Testing device

Abstract

The utility model relates to a testing device for testing a solar cell unit. The testing device comprises a testing table, the testing table comprises a bearing plate, the bearing plate is provided with a contact area for bearing the solar cell unit, an enamel insulation structure is arranged in the contact area, and a communication groove penetrating through the bearing plate is formed in the contact area; and the test assembly is used for being in contact with an electrode of the solar cell unit through the communication groove. According to the testing device provided by the invention, the short circuit risk of the solar cell unit in the testing process can be reduced, and the processing and maintenance cost of the testing device is reduced.

Description

Technical Field

[0001] This application relates to the field of photovoltaic technology, and in particular to a testing device. Background Technology

[0002] During the production, storage, transportation, and installation of solar cells and photovoltaic modules, defects such as microcracks, broken grids, contamination, or cell degradation may occur, potentially affecting the power and efficiency of the solar cells or photovoltaic modules. Traditional imaging systems struggle to identify these defects, necessitating the use of electroluminescence to detect microcracks, false printing, broken grids, and dirt in solar cells or photovoltaic modules. However, current electroluminescence testing stations are not suitable for back-contact cells and modules, and their processing and maintenance costs are high. Utility Model Content

[0003] Based on this, this application provides a testing device that can reduce the short-circuit risk of solar cell units during testing and reduce the processing and maintenance costs of the testing device.

[0004] This application provides a testing apparatus for testing solar cell units. The testing apparatus includes:

[0005] The test stand includes a support plate, which has a contact area for supporting solar cell units. The contact area is provided with an enamel insulation structure, and a connecting groove penetrating the support plate is opened in the contact area.

[0006] Test assembly, used to contact the electrodes of the solar cell unit through a connecting slot.

[0007] In one embodiment, the enamel insulation structure has a thickness D along a first direction, where 1 mm ≤ D ≤ 10 mm; the first direction is perpendicular to the plane of the support plate.

[0008] In one embodiment, a groove is formed in the contact area of ​​the bearing plate, and the enamel insulation structure is located in the groove; the dimension of the groove along the first direction is the same as the dimension of the enamel insulation structure along the first direction.

[0009] In one embodiment, the test bench further includes a platform body, a support plate is disposed at one end of the platform body and forms a vacuum chamber with the platform body; the vacuum chamber is connected to a connecting groove, and a vacuum interface communicating with the vacuum chamber is provided on the side wall of the platform body.

[0010] In one embodiment, the testing apparatus further includes a mounting structure disposed within a vacuum chamber, on which the testing components are mounted.

[0011] In one embodiment, the mounting structure includes a connected mounting element and a support plate, with the test component mounted on the mounting element.

[0012] In one embodiment, the testing apparatus further includes a cooling structure installed inside the support plate, the cooling structure being used at least to cool the contact area.

[0013] In one embodiment, the cooling structure includes cooling pipes installed inside a support plate, and the support plate is also provided with a coolant inlet and a coolant outlet connected to the cooling pipes.

[0014] In one embodiment, a plurality of spaced-apart connecting slots are provided in the contact area, and the testing device includes a plurality of testing components, which are arranged at intervals within the connecting slots.

[0015] The test components include a first test piece and a second test piece, and the test device also includes a first busbar connected to the first test piece and a second busbar connected to the second test piece.

[0016] In one embodiment, the testing device further includes a first terminal and a second terminal disposed on the test bench, wherein the first terminal is electrically connected to one end of the first busbar and the second terminal is electrically connected to one end of the second busbar.

[0017] The aforementioned testing device features an enamel-lined insulation structure in the contact area of ​​the support plate. Even if both the positive and negative electrodes of the solar cell unit are in contact with this insulation structure, a short circuit will not occur, reducing the risk of short circuits during testing. A through-slot is provided in the contact area, allowing the test component to contact and conduct with the electrodes of the solar cell unit. The enamel-lined insulation structure, made of enamel material, is easier to detect when there is localized damage, facilitating timely maintenance or replacement. Furthermore, the enamel insulation structure has better thermal conductivity, enabling more effective heat absorption and release, resulting in better heat dissipation. It is also less prone to deformation under heat, reducing measurement errors. In addition, enamel material is relatively inexpensive, and the thickness of the enamel insulation structure can be increased to make it more difficult to penetrate, further reducing the processing and maintenance costs of the testing device. Attached Figure Description

[0018] Figure 1 This is a schematic cross-sectional view of the testing device provided in an embodiment of this application.

[0019] Figure 2 This is a top view of the testing device provided in an embodiment of this application.

[0020] Figure 3 This is a top view schematic diagram of another test device provided in the embodiments of this application.

[0021] Figure Labels

[0022] 1-Solar cell unit; 20-Carrier plate; 21-Stage; 201-Contact area; 22-Enamel insulation structure; 23-Connecting groove; 3-Test component; 202-Groove; 24-Vacuum chamber; 25-Vacuum interface; 4-Mounting structure; 41-Mounting component; 42-Support plate; 31-First test piece; 32-Second test piece; 51-First busbar; 52-Second busbar; 6-Cooling structure; 61-Cooling pipe; 62-Coolant inlet; 63-Coolant outlet. Detailed Implementation

[0023] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0024] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0025] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0026] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0027] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0028] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0029] When testing back-contact solar cells, electroluminescence (EL) imaging is required to screen for common defects such as broken grids, dirt, and microcracks. Conventional EL testing uses a gold-plated copper test stage. While gold-plated copper test stages offer good conductivity, they are expensive to manufacture, and the gold plating is prone to wear, requiring complete replacement after wear. Furthermore, the stage surface needs to maintain full contact with the solar cell during testing, resulting in high manufacturing precision and maintenance costs. A gold-plated copper test stage is unsuitable for back-contact cells. Because the positive and negative terminals are on the back of the cell, using a one-piece metal test stage would cause the high conductivity of the stage to lead to short circuits. Furthermore, when the testing device collects current and voltage, the areas on the battery cell that the current needle contacts and the areas on the battery cell that the voltage needle contacts will come into contact with the platform. These two areas need to be insulated; otherwise, they will conduct electricity and cause a short circuit. For the copper-plated gold platform, separating the two insulated areas and installing them at the same height requires high installation precision.

[0030] Current back-contact battery testing equipment uses an alumina platform, which provides insulation. However, the typical thickness of the alumina insulating layer is only 5-200 micrometers. When the alumina is scratched or impacted, resulting in a thinner layer, excessive test current or voltage can break down the insulating layer, causing it to fail. Increasing the thickness of the alumina insulating layer leads to greater manufacturing complexity and significantly higher costs. Furthermore, alumina failure is not easily detected.

[0031] In addition, the electrical performance testing of mass-produced back-contact solar cells generally uses a high-transmittance cover plate or pressure strip on the front to balance the pressure on the back probe. However, the introduction of the cover plate or pressure strip will block, absorb, and reflect the irradiated light, and at the same time reduce the light utilization rate, resulting in a decrease in short-circuit current and quantum conversion efficiency, which in turn leads to inaccurate electrical performance parameters such as short-circuit current.

[0032] Figure 1 This is a schematic cross-sectional view of the testing device provided in an embodiment of this application. Figure 2 This is a top view of the testing device provided in an embodiment of this application. Figure 3 This is a top view schematic diagram of another test device provided in the embodiments of this application.

[0033] See Figures 1-3 This application provides a testing apparatus for testing a solar cell unit 1. The testing apparatus includes:

[0034] The test stand includes a support plate 20, which has a contact area 201 for supporting solar cell unit 1. An enamel insulation structure 22 is provided in the contact area 201, and a connecting groove 23 penetrating the support plate 20 is provided in the contact area 201.

[0035] Test component 3 is used to contact the electrodes of solar cell unit 1 through the connecting groove 23.

[0036] Among them, the solar cell unit 1 can be a back-contact solar cell unit, specifically a back-contact solar cell, a back-contact solar cell string, or a photovoltaic module including a back-contact solar cell, etc., which is not limited in this application.

[0037] like Figures 1-3 As shown in the diagram, the structure of the aforementioned testing device reveals that the solar cell unit 1 can be placed on the support plate 20. The contact area 201 on the support plate 20, where the solar cell unit 1 is placed, is equipped with an enamel insulation structure 22. Since enamel is an insulator, it possesses excellent insulation properties. Even if both the positive and negative electrodes of the solar cell unit 1 are in contact with the enamel insulation structure 22 in the contact area 201, no short circuit will occur, thus reducing the risk of short circuits during testing and ensuring the normal operation of the EL test. The support plate 20 within the contact area 201 has a through-slot 23, allowing the test assembly 3 to contact and conduct with the electrodes of the solar cell unit 1 through the through-slot 23, collecting the current and voltage generated by the solar cell unit 1 to test its performance. Because enamel has a more noticeable scratch or wear characteristic, compared to alumina tabletops, the enamel insulation structure 22, made of enamel material, is easier to detect when localized damage occurs, allowing for timely maintenance or replacement. Furthermore, small areas of damage to the enamel insulation structure 22 that do not involve the vicinity of the connecting groove 23 will not affect the test. Simultaneously, the solar cell unit 1 generates heat during testing, requiring cooling of both the solar cell unit 1 and the testing device under high testing frequency. Since enamel material has a higher specific heat capacity than copper and alumina, the enamel insulation structure 22 has better thermal conductivity than copper-plated or alumina tabletops, enabling more effective heat absorption and release, and better heat dissipation. Moreover, compared to metal tabletops, the enamel insulation structure 22 is less prone to deformation under heat, reducing measurement errors. In addition, enamel material is less expensive and easier to process; increasing the thickness of the enamel insulation structure 22 makes it more difficult to penetrate, improving test safety, and also reduces the processing and maintenance costs of the testing device.

[0038] On the other hand, enamel materials come in a variety of colors, and different colored enamel materials can be selected to prepare the insulation structure according to the requirements during actual testing. For example, when introducing a cover plate or pressure strip during testing, a white enamel material with a light reflectivity of 94% can be selected to prepare a white enamel insulation structure22, which improves light utilization and obtains more accurate short-circuit current and quantum conversion efficiency; or, when more accurate test data is required, a black enamel material with low reflectivity can be selected to prepare a black enamel structure, further improving the accuracy of the test.

[0039] Furthermore, the enamel insulation structure 22 is provided in the contact area 201 in areas other than the connecting groove 23.

[0040] As one possible implementation, along the first direction A, the enamel insulation structure 22 has a thickness D, 1mm≤D≤10mm; the first direction A is perpendicular to the plane of the bearing plate.

[0041] Based on this, compared to the alumina material platform with a thickness of 5-200 micrometers, the enamel insulation structure 22 provided on the support plate 20 of the test stage in this embodiment can reach a thickness of 1mm-10mm, or even thicker, further making the enamel insulation structure 22 more difficult to be penetrated, further reducing the short-circuit risk of the solar cell unit 1 during the test, and further ensuring the normal conduct of the EL test. At the same time, for the solar cell unit 1 to contact the metal support plate 20 below the enamel insulation structure 22, the damaged area needs to be relatively large. When a small area of ​​the enamel insulation structure 22 with a certain thickness is locally damaged, the solar cell unit 1 will be in a suspended state when it contacts the small area of ​​local damage, so that the solar cell unit 1 will not directly contact the metal support plate 20 below the enamel insulation structure 22, and thus will not affect the test.

[0042] Furthermore, the first direction A is perpendicular to the plane of the surface of the support plate 20 that is in contact with the solar cell unit 1.

[0043] For example, along the first direction A, the thickness D of the enamel insulation structure 22 can be 1mm, 2mm, 3mm, 4mm, 5mm, 6mm, 7mm, 8mm, 9mm, or 10mm, etc., which are only examples and are not specifically limited. In addition, the thickness of the enamel insulation structure 22 can also be greater than 10mm. The specific thickness can be set according to the actual testing device, and the embodiments of this application will not be listed one by one here.

[0044] As one possible implementation, such as Figure 1 As shown, within the contact area 201, the bearing plate 20 has a groove 202, and the enamel insulation structure 22 is located within the groove 202; the dimensions of the groove 202 along the first direction A are the same as the dimensions of the enamel insulation structure 22 along the first direction A.

[0045] Based on this, such as Figure 1 As shown, since the enamel insulation structure 22 has a certain thickness, a groove 202 can be opened in the contact area 201 of the support plate 20. Placing the enamel insulation structure 22 within the groove 202 reduces the overall height of the testing device and makes the enamel insulation structure 22 less prone to shaking, thus improving testing stability. Simultaneously, the depth of the groove 202 in the first direction A is the same as the thickness of the enamel insulation structure 22 in the first direction A, allowing the support plate 20 with the enamel insulation structure 22 to fully contact the solar cell unit 1. This ensures full contact between the solar cell unit 1 and the test component 3 during testing, further improving the stability and accuracy of the test.

[0046] It should be noted that, due to differences in manufacturing processes and wear during actual use, the dimensions of the groove 202 along the first direction A and the dimensions of the enamel insulation structure 22 along the first direction A may be approximately equal.

[0047] As one possible implementation, such as Figure 1 As shown, the test bench also includes a platform body 21, a support plate 20 is disposed at one end of the platform body 21, and together with the platform body 21, they form a vacuum chamber 24; the vacuum chamber 24 is connected to the connecting groove 23, and a vacuum interface 25 communicating with the vacuum chamber 24 is provided on the side wall of the platform body 21.

[0048] Based on this, such as Figure 1 As shown, the vacuum chamber 24 can be evacuated through the vacuum interface 25, making it under negative pressure. Since the vacuum chamber 24 is connected to the connecting groove 23, after the solar cell unit 1 is placed in the contact area 201 and the electrode of the solar cell unit 1 is in contact with the test component 3, the solar cell unit 1 can be adsorbed in the contact area 201 under the action of negative pressure. This can achieve further full contact between the test component 3 and the solar cell unit 1, which is beneficial to further improve the stability and accuracy of the test.

[0049] For example, such as Figure 1 As shown, two vacuum ports 25 can be provided on the side wall of the platform 21, which can simultaneously evacuate the vacuum chamber 24.

[0050] For example, a vacuum generator or vacuum pump can be used to evacuate the vacuum chamber 24, bringing it to a negative pressure or vacuum state. In specific implementation, a vacuum generator or vacuum pump can be connected to the vacuum interface 25 first, then the support plate 20 can be placed on top, the solar cell unit 1 can be placed, and the switch of the vacuum generator or vacuum pump can be turned on to adjust the vacuum chamber 24 to a negative pressure or vacuum state, so that the solar cell unit 1 is adsorbed onto the support plate 20 due to the pressure difference, making full contact with the test component 3.

[0051] As one possible implementation, such as Figure 1 As shown, the testing device also includes a mounting structure 4 disposed within the vacuum chamber 24, and the testing component 3 is mounted on the mounting structure 4. Based on this, the testing component 3 can be mounted within the vacuum chamber 24 via the mounting structure 4, allowing one end of the testing component 3 to pass through the connecting slot 23 to make contact with the solar cell unit 1, thus saving space and further reducing the overall height of the testing device.

[0052] In some examples, such as Figure 1 As shown, the mounting structure 4 includes a mounting component 41 and a support plate 42 connected together, and the test component 3 is mounted on the mounting component 41. Based on this, the test component 3 can be mounted on the mounting component 41, and the support plate 42 can serve to support the mounting component 41, thereby realizing the installation of the test component 3.

[0053] For example, mounting component 41 can be a printed circuit board (PCB), etc., which is only an example and is not specifically limited.

[0054] As one possible implementation, such as Figures 1-3 As shown, multiple spaced-apart connecting grooves 23 are formed within the contact area 201. The testing device includes multiple testing components 3, which are arranged at intervals within the connecting grooves 23. Based on this, the multiple testing components 3 can be arranged at intervals within the multiple spaced-apart connecting grooves 23 within the contact area 201, facilitating full contact with all electrodes on the surface of the solar cell unit 1 during testing, further improving the accuracy of the test.

[0055] Furthermore, the number, spacing, and size of the connecting slots 23, as well as the number, spacing, and size of the test components 3, etc., can be set according to the actual applicable solar cell unit 1. The accompanying drawings provided in this application embodiment are only examples and are not intended to limit the scope of the application.

[0056] It should be noted that the test components 3 are arranged at intervals in the connecting groove 23, which means that when the test components 3 test the solar cell unit 1, the test components 3 are arranged at intervals in the connecting groove 23.

[0057] In some examples, such as Figure 1 As shown, the mounting component 41 and the support plate 42 can be fixedly installed in the vacuum chamber 24, and the test component 3 can also be fixed on the mounting component 41, so that one end of the test component 3 can be fixed in the connecting groove 23, which further saves space and further reduces the overall height of the test device.

[0058] In some examples, the testing apparatus may also include a drive unit (not shown) connected to the mounting member 41 and / or the support plate 42. The drive unit can drive the mounting member 41 and / or the support plate 42 to move up and down in the first direction A within the vacuum chamber 24, thereby causing the test assembly 3 to move up and down in the first direction A. This allows the test assembly 3 to pass through the connecting groove 23 and contact the solar cell unit 1 when testing it. When testing is not required, the test assembly 3 can be withdrawn from the connecting groove 23, thus improving the service life of the test assembly 3.

[0059] For example, the drive unit can be located inside or outside the vacuum chamber 24, and can be connected to the mounting structure 4 inside the vacuum chamber 24 by opening holes in the platform 21 or the support plate 20.

[0060] For example, the driving component can be a motor, cylinder, hydraulic cylinder, etc. This is just an example and is not a specific limitation.

[0061] Therefore, vacuum adsorption and contact between the test component 3 and the solar cell unit 1 can be achieved through the connecting groove 23. Thus, even if the enamel insulation structure 22 is partially damaged, as long as the damaged area does not involve the vicinity of the connecting groove 23, it will not cause a short circuit or affect the vacuum adsorption function.

[0062] In some examples, such as Figure 1 and Figure 2 As shown, the test component 3 includes a first test piece 31 and a second test piece 32, and the test device also includes a first busbar 51 connected to the first test piece 31 and a second busbar 52 connected to the second test piece 32.

[0063] Based on this, such as Figure 1 and Figure 2 As shown, the first busbar 51 can gather at least a number of first test pieces 31 located in the same column together, and the electrical signals of the multiple first test pieces 31 can be controlled and data collected simultaneously through the first busbar 51. The second busbar 52 can gather at least a number of second test pieces 32 located in the same column together, and the electrical signals of the multiple second test pieces 32 can be controlled and data collected simultaneously through the second busbar 52, thereby improving test efficiency and further reducing test errors.

[0064] For example, test component 3 can be a test probe. Further, the first test element 31 can be a test probe with a first electrical charge, and the second test element 32 can be a test probe with a second electrical charge. The first and second electrical charges are opposite charges; for example, the first test element 31 can be a positively charged test probe, and the second test element 32 can be a negatively charged test probe, or the first test element 31 can be a negatively charged test probe, and the second test element 32 can be a positively charged test probe. This embodiment of the application does not limit this to any particular type.

[0065] For example, the electrode of solar cell unit 1 refers to the main grid of solar cell unit 1 (not shown in the figure), and the test probe contacts the main grid of the solar cell during testing. Further, the main grid of solar cell unit 1 may include a first main grid and a second main grid, respectively used to collect different charge carriers; the positive and negative electrodes of solar cell unit 1 are the first and second main grids of solar cell unit 1. When solar cell unit 1 is a back-contact solar cell unit 1, both the first and second main grids of solar cell unit 1 are located on the back surface of solar cell unit 1, and the first test piece 31 and the second test piece 32 contact the first and second main grids respectively during testing.

[0066] Furthermore, since the main grid design time interval of some solar cell units 1 is relatively small, a test probe with a smaller needle tip can be selected for testing.

[0067] In some examples, the test apparatus also includes a first terminal and a second terminal (not shown in the figure) disposed on the test bench. The first terminal is electrically connected to one end of the first busbar 51, and the second terminal is electrically connected to one end of the second busbar 52. Based on this, the current and voltage data transmitted by the first busbar 51 and the second busbar 52 can be collected through the first terminal and the second terminal for subsequent analysis.

[0068] As one possible implementation, such as Figure 1 and Figure 3 As shown, the testing device also includes a cooling structure 6 installed inside the support plate 20. The cooling structure 6 is used at least to cool the contact area 201. During the test, the heat generated by the solar cell unit 1 will cause the contact area 201 of the support plate 20 to heat up. The heat can be absorbed by the enamel insulating structure 22 with a large specific heat capacity and carried away by the cooling structure 6, thereby cooling the contact area 201.

[0069] In some examples, such as Figure 1 and Figure 3 As shown, the cooling structure 6 includes a cooling pipe 61 installed inside the support plate 20. The support plate 20 is also provided with a coolant inlet 62 and a coolant outlet 63 that are connected to the cooling pipe 61.

[0070] Based on this, the cooling structure 6 can cool the contact area 201 through the principle of indirect heat exchange. Furthermore, coolant can be introduced into the cooling pipe 61 through the coolant inlet 62, using the coolant to absorb and remove heat from the contact area 201, and then the coolant carrying heat can be discharged through the coolant outlet 63, thereby achieving cooling of the contact area 201 and further ensuring the normal progress of the test.

[0071] For example, the coolant can be cooling water; this is merely an example and not a specific limitation.

[0072] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0073] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A testing device, characterized in that, The testing apparatus is used to test solar cell units and includes: A test stand, the test stand including a support plate, the support plate having a contact area for supporting the solar cell unit, the contact area being provided with an enamel insulation structure, and a connecting groove penetrating the support plate being formed in the contact area; A test assembly for contacting the electrodes of the solar cell unit via the connecting slot.

2. The testing apparatus according to claim 1, characterized in that, Along the first direction, the enamel insulation structure has a thickness D, where 1mm ≤ D ≤ 10mm; the first direction is perpendicular to the plane of the supporting plate.

3. The testing apparatus according to claim 2, characterized in that, Within the contact area, the bearing plate has a groove, and the enamel insulation structure is located within the groove; The dimensions of the groove along the first direction are the same as the dimensions of the enamel insulation structure along the first direction.

4. The testing apparatus according to claim 1, characterized in that, The test bench also includes a platform body, and the support plate is disposed at one end of the platform body and forms a vacuum chamber with the platform body; the vacuum chamber is connected to the connecting groove, and a vacuum interface communicating with the vacuum chamber is provided on the side wall of the platform body.

5. The testing apparatus according to claim 4, characterized in that, The testing device also includes a mounting structure disposed within the vacuum chamber, and the testing components are mounted on the mounting structure.

6. The testing apparatus according to claim 5, characterized in that, The mounting structure includes a connected mounting component and a support plate, and the test component is mounted on the mounting component.

7. The testing apparatus according to claim 1, characterized in that, The testing device also includes a cooling structure installed inside the support plate, which is used at least to cool the contact area.

8. The testing apparatus according to claim 7, characterized in that, The cooling structure includes cooling pipes installed inside the support plate, and the support plate is also provided with a coolant inlet and a coolant outlet connected to the cooling pipes.

9. The testing apparatus according to claim 1, characterized in that, The contact area is provided with multiple spaced-apart connecting slots, and the testing device includes multiple testing components, which are arranged at intervals within the connecting slots. The test component includes a first test piece and a second test piece, and the test device further includes a first busbar connected to the first test piece and a second busbar connected to the second test piece.

10. The testing apparatus according to claim 9, characterized in that, The testing device further includes a first terminal and a second terminal disposed on the test bench, wherein the first terminal is electrically connected to one end of the first busbar and the second terminal is electrically connected to one end of the second busbar.

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