PCB (Printed Circuit Board) test fixture with elastic probe structure
By setting springs with different elastic coefficients to connect probes on the PCB board test fixture, the problem of probe damage to the gold finger area is solved, thus protecting the PCB board.
Patent Information
- Application Number
- CN202423316540.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-10-28
- Estimated Expiration
- 2034-12-31
AI Technical Summary
Existing PCB testing fixtures can easily damage the gold fingers by pressing down on them during PCB testing, thus affecting the board's performance.
Design a PCB board test fixture with an elastic probe structure. The probe is connected by springs with different elastic coefficients. The first spring with a smaller elastic coefficient protects the gold finger area, while the second spring with a larger elastic coefficient protects the exposed copper area, thus reducing damage.
It effectively reduces damage to the gold finger area of the PCB board, avoids pin marks, and protects the performance of the PCB board.
Smart Images
Figure CN223486128U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of PCB board testing fixtures, and in particular to a PCB board testing fixture with an elastic probe structure. Background Technology
[0002] PCB (Printed Circuit Board) test fixtures are auxiliary equipment specifically designed for testing and experimenting with the functionality, power calibration, lifespan, and performance of PCBs. They are typically placed at the end of the production process to check the integrity of the PCB's functions. By using test fixtures, it is ensured that the electrical conductivity, soldering quality, and overall performance of the PCB meet design requirements, thereby improving the quality of the shipped product.
[0003] Existing PCB test fixtures require probes on the fixture to press against the exposed copper and gold fingers of the PCB to test conductivity when testing its electrical performance. However, the gold fingers are more fragile than the exposed copper. Therefore, when the probes press against the gold fingers, excessive pressure can easily cause damage, leaving needle marks and affecting the PCB's performance. Summary of the Invention
[0004] Therefore, it is necessary to provide a PCB board testing fixture with an elastic probe structure.
[0005] The technical solution of this utility model to solve the above-mentioned technical problems is as follows: A PCB board test fixture with an elastic probe structure includes: a fixture body, a first probe, a second probe, a first spring, and a second spring; the fixture body has a first pinhole and a second pinhole, the first spring and the first probe are both disposed in the first pinhole, one end of the first spring abuts against the bottom of the first pinhole, the second end of the first spring is connected to the first probe, and the end of the first probe away from the first spring at least partially protrudes out of the first pinhole; the second spring and the second probe are both disposed in the second pinhole, one end of the second spring abuts against the bottom of the second pinhole, the second end of the second spring is connected to the second probe, and the end of the second probe away from the second spring at least partially protrudes out of the second pinhole; the elastic coefficient of the first spring is smaller than that of the second spring.
[0006] In one embodiment, the portion of the first probe protruding beyond the first pinhole is a first protrusion, and the portion of the second probe protruding beyond the second pinhole is a second protrusion, wherein the length of the first protrusion is shorter than the length of the second protrusion.
[0007] In one embodiment, the length of the first protrusion is 0.04 mm shorter than the length of the second protrusion.
[0008] In one embodiment, the end of the first probe furthest from the first spring is rounded.
[0009] In one embodiment, the end of the second probe furthest from the second spring is configured as a rounded head.
[0010] In one embodiment, the cross-sectional area of the first probe is greater than the cross-sectional area of the second probe.
[0011] In one embodiment, positioning mounting posts are provided at the four corners of the fixture plate.
[0012] In one embodiment, the end of the positioning mounting post away from the fixture plate is configured as a pointed end.
[0013] The beneficial effects of this utility model are as follows: This utility model provides a PCB board testing fixture with an elastic probe structure. Two springs with different elastic coefficients are set on the fixture body, and each spring connects to a different probe. A first spring with a smaller elastic coefficient is used to connect to the first probe, which is used to press down against the gold finger area of the PCB board for testing. A second spring with a larger elastic coefficient is used to connect to the second probe, which is used to test other exposed copper areas of the PCB board. When the fixture body presses down to test the PCB board, the first spring with the smaller elastic coefficient deforms more easily. Therefore, when the first probe connected to the first spring contacts the gold finger area of the PCB board, it can reduce damage to the gold finger area, i.e., avoid leaving needle marks on the gold finger, thereby protecting the PCB board. Attached Figure Description
[0014] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.
[0015] Figure 1 This is a three-dimensional structural diagram of a PCB board test fixture with an elastic probe structure in one embodiment;
[0016] Figure 2 In one embodiment Figure 1 A magnified schematic diagram of part A in the middle section;
[0017] Figure 3This is a three-dimensional exploded view of a PCB board test fixture with an elastic probe structure in one embodiment;
[0018] Figure 4 In one embodiment Figure 3 A magnified schematic diagram of part B in the middle section.
[0019] In the attached figures, 10 is a PCB board test fixture with an elastic probe structure; 100 is the fixture body; 110 is the first pinhole; 120 is the second pinhole; 200 is the first probe; 210 is the first protrusion; 300 is the second probe; 310 is the second protrusion; 400 is the first spring; 500 is the second spring; and 600 is the mounting post. Detailed Implementation
[0020] It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments of the present invention can be combined with each other. The technical solutions of the present invention will be further described below with reference to the accompanying drawings of the embodiments. The present invention is not limited to the specific embodiments described below.
[0021] It should be understood that the same or similar reference numerals in the accompanying drawings of the embodiments correspond to the same or similar components. In the description of this utility model, it should be understood that if terms such as "upper," "lower," "front," "rear," "left," "right," "top," and "bottom" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, they are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, the terms describing positional relationships in the accompanying drawings are for illustrative purposes only and should not be construed as limiting this patent. Those skilled in the art can understand the specific meaning of the above terms according to the specific circumstances.
[0022] In one embodiment, Figure 1 and Figure 3As shown, a PCB board testing fixture 10 with an elastic probe structure includes: a fixture body 100, a first probe 200, a second probe 300, a first spring 400, and a second spring 500; the fixture body 100 has a first pinhole 110 and a second pinhole 120, the first spring 400 and the first probe 200 are both disposed in the first pinhole 110, one end of the first spring 400 abuts against the bottom of the first pinhole, and the second end of the first spring 400 is connected to the first probe 200. The end of the second spring 400 away from the first spring 400 protrudes at least partially outside the first pinhole 110; the second spring 500 and the second probe 300 are both disposed inside the second pinhole 120, one end of the second spring 500 abuts against the bottom of the second pinhole, the second end of the second spring 500 is connected to the second probe 300, and the end of the second probe 300 away from the second spring 500 protrudes at least partially outside the second pinhole 120; the elastic coefficient of the first spring 400 is less than the elastic coefficient of the second spring 500.
[0023] Specifically, two springs with different elastic coefficients are provided on the fixture plate 100, and each spring is connected to a different probe. The first spring 400 with a smaller elastic coefficient is used to connect to the first probe 200, and the first probe 200 is used to press down against the gold finger area of the PCB board for detection. The second spring 500 with a larger elastic coefficient is used to connect to the second probe 300, and the second probe 300 is used to detect other exposed copper areas of the PCB board. When the fixture plate 100 presses down to detect the PCB board, the first spring 400 with the smaller elastic coefficient deforms more easily. Therefore, when the first probe 200 connected to the first spring 400 contacts the gold finger area of the PCB board, it can reduce damage to the gold finger area, i.e., avoid leaving needle marks on the gold finger area, thereby protecting the PCB board.
[0024] To better protect the PCB board, in one embodiment, such as Figure 2As shown, the portion of the first probe 200 protruding beyond the first pinhole 110 is the first protrusion 210, and the portion of the second probe 300 protruding beyond the second pinhole 120 is the second protrusion 310. The length of the first protrusion 210 is shorter than the length of the second protrusion 310. Specifically, since it is difficult for the machine to control the downward pressure, by setting the first protrusion 210 of the first probe 200 to be shorter than the second protrusion 310 of the second probe 300, the second probe 300 on the fixture plate 100 will contact the PCB board first, thereby relieving the pressure first. This ensures that when the first probe 200 contacts the PCB board, there will not be excessive pressure, thus better protecting the PCB board to be tested.
[0025] In one embodiment, Figure 2 As shown, the length of the first protrusion 210 is 0.04 mm shorter than the length of the second protrusion 310. Specifically, by setting the length of the first protrusion 210 of the first probe 200 to be 0.04 mm shorter than the length of the second protrusion 310 of the second probe 300, the pressure is reduced when the second probe 300 contacts the gold finger portion on the PCB board, thereby better protecting the PCB board.
[0026] To better protect the gold finger area of the PCB board, in one embodiment, such as Figure 2 and Figure 4 As shown, the end of the first probe 200 furthest from the first spring 400 is rounded. Specifically, by making the end of the first probe 200 furthest from the first spring 400 rounded, the end of the first probe 200 that contacts the PCB board is also rounded. When the rounded-headed first probe 200 contacts the gold fingers of the PCB board, the contact area is larger and the pressure is lower, thus ensuring that the first probe 200 causes minimal damage to the gold fingers of the PCB board when in contact with them.
[0027] To better protect the exposed copper areas of the PCB board, in one embodiment, such as Figure 2 and Figure 4 As shown, the end of the second probe 300 furthest from the second spring 500 is rounded. Specifically, by making the end of the second probe 300 furthest from the second spring 500 rounded, the end of the second probe 300 that contacts the PCB board is rounded. When the rounded-headed second probe 300 contacts the exposed copper area of the PCB board, the contact area is larger and the pressure is lower, thus ensuring that the second probe 300 causes minimal damage to the exposed copper area of the PCB board when in contact with it.
[0028] To further reduce damage to the gold finger area of the PCB board, in one embodiment, such as Figure 2 and Figure 4 As shown, the cross-sectional area of the first probe 200 is larger than that of the second probe 300. Specifically, by increasing the cross-sectional area of the first probe 200, the contact area is larger and the pressure is lower when the first probe 200 contacts the gold fingers of the PCB board, thereby minimizing damage to the gold fingers of the PCB board and protecting the PCB board.
[0029] In order to ensure that the PCB board test fixture 10 with the elastic probe structure can accurately fit onto the test machine, in one embodiment, such as Figure 1 and Figure 3 As shown, positioning mounting posts 600 are respectively provided at the four corners of the fixture plate 100. Specifically, the testing machine has corresponding positioning holes, and each positioning mounting post 600 is aligned with a positioning hole. With the above arrangement, the PCB board testing fixture 10 with elastic probe structure can be accurately fitted onto the testing machine by inserting the positioning mounting posts 600 into the positioning holes.
[0030] To facilitate the insertion of the positioning mounting post 600 into the positioning hole, in one embodiment, such as Figure 1 and Figure 3 As shown, the end of the positioning mounting post 600 furthest from the fixture plate 100 is designed as a pointed tip. Specifically, by designing the end of the positioning mounting post 600 furthest from the fixture plate 100 as a pointed tip, that is, by designing the end of the positioning mounting post 600 that needs to be inserted into the positioning hole as a pointed tip, the pointed positioning mounting post 600 can be inserted into the positioning hole more easily.
[0031] Obviously, the above embodiments of this utility model are merely examples for clearly illustrating this utility model, and are not intended to limit the implementation of this utility model. Those skilled in the art can make other variations or modifications based on the above description. It is neither necessary nor possible to exhaustively describe all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the protection scope of the claims of this utility model.
Claims
1. A PCB board testing fixture with an elastic probe structure, characterized in that, include: Fixture plate, first probe, second probe, first spring and second spring; The fixture plate has a first pinhole and a second pinhole. The first spring and the first probe are both disposed in the first pinhole. One end of the first spring abuts against the bottom of the first pinhole, and the second end of the first spring is connected to the first probe. At least part of the end of the first probe away from the first spring protrudes out of the first pinhole. The second spring and the second probe are both disposed in the second pinhole. One end of the second spring abuts against the bottom of the second pinhole, and the second end of the second spring is connected to the second probe. At least part of the end of the second probe away from the second spring protrudes out of the second pinhole. The spring constant of the first spring is less than that of the second spring.
2. The PCB board test fixture with an elastic probe structure according to claim 1, characterized in that, The portion of the first probe protruding beyond the first pinhole is the first protrusion, and the portion of the second probe protruding beyond the second pinhole is the second protrusion. The length of the first protrusion is shorter than the length of the second protrusion.
3. The PCB board test fixture with an elastic probe structure according to claim 2, characterized in that, The length of the first protrusion is 0.04 mm shorter than the length of the second protrusion.
4. The PCB board test fixture with an elastic probe structure according to claim 1, characterized in that, The end of the first probe furthest from the first spring is rounded.
5. The PCB board test fixture with an elastic probe structure according to claim 1, characterized in that, The end of the second probe furthest from the second spring is rounded.
6. The PCB board test fixture with an elastic probe structure according to claim 1, characterized in that, The cross-sectional area of the first probe is larger than that of the second probe.
7. The PCB board test fixture with an elastic probe structure according to claim 1, characterized in that, Positioning and mounting posts are respectively provided at the four corners of the fixture plate.
8. The PCB board test fixture with an elastic probe structure according to claim 7, characterized in that, The end of the positioning and mounting post furthest from the fixture plate is designed with a pointed tip.