Aging test jig with separation structure

Abstract

The utility model relates to the field of aging test, and discloses an aging test frame with a separation structure, which comprises an aging test main frame, two aging test auxiliary frames are fixedly arranged at the top of the aging test main frame, and assembling mechanisms are arranged on the aging test main frame and the aging test auxiliary frames; the splicing mechanism comprises splicing blocks, a partition main plate, a partition auxiliary plate, a T-shaped block, a moving block, a connecting block, a square block and a screw rod; the separation main plate is clamped with the assembling block, the separation auxiliary plate sleeves the outer side of the separation main plate, the T-shaped block is fixedly connected with the assembling block, the T-shaped block is clamped with the aging test auxiliary frame, the top of the moving block is fixedly connected with the connecting block, the square block is fixedly mounted at the bottom of the assembling block, and the square block is clamped with the connecting block. The utility model has the following advantages and effects: after the aging test is completed, the separation main plate and the separation auxiliary plate can be conveniently detached for cleaning, and the use is relatively convenient.

Description

Technical Field

[0001] The utility model relates to the technical field of aging testing, in particular to an aging testing rack with a partition structure. Background Art

[0002] With the development of the information age, electronic products have become indispensable in people's lives. Aging tests are required in the production process of electronic products to eliminate defective products. In aging tests, it is necessary to simulate the various factors that affect the products in actual use conditions, such as light aging, damp heat aging, and high temperature aging, and conduct enhanced tests based on the corresponding factors. Aging tests of electronic products are conducted under high temperatures and harsh environments to test the stability and reliability of electronic products.

[0003] In the prior art, when performing an aging test on an electronic product, the electronic product is placed on a partition plate on an aging test rack, and then the aging test rack is placed in an aging test box for aging testing. After the aging test is completed, a lot of stains often remain on the partition plate. Currently, most partition plates are fixed and not convenient to remove for cleaning. Manual wiping and cleaning of the partition plate is required, which is not convenient to use. Therefore, it is necessary to design an aging test rack with a partition structure to solve the above problem.

[0004] The information disclosed in this background technology section is only intended to increase the understanding of the overall background of the present invention, and should not be regarded as an admission or any form of suggestion that the information constitutes the prior art already known to those skilled in the art. Utility Model Content

[0005] The purpose of the utility model is to provide an aging test rack with a partition structure to solve the above problems.

[0006] The above technical objectives of the present invention are achieved through the following technical solutions: an aging test stand with a partition structure, comprising:

[0007] A main aging test frame, with two auxiliary aging test frames fixedly mounted on the top of the main aging test frame, and an assembling mechanism disposed on the main aging test frame and the auxiliary aging test frames;

[0008] The assembly mechanism includes an assembly block, a partition main plate, a partition auxiliary plate, a T-block, a moving block, a connecting block, a block and a screw;

[0009] The partition main board is clamped with the assembly block, the partition auxiliary board is sleeved on the outside of the partition main board, the T-block is fixedly connected to the assembly block, the T-block is clamped with the aging test auxiliary frame, the top of the movable block is fixedly connected with the connecting block, the block is fixedly installed on the bottom of the assembly block, the block is clamped with the connecting block, the screw is rotatably installed on the aging test main frame, and the screw is threadedly connected to the movable block.

[0010] The utility model is further configured as follows: a moving groove is provided on the top of the aging test main frame, and the moving block is slidably installed in the moving groove.

[0011] The present invention is further configured as follows: a damping pad is embedded in the bottom of the auxiliary partition plate, and the damping pad abuts against the connecting block.

[0012] By adopting the above technical solution, the damping pad can provide greater friction, thus ensuring the stability of the auxiliary partition plate.

[0013] The utility model is further configured as follows: a plurality of slots are provided on the side of the assembling block to separate the main board and to clamp the slots.

[0014] The utility model is further configured as follows: a T-slot is provided on the front side of the aging test auxiliary frame, and the T-block is clamped in the T-slot.

[0015] By adopting the above technical solution, the assembly blocks are limited.

[0016] The utility model is further configured as follows: a square groove is provided on the top of the connecting block, and the square block and the square groove are clamped together.

[0017] By adopting the above technical solution, the assembly blocks are limited.

[0018] The utility model is further configured as follows: the bottom of the assembling block contacts the connecting block, and the side surface of the assembling block contacts the aging test auxiliary frame.

[0019] The present invention is further configured such that the bottom of the connection block contacts the aging test main frame.

[0020] The beneficial effects of the utility model are:

[0021] The utility model is provided with an assembling mechanism, and only the screw needs to be rotated to make the connecting block drive the assembling block to move through the square block, so that the T-block can be moved out of the T-slot, and then the assembling block can be pulled vertically to remove the assembling block, and then the partition main board and the partition auxiliary board can be removed. In this way, after the aging test is completed, the partition main board and the partition auxiliary board can be conveniently removed for cleaning, which is more convenient to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0023] Figure 1 The utility model is a three-dimensional structural diagram of an aging test rack with a partition structure.

[0024] Figure 2 The utility model is a three-dimensional structural diagram of an aging test rack with a partition structure.

[0025] Figure 3 The utility model is a schematic cross-sectional view of an aging test stand with a partition structure.

[0026] Figure 4 yes Figure 3 Schematic diagram of the structure of part A in .

[0027] In the figure, 1. Aging test main frame; 2. Aging test auxiliary frame; 3. Assembly block; 4. Partition main board; 5. Slot; 6. Partition auxiliary board; 7. T-block; 8. T-slot; 9. Moving block; 10. Connecting block; 11. Block; 12. Square slot; 13. Screw. DETAILED DESCRIPTION

[0028] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal connection of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0029] The following will clearly and completely describe the technical solutions of the present invention in conjunction with specific embodiments. Obviously, the embodiments described are only some of the embodiments of the present invention, and not all of them. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without inventive effort are also within the scope of protection of the present invention.

[0030] See also Figure 1 、 Figure 2 、 Figure 3 and Figure 4 The utility model provides an aging test rack with a partition structure, comprising:

[0031] A aging test main frame 1, two aging test auxiliary frames 2 are fixedly arranged on the top of the aging test main frame 1, and an assembling mechanism is provided on the aging test main frame 1 and the aging test auxiliary frame 2. It should be noted that the partition main board 4 and the partition auxiliary board 6 are assembled by the assembling mechanism. After the aging test is completed, the partition main board 4 and the partition auxiliary board 6 are conveniently removed for cleaning, which is convenient to use;

[0032] The assembly mechanism includes an assembly block 3, a partition main plate 4, a partition auxiliary plate 6, a T-shaped block 7, a moving block 9, a connecting block 10, a block 11 and a screw 13;

[0033] The partition main board 4 is clamped with the assembly block 3, and the partition auxiliary board 6 is sleeved on the outside of the partition main board 4. It should be noted that the partition auxiliary board 6 is sleeved on the outside of multiple partition main boards 4 and is adjusted as needed;

[0034] The T-block 7 is fixedly connected to the assembling block 3, the T-block 7 is clamped to the aging test auxiliary frame 2, the top of the movable block 9 is fixedly connected to the connecting block 10, the block 11 is fixedly installed on the bottom of the assembling block 3, the block 11 is clamped to the connecting block 10, the screw 13 is rotatably installed on the aging test main frame 1, and the screw 13 is threadedly connected to the movable block 9.

[0035] Through the above-mentioned assembling mechanism, after the aging test is completed, the screw 13 is rotated, and the connecting block 10 drives the assembling block 3 to move through the block 11, and the assembling block 3 drives the T-block 7 and the partition main board 4 to move, so that the T-block 7 moves out of the T-slot 8, and then the assembling block 3 is pulled upward to move the block 11 out of the square slot 12, and the assembling block 3, the partition main board 4 and the partition auxiliary plate 6 are removed, and then the assembling block 3 is removed from the partition main board 4, and then the partition auxiliary plate 6 is removed from the partition main board 4. In this way, after the aging test is completed, it is convenient to remove the partition main board 4 and the partition auxiliary plate 6 for cleaning, which is more convenient to use.

[0036] Specifically, a moving groove is opened on the top of the aging test main frame 1, and the moving block 9 is slidably installed in the moving groove. It should be noted that this facilitates the movement of the moving block 9.

[0037] Specifically, a damping pad is embedded in the bottom of the partition auxiliary plate 6, and the damping pad abuts against the connecting block 10. It should be noted that the damping pad can provide a large friction force. The damping pad on the partition auxiliary plate 6 abuts against the connecting block 10, thereby ensuring the stability of the partition auxiliary plate 6 in this position.

[0038] Specifically, a plurality of slots 5 are provided on the side of the assembling block 3, and the partition mainboard 4 is snap-fitted into the slots 5; a T-slot 8 is provided on the front side of the aging test auxiliary frame 2, and the T-block 7 is snap-fitted into the T-slot 8; a square groove 12 is provided on the top of the connecting block 10, and the square block 11 is snap-fitted into the square groove 12. It should be noted that the setting of the slots 5 facilitates the assembly of the partition mainboard 4 and the assembling block 3.

[0039] Specifically, the bottom of the assembling block 3 contacts the connecting block 10, the side of the assembling block 3 contacts the aging test auxiliary frame 2, and the bottom of the connecting block 10 contacts the aging test main frame 1. It should be noted that the assembling block 3 and the connecting block 10 can be limited.

[0040] Working principle:

[0041] S1: After the aging test is completed, the screw 13 is rotated, the screw 13 drives the moving block 9 to move forward, the moving block 9 drives the connecting block 10 to move forward, the connecting block 10 drives the assembling block 3 to move through the block 11, and the assembling block 3 drives the T-block 7 and the partition main board 4 to move, so that the T-block 7 moves out of the T-slot 8, and then the assembling block 3 is pulled upward to move the block 11 out of the square slot 12;

[0042] S2: Remove the assembly block 3, the partition main board 4 and the partition auxiliary board 6, then remove the assembly block 3 from the partition main board 4, and then remove the partition auxiliary board 6 from the partition main board 4. In this way, after the aging test is completed, it is convenient to remove the partition main board 4 and the partition auxiliary board 6 for cleaning, which is more convenient to use;

[0043] S3: After cleaning, first put the partition auxiliary plate 6 on the partition main plate 4, dock the partition main plate 4 with the assembly block 3, insert the block 11 on the assembly block 3 into the square groove 12, and turn the screw 13 to make the T-block 7 fit into the T-slot 8. The assembly is relatively simple.

[0044] The above is a detailed introduction to the aging test stand with a partition structure provided by the present invention. Specific embodiments are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only intended to help understand the method and core concept of the present invention. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, several improvements and modifications can be made to the present invention, and these improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. An aging test rack with a partition structure, characterized in that: include: An aging test main frame (1), wherein two aging test auxiliary frames (2) are fixedly arranged on the top of the aging test main frame (1), and an assembling mechanism is arranged on the aging test main frame (1) and the aging test auxiliary frames (2); The assembly mechanism comprises an assembly block (3), a partition main plate (4), a partition auxiliary plate (6), a T-shaped block (7), a moving block (9), a connecting block (10), a block (11) and a screw (13); The partition main board (4) is clamped with the assembly block (3), the partition auxiliary board (6) is sleeved on the outside of the partition main board (4), the T-block (7) is fixedly connected with the assembly block (3), the T-block (7) is clamped with the aging test auxiliary frame (2), the top of the moving block (9) is fixedly connected with the connecting block (10), the block (11) is fixedly installed on the bottom of the assembly block (3), the block (11) is clamped with the connecting block (10), the screw (13) is rotatably installed on the aging test main frame (1), and the screw (13) is threadedly connected with the moving block (9).

2. The aging test rack with a partition structure according to claim 1, characterized in that: A moving groove is provided on the top of the aging test main frame (1), and the moving block (9) is slidably installed in the moving groove.

3. The aging test rack with a partition structure according to claim 1, characterized in that: A damping pad is embedded in the bottom of the partition auxiliary plate (6), and the damping pad abuts against the connecting block (10).

4. The aging test rack with a partition structure according to claim 1, characterized in that: The side of the assembly block (3) is provided with a plurality of slots (5) for separating the main board (4) and the slots (5) for clamping.

5. The aging test rack with a partition structure according to claim 1, characterized in that: A T-shaped slot (8) is provided on the front side of the aging test auxiliary frame (2), and the T-shaped block (7) is clamped to the T-shaped slot (8).

6. The aging test rack with a partition structure according to claim 1, characterized in that: A square groove (12) is provided on the top of the connecting block (10), and the square block (11) and the square groove (12) are clamped together.

7. The aging test rack with a partition structure according to claim 1, characterized in that: The bottom of the assembly block (3) contacts the connecting block (10), and the side of the assembly block (3) contacts the aging test auxiliary frame (2).

8. The aging test rack with a partition structure according to claim 1, characterized in that: The bottom of the connecting block (10) is in contact with the aging test main frame (1).

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