Solid state disk testing equipment

Abstract

The utility model discloses solid state disk test equipment, which comprises a case, a test device, a power supply and a test circuit board, wherein an installation space is formed inside the case; the test device, the power supply and the test circuit board are arranged in the installation space; the case comprises a first fixing plate, and the first fixing plate divides the installation space into a test area and a host area; the testing device and the power supply are arranged in the host area; the test circuit board is arranged in the test area and fixedly connected with the first fixing plate, a plurality of hard disk interfaces are formed in the test circuit board and used for inserting solid state disks to be tested, and the solid state disks are horizontally fixed to the test circuit board. According to the utility model, the test circuit board integrated with the plurality of hard disk interfaces is arranged and electrically connected with the test device, so that the hard disks can be uniformly installed, the equipment space is saved, the equipment structure is compact, and dust can be prevented from entering from the upper part to damage the interfaces due to horizontal insertion of the hard disks.

Description

Technical Field

[0001] The utility model relates to the field of solid state hard disk testing, in particular to a solid state hard disk testing device. Background Art

[0002] Enterprise-grade SSDs are used in various enterprise scenarios, including high-performance computing, edge computing, high-end storage, and data centers. They offer uninterrupted operation and can handle I / O-intensive workloads such as database files, index logs, data analysis, and other performance-intensive transaction processing operations. Compared to consumer-grade SSDs, they offer higher performance, higher reliability, and greater durability. Enterprise-grade SSDs are targeted at enterprise users and require guaranteed data security, speed stability, and long-term durability, placing even stricter demands on high-reliability product delivery. Therefore, testing enterprise-grade SSDs is particularly important.

[0003] During the hard drive production process, hard drive testing equipment is required to perform performance tests on the hard drives. However, current hard drive testing equipment generally fixes multiple hard drives on a hard drive test rack, and then connects all the hard drives to the testing equipment via cables. The hard drive test rack is usually designed to be large in size because it needs to store multiple hard drives and accommodate the passage of cables, making the entire testing equipment structure bulky. At the same time, some existing testing equipment has an upward-facing plug interface, which is prone to dust accumulation when the hard drive is not plugged in, resulting in poor contact of the plug interface. Utility Model Content

[0004] In view of the deficiencies of the prior art, the present invention provides a relatively small solid-state hard disk test device, in which multiple hard disks can be plugged in horizontally to prevent dust from entering the interface.

[0005] The utility model is achieved through the following technical solutions:

[0006] A solid-state hard disk test device includes a chassis with an installation space formed therein, a test device arranged in the installation space, a power supply, and a test circuit board;

[0007] The chassis includes a first fixing plate installed vertically, and the first fixing plate divides the installation space into a test area and a host area;

[0008] The testing device and the power supply are arranged in the host area;

[0009] The test circuit board is vertically arranged in the test area and fixedly connected to the first fixed plate. The test circuit board is integrated with a plurality of hard disk interfaces for plugging in a plurality of solid-state hard disks to be tested. The plurality of solid-state hard disks are electrically connected to the test circuit board through the plurality of hard disk interfaces. The test circuit board is electrically connected to the test device. The plurality of solid-state hard disks are plugged into the hard disk interfaces in a horizontal direction to prevent dust from entering the plurality of hard disk interfaces from above.

[0010] Furthermore, the chassis includes a first side panel and a top panel, the first side panel is provided with an opening for the solid-state hard disks to be placed in the solid-state hard disk testing device, and the top panel is arranged on the top of the chassis and is closed.

[0011] Furthermore, the solid state hard disk test device also includes a guide member, which is fixedly connected to the test circuit board and has a plurality of guide grooves formed on the guide member corresponding one-to-one to the plurality of hard disk interfaces.

[0012] Furthermore, a chamfer is formed on the guide groove away from the test circuit board.

[0013] Furthermore, the solid state drive testing device further includes a plurality of support plates, which are arranged one-to-one correspondingly below the plurality of hard drive interfaces and are fixedly connected to the guide members.

[0014] Furthermore, through holes are formed on the support plate for heat dissipation of the solid state drive.

[0015] Furthermore, the guide member includes at least one pair of guide blocks symmetrically arranged on both sides of the hard disk interface, and the guide groove is formed on the guide blocks.

[0016] Furthermore, the solid-state hard drive testing equipment also includes a plurality of cooling fans, which are arranged on both sides of the solid-state hard drive and have the same wind direction. The chassis includes two symmetrically arranged second side panels, and the second side panels are provided with a plurality of cooling holes.

[0017] Furthermore, the solid state drive testing device further includes an antistatic base, one side of which is fixedly connected to the first fixing plate, and the other side of which is fixedly connected to the test circuit board.

[0018] Furthermore, the chassis further includes a second fixing plate, which is horizontally arranged in the host area, and the testing device and the power supply are respectively arranged on both sides of the second fixing plate.

[0019] Compared with the prior art, the advantages of the present invention are:

[0020] 1. By providing a test circuit board integrated with multiple hard disk interfaces and electrically connecting the test circuit board to the test device, the hard disks can be installed uniformly, saving equipment space and making the equipment structure compact.

[0021] 2. By setting up a vertically installed test circuit board, the hard disk can be plugged into the test circuit board from a horizontal direction, and a support plate is used to support the solid-state drive, so that dust is not easy to fall into the hard disk interface from above and cause damage to the interface.

[0022] 3. The installation space inside the equipment is divided into a test area and a host area, and both are equipped with heat dissipation vents, so that the space layout inside the equipment is reasonable, and each component is installed in a different position to facilitate later maintenance and repair. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a structural diagram of a solid state drive testing device according to an embodiment of the present invention;

[0024] Figure 2 This is a side sectional view of a solid state drive testing device according to an embodiment of the present invention;

[0025] Figure 3 This is a front cross-sectional view of a solid state drive testing device according to an embodiment of the present invention;

[0026] Figure 4 This is a schematic structural diagram of a test circuit board according to an embodiment of the present invention;

[0027] Figure 5 This is a partial structural diagram of a solid state drive testing device according to an embodiment of the present invention;

[0028] Figure 6 This is a schematic structural diagram of an assembled test circuit board and a guide member according to an embodiment of the present invention.

[0029] Explanation of reference numbers: 1. Chassis; 10. First fixing plate; 11. Test area; 12. Host area; 13. Rack; 14. Shell; 140. Heat dissipation hole; 15. Second fixing plate; 2. Test device; 3. Test circuit board; 30. Hard disk interface; 4. Solid-state hard disk; 5. Guide member; 50. Guide groove; 51. Guide block; 53. Chamfer; 54. Support plate; 540. Through hole; 6. Cooling fan; 7. Anti-static base; 8. Power supply; 9. Foot pad; 141. First side panel; 144. Top panel; 142. Opening; 143. Second side panel. DETAILED DESCRIPTION

[0030] The following is a further non-restrictive detailed description of the technical solution of the utility model in conjunction with the preferred embodiments and the accompanying drawings. In the description of the utility model, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" can explicitly or implicitly include at least one of the features. In the description of the utility model, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the utility model, and cannot be understood as limiting the utility model.

[0031] like Figure 1 As shown, a solid-state drive testing device according to one embodiment of the present invention includes a chassis 1 having an internal mounting space, a test device 2 disposed in the mounting space, a power supply 8, and a test circuit board 3. The test circuit board 3 is electrically connected to the test device 2, the power supply 8 is used to power the test device 2, and the test circuit board 3 is used to connect to a plurality of solid-state drives 4 to be tested. By electrically connecting the test circuit board 3, with the plurality of solid-state drives 4 to be tested connected thereto, to the test device 2, the plurality of solid-state drives 4 can be installed uniformly, saving equipment space and making the device compact.

[0032] Further references Figures 2 to 3 The chassis 1 includes a frame 13 and a shell 14 fixed on the frame 13. In this embodiment, the frame 13 is constructed of profiles and the shell 14 is made of sheet metal, which is durable, easy to process and low in cost.

[0033] Chassis 1 also includes a first mounting plate 10 vertically mounted within the installation space. This plate divides the installation space into a test area 11 and a host area 12. The test device 2 and power supply 8 are located within host area 12, while the test circuit board 3 is vertically mounted within test area 11 and secured to the first mounting plate 10 via screws (not shown). Separating the test device 2 and test circuit board 3 from each other separates the heat generated by each, increasing the device's heat dissipation capacity.

[0034] Optionally, the solid-state drive test device further includes an anti-static base 7, one side of which is fixedly connected to the first fixing plate 10, and the other side of which is fixedly connected to the test circuit board 3, so as to prevent static electricity from affecting the test circuit board 3 and thus damaging the device.

[0035] Optionally, the chassis 1 further includes a second fixing plate 15, which is horizontally positioned within the host area 12. The test device 2 and power supply 8 are positioned on either side of the second fixing plate 15. This partitioning of the test device 2 and power supply 8 separates the heat generated by each from the same space, thereby increasing the device's heat dissipation capacity. Furthermore, the test device 2 incorporates an overcurrent protection circuit and a ground fault protection circuit to enhance device safety.

[0036] The test circuit board 3 is integrated with several hard disk interfaces 30 for plugging in several solid-state hard disks 4 to be tested. The several solid-state hard disks 4 are electrically connected to the test circuit board 3 via the several hard disk interfaces 30. The test circuit board 3 is also electrically connected to the test device 2, and the solid-state hard disks 4 are plugged into the hard disk interfaces 30 in a horizontal orientation. The test circuit board 3 with multiple hard disk interfaces 30 allows the multiple solid-state hard disks 4 to be installed uniformly, saving equipment space and making the equipment structure compact. At the same time, the hard disk interfaces 30 and the solid-state hard disks 4 are both arranged horizontally, reducing the possibility of dust entering the interfaces and causing damage to the equipment. In this embodiment, the test circuit board 3 is square and integrated with eight hard disk interfaces 30. The eight hard disk interfaces 30 are arranged in two rows and evenly spaced, which can minimize the area of ​​the test circuit board 3 and thus reduce the size of the equipment.

[0037] Optionally, the housing 14 includes a first side panel 141 having an opening 142 therein for inserting the solid-state drive 4 into the solid-state drive testing apparatus. In this embodiment, the opening 142 is square for ease of processing and for accommodating the test circuit board 3, while also having rounded corners to prevent injury to users.

[0038] Optionally, the housing 14 further includes a top plate 144 , which is disposed on the top of the chassis 1 and is closed except for an opening for fixing, and is used to seal the top of the chassis 1 to prevent dust from falling into the chassis 1 .

[0039] Further references Figure 4The housing 14 also includes a symmetrically arranged second side panel 143. Several heat dissipation holes 140 are provided on the second side panel 143 near the test device 2 and the solid-state drive 4 to enhance heat dissipation. The solid-state drive test equipment also includes several cooling fans 6. These fans 6 are positioned on both sides of the solid-state drive 4, and the fans 6 have the same wind direction. The fans 6 on one side blow inward, drawing cool air from the outside into the device, while the fans 6 on the other side blow outward, removing hot air from the device to the outside. This accelerates air circulation within the device, improves the device's heat dissipation performance, and makes test results more accurate.

[0040] Optionally, a plurality of foot pads 9 are installed under the chassis 1 to reduce the impact of device vibration on the test and to elevate the device to a certain height to increase heat dissipation. In this embodiment, a foot pad 9 is installed at each of the four corners of the device.

[0041] Optionally, refer to Figures 5 and 6 The solid-state hard disk test device further includes a guide member 5. The guide member 5 is fixedly connected to the test circuit board 3 and has a plurality of guide grooves 50 formed thereon corresponding to the plurality of hard disk interfaces 30, for guiding the solid-state hard disk 4 when it is plugged in.

[0042] Optionally, a chamfer 53 is formed on the guide groove 50 away from the test circuit board 3 to serve as a guide when the solid state drive 4 is plugged in.

[0043] Optionally, the guide member 5 includes at least one pair of guide blocks 51 symmetrically disposed on either side of the hard disk interface 30. Guide grooves 50 are formed on the guide blocks 51. In this embodiment, guide blocks 51 are disposed on both sides of the two rows of hard disk interfaces 30. The guide blocks 51 are fixedly connected to the test circuit board 3 via screws (not shown).

[0044] Optionally, the guide member 5 further includes a plurality of support plates 54, which are disposed one-to-one below the plurality of hard drive interfaces 30 and are fixedly connected to the guide member 5. These support plates 54 further support the solid-state drives 4 to prevent them from falling off due to vibration or other reasons during testing. In this embodiment, the support plates 54 are fixed to the guide block 51 by screws. In other optional embodiments, the support plates 54 may also be directly fixedly connected to the test circuit board 3.

[0045] Optionally, a through hole 540 is formed on the support plate 54 for ventilating and dissipating heat for the solid state drive 4 .

[0046] When in use, several solid-state hard disks 4 are inserted into the guide grooves 50 one by one, plugged into the hard disk interfaces 30 integrated on the test circuit board 3, and then the start button on the back of the solid-state hard disk test device is turned on. The solid-state hard disk test device provided by the utility model is provided with a test circuit board 3 integrated with multiple hard disk interfaces 30, and the test circuit board 3 is electrically connected to the test device 2, so that several solid-state hard disks 4 can be installed uniformly, saving equipment space and making the equipment structure compact; the installation space in the equipment is divided into a test area 11 and a host area 12, and both are provided with heat dissipation holes 140, so that the space layout in the equipment is reasonable, the heat dissipation is good, and the various components are installed in different positions for easy later maintenance and repair; by setting a horizontal hard disk interface 30 and using a support plate 54 to support the solid-state hard disk 4, it is not easy for dust to enter the hard disk interface 30 from above and cause damage to the hard disk interface 30.

[0047] The above embodiments merely illustrate several implementations of the present invention. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make numerous variations and improvements without departing from the concept of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A solid state drive testing device, characterized in that: It comprises a chassis (1) with an installation space formed therein, a test device (2) arranged in the installation space, a power supply (8) and a test circuit board (3); The chassis (1) comprises a first fixing plate (10) installed vertically, wherein the first fixing plate (10) divides the installation space into a test area (11) and a host area (12); The testing device (2) and the power supply (8) are arranged in the host area (12); The test circuit board (3) is vertically arranged in the test area (11) and fixedly connected to the first fixing plate (10). The test circuit board (3) is integrated with a plurality of hard disk interfaces (30) for plugging in a plurality of solid-state hard disks (4) to be tested. The plurality of solid-state hard disks (4) are electrically connected to the test circuit board (3) via the plurality of hard disk interfaces (30). The test circuit board (3) is electrically connected to the test device (2). The plurality of solid-state hard disks (4) are plugged into the hard disk interfaces (30) in a horizontal direction to prevent dust from entering the plurality of hard disk interfaces (30) from above.

2. The solid state drive testing device according to claim 1, wherein: The chassis (1) comprises a first side panel (141) and a top panel (144); the first side panel (141) is provided with an opening (142) for allowing the plurality of solid state hard disks (4) to be placed in the solid state hard disk testing device; and the top panel (144) is arranged on the top of the chassis (1) and is closed.

3. The solid state drive testing device according to claim 1, wherein: The solid-state hard disk test device further comprises a guide member (5), the guide member (5) being fixedly connected to the test circuit board (3), and a plurality of guide grooves (50) corresponding one-to-one to the plurality of hard disk interfaces (30) being formed on the guide member (5).

4. The solid state drive testing device according to claim 3, wherein: A chamfer (53) is formed on the guide groove (50) at a position away from the test circuit board (3).

5. The solid state drive testing device according to claim 3, wherein: The solid state hard disk test device further comprises a plurality of support plates (54), which are arranged one by one below the plurality of hard disk interfaces (30) and are fixedly connected to the guide member (5).

6. The solid state drive testing device according to claim 5, wherein: The support plate (54) is formed with through holes (540) for dissipating heat from the solid state hard disk (4).

7. The solid state drive testing device according to claim 3, wherein: The guide member (5) comprises at least one pair of guide blocks (51) symmetrically arranged on both sides of the hard disk interface (30), and the guide groove (50) is formed on the guide block (51).

8. The solid state drive testing device according to claim 1, wherein: The solid-state hard disk test device further comprises a plurality of cooling fans (6), the plurality of cooling fans (6) being arranged on both sides of the solid-state hard disk (4), and the plurality of cooling fans (6) having the same wind direction, the chassis (1) comprising two symmetrically arranged second side panels (143), the second side panels (143) being provided with a plurality of cooling holes (140).

9. The solid state drive testing device according to claim 1, wherein: The solid state hard disk test device further comprises an antistatic base (7), one side of the antistatic base (7) is fixedly connected to the first fixing plate (10), and the other side of the antistatic base (7) is fixedly connected to the test circuit board (3).

10. The solid state drive testing device according to claim 1, wherein: The chassis (1) further comprises a second fixing plate (15), the second fixing plate (15) being horizontally arranged in the host area (12), and the test device (2) and the power supply (8) being respectively arranged on both sides of the second fixing plate (15).

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