High-precision multifunctional circuit tester
By simplifying the circuit structure and optimizing signal processing, the problems of complex circuit design and analog-to-digital conversion errors in circuit testing instruments have been solved, enabling high-precision voltage, current, and power measurements, reducing costs, and improving measurement accuracy and efficiency.
Patent Information
- Application Number
- CN202422831817.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-20
- Publication Date
- 2025-10-31
- Estimated Expiration
- 2034-11-20
AI Technical Summary
Existing circuit testing instruments have complex circuit designs, and systematic errors are prone to occur during the analog-to-digital conversion process, leading to inaccurate measurement results.
A simplified circuit structure is adopted, including conditioning circuit, RMS circuit and analog-to-digital conversion circuit. The voltage conditioning circuit, current conditioning circuit and power circuit are used to process the electrical signal. Combined with the effective chip AD637 and analog-to-digital converter ADS1224, accurate measurement of voltage, current and power can be achieved.
It improves the accuracy and stability of measurements, reduces manufacturing costs and maintenance expenses, and enhances the user experience and work efficiency.
Smart Images

Figure CN223501120U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of circuit testing technology, and in particular to a high-precision multifunctional circuit tester. Background Technology
[0002] With the advancement and development of science and technology, electrical parameter testing instruments have become more accurate, more automated, and more comprehensive in function. Due to the increasing complexity of electrical equipment used in defense technology and industrial production, traditional testing instruments and measurement methods can no longer meet the needs of practical applications. In recent years, the variety of electronic equipment in scientific and technological research and industrial production has increased, leading to a more complex electromagnetic environment. Existing circuit testers can better resist electromagnetic environments, but they are prone to high manufacturing costs due to the complexity of their circuit components. In order to achieve the measurement function, they have designed relatively complex circuit structures, resulting in significant maintenance costs. More importantly, in the process of measuring voltage and current, analog-to-digital converters are often used to directly convert electrical signals into digital signals, but this increases system errors and makes the measurement results inaccurate. Utility Model Content
[0003] To address the shortcomings of existing technologies, this utility model provides a high-precision multi-functional circuit tester, which solves the technical problems of complex circuit design and inaccurate measurement results due to systematic errors in the analog-to-digital conversion process. It simplifies the circuit structure of the tester and increases the accuracy of the tester's measurements.
[0004] To solve the above-mentioned technical problems, this utility model provides the following technical solution: a high-precision multi-functional circuit tester, including a processing module, and a conditioning circuit, an RMS circuit and an analog-to-digital conversion circuit are externally connected to the processing module.
[0005] Preferably, the conditioning circuit includes a voltage conditioning circuit for converting a voltage signal into an input voltage, and a current conditioning circuit for amplifying and filtering a current signal and converting it into an input current. The voltage conditioning circuit includes a fixed resistor R1 and a feedback unit OP1 connected in series. The feedback unit OP1 is connected in parallel with a capacitor C1. The feedback unit OP1 is also connected in parallel with fixed resistors R2 and R3. A diode D1 is connected in parallel between the fixed resistors R2 and R3. An adjustment switch K1 is connected between the fixed resistor R1 and the diode D1.
[0006] Preferably, the current conditioning circuit includes a bipolar transformer with a series-connected fixed resistor R4 and R5 connected in parallel. A control switch K2 is connected in parallel between the fixed resistors R4 and R5 and is also connected in parallel with the bipolar transformer. An amplifier OP2 is connected in series with the bipolar transformer. One side of the fixed resistors R4 and R5 connected in parallel with the bipolar transformer is connected to the positive terminal of the amplifier OP2, and the other side is connected to the negative terminal of the amplifier OP2. The amplifier OP2 outputs the input current, and a capacitor C2 is connected in parallel with the output terminal of the amplifier OP2.
[0007] Preferably, the conditioning circuit further includes a power circuit, which includes an input voltage and an input current as input terminals. The input terminal is connected to a double-pole double-throw switch K3. The double-pole double-throw switch K3 is connected in series with fixed resistors R6 and R7 and a control rheostat R8. The control rheostat R8 and the fixed resistor R7 are connected in parallel to the input terminal of the judgment unit OP3. The positive terminal of the judgment unit OP3 is connected to a 15V voltage and a capacitor C3 in parallel. The negative terminal of the judgment unit OP3 is connected in parallel with a fixed resistor R9 and grounded. The output terminal of the judgment unit OP3 is connected in parallel with a fixed resistor R10 and outputs the input power.
[0008] Preferably, the effective value circuit includes an effective chip for receiving input power, input voltage, and input current. The input power is connected to the B_I port of the effective chip through a fixed resistor R11, the input voltage is connected to the B_O port of the effective chip through a fixed resistor R12, and the input current is connected to the VIN port of the effective chip through a fixed resistor R13. The effective value circuit (2) also includes external power supplies of +15V and -15V. The +15V external power supply is connected to the +VS port of the effective chip through a parallel capacitor C7, and the -15V external power supply is connected to the -VS port of the effective chip through a parallel capacitor C8. A capacitor C5 is connected in parallel on the side of the fixed resistor R11, and a capacitor C6 is connected in parallel between the capacitor C5 and the fixed resistor R11. The capacitor C6 is connected in parallel to the OUT port of the effective chip, and the effective chip outputs information signals to the outside through the OUT port.
[0009] Preferably, the analog-to-digital converter circuit is used to receive information signals, convert the information signals into digital signals, and transmit them to the processing module.
[0010] Preferably, the analog-to-digital converter circuit is model ADS1224, the processing module is model STC89C58RD+, and the active chip is model AD637.
[0011] By employing the above technical solution, this utility model provides a high-precision multifunctional circuit tester, which has at least the following beneficial effects:
[0012] 1. This utility model can obtain voltage, current and power measurement data by detecting electrical signals through conditioning circuit. The corresponding circuits have been simplified. While ensuring that the original functions are not affected, it can still obtain voltage, current and power measurement data. Furthermore, the optimized structure makes the acquired data more stable and reduces the amount of noise. This simplified structure can reduce manufacturing costs, reduce maintenance costs, and make the acquired circuit measurement data more accurate.
[0013] 2. By combining the function of the conditioning circuit with the effective value circuit, this utility model can convert the effective value of the AC signal into a fixed electrical signal after the conditioning circuit obtains the circuit measurement data. This avoids large systematic errors caused by fluctuating electrical signals, increases the accuracy of the tester's measurement, and improves the user experience and work efficiency. Attached Figure Description
[0014] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments of this application and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:
[0015] Figure 1 This is a circuit structure block diagram of a high-precision multifunctional circuit tester according to the present invention;
[0016] Figure 2 This is a circuit diagram of the voltage conditioning circuit of this utility model;
[0017] Figure 3 This is a circuit diagram of the current conditioning circuit of this utility model;
[0018] Figure 4 This is a circuit diagram of the power circuit of this utility model;
[0019] Figure 5 This is a circuit diagram of the effective value circuit of this utility model.
[0020] In the diagram: 1. Conditioning circuit; 11. Voltage conditioning circuit; 12. Current conditioning circuit; 13. Power circuit; 2. RMS circuit; 3. Analog-to-digital conversion circuit; 4. Processing module. Detailed Implementation
[0021] To make the above-mentioned objectives, features, and advantages of this utility model more apparent and understandable, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments. This will allow for a full understanding and implementation of how the present application uses technical means to solve technical problems and achieve technical effects.
[0022] Due to the complexity of circuit design and the susceptibility of systematic errors in the analog-to-digital conversion process in existing technologies, resulting in inaccurate measurement results, please refer to [the relevant documentation / reference]. Figure 1 - Figure 5 This embodiment provides a high-precision multifunctional circuit tester, which simplifies the circuit structure of the tester and increases the accuracy of the measurement. The circuit tester includes a processing module 4, externally connected to a conditioning circuit 1, an RMS circuit 2, and an analog-to-digital converter (ADC) circuit 3. The ADC circuit 3 receives information signals, converts them into digital signals, and transmits them to the processing module 4. The processing module 4 is model STC89C58RD+, and the ADC circuit 3 is model ADS1224. The conditioning circuit 1 includes a voltage conditioning circuit 11 for converting voltage signals into input voltage, and a current conditioning circuit 12 for amplifying and filtering current signals and converting them into input current. The voltage conditioning circuit 11 includes a fixed resistor R1 and a feedback circuit OP1 connected in series. A capacitor C1 is connected in parallel with the feedback circuit OP1. The feedback circuit OP1 also has fixed resistors R2 and R3 connected in parallel. A diode D1 is connected in parallel between the fixed resistors R2 and R3. An adjustment switch K1 is connected between the fixed resistor R1 and the diode D1. The current conditioning circuit 12... The circuit includes a bipolar transformer with series-connected fixed resistors R4 and R5 connected in parallel. A control switch K2 is connected in parallel between the fixed resistors R4 and R5 and in parallel with the bipolar transformer. An amplifier OP2 is connected in series with the bipolar transformer. One side of the parallel connection between the fixed resistors R4 and R5 is connected to the positive terminal of the amplifier OP2, and the other side is connected to the negative terminal of the amplifier OP2. The amplifier OP2 outputs the input current, and a capacitor C2 is connected in parallel to the output terminal of the amplifier OP2. The conditioning circuit 1 also includes a power circuit 13. The power circuit 13 includes an input voltage and an input current as input terminals. A double-pole double-throw switch K3 is connected to the input terminal. A fixed resistor R6 and R7 and a control rheostat R8 are connected in series with the double-pole double-throw switch K3. The control rheostat R8 and the fixed resistor R7 are connected in parallel to the input terminal of the judgment unit OP3. A 15V voltage is connected in parallel with a capacitor C3 at the positive terminal of the judgment unit OP3. A fixed resistor R9 is connected in parallel with the negative terminal of the judgment unit OP3 and grounded. A fixed resistor R10 is connected in parallel with the output terminal of the judgment unit OP3 and outputs the input power.
[0023] In this invention, the voltage conditioning circuit 11 receives the measured voltage signal, and the adjusting switch K1 and diode D1 work together to connect the fixed resistor R2 in parallel with the feedback unit OP1. The feedback unit OP1 outputs voltage 1 to the output terminal. When the adjusting switch K1 is switched to the other side, the diode D1 causes the fixed resistors R2 and R3 to be connected in parallel, thereby changing the voltage measurement range and increasing the voltage measurement range. The current conditioning circuit 12 receives the current signal and converts it through a bipolar transformer. When a large current signal passes through the mutual inductance coil of the bipolar transformer, a smaller current signal is induced. Then, the controlling switch K2 changes the parallel resistors to change the range. The fixed resistors R4 and R5 convert this small current signal into a voltage signal of the same frequency. This voltage signal is used in subsequent steps to calculate the current magnitude, hence the name "input current." However, this input current does not have load-carrying capacity. Therefore, this invention uses amplifier OP2 to amplify the input current, making... The amplified signal has the ability to carry a load and can be sent to the next stage of the RMS conversion circuit. Finally, the input current is analyzed and calculated by the processing module 4 to obtain the current value, thus completing the current measurement. The power circuit 13 can quickly obtain the electrical power signal corresponding to the voltage and current through the switching of the double-pole double-throw switch K3 and the judgment unit OP3. By controlling the adjustment of the variable resistor R8, the potential difference between the input voltage and the input current can be changed, making the measurement results more accurate. The judgment unit OP3 sums the two signals and transmits them to the RMS circuit 2. Through the detection of the electrical signal by the conditioning circuit, the measurement data of voltage, current and power can be obtained. The corresponding circuits have been simplified. While ensuring that the original functions are not affected, the measurement data of voltage, current and power can still be obtained. Furthermore, the optimized structure makes the obtained data more stable and reduces the amount of noise. This simplified structure can reduce manufacturing costs, reduce maintenance costs, and make the obtained circuit measurement data more accurate.
[0024] Since the tester measures AC voltage signals, directly sending them to an analog-to-digital converter for processing will only convert the analog voltage signal directly into a digital signal, increasing system errors. Please refer to [the relevant documentation / reference]. Figure 1 and Figure 5This embodiment proposes an RMS circuit 2 including an effective chip for receiving input power, input voltage, and input current. The input power is connected to the B_I port of the effective chip through a fixed resistor R11, the input voltage is connected to the B_O port of the effective chip through a fixed resistor R12, and the input current is connected to the VIN port of the effective chip through a fixed resistor R13. The RMS circuit 2 also includes external power supplies of +15V and -15V. The +15V external power supply is connected to the +VS port of the effective chip through a parallel capacitor C7, and the -15V external power supply is connected to the -VS port of the effective chip through a parallel capacitor C8. A capacitor C5 is connected in parallel on the side of the fixed resistor R11, and a capacitor C6 is connected in parallel between capacitor C5 and the fixed resistor R11. The capacitor C6 is connected in parallel to the OUT port of the effective chip, and the effective chip outputs an information signal to the outside through the OUT port. The effective chip is model AD637.
[0025] This invention utilizes the effective chip and the fixed resistors R11, R12, and R13 to stabilize the input power, voltage, and current signals, resulting in more accurate data obtained after processing by the RMS circuit 2. The AD637 effective chip, with a nonlinearity error of less than or equal to 0.02% at an input voltage of 0-2V, further optimizes the accuracy of the RMS circuit 2 and generates an information signal that is sent to the processing module 4. The processing module 4 analyzes the information signal using its internally designed software and ultimately obtains the measured voltage, current, and power data. Through the coordination of the conditioning circuit and the RMS circuit, the effective value of the AC signal is converted into a fixed electrical signal after the conditioning circuit obtains the circuit measurement data. This avoids large system errors caused by fluctuating electrical signals, increases the accuracy of the tester, and improves the user experience and work efficiency.
[0026] The above embodiments provide a detailed description of the present invention. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.
Claims
1. A high-precision multi-functional circuit tester, comprising a processing module (4), characterized in that, The processing module (4) is externally connected to a conditioning circuit (1), an effective value circuit (2), and an analog-to-digital conversion circuit (3); The conditioning circuit (1) includes a voltage conditioning circuit (11) for converting a voltage signal into an input voltage, and a current conditioning circuit (12) for amplifying and filtering a current signal and converting it into an input current. The voltage conditioning circuit (11) includes a fixed resistor R1 and a feedback device OP1 connected in series. The feedback device OP1 is connected in parallel with a capacitor C1. The feedback device OP1 is also connected in parallel with fixed resistors R2 and R3. A diode D1 is connected in parallel between the fixed resistors R2 and R3. An adjustment switch K1 is connected between the fixed resistors R1 and the diode D1.
2. The circuit tester according to claim 1, characterized in that, The current conditioning circuit (12) includes a bipolar transformer with series-connected fixed resistors R4 and R5 connected in parallel. A control switch K2 is connected in parallel between the fixed resistors R4 and R5. The control switch K2 is connected in parallel with the bipolar transformer. An amplifier OP2 is also connected in series with the bipolar transformer. One side of the fixed resistors R4 and R5 connected in parallel with the bipolar transformer is connected to the positive terminal of the amplifier OP2, and the other side is connected to the negative terminal of the amplifier OP2. The amplifier OP2 outputs the input current, and a capacitor C2 is connected in parallel with the output terminal of the amplifier OP2.
3. The circuit tester according to claim 1, characterized in that, The conditioning circuit (1) also includes a power circuit (13), which includes an input voltage and an input current as input terminals. The input terminal is connected to a double-pole double-throw switch K3. The double-pole double-throw switch K3 is connected in series with fixed resistors R6 and R7 and a control rheostat R8. The control rheostat R8 and the fixed resistor R7 are connected in parallel to the input terminal of the judgment device OP3. The positive terminal of the judgment device OP3 is connected to a 15V voltage and a capacitor C3 in parallel. The negative terminal of the judgment device OP3 is connected in parallel with a fixed resistor R9 and grounded. The output terminal of the judgment device OP3 is connected in parallel with a fixed resistor R10 and outputs the input power.
4. The circuit tester according to claim 1, characterized in that, The effective value circuit (2) includes an effective chip for receiving input power, input voltage and input current. The input power is connected to the B_I port of the effective chip through a fixed resistor R11. The input voltage is connected to the B_O port of the effective chip through a fixed resistor R12. The input current is connected to the VIN port of the effective chip through a fixed resistor R13. The effective value circuit (2) also includes external power supplies of +15V and -15V. The +15V external power supply is connected to the +VS port of the effective chip through a parallel capacitor C7. The -15V external power supply is connected to the -VS port of the effective chip through a parallel capacitor C8. A capacitor C5 is connected in parallel on the side of the fixed resistor R11. A capacitor C6 is connected in parallel between the capacitor C5 and the fixed resistor R11. The capacitor C6 is connected in parallel to the OUT port of the effective chip. The effective chip outputs information signals to the outside through the OUT port.
5. The circuit tester according to claim 1, characterized in that, The analog-to-digital converter circuit (3) is used to receive information signals, convert the information signals into digital signals, and transmit them to the processing module (4).
6. The circuit tester according to claim 4, characterized in that, The analog-to-digital converter circuit (3) is model ADS1224, the processing module (4) is model STC89C58RD+, and the active chip is model AD637.