Metal plate cabinet of semiconductor detector

By introducing slides and clamping mechanisms into the sheet metal cabinet of the semiconductor tester, the problem of time-consuming replacement and repair in the existing technology is solved, rapid installation and maintenance are achieved, and operational efficiency is improved.

CN223389785UActive Publication Date: 2025-09-26EFT IND AUTOMATION TECH (SUZHOU) CO LTD
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Patent Information

Application Number
CN202422603310.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-10-28
Publication Date
2025-09-26
Estimated Expiration
2034-10-28

AI Technical Summary

Technical Problem

The sheet metal cabinets of existing semiconductor testers take a long time to replace and repair, and the existing fixing methods are not convenient for quick installation and maintenance.

Method used

A slideway and pulley system is used in conjunction with a clamping mechanism. The pulleys and sliders in the slideway are used to achieve rapid installation and maintenance of the semiconductor detector. The clamping mechanism uses forward and reverse threaded rods to drive the threaded blocks and clamping plates to achieve stable clamping of the semiconductor.

Benefits of technology

It realizes the rapid installation and maintenance of semiconductor testers in sheet metal cabinets, reduces replacement and maintenance time, and improves operational efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of semiconductor detection, and discloses a metal plate cabinet of a semiconductor detector, which comprises a cabinet body, two slideways are fixedly connected to the left end in the cabinet body at equal intervals, pulleys I are rotatably connected to the front ends of adjacent sides of the two slideways, sliding strips are slidably connected to the adjacent sides of the two slideways, and the pulleys I are rotatably connected to the front ends of the two slideways. Second pulleys are rotationally connected to the rear ends of the outer sides of the two sliding strips, fixing plates are fixedly connected to the adjacent sides of the two sliding strips, supporting ropes are fixedly connected to the left side and the right side of the front end of the top of each fixing plate, and a clamping mechanism is installed at the upper end of the right side of the cabinet body. According to the utility model, the pulley I and the sliding strip are fixed in the slideway, the pulley and the fixing plate are fixed on the sliding strip, the semiconductor detector is installed on the fixing plate, and the fixing plate is pulled out when replacement and maintenance are needed, so that the effect of rapidly installing and maintaining the semiconductor detector in the sheet metal cabinet is realized.
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Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor detection, in particular to a sheet metal cabinet of a semiconductor detector. Background Art

[0002] A semiconductor tester is a professional device used to test the performance and quality of semiconductor materials and devices. By testing the content of impurity elements in the material, it can ensure that the material meets the requirements of semiconductor manufacturing.

[0003] The sheet metal cabinet of a semiconductor tester is shaped like a rectangular parallelepiped to accommodate the layout of the tester's internal components and facilitate placement on workbenches in laboratories and production workshops. The outer surface of the cabinet generally undergoes a fine surface treatment, and its size varies depending on the function and usage scenario of the tester.

[0004] Existing sheet metal cabinets for semiconductor testers have two fixing methods: first installing the equipment inside and then welding the cabinet opening, and then placing the tester into the cabinet and fixing it inside the cabinet with screws. These two methods will cause instability when replacing and repairing semiconductor testers, resulting in a long replacement and repair time. Utility Model Content

[0005] In order to make up for the above shortcomings, the utility model provides a sheet metal cabinet for a semiconductor tester, aiming to improve the problem in the prior art that the replacement and maintenance are time-consuming due to the two existing fixing methods.

[0006] In order to achieve the above-mentioned purpose, the present invention adopts the following technical solution: a sheet metal cabinet for a semiconductor detector includes a cabinet body, two slides are equidistantly fixedly connected to the inner left end of the cabinet body, the front ends of the adjacent sides of the two slides are rotatably connected to pulley one, the adjacent sides of the two slides are slidably connected to a slide bar, the outer rear ends of the two slide bars are rotatably connected to pulley two, the adjacent sides of the two slide bars are fixedly connected to a fixed plate, the left and right sides of the top front end of the fixed plate are fixedly connected to support ropes, and a clamping mechanism is installed at the upper right end of the cabinet body, and the clamping mechanism is used for clamping during small semiconductor testing.

[0007] As a further description of the above technical solution:

[0008] The clamping mechanism includes a forward threaded rod, which is rotatably connected to the middle part of the upper right end of the cabinet, a turning handle is fixedly connected to the right side of the forward threaded rod, a driving gear is fixedly connected to the left side of the forward threaded rod, a reverse threaded rod is rotatably connected to the front end of the right inner side of the cabinet, the left end of the reverse threaded rod is fixedly connected to the driven gear, the driven gear is meshed with the driving gear, the outer walls of the forward threaded rod and the reverse threaded rod are threadedly connected to threaded blocks, the tops of the two threaded blocks are fixedly connected to limiting blocks, and the bottoms of the two threaded blocks are fixedly connected to splints.

[0009] As a further description of the above technical solution:

[0010] A plurality of auxiliary bars are fixedly connected to the left inner bottom wall of the cabinet body at equal intervals, and the front and rear ends of adjacent sides of the plurality of auxiliary bars are rotatably connected to auxiliary wheels.

[0011] As a further description of the above technical solution:

[0012] The left front end of the cabinet body is equidistantly threadedly connected with a hinge 1, and the right front ends of the two hinges 1 are both threadedly connected with a cabinet door.

[0013] As a further description of the above technical solution:

[0014] A second hinge is threadedly connected to the middle upper portion of the right end of the front side of the cabinet body, and an observation window is threadedly connected to the middle upper portion of the second hinge.

[0015] As a further description of the above technical solution:

[0016] The upper left end of the observation window is fixedly connected with a slide buckle, and the middle part of the slide buckle is slidably connected with a latch.

[0017] As a further description of the above technical solution:

[0018] A display screen is fixedly connected to the rear end of the right side of the top of the cabinet, and an operation key is installed at the rear end of the left side of the top of the cabinet.

[0019] As a further description of the above technical solution:

[0020] The four corners of the bottom of the cabinet are all fixedly connected with support rods, and the bottoms of the plurality of support rods are all fixedly connected with pads.

[0021] The utility model has the following beneficial effects:

[0022] 1. In the utility model, a pulley and a slide bar are fixed in the slideway, a pulley and a fixed plate are fixed on the slide bar, and the semiconductor detector is installed on the fixed plate. When replacement and maintenance are required, the fixed plate can be pulled out, thereby achieving the effect of rapid installation and maintenance of the semiconductor detector in the sheet metal cabinet and reducing the time for replacement and maintenance.

[0023] 2. In the present invention, rotating the handle drives the rotation of the forward threaded rod, the driving gear, the driven gear and the reverse threaded rod, thereby controlling the opposite movement of the two threaded blocks. At the same time, the two clamping plates fixed under the threaded blocks also move oppositely, thereby achieving the effect of clamping smaller semiconductors. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 A three-dimensional diagram of a sheet metal cabinet of a semiconductor tester proposed in the present invention;

[0025] Figure 2 This is a front view of the sheet metal cabinet of the semiconductor tester proposed in the present invention;

[0026] Figure 3 This is a top view of the sheet metal cabinet of the semiconductor tester proposed in the present invention;

[0027] Figure 4 This is a partial structural exploded view of the sheet metal cabinet of the semiconductor tester proposed in the present invention;

[0028] Figure 5 This is an exploded view of the clamping mechanism of the sheet metal cabinet of the semiconductor tester proposed in the present invention.

[0029] Legend:

[0030] 1. Cabinet body; 2. Clamping mechanism; 201. Forward threaded rod; 202. Turning handle; 203. Driving gear; 204. Driven gear; 205. Reverse threaded rod; 206. Threaded block; 207. Limit block; 208. Clamp; 3. Slide; 4. Pulley 1; 5. Slide bar; 6. Pulley 2; 7. Fixed plate; 8. Support rope; 9. Auxiliary bar; 10. Auxiliary wheel; 11. Hinge 1; 12. Cabinet door; 13. Hinge 2; 14. Observation window; 15. Slide buckle; 16. Latch; 17. Display screen; 18. Operation key; 19. Support rod; 20. Pad. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0032] Reference Figure 2 、 Figure 3 and Figure 4 The utility model provides an embodiment of a sheet metal cabinet for a semiconductor detector, including a cabinet body 1, wherein two slideways 3 are fixedly connected to the left end of the interior of the cabinet body 1 at equal distances, the front ends of the adjacent sides of the two slideways 3 are rotatably connected to pulleys 1 and 4, the adjacent sides of the two slideways 3 are slidably connected to slide bars 5, the outer rear ends of the two slide bars 5 are rotatably connected to pulleys 2 and 6, the slideways 3 cooperate with pulleys 1 and 4 and pulleys 2 and 6 to realize the forward and backward movement of the slide bars 5, the adjacent sides of the two slide bars 5 are fixedly connected to fixed plates 7, and the left and right sides of the top front end of the fixed plates 7 are fixedly connected A support rope 8 is connected, and the support rope 8 provides support for the fixed plate 7. A clamping mechanism 2 is installed on the upper right end of the cabinet body 1. The clamping mechanism 2 is used for clamping during small semiconductor testing. A plurality of auxiliary bars 9 are fixedly connected to the left inner bottom wall of the cabinet body 1 at equal intervals. The front and rear ends of the adjacent sides of the plurality of auxiliary bars 9 are rotatably connected to auxiliary wheels 10. The auxiliary wheels 10 assist the sliding of the fixed plate 7. The left front end of the cabinet body 1 is equidistantly threaded with hinges 11. The right front ends of the two hinges 11 are both threadedly connected to cabinet doors 12. The cabinet doors 12 are opened and closed by hinges 11.

[0033] When the cam 11 is in the upright position, the cam 12 is in the upright position, and the cam 13 is in the upright position, and the cam 14 is in the upright position, and the cam 15 is in the upright position, and the cam 16 is in the upright position, and the cam 17 is in the upright position, and the cam 18 is in the upright position, and the cam 19 is in the upright position, and the cam 20 is in the upright position, and the cam 21 is in the upright position, and the cam 22 is in the upright position, and the cam 23 is in the upright position, and the cam 24 is in the upright position, and the cam 25 is in the upright position, and the cam 26 is in the upright position, and the cam 27 is in the upright position, and the cam 28 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam 29 is in the upright position, and the cam

[0034] Reference Figure 1 and Figure 5The clamping mechanism 2 includes a forward threaded rod 201, which is rotatably connected to the middle of the upper right end of the cabinet 1. The right side of the forward threaded rod 201 is fixedly connected to a handle 202, and the left side of the forward threaded rod 201 is fixedly connected to a driving gear 203. The handle 202 drives the driving gear 203 through the forward threaded rod 201. The front end of the right inner side of the cabinet 1 is rotatably connected to a reverse threaded rod 205, and the left end of the reverse threaded rod 205 is fixedly connected to a driven gear 204. The driven gear 204 is meshed with the driving gear 203, and the driving gear 203 drives the reverse threaded rod 205 through the driven gear 204. The rotation of the rod 205, the outer walls of the forward threaded rod 201 and the reverse threaded rod 205 are threadedly connected with a threaded block 206, the tops of the two threaded blocks 206 are fixedly connected to the limit blocks 207, and the bottoms of the two threaded blocks 206 are fixedly connected to the clamping plate 208. The forward threaded rod 201 and the reverse threaded rod 205 drive the clamping plate 208 to move in opposite directions through the two threaded blocks 206. The limit blocks 207 prevent the threaded blocks 206 from rotating. The middle and upper part of the front right end of the cabinet 1 is threadedly connected with the hinge 2 13, and the middle and upper part of the hinge 2 13 is threadedly connected with the observation window 14, and the observation window 14 is opened and closed by the hinge 2 13;

[0035] Specifically, the forward threaded rod 201 is driven to rotate by rotating the handle 202, and when the forward threaded rod 201 rotates, it drives the rotation of the driving gear 203, and then the driving gear 203 continues to drive the driven gear 204 to rotate. At this time, the reverse threaded rod 205 fixed on one side of the driven gear 204 will also rotate. When the forward threaded rod 201 and the reverse threaded rod 205 rotate in opposite directions, the threaded blocks 206 fixed on them will also move in opposite directions. When the threaded block 206 moves, the limit block 207 fixed thereon will prevent it from rotating. At the same time, the two clamping plates 208 fixed thereunder will also move in opposite directions, thereby achieving the effect of clamping smaller semiconductors. The observation window 14 that is opened and closed by the hinge 2 13 makes it easy to place small semiconductor materials into the sheet metal cabinet of the semiconductor detector.

[0036] Reference Figure 2 and Figure 3 , the upper left end of the observation window 14 is fixedly connected with a slide buckle 15, and the middle part of the slide buckle 15 is slidably connected with a latch 16, and the observation window 14 is fixed by the slide buckle 15 and the latch 16. The rear end of the top right side of the cabinet 1 is fixedly connected with a display screen 17, and the rear end of the top left side of the cabinet 1 is equipped with an operation key 18. The display screen 17 can display the test data, and the operation key 18 can operate the semiconductor tester. The four corners of the bottom of the cabinet 1 are fixedly connected with support rods 19, and the bottoms of the multiple support rods 19 are fixedly connected with pads 20. The support rods 19 provide support for the sheet metal cabinet of the semiconductor tester;

[0037] Specifically, the observation window 14 is fixed to the cabinet 1 through a slide buckle 15 in conjunction with a latch 16. Various operations of the semiconductor tester can be controlled by the operation key 18, and various test data are displayed on the display screen 17. The support rod 19 can provide support for the sheet metal cabinet of the semiconductor tester, and the protective pad 20 provides protection and anti-slip effect for the support rod 19.

[0038] Working principle: Two slideways 3 are fixed in the sheet metal cabinet of the semiconductor detector. Pulley 1 4 is fixed in both slideways 3, and there are also two slide bars 5. Pulley 2 6 is fixed on both slide bars 5. A fixing plate 7 is fixed in the middle of the two slide bars 5. When the semiconductor detector is installed in the sheet metal cabinet, the fixing plate 7 can be pulled out. At this time, the pulley 1 4 and the pulley 2 6 fixed on the slideway 3 and the slide bar 5 will rotate in the slideway 3, so that the fixing plate 7 can slide out smoothly, and the support rope 8 provides support for the fixing plate 7. The semiconductor detector is installed on the fixing plate 7. When replacement and maintenance are required, the fixing plate 7 can be pulled out. In this way, the semiconductor detector can be quickly installed and maintained in the sheet metal cabinet, which reduces the time for replacement and maintenance.

[0039] The forward threaded rod 201 is driven to rotate by rotating the handle 202, and when the forward threaded rod 201 rotates, it drives the driving gear 203 to rotate, and then the driving gear 203 continues to drive the driven gear 204 to rotate. At this time, the reverse threaded rod 205 fixed to one side of the driven gear 204 will also rotate. When the forward threaded rod 201 and the reverse threaded rod 205 rotate in opposite directions, the threaded blocks 206 fixed on them will also move in opposite directions. When the threaded block 206 moves, the limit block 207 fixed on it will prevent it from rotating. At the same time, the two clamping plates 208 fixed thereunder will also move in opposite directions, thereby achieving the effect of clamping a smaller semiconductor.

[0040] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent replacements for some of the technical features therein. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A sheet metal cabinet for a semiconductor tester, comprising a cabinet body (1), characterized in that: The left end of the interior of the cabinet (1) is equidistantly fixedly connected to two slideways (3), the front ends of the adjacent sides of the two slideways (3) are rotatably connected to pulley one (4), the adjacent sides of the two slideways (3) are slidably connected to a slide bar (5), the outer rear ends of the two slide bars (5) are rotatably connected to pulley two (6), the adjacent sides of the two slide bars (5) are fixedly connected to a fixed plate (7), the left and right sides of the top front end of the fixed plate (7) are fixedly connected to support ropes (8), and a clamping mechanism (2) is installed on the upper right end of the cabinet (1), and the clamping mechanism (2) is used for clamping during small semiconductor testing.

2. The sheet metal cabinet for a semiconductor tester according to claim 1, characterized in that: The clamping mechanism (2) comprises a forward threaded rod (201), the forward threaded rod (201) is rotatably connected to the middle portion of the upper right end of the cabinet (1), the right side of the forward threaded rod (201) is fixedly connected to a handle (202), the left side of the forward threaded rod (201) is fixedly connected to a driving gear (203), the front end of the right inner side of the cabinet (1) is rotatably connected to a reverse threaded rod (205), the left end of the reverse threaded rod (205) is fixedly connected to a driven gear (204), the driven gear (204) is meshed with the driving gear (203), the outer walls of the forward threaded rod (201) and the reverse threaded rod (205) are both threadedly connected to threaded blocks (206), the tops of the two threaded blocks (206) are both fixedly connected to limit blocks (207), and the bottoms of the two threaded blocks (206) are both fixedly connected to clamping plates (208).

3. The sheet metal cabinet for a semiconductor tester according to claim 1, characterized in that: A plurality of auxiliary bars (9) are fixedly connected to the left inner bottom wall of the cabinet body (1) at equal intervals, and the front and rear ends of adjacent sides of the plurality of auxiliary bars (9) are rotatably connected to auxiliary wheels (10).

4. The sheet metal cabinet for a semiconductor tester according to claim 1, wherein: The left front end of the cabinet body (1) is equidistantly threadedly connected to a hinge (11), and the right front ends of the two hinges (11) are both threadedly connected to a cabinet door (12).

5. The sheet metal cabinet for a semiconductor tester according to claim 1, characterized in that: The upper middle portion of the front right end of the cabinet body (1) is threadedly connected to a hinge 2 (13), and the upper middle portion of the hinge 2 (13) is threadedly connected to an observation window (14).

6. The sheet metal cabinet for a semiconductor tester according to claim 5, characterized in that: The upper left end of the observation window (14) is fixedly connected with a slide buckle (15), and the middle part of the slide buckle (15) is slidably connected with a latch (16).

7. The sheet metal cabinet for a semiconductor tester according to claim 1, characterized in that: A display screen (17) is fixedly connected to the rear end of the right top portion of the cabinet (1), and an operation key (18) is installed at the rear end of the left top portion of the cabinet (1).

8. The sheet metal cabinet for a semiconductor tester according to claim 1, wherein: Support rods (19) are fixedly connected at the four corners of the bottom of the cabinet (1), and protective pads (20) are fixedly connected at the bottoms of the plurality of support rods (19).