High-speed withstand voltage test device and withstand voltage test equipment

Abstract

The utility model discloses a high-speed voltage-withstanding testing device and voltage-withstanding testing equipment. The high-speed voltage-withstanding testing device comprises a mounting seat; the test seat is fixedly connected with the mounting seat, and the test seat comprises a supporting surface for accommodating the inductor and a probe hole which is formed by penetrating downwards from the supporting surface along the vertical direction; the transmission arm is rotationally connected to the lower portion of the mounting base, and the transmission arm can rotate upwards to a first state or rotate downwards to a second state; the test probe is fixed on the transmission arm; the electromagnet is connected between the mounting seat and the transmission arm; the spring assembly is connected between the mounting seat and the transmission arm and is suitable for buffering the transmission arm when the transmission arm turns to the mounting seat; when the electromagnet is powered on, the transmission arm is in a first state and drives the test probe to extend out of the supporting surface along the probe hole, and when the electromagnet is powered off, the transmission arm is in a second state and drives the test probe not to extend out relative to the supporting surface. By adopting the above structure, the test probe is smooth in telescoping, and the test probe can be buffered.

Description

Technical Field

[0001] The utility model relates to the technical field of inductor withstand voltage testing, in particular to a high-speed withstand voltage testing device and withstand voltage testing equipment. Background Art

[0002] Before leaving the factory, chip inductors usually need to be tested for performance using inductor testing equipment to eliminate inductors that fail the test. For example, Chinese utility model patent CN216988719U discloses a fully automated high-speed interlayer withstand voltage test sorting mechanism for power inductors, which uses a vibrating disk direct vibration feeding mechanism to load the inductors to be tested onto a turntable module. The turntable module can drive the inductors to flow through the test module in sequence for testing. However, existing test structures usually use cylinders to drive the test probes to approach and contact the inductors, resulting in low test efficiency. In addition, the test probes have no buffer when contacting the inductors, which can easily cause damage to the inductors and / or probes.

[0003] Therefore, it is necessary to improve the prior art to overcome the above defects. Utility Model Content

[0004] The purpose of the utility model is to provide a high-speed withstand voltage test device and a withstand voltage test equipment, which can test the smoothness of the extension and contraction of the test probe and can buffer the test probe.

[0005] The purpose of the utility model is achieved through the following technical solutions: a high-speed voltage test device, comprising:

[0006] Mounting seat;

[0007] A test seat fixedly connected to the mounting seat, the test seat comprising a support surface for accommodating the inductor and a probe hole vertically extending downward from the support surface;

[0008] A transmission arm is rotatably connected to the bottom of the mounting base, and the transmission arm can be rotated upward to a first state or rotated downward to a second state;

[0009] a test probe, fixed on the transmission arm;

[0010] an electromagnet, mounted between the mounting base and the transmission arm;

[0011] a spring assembly, received between the mounting seat and the transmission arm, and adapted to cushion the transmission arm when the transmission arm turns toward the mounting seat;

[0012] When the electromagnet is powered on, the transmission arm is in the first state and drives the test probe to extend out of the support surface along the probe hole. When the electromagnet is powered off, the transmission arm is in the second state and drives the test probe not to extend relative to the support surface.

[0013] Furthermore, the mounting base is in the shape of an elongated strip, and a connecting portion is extended downward from one end thereof, the connecting portion is rotatably connected to the transmission arm, and the other end of the mounting base is fixedly connected to the test base.

[0014] Furthermore, a fixing seat is detachably provided on one end of the transmission arm away from the connecting portion, and the test probe is fixed on the fixing seat.

[0015] Furthermore, the electromagnet comprises:

[0016] The electromagnet body is fixed to the bottom of the mounting base;

[0017] a transmission member, fixed to the top of the transmission arm;

[0018] When the electromagnet body is powered on, it is suitable for adsorbing the transmission member to drive the transmission arm to rotate upward, and when the electromagnet body is powered off, the transmission member is released from adsorption and the transmission arm rotates downward under the action of gravity.

[0019] Furthermore, the spring assembly includes:

[0020] a bolt member, movably provided in the transmission arm from the bottom of the transmission arm, wherein the end of the bolt member is threadedly connected to the mounting seat;

[0021] a spring, sleeved outside the bolt member, with both ends limited between the mounting seat and the transmission arm;

[0022] Wherein, when the transmission arm is in the first state, the spring is compressed between the mounting seat and the transmission arm, and when the transmission arm is in the second state, the transmission arm is abutted against the cap portion of the bolt member.

[0023] Furthermore, a limit block is provided at one end of the mounting seat close to the test seat, and the limit block is suitable for limiting the extreme position of the upward rotation of the transmission arm.

[0024] Furthermore, the testing device also includes a proximity switch arranged at the bottom of the mounting base, the proximity switch is suitable for detecting the rotation state of the transmission arm, the proximity switch is arranged close to the connecting part, the electromagnet is arranged away from the connecting part, and the spring assembly is located between the proximity switch and the electromagnet.

[0025] Furthermore, the mounting seat is recessed inward from its top surface to form a wiring groove, one end of the wiring groove extends along the length direction of the mounting seat and passes through to the end of the mounting seat, and the other end passes through along the vertical direction to the bottom of the mounting seat corresponding to the electromagnet, and the top of the proximity switch extends into the wiring groove.

[0026] In addition, the utility model also provides a withstand voltage test device, including the above-mentioned high-speed withstand voltage test device.

[0027] Furthermore, the withstand voltage test equipment includes:

[0028] a table top, the mounting seat being arranged on the table top;

[0029] a turntable module rotatably disposed on the platform to receive and deliver inductance;

[0030] A loading device, used for loading the inductor onto the turntable module;

[0031] A blanking device, used for blanking inductors, is disposed on the table and downstream of the testing device;

[0032] Wherein, after the loading device loads the inductor onto the turntable module, the turntable module is suitable for driving the inductor to flow through the testing device and the unloading device in sequence.

[0033] Compared with the prior art, the present invention has the following beneficial effects: the present invention adopts an electromagnet to drive the transmission arm, thereby driving the test probe to extend or not extend relative to the support surface, and the test probe has a high extension and retraction frequency, which effectively improves the test efficiency; the transmission arm is rotatably connected to the mounting base, and the transmission arm moves smoothly, thereby improving the extension and retraction smoothness of the test probe, and the electromagnet only needs to apply a small force to drive the transmission arm, reducing the cost of the electromagnet; in addition, a spring assembly is connected between the mounting base and the transmission arm, which can buffer the transmission arm when the transmission arm turns to the mounting base, so as to play the role of buffering the test probe and reduce the chance of inductance damage during the test, and the reaction force of the spring assembly can ensure that the transmission arm remains in the second state in a natural state. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 It is a structural schematic diagram of the utility model high-speed voltage resistance testing device.

[0035] Figure 2 yes Figure 1 Schematic diagram of the structure in another direction.

[0036] Figure 3 This is a schematic diagram of the structure of the mounting seat in the utility model

[0037] Figure 4 It is a structural diagram of the voltage withstand test equipment of the utility model.

[0038] Description of reference numerals:

[0039] 100. Mounting seat; 110. Connecting portion; 120. Mounting recess; 121. First wall; 122. Second wall; 130. Connecting hole; 140. Wiring groove; 200. Test seat; 210. Support surface; 220. Probe hole; 230. Strip hole; 300. Transmission arm; 400. Test probe; 500. Electromagnet; 510. Electromagnet body; 520. Transmission member; 600. Spring assembly; 610. Bolt member; 611. Cap; 620. Spring; 630. Gasket; 700. Fixing seat; 800. Limit block; 900. Proximity switch; 1000. Table; 2000. Turntable module; 3000. Loading device; 4000. Unloading device. DETAILED DESCRIPTION

[0040] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It will be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some, rather than all, structures related to the present application are shown in the accompanying drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0041] As used herein, the terms "comprise," "comprising," and "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0042] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0043] See also Figures 1 to 3As shown, a high-speed withstand voltage test device corresponding to a preferred embodiment of the present invention includes: a mounting base 100; a test base 200, fixedly connected to the mounting base 100, the test base 200 including a support surface 210 for accommodating an inductor and a probe hole 220 extending downward from the support surface 210 in a vertical direction; a transmission arm 300, rotatably connected to the bottom of the mounting base 100, the transmission arm 300 being capable of rotating upward to a first state or downward to a second state; a test probe 400, fixed to the transmission arm 300; an electromagnet 50 0, received between the mounting base 100 and the transmission arm 300; the spring assembly 600, received between the mounting base 100 and the transmission arm 300, and suitable for buffering the transmission arm 300 when the transmission arm 300 turns toward the mounting base 100; wherein, when the electromagnet 500 is energized, the transmission arm 300 is in a first state, and drives the test probe 400 to extend out of the support surface 210 along the probe hole 220; when the electromagnet 500 is de-energized, the transmission arm 300 is in a second state, and drives the test probe 400 not to extend relative to the support surface 210.

[0044] The present invention uses an electromagnet 500 to drive the transmission arm 300, thereby driving the test probe 400 to extend or not extend relative to the support surface 210. The test probe 400 has a high extension and retraction frequency, which effectively improves the test efficiency; the transmission arm 300 is rotatably connected to the mounting base 100, and the transmission arm 300 moves smoothly, thereby improving the extension and retraction smoothness of the test probe 400, and the electromagnet 500 only needs to apply a small force to drive the transmission arm 300, reducing the cost of the electromagnet 500; in addition, a spring assembly 600 is supported between the mounting base 100 and the transmission arm 300, and when the transmission arm 300 turns to the mounting base 100, it can buffer the transmission arm 300, so as to play the role of buffering the test probe 400 and reduce the probability of inductance damage during the test, and the reaction force of the spring assembly 600 can ensure that the transmission arm 300 remains in the second state in a natural state.

[0045] Furthermore, the mounting base 100 is in the shape of an elongated strip, with a connecting portion 110 extending downward from one end. One end of the transmission arm 300 is rotatably connected to the connecting portion 110, and the other end of the mounting base 100 is fixedly connected to the test base 200. In this embodiment, the end of the mounting base 100 that connects to the test base 200 is recessed inward in the horizontal direction to form an L-shaped mounting recess 120. The mounting recess 120 has a first wall 121 and a second wall 122 that are perpendicular to each other and parallel to the vertical direction. The test base 200 rests on the first wall 121 and the second wall 122, thereby ensuring horizontal positioning accuracy and ensuring reliable alignment of the probe hole 220 with the test probe 400.

[0046] Preferably, the test socket 200 is vertically adjustable relative to the mounting base 100. Specifically, the mounting base 100 is provided with a connecting hole 130, and the test socket 200 is provided with a strip-shaped hole 230 corresponding to the connecting hole 130. The length of the strip-shaped hole 230 is parallel to the vertical direction. A screw is connected between the connecting hole 130 and the strip-shaped hole 230 to achieve fastening of the mounting base 100 and the test socket 200. This structure ensures that the test probe 400 can be reliably extended or retracted from the support surface 210.

[0047] Furthermore, a fixing base 700 is detachably provided at one end of the transmission arm 300 away from the connecting portion 110. A hole is provided on the fixing base 700 for installing the test probe 400, and the test probe 400 is fixed to the fixing base 700. Since the test positions of the inductors are different when testing the inductors of different signals, by providing the fixing base 700, when replacing other types of inductors, it is only necessary to replace the corresponding fixing base 700 and the test base 200. Preferably, the fixing base 700 can be adjusted relative to the transmission arm 300 along the length direction of the mounting base 100. The specific adjustment structure can refer to the adjustment structure between the mounting base 100 and the test base 200. When there is a positional deviation between the probe hole 220 and the test probe 400, the position of the test probe 400 can be adjusted to ensure that the two correspond.

[0048] Furthermore, the electromagnet 500 includes an electromagnet body 510 and a transmission member 520. The electromagnet body 510 is fixed to the bottom of the mounting base 100, and the transmission member 520 is fixed to the top of the transmission arm 300. When the electromagnet body 510 is energized, it is adapted to attract the transmission member 520, thereby driving the transmission arm 300 to rotate upward. When the electromagnet body 510 is de-energized, the transmission member 520 is released from attraction, and the transmission arm 300 rotates downward under the action of gravity. The electromagnet 500 has a conventional structure, and its structure will not be described in detail herein.

[0049] Furthermore, the spring assembly 600 includes a bolt 610 and a spring 620. The transmission arm 300 has a mounting hole extending therethrough along the axial direction of the test probe 400. The bolt 610 is movably inserted into the mounting hole of the transmission arm 300 from the bottom of the transmission arm 300. The end of the bolt 610 is threadedly connected to the mounting base 100. The spring 620 is sleeved outside the bolt 610, with both ends positioned between the mounting base 100 and the transmission arm 300. When the transmission arm 300 is in a first state, the spring 620 is compressed between the mounting base 100 and the transmission arm 300. When the transmission arm 300 is in a second state, the transmission arm 300 abuts against the cap 611 of the bolt 610. By adopting the above-described structure, the spring assembly 600 can cushion the test probe 400 while maintaining a simple structure and easy installation. The bolt member 610 can limit the position of the transmission arm 300 when it rotates downward to the limit position. By tightening or loosening the bolt member 610, the gap between the cap portion 611 and the transmission arm 300 can be adjusted, thereby adjusting the limit position of the transmission arm 300's downward rotation to meet different testing requirements. Preferably, a gasket 630 is provided between the cap portion 611 and the transmission arm 300 to ensure the position of the bolt member 610 while ensuring its reliable fastening to the mounting base 100.

[0050] Furthermore, a limit block 800 is provided at one end of the mounting base 100 near the test base 200. The limit block 800 is adapted to limit the maximum upward rotation position of the transmission arm 300. Preferably, the limit block 800 can also be adjusted vertically relative to the mounting base 100 to adjust the maximum upward rotation position of the transmission arm 300 as needed to meet different testing requirements.

[0051] Furthermore, the testing device also includes a proximity switch 900 arranged at the bottom of the mounting base 100. The proximity switch 900 is suitable for detecting the rotation state of the transmission arm 300. When the transmission arm 300 rotates upward to the first state, the proximity switch 900 can detect the transmission arm 300 to determine that it is in the first state. When the transmission arm 300 rotates downward away from the mounting base 100, the proximity switch 900 cannot detect the transmission arm 300 to determine that it is in the second state, thereby obtaining the position state of the transmission arm 300 in real time during the test process, ensuring that the test probe 400 is accurately driven to rise and fall during the test.

[0052] Preferably, the mounting base 100 is recessed inward from its top surface to form a wiring groove 140. One end of the wiring groove 140 extends along the length of the mounting base 100 and passes through the end of the mounting base 100, and the other end passes through the bottom of the mounting base 100 corresponding to the electromagnet 500 along the vertical direction. The top of the proximity switch 900 extends into the wiring groove 140. The provision of the wiring groove 140 facilitates the regular routing of the electromagnet 500 and the proximity switch 900 and avoids damage to the wires.

[0053] The working process of the high-speed withstand voltage test device of the present invention is as follows: the inductor is placed on the support surface 210, and the inductor is limited by the limiting structure in the vertical upward direction. The electromagnet 500 is energized to drive the transmission arm 300 to rotate upward to the first state. During this process, the spring 620 is gradually compressed to buffer the test probe 400. The test probe 400 extends out of the support surface 210 to contact and test the inductor. After the test is completed, the electromagnet 500 is powered off, and the transmission arm 300 is acted upon by gravity and the rebound of the spring 620. It rotates downward to the second state and is supported by the bolt member 610. Due to the support of the spring 620, the transmission arm 300 is difficult to rotate upward in a natural state. Therefore, the test probe 400 will not extend upward when not acted upon by the electromagnet 500, and the reliability is good.

[0054] In addition, refer to Figure 4 As shown, the present invention also provides a withstand voltage test device, including the aforementioned high-speed withstand voltage test device. The withstand voltage test device also includes a platen 1000, a turntable module 2000, a loading device 3000, and a unloading device 4000. The mounting seat 100 is disposed on the platen 1000. The turntable module 2000 is rotatably disposed on the platen 1000 to receive and transport inductors. The loading device 3000 is used to load the inductors onto the turntable module 2000. The unloading device 4000 is used to unload the inductors. It is disposed on the platen 1000 and is located downstream of the test device. After the loading device 3000 loads the inductors onto the turntable module 2000, the turntable module 2000 is adapted to drive the inductors to flow through the test device and the unloading device 4000 in sequence.

[0055] The above description is only an implementation method of the present application and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the description and drawings of this application, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A high-speed withstand voltage test device, characterized in that: include: Mounting seat (100); A test seat (200) is fixedly connected to the mounting seat (100), and the test seat (200) includes a support surface (210) for accommodating an inductor and a probe hole (220) extending downward from the support surface (210) in a vertical direction; A transmission arm (300) is rotatably connected to the bottom of the mounting base (100), and the transmission arm (300) can be rotated upward to a first state or rotated downward to a second state; A test probe (400) is fixed on the transmission arm (300); An electromagnet (500) is received between the mounting seat (100) and the transmission arm (300); a spring assembly (600) received between the mounting seat (100) and the transmission arm (300) and adapted to cushion the transmission arm (300) when the transmission arm (300) turns toward the mounting seat (100); When the electromagnet (500) is powered on, the transmission arm (300) is in the first state and drives the test probe (400) to extend out of the support surface (210) along the probe hole (220); when the electromagnet (500) is powered off, the transmission arm (300) is in the second state and drives the test probe (400) not to extend relative to the support surface (210).

2. The high-speed withstand voltage test device according to claim 1, wherein: The mounting seat (100) is in the shape of an elongated strip, with a connecting portion (110) extending downward from one end thereof. The connecting portion (110) is rotatably connected to the transmission arm (300), and the other end of the mounting seat (100) is fixedly connected to the test seat (200).

3. The high-speed withstand voltage test device according to claim 2, wherein: A fixing seat (700) is detachably provided at one end of the transmission arm (300) away from the connecting portion (110), and the test probe (400) is fixed on the fixing seat (700).

4. The high-speed withstand voltage test device according to claim 1, wherein: The electromagnet (500) comprises: The electromagnet body (510) is fixed to the bottom of the mounting base (100); A transmission member (520) is fixed to the top of the transmission arm (300); When the electromagnet body (510) is powered on, it is suitable for adsorbing the transmission member (520) to drive the transmission arm (300) to rotate upward, and when the electromagnet body (510) is powered off, the transmission member (520) is released from adsorption, and the transmission arm (300) rotates downward under the action of gravity.

5. The high-speed withstand voltage test device according to claim 1, wherein: The spring assembly (600) comprises: a bolt member (610) movably inserted into the transmission arm (300) from the bottom of the transmission arm (300), and an end of the bolt member (610) is threadedly connected to the mounting seat (100); a spring (620) sleeved outside the bolt member (610), with both ends limited between the mounting seat (100) and the transmission arm (300); When the transmission arm (300) is in the first state, the spring (620) is compressed between the mounting seat (100) and the transmission arm (300), and when the transmission arm (300) is in the second state, the transmission arm (300) is held against the cap portion (611) of the bolt member (610).

6. The high-speed withstand voltage test device according to claim 2, wherein: A limit block (800) is provided at one end of the mounting seat (100) close to the test seat (200), and the limit block (800) is suitable for limiting the extreme position of the upward rotation of the transmission arm (300).

7. The high-speed withstand voltage test device according to claim 2, wherein: The testing device further comprises a proximity switch (900) arranged at the bottom of the mounting seat (100), the proximity switch (900) being suitable for detecting the rotation state of the transmission arm (300), the proximity switch (900) being arranged close to the connecting portion (110), the electromagnet (500) being arranged away from the connecting portion (110), and the spring assembly (600) being located between the proximity switch (900) and the electromagnet (500).

8. The high-speed withstand voltage test device according to claim 7, wherein: The mounting seat (100) is recessed inward from its top surface to form a wiring groove (140), one end of the wiring groove (140) extends along the length direction of the mounting seat (100) and passes through to the end of the mounting seat (100), and the other end passes through along the vertical direction to the bottom of the mounting seat (100) corresponding to the electromagnet (500), and the top of the proximity switch (900) extends into the wiring groove (140).

9. A withstand voltage test device, characterized in that: The high-speed voltage withstand test device comprises the device according to any one of claims 1 to 8.

10. The withstand voltage test equipment according to claim 9, comprising: a table (1000), the mounting seat (100) being arranged on the table (1000); A turntable module (2000) is rotatably disposed on the platform (1000) to receive and transmit inductance; A loading device (3000) for loading the inductor onto the turntable module (2000); A blanking device (4000) for blanking inductors, which is arranged on the platform (1000) and located downstream of the testing device; Wherein, after the loading device (3000) loads the inductor onto the turntable module (2000), the turntable module (2000) is suitable for driving the inductor to flow through the testing device and the unloading device (4000) in sequence.

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