test circuit, and the device Hr test circuit and the device Sr test circuit are both connected to a general control unit, and the general control unit collects the output current of the special equipment. In the above scheme, the input current is a current that can be precisely adjusted, for example, engineers perform continuous numerical precision adjustment of the input current in the laboratory; further, in the process of continuously adjusting the input current of the special equipment, the components of the test circuit will not be damaged due to the electromagnetic interference of the laboratory.
[0009] Its further technical solution is that the experimental index detection system also includes a proximal current sensing unit, a remote current sensing unit, a first Hr conduction state switch unit, and a second Sr conduction state switch unit; the special equipment is connected to the proximal current sensing unit and the remote current sensing unit, and the first Hr conduction state switch unit and the second Sr conduction state switch unit are connected to each other; the first Hr conduction state switch unit is also connected to the main control unit, the proximal current sensing unit, and the remote current sensing unit, and the second Sr conduction state switch unit is also connected to the main control unit, the proximal current sensing unit, and the remote current sensing unit.
[0010] Its further technical solution is that the proximal current sensing unit includes a first conversion end, a first path end, a first circuit breaker end, and a first induction end. The conduction states of the first path end and the first circuit breaker end are mutually exclusive, and the first induction end is used to control the conduction states of the first path end and the first circuit breaker end; the main control unit is connected to and controls the first induction end, the proximal current sensing unit is connected to the first conversion end of the first Hr conduction state switch unit, and the first path end of the first Hr conduction state switch unit is connected to the dedicated device.
[0011] Its further technical solution is that the remote current sensing unit includes a second conversion end, a second path end, a second circuit breaker end, and a second induction end. The conduction states of the second path end and the second circuit breaker end are mutually exclusive, and the second induction end is used to control the conduction states of the second path end and the second circuit breaker end; the main control unit is connected to and controls the second induction end, the proximal current sensing unit is connected to the second conversion end of the second Sr conduction state switch unit, the second path end of the second Sr conduction state switch unit is connected to the remote current sensing unit, and the remote current sensing unit is connected to the dedicated device.
[0012] In summary, the present invention adds a precise current sampling circuit to two conventional DC power supply circuits with different measurements. The current sampling circuit is divided into wide-measurement current sampling and small current sampling. The two circuits are independently fed back to the analog-to-digital converter and sent to the single-chip microcomputer for processing. Power outputs of different measurements are selected according to application requirements; the ratio of large and small measurements is allocated in multiples of 1000:1. For example, taking the full measurement of 1000A as an example, the full measurement of the small-measurement power supply only requires 1A. In this way, under the premise of the same accuracy, the same precision and wide-measurement current output control can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS
[0013] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0014] Figure 1 This is a circuit block diagram of a dual-source constant current system proposed in an embodiment of the present utility model.
[0015] Figure 2 This is another circuit block diagram of the dual-source constant current system proposed in an embodiment of the present utility model.
[0016] Figure 3 This is another circuit block diagram of the dual-source constant current system proposed in an embodiment of the present utility model.
[0017] Figure 4 This is a circuit block diagram of the experimental indicator detection system proposed in an embodiment of the present utility model. DETAILED DESCRIPTION
[0018] The following will be combined with the accompanying drawings of the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments. Similar component numbers in the drawings represent similar components. Obviously, the embodiments described below are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts are within the scope of protection of the present invention.
[0019] It should be understood that the terms used in this specification of the embodiments of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the embodiments of the present invention. As used in the specification of the embodiments of the present invention and the appended claims, the singular forms "a", "an" and "the" are intended to include plural forms unless the context clearly indicates otherwise.
[0020] Example
[0021] See also Figures 1 to 3, is a dual-source constant current system proposed in an embodiment of the present utility model, the dual-source constant current system is connected to a dedicated device for providing current to the dedicated device, the dual-source constant current system includes: a current Hr sampling module, a current Sr sampling module, a four-channel AD conversion module, a single-chip microcomputer grading control module, a four-channel DA conversion module, and a power output module; the current Hr sampling module is connected to the four-channel AD conversion module, the current Sr sampling module is connected to the four-channel AD conversion module, the four-channel AD conversion module is connected to the single-chip microcomputer grading control module, the single-chip microcomputer grading control module is connected to the four-channel DA conversion module, the four-channel DA conversion module is connected to the power output module, the power output module is connected to the current Hr sampling module and the current Sr sampling module respectively, and the power output module is also connected to the dedicated device. In the above scheme, accuracy is resolution, which is a relative value. For example, 0.001A / 10A and 0.001A / 0.1A both include 0.001A, but they represent different accuracy / resolution. From the perspective of range, the former is a large range of 10A, while the latter is not a large range.
[0022] Furthermore, the power output module of the dual-source constant current system includes a constant current Hr power module, a constant current Sr power module, and a coupling output module; the four-channel DA conversion module is connected to the constant current Hr power module, the four-channel DA conversion module is connected to the constant current Sr power module, the constant current Hr power module is respectively connected to the current Hr sampling module and the coupling output module, the constant current Hr power module is respectively connected to the constant current Sr power module and the coupling output module, and the coupling output module is connected to the dedicated equipment. In the above scheme, the current Hr sampling module is a High-Range current sampling module for wide measurement; the current Sr sampling module is a Small-Range current sampling module for small measurement.
[0023] Furthermore, the dual-source constant current system also includes a human-machine operation module, which is connected to the single-chip microcomputer grading control module to realize the user's grading control of the single-chip microcomputer. Among them, the analog-to-digital conversion ADC of the single-chip microcomputer is generally a 0 to 10V range, that is, the current of 0 to 1000A will be converted into a 0 to 10V signal through the sensor. In order to improve the resolution within 10A, it is necessary to add a 0 to 10V corresponding to 0 to 10A sensor; for this, according to the scope of use, it is necessary to switch the signal processing of the two sensors, that is, it is necessary to realize the user's grading control of the single-chip microcomputer. Furthermore, for currents below 10A, a small current sensor is used, and for currents above 10A, a large current sensor is used. By extension, multiple sensors can also be used for grading detection.
[0024] Further, see Figure 4, the embodiment of the present utility model also proposes an experimental index detection system, the experimental index detection system is used to test the parameter indicators of special equipment in the electromagnetic interference environment of the laboratory, the special equipment is connected to the dual-source constant current system as described in any of the above embodiments, and the input current of the special equipment is derived from the dual-source constant current system; the test special equipment is also connected to a device Hr test circuit, and a device Sr test circuit, the device Hr test circuit and the device Sr test circuit are both connected to a general control unit, and the general control unit collects the output current of the special equipment. In the above scheme, the input current is a current that can be precisely adjusted, for example, engineers perform continuous and precise adjustments to the input current in the laboratory; further, in the process of continuously adjusting the input current of the special equipment, the components of the test circuit will not be damaged due to the electromagnetic interference of the laboratory.
[0025] Furthermore, the experimental index detection system also includes a proximal current sensing unit, a remote current sensing unit, a first Hr conduction state switch unit, and a second Sr conduction state switch unit; the dedicated equipment is connected to the proximal current sensing unit and the remote current sensing unit, and the first Hr conduction state switch unit and the second Sr conduction state switch unit are connected to each other; the first Hr conduction state switch unit is also connected to the main control unit, the proximal current sensing unit, and the remote current sensing unit, and the second Sr conduction state switch unit is also connected to the main control unit, the proximal current sensing unit, and the remote current sensing unit.
[0026] Furthermore, the proximal current sensing unit of the experimental index detection system includes a first conversion end, a first path end, a first circuit breaker end, and a first induction end. The conduction states of the first path end and the first circuit breaker end are mutually exclusive, and the first induction end is used to control the conduction states of the first path end and the first circuit breaker end; the general control unit is connected to and controls the first induction end, the proximal current sensing unit is connected to the first conversion end of the first Hr conduction state switch unit, and the first path end of the first Hr conduction state switch unit is connected to the dedicated equipment.
[0027] Furthermore, the remote current sensing unit of the experimental index detection system includes a second conversion end, a second path end, a second circuit breaker end, and a second induction end. The conduction states of the second path end and the second circuit breaker end are mutually exclusive, and the second induction end is used to control the conduction states of the second path end and the second circuit breaker end; the main control unit is connected to and controls the second induction end, the proximal current sensing unit is connected to the second conversion end of the second Sr conduction state switch unit, the second path end of the second Sr conduction state switch unit is connected to the remote current sensing unit, and the remote current sensing unit is connected to the dedicated equipment.
[0028] Furthermore, the input current of the experimental index detection system is a current that can be precisely scaled and adjusted. When engineers continuously and precisely adjust the input current for index detection in the laboratory, the components of the test circuit will not be damaged due to electromagnetic interference in the laboratory.
[0029] To sum up, in the fields of precision measuring instruments, medical equipment, scientific research experiments and testing, precision constant current power supply technology has significant advantages in current control accuracy, response speed, and long-term stability; in scenarios such as battery charging, capacitor charging, and electromagnetic field formation, precision constant current power supply technology is also involved, which requires precision constant current circuits and constant current power supplies; even if existing constant current power supplies rely on precision components, they cannot achieve precise control of wide and small measurements. For example, a constant current source with a range of 1000A is difficult to achieve constant current control of 0.01A; for the above technical scenarios, this application proposes a dual-source constant current system and an experimental index detection system. The dual-source constant current system can solve the problem of insufficient current control accuracy in a large-scale constant current source and significantly improve the control accuracy of wide-scale current output; the input current of the experimental index detection system is a current that can be precisely adjusted. In the process of engineers continuously and precisely adjusting the input current in the laboratory for index detection, the components of the test circuit will not be damaged due to electromagnetic interference in the laboratory.
[0030] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.
[0031] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature specified as "first" or "second" may explicitly or implicitly include one or more of such features. In the description of this utility model, "plurality" means two or more, unless otherwise specifically defined.
[0032] In this utility model, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. For those skilled in the art, the specific meanings of the above terms in this utility model can be understood according to specific circumstances.
[0033] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Moreover, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.
[0034] In the description of this specification, the reference terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" mean that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic expressions of the above terms should not be understood as necessarily referring to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine the different embodiments or examples described in this specification.
[0035] Obviously, those skilled in the art may make various modifications and variations to the present invention without departing from the spirit and scope of the present invention. Thus, as long as these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is intended to include such modifications and variations.
[0036] The above description is a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and such modifications or substitutions should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.
Claims
1. A dual-source constant current system, characterized in that: The dual-source constant current system is connected to a dedicated device for providing current to the dedicated device, and the dual-source constant current system includes: Current Hr sampling module, current Sr sampling module, four-channel AD conversion module, single-chip microcomputer step control module, four-channel DA conversion module, power output module; The current Hr sampling module is connected to the four-channel AD conversion module, the current Sr sampling module is connected to the four-channel AD conversion module, the four-channel AD conversion module is connected to the single-chip microcomputer grading control module, the single-chip microcomputer grading control module is connected to the four-channel DA conversion module, the four-channel DA conversion module is connected to the power output module, the power output module is respectively connected to the current Hr sampling module and the current Sr sampling module, and the power output module is also connected to the special equipment.
2. The dual-source constant current system according to claim 1, characterized in that: The power output module of the dual-source constant current system includes a constant current Hr power module, a constant current Sr power module, and a coupling output module; The four-channel DA conversion module is connected to the constant current Hr power supply module, the four-channel DA conversion module is connected to the constant current Sr power supply module, the constant current Hr power supply module is respectively connected to the current Hr sampling module and the coupling output module, the constant current Hr power supply module is respectively connected to the constant current Sr power supply module and the coupling output module, and the coupling output module is connected to the dedicated equipment.
3. The dual-source constant current system according to claim 2, characterized in that: The dual-source constant current system further includes a human-machine operation module, which is connected to the single-chip microcomputer grading control module and is used to enable the user to control the grading of the single-chip microcomputer.
4. An experimental index detection system, characterized by: The experimental index detection system is used to test the parameter indicators of special equipment in the electromagnetic interference environment of the laboratory. The special equipment is connected to the dual-source constant current system according to any one of claims 1 to 3, and the input current of the special equipment comes from the dual-source constant current system; the test special equipment is also connected to a device Hr test circuit and a device Sr test circuit. The device Hr test circuit and the device Sr test circuit are both connected to a general control unit, and the general control unit collects the output current of the special equipment.
5. The experimental index detection system according to claim 4, characterized in that: The experimental index detection system also includes a proximal current sensing unit, a remote current sensing unit, a first Hr conduction state switch unit, and a second Sr conduction state switch unit; the dedicated equipment is connected to the proximal current sensing unit and the remote current sensing unit, and the first Hr conduction state switch unit and the second Sr conduction state switch unit are connected to each other; the first Hr conduction state switch unit is also connected to the main control unit, the proximal current sensing unit, and the remote current sensing unit, and the second Sr conduction state switch unit is also connected to the main control unit, the proximal current sensing unit, and the remote current sensing unit.
6. The experimental index detection system according to claim 5, characterized in that: The proximal current sensing unit includes a first conversion end, a first path end, a first disconnection end, and a first sensing end. The conduction states of the first path end and the first disconnection end are mutually exclusive. The first sensing end is used to control the conduction state of the first path end and the first disconnection end. The overall control unit is connected to and controls the first sensing end, the proximal current sensing unit is connected to the first conversion end of the first Hr conduction state switch unit, and the first path end of the first Hr conduction state switch unit is connected to the dedicated device.
7. The experimental index detection system according to claim 6, characterized in that: The remote current sensing unit includes a second conversion terminal, a second path terminal, a second disconnect terminal, and a second sensing terminal. The conduction states of the second path terminal and the second disconnect terminal are mutually exclusive. The second sensing terminal is used to control the conduction state of the second path terminal and the second disconnect terminal. The main control unit is connected to and controls the second sensing end, the proximal current sensing unit is connected to the second conversion end of the second Sr conduction state switch unit, the second path end of the second Sr conduction state switch unit is connected to the remote current sensing unit, and the remote current sensing unit is connected to the dedicated device.