Probe contact testing device

Abstract

An embodiment of the utility model provides a probe contact testing device, which relates to the technical field of probe testing and comprises a testing case and a conveying unit arranged in an inner cavity of the testing case, the conveying unit comprises a testing clamping portion and a first conveying frame arranged on one side of the testing clamping portion, and a probe body placing frame is placed on one side of the lower end of the conveying unit. An adjusting track and a moving cylinder which are arranged on one side drive a first conveying frame and a test clamping part which are arranged at the upper end to move synchronously, a probe body is driven to move to the upper end of a test plate, a point contact test is conducted on the probe body, the first conveying frame and the test clamping part move back, and a probe of the test plate is taken down through the test clamping part. After sampling, the first conveying frame and the test clamping part move synchronously, the test clamping part moves the tested probe body to the placing frame on one side for discharging, meanwhile, the first conveying frame arranged on one side conducts contact detection again, and the test efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of probe testing, in particular to a probe contact testing device. Background Art

[0002] With the rapid development of electronic technology, the quality requirements of electronic products are becoming increasingly stringent. As a key component of electronic products, probes undergo rigorous testing during the production process to ensure their performance stability and reliability. As a key component connecting test equipment to the circuit under test, the quality of probes directly affects the accuracy of test results. Therefore, pre-shipment inspection of probes is particularly important.

[0003] Traditional probe contact testing methods are typically performed manually or semi-automatically. This approach is not only inefficient but also prone to unstable test results due to human error, impacting product quality. Furthermore, manual operation poses certain safety risks, especially when handling small and fragile probes. Improper handling can damage the probes, increasing production costs. Utility Model Content

[0004] The purpose of the utility model is to provide a probe contact testing device, which can avoid the problem that the test results are unstable due to human factors in manual or semi-automatic methods, thereby affecting product quality.

[0005] The utility model provides a probe contact testing device, comprising:

[0006] A test chassis, and a transmission unit disposed at the upper end of the inner cavity of the test chassis, wherein the transmission unit is movably mounted at the upper end of the operating table of the inner cavity of the test chassis;

[0007] The conveying unit includes a test clamping portion for clamping and conveying the probe body and a first conveying frame arranged at one side of the test clamping portion, wherein the first conveying frame is movably installed at one side of the test clamping portion.

[0008] Preferably, a test plate is provided at the lower end of the test clamping portion, a test hole is opened at the upper end of the test plate, and the test clamping portion and the first conveying rack are devices composed of the same components.

[0009] Preferably, the test clamping part includes a movable seat and a clamping plate movably mounted on the upper end of the movable seat. The movable seat is engaged with an adjustment track set on the upper end of the internal table of the test chassis, and the movable seat adjusts its position through a movable cylinder set in the inner cavity of the adjustment track.

[0010] Preferably, a transverse adjustment frame is fixedly provided on the upper end of the movable seat, and a pneumatic slider is provided on the upper end of the transverse adjustment frame.

[0011] Preferably, one side of the pneumatic slider is fixedly connected to a height adjustment frame by bolts, and one side of the height adjustment frame is provided with a lifting slider, and the lifting slider adjusts the height by driving the cylinder, and the lower end of the lifting slider is fixedly connected to the clamping plate.

[0012] Preferably, a probe seat is fixedly installed on one side of the clamping plate by bolts, the probe body is inserted into the inside of the probe seat, a telescopic frame is provided on one side of the probe seat, and the position of one side of the telescopic frame is adjusted by a telescopic cylinder fixedly installed on one side, and the telescopic cylinder is fixedly installed on the lower end of the clamping plate by bolts.

[0013] Preferably, a through hole is opened in the middle of the probe seat, and the telescopic frame is movably installed inside the through hole inside the probe seat.

[0014] Preferably, a supporting slider is fixedly mounted on one end of the transverse adjustment frame, and the supporting slider is engaged with an upper end of a positioning rail fixedly mounted on the inner side of a mounting bracket provided at the upper end of the test chassis.

[0015] Preferably, protective covers are provided on both sides of the middle portion of the test chassis, and the test board is placed inside the protective covers on both sides.

[0016] Preferably, a placement plate is provided at the upper end of the test chassis, and the placement plate is installed on the upper end of the test chassis operating table through sliders and bolts. A hole is opened at the upper end of the placement plate, and the positioning pile is inserted into the hole opened in the placement plate.

[0017] The present invention provides a probe contact testing device. When it is necessary to test the factory probe body, the probe body placement rack is placed on one side of the lower end of the conveying unit, and then the probe body set at the lower end is clamped by the first conveying rack set at the upper end, and then the first conveying rack set at the upper end and the test clamping part are driven to move synchronously by the adjustment track and the moving cylinder set at one side, and the probe body is driven to the upper end of the test board, and the probe body is subjected to a point test, and then inserted into the test hole inside the test board for testing, and then the first conveying rack and the test clamping part are moved back, and the probe of the test board is removed by the test clamping part. After the first conveying rack takes the sample, it moves synchronously with the test clamping part, and the test clamping part moves the tested probe body to the placement rack on one side for unloading, and at the same time, the first conveying rack set on one side performs contact detection again, thereby improving the test efficiency, making the transfer test smoother, and avoiding damage to the probe body or inaccurate detection due to manual or semi-automatic detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 It is a schematic diagram of the overall structure of an embodiment of the present utility model.

[0020] Figure 2 This is a schematic diagram of the internal structure of a test chassis according to an embodiment of the present utility model.

[0021] Figure 3 This is a schematic structural diagram of a transmission unit according to an embodiment of the present utility model.

[0022] Figure 4 This is a schematic structural diagram of a test clamping portion according to an embodiment of the present utility model.

[0023] Figure 5 This is a schematic structural diagram of the lower end of the test clamping part according to an embodiment of the present utility model.

[0024] Figure 6 This is a schematic diagram of the probe seat installation structure of an embodiment of the present utility model.

[0025] Figure 7 This is a schematic diagram of the probe seat structure of an embodiment of the present utility model.

[0026] Figure 8 For the embodiment of the utility model Figure 2 Enlarged structural diagram at point A in the middle.

[0027] Figure 9 For the embodiment of the utility model Figure 2 Enlarged structural diagram at point B in the middle.

[0028] Figure 10 This is a schematic diagram of the placement plate structure of an embodiment of the present utility model.

[0029] Description of the drawings: 100, test chassis; 110, protective cover; 120, mounting bracket; 121, positioning rail; 130, adjustment rail; 200, conveying unit; 210, first conveying rack; 220, test clamping part; 221, lateral adjustment rack; 222, pneumatic slider; 223, height adjustment rack; 224, lifting slider; 225, clamping plate; 226, supporting slider; 227, moving seat; 230, test board; 240, placement plate; 241, positioning pile; 300, probe seat; 310, telescopic cylinder; 320, telescopic rack; 400, probe body. DETAILED DESCRIPTION

[0030] Hereinafter, only certain exemplary embodiments are briefly described. As will be appreciated by those skilled in the art, the described embodiments may be modified in various ways without departing from the spirit or scope of the embodiments of the present invention. Therefore, the drawings and description are to be regarded as illustrative in nature and not restrictive.

[0031] In the description of the embodiments of the present invention, it should be understood that the terms "length", "vertical", "horizontal", "top", "bottom", etc. indicating the orientation or position relationship are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the embodiments of the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the embodiments of the present invention.

[0032] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0033] In the embodiments of the present invention, unless otherwise expressly specified or limited, the terms "installed," "connected," "connected," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection, or communication; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the embodiments of the present invention based on specific circumstances.

[0034] The disclosure below provides many different embodiments or examples for implementing different structures of the embodiments of the present invention. In order to simplify the disclosure of the embodiments of the present invention, the components and settings of specific examples are described below. Of course, these are merely examples and are not intended to limit the embodiments of the present invention. In addition, the embodiments of the present invention may repeat reference numbers and / or reference letters in different examples. Such repetition is for the purpose of simplicity and clarity and does not in itself indicate the relationship between the various embodiments and / or settings discussed.

[0035] In order to better understand the purpose, structure and function of the present invention, a probe contact testing device of the present invention is described in further detail below with reference to the accompanying drawings.

[0036] like Figures 1-10 As shown, an embodiment of the present invention provides a probe contact testing device, including a test box 100 for installing various groups of test parts, and a conveying unit 200 arranged at the upper end of the inner cavity of the test box 100 for conveying the probe body 400 for testing. The conveying unit 200 is movably installed on the upper end of the inner cavity operating table of the test box 100.

[0037] The conveying unit 200 includes a test clamping portion 220 for clamping and conveying the probe body 400 and a first conveying rack 210 arranged on one side of the test clamping portion 220 for auxiliary conveying testing of the probe body 400. The first conveying rack 210 is movably installed on one side of the test clamping portion 220. The lower end of the test clamping portion 220 is provided with a test plate 230 for testing and displaying the probe body 400. The upper end of the test plate 230 is provided with a test hole for matching the position and size of the probe body 400. The test clamping portion 220 and the first conveying rack 210 are devices composed of the same components.

[0038] The test clamping part 220 includes a movable seat 227 for driving the entire body to move and adjust, and a clamping plate 225 movably installed on the upper end of the movable seat 227 for clamping the probe body 400. The movable seat 227 is engaged with an adjustment track 130 installed on the upper end of the internal table of the test chassis 100 for adjusting the position of the movable seat 227. The position of the movable seat 227 is adjusted by a movable cylinder arranged in the inner cavity of the adjustment track 130.

[0039] When the probe body 400 leaving the factory needs to be tested, the probe body 400 placement rack is placed on one side of the lower end of the conveying unit 200, and then the probe body 400 set at the lower end is clamped by the first conveying rack 210 set at the upper end. Then, the first conveying rack 210 set at the upper end and the test clamping part 220 set at the upper end are driven to move synchronously by the adjusting rail 130 and the moving cylinder set at one side, and the probe body 400 is driven to move to the upper end of the test board 230, and the probe body 400 is subjected to a touch test. Then, the probe body 400 is inserted into the test hole inside the test board 230 for testing. After that, the first conveying rack 210 and the test clamping part 220 move back, and the probe of the test board 230 is removed by the test clamping part 220. After the first conveying rack 210 takes the sample, it moves synchronously with the test clamping part 220, and the test clamping part 220 moves the tested probe body 400 to the placement rack on one side for unloading, and at the same time, the first conveying rack 210 set at one side performs contact detection again, thereby improving the test efficiency and making the transfer test smoother.

[0040] A lateral adjustment frame 221 for laterally adjusting the clamping plate 225 is fixedly provided at the upper end of the movable seat 227, and a pneumatic slider 222 is provided at the upper end of the lateral adjustment frame 221 for driving the clamping plate 225 to move. The clamping plate 225 set at the lower end is driven to move by the lateral adjustment frame 221 and the pneumatic slider 222, and the pick-up and placement position of the probe body 400 can be adjusted.

[0041] One side of the pneumatic slider 222 is fixedly connected by bolts to a height adjustment frame 223 for adjusting the height. One side of the height adjustment frame 223 is provided with a lifting slider 224 that can be raised and lowered along the height adjustment frame 223. The lifting slider 224 adjusts the height by driving the cylinder. The lower end of the lifting slider 224 is fixedly connected to the clamping plate 225. Through the setting of the driving cylinder, the height adjustment frame 223 and the lifting slider 224, it is convenient to drive the clamping plate 225 installed at the lower end of the lifting slider 224 to perform lifting operations, thereby facilitating the pick-up and placement operations of the probe body 400, and is flexible to use.

[0042] One side of the clamping plate 225 is fixed with a probe base 300 for fixing the probe body 400 by bolts, and the probe body 400 is inserted into the inside of the probe base 300. One side of the probe base 300 is provided with a telescopic frame 320 for fixing the probe body 400. One side of the telescopic frame 320 is adjusted in position by a telescopic cylinder 310 fixedly installed on one side. The telescopic cylinder 310 is fixedly installed at the lower end of the clamping plate 225 by bolts. A through hole for fixing the probe body 400 is provided in the middle of the probe base 300. The telescopic frame 320 is movably installed inside the through hole inside the probe base 300 and is limited by the through hole. The telescopic frame 320 can be driven to move by the telescopic cylinder 310, and then the probe body 400 can be loosened and clamped by the rod body on one side of the telescopic frame 320, thereby facilitating the material taking and discharging operations of the probe body 400. It is simple to control and easy to use.

[0043] One end of the transverse adjustment frame 221 is fixedly installed with a supporting slider 226 for supporting the transverse adjustment frame 221. The supporting slider 226 is engaged and installed on the upper end of the positioning rail 121 fixedly installed on the inner side of the mounting bracket 120 provided at the upper end of the test chassis 100. The positioning rail 121 and the supporting slider 226 are matched and installed. The supporting slider 226 provided at the upper end of the first conveying frame 210 and the test clamping part 220 are both slidably installed on the upper end of the same positioning rail 121. When the first conveying frame 210 and the test clamping part 220 move, the positioning rail 121 and the supporting slider 226 provided on one side can support the moving transverse adjustment frame 221 to avoid deformation and tilting of the transverse adjustment frame 221 due to the heavier equipment at the lower end.

[0044] Transparent protective covers 110 are provided on both sides of the middle of the test chassis 100. The upper and lower sides of the protective covers 110 are installed and positioned by interlocking frames. The test board 230 is placed inside the protective covers 110 on both sides, which is convenient for protecting the internal test board 230 and convenient for observation.

[0045] A placement plate 240 for fixing the probe placement frame is provided at the upper end of the test chassis 100. The placement plate 240 is installed on the upper end of the test chassis 100 operating table through sliders and bolts. A plurality of groups of holes are provided on the upper end of the placement plate 240 for installing positioning piles 241 for auxiliary fixation. The positioning piles 241 are inserted into the holes provided in the placement plate 240. The probe placement frame can be limited and placed by the positioning piles 241. The probe placement frame can be limited by the positioning piles 241, which makes it convenient for the operator to accurately place the probe placement frame and facilitates the first conveying rack 210 and the test clamping part 220 provided at the upper end to take and place the probe body 400.

[0046] The working principle of a probe contact test device is as follows: when it is necessary to test the factory probe body 400, the probe body 400 placement rack is placed on the lower side of the conveying unit 200, and then the probe body 400 set at the lower end is clamped by the first conveying rack 210 set at the upper end, and then the first conveying rack 210 set at the upper end and the test clamping part 220 are driven to move synchronously by the adjustment track 130 and the moving cylinder set at one side, and the probe body 400 is driven to move to the upper end of the test board 230, and the probe body is tested. 400 performs a touch test, and then inserts it into the test hole inside the test board 230 for detection. After that, the first conveyor frame 210 and the test clamping part 220 move back, and the probe of the test board 230 is removed by the test clamping part 220. After the first conveyor frame 210 takes the sample, it moves synchronously with the test clamping part 220. The test clamping part 220 moves the tested probe body 400 to a side placement rack for unloading. At the same time, the first conveyor frame 210 set on one side performs contact detection again, which improves the test efficiency and makes the transfer test smoother.

[0047] It is understood that the present invention is described by way of certain embodiments, and those skilled in the art will appreciate that various changes or equivalent substitutions may be made to these features and embodiments without departing from the spirit and scope of the present invention. Furthermore, under the guidance of the present invention, these features and embodiments may be modified to suit specific circumstances and materials without departing from the spirit and scope of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of this application are intended to be protected by the present invention.

Claims

1. A probe contact testing device, characterized in that: include: A test chassis, and a transmission unit disposed at the upper end of the inner cavity of the test chassis, wherein the transmission unit is movably mounted at the upper end of the operating table of the inner cavity of the test chassis; The conveying unit includes a test clamping portion for clamping and conveying the probe body and a first conveying frame arranged at one side of the test clamping portion, wherein the first conveying frame is movably installed at one side of the test clamping portion.

2. A probe contact testing device according to claim 1, characterized in that: A test plate is provided at the lower end of the test clamping portion, a test hole is opened at the upper end of the test plate, and the test clamping portion and the first conveying rack are devices composed of the same components.

3. A probe contact testing device according to claim 2, characterized in that: The test clamping part includes a movable seat and a clamping plate movably mounted on the upper end of the movable seat. The movable seat is engaged with an adjustment track set at the upper end of the table inside the test chassis. The movable seat adjusts its position through a movable cylinder set in the inner cavity of the adjustment track.

4. The probe contact testing device according to claim 3, characterized in that: A transverse adjustment frame is fixedly provided on the upper end of the movable seat, and a pneumatic slider is provided on the upper end of the transverse adjustment frame.

5. The probe contact testing device according to claim 4, characterized in that: One side of the pneumatic slider is fixedly connected to a height adjustment frame by bolts, and one side of the height adjustment frame is provided with a lifting slider. The lifting slider adjusts the height by driving the cylinder, and the lower end of the lifting slider is fixedly connected to the clamping plate.

6. The probe contact testing device according to claim 5, characterized in that: A probe seat is fixedly installed on one side of the clamping plate by bolts, and the probe body is inserted into the inside of the probe seat. A telescopic frame is provided on one side of the probe seat. One side of the telescopic frame is position-adjusted by a telescopic cylinder fixedly installed on one side, and the telescopic cylinder is fixedly installed on the lower end of the clamping plate by bolts.

7. The probe contact testing device according to claim 6, characterized in that: A through hole is provided in the middle of the probe seat, and the telescopic frame is movably mounted inside the through hole inside the probe seat.

8. The probe contact testing device according to claim 7, characterized in that: A supporting slider is fixedly mounted on one end of the transverse adjustment frame, and the supporting slider is engaged with the upper end of a positioning track fixedly mounted on the inner side of a mounting bracket provided at the upper end of the test chassis.

9. The probe contact testing device according to claim 8, characterized in that: Protective covers are provided on both sides of the middle of the test box, and the test board is placed inside the protective covers on both sides.

10. The probe contact testing device according to claim 9, characterized in that: A placement plate is provided at the upper end of the test chassis, and the placement plate is mounted on the upper end of the test chassis operating table through sliders and bolts. A hole is opened at the upper end of the placement plate, and the positioning pile is inserted into the hole opened in the placement plate.

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