High-voltage power supply circuit for double-pulse test

Abstract

The utility model discloses a high-voltage power supply circuit for a double-pulse test. The high-voltage power supply circuit comprises a single-pulse generator, a high-voltage storage capacitor, a first IGBT, a second IGBT, a third IGBT, a fourth IGBT, a fifth IGBT, a sixth IGBT, a first inductor, a voltage source, a low-voltage energy storage capacitor, a second inductor, an insulated gate bipolar transistor and a diode. Through the above mode, the test power supply has a soft switching function effect, can realize automatic switching of the test power supply, avoids operation danger caused by manual switching, and does not need additional switching devices, so that the power supply is relatively compact in structure and relatively small in size, operates in a monopulse mode, reduces heat productivity, does not need heat dissipation, and is convenient to use. And the overall power supply volume can be further reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of test circuits, in particular to a high-voltage power supply circuit for double-pulse testing. Background Art

[0002] High-power electronic devices in rail transit equipment are required to undergo double pulse testing during the design phase. The testing principle is as follows:

[0003] Figure 1 For the two-level inverter circuit used in the traction inverter in rail transit, when performing a double-pulse test, the gate potential of the five IGBTs (V01, V02, V04, V05, and V06) is first pulled down to turn off the IGBTs. Then, switch K1 is opened to charge capacitor C1 to the maximum bus voltage of the power module (generally high voltage, 2000V or 4000V). Then, switch K1 is opened, and the 2000V voltage stored in capacitor C1 is used to complete the subsequent test. For example, a double-pulse signal is given to the V03 IGBT, and the current of inductor L1 is increased to a certain level before being disconnected. Finally, the voltage signals of the two IGBTs (V03 and V04) and the current signal of the V03 IGBT are monitored by an oscilloscope to evaluate the rationality of the main power circuit design of the power module.

[0004] However, the above test must disconnect switch K1 because this type of test is dangerous if the voltage source S1 is continuously supplying power. Therefore, to disconnect switch K1 after capacitor C1 is fully charged, a high-voltage contactor or air switch must be used. The former is larger in size, and the latter is more dangerous to operate manually. Utility Model Content

[0005] In view of the deficiencies in the prior art, the present invention provides a high-voltage power supply circuit for double-pulse testing, which can solve the above technical problems.

[0006] In order to solve the above technical problems, the present invention provides the following technical solutions: a high-voltage power supply circuit for double-pulse testing, comprising a single pulse generator, a high-voltage energy storage capacitor, a first IGBT, a second IGBT, a third IGBT, a fourth IGBT, a fifth IGBT, a sixth IGBT and a first inductor, wherein the first IGBT and the sixth IGBT are connected in series, the second IGBT and the fifth IGBT are connected in series, the third IGBT and the fourth IGBT are connected in series, the high-voltage energy storage capacitor is connected in parallel at both ends of the first IGBT and the sixth IGBT, the first inductor is connected in parallel at both ends of the fourth IGBT, and the connection between the first IGBT and the sixth IGBT is connected in parallel. As the first pulse signal connection point, the connection between the second IGBT and the fifth IGBT serves as the second pulse signal connection point, and is characterized in that it also includes: a voltage source, whose negative end is grounded; a low-voltage energy storage capacitor, one end of which is connected to the positive end of the voltage source, and the other end of which is connected to the negative end of the voltage source; a second inductor, one end of which is connected to the positive end of the voltage source; an insulated gate bipolar transistor, a first pin of which is connected to the output end of the single pulse generator, a second pin of which is connected to the other end of the second inductor, and a third pin of which is grounded; a diode, a positive end of which is connected to the other end of the second inductor, and a negative end of which is connected to one end of the high-voltage energy storage capacitor; wherein the other end of the high-voltage energy storage capacitor is grounded.

[0007] Furthermore, it also includes an IGBT driving board, one end of which is connected to the output end of the single pulse generator, and the other end of which is connected to the first pin of the insulated gate bipolar transistor.

[0008] Furthermore, the insulated gate bipolar transistor is an NMOS tube, wherein the first pin of the insulated gate bipolar transistor is the gate of the NMOS tube, the second pin of the insulated gate bipolar transistor is the source of the NMOS tube, and the third pin of the insulated gate bipolar transistor is the drain of the NMOS tube.

[0009] Compared with the prior art, the present invention provides a high-voltage power supply circuit for dual-pulse testing, which has the following beneficial effects: the high-voltage power supply circuit for dual-pulse testing disclosed in the present invention includes a single pulse generator, a high-voltage energy storage capacitor, a first IGBT, a second IGBT, a third IGBT, a fourth IGBT, a fifth IGBT, a sixth IGBT, a first inductor, a voltage source, a low-voltage energy storage capacitor, a second inductor, an insulated gate bipolar transistor, and a diode. Through the above-mentioned method, the present invention has a soft switching function effect, which can realize the automatic switching of the test power supply, avoid the operational danger caused by manual switching, and do not require additional switching devices. Therefore, the power supply structure is relatively compact and the power supply volume is small. At the same time, it operates in a single-pulse mode, which reduces heat generation, thereby eliminating the need for heat dissipation, and the overall power supply volume can be further reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 This is a schematic diagram of the structure of a traditional double-pulse test circuit;

[0011] Figure 2 This is a schematic diagram of the structure of the high-voltage power supply circuit for double-pulse testing of the utility model. DETAILED DESCRIPTION

[0012] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0013] like Figure 2 As shown, the utility model provides a high-voltage power supply circuit for double-pulse testing, including a single pulse generator 10, a high-voltage energy storage capacitor C1, a first IGBT01, a second IGBT02, a third IGBT03, a fourth IGBT04, a fifth IGBT05, a sixth IGBT06, a first inductor L1, a voltage source S1, a low-voltage energy storage capacitor C2, a second inductor L2, an insulated gate bipolar transistor Q1 and a diode D1.

[0014] In this embodiment, the first IGBT01 and the sixth IGBT06 are connected in series, the second IGBT02 and the fifth IGBT05 are connected in series, the third IGBT03 and the fourth IGBT04 are connected in series, the high-voltage energy storage capacitor C1 is connected in parallel at both ends of the first IGBT01 and the sixth IGBT06, the first inductor L1 is connected in parallel at both ends of the fourth IGBT04, the connection between the first IGBT01 and the sixth IGBT06 serves as the first pulse signal connection point, and the connection between the second IGBT02 and the fifth IGBT05 serves as the second pulse signal connection point. It should be understood that the double pulse signal is input from the connection between the first IGBT01 and the sixth IGBT06 and the connection between the second IGBT02 and the fifth IGBT05, and the high-voltage energy storage capacitor C1, the first IGBT01, the second IGBT02, the third IGBT03, the fourth IGBT04, the fifth IGBT05, the sixth IGBT06 and the first inductor L1 are implemented using existing products, so their connection relationship and principles also adopt existing technologies, and the double pulse test also adopts existing technologies, which will not be elaborated here.

[0015] The negative terminal of the voltage source S1 is connected to the ground GND.

[0016] One end of the low-voltage energy storage capacitor C2 is connected to the positive terminal of the voltage source S1 , and the other end of the low-voltage energy storage capacitor C2 is connected to the negative terminal of the voltage source S1 .

[0017] One end of the second inductor L2 is connected to the positive terminal of the voltage source S1 .

[0018] A first pin of the IGBT Q1 is connected to the output end of the single pulse generator 10 , a second pin of the IGBT Q1 is connected to the other end of the second inductor L2 , and a third pin of the IGBT Q1 is grounded GND.

[0019] In this embodiment, the insulated gate bipolar transistor Q1 is an IGBT tube, wherein the first pin of the insulated gate bipolar transistor Q1 is the gate of the IGBT tube, the second pin of the insulated gate bipolar transistor Q1 is the emitter of the IGBT tube, and the third pin of the insulated gate bipolar transistor Q1 is the collector of the IGBT tube.

[0020] The positive terminal of the diode D1 is connected to the other end of the second inductor L2 , and the negative terminal of the diode D1 is connected to one end of the high-voltage energy storage capacitor C1 .

[0021] Preferably, the other end of the high-voltage energy storage capacitor C2 is grounded.

[0022] Furthermore, the high-voltage power supply circuit for double-pulse testing also includes an IGBT driver board, wherein one end of the IGBT driver board is connected to the output end of the single pulse generator 10, and the other end of the IGBT driver board is connected to the first pin of the insulated gate bipolar transistor Q1.

[0023] Specifically, the IGBT driving board includes a boost resistor to increase the voltage of the first pin of the insulated gate bipolar transistor Q1 through the boost resistor.

[0024] The specific principles are as follows:

[0025] Before performing the double pulse test, the voltage source S1 is first started to charge the low-voltage energy storage capacitor C2. After the current of the voltage source S1 is zero, which means that the capacitance of the low-voltage energy storage capacitor C2 reaches the output voltage of the voltage source S1, the single pulse generator 10 is used to output a short pulse to the insulated gate bipolar transistor Q1 for a period of time. At this time, since the positive terminal of the diode D1 is pulled low (that is, the insulated gate bipolar transistor Q1 is driven to turn on and the positive terminal of the diode D1 is grounded GND), and the negative terminal of the diode D1 has voltage, the diode D1 is in the cut-off state;

[0026] The current of the second inductor L2 increases linearly. When the falling edge of the pulse arrives, since the inductor current cannot change suddenly, a high voltage (that is, greater than the voltage of the high-voltage energy storage capacitor C1) is induced on the right side of the second inductor L2, causing the diode D1 to turn on. The current of the second inductor L2 flows to the high-voltage energy storage capacitor C1 to charge. The current of the second inductor L2 does not turn off until the current of the second inductor L2 is zero. At this time, the voltage of the high-voltage energy storage capacitor C1 can be seen to rise through the detection device. Then the second pulse, the third pulse... the nth pulse, and so on are continuously input. Each pulse will store the electrical energy of the voltage source S1 in the second inductor L2. The moment the insulated gate bipolar transistor Q1 is disconnected, this energy will be forcibly pushed into the high-voltage energy storage capacitor C1, thereby completing the charging.

[0027] After the high-voltage energy storage capacitor C1 is charged, a double pulse signal is input from the connection between the first IGBT01 and the sixth IGBT06 and from the connection between the second IGBT02 and the fifth IGBT05 to implement a double pulse test.

[0028] It should be understood that the voltage source S1 of this embodiment is a low-voltage power supply with a 110V output. The low-voltage energy storage capacitor C2 is used for low-voltage energy storage. When the voltage of the high-voltage energy storage capacitor C1 is higher than the voltage of the low-voltage side (i.e., the low-voltage energy storage capacitor C2), the diode D1 is cut off and there is no need to add a switching device. The insulated gate bipolar transistor Q1 and the diode D1 work in the form of a single pulse each time, do not require heat dissipation, and the overall volume is small.

[0029] It should be noted that the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or apparatus that includes a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprises a ..." does not preclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0030] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A high-voltage power supply circuit for a double-pulse test, comprising a single pulse generator, a high-voltage energy storage capacitor, a first IGBT, a second IGBT, a third IGBT, a fourth IGBT, a fifth IGBT, a sixth IGBT, and a first inductor, wherein the first IGBT and the sixth IGBT are connected in series, the second IGBT and the fifth IGBT are connected in series, and the third IGBT and the fourth IGBT are connected in series, the high-voltage energy storage capacitor is connected in parallel at both ends of the first IGBT and the sixth IGBT, the first inductor is connected in parallel at both ends of the fourth IGBT, the connection between the first IGBT and the sixth IGBT serves as a first pulse signal connection point, and the connection between the second IGBT and the fifth IGBT serves as a second pulse signal connection point, characterized in that: Also includes: A voltage source with its negative terminal grounded; a low-voltage energy storage capacitor, one end of which is connected to the positive terminal of the voltage source, and the other end of which is connected to the negative terminal of the voltage source; a second inductor, one end of which is connected to the positive terminal of the voltage source; an insulated gate bipolar transistor, a first pin of which is connected to the output end of the single pulse generator, a second pin of which is connected to the other end of the second inductor, and a third pin of which is grounded; a diode, a positive terminal of which is connected to the other end of the second inductor, and a negative terminal of which is connected to one end of the high-voltage energy storage capacitor; Wherein, the other end of the high-voltage energy storage capacitor is grounded.

2. The high-voltage power supply circuit for double-pulse testing according to claim 1, characterized in that: It also includes an IGBT driving board, one end of which is connected to the output end of the single pulse generator, and the other end of which is connected to the first pin of the insulated gate bipolar transistor.

3. The high-voltage power supply circuit for double-pulse testing according to claim 1, characterized in that: The insulated gate bipolar transistor is an IGBT tube, wherein the first pin of the insulated gate bipolar transistor is the gate of the IGBT tube, the second pin of the insulated gate bipolar transistor is the emitter of the IGBT tube, and the third pin of the insulated gate bipolar transistor is the collector of the IGBT tube.

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