Adjusting and testing device and system for optical module

The optical module debugging device is used to debug the transmission parameters and reception parameters of the XGPON end and the GPON end in parallel, which solves the low efficiency problem in the existing technology and realizes efficient optical module debugging.

CN223488245UActive Publication Date: 2025-10-28ACCELINK TECHNOLOGIES CO LTD
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Patent Information

Application Number
CN202422685811.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-04
Publication Date
2025-10-28
Estimated Expiration
2034-11-04

AI Technical Summary

Technical Problem

In the existing technology, the commissioning efficiency of the Combo XGPON-GPON OLT SFP+ optical module is low. It is necessary to commission the transmission and reception parameters of the XGPON and GPON ends separately, which involves many projects and a long software process.

Method used

An optical module debugging device is used, including a transmitting bit error meter, a receiving bit error meter, a first test board, a first oscilloscope and a second oscilloscope. The transmitting parameters and receiving parameters of the XGPON end and the GPON end are debugged in parallel, and the transmitting bit error meter and the receiving bit error meter are controlled by a controller to perform synchronous debugging.

Benefits of technology

The parallel debugging of the transmission parameters and reception parameters of the XGPON and GPON ends is realized, which improves the debugging efficiency of the optical module.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of optical communication, in particular to a debugging and testing device and system for an optical module, which debugs and tests emission parameters of an XGPON (X gigabit passive optical network) end and a GPON (gigabit passive optical network) end of the optical module to be tested in parallel through an emission bit-error tester, a first test board, a first oscilloscope and a second oscilloscope respectively, and can accurately analyze the emission parameters. The receiving error detector, the light-emitting unit and the first test board form a loop, receiving parameters of the XGPON end and the GPON end of the optical module to be tested can be debugged and tested, transmitting end parameters and receiving end parameters of the XGPON end and the GPON end of the optical module to be tested can be debugged and tested in parallel, and therefore debugging and testing efficiency of the optical module to be tested is greatly improved.
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Description

Technical Field

[0001] This utility model relates to the field of optical communication technology, and in particular to an optical module tuning and testing device and system. Background Technology

[0002] Currently, Gigabit Passive Optical Network (GPON) and XGPON are the mainstream Passive Optical Network (PON) technologies, both of which are asymmetric PONs. With the development of Fiber To The Home (FTTH), there is a strong market demand and wide range of application scenarios for the smooth upgrade from GPON to XGPON. Therefore, Combo XGPON-GPON OLT SFP+ optical modules have huge market demand and are shipped in large quantities.

[0003] According to conventional debugging methods, the transmit and receive parameters of the Combo XGPON-GPON OLT SFP+ optical module need to be debugged separately on the XGPON and GPON sides, including optical power, extinction ratio, crossover point, transmit reporting calibration, eye diagram test, high voltage adjustment, sensitivity overload point bit error test, received signal strength (RSSI) calibration and test, etc. The above debugging methods involve many items, long software procedures and low efficiency.

[0004] In view of this, overcoming the defects of the prior art is an urgent problem to be solved in this technical field. Utility Model Content

[0005] The technical problem to be solved by this invention is: how to improve the adjustment and testing efficiency of optical modules.

[0006] The present invention adopts the following technical solution:

[0007] In a first aspect, an optical module tuning and testing device is provided, comprising at least one tuning and testing module, a first wavelength division multiplexer, a first oscilloscope, and a second oscilloscope. The tuning and testing module includes a transmit bit error rate meter, a first test board, a receive bit error rate meter, and a light-emitting unit. The optical module under test is electrically connected to the first test board.

[0008] The first and second transmitting ends of the transmission error meter are respectively connected to the two transmitting ends on the first test board. The optical module under test is coupled to the common end of the first wavelength division multiplexer. The first port of the first wavelength division multiplexer is connected to the optical signal receiving end of the first oscilloscope, and the second port of the first wavelength division multiplexer is connected to the optical signal receiving end of the second oscilloscope. The third transmitting end of the transmission error meter is connected to the trigger end of the first oscilloscope, and the fourth transmitting end of the transmission error meter is connected to the trigger end of the second oscilloscope.

[0009] The transmitter of the receiver error meter is connected to the control terminal of the light-emitting unit, the light-emitting unit is coupled to the optical module under test, and the receiver on the first test board is connected to the receiver of the receiver error meter.

[0010] The serial ports on both the transmit and receive error meters are connected to the controller to adjust and test the optical module under test.

[0011] Preferably, the testing module further includes: a second wavelength division multiplexer, a receiving optical module, and a second test board, wherein the receiving optical module is electrically connected to the second test board;

[0012] The optical module under test is coupled to the common terminal of the second wavelength division multiplexer, and the first port of the second wavelength division multiplexer is coupled to the common terminal of the first wavelength division multiplexer and the receiving optical module, respectively.

[0013] The receiver on the second test board is connected to the receiver of the transmit error meter.

[0014] Preferably, the tuning module further includes a beam splitter, the first port of the second wavelength division multiplexer is connected to the input of the beam splitter, and the output of the beam splitter is coupled to the common port of the first wavelength division multiplexer and the receiving optical module, respectively.

[0015] An optical fiber of a preset length is also provided on the coupling optical path between the first port of the second wavelength division multiplexer and the receiving optical module.

[0016] Preferably, the light-emitting unit includes a timing board, a first light source, a second light source, and a coupler; the first light source and the second light source are respectively electrically connected to the timing board;

[0017] The transmitter of the receiver error meter is connected to the transmitter on the timing board. The first light source and the second light source are respectively coupled to the input of the coupler. The output of the coupler is coupled to the second port of the second wavelength division multiplexer.

[0018] Preferably, the light-emitting unit further includes a first attenuator and a second attenuator, the light-receiving module is coupled to the input end of the first attenuator, the first light source is coupled to the input end of the second attenuator, and the output ends of the first attenuator and the second attenuator are respectively coupled to the input end of the coupler.

[0019] Preferably, the alarm pin on the timing board is connected to the alarm pin on the first test board; the reset signal pin on the timing board is connected to the reset signal pin on the first test board; the trigger pin on the timing board is connected to the intensity signal pin on the first test board; and the communication pin on the timing board is connected to the communication pin on the first test board.

[0020] Preferably, the controller is connected to a serial port on the timing board.

[0021] Preferably, when the optical module adjustment and testing device is used to adjust and test multiple optical modules under test, the adjustment and testing device includes multiple adjustment and testing modules, and the adjustment and testing device further includes an optical switch, a first frequency divider, and a second frequency divider;

[0022] The first ports of the plurality of second wavelength division multiplexers are respectively coupled to the selection terminals of the optical switches, and the common terminals of the optical switches are coupled to the common terminals of the first wavelength division multiplexers;

[0023] The third transmitters of the plurality of transmission error meters are respectively connected to the input of the first frequency divider, and the fourth transmitters of the plurality of transmission error meters are respectively connected to the input of the second frequency divider;

[0024] The output terminal of the first frequency divider is connected to the trigger terminal of the first oscilloscope, and the output terminal of the second frequency divider is connected to the trigger terminal of the second oscilloscope.

[0025] Preferably, the optical switch, the first frequency divider, the second frequency divider, the first oscilloscope, and the second oscilloscope are all connected to the instrument cloud server.

[0026] In a second aspect, a testing and adjustment system for an optical module is provided, comprising a testing and adjustment device for an optical module as described in the first aspect and an optical module under test, wherein the optical module under test is electrically connected to a first test board on the testing and adjustment device for the optical module.

[0027] Compared with the prior art, the beneficial effects of the present invention are:

[0028] This invention uses a transmit error meter, a first test board, a first oscilloscope, and a second oscilloscope to perform parallel adjustments on the transmit parameters of the XGPON and GPON ends of the optical module under test, enabling accurate analysis of the transmit parameters. Furthermore, by forming a circuit with a receive error meter, a light-emitting unit, and the first test board, the receive parameters of the XGPON and GPON ends of the optical module under test can be adjusted. In summary, this invention allows for parallel adjustments on both the transmit and receive parameters of the XGPON and GPON ends of the optical module under test, significantly improving the adjustment efficiency of the optical module under test. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0030] Figure 1 This is a schematic diagram of the structure of an optical module adjustment and testing device provided in an embodiment of the present invention;

[0031] Figure 2 This is another structural schematic diagram of an optical module adjustment and testing device provided in an embodiment of the present utility model;

[0032] Figure 3 This is a schematic diagram of a specific optical module adjustment and testing device provided in an embodiment of the present utility model;

[0033] Figure 4 This is a more detailed structural schematic diagram of an optical module adjustment and testing device provided in an embodiment of the present utility model;

[0034] Figure 5 This is a schematic diagram of the structure of an optical module adjustment and testing system provided in an embodiment of this utility model. Detailed Implementation

[0035] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0036] Unless the context otherwise requires, throughout the specification and claims, the term "comprising" is interpreted as openly inclusive, meaning "including, but not limited to." In the description of the specification, terms such as "one embodiment," "some embodiments," "exemplary embodiment," "example," "specific example," or "some examples" are intended to indicate that a particular feature, structure, material, or characteristic associated with that embodiment or example is included in at least one embodiment or example of this disclosure. The illustrative representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics mentioned may be included in any suitable manner in any one or more embodiments or examples; that is, although they may be incorporated into embodiments or examples using the above terms for reasons such as order and position, it does not limit them to be incorporated in combination by a single embodiment or example.

[0037] In the description of this utility model, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of embodiments of this disclosure, unless otherwise stated, "a plurality of" means two or more. Furthermore, for example, the description may use the prefix "A" or "B" to describe the same type of nouns as two independent entities. In this case, the features defined with "A" and "B" are used only to distinguish between similar entities and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features.

[0038] In describing some embodiments, the terms "coupled," "coupled," and "connected," and their derivative expressions, may be used. For example, the term "connected" may be used in describing some embodiments to indicate that two or more components have direct physical or electrical contact with each other. Similarly, the term "coupled" may be used in describing some embodiments to indicate that two or more components have direct physical or electrical contact. However, the terms "connected" or "coupled" may also refer to two or more components that do not have direct contact with each other but still cooperate or interact with each other, such as "optical coupling" or "wireless connection." The embodiments disclosed herein are not necessarily limited to the scope of this invention.

[0039] Furthermore, the technical features involved in the various embodiments of this utility model described below can be combined with each other as long as they do not conflict with each other.

[0040] Example 1:

[0041] Existing technology requires separate testing of the XGPON and GPON transmission and reception parameters for Combo XGPON-GPON OLT SFP+ optical modules. This testing method involves many steps, lengthy software procedures, and low efficiency.

[0042] To address the low testing efficiency of existing technologies for Combo XGPON-GPON OLT SFP+ optical modules, Embodiment 1 of this invention provides a testing device for optical modules that can perform parallel testing of the transmission and reception parameters of the XGPON and GPON ends, thereby improving the testing efficiency of the optical module. Specifically, in one embodiment, such as... Figure 1 As shown, the optical module debugging device includes at least one debugging module, a first wavelength division multiplexer, a first oscilloscope, and a second oscilloscope. The debugging module includes a transmit error meter, a first test board, a receive error meter, and a light-emitting unit. The optical module under test is electrically connected to the first test board. The first and second transmitting terminals of the transmit error meter are respectively connected to the two transmitting terminals on the first test board. The optical module under test is coupled to the common terminal of the first wavelength division multiplexer. The first port of the first wavelength division multiplexer is connected to the optical signal receiving terminal of the first oscilloscope, and the second port of the first wavelength division multiplexer is connected to the common terminal of the first oscilloscope. The optical signal receiving end of the second oscilloscope is connected; the third transmitting end of the transmit error meter is connected to the trigger end of the first oscilloscope, and the fourth transmitting end of the transmit error meter is connected to the trigger end of the second oscilloscope; the transmitting end of the receive error meter is connected to the control end of the light-emitting unit, the light-emitting unit is coupled to the optical module under test, and the receiving end on the first test board is connected to the receiving end of the receive error meter; the serial ports on the transmit error meter and the receive error meter are both connected to the controller to adjust and test the optical module under test through the transmit error meter and the receive error meter.

[0043] The optical module under test can be a Combo XGPON-GPON OLT SFP+ optical module.

[0044] Reference Figure 1 The testing module can be divided into a transmission testing module and a reception testing module. The transmission testing module includes components such as a transmission error rate meter and a first test board, while the reception testing module includes a reception error rate meter, a light-emitting unit, and the functions of corresponding components on the first test board. The first test board is a shared component of both the transmission and reception testing modules. It serves as a connection and relay, transmitting the signal from the transmission error rate meter to the optical module under test for transmission parameter adjustment. The first test board also converts the optical signal received by the optical module under test and transmits it to the reception error rate meter for reception parameter adjustment.

[0045] Specifically, in the transmission debugging module, the transmission error meter includes multiple transmitters. The first transmitter TX2+ of the transmission error meter is connected to the transmitter TX+2.5G on the first test board, and the second transmitter TX3+ of the transmission error meter is connected to the transmitter TX+10G on the first test board. The optical module under test involves both XGPON and GPON functions. The transmission error meter sends corresponding test signals through the TX2+ terminal to the TX+2.5G terminal of the first test board, and then the GPON terminal in the optical module under test receives the corresponding test signals. The transmission error meter sends corresponding test signals through the TX3+ terminal to the TX+10G terminal of the first test board, and then... The XGPON terminal in the optical module under test then receives the corresponding test signal. Based on this test signal, the optical module under test transmits an optical signal to the common COM port of the first wavelength division multiplexer. The first port (1490 nm wavelength port) of the first wavelength division multiplexer then transmits the corresponding optical signal to the first oscilloscope, which receives the optical signal corresponding to the GPON terminal. The second port (1550 nm wavelength port) of the first wavelength division multiplexer transmits the corresponding optical signal to the second oscilloscope, which receives the optical signal corresponding to the XGPON terminal. The transmission performance of the XGPON and GPON terminals on the optical module under test is then tested using both oscilloscopes. A stable test signal is provided by a bit error rate tester to adjust the transmission parameters of the XGPON and GPON terminals on the optical module under test. These transmission parameters include optical power, extinction ratio, crossover point, transmission reporting calibration, and eye diagram testing.

[0046] The first and second oscilloscopes are used to monitor the optical signals at the XGPON and GPON ends, respectively. The third and fourth transmitters of the transmission error rate meter serve as synchronous triggers, ensuring that both oscilloscopes can accurately capture the optical signals emitted by the optical module under test at the XGPON and GPON ends. During the debugging process, the characteristics of the transmitted signals at the XGPON and GPON ends, such as waveform, frequency, and amplitude, can be observed and analyzed simultaneously to achieve simultaneous adjustment of the transmission parameters at both ends, enabling timely detection and adjustment of problems. The serial port on the transmission error rate meter is connected to the controller, allowing for adjustment and testing of the transmission parameters under the controller's control. Specific testing methods for the transmission parameters at the XGPON and GPON ends are not detailed in this embodiment.

[0047] In the receiving and testing module, the transmitter of the receiving error meter is connected to the control terminal of the light-emitting unit, and the light-emitting unit is coupled to the optical module under test. The receiving error meter generates a corresponding error signal to the light-emitting unit based on the control signal from the controller. The light-emitting unit then sends an optical signal to the optical module under test based on the error signal from the receiving error meter, for testing the receiving performance of the optical module under test. The receivers (including RX+1G and RX+2.5G) on the first test board are connected to the receivers (including RX2+ and RX3+) of the receiving error meter, respectively, for converting the optical signal received by the optical module under test and transmitting it to the receiving error meter for analysis. The serial port on the receiving error meter is connected to the controller, allowing adjustment and testing of the receiving parameters under the control of the controller.

[0048] In summary, the main innovation of this embodiment lies in the following: During the adjustment and testing of transmission parameters, the controller sends control signals to the transmission error meter, which generates two types of error signals. These signals are then transmitted to the TX+10G and TX+2.5G pins on the first test board via its TX3+ and TX2+ pins, respectively. The first test board controls the XGPON and GPON terminals on the optical module under test to emit corresponding optical signals based on the two error signals. These optical signals are then transmitted to the first and second oscilloscopes via the first wavelength division multiplexer for monitoring, thereby enabling parallel adjustment and testing of the transmission parameters of the XGPON and GPON terminals.

[0049] During the adjustment and testing of the receiving parameters, the controller sends control signals to the receiving error meter. The receiving error meter generates two types of error signals, which are sent to the light-emitting unit through its TX3+ and TX2+ pins, respectively. The light-emitting unit emits optical signals corresponding to the XGPON and GPON ends according to the two types of error signals. The corresponding optical signals are transmitted to the optical module under test for reception and generate corresponding electrical signals on the first test board. The corresponding electrical signals are then transmitted to the receiving error meter through RX+10G and RX+2.5G on the first test board, so as to realize the parallel adjustment and testing of the receiving parameters of the XGPON and GPON ends.

[0050] The testing efficiency of the optical module under test is improved by performing parallel testing of the generation and reception parameters at both the XGPON and GPON ends. Other structural details of the testing device for the optical module are described in the following embodiments.

[0051] In one embodiment, the adjustment of the emission parameters of the optical module under test also requires testing the fiber transmission effect of the optical module under test. In one embodiment, such as... Figure 2As shown, the testing module further includes: a second wavelength division multiplexer, a receiving optical module, and a second test board. The receiving optical module is electrically connected to the second test board. The optical module under test is coupled to the common terminal of the second wavelength division multiplexer. The first port of the second wavelength division multiplexer is coupled to the common terminal of the first wavelength division multiplexer and the receiving optical module, respectively. The receiving terminal (i.e., RX+) on the second test board is connected to the receiving terminal (i.e., RX2+) of the transmit error meter.

[0052] The optical module under test (DUT) is coupled to the common COM port of the second wavelength division multiplexer (WDM), allowing the optical signal emitted by the DUT to enter the second WDM for processing. The first port (i.e., the 1550 nm wavelength port) of the second WDM is coupled to both the common port of the first WDM and the receiving optical module. In one embodiment, to split the optical signal emitted by the DUT into two paths, as shown... Figure 2 As shown, the tuning module also includes a beam splitter. The first port (i.e., the 1550 wavelength port) of the second wavelength division multiplexer is connected to the input end of the beam splitter. The output end of the beam splitter is coupled to the common end of the first wavelength division multiplexer and the receiving optical module, respectively. An optical fiber of a preset length is also provided on the coupling optical path between the first port of the second wavelength division multiplexer and the receiving optical module.

[0053] The optical splitter enables the splitting of optical signals and the extension of transmission paths. On one hand, the optical signal from the optical module under test (DUT) can be transmitted through one output of the splitter to the common end of the first wavelength division multiplexer (WDM) to continue participating in routine testing of transmission parameters. On the other hand, the optical signal from the DUT can also be transmitted through the other output of the splitter and a section of optical fiber to the receiving optical module. The receiving optical module receives the optical signal from the second WDM and converts it into an electrical signal, which is then transmitted to the second test board. The second test board processes and analyzes the corresponding electrical signal and generates a corresponding electrical signal for the bit error rate analyzer to evaluate the fiber transmission performance of the DUT. The preset length can be 20 km.

[0054] The following section will provide a detailed explanation of the structures related to the adjustment process of the receiving parameters.

[0055] To generate two different frequency test optical signals for adjusting the receiving parameters of the optical module under test, in one embodiment, such as... Figure 3As shown, the light-emitting unit includes a timing board, a first light source (i.e., a 10G light source), a second light source (i.e., a 1G light source), and a coupler; the first light source and the second light source are electrically connected to the timing board respectively; the transmitting end of the receiving error meter is connected to the transmitting end on the timing board; the first light source and the second light source are coupled to the input end of the coupler respectively; and the output end of the coupler is coupled to the second port (i.e., the 1310 wavelength port) of the second wavelength division multiplexer.

[0056] The timing board plays a control and coordination role. It receives control signals from the output of the receiver error meter (including TX3+ and TX2+ corresponding to the control signals sent to the receiver optical module and the first light source, respectively), and controls the operating timing of the first and second light sources according to the corresponding control signals. By precisely controlling the timing, it can ensure that the two test optical modules emit optical signals in a specific order and time interval, thereby generating test optical signals of different frequencies. This is existing technology and will not be described in detail here. In one embodiment, refer to... Figure 3 The controller is connected to the serial port (i.e., USB port) on the timing board. The alarm pins (i.e., SD1 and SD2 pins) on the timing board are connected to the alarm pins (i.e., SD1 and SD2 pins) on the first test board; the reset signal pin (i.e., RST pin) on the timing board is connected to the reset signal pin (i.e., RST pin) on the first test board; the trigger pin (i.e., Trig pin) on the timing board is connected to the intensity signal pin (i.e., RSSI pin) on the first test board; and the communication pins on the timing board are connected to the communication pins on the first test board.

[0057] Under the control of the timing board, the first and second light sources each emit test light signals of specific frequencies for adjusting the receiving parameters of the optical module under test. The coupler is used to combine the test light signals emitted by the two test light modules and transmit the combined test light signal to the second wavelength division multiplexer. Through the coupler, test light signals of different frequencies can be integrated together so that they can be simultaneously input to the optical module under test for adjusting the receiving parameters.

[0058] When adjusting the receiving parameters of the optical module under test, the receiving error meter outputs corresponding control signals to the timing board. The timing board controls the operating timing of the first and second light sources according to the corresponding control signals, causing them to emit test optical signals of different frequencies. The two test optical signals are combined by a coupler and transmitted to the second port (i.e., the 1310 wavelength port) of the second wavelength division multiplexer. The second wavelength division multiplexer transmits the coupled test optical signal to the optical module under test through the common COM port. The optical module under test receives the test optical signal from the second wavelength division multiplexer, converts it into an electrical signal, and transmits it to the first test board. The corresponding electrical signals are then transmitted to the receiving error meter via the RX+1G and RX+2.5G ports on the first test board. The receiving error meter analyzes the receiving parameters of the optical module under test based on the received electrical signals to determine whether its receiving performance meets the requirements. Specific receiving parameters to be adjusted include high-voltage adjustment, sensitivity overload point bit error rate testing, RSSI calibration and testing, and SD adjustment, etc. The specific adjustment methods are not described in detail in this embodiment.

[0059] The coupler needs to receive optical signals from multiple input terminals. If the power differences of these optical signals are too large, it may affect the coupling effect and subsequent test results. To precisely control the optical power of the optical signals generated by the first and second light sources, in one embodiment, such as... Figure 3 As shown, the light-emitting unit further includes a first attenuator and a second attenuator. The receiving light module is coupled to the input terminal of the first attenuator, the first light source is coupled to the input terminal of the second attenuator, and the output terminals of the first attenuator and the second attenuator are respectively coupled to the input terminal of the coupler.

[0060] The first attenuator is used to attenuate the optical signal emitted by the second test optical module, adjusting the intensity of the corresponding optical signal to a range suitable for subsequent testing and processing. This avoids damage to other components, such as the coupler or the optical module under test, due to excessively strong optical signals, while also ensuring that the optical signal is transmitted and tested within a reasonable intensity range for more accurate evaluation of the performance of the optical module under test. The second attenuator works similarly and will not be described further in this embodiment. Furthermore, by controlling the power of the corresponding optical signals according to the first and second attenuators, it ensures that the coupler can effectively combine and transmit the signals to the second wavelength division multiplexer.

[0061] This embodiment uses a transmit error meter, a first test board, a first oscilloscope, and a second oscilloscope to perform parallel adjustments on the transmit parameters of the XGPON and GPON ends of the optical module under test, enabling accurate analysis of the transmit parameters. By forming a circuit with a receive error meter, a light-emitting unit, and the first test board, the receive parameters of the XGPON and GPON ends of the optical module under test can be adjusted. In summary, this embodiment can perform parallel adjustments on both the transmit and receive parameters of the XGPON and GPON ends of the optical module under test, thereby significantly improving the adjustment efficiency of the optical module under test.

[0062] Example 2:

[0063] Example 1 describes a testing and adjustment device for an optical module, which simultaneously adjusts the transmission and reception parameters of both the XGPON and GPON ends of the same optical module under test. To further improve the testing and adjustment efficiency of the optical module under test, in one embodiment, multiple testing and adjustment modules can be set up, allowing each module to handle the testing and adjustment of one optical module under test, thus further improving the testing and adjustment efficiency. In one embodiment, such as... Figure 4 As shown, when the optical module debugging device is used to debug multiple optical modules under test, the debugging device includes multiple debugging modules, and the debugging device also includes an optical switch, a first frequency divider, and a second frequency divider; the first ports of multiple second wavelength division multiplexers are respectively coupled to the selection terminals of the optical switches, and the common terminal of the optical switches is coupled to the common terminal of the first wavelength division multiplexers; the third transmitter terminals of multiple transmission error meters are respectively connected to the input terminals of the first frequency divider, and the fourth transmitter terminals of multiple transmission error meters are respectively connected to the input terminals of the second frequency dividers; the output terminal of the first frequency divider is connected to the trigger terminal of the first oscilloscope, and the output terminal of the second frequency divider is connected to the trigger terminal of the second oscilloscope.

[0064] In this design, when the optical module testing device is used to test multiple optical modules under test, an optical switch, a first frequency divider, and a second frequency divider are added. This design allows the testing device to independently test multiple optical modules under test. After testing one optical module is completed, another optical module can be selected for testing by switching the conduction channels on the optical switch. It is worth noting that, theoretically, the number of selection ports on the optical switch corresponds to the number of modules being tested, i.e., the number of optical modules under test. Figure 4 Taking two testing modules as an example, two optical modules under test can be tested and adjusted sequentially, which greatly improves the testing and adjustment efficiency.

[0065] The optical switch in the testing and adjustment device acts as a signal router, allowing signals from different optical modules under test to be switched to the first wavelength division multiplexer for subsequent processing and analysis as needed. This enables flexible selection of the optical modules to be tested, achieving orderly testing and adjustment of multiple optical modules.

[0066] The frequency divider integrates and distributes the trigger signals from multiple transmit error rate meters (BERTs). Since there are multiple optical modules under test (DUTs) and corresponding BERTs, the frequency divider can rationally allocate these trigger signals, enabling the first and second oscilloscopes to accurately receive and display signals from different DUTs, thereby achieving synchronous monitoring of the transmission parameters of multiple optical modules. Specific switching methods are existing technologies and will not be described in detail in this embodiment.

[0067] In summary, the optical module tuning and testing device in this embodiment achieves efficient tuning and testing of multiple optical modules under test by adding multiple tuning and testing modules, optical switches, frequency dividers, and other components, thereby further improving the tuning and testing efficiency of the optical modules under test.

[0068] In one embodiment, such as Figure 4 As shown, the optical switch, the first frequency divider, the second frequency divider, the first oscilloscope, and the second oscilloscope are all connected to the instrument cloud server. Connecting these devices to the instrument cloud server enables centralized management and remote monitoring of the entire optical module commissioning process. Regardless of location, as long as there is a connection to the instrument cloud server, the operating status of the commissioning device and the testing status of each optical module under test can be monitored in real time. The instrument cloud server can store a large amount of test data, including signal data from the oscilloscope, status data from the optical switch, and parameters of the frequency divider. This data can be used for subsequent analysis and processing, helping engineers better understand the performance characteristics of the optical module, identify potential problems, and make optimizations and improvements. Simultaneously, the instrument cloud server allows for remote control and configuration of devices such as the optical switch, frequency divider, and oscilloscope. For example, the switching mode of the optical switch can be adjusted, the division ratio of the frequency divider can be set, and the parameters of the oscilloscope can be adjusted, eliminating the need for on-site operation and improving the flexibility and convenience of commissioning.

[0069] In summary, connecting the optical switch, the first frequency divider, the second frequency divider, the first oscilloscope, and the second oscilloscope to the instrument cloud server enables centralized management, remote monitoring, data storage and analysis, and remote control and configuration of the optical module commissioning process, thereby improving commissioning efficiency and accuracy. It is worth noting that the specific control method of the instrument cloud server is existing technology and will not be described in detail in this embodiment.

[0070] Example 3:

[0071] An optical module tuning and testing device was proposed in Embodiments 1 and 2. In this embodiment, an optical module tuning and testing system will be proposed, such as... Figure 5 As shown, the device includes the optical module adjustment and testing apparatus described in Embodiments 1 and 2, and the optical module under test. The optical module under test is electrically connected to the first test board on the optical module adjustment and testing apparatus.

[0072] For the specific structure of the adjustment and testing device for the optical module, please refer to Embodiments 1 and 2. It will not be described in detail in this embodiment.

[0073] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A device for adjusting and testing an optical module, characterized in that, It includes at least one commissioning module, a first wavelength division multiplexer, a first oscilloscope, and a second oscilloscope. The commissioning module includes a transmit bit error rate meter, a first test board, a receive bit error rate meter, and a light-emitting unit. The optical module under test is electrically connected to the first test board. The first and second transmitting ends of the transmission error meter are respectively connected to the two transmitting ends on the first test board. The optical module under test is coupled to the common end of the first wavelength division multiplexer. The first port of the first wavelength division multiplexer is connected to the optical signal receiving end of the first oscilloscope. The second port of the first wavelength division multiplexer is connected to the optical signal receiving end of the second oscilloscope. The third transmitting terminal of the transmission error meter is connected to the trigger terminal of the first oscilloscope, and the fourth transmitting terminal of the transmission error meter is connected to the trigger terminal of the second oscilloscope. The transmitter of the receiver error meter is connected to the control terminal of the light-emitting unit, the light-emitting unit is coupled to the optical module under test, and the receiver on the first test board is connected to the receiver of the receiver error meter. The serial ports on both the transmit and receive error meters are connected to the controller to adjust and test the optical module under test.

2. The adjustment and testing device for an optical module according to claim 1, characterized in that, The testing module further includes: a second wavelength division multiplexer, a receiving optical module, and a second test board, wherein the receiving optical module is electrically connected to the second test board; The optical module under test is coupled to the common terminal of the second wavelength division multiplexer, and the first port of the second wavelength division multiplexer is coupled to the common terminal of the first wavelength division multiplexer and the receiving optical module, respectively. The receiver on the second test board is connected to the receiver of the transmit error meter.

3. The adjustment and testing device for the optical module according to claim 2, characterized in that, The tuning module also includes a beam splitter, with the first port of the second wavelength division multiplexer connected to the input of the beam splitter, and the output of the beam splitter coupled to the common port of the first wavelength division multiplexer and the receiving optical module, respectively. An optical fiber of a preset length is also provided on the coupling optical path between the first port of the second wavelength division multiplexer and the receiving optical module.

4. The adjustment and testing device for an optical module according to claim 2, characterized in that, The light-emitting unit includes a timing board, a first light source, a second light source, and a coupler; the first light source and the second light source are electrically connected to the timing board respectively; The transmitter of the receiver error meter is connected to the transmitter on the timing board. The first light source and the second light source are respectively coupled to the input of the coupler. The output of the coupler is coupled to the second port of the second wavelength division multiplexer.

5. The adjustment and testing device for an optical module according to claim 4, characterized in that, The light-emitting unit further includes a first attenuator and a second attenuator. The receiving light module is coupled to the input end of the first attenuator, the first light source is coupled to the input end of the second attenuator, and the output ends of the first attenuator and the second attenuator are respectively coupled to the input end of the coupler.

6. The adjustment and testing device for an optical module according to claim 4, characterized in that, The alarm pin on the timing board is connected to the alarm pin on the first test board; the reset signal pin on the timing board is connected to the reset signal pin on the first test board; the trigger pin on the timing board is connected to the intensity signal pin on the first test board; and the communication pin on the timing board is connected to the communication pin on the first test board.

7. The adjustment and testing device for an optical module according to claim 4, characterized in that, The controller is connected to the serial port on the timing board.

8. The adjustment and testing device for an optical module according to claim 2, characterized in that, When the optical module adjustment and testing device is used to adjust and test multiple optical modules under test, the adjustment and testing device includes multiple adjustment and testing modules, and the adjustment and testing device also includes an optical switch, a first frequency divider and a second frequency divider; The first ports of the plurality of second wavelength division multiplexers are respectively coupled to the selection terminals of the optical switches, and the common terminals of the optical switches are coupled to the common terminals of the first wavelength division multiplexers; The third transmitters of the plurality of transmission error meters are respectively connected to the input of the first frequency divider, and the fourth transmitters of the plurality of transmission error meters are respectively connected to the input of the second frequency divider; The output terminal of the first frequency divider is connected to the trigger terminal of the first oscilloscope, and the output terminal of the second frequency divider is connected to the trigger terminal of the second oscilloscope.

9. The adjustment and testing device for an optical module according to claim 8, characterized in that, The optical switch, the first frequency divider, the second frequency divider, the first oscilloscope, and the second oscilloscope are all connected to the instrument cloud server.

10. A system for adjusting and testing an optical module, characterized in that, The device includes a testing and adjustment apparatus for an optical module as described in any one of claims 1-9 and an optical module under test, wherein the optical module under test is electrically connected to a first test board on the testing and adjustment apparatus for the optical module.