Mutual inductor testing device
By designing a transformer testing device and using power parts to drive the test frame to automatically abut the transformer pins, the problem of low transformer detection efficiency is solved and an efficient and safe detection process is achieved.
Patent Information
- Application Number
- CN202422598838.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-25
- Publication Date
- 2025-10-03
- Estimated Expiration
- 2034-10-25
AI Technical Summary
During the transformer testing process, the large number of pins results in time-consuming equipment installation and low testing efficiency.
A transformer testing device is designed, which includes a frame, a power component, a test frame and a probe. The power component drives the test frame to move back and forth in a linear direction, so that the probe automatically contacts the pin of the detection instrument, simplifying the equipment installation process.
It improves the detection efficiency of mutual inductors, reduces the time of equipment installation and removal, reduces the probability of damage to probes and pins, and improves the safety and stability of detection.
Smart Images
Figure CN223413460U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of electrical component testing devices, and in particular to a transformer testing device. Background Art
[0002] A current transformer is a measuring instrument that converts a large current on one side into a small current on the secondary side based on the principle of electromagnetic induction. A current transformer consists of a closed iron core and windings. After the current transformer completes the assembly production process, the finished current transformer needs to be tested to determine the product performance.
[0003] The relevant transformer test is completed through power supply, ammeter and voltmeter. The transformer is provided with multiple pins, which are used to connect the power supply, ammeter or voltmeter. The power supply is connected to the metering coil and leakage coil of the transformer and inputs current. The corresponding pins of the transformer output voltage. The user connects the voltmeter to the corresponding pins of the transformer to detect the output voltage value and determine whether the transformer is qualified.
[0004] The above-mentioned related technical solutions have the following defects: there are many pins on the transformer, and many devices need to be installed. It takes time to install the detection equipment on the transformer, resulting in low detection efficiency. Utility Model Content
[0005] In order to improve the detection efficiency of a mutual inductor, the present application provides a mutual inductor testing device.
[0006] The present application provides a transformer testing device that adopts the following technical solution:
[0007] A transformer testing device includes a frame, a power component, a test frame and multiple probes. The frame includes a horizontal plate and a vertical plate. The horizontal plate and the vertical plate are perpendicular to each other and connected. The horizontal plate is used to place an instrument to be tested. The power component is installed on the vertical plate. The test frame is installed on the power component. The power component drives the test frame to reciprocate in a straight line. The movement direction of the test frame is perpendicular to the horizontal plate. The probes are installed on the test frame. The probes are used to abut against the pins of the instrument to be tested and conduct electricity.
[0008] By adopting the above technical solution, by arranging a power part on the vertical plate, the user can control the extension and contraction of the power part to make the test frame move back and forth in a straight line. The user places the instrument to be tested on the horizontal plate and controls the drop of the test frame so that the multiple probes on the test frame can respectively abut the pins of the instrument to be tested. The user installs devices with different functions on the probes so that the multiple devices are electrically connected to the instrument to be tested through the probes, thereby achieving the purpose of testing the production quality of the transformer. During the testing process, the user does not need to install and remove the equipment on the instrument to be tested, thereby improving the testing efficiency.
[0009] Optionally, a mounting seat is provided on the horizontal plate, and a card slot is provided on the top surface of the mounting seat, and the card slot is used to receive the detection instrument.
[0010] By adopting the above technical solution, a mounting base is set on the horizontal plate, and a slot is opened on the mounting base. The instrument to be tested can be stuck in the slot of the mounting base, thereby reducing the chance of the instrument to be tested slipping on the mounting base. When the test stand falls, the probe on the test stand can stably abut against the pin of the instrument to be tested.
[0011] Optionally, a plurality of mounting holes are provided on the mounting seat, and the mounting holes are used to set bolts, and the mounting seat is detachably connected to the horizontal plate.
[0012] By adopting the above technical solution and opening a mounting hole on the mounting seat, users can connect mounting seats of different shapes to the rack, so that instruments to be tested of different shapes can be snapped onto the rack for testing.
[0013] Optionally, the vertical plate is provided with a plurality of waist holes, bolts are provided in the waist holes, the power member is detachably connected to the vertical plate through the waist holes, and the length direction of the waist holes is perpendicular to the horizontal plate.
[0014] By adopting the above technical solution, a waist hole is opened on the vertical plate and the power part is installed in the waist hole. The user can adjust the position of the power part according to the size of the instrument to be tested, thereby achieving the effect of adjusting the position and movement range of the test frame.
[0015] Optionally, a slider is fixed on the test stand, a slide rail is installed on the vertical plate, the length direction of the slide rail is perpendicular to the horizontal plate, and the slider is embedded in and slidably connected to the slide rail.
[0016] By adopting the above technical solution, a slider is set on the test frame, and the slider is slidably connected to the slide rail. The slide rail plays a guiding role, which can reduce the probability of position deviation during the movement of the test frame and enable the probe to stably abut the pin of the instrument to be tested.
[0017] Optionally, the probe includes an insulating sleeve and a conductive member, the insulating sleeve is made of insulating material, the insulating sleeve is arranged outside the conductive member, and the insulating sleeve passes through the test frame and is connected to the test frame.
[0018] By adopting the above technical solution and providing an insulating sleeve outside the conductive part, the probability of leakage when the conductive part contacts the pins of the instrument to be tested is reduced, thereby improving the safety of the testing work.
[0019] Optionally, the probe is slidably connected to the test frame, and the sliding direction of the probe is perpendicular to the horizontal plate.
[0020] By adopting the above technical solution, the probe is slidably connected to the test frame. When the test frame drives the probe to fall, the probe can abut against the instrument to be tested. When the power part drives the test frame to continue to fall, the probe can automatically slide on the test frame, thereby reducing the chance of damage to the probe and the pins of the instrument to be tested during the testing process.
[0021] Optionally, a snap-fit convex circle is provided on the insulating sleeve, and the snap-fit convex circle is arranged above the test frame, and the snap-fit convex circle is detachably connected to the insulating sleeve.
[0022] By adopting the above technical solution, a snap-fitting convex circle is provided on the insulating sleeve so that the snap-fitting convex circle can be clamped on the upper surface of the test frame. The user adjusts the position of the snap-fitting convex circle on the insulating sleeve to adjust the relative position of the probe and the test frame. When the test frame falls, multiple probes can be electrically connected to different pins of the instrument to be tested in different orders, thereby facilitating detection for multiple purposes.
[0023] In summary, the beneficial technical effects of this application are:
[0024] 1. By arranging a power piece on the vertical plate, the user can control the extension and contraction of the power piece to make the test frame move back and forth in a straight line. The user places the instrument to be tested on the horizontal plate and controls the test frame to fall so that the multiple probes on the test frame can respectively abut the pins of the instrument to be tested. The user installs devices with different functions on the probes, so that multiple devices are electrically connected to the instrument to be tested through the probes, achieving the purpose of testing the production quality of the mutual inductor. During the testing process, the user does not need to install and remove the equipment on the instrument to be tested, thereby improving the testing efficiency.
[0025] 2. By setting a mounting base on the horizontal plate, the mounting base has a slot, and the instrument to be tested can be stuck in the slot of the mounting base, thereby reducing the probability of the instrument to be tested slipping on the mounting base. When the test stand falls, the probes on the test stand can stably contact the pins of the instrument to be tested;
[0026] 3. By sliding the probe to the test frame, when the test frame drives the probe to fall, the probe can abut against the instrument to be tested. When the power part drives the test frame to continue to fall, the probe can automatically slide on the test frame, thereby reducing the chance of damage to the probe and the pins of the instrument to be tested during the testing process. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] Figure 1 This is a schematic diagram of the usage status of an embodiment of the present application.
[0028] Figure 2 It is a schematic diagram of the overall structure of an embodiment of the present application.
[0029] Figure 3It is a schematic structural diagram of the waist hole in an embodiment of the present application.
[0030] Figure 4 Schematic diagram of the position of the probe in the embodiment of the present application.
[0031] Figure 5 This is a schematic diagram of the position of the clamping convex circle in the embodiment of the present application Figure 1 .
[0032] Figure 6 This is a schematic diagram of the position of the clamping convex circle in the embodiment of the present application Figure 2 .
[0033] Figure numerals: 1, frame; 11, horizontal plate; 111, mounting seat; 112, slot; 113, mounting hole; 12, vertical plate; 121, waist hole; 2, power part; 3, test frame; 31, slider; 32, slide rail; 4, probe; 41, insulating sleeve; 411, snap-on convex circle; 42, conductive part. DETAILED DESCRIPTION
[0034] The present application is further described in detail below with reference to the accompanying drawings.
[0035] The present application discloses a mutual inductor testing device, referring to Figure 1 and Figure 2 , including a frame 1, a power part 2, a test frame 3 and multiple probes 4. The frame 1 includes a horizontal plate 11 and a vertical plate 12. The horizontal plate 11 and the vertical plate 12 are perpendicular to each other and connected. A mounting seat 111 is provided on the horizontal plate 11, and the instrument to be tested is placed on the mounting seat 111. The power part 2 can use a cylinder or an electric cylinder. The shell of the power part 2 is fixed on the vertical plate 12. The length direction of the power part 2 is perpendicular to the horizontal plate 11. The test frame 3 is fixed on the piston rod of the power part 2. The power part 2 is used to drive the test frame 3 to move back and forth in the vertical direction. Multiple probes 4 are provided on the test frame 3. The probes 4 pass through the test frame 3 and are connected to the test frame 3. The probes 4 are used for conductivity. The length direction of the probes 4 is parallel to the length direction of the power part 2. The two ends of the probes 4 are respectively located on the upper and lower sides of the test frame 3. After the user places the instrument to be tested on the mounting seat 111, the test stand 3 is made to fall vertically by controlling the movement of the power part 2, so that the lower end of the probe 4 can be abutted against the pin of the instrument to be tested. The user sets an electric wire at the upper end of the probe 4 so that devices such as ammeter, voltmeter and power supply can be connected to the instrument to be tested through the probe 4, thereby achieving the effect of testing the quality of the instrument. Multiple probes 4 are set on the test stand 3, and the user can connect different devices to the probe 4 at the same time, so that the test stand 3 drives multiple probes 4 to abut against pins with different functions of the instrument to be tested, thereby improving the detection efficiency.
[0036] Reference Figure 2The mounting base 111 is provided with a slot 112, which is formed on the upper surface of the mounting base 111. The instrument to be tested can be snapped into the slot 112. The mounting base 111 is provided with multiple mounting holes 113, and bolts are installed in the mounting holes 113. The mounting base 111 is removably connected to the horizontal plate 11 via the bolts. The user can install mounting bases 111 of different shapes under the test frame 3, so that instruments of different shapes can be snapped onto the rack 1 for testing.
[0037] Reference Figure 3 A plurality of waist holes 121 are provided on the vertical plate 12. The length direction of the waist holes 121 is parallel to the length direction of the power part 2. Bolts are provided in the waist holes 121. The bolts are threadedly connected to the power part 2. The user can install the power part 2 at different positions in the waist holes 121, thereby facilitating the adjustment of the position of the power part 2 and the test frame 3.
[0038] Reference Figure 2 The test stand 3 is provided with a plurality of sliders 31, which are fixedly connected to the test stand 3. Slide rails 32 are fixedly connected to the vertical plate 12. The sliders 31 are embedded in the slide rails 32 and slidably connected to the slide rails 32. The length of the slide rails 32 is parallel to the length of the power member 2. The slide rails 32 serve as guides, ensuring that the test stand 3 is parallel to the horizontal plate 11 during movement, thereby allowing the multiple probes 4 on the test stand 3 to abut the pins of the instrument to be tested when they fall.
[0039] Reference Figure 4 and Figure 5 The probe 4 includes an insulating sleeve 41 and a conductive member 42. The insulating sleeve 41 is made of rubber and has a cylindrical structure. The conductive member 42 has a cylindrical structure. The insulating sleeve 41 is sleeved outside the conductive member 42. The insulating sleeve 41 passes through and is slidably connected to the test frame 3. When the power member 2 drives the test frame 3 to fall, the probe 4 falls with the power member 2 and abuts against the instrument to be tested. At this time, the power member 2 continues to drive the test frame 3 to fall, and the probe 4 can automatically slide on the test frame 3, thereby reducing the chance of damage to the probe 4 and the pins of the instrument to be tested.
[0040] Reference Figure 5 The insulating sleeve 41 is provided with a snap-fitting protrusion 411, which is coaxially connected to the insulating sleeve 41 and located on the upper side of the test stand 3. When the probe 4 is disconnected from the instrument to be tested, the probe 4 automatically slides under the action of gravity until the snap-fitting protrusion 411 abuts the test stand 3. As the test stand 3 gradually descends, the probe 4 can abut the instrument to be tested and slide automatically.
[0041] Reference Figure 6, the snap-fitting convex circle 411 is detachably connected to the insulating sleeve 41, and the outer wall of the insulating sleeve 41 is provided with an external thread, and the snap-fitting convex circle 411 is connected to the insulating sleeve 41 by a thread. The user can adjust the height of the probe 4 on the test stand 3 by adjusting the position of the snap-fitting convex circle 411 on the insulating sleeve 41, so that when the test stand 3 falls, the probe 4 can successively abut against the pins of the instrument to be tested. The user can set a power supply, an ammeter or a voltmeter on different probes 4, thereby completing the requirements for performance testing and reducing the probability of damage to the equipment connected to the probe 4. In other embodiments, the snap-fitting convex circle 411 can be made of elastic rubber material, the insulating sleeve 41 is inserted into the snap-fitting convex circle 411, the insulating sleeve 41 and the snap-fitting convex circle 411 are interference fit, and the surface of the insulating sleeve 41 is smooth and flat, and can slide stably in the through hole of the test stand 3.
[0042] The implementation principle of the embodiment of the present application is: by setting a mounting base 111 on the rack 1, the instrument to be tested can be clamped on the mounting base 111; by setting multiple probes 4 on the test frame 3, the test frame 3 can drive the probes 4 to move vertically back and forth, and then the probes 4 can abut against the pins of the instrument to be tested; by connecting a power supply, an ammeter or a voltmeter to the probes 4, various parameter performances of the instrument to be tested can be tested, thereby improving work efficiency.
[0043] The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application should be included in the scope of protection of the present application.
Claims
1. A transformer testing device, characterized in that: The invention comprises a frame (1), a power member (2), a test frame (3) and a plurality of probes (4), wherein the frame (1) comprises a horizontal plate (11) and a vertical plate (12), wherein the horizontal plate (11) and the vertical plate (12) are perpendicular to each other and connected to each other, wherein the horizontal plate (11) is used to place an instrument to be detected, wherein the power member (2) is mounted on the vertical plate (12), and the test frame (3) is mounted on the power member (2), wherein the power member (2) drives the test frame (3) to move back and forth in a straight line, wherein the moving direction of the test frame (3) is perpendicular to the horizontal plate (11), and the probes (4) are mounted on the test frame (3), and wherein the probes (4) are used to contact the pins of the instrument to be detected and conduct electricity.
2. A transformer testing device according to claim 1, characterized in that: A mounting seat (111) is provided on the horizontal plate (11), and a card slot (112) is provided on the top surface of the mounting seat (111). The card slot (112) is used to receive and receive a detection instrument.
3. A transformer testing device according to claim 2, characterized in that: The mounting seat (111) is provided with a plurality of mounting holes (113), the mounting holes (113) being used to set bolts, and the mounting seat (111) is detachably connected to the horizontal plate (11).
4. A transformer testing device according to claim 1, characterized in that: The vertical plate (12) is provided with a plurality of waist holes (121), bolts are provided in the waist holes (121), the power member (2) is detachably connected to the vertical plate (12) through the waist holes (121), and the length direction of the waist holes (121) is perpendicular to the horizontal plate (11).
5. The mutual inductor testing device according to claim 1, characterized in that: A slider (31) is fixed on the test frame (3), a slide rail (32) is installed on the vertical plate (12), the length direction of the slide rail (32) is perpendicular to the horizontal plate (11), and the slider (31) is embedded in and slidably connected to the slide rail (32).
6. A transformer testing device according to claim 1, characterized in that: The probe (4) comprises an insulating sleeve (41) and a conductive member (42). The insulating sleeve (41) is made of insulating material. The insulating sleeve (41) is sleeved outside the conductive member (42). The insulating sleeve (41) passes through the test frame (3) and is connected to the test frame (3).
7. A transformer testing device according to claim 6, characterized in that: The probe (4) is slidably connected to the test frame (3), and the sliding direction of the probe (4) is perpendicular to the horizontal plate (11).
8. The mutual inductor testing device according to claim 7, characterized in that: The insulating sleeve (41) is provided with a snap-fitting convex circle (411), which is arranged above the test stand (3), and the snap-fitting convex circle (411) is detachably connected to the insulating sleeve (41).