Chip detection jig and bare chip detection jig

Abstract

The utility model relates to the technical field of chip detection, in particular to a chip detection jig which comprises a jig seat, two symmetrical chip grooves are arranged on the jig seat, and chips are placed in the chip grooves. The chip testing jig further comprises chip locking mechanisms, a testing mechanism and a supporting mechanism, the number of the chip locking mechanisms is four, two of the chip locking mechanisms are correspondingly arranged at the rear ends of the two chip grooves, the other two of the chip locking mechanisms are arranged on the side faces, away from each other, of the two chip grooves respectively, and the chip locking mechanisms are arranged on the jig seat and make contact with and lock chips. The testing mechanism is arranged above the two chip grooves, the supporting mechanisms are arranged on the jig seat on the two sides of the two chip grooves, and the testing mechanism is detachably connected to the supporting mechanisms. When the chip detection device is used, a chip is placed in the chip groove, the chip is locked through the chip locking mechanism, detection is carried out through the testing mechanism, the chips of different sizes can be placed in the chip groove to be locked and detected through the arrangement of the chip locking mechanism, the flexibility is high, and the stability of chip detection can be guaranteed.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip detection technical field, concretely relates to a chip detection fixture and bare chip detection fixture. BACKGROUND

[0002] Chip testing, design initial stage system level chip testing, chip detection technology is a part of semiconductor manufacturing industry, and semiconductor manufacturing industry is classified as high -tech industry. Chip detection includes logic test, this covers functional test, timing test, performance test, stability test etc. whether the logic circuit in the chip is correct, whether the timing is in conformity with the stipulation, whether the performance reaches the standard and whether the working state is stable are judged to judge whether the chip is normal. In addition, it also includes signal integrity test, evaluates the input and output signal integrity of chip, and temperature test to evaluate the performance and working reliability of chip under different temperatures.

[0003] Chip testing is generally through test probe contacts chip, and chip information is transmitted through probe and connector to other test software or test equipment to test, needs to clamp and fix the chip to be tested when detecting the chip to guarantee the stability of detection, because in practical application, the size of chip is different, needs to fix the chip of different size when detecting, if a detection fixture only aims at one kind of size chip, then use is more single, is not flexible. And because each chip is different, the position that can be detected is also different, and the setting of probe needs to detect different positions of different chips flexibly. UTILITARIAN CONTENT

[0004] The utility model provides a kind of chip detection fixture and bare chip detection fixture to reach the purpose of locking different size chip and probe test flexibility.

[0005] To achieve the above object, the technical scheme of the utility model is as follows: a chip detection fixture is provided, which has the following innovative features: a fixture base is provided, two symmetrical chip slots are provided on the fixture base, and a chip is placed in each chip slot; a chip locking mechanism, a testing mechanism and a supporting mechanism are further included; the chip locking mechanism has four components, two of which are arranged at the rear ends of the two chip slots, and the other two are arranged on the sides of the two chip slots that are farthest apart; the chip locking mechanism is arranged on the fixture base and contacts and locks the chip in the chip slot; the testing mechanism is arranged above the two chip slots; the supporting mechanism is arranged on the fixture base on both sides of the two chip slots; and the testing mechanism is detachably connected to the supporting mechanism.

[0006] Further, the chip locking mechanism comprises a locking groove, an electric push rod and a locking plate, the locking groove is arranged on the jig base at a position corresponding to each chip locking mechanism, the locking groove is not communicated with the chip groove, the electric push rod is arranged in the locking groove and the telescopic end of the electric push rod penetrates into the chip groove, and the locking plate is arranged in the chip groove and parallel to the side of the corresponding chip groove.

[0007] Further, two take-and-place grooves are symmetrically arranged on the two sides of each chip groove, the take-and-place groove is communicated with the chip groove, and the bottom of the take-and-place groove is higher than the bottom of the chip groove.

[0008] Further, the testing mechanism comprises a probe connector, the probe connector is arranged above the two chip grooves, the bottom of the probe connector is uniformly provided with a plurality of telescopic probes corresponding to the positions of the two chip grooves, and the top of the probe connector is provided with a communication interface.

[0009] Further, the telescopic probe arranged on the probe connector is a P75-B1 telescopic probe.

[0010] Further, the supporting mechanism comprises two supporting plates, the two supporting plates are symmetrically arranged on the two sides of the two chip grooves of the jig base, and the two ends of the probe connector are detachably connected with the two supporting plates.

[0011] Further, the two ends of the probe connector are detachably connected with the two supporting plates in the following mode: the two ends of the probe connector are symmetrically provided with inverted L-shaped connecting pieces, the mutually close sides of the two supporting plates are provided with insertion blocks, the insertion blocks are provided with insertion grooves corresponding to the vertical positions of the connecting pieces, and the vertical positions of the connecting pieces are inserted into the corresponding insertion grooves.

[0012] The utility model also provides a die detection jig, and its innovation point lies in: comprising chip detection jig as above, and the chip is die.

[0013] Compared with the prior art, the utility model has the following beneficial effects:

[0014] The chip detection jig has the advantages that: when the chip detection jig is used, the chip is placed in the chip groove, the chip is locked by the chip locking mechanism, and the chip is detected by the testing mechanism, the chip locking mechanism can lock and detect chips of different sizes in the chip groove, the flexibility is high, and the stability of chip detection can be ensured.

[0015] In the utility model, the two chip locking mechanisms corresponding to the two chip grooves are symmetrical, and the two chip locking mechanisms arranged on the side faces are arranged on side faces away from each other, so that the distance between the two chip grooves can be shortened, and the testing mechanism can conveniently test the chips in the two chip grooves. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 This is a schematic diagram of the overall structure of a chip detection fixture of the present invention.

[0018] Figure 2 For the utility model Figure 1 There is no structural diagram of the testing mechanism and the supporting mechanism.

[0019] Figure 3 For the utility model Figure 2 A in the enlarged view.

[0020] Figure 4 For the utility model Figure 2 Enlarged view of point B in .

[0021] Figure 5 For the utility model Figure 2 Schematic diagram of the structure with a partition in the chip slot on the left side.

[0022] Among them, 1- fixture seat, 2- chip slot, 3- chip, 4- chip locking mechanism, 41- locking slot, 42- electric push rod, 43- locking plate, 44- partition, 5- testing mechanism, 51- probe connector, 52- telescopic probe, 53- communication interface, 6- support mechanism, 61- support plate, 62- connector, 63- plug-in block, 64- slot, 7- pick-and-place slot. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0024] In the present invention, directional words such as "rear end", "left side", "right side", "left side", etc. generally refer to the directions shown in the accompanying drawings and are not intended to limit the present invention. When the chip detection fixture of the present invention is actually used, the actual direction of use shall prevail.

[0025] Example 1

[0026] This embodiment provides a chip detection fixture, including a fixture base 1, on which two chip slots 2 are symmetrically provided. The specific structure is as follows: Figure 1 and 2 As shown, a chip 3 is placed in the chip slot 2. For comparison, Figure 1 and 2 In the figure, the chip slot 2 on the left does not have a chip 3, and the chip slot 2 on the right has a chip 3; it also includes a chip locking mechanism 4, a testing mechanism 5 and a supporting mechanism 6. There are four chip locking mechanisms 4, two of which are respectively arranged at the rear ends of the two chip slots 2, and the other two are respectively arranged on the sides of the two chip slots 2 away from each other. The chip locking mechanism 4 is arranged on the jig seat 1 and contacts and locks the chip 3 in the chip slot 2; the testing mechanism 5 is arranged above the two chip slots 2, and the supporting mechanism 6 is arranged on the jig seat 1 on both sides of the two chip slots 2. The testing mechanism 5 is detachably connected to the supporting mechanism 6.

[0027] When this embodiment is in use, the chip 3 is placed in the chip slot 2, the chip 3 is locked by the chip locking mechanism 4, and is tested by the testing mechanism 5. The setting of the chip locking mechanism 4 enables chips 3 of different sizes to be placed in the chip slot 2 and locked and tested, which is highly flexible and can ensure the stability of the chip 3 detection.

[0028] In this embodiment, the two chip locking mechanisms 4 corresponding to the two chip slots 2 are symmetrical, and the two chip locking mechanisms 4 arranged on the side are arranged on the sides away from each other, which can shorten the distance between the two chip slots 2, and further facilitate the testing mechanism 5 to test the chips 3 in the two chip slots 2.

[0029] Example 2

[0030] The chip locking mechanism 4 of this embodiment includes a locking groove 41, an electric push rod 42 and a locking plate 43. Figure 3 and 4 As shown, the locking groove 41 is provided on the fixture base 1 at a position corresponding to each chip locking mechanism 4. The locking groove 41 is not connected to the chip slot 2. The electric push rod 42 is provided in the locking groove 41, and the telescopic end extends through the chip slot 2. The locking plate 43 is in the chip slot 2 and parallel to the corresponding side of the chip slot 2. The telescopic end of the electric push rod 42 is fixed on the locking plate 43.

[0031] The rest is the same as in Example 1.

[0032] The chip locking mechanism 4 in the embodiment is used in practice by placing the chip 3 in the chip slot 2, pushing the corresponding locking plate 43 towards the chip 3 by the electric push rod 42 (the electric push rod 42 is prior art, which is controlled to extend and retract by electricity, and will not be described in detail here) at the rear end and the side of the chip 3, and locking the chip 3 to ensure the stability of the chip 3 and avoid the instability of the chip 3 affecting the detection. It can lock different sizes of chips 3.

[0033] In actual use, a partition 44 can also be placed at the inner front end of the chip slot 2 or the inner side away from the locking plate 43, which can control the position of the locked chip 3, as shown in Figure 5

[0034] Embodiment 3

[0035] Each chip slot 2 in the embodiment is also symmetrically provided with two taking and placing slots 7 on both sides, the taking and placing slots 7 are communicated with the chip slot 2, and the bottom of the taking and placing slot 7 is higher than the bottom of the chip slot 2. The thickness of the chip 3 can be adapted to the height of the chip slot 2, and the taking and placing slot 7 is convenient for placing and taking out the chip 3.

[0036] The rest is the same as embodiment 2.

[0037] Embodiment 4

[0038] The test mechanism 5 of the embodiment includes a probe connector 51, which is arranged above the two chip slots 2. The bottom of the probe connector 51 is uniformly provided with a plurality of telescopic probes 52 corresponding to the positions of the two chip slots 2, and the top of the probe connector 51 is provided with a communication interface 53.

[0039] Preferably, the telescopic probe 52 provided on the probe connector 51 of the embodiment is a telescopic probe of model P75-B1.

[0040] The rest is the same as embodiment 1.

[0041] In use, the communication interface 53 at the top of the probe connector 51 is connected to a detection device or detection software, the telescopic probe 52 corresponding to the detection point (such as a solder pad) on the chip 3 is elongated according to the size and position of the chip 3 to be detected, and the detection point on the chip 3 is contacted for detection. The detection is convenient and efficient.

[0042] Embodiment 5

[0043] The support mechanism 6 of the embodiment includes two support plates 61, which are symmetrically arranged on both sides of the two chip slots 2 of the jig seat 1, and the two ends of the probe connector 51 are detachably connected with the two support plates 61.

[0044] ​The detachable connection of the two ends of the probe connector 51 and the two support plates 61 is as follows: the two ends of the probe connector 51 are symmetrically provided with inverted L-shaped connecting pieces 62, the mutually close sides of the two support plates 61 are provided with insertion blocks 63, the insertion blocks 63 are provided with insertion grooves 64 corresponding to the vertical parts of the connecting pieces 62, and the vertical parts of the connecting pieces 62 are inserted into the corresponding insertion grooves 64.

[0045] The rest is the same as in Embodiment 4.

[0046] In this embodiment, when the test mechanism 5 is installed, the test mechanism 5 is moved from top to bottom, the vertical parts of the connecting pieces 62 at the two ends of the test mechanism 5 correspond to the insertion grooves 64 on the insertion blocks 63 at the two ends respectively, and the vertical parts of the connecting pieces 62 are inserted into the insertion grooves 64 correspondingly downward, so that the test mechanism 5 and the support plates 61 are detachably connected, and the installation and disassembly are convenient and fast.

[0047] Embodiment 6

[0048] On the basis of any one of Embodiments 1-5, this embodiment provides a die detection jig, which comprises the chip detection jig of any one of Embodiments 1-5, and specifically, the chip 3 in this embodiment is a die.

[0049] The die refers to a chip produced in a factory, which has only a pressure welding point for packaging and cannot be directly applied to an actual circuit. The die is detected by placing the die in a chip slot, locking by a chip locking mechanism, and detecting by a telescopic probe.

[0050] The above-described embodiments are merely preferred embodiments of the present application for description, and do not limit the design concept and scope of the present application. Without departing from the design concept of the present application, various modifications and improvements of the technical solution of the present application made by ordinary engineering technicians in the art shall fall within the protection scope of the present application. The technical content claimed by the present application has been entirely recorded in the technical requirements.

Claims

1. A chip detection fixture, characterized by: The chip detection fixture comprises a fixture base, two symmetrical chip slots provided on the fixture base, and a chip placed in each chip slot; a chip locking mechanism, a testing mechanism, and a supporting mechanism; the chip locking mechanism comprises four locking slots provided on the fixture base, two of which are provided at the rear end of the two chip slots, and the other two are provided on the side of the two chip slots away from each other; the testing mechanism is provided above the two chip slots; and the supporting mechanism is provided on the fixture base on the two sides of the two chip slots.

2. The chip detection fixture of claim 1, wherein: The chip locking mechanism comprises a locking slot, an electric push rod, and a locking plate; the locking slot is provided on the fixture base at a position corresponding to each chip locking mechanism; the electric push rod is provided in the locking slot and has an extending end penetrating into the chip slot; and the locking plate is parallel to the side of the corresponding chip slot.

3. The chip detection fixture of claim 2, wherein: Two take-and-place slots are symmetrically provided on the two sides of each chip slot; the take-and-place slots are connected to the chip slots and have a bottom higher than that of the chip slots.

4. The chip detection fixture of claim 1, wherein: The testing mechanism comprises a probe connector provided above the two chip slots; the bottom of the probe connector is uniformly provided with a plurality of retractable probes at positions corresponding to the two chip slots; and the top of the probe connector is provided with a communication interface.

5. The chip detection fixture of claim 4, wherein: The retractable probes provided on the probe connector are P75-B1 retractable probes.

6. The chip detection fixture of claim 4, wherein: The supporting mechanism comprises two supporting plates symmetrically provided on the fixture base on the two sides of the two chip slots; and the two ends of the probe connector are detachably connected to the two supporting plates.

7. The chip detection fixture of claim 6, wherein: The two ends of the probe connector are detachably connected to the two supporting plates in the following manner: the two ends of the probe connector are symmetrically provided with inverted L-shaped connecting pieces; the mutually approaching sides of the two supporting plates are provided with insertion blocks; the insertion blocks are provided with insertion slots corresponding to the vertical parts of the connecting pieces; and the vertical parts of the connecting pieces are inserted into the corresponding insertion slots.

8. A die detection tool, characterized by: The chip detection fixture comprises the chip detection fixture according to any one of claims 1-7, and the chip is a bare chip.

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