Anti-vibration performance detection device of semiconductor heat exchanger

Abstract

The utility model discloses an anti-vibration performance detection device of a semiconductor heat exchanger, which comprises a support frame (1), the top of the support frame (1) is provided with a right stand column (2) and a left stand column (17), the right stand column (2) is connected with the right end of a vibration table (23) through a right rubber spring (3), and the left stand column (17) is connected with the left end of the vibration table (23) through a left rubber spring (16). A heat exchanger body (11) is placed on the upper plane of the vibration table (23), the bottom of the vibration table (23) is connected with a first suspension plate (4) and a second suspension plate (18), the first suspension plate (4) is provided with a first vibration motor (6), and the second suspension plate (18) is provided with a second vibration motor (20). And stable operation of the semiconductor heat exchanger in a vibration environment is ensured.

Description

TECHNICAL FIELD

[0001] The utility model belongs to semiconductor heat exchanger detection technical field relates to a kind of anti-vibration performance detection devices of semiconductor heat exchanger. BACKGROUND

[0002] Anti-vibration performance is mainly related to the design, manufacture, use process of various equipment, including but not limited to mechanical, electronic, electrical, aerospace, transportation and other fields, and anti-vibration performance provides guidance for the design and manufacture of equipment, ensures the stability of equipment, so that it does not fail due to vibration during transportation or use, and improves the service life of equipment.

[0003] At present, semiconductor heat exchanger can be affected by various vibrations during transportation and use, which can cause problems such as loosening of parts and falling of welding points, and thus affect the performance and life of the equipment. UTILITY MODEL CONTENT

[0004] To solve the above problems existing in the prior art, the present application provides an anti-vibration performance detection device for a semiconductor heat exchanger.

[0005] The technical scheme of the utility model is as follows:

[0006] An anti-vibration performance detection device for a semiconductor heat exchanger includes a support frame, a right vertical column and a left vertical column are provided on the top of the support frame, the right vertical column is connected to the right end of a vibration table through a right rubber spring, the left vertical column is connected to the left end of the vibration table through a left rubber spring, the upper surface of the vibration table is provided with a heat exchanger body, the bottom of the vibration table is connected to a first suspension plate and a second suspension plate, the first suspension plate is provided with a first vibration motor, and the second suspension plate is provided with a second vibration motor.

[0007] As a preferred embodiment of the utility model: the top of the vibration table is provided with a positioning horizontal plate one and a positioning horizontal plate two, the positioning horizontal plate one is connected to a positioning vertical plate one, and the positioning horizontal plate two is connected to a positioning vertical plate two.

[0008] As a preferred embodiment of the utility model: the positioning vertical plate one is provided with a positioning screw one and a locking nut one, and the positioning vertical plate two is provided with a positioning screw two and a locking nut two.

[0009] As a preferred embodiment of the utility model: the specifications of the first vibration motor and the second vibration motor are the same.

[0010] As a preferred embodiment of the utility model: an outer hexagonal bolt one is connected between the first suspension plate and the first vibration motor, and an outer hexagonal bolt two is connected between the second suspension plate and the second vibration motor.

[0011] As a preferred embodiment of the utility model: right stand and left stand between being equipped with intermediate stand, intermediate stand is connected vibration table through intermediate rubber spring.

[0012] The utility model discloses the beneficial effects are:

[0013] The utility model discloses a kind of anti-vibration performance detection devices of semiconductor heat exchanger, vibration table can simulate vibration environment in transportation and use process, response data under different vibration frequency and amplitude can be analyzed, to find out weak link on structure, and carry out targeted improvement, evaluate its stability and reliability under different vibration conditions, vibration test can expose potential defect of semiconductor heat exchanger in structural design, material selection, assembly process, potential problems can be found and solved before being put into market, take measures to reduce vibration, to improve the anti-vibration capacity of semiconductor heat exchanger, ensure that semiconductor heat exchanger can stably operate under vibration environment, avoid the failure or performance decline caused by vibration, convenient and reliable. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 It is the structural schematic diagram of the utility model.

[0015] In the drawing: 1-support frame;2-right stand;3-right rubber spring;4-first suspension plate;5-outer hexagonal bolt one;6-first vibration motor;7-positioning cross plate one;8-positioning vertical plate one;9-positioning screw one;10-locking nut one;11-heat exchanger body;12-locking nut two;13-positioning screw two;14-positioning vertical plate two;15-positioning cross plate two;16-left rubber spring;17-left stand;18-second suspension plate;19-outer hexagonal bolt two;20-second vibration motor;21-intermediate stand;22-intermediate rubber spring;23-vibration table. DETAILED DESCRIPTION

[0016] The utility model is specifically described below in connection with drawing and embodiment. Obviously, the described embodiment is only a part of embodiment of the utility model, not all embodiment. Based on the embodiment in the utility model, all other embodiments obtained by ordinary skilled in the art without making creative labor belong to the range of protection of the utility model.

[0017] As Figure 1As shown, a kind of anti-vibration performance detection device of semiconductor heat exchanger, including support frame 1, the top of support frame 1 is provided with right vertical column 2 and left vertical column 17, right vertical column 2 is connected with the right end of vibration table 23 by right rubber spring 3, left vertical column 17 is connected with the left end of vibration table 23 by left rubber spring 16, the upper plane of vibration table 23 is placed with heat exchanger body 11, the bottom of vibration table 23 is connected with first suspension plate 4 and second suspension plate 18, first suspension plate 4 is installed with first vibration motor 6, second suspension plate 18 is installed with second vibration motor 20.

[0018] The top of vibration table 23 is provided with positioning horizontal plate one 7 and positioning horizontal plate two 15, positioning horizontal plate one 7 is connected with positioning vertical plate one 8, and positioning horizontal plate two 15 is connected with positioning vertical plate two 14; positioning vertical plate one 8 is equipped with positioning screw one 9 and locking nut one 10, and positioning vertical plate two 14 is equipped with positioning screw two 13 and locking nut two 12; the specification size of first vibration motor 6 and second vibration motor 20 is same, and universality is increased; first suspension plate 4 and first vibration motor 6 are connected with outer hexagonal bolt one 5, and second suspension plate 18 and second vibration motor 20 are connected with outer hexagonal bolt two 19, which is convenient to disassemble and assemble; intermediate vertical column 21 is arranged between right vertical column 2 and left vertical column 17, and intermediate vertical column 21 is connected with vibration table 23 by intermediate rubber spring 22.

[0019] When testing, the test environment should be quiet, dust-free and interference-free, the semiconductor heat exchanger is installed on the vibration table, and the relevant test equipment and data acquisition instrument are connected; according to the test requirements and standards, the vibration frequency, amplitude and test time are set; vibration test is carried out according to the set parameters, and the performance and state of the semiconductor heat exchanger are monitored; the test results are analyzed: the test data are processed and analyzed to determine whether the performance of the semiconductor heat exchanger in the vibration environment meets the requirements; the vibration performance of the semiconductor heat exchanger is comprehensively evaluated to ensure its stability and reliability in the vibration environment.

[0020] In summary, the anti-vibration performance detection device of the semiconductor heat exchanger can simulate the vibration environment in the transportation and use process, analyze the response data under different vibration frequencies and amplitudes, find out the weak links in the structure, and make targeted improvements to evaluate the stability and reliability under different vibration conditions. Vibration test can expose potential defects in structure design, material selection and assembly process of semiconductor heat exchanger, and potential problems can be found and solved before market, and measures can be taken to reduce vibration, so as to improve the anti-vibration ability of semiconductor heat exchanger, ensure the stable operation of semiconductor heat exchanger in vibration environment, and avoid failure or performance decline caused by vibration.

[0021] Although the embodiments of the present application have been disclosed as above, it is not limited to the application listed in the specification and the embodiments, and can be applied to various fields suitable for the present application. For those skilled in the art, various changes, modifications, replacements and modifications can be made to the embodiments without departing from the principles and spirits of the present application, and therefore the present application is not limited to specific details under the general concept defined by the claims and the equivalent range.

Claims

1. A device for testing the vibration resistance of a semiconductor heat exchanger, characterized in that: The system includes a support frame (1), with a right column (2) and a left column (17) at the top. The right column (2) is connected to the right end of the vibration table (23) via a right rubber spring (3), and the left column (17) is connected to the left end of the vibration table (23) via a left rubber spring (16). A heat exchanger body (11) is placed on the upper surface of the vibration table (23), and a first suspension plate (4) and a second suspension plate (18) are connected to the bottom of the vibration table (23). A first vibration motor (6) is installed on the first suspension plate (4), and a second vibration motor (20) is installed on the second suspension plate (18).

2. The vibration resistance testing device for semiconductor heat exchangers according to claim 1, characterized in that: The top of the vibration table (23) is provided with a positioning horizontal plate one (7) and a positioning horizontal plate two (15). The positioning horizontal plate one (7) is connected to the positioning vertical plate one (8), and the positioning horizontal plate two (15) is connected to the positioning vertical plate two (14).

3. The vibration resistance testing device for semiconductor heat exchangers according to claim 2, characterized in that: The first positioning vertical plate (8) is equipped with a first positioning screw (9) and a first locking nut (10), and the second positioning vertical plate (14) is equipped with a second positioning screw (13) and a second locking nut (12).

4. The vibration resistance testing device for semiconductor heat exchangers according to claim 1, characterized in that: The first vibration motor (6) and the second vibration motor (20) have the same specifications and dimensions.

5. The vibration resistance testing device for semiconductor heat exchangers according to claim 1, characterized in that: An external hex bolt 1 (5) is connected between the first suspension plate (4) and the first vibration motor (6), and an external hex bolt 2 (19) is connected between the second suspension plate (18) and the second vibration motor (20).

6. The vibration resistance testing device for a semiconductor heat exchanger according to any one of claims 1-5, characterized in that: An intermediate column (21) is provided between the right column (2) and the left column (17), and the intermediate column (21) is connected to the vibration table (23) through an intermediate rubber spring (22).

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