Special test assembly for turret

Abstract

The utility model relates to a special test assembly for a turret, which comprises a test base, a circuit board and a test unit, the test base comprises a test base body and a fixed connecting piece, the fixed connecting piece is fixedly arranged on the test base body, the fixed connecting piece is provided with a fixed connecting hole, and the fixed connecting hole is provided with an internal thread; a first positioning piece is further fixedly arranged on the fixed connecting piece; a first positioning through hole and a first connecting through hole are formed in the circuit board, and both the first positioning through hole and the first connecting through hole penetrate through the circuit board; when the testing base and the circuit board are fixedly connected together, a first positioning piece of a fixed connecting piece on the testing base penetrates through a first positioning through hole in the circuit board, a fixed connecting hole is aligned with a first connecting through hole, and the first connecting through hole is located over the fixed connecting hole.

Description

Technical Field

[0001] The utility model relates to a chip testing technology, in particular to a turret-specific testing component. Background Art

[0002] Currently, chip testing is primarily accomplished using a test device. In one prior art, the test device includes a base, a circuit board, and a test unit. The base and circuit board are assembled together, and the test unit is assembled together with the circuit board. The chip under test is then placed in the test unit to perform chip testing. However, in this prior art, the fixed connection structures between the base and circuit board, and between the test unit and circuit board, are complex. While this connection structure can provide a more secure connection, it is time-consuming to assemble and disassemble the test unit, resulting in low work efficiency to a certain extent. Summary of the Invention

[0003] The purpose of the utility model is to solve the shortcomings of the prior art and to propose a turret-specific test component.

[0004] In order to achieve the above-mentioned purpose, the utility model adopts the following technical solutions: a turret-specific test assembly, comprising a test base, a circuit board, and a test unit, the test base comprising a test base body and a fixed connecting piece, the fixed connecting piece being fixedly mounted on the test base body, a fixed connecting hole being provided on the fixed connecting piece, and the fixed connecting hole having an internal thread; a first positioning piece is also fixedly provided on the fixed connecting piece; a first positioning through hole and a first connecting through hole are provided on the circuit board, and both the first positioning through hole and the first connecting through hole pass through the circuit board; when the test base and the circuit board are fixedly connected together, the first positioning piece of the fixed connecting piece on the test base passes through the first positioning through hole on the circuit board, and the fixed connecting hole and the first connecting through hole are aligned, And the first connecting through hole is located directly above the fixed connecting hole; a second positioning through hole and a second connecting through hole are provided on the test unit, and the second positioning through hole and the second connecting through hole both pass through the test unit. When the test unit is installed on the circuit board, the first positioning through hole passes through the first positioning through hole and is inserted into the second positioning through hole, so as to position the test unit. At this time, the second connecting through hole and the first connecting through hole are aligned, and the second connecting through hole is located above the first connecting through hole, and the second connecting through hole has an internal thread, which is screwed into the second connecting through hole, the first connecting through hole and the fixed connecting hole by screws / bolts, so that the test unit, the circuit board and the test base are detachably fixed together.

[0005] Furthermore, the test base also includes a connecting boss, which protrudes upward from the test base body to a preset height, and a third connecting through-hole is provided on the connecting boss, and the third connecting through-hole passes through the connecting boss; a preset number of fourth connecting through-holes are provided on the circuit board, and the fourth connecting through-hole passes through the circuit board. When the circuit board is installed on the test base, the third connecting through-hole is aligned with one of the fourth connecting through-holes on the circuit board, and the fourth connecting through-hole is located above the third connecting through-hole, and is screwed into the fourth connecting through-hole and the third connecting through-hole by screws / bolts, thereby fixing the circuit board and the test base together.

[0006] Furthermore, the fixed connection member is fixedly mounted on the test base body by bonding or screw / bolt connection.

[0007] Furthermore, the test base further includes a support platform, which is fixedly mounted on the test base body by welding, bonding, or screw / bolt connection, and the connecting boss and the support platform have the same height.

[0008] Furthermore, a fifth connecting through-hole is provided on the support platform, the fifth connecting through-hole passes through the support platform, and the fifth connecting through-hole has an internal thread; when the test base and the circuit board are installed together, the fifth connecting through-hole is aligned with one of the fourth connecting through-holes on the circuit board, and the fourth connecting through-hole is located above the fifth connecting through-hole, and is screwed into the fifth connecting through-hole and the fourth connecting through-hole by screws / bolts, so that the test base and the circuit board are fixedly connected together.

[0009] Furthermore, a preset number of third positioning holes are provided on the circuit board, and the third positioning holes pass through the circuit board; a preset number of second positioning members are also provided on the support platform. When the circuit board and the test base are installed together, the second positioning members on the support platform are inserted into the third positioning holes on the circuit board, thereby realizing the positioning of the circuit board.

[0010] Furthermore, a third positioning member is fixedly provided on the connecting boss. When the circuit board and the test base are installed together, the third positioning member is inserted into the third positioning hole on the circuit board 2 to achieve positioning of the circuit board.

[0011] Furthermore, a test frame is provided on the test unit, and the chip is placed in the test frame.

[0012] The beneficial effects of the present application are as follows: the turret-specific test assembly provided by the present application has a simple structure and is easy to assemble and disassemble. By setting positioning parts on the test base and positioning holes on the circuit board and the test unit, the circuit board and the test unit can be quickly installed, and the three can be fixed and assembled with just a few screws or bolts, which greatly improves the efficiency of disassembly and replacement. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 This is a structural schematic diagram of a turret-specific test assembly provided by the utility model.

[0014] Figure 2 This is another structural schematic diagram of a turret-specific test assembly provided by the present invention, in which the test unit is removed.

[0015] Figure 3 This is a structural schematic diagram of a test base of a turret-specific test assembly provided by the utility model.

[0016] Figure 4 for Figure 1 A partial enlarged view of a turret-specific test assembly is shown in FIG. DETAILED DESCRIPTION

[0017] The present application is further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core portion of the present application being overwhelmed by excessive descriptions. For those skilled in the art, it is not necessary to describe these related operations in detail. They can fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0018] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various implementations, and the operational steps involved in each embodiment may be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the specification and drawings are only for the purpose of clearly describing a particular embodiment and do not imply a required composition and / or sequence.

[0019] The serial numbers assigned to components herein, such as "first," "second," etc., are used solely to distinguish the objects being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings).

[0020] Please refer to Figure 1-4 The present application provides a turret-specific test assembly (hereinafter referred to as the test assembly), which includes a test base 1, a circuit board 2, and a test unit 3. The test base 1 includes a test base body 10 and a fixed connecting member 12. The fixed connecting member 12 is fixedly installed on the test base body 10, and a fixed connecting hole 120 is provided on the fixed connecting member 12. The fixed connecting hole 120 has an internal thread; a first positioning member 13 is also fixedly provided on the fixed connecting member 12; a first positioning through hole 21 and a first connecting through hole 22 are provided on the circuit board 2, and the first positioning through hole 21 and the first connecting through hole 22 both pass through the circuit board 2; when the test base 1 and the circuit board 2 are fixedly connected together, the first positioning member 13 of the fixed connecting member 12 on the test base 1 passes through the first positioning through hole 21 on the circuit board 2, and the fixed connecting hole 120 and the first connecting through hole 22 are aligned. , and the first connecting through hole 22 is located directly above the fixed connecting hole 120; a second positioning through hole 32 and a second connecting through hole 31 are provided on the test unit 3, and the second positioning through hole 32 and the second connecting through hole 31 both pass through the test unit 3. When the test unit 3 is installed on the circuit board 2, the first positioning member 13 passes through the first positioning through hole 21 and is inserted into the second positioning through hole 32, so as to position the test unit 3. At this time, the second connecting through hole 31 and the first connecting through hole 22 are aligned, and the second connecting through hole 31 is located above the first connecting through hole 22, and the second connecting through hole 31 has an internal thread, which is screwed into the second connecting through hole 31, the first connecting through hole 21 and the fixed connecting hole 120 by screws / bolts, so that the test unit 3, the circuit board 2 and the test base 1 are detachably fixed together.

[0021] In one embodiment of the present application, the test base further includes a connecting boss 11, which protrudes upward from the test base body 10 by a preset height, and a third connecting through-hole 110 is provided on the connecting boss 11, and the third connecting through-hole 110 passes through the connecting boss 11; a preset number of fourth connecting through-holes 23 are provided on the circuit board 2, and the fourth connecting through-holes 23 pass through the circuit board 2. When the circuit board 2 is installed on the test base 1, the third connecting through-hole 110 is aligned with one of the fourth connecting through-holes 23 on the circuit board 2, and the fourth connecting through-hole 23 is located above the third connecting through-hole 110, and is screwed into the fourth connecting through-hole 23 and the third connecting through-hole 110 by screws / bolts, thereby fixing the circuit board 2 and the test base 1 together.

[0022] In one embodiment of the present application, the fixing connection member 12 is fixedly mounted on the test base body 10 by bonding or screw / bolt connection.

[0023] In one embodiment of the present application, the test base 1 further includes a support platform 14, which is fixedly mounted on the test base body 10 by welding, bonding, or screw / bolt connection, and the connecting boss 11 and the support platform 14 have the same height.

[0024] In one embodiment of the present application, a fifth connecting through-hole 140 is provided on the support platform 14, and the fifth connecting through-hole 140 passes through the support platform 14, and the fifth connecting through-hole 140 has an internal thread; when the test base 1 and the circuit board 2 are installed together, the fifth connecting through-hole 140 and one of the fourth connecting through-holes 23 on the circuit board 2 are aligned, and the fourth connecting through-hole 23 is located above the fifth connecting through-hole 140, and is screwed into the fifth connecting through-hole 140 and the fourth connecting through-hole 23 by screws / bolts, so that the test base 1 and the circuit board 2 are fixedly connected together.

[0025] In one embodiment of the present application, a preset number of third positioning holes 24 are further provided on the circuit board 2, and the third positioning holes 24 pass through the circuit board 2; a preset number of second positioning members 141 are also provided on the support platform 14. When the circuit board 2 and the test base 1 are installed together, the second positioning members 141 on the support platform 14 are inserted into the third positioning holes 24 on the circuit board 2, thereby realizing the positioning of the circuit board 2.

[0026] In one embodiment of the present application, a third positioning member 111 is fixedly provided on the connecting boss 11. When the circuit board 2 and the test base 1 are installed together, the third positioning member 111 is inserted into the third positioning hole 24 on the circuit board 2 to achieve the positioning of the circuit board 2.

[0027] In one embodiment of the present application, a test frame 30 is further provided on the test unit 3 , and the chip is placed in the test frame 30 .

[0028] The turret-specific test assembly provided in the present application has a simple structure and is easy to disassemble and assemble. By setting positioning parts on the test base and setting positioning holes on the circuit board and the test unit, the circuit board and the test unit can be quickly installed, and the three can be fixed and assembled with just a few screws or bolts, which greatly improves the efficiency of disassembly and replacement.

[0029] The above embodiments are intended only to illustrate the technical concepts and features of the present invention. Their purpose is to enable those familiar with the art to understand the contents of the present invention and implement them accordingly. They are not intended to limit the scope of protection of the present invention. Any equivalent changes or modifications based on the spirit of the present invention are intended to be included in the scope of protection of the present invention.

Claims

1. A turret-specific test assembly, characterized in that: The test base comprises a test base, a circuit board, and a test unit, wherein the test base comprises a test base body and a fixed connecting piece, wherein the fixed connecting piece is fixedly mounted on the test base body, and a fixed connecting hole is provided on the fixed connecting piece, and the fixed connecting hole has an internal thread; a first positioning piece is also fixedly provided on the fixed connecting piece; a first positioning through hole and a first connecting through hole are provided on the circuit board, and the first positioning through hole and the first connecting through hole both pass through the circuit board; when the test base and the circuit board are fixedly connected together, the first positioning piece of the fixed connecting piece on the test base passes through the first positioning through hole on the circuit board, and the fixed connecting hole and the first connecting through hole are aligned, and the first connecting through hole is located at the fixed connecting hole. The hole is directly above the test unit; a second positioning through hole and a second connecting through hole are provided on the test unit, and the second positioning through hole and the second connecting through hole both pass through the test unit. When the test unit is installed on the circuit board, the first positioning through hole passes through the first positioning through hole and is inserted into the second positioning through hole, so as to position the test unit. At this time, the second connecting through hole and the first connecting through hole are aligned, and the second connecting through hole is located above the first connecting through hole, and the second connecting through hole has an internal thread, which is screwed into the second connecting through hole, the first connecting through hole and the fixed connecting hole by a screw / bolt, so that the test unit, the circuit board and the test base are detachably fixed together.

2. The turret-specific test assembly according to claim 1, characterized in that: The test base also includes a connecting boss, which protrudes upward from the test base body to a preset height, and a third connecting through-hole is provided on the connecting boss, and the third connecting through-hole passes through the connecting boss; a preset number of fourth connecting through-holes are provided on the circuit board, and the fourth connecting through-hole passes through the circuit board. When the circuit board is installed on the test base, the third connecting through-hole is aligned with one of the fourth connecting through-holes on the circuit board, and the fourth connecting through-hole is located above the third connecting through-hole, and is screwed into the fourth connecting through-hole and the third connecting through-hole by screws / bolts, thereby fixing the circuit board and the test base together.

3. The turret-specific test assembly according to claim 2, characterized in that: The fixed connection member is fixedly mounted on the test base body by bonding or screw / bolt connection.

4. The turret-specific test assembly according to claim 2, characterized in that: The test base further includes a support platform, which is fixedly mounted on the test base body by welding, bonding, or screw / bolt connection, and the connecting boss and the support platform have the same height.

5. The turret-specific test assembly according to claim 4, characterized in that: A fifth connecting through-hole is provided on the support platform, the fifth connecting through-hole passes through the support platform, and the fifth connecting through-hole has an internal thread; when the test base and the circuit board are installed together, the fifth connecting through-hole is aligned with one of the fourth connecting through-holes on the circuit board, and the fourth connecting through-hole is located above the fifth connecting through-hole, and is screwed into the fifth connecting through-hole and the fourth connecting through-hole by screws / bolts, so that the test base and the circuit board are fixedly connected together.

6. The turret-specific test assembly according to claim 5, characterized in that: A preset number of third positioning holes are also provided on the circuit board, and the third positioning holes pass through the circuit board; a preset number of second positioning members are also provided on the support platform. When the circuit board and the test base are installed together, the second positioning members on the support platform are inserted into the third positioning holes on the circuit board, thereby realizing the positioning of the circuit board.

7. The turret-specific test assembly according to claim 6, characterized in that: A third positioning member is fixedly provided on the connecting boss. When the circuit board and the test base are mounted together, the third positioning member is inserted into a third positioning hole on the circuit board, thereby achieving positioning of the circuit board.

8. The turret-specific test assembly according to claim 1, characterized in that: The test unit is provided with a test frame, and the chip is placed in the test frame.

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