Multi-thyristor-level measuring device

Abstract

The utility model discloses a multi-thyristor-level measuring device, and the device comprises a fixed structure which is internally and fixedly provided with a plurality of thyristors to be measured; the measuring structure is connected with the plurality of thyristors to be measured through wires; and the polarity conversion structure is connected with the measuring structure through a wire. Thyristor measurement can be completed without repeated disconnection and connection with the multi-thyristor level, and the measurement efficiency of the multi-thyristor level can be improved.

Description

Technical Field

[0001] This application belongs to the field of thyristor measurement technology, specifically relating to a polythyristor-level measurement device. Background Technology

[0002] Thyristors are semi-controlled switching elements, particularly suitable for high-voltage, high-current operating conditions. Therefore, they are widely used in ultra-high voltage and extra-high voltage direct current (UHVDC) transmission and are key components of converter valves. Because converter valves utilize a large number of thyristors, sequential testing of the internal polythyristor stages is necessary before commissioning or during maintenance of DC transmission projects to ensure good electrical characteristics and optimal functionality of the thyristor stages.

[0003] Testing thyristor stages requires applying specific voltage waveforms to the positive and negative terminals of the thyristor using a measuring device. The degree of aging or damage is determined by acquiring the actual voltage data across the thyristor. In practical applications, hundreds of thyristor stages in a single DC transmission converter valve need to be tested. Most existing measuring devices are single-pole thyristor measuring structures, requiring disconnection and reconnection after each measurement, thus affecting measurement efficiency.

[0004] The information disclosed in the background section is only intended to enhance the understanding of the background of this utility model, and therefore may contain information that does not constitute prior art known to those skilled in the art. Utility Model Content

[0005] In view of the shortcomings of the prior art, the purpose of this application is to provide a polythyristor level measurement device. This application can complete thyristor measurement without repeatedly disconnecting and reconnecting to the polythyristor level, thereby improving the measurement efficiency of the polythyristor level.

[0006] To achieve the above objectives, this application provides the following technical solution:

[0007] A polythyristor-level measurement device includes: a fixed structure in which a plurality of thyristors to be tested are fixedly disposed; a measurement structure connected to the plurality of thyristors to be tested via wires; and a polarity conversion structure connected to the measurement structure via wires.

[0008] Optionally, the fixing structure includes: a first clamping plate and a second clamping plate, with a plurality of metal plates disposed between the first clamping plate and the second clamping plate, and a thyristor to be tested disposed between each pair of adjacent metal plates.

[0009] Optionally, the first clamping plate and the second clamping plate are connected by a spring structure.

[0010] Optionally, multiple grooves are evenly arranged on the second clamping plate, and the metal plate is located in the grooves.

[0011] Optionally, a metal contact is provided in the groove, and the metal contact is in close contact with the metal plate.

[0012] Optionally, the measuring structure includes an inner disk and an outer disk.

[0013] Optionally, the outer disk is provided with a wiring port in the circumferential direction, and the wiring port is connected to the thyristor under test through a wire.

[0014] Optionally, the inner disk is provided with a first switch and a second switch. The first end of the first switch and the second switch are connected to the center of the inner disk, and the second end is connected to the edge of the inner disk. The first switch and the second switch are respectively connected to the anode and cathode of the thyristor through wires.

[0015] Optionally, the polarity conversion structure includes a positive electrode portion and a negative electrode portion, which are respectively connected to the measuring structure via wires.

[0016] Optionally, a switching shaft is provided between the positive electrode portion and the negative electrode portion.

[0017] Compared with the prior art, the beneficial effects of this application are as follows: by adjusting the switch position and changing the positive and negative pole structure of the polarity conversion measuring device, this application can test the thyristors one by one in sequence, and there is no need to repeatedly connect or disconnect the thyristors during the testing process, thereby speeding up the testing speed of the thyristors and improving the testing efficiency. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of a polythyristor-level measurement device provided in one embodiment of this application;

[0019] Figure 2 This is a partial schematic diagram of a red polythyristor-level measurement device provided in another embodiment of this application;

[0020] The annotations in the attached figures are explained as follows:

[0021] 1. Fixing hole; 2. Spring structure; 3-1. First clamping plate; 3-2. Second clamping plate; 4. Measuring structure (4-1. Inner disc; 4-2. Outer disc; 4-3. First switch; 4-4. Second switch); 5. Polarity conversion structure (5-1. Positive part; 5-2. Negative part; 5-3. Axis of symmetry); 6. Metal plate; 7. Thyristor; 8. Metal contact. Detailed Implementation

[0022] Specific embodiments of this application will now be described in detail with reference to the accompanying drawings. While specific embodiments of this application are shown in the drawings, it should be understood that this application can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of this application and to fully convey the scope of this application to those skilled in the art.

[0023] It should be noted that certain terms are used in the specification and claims to refer to specific components. Those skilled in the art will understand that different terms may be used to refer to the same component. This specification and claims do not distinguish components based on differences in terminology, but rather on differences in function. The terms "comprising" or "including" used throughout the specification and claims are open-ended and should be interpreted as "comprising but not limited to." The following descriptions in the specification are preferred embodiments for carrying out this application; however, these descriptions are for the purpose of understanding the general principles of the specification and are not intended to limit the scope of this application. The scope of protection of this application shall be determined by the appended claims.

[0024] To facilitate understanding of the embodiments of this application, the following will provide further explanation and description with reference to the accompanying drawings and specific embodiments, and the accompanying drawings do not constitute a limitation on the embodiments of this application.

[0025] In one embodiment, such as Figure 1 and Figure 2 As shown, the measuring device includes:

[0026] A fixed structure, wherein multiple thyristors 7 to be tested are fixedly disposed within the fixed structure;

[0027] Measurement structure 4 is connected to the plurality of thyristors under test via wires;

[0028] The polarity conversion structure 5 is connected to the measuring structure 4 via a wire.

[0029] In another embodiment, the fixing structure includes:

[0030] The first clamping plate 3-1 and the second clamping plate 3-2 are connected by the spring structure 2.

[0031] A plurality of metal plates 6 are provided between the first clamping plate 3-1 and the second clamping plate 3-2, and a thyristor to be tested is provided between each two adjacent metal plates 6.

[0032] In this embodiment, the spring structure connects the first clamping plate and the second clamping plate through a perforation, so that the first clamping plate and the second clamping plate can open at a certain angle to clamp the thyristor to be tested. When there is no external force, the first clamping plate and the second clamping plate are tightly attached with a relative angle of 0°. When subjected to external force, the spring structure provides a lever arm for the first clamping plate and the second clamping plate, and the two clamping plates open. The angle depends on the number of thyristors under test.

[0033] In addition, the second clamping plate is provided with fixing holes 1, which are installed at the four corners of the second clamping plate. During testing, screws and nuts are used to fix the device in the specified test position through the fixing holes 1.

[0034] In another embodiment, multiple grooves are evenly arranged on the second clamping plate 3-2, and the metal plate 6 is located in the grooves.

[0035] In another embodiment, a metal contact 8 is provided in the groove, and the metal contact is in close contact with the metal plate 6.

[0036] In this embodiment, the metal contact is connected to the external circuit. During measurement, the metal contact should be in close contact with the metal clamp between the thyristor being measured to ensure the circuit is connected.

[0037] In another embodiment, the measuring structure includes an inner disk 4-1 and an outer disk 4-2.

[0038] In this embodiment, the outer disk has multiple connection ports circumferentially arranged, which are connected to each stage of the thyristor under test via wires during testing. The inner disk 4-1 is equipped with a first switch 4-3 and a second switch 4-4. The first ends of the first switch 4-3 and the second switch 4-4 are connected to the center of the inner disk 4-1, and the second ends are connected to the edge of the inner disk 4-1. The first switch 4-3 and the second switch 4-4 are respectively connected to the anode and cathode of the thyristor via wires.

[0039] The first and second switches can be changed as the inner circle rotates. The first and second switches are initially connected to the anode and cathode of the first thyristor under test via wires. After the first thyristor under test is tested, by rotating the inner circle, the first and second switches can be rotated by a fixed angle, thereby connecting the first and second switches to the anode and cathode of the second thyristor under test, and so on, until the measurement of all thyristors under test is completed.

[0040] In another embodiment, the polarity conversion structure is an axisymmetric structure, which has an axis of symmetry 5-3 inside. The positive electrode portion 5-1 and the negative electrode portion 5-2 are respectively on both sides of the axis of symmetry 5-3. The positive electrode portion 5-1 and the negative electrode portion 5-2 are respectively connected to the measuring structure through wires.

[0041] In this embodiment, as the first and second switches rotate with the inner circle and connect to different thyristors under test, the polarity switching device also needs to rotate synchronously. That is, for each thyristor tested, the positive and negative portions of the polarity switching structure need to be swapped to ensure correct external circuit connection and complete thyristor parameter measurement. Specifically, after measuring the first thyristor, the first and second switches rotate via the inner circle, and the polarity switching structure simultaneously rotates 180° around the axis of symmetry, swapping the positions of the positive and negative portions. After measuring the second thyristor, the first and second switches rotate again via the inner circle, and the polarity switching structure again rotates 180° around the axis of symmetry. This process is repeated until the last thyristor under test is tested sequentially.

[0042] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A polythyristor-level measurement device, comprising: A fixed structure, wherein multiple thyristors to be tested are fixedly disposed within the fixed structure; The measuring structure is connected to the plurality of thyristors under test via wires; A polarity reversal structure is connected to the measurement structure via a wire.

2. The apparatus according to claim 1, wherein, The fixing structure includes: First and second clamping plates Multiple metal plates are disposed between the first clamping plate and the second clamping plate, and a thyristor to be tested is disposed between each two adjacent metal plates.

3. The apparatus according to claim 2, wherein, The first clamping plate and the second clamping plate are connected by a spring structure.

4. The apparatus according to claim 3, wherein, The second clamping plate has multiple grooves evenly arranged, and the metal plate is located in the grooves.

5. The apparatus according to claim 4, wherein, A metal contact is provided in the groove, and the metal contact is in close contact with the metal plate.

6. The apparatus according to claim 1, wherein, The measuring structure includes an inner disk and an outer disk.

7. The apparatus according to claim 6, wherein, The outer disk is provided with a wiring port in the circumferential direction, and the wiring port is connected to the thyristor under test through a wire.

8. The apparatus according to claim 6, wherein, The inner disk is provided with a first switch and a second switch. The first end of the first switch and the second switch are connected to the center of the inner disk, and the second end is connected to the edge of the inner disk. The first switch and the second switch are respectively connected to the anode and cathode of the thyristor through wires.

9. The apparatus according to claim 1, wherein, The polarity conversion structure includes a positive electrode portion and a negative electrode portion, which are respectively connected to the measuring structure via wires.

10. The apparatus according to claim 9, wherein, A conversion shaft is provided between the positive electrode portion and the negative electrode portion.

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