Detection device for electronic component

Abstract

The utility model relates to the technical field of electronic component detection equipment, and discloses an electronic component detection device which comprises a universal meter, the universal meter is provided with a plurality of test ports, two corresponding test ports are provided with detection mechanisms, the back side of the universal meter is fixedly provided with two fixing seats respectively, and the fixing seats are fixed on the universal meter. The same deflection supporting plate is rotationally mounted on the two fixed seats, a plurality of movable grooves are formed in one side of the deflection supporting plate, and anti-loosening elastic mechanisms are arranged in the movable grooves; according to the utility model, the two wires are sequentially wound on the plurality of wire winding bent rods, and under the elastic force action of the plurality of springs, outward acting force is synchronously generated on the plurality of wire winding bent rods, so that the two wires wound on the plurality of wire winding bent rods are kept in a proper straightened state; the condition that two wires wound on the plurality of winding bent rods are wound together disorderly is reduced, the time for subsequent arrangement of the wires of the universal meter is shortened, and the practicability of the universal meter is improved.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing equipment technology, and in particular to a testing device for electronic components. Background Technology

[0002] Electronic components are basic building blocks that perform specific functions in electronic circuits. They form the foundation of electronic equipment. There are many types of electronic components, which can be broadly divided into two categories: components, such as resistors, capacitors, and inductors, and devices, such as transistors, diodes, field-effect transistors, and integrated circuits. Testing devices are required when testing electronic components.

[0003] A testing device for power electronic components (authorization announcement number: CN219935935U) is available. This testing device is a multimeter. It tests electronic components through two test probes on the multimeter. A spring clip is set between the two test probes to stabilize the spread state of the two probes. Squeezing the probes reduces the opening angle, and releasing the probes increases the opening angle. This allows for manual operation to change the distance between the contact ends of the probes, making it convenient for users to operate the multimeter to test electronic components.

[0004] However, this type of testing device for power electronic components has some shortcomings in practical use: after testing the electronic components with a multimeter, the user usually wraps the wires from the two test leads around the multimeter body several times. However, the wires wrapped around the multimeter body are prone to loosening, resulting in the two wires becoming tangled together, increasing the time required to tidy up the multimeter wires and reducing its practicality. Therefore, we propose a testing device for electronic components to solve the above problems. Utility Model Content

[0005] In view of the shortcomings of the prior art, this utility model provides a testing device for electronic components to solve the above problems.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] A testing device for electronic components includes a multimeter with multiple test ports and a testing mechanism on each of two corresponding test ports. Two mounting bases are fixedly installed on the back of the multimeter, and a common deflection support plate is rotatably mounted on each of the two mounting bases. Multiple movable slots are provided on one side of the deflection support plate, and anti-loosening elastic mechanisms are installed in each of the movable slots. Multiple elastic buckles are fixedly installed on one side of the deflection support plate, and two limiting mechanisms for limiting the movement of the deflection support plate are provided on the back of the multimeter.

[0008] Preferably, the testing mechanism includes a connector, a wire, and a test probe. The connector is inserted into the test port, and one end of the wire is provided on the connector, while the other end of the wire is provided with a test probe. This facilitates the testing of electronic components using two test probes.

[0009] Preferably, the anti-slackening elastic mechanism includes a movable circular plate, a spring, and a winding rod. The movable circular plate is movably installed in the movable groove. One end of the spring is fixedly installed on one side of the movable circular plate, and the other end of the spring is fixedly installed on the inner wall of one side of the movable groove. The winding rod is fixedly installed on one side of the movable circular plate. Under the coordinated action of multiple anti-slackening elastic mechanisms, an outward force is simultaneously generated on multiple winding rods, so that the two wires wound on multiple winding rods maintain an appropriate taut state, reducing the situation where the two wires wound on multiple winding rods become messy and tangled together.

[0010] Preferably, the number of elastic clips is four, and the elastic clips are adapted to the test probes; this facilitates the two test probes to be inserted into the corresponding two elastic clips, thereby achieving the locking and fixing of the two test probes.

[0011] Preferably, the limiting mechanism includes a sleeve, a rotating ring, a baffle, and a notch limiting plate. The sleeve is fixedly installed on the back side of the multimeter. A rotating ring is rotatably installed inside the sleeve. A baffle is fixedly installed on one side of the rotating ring. One end of the baffle rotatably abuts against one side of the deflection support plate. A notch limiting plate is fixedly installed on one side of the sleeve. The notch limiting plate is adapted to the baffle. When one end of the baffle rotates and abuts against one side of the deflection support plate, the deflection support plate is limited.

[0012] Preferably, each of the two fixed seats is provided with a deflection limiting groove, and the deflection support plate is adapted to the deflection limiting groove on the two fixed seats. Two support columns are fixedly installed on the back side of the multimeter. The deflection limiting groove on the two fixed seats is used to limit the deflection support plate after deflection, so as to facilitate the multimeter to be supported by the deflection support plate after deflection.

[0013] Compared with the prior art, the beneficial effects of this utility model are:

[0014] This electronic component testing device, after the multimeter has completed the testing of the electronic component, winds two wires sequentially around multiple winding rods. Under the elastic force of multiple springs, the multiple winding rods simultaneously generate outward force, keeping the two wires wound around the multiple winding rods in a proper taut state. This reduces the possibility of the two wires becoming tangled together, reduces the time spent tidying up the multimeter wires, and improves the practicality of the multimeter. Attached Figure Description

[0015] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0016] Figure 2 This is a partial cross-sectional structural schematic diagram of the deflection support plate of this utility model;

[0017] Figure 3 This utility model Figure 2 A schematic diagram of the structure of part A;

[0018] Figure 4 This is a rear view structural schematic diagram of the present invention;

[0019] Figure 5 This is a structural schematic diagram of the present invention from an exploded perspective.

[0020] In the diagram: 1. Multimeter; 2. Test port; 3. Connector; 4. Wire; 5. Test probe; 6. Mounting base; 7. Deflection support plate; 8. Movable groove; 9. Movable circular plate; 10. Spring; 11. Winding rod; 12. Elastic buckle; 13. Sleeve; 14. Rotary ring; 15. Baffle; 16. Notch limiting plate; 17. Deflection limiting groove; 18. Support column. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Example: Refer to Figure 1-5A testing device for electronic components includes a multimeter 1, which has multiple test ports 2. A testing mechanism is provided on each of the two corresponding test ports 2. Two fixed bases 6 are fixedly installed on the back side of the multimeter 1. The same deflection support plate 7 is rotatably installed on the two fixed bases 6. Multiple movable slots 8 are provided on one side of the deflection support plate 7. Each movable slot 8 is provided with an anti-loosening elastic mechanism. Multiple elastic buckles 12 are fixedly installed on one side of the deflection support plate 7. Two limiting mechanisms for limiting the deflection support plate 7 are provided on the back side of the multimeter 1.

[0023] Furthermore, the testing mechanism includes a connector 3, a wire 4, and a test probe 5. The connector 3 is inserted into the test port 2, and one end of the wire 4 is provided on the connector 3. The other end of the wire 4 is provided with a test probe 5, which facilitates the testing of electronic components through two test probes 5.

[0024] Furthermore, the anti-slackening elastic mechanism includes a movable circular plate 9, a spring 10, and a winding rod 11. The movable circular plate 9 is movably installed in the movable groove 8. One end of the spring 10 is fixedly installed on one side of the movable circular plate 9, and the other end of the spring 10 is fixedly installed on the inner wall of one side of the movable groove 8. The winding rod 11 is fixedly installed on one side of the movable circular plate 9. Under the coordinated action of multiple anti-slackening elastic mechanisms, an outward force is generated simultaneously on multiple winding rods 11, so that the two wires 4 wound on multiple winding rods 11 maintain an appropriate taut state, reducing the situation where the two wires 4 wound on multiple winding rods 11 become messy and tangled together.

[0025] Specifically, there are four elastic clips 12, which are adapted to the test probes 5; so that the two test probes 5 can be inserted into the corresponding two elastic clips 12 to achieve the snap-fit ​​and fixation of the two test probes 5.

[0026] Furthermore, the limiting mechanism includes a sleeve 13, a rotating ring 14, a baffle 15, and a notch limiting plate 16. The sleeve 13 is fixedly installed on the back side of the multimeter 1. The rotating ring 14 is rotatably installed inside the sleeve 13. The baffle 15 is fixedly installed on one side of the rotating ring 14. One end of the baffle 15 rotates and abuts against one side of the deflection support plate 7. The notch limiting plate 16 is fixedly installed on one side of the sleeve 13. The notch limiting plate 16 is adapted to the baffle 15. When one end of the baffle 15 rotates and abuts against one side of the deflection support plate 7, the deflection support plate 7 is limited.

[0027] Specifically, each of the two fixed seats 6 is provided with a deflection limiting groove 17, and the deflection support plate 7 is adapted to the deflection limiting groove 17 on the two fixed seats 6. Two support columns 18 are fixedly installed on the back side of the multimeter 1. The deflection limiting groove 17 on the two fixed seats 6 is used to limit the deflection support plate 7 after deflection, so as to facilitate the multimeter 1 to be supported by the deflection support plate 7 after deflection.

[0028] In use: After using multimeter 1 to test electronic components, the two wires 4 are wound sequentially around multiple winding rods 11. Under the elastic force of multiple springs 10, the multiple winding rods 11 are simultaneously exerted with an outward force, keeping the two wires 4 wound around the multiple winding rods 11 in a proper taut state, reducing the possibility of the two wires 4 being tangled together, reducing the time spent tidying up the wires 4 on multimeter 1, and improving the practicality of multimeter 1. Then, the two test probes 5 are respectively embedded into the corresponding two elastic clips 12 to achieve the locking and fixing of the two test probes 5. Then, the deflection support plate 7 is rotated and attached to the back of multimeter 1. Then, the two baffles 15 are rotated and adjusted to one side of the deflection support plate 7 to achieve the limiting and fixing of the deflection support plate 7.

[0029] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0030] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention.

Claims

1. A testing device for electronic components, comprising a multimeter (1), characterized in that, The multimeter (1) is provided with multiple test ports (2), and a detection mechanism is provided on the two corresponding test ports (2). Two fixed seats (6) are fixedly installed on the back side of the multimeter (1), and the same deflection support plate (7) is rotatably installed on the two fixed seats (6). Multiple movable slots (8) are provided on one side of the deflection support plate (7), and an anti-loosening elastic mechanism is provided in each of the multiple movable slots (8). Multiple elastic buckles (12) are fixedly installed on one side of the deflection support plate (7). Two limiting mechanisms for limiting the deflection support plate (7) are provided on the back side of the multimeter (1).

2. The testing device for electronic components according to claim 1, characterized in that, The testing mechanism includes a connector (3), a wire (4) and a test probe pen (5). The connector (3) is inserted into the test port (2). One end of the wire (4) is provided on the connector (3), and the other end of the wire (4) is provided with the test probe pen (5).

3. The testing device for electronic components according to claim 1, characterized in that, The anti-relaxation elastic mechanism includes a movable circular plate (9), a spring (10), and a winding rod (11). The movable circular plate (9) is movably installed in the movable groove (8). One end of the spring (10) is fixedly installed on one side of the movable circular plate (9), and the other end of the spring (10) is fixedly installed on the inner wall of one side of the movable groove (8). The winding rod (11) is fixedly installed on one side of the movable circular plate (9).

4. The testing device for electronic components according to claim 2, characterized in that, The number of elastic buckles (12) is set to four, and the elastic buckles (12) are adapted to the test probe pen (5).

5. The testing device for electronic components according to claim 1, characterized in that, The limiting mechanism includes a sleeve (13), a rotating ring (14), a baffle (15), and a notch limiting plate (16). The sleeve (13) is fixedly installed on the back side of the multimeter (1). The rotating ring (14) is rotatably installed inside the sleeve (13). The baffle (15) is fixedly installed on one side of the rotating ring (14). One end of the baffle (15) rotates and fits against one side of the deflection support plate (7). The notch limiting plate (16) is fixedly installed on one side of the sleeve (13). The notch limiting plate (16) is adapted to the baffle (15).

6. The testing device for electronic components according to claim 5, characterized in that, Both fixed seats (6) are provided with deflection limiting grooves (17). The deflection support plate (7) is adapted to the deflection limiting grooves (17) on the two fixed seats (6). Two support columns (18) are fixedly installed on the back side of the multimeter (1).

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