Integrated circuit testing device

Abstract

The utility model relates to the field of integrated circuit testing, in particular to an integrated circuit testing device which comprises an integrated circuit device body, a testing groove is formed in one side of the top of the integrated circuit device body, and guide rails are symmetrically installed on the top of the integrated circuit device body and located on the two sides of the testing groove. A dustproof cover body is movably arranged outside the test slot at the top end of the integrated circuit device body; according to the utility model, the dustproof cover body movably covers the outside of the test groove, when the test groove is not used, dustproof treatment is carried out on the test groove, and when the integrated circuit device body is used, the dustproof cover body plays a role in environment isolation, prevents external dust, impurities and the like from entering a test area, ensures the cleanliness of a test environment, and improves the test efficiency. Meanwhile, heat generated in the working process of the integrated circuit device body is discharged through the heat dissipation through holes and the filter screen plate, and the temperature in the dustproof cover body is prevented from being too high.

Description

TECHNICAL FIELD

[0001] The utility model relates to integrated circuit test technical field especially relates to a kind of integrated circuit testing device. BACKGROUND

[0002] Integrated circuit tester is used to test integrated circuit logic function, DC parameter and AC parameter High-tech testing equipment of high technology concentration, integrated circuit tester is the special instrument equipment to integrated circuit testing, is one of the key means to guarantee integrated circuit performance, quality.

[0003] The existing integrated circuit testing device is mostly not provided with protection at test groove, the surface of test groove is easy to attach dust when the integrated circuit testing device is not used, and part of dust can enter test groove and attach to the surface or inside of integrated circuit when the integrated circuit testing device is used, which can easily affect the accuracy and reliability of test. UTILITY MODEL CONTENT

[0004] The utility model aims at solving the shortcomings in prior art and provides an integrated circuit testing device.

[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme:

[0006] An integrated circuit testing device, comprising an integrated circuit device body, a test groove is provided on one side of the top of the integrated circuit device body, guide rails are symmetrically installed on both sides of the top of the integrated circuit device body outside the test groove, and a dust cover body is movably arranged on the outside of the test groove at the top of the integrated circuit device body.

[0007] A limiting clamping groove is formed on one side of the dust cover body, a transparent dustproof plate is clamped in the limiting clamping groove, a through hole is formed in the dust cover body below the limiting clamping groove, a clamping groove is formed in the middle of the bottom end of the dust cover body, a filter screen plate is clamped in the clamping groove, and a plurality of heat dissipation through holes are formed at equal distances on one side of the through hole in the dust cover body.

[0008] In addition, preferably, a through hole is formed in the middle of the top of the dust cover body, and the area of the through hole is smaller than the area of the transparent dustproof plate.

[0009] In addition, preferably, a limiting seat is installed on one side of the top of the integrated circuit device body between the two guide rails, and a magnetic attraction groove is formed in the middle of the side of the limiting seat close to the test groove.

[0010] In addition, preferably, a magnetic attraction block is installed on the side of the dust cover body away from the filter screen plate at the magnetic attraction groove, and the magnetic attraction block is magnetically connected with the magnetic attraction groove.

[0011] In addition, preferably, the bottom of the dust cover is provided with a limiting sliding slot at both sides of the guide rail, and the top of the dust cover is provided with a through hole at one side of the clamping groove, and the area of the through hole is larger than that of the clamping groove.

[0012] In addition, preferably, the top of the transparent dustproof plate is provided with a limiting groove at the through hole, and the area of the limiting groove is larger than that of the through hole.

[0013] The utility model discloses the beneficial effects are:

[0014] In the utility model, when the test groove does not use, dustproof treatment is carried out to it, when integrated circuit device body uses, the dust cover plays the role of environmental isolation, prevents the dust, impurity etc. of outside from entering the test area, guarantees the cleanliness of test environment, thereby ensures the accuracy and reliability of test, and the heat generated in the working process of integrated circuit device body is discharged through the heat dissipation through -hole and filter screen, prevents the temperature in the dust cover from being too high. BRIEF DESCRIPTION OF DRAWINGS

[0015] Fig. 1 The utility model provides a kind of integrated circuit test device's structural schematic diagram;

[0016] Fig. 2 It is the structural schematic diagram of integrated circuit test device body, dust cover split;

[0017] Fig. 3 It is the structural schematic diagram of dust cover section.

[0018] In the drawing: 1, integrated circuit test device body;2, test groove;3, dust cover;31, limiting slot;32, clamping groove;33, heat dissipation through -hole;34, magnetic attraction piece;4, transparent dustproof plate;5, limiting seat;51, magnetic attraction slot;6, filter screen. DETAILED DESCRIPTION

[0019] The technical scheme in the embodiments of the utility model will be described clearly and completely in combination with the drawings in the embodiments of the utility model, and obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments.

[0020] Refer to Figs. 1-3The utility model provides an integrated circuit testing device, including integrated circuit device body 1, the one side of integrated circuit device body 1 top is provided with test slot 2, the both sides of integrated circuit device body 1 top are installed guide rail in test slot 2, and the top of integrated circuit device body 1 is movably provided with dust cover body 3 outside test slot 2, wherein the specific structure of integrated circuit device body 1 and test slot 2 and its working mode are the prior art disclosed on the market, and do not belong to the main technical problems required to be solved in the utility model, so the utility model does not add more.

[0021] And, the dust cover body 3 one side is provided with a limiting slot 31, the limiting slot 31 is provided with a transparent dustproof plate 4, the dust cover body 3 is provided with a through hole below the limiting slot 31, the dust cover body 3 is provided with a card recess 32 in the middle of the limiting slot 31 bottom, the card recess 32 is provided with a filter screen plate 6, and the dust cover body 3 is provided with a plurality of heat dissipation through holes 33 on one side of the through hole.

[0022] And, the dust cover body 3 top is provided with a through hole, and the area of the through hole is less than the area of the transparent dustproof plate 4.

[0023] Meanwhile, the integrated circuit device body 1 top is provided with a limiting seat 5 on one side between the two guide rails, and the limiting seat 5 is provided with a magnetic slot 51 in the middle of the side close to the test slot 2.

[0024] Meanwhile, the dust cover body 3 is provided with a magnetic block 34 on the side away from the filter screen plate 6 at the magnetic slot 51, the magnetic block 34 is magnetically connected with the magnetic slot 51, and the dust cover body 3 is provided with a sliding slot through hole below the magnetic block 34 on one side, and the cross-sectional area of the sliding slot through hole is greater than the cross-sectional area of the test slot 2.

[0025] Further, the dust cover body 3 bottom is provided with a limiting sliding slot on both sides at the guide rail, and the dust cover body 3 top is provided with a through hole on one side at the card recess 32, and the area of the through hole is greater than the area of the card recess 32.

[0026] Further, the dust cover body 3 top is provided with a limiting recess at the through hole, and the area of the limiting recess is greater than the area of the through hole, the dust on the dust cover body 3 top at the through hole is collected by the limiting recess, and the user can clean it later, and the dust will not fall into the dust cover body 3 when the transparent dustproof plate 4 is taken out.

[0027] In this embodiment, the dust cover 3 is movably covered to the outside of the test slot 2 through the guide rail, and the side with the magnetic block 34 faces the test slot 2 and slides, and after the test slot 2 passes through the through hole and is located in the dust cover 3, the magnetic block 34 is clamped into the magnetic groove 51 of the limiting seat 5, and the magnetic block 34 and the magnetic groove 51 are magnetically adsorbed and connected, so that the installation of the dust cover 3 is completed,

[0028] When the test slot 2 is not used, dustproof treatment is performed, so that external dust, impurities and the like are prevented from entering the test area, and the cleanliness of the test environment is ensured.

[0029] Meanwhile, when the integrated circuit device body 1 is used, the dust cover 3 plays a role of environmental isolation, so that external dust, impurities and the like are prevented from entering the test area, the cleanliness of the test environment is ensured, the accuracy and reliability of the test are ensured, and the heat generated during the operation of the integrated circuit device body 1 is discharged through the heat dissipation through hole 33 and the filter screen plate 6, so that the temperature inside the dust cover 3 is prevented from being too high.

[0030] In addition, the filter screen plate 6 is detachable, can be taken out and cleaned after being used for a period of time, dust in the external air is filtered through the filter screen plate 6, the dust is prevented from entering the dust cover 3, external dust, impurities and the like are prevented from entering the test area, and the cleanliness of the test environment is ensured.

[0031] When the integrated circuit needs to be placed, the transparent dustproof plate 4 is taken out, the integrated circuit is placed in the test slot 2 through the through hole, after the placement is completed, the transparent dustproof plate 4 is clamped with the dust cover 3, and then the integrated circuit test device body 1 can continue the subsequent operation.

[0032] In the utility model, the dust cover 3 is movably covered to the outside of the test slot 2, when the test slot 2 is not used, dustproof treatment is performed, and when the integrated circuit device body 1 is used, the dust cover 3 plays a role of environmental isolation, so that external dust, impurities and the like are prevented from entering the test area, the cleanliness of the test environment is ensured, the accuracy and reliability of the test are ensured, the heat generated during the operation of the integrated circuit device body 1 is discharged through the heat dissipation through hole 33 and the filter screen plate 6, and the temperature inside the dust cover 3 is prevented from being too high.

[0033] The above is only a preferred specific embodiment of the utility model, but the protection scope of the utility model is not limited to this, any skilled person in the art can make equivalent replacement or change according to the technical scheme and the utility model concept of the utility model within the technical range disclosed by the utility model, which should be covered in the protection scope of the utility model.

Claims

1. An integrated circuit testing device comprising an integrated circuit device body (1), characterized in that, The side of the integrated circuit device body (1) top is provided with test slot (2), integrated circuit device body (1) top is located in the two sides of test slot (2) symmetry installation guide rail, and integrated circuit device body (1) top end is located outside the test slot (2) activity setting dust cover (3) is provided with; The side of the dust cover (3) is provided with a limiting clamping groove (31), the limiting clamping groove (31) is clamped with a transparent dustproof plate (4), the dust cover (3) is provided with a through hole below the limiting clamping groove (31), the dust cover (3) is provided with a clamping groove (32) in the middle of the bottom end of the limiting clamping groove (31), the clamping groove (32) is clamped with a filter screen plate (6), and a plurality of heat dissipation through holes (33) are provided on one side of the through hole in the dust cover (3).

2. An integrated circuit testing apparatus according to claim 1, wherein The top of the dust cover (3) is provided with a through hole, and the area of the through hole is smaller than the area of the transparent dustproof plate (4).

3. An integrated circuit testing apparatus according to claim 1, wherein The side of the integrated circuit device body (1) top between the two guide rails is provided with a limiting seat (5), and the limiting seat (5) is provided with a magnetic attraction groove (51) in the middle of the side of the test slot (2).

4. The integrated circuit testing apparatus of claim 1, wherein The side of the dust cover (3) away from the filter screen plate (6) is provided with a magnetic attraction block (34) at the magnetic attraction groove (51), and the magnetic attraction block (34) is magnetically connected with the magnetic attraction groove (51).

5. The integrated circuit testing apparatus of claim 1, wherein The bottom of the dust cover (3) is provided with a limiting sliding groove at the guide rail, and the top of the dust cover (3) is provided with a through hole at the clamping groove (32), and the area of the through hole is larger than the area of the clamping groove (32).

6. The integrated circuit testing apparatus of claim 1, wherein The top of the transparent dustproof plate (4) is provided with a limiting groove at the through hole, and the area of the limiting groove is larger than the area of the through hole.

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