Dual-wavelength product aging test device

Abstract

The utility model relates to the technical field of communication equipment, and provides a dual-wavelength product aging test device and a use method thereof. The device is arranged on a PCB (Printed Circuit Board) and is mainly used for preventing optical crosstalk of adjacent indicating lamps. The device comprises a base, a shading assembly and an elastic adjusting piece, the shading assembly is movably installed on the base through a movable rod, and the elastic adjusting piece is used for adjusting the shading assembly so that the shading assembly can be attached to the inner side of a panel of the PCB in a self-adaptive mode. A plurality of groups of shading assemblies can be arranged, and the shading assemblies are matched with one another to form multi-surface shading for a single indicator lamp. The use method comprises the steps that the base is fixed to the PCB, the shading assembly is assembled and installed on the base, and the elastic force is adjusted in a self-adaptive mode through the linear spring, so that the shading plate abuts against the inner side of a panel of the PCB for shading. In addition, according to actual needs, a plurality of devices can be installed on the PCB, multi-face shielding of the indicating lamp is formed through a plurality of shading assemblies, the optical crosstalk phenomenon is prevented, the display definition of the indicating lamp is improved, and the user experience is enhanced.

Description

Technical Field

[0001] The present invention relates to the technical field of detection equipment, and in particular to a dual-wavelength product aging test device. Background Art

[0002] Burn-in racks, a device used for product aging testing, play a vital role in the development and production of electronic products. By simulating the operating conditions of a product over extended use, burn-in racks accelerate the product's aging process, effectively assessing its reliability and lifespan.

[0003] However, existing burn-in racks have several design deficiencies. Specifically, they primarily consist of a rack housing and circular circuit boards. These boards are typically mounted on separate levels, with each level housing a specific number of devices for burn-in testing. While this design allows for product burn-in testing, it presents several practical challenges.

[0004] First, when a device is placed on a burn-in rack for burn-in testing, if there is a misalignment between the device port and the rack pins, the pins on the rack can easily become deformed, leading to damage. This damage not only affects the accuracy of the burn-in test but can also cause irreversible damage to the device itself.

[0005] Secondly, existing burn-in racks may also lack efficiency and convenience in their operational processes. For example, before performing a burn-in test, a series of preparations may be required for both the burn-in rack and the device under test, including wiring and debugging. These steps are not only tedious and time-consuming, but can also increase the workload of operators.

[0006] Therefore, in response to these shortcomings of the prior art, the present invention proposes a new aging machine fixture, which aims to solve the problems of complex operation, low efficiency and pin damage due to installation deviation in the existing aging rack during equipment aging testing. Summary of the Invention

[0007] One of the purposes of the present invention is to provide a dual-wavelength product aging test device. By designing an integrated test device including an aging rack main frame, a power supply system and related connecting components, it aims to realize simultaneous aging testing of multiple products to be tested, so as to improve test efficiency and accuracy. It is efficient, reliable and easy to manage.

[0008] In order to solve the above technical problems, the present invention provides a dual-wavelength product aging test device, including an aging rack main frame and a power supply system. The aging rack main frame is provided with multiple aging ports, each aging port is equipped with a circuit board, and the circuit board is provided with power pins and signal pins for connecting the product to be tested, and all circuit boards are connected to the power supply system in series.

[0009] In addition to the above technical features, this application also makes improvements in the following aspects:

[0010] In some embodiments, the main frame of the aging rack includes a box frame and a circuit board support frame, and the circuit board support frame is used to fix and support each layer of circuit boards.

[0011] In some embodiments, the box frame is divided into two sides, each side includes a multi-layer structure, and each layer can independently place the product to be tested for aging testing.

[0012] In some embodiments, the power supply system includes an external power supply and a power transformer. The power pins of all circuit boards are connected to the external power supply through a series circuit and converted into the required voltage through the power transformer.

[0013] In some embodiments, the circuit boards are connected via a series circuit, and the series circuit is used to connect the circuit boards of each row of aging ports in series, so that the entire power supply can be achieved by only connecting an external power supply once.

[0014] In some embodiments, the external power supply is 220V AC power, and the power transformer is a 24V power transformer; the power transformer converts the 220V power into a 24V power for power supply.

[0015] In some embodiments, the main frame of the aging rack has at least 16 rows of aging ports, and each row of aging ports can hold at least 12 products to be tested.

[0016] In some embodiments, at least two power pins and two signal pins are provided respectively, distributed on the circuit board, and used to connect to the power port and the signal port of the product to be tested.

[0017] In some embodiments, the power pins and the signal pins are both provided with an anti-deformation structure to prevent the pins from being damaged due to deviation during the connection process of the product to be tested.

[0018] In some embodiments, the dual-wavelength product aging test device further includes a control circuit and a visualization device, wherein the control circuit is used to control the on and off of the power supply and the parameter setting during the aging test, and the visualization device is used to display the status and progress information of the aging test.

[0019] By adopting the above technical solution, the present invention has at least one of the following beneficial effects:

[0020] 1. Improve test efficiency: By designing a main frame with multiple aging ports, it can accommodate and test a large number of products under test simultaneously, significantly improving the batch processing capacity and efficiency of testing work.

[0021] 2. Reduce costs:

[0022] (1) All circuit boards are connected to the power supply system in series, which reduces the number of power cables and connectors used, reduces material costs and the complexity of installation and maintenance.

[0023] (2) Unified power management and control circuit design simplifies the overall structure of the test system and reduces design and manufacturing costs.

[0024] 3. Enhance test accuracy:

[0025] (1) Each aging port is equipped with an independent circuit board to ensure that each product under test can obtain stable power and signal connections, avoiding test errors that may be caused by shared resources.

[0026] (2) The power pins and signal pins on the circuit board adopt an anti-deformation structure design, which improves the reliability and accuracy of the test and reduces test failures caused by improper connection.

[0027] 4. Improve testing flexibility:

[0028] (1) The main frame of the aging rack is designed as a multi-layer structure, and each layer can independently place the product to be tested, which is convenient for flexible adjustment according to the size and test requirements of different products.

[0029] (2) The power supply system supports voltage conversion and can provide appropriate operating voltage according to the actual needs of the product to be tested, enhancing the versatility and flexibility of the test.

[0030] 5. Easy to monitor and manage: The integrated control circuit and visualization device enable the operator to easily control the power on and off, set the test parameters, and monitor the status and progress of the aging test in real time, thereby improving the degree of automation of the test and the convenience of management.

[0031] In summary, the design of the dual-wavelength product aging test device significantly improves test efficiency, enhances test flexibility and applicability, ensures test accuracy and stability, and improves user experience and convenience through structural optimization, providing strong support for efficient and accurate aging testing of modern electronic products. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The drawings described herein are used to provide further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute improper limitations on the present invention.

[0033] Figure 1 This is a front view of the dual-wavelength product aging test device of the present invention;

[0034] Figure 2 A side view of the dual-wavelength product aging test device of the present invention;

[0035] Figure 3 This is an isometric view of the dual-wavelength product aging test device of the present invention;

[0036] Figure 4 This is a front view diagram of the circuit board and power pins and signal pins in the present invention;

[0037] Figure 5 This is a rear view diagram of the circuit board, power pins, and signal pins in the present invention.

[0038] The numbers in the figure are as follows:

[0039] 1. Box frame; 2. Circuit board support frame; 3. Power supply system; 4. Aging port; 5. Circuit board; 6. Power pins; 7. Signal pins. DETAILED DESCRIPTION

[0040] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. The description of the exemplary embodiments is merely illustrative and is in no way intended to limit the present invention and its application or use. The present invention can be implemented in other different forms and is not limited to the embodiments described herein.

[0041] It should be noted that persons of ordinary skill in the art explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments unless there is a conflict. Unless otherwise defined, technical or scientific terms used in this invention shall have the same meaning as those generally understood by persons of ordinary skill in the art to which this invention belongs.

[0042] The terms "a," "an," "an," "the," and similar expressions used in this disclosure do not limit quantity and may refer to the singular or plural. The terms "include," "comprises," "includes," "has," and any variations thereof used in this disclosure are intended to cover a non-exclusive inclusion. The terms "first," "second," "third," and similar expressions used in this disclosure are intended solely to distinguish similar items and do not imply a specific ordering of the items.

[0043] The current aging racks are faced with the problem of deviations between the device ports and the aging rack pins during installation. This deviation often causes the pins to deform or even be damaged, which not only affects the accuracy of the aging test, but may also cause irreversible damage to the device under test. At the same time, the operation process of the aging rack is relatively complicated, especially the preparation work before the aging test, such as wiring and debugging. These steps are tedious and time-consuming, significantly reducing the test efficiency and increasing the workload of the operator. In order to solve these problems, the present invention specifically provides a technical solution to the above problems. The technical solution, working principle and technical effects of the present invention are described in detail below in conjunction with specific embodiments.

[0044] Reference Figure 1 、 Figure 2 、 Figure 3 As shown, the present invention describes a dual-wavelength product aging test device comprising a main aging rack frame, a power supply system 3, and additional control circuits and visualization devices. The main aging rack frame supports and secures the product under test, the power supply system 3 provides the necessary power to the product under test, the control circuit controls the progress of the aging test, and the visualization device displays the test status and progress.

[0045] The main frame of the aging rack consists of a box frame 1 and a circuit board support frame 2. The box frame 1 is divided into two sides, each side contains a multi-layer structure, and each layer can independently place the product to be tested for aging test.

[0046] In this embodiment, the box frame 1 is made of metal material (such as cold-rolled steel plate) and has sufficient strength and rigidity to withstand long-term work and the weight of the equipment.

[0047] The box frame 1 is designed as a layered structure, including two sides, each side has 8 layers, and a total of 16 layers. On each layer of the aging rack box frame 1, an aging port 4 is provided, and a special circuit board 5 is installed on each aging port 4.

[0048] These circuit boards 5 are designed with standard power pins 6 and signal pins 7, which are located on the left and right sides of the circuit board 5, with the power pins 6 on the left and the signal pins 7 on the right. Each pin has been specially processed to ensure good contact with the device port and stable transmission.

[0049] The main frame of the aging rack has at least 16 rows of aging ports 4, and each row of aging ports 4 can accommodate at least 12 products to be tested. This design enables the device to test a large number of products at the same time, improves space utilization, and enables the device to test multiple products at the same time, thereby improving testing efficiency and production efficiency.

[0050] The circuit board support frame 2 is used to fix and support each layer of the circuit board 5 to ensure that the circuit board 5 does not move or fall off during the test process.

[0051] Each burn-in port 4 is equipped with a circuit board 5, which is provided with power pins 6 and signal pins 7 for connecting to the product under test. At least two power pins 6 and two signal pins 7 are provided, distributed on the circuit board 5, for connecting to the power port and signal port of the product under test.

[0052] The circuit boards 5 are connected in series with the power pins 6 of each circuit board 5 through a predetermined wire or connector to form an integrated circuit system. This series connection ensures stable transmission of power and signals while simplifying circuit layout and wiring complexity.

[0053] The power supply system 3 includes an external power supply and a power transformer. The external power supply is 220V AC, which is converted to 24V by the power transformer. The power pins 6 of all circuit boards 5 are connected to the external power supply via a series circuit. This allows for complete power supply through a single external power supply connection, simplifying the power connection process.

[0054] The design of the series circuit enables the circuit boards 5 of each row of aging ports 4 to be connected in series, thereby improving the efficiency and stability of power supply.

[0055] During use, a power interface is provided on one side of the main frame of the burn-in rack. By connecting an external 220V power supply and connecting it to a 24V power transformer, the voltage is converted to a 24V voltage suitable for burn-in testing. The power transformer has overload protection and short-circuit protection functions to ensure the safety and stability of the power supply system 3.

[0056] To prevent deformation of power pins 6 and signal pins 7 during insertion, an anti-deformation structure is incorporated into both pins. This design effectively prevents damage to the pins due to misalignment during connection to the product under test. This improves test reliability and safety, reducing the risk of test failure or equipment damage due to pin damage.

[0057] In order to facilitate monitoring and management of the test process, the dual-wavelength product aging test device is also provided with a control circuit and a visualization device.

[0058] The control circuit is used to control the power supply on and off and set parameters during the aging test. Through the control circuit, users can easily adjust test parameters such as test time, voltage, current, etc. to meet the testing requirements of different products.

[0059] The visualization device is used to display the status and progress of the aging test. Through the visualization device, users can intuitively understand the current test status, remaining time, test results and other information, improving the convenience and traceability of the test.

[0060] In summary, the specific embodiments of the present invention describe in detail the structure and functions of a dual-wavelength product aging test device. Through a rational structural design and an efficient power supply system 3, this device can simultaneously test multiple products, improving both testing and production efficiency. Furthermore, the design of the control circuit and visualization device makes the testing process more convenient and traceable. Furthermore, the pin protection design also enhances the reliability and safety of the test.

[0061] The present invention also describes a specific operation method and usage process of a dual-wavelength product aging test device as follows;

[0062] 1. Preparation stage:

[0063] Design and manufacture the box frame of the TSF-9200S2 dual-wavelength aging rack. The frame is made of solid materials and is divided into two sides, each side contains 8 layers, a total of 16 layers.

[0064] Customized circuit boards are installed at each aging port location on each layer. These circuit boards are equipped with standard power pins and signal pins for connecting to the devices to be aged.

[0065] Prepare an external 220V power supply and a 24V power transformer to power the entire aging rack.

[0066] 2. Equipment installation:

[0067] Place the devices to be aged one by one on the designated aging ports of the aging rack frame, ensuring that the device ports are aligned with the power pins and signal pins on the circuit board.

[0068] Gently press the device down so that the device port firmly connects to the pins on the circuit board without any additional tightening.

[0069] 3. Circuit connection and power supply:

[0070] Connect all the circuit boards together in series to form a complete circuit system. This can be achieved by setting up serial interfaces on the circuit boards or using special connection cables.

[0071] Connect the external 220V power supply to the input of the power transformer, and then connect the output of the 24V power transformer to the main power input of the aging rack. After confirming that all connections are correct, turn on the power transformer to power the entire aging rack. At this time, all devices on the aging rack will begin to enter the aging test state.

[0072] 4. Test monitoring:

[0073] During the test, the operator can monitor the equipment's operating status and performance parameters in real time through monitoring equipment and record test data. If any abnormality is found, timely measures should be taken to address it.

[0074] 5. End of test: After the aging test is completed, turn off the power transformer and disconnect the external power supply. Remove the device for subsequent performance evaluation and life analysis.

[0075] The specific working principle of the dual-wavelength product aging test device of this utility model is as follows:

[0076] Connect the power and signal ports of the product under test to the power and signal pins on the circuit board, respectively. Connect the external power supply, and the power transformer converts the 220V power supply to 24V for power supply. The control circuit sets the burn-in test parameters and starts the burn-in test.

[0077] After the burn-in test begins, monitor the equipment's operating status and performance parameters, such as current, voltage, and temperature, and record the relevant data. Set the burn-in time and test conditions, such as temperature and humidity, based on the test requirements. Regularly check the operating status of the burn-in rack to ensure the stability and safety of the test process.

[0078] During the burn-in test, a visualization device displays the test status and progress in real time. The operator monitors the test progress through the visualization device and, if necessary, adjusts test parameters through the control circuit. When the burn-in test is complete, the control circuit automatically disconnects the power supply, allowing the operator to remove the product for subsequent processing.

[0079] After the burn-in test is complete, turn off the power transformer and disconnect the external power supply. Remove the tested device from the burn-in port for subsequent performance evaluation and lifespan analysis. Inspect the condition of the circuit boards and pins, and replace any damage or wear. Clean and tidy the burn-in rack frame and surrounding area in preparation for the next test.

[0080] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

[0081] In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the fact that ordinary technicians in this field can implement them; when the combination of technical solutions is mutually contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

Claims

1. A dual-wavelength product aging test device, characterized by: include, An aging rack main frame and a power supply system (3) are provided on the aging rack main frame. A plurality of aging ports (4) are provided on the aging rack main frame. Each aging port (4) is equipped with a circuit board (5). The circuit board (5) is provided with power pins (6) and signal pins (7) for connecting to a product to be tested, and all the circuit boards (5) are connected to the power supply system (3) in series.

2. The dual-wavelength product aging test device according to claim 1, characterized in that: The main frame of the aging rack comprises a box frame (1) and a circuit board support frame (2), and the circuit board support frame (2) is used to fix and support each layer of circuit boards (5).

3. The dual-wavelength product aging test device according to claim 2, characterized in that: The box frame (1) is divided into two sides, each side includes a multi-layer structure, and each layer can independently place the product to be tested for aging testing.

4. The dual-wavelength product aging test device according to claim 1, characterized in that: The power supply system (3) includes an external power supply and a power transformer. The power pins (6) of all circuit boards (5) are connected to the external power supply through a series circuit and converted into a required voltage through the power transformer.

5. The dual-wavelength product aging test device according to claim 4, characterized in that: The circuit boards (5) are connected via a series circuit, and the series circuit is used to connect the circuit boards (5) of each row of aging ports (4) in series, so that the entire power supply can be achieved by only connecting an external power supply once.

6. The dual-wavelength product aging test device according to claim 4, characterized in that: The external power supply is 220V AC power, and the power transformer is a 24V power transformer; the power transformer converts the 220V power into a 24V power for power supply.

7. The dual-wavelength product aging test device according to claim 1, characterized in that: The main frame of the aging rack has at least 16 rows of aging ports (4), and each row of aging ports (4) can hold at least 12 products to be tested.

8. The dual-wavelength product aging test device according to claim 1, characterized in that: At least two power pins (6) and signal pins (7) are provided, respectively, and are distributed on the circuit board (5) for connecting to the power port and the signal port of the product to be tested.

9. The dual-wavelength product aging test device according to claim 1 or 2, characterized in that: The power pin (6) and the signal pin (7) are both provided with an anti-deformation structure for preventing the pins from being damaged due to deviation during the connection process of the product to be tested.

10. The dual-wavelength product aging test device according to claim 1, characterized in that: It also includes a control circuit and a visualization device, wherein the control circuit is used to control the on and off of the power supply and the parameter setting during the aging test, and the visualization device is used to display the status and progress information of the aging test.

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