Wear resistance testing device for high-toughness leather boots

Abstract

The utility model relates to a wear resistance testing device for high-toughness leather boots, and relates to the technical field of detection equipment, the wear resistance testing device comprises a rack, a rotating disc is rotatably arranged on the rack, a wear resistance sample is placed on the rotating disc, a testing rod is vertically arranged on the rack in a sliding manner, and the testing rod rubs the wear resistance sample on the rotating disc; and a scrap removing mechanism for removing scraps generated by the wear-resistant sample is arranged on the rack. The chip removal pipe is rotated to the horizontal state, the chip removal pipe rotates to drive the suction nozzle to be located above the wear-resistant sample, then the vacuum pump is started to vacuumize the interior of the chip removal pipe, the chip removal pipe adsorbs chips generated when the wear-resistant sample is polished through the suction nozzle, and the chip collection assembly collects the chips adsorbed by the suction nozzle; therefore, the work of adsorbing and cleaning the chippings generated during the wear resistance test is completed, the probability that the chippings have adverse effects on the test work is reduced, and the cleanness and tidiness of the working environment are ensured.

Description

Technical Field

[0001] This application relates to the technical field of testing equipment, and in particular to an abrasion resistance testing device for high-toughness leather boots. Background Technology

[0002] Leather boots are a type of footwear that covers the foot and ankle, and sometimes even extends to the calf, and are known for their durability and protection. Therefore, the manufacturing process for leather boots requires high abrasion resistance of the materials, typically necessitating the use of abrasion testing machines to assess the wear resistance of the boot materials.

[0003] In related technologies, please refer to Chinese utility model patent with authorization announcement number CN215640684U, which discloses a wear resistance testing machine. The wear resistance testing machine includes a frame, a turntable, a clamping device and a testing device. The testing device can move freely in the vertical direction of the worktable and can move in the horizontal direction of the worktable. The testing device includes a mounting base, a testing rod, a sliding rod, weights and a buffer. The testing rod is perpendicular to the turntable and the testing head of the testing rod is used to abut against the test sample on the turntable.

[0004] However, during the actual operation of the aforementioned abrasion testing machine, a certain amount of debris will be generated on the surface of the test sample under the continuous friction of the test rod. Some of these debris will remain on the surface of the test sample, while the rest will be scattered in the working environment. The debris remaining on the surface of the test sample will have an adverse effect on the polishing effect of the test rod, while the debris scattered in the working environment will cause pollution to the working environment. Utility Model Content

[0005] In order to reduce the probability that debris generated during the abrasion resistance test will adversely affect the test results, this application provides an abrasion resistance testing device for high-toughness leather boots.

[0006] This application provides a wear resistance testing device for high-toughness leather boots, which adopts the following technical solution:

[0007] A high-toughness leather boot abrasion resistance testing device includes a frame, a turntable rotatably mounted on the frame, an abrasion resistance sample placed on the turntable, a test rod vertically sliding on the frame, the test rod rubbing the abrasion resistance sample on the turntable, and a chip removal mechanism provided on the frame, the chip removal mechanism comprising:

[0008] A chip removal tube, which is rotatably mounted on the frame;

[0009] A vacuum pump is installed on the chip removal tube, and the vacuum pump evacuates the inside of the chip removal tube.

[0010] A suction nozzle is disposed on the chip removal tube and communicates with the inside of the chip removal tube. When the chip removal tube is rotated to a horizontal position, the opening of the suction nozzle is located above the surface of the turntable.

[0011] A rotating assembly, which is mounted on the frame and is used to drive the chip removal tube to rotate;

[0012] A chip collection assembly is disposed on a chip removal pipe and is used to collect the chips adsorbed by the chip removal pipe.

[0013] By adopting the above technical solution, while the rotating turntable grinds the wear-resistant sample through the test rod, the chip removal tube is rotated to a horizontal position. The rotation of the chip removal tube causes the suction nozzle to be positioned above the wear-resistant sample. Then, the vacuum pump is started to evacuate the inside of the chip removal tube. The chip removal tube adsorbs the debris generated during the grinding of the wear-resistant sample through the suction nozzle. The chip collection assembly collects the debris adsorbed by the suction nozzle, thereby completing the adsorption and cleaning of debris generated during the wear-resistant test. This reduces the probability of debris adversely affecting the test and ensures a clean and tidy working environment.

[0014] Optionally, the rotating assembly includes:

[0015] A rotating shaft is rotatably mounted on the frame and connected to a chip removal pipe;

[0016] A rotating motor is mounted on a frame and its output shaft is connected to a rotating shaft.

[0017] By adopting the above technical solution, the rotating motor starts and drives the rotating shaft to rotate, and the rotating shaft drives the chip removal tube to rotate, thereby realizing the rotation of the chip removal tube by controlling the rotating motor.

[0018] Optionally, the chip collection assembly includes:

[0019] A filter plate, wherein a chip removal tube is provided inside the filter plate, and filter holes are provided on the filter plate for gas to pass through only;

[0020] The chip collection box is disposed on the outer wall of the chip removal tube. A through hole communicating with the inside of the chip removal tube is opened on the side wall of the chip collection box connected to the chip removal tube. The through hole is communicating with the surface of the filter plate.

[0021] A chip pusher plate, which is horizontally slidably disposed on the chip removal tube and in contact with the surface of the filter plate;

[0022] A driving component, which is disposed on the chip removal tube and is used to drive the chip pusher plate to move.

[0023] By adopting the above technical solution, after the suction nozzle sucks the debris into the chip removal tube, the filter plate filters the debris onto its surface. Then, the drive unit starts and drives the chip pusher plate to move. The movement of the chip pusher plate pushes the debris on the filter plate into the through hole and accumulates in the chip collection box, thereby completing the collection of debris and reducing the probability of debris clogging the filter plate.

[0024] Optionally, the driving element includes:

[0025] A drive screw is rotatably mounted on the chip removal tube and threadedly connected to the chip pusher plate.

[0026] A drive motor is mounted on the outer wall of the chip removal tube and its output shaft is connected to a drive screw.

[0027] By adopting the above technical solution, the drive motor starts and drives the drive screw to rotate, and the rotation of the drive screw drives the chip pusher plate to move, thereby realizing the movement of the chip pusher plate by controlling the drive motor.

[0028] Optionally, the frame is provided with an adjustment assembly for adjusting the height of the chip removal pipe, the adjustment assembly including:

[0029] An adjusting block is vertically slidably mounted on the frame, and the chip removal pipe, rotating shaft, and rotating motor are all mounted on the adjusting block;

[0030] An adjusting screw is rotatably mounted on the frame and is vertically positioned; the adjusting screw is threadedly connected to an adjusting block.

[0031] An adjusting motor is mounted on the frame and its output shaft is connected to an adjusting lead screw.

[0032] By adopting the above technical solution, the adjustment motor starts and drives the adjustment screw to rotate, the adjustment screw rotates and drives the adjustment block to move, and the adjustment block moves the chip removal tube up and down. Thus, by controlling the adjustment motor, the height of the chip removal tube can be adjusted, expanding the adaptability of the chip removal tube when facing wear-resistant samples of different thicknesses.

[0033] Optionally, an adjustment disk is rotatably mounted on the adjustment block, and the chip removal pipe, rotating shaft, and rotating motor are all mounted on the adjustment disk. A reversing motor is mounted on the adjustment block, and the output shaft of the reversing motor is connected to the adjustment disk.

[0034] By adopting the above technical solution, an adjustment disc is rotatably installed on the adjustment block. The adjustment motor starts and drives the adjustment disc to rotate, which in turn drives the chip removal tube to rotate. Thus, by controlling the adjustment motor, the position of the chip removal tube in the horizontal direction can be adjusted, thereby expanding the adsorption range of the chip removal tube for debris.

[0035] Optionally, a horizontal sliding hole is provided on the outer wall of the chip collection box, and a collection frame is slidably installed on the chip collection box. The collection frame is located in the sliding hole, and a handle is provided on the outer wall of the collection frame.

[0036] By adopting the above technical solution, a collection frame is slidably installed on the chip collection box. The collection frame collects the chips that enter the chip collection box. After the collection frame is full of chips, the chips can be dumped by removing the handle from the collection frame. This is convenient, quick, and efficient.

[0037] In summary, this application includes at least one of the following beneficial technical effects:

[0038] 1. By rotating the chip removal tube to a horizontal position, the rotation of the chip removal tube causes the suction nozzle to be positioned above the wear-resistant sample. Then, the vacuum pump is started to evacuate the inside of the chip removal tube. The chip removal tube adsorbs the chips generated during the grinding of the wear-resistant sample through the suction nozzle. The chip collection assembly collects the chips adsorbed by the suction nozzle, thereby completing the adsorption and cleaning of chips generated during the wear resistance test, reducing the probability of chips adversely affecting the test work, and ensuring a clean and tidy working environment.

[0039] 2. After the debris is sucked into the chip removal tube through the suction nozzle, the filter plate filters the debris onto its surface. Then, the drive unit starts and moves the chip pusher plate. The moving chip pusher plate pushes the debris on the filter plate into the through hole and accumulates in the chip collection box, thus completing the collection of debris and reducing the probability of debris clogging the filter plate.

[0040] 3. By sliding a collection frame onto the chip collection box, the collection frame collects the chips that enter the box. Once the collection frame is full, the chips can be emptied by removing the handle. This method is convenient, quick, and highly efficient. Attached Figure Description

[0041] Figure 1 This is a three-dimensional structural diagram of this application;

[0042] Figure 2 This is a structural schematic diagram of the chip removal mechanism and adjustment components in this application, in which the sidewalls of the chip removal tube and the chip collection box are shown in cross-section.

[0043] Reference numerals: 1. Frame; 11. Turntable; 12. Test rod; 13. Through hole; 14. Collection frame; 2. Chip removal mechanism; 21. Chip removal pipe; 22. Vacuum pump; 23. Suction nozzle; 24. Rotating assembly; 25. Chip collection assembly; 26. Rotating shaft; 27. Rotating motor; 3. Adjusting assembly; 31. Adjusting block; 32. Adjusting screw; 33. Adjusting motor; 34. Adjusting disc; 35. Rotating motor; 41. Filter plate; 42. Chip collection box; 43. Chip pusher plate; 44. Driving component; 45. Driving screw; 46. Driving motor. Detailed Implementation

[0044] The following is in conjunction with the appendix Figure 1 - Appendix Figure 2 This application will be described in further detail.

[0045] This application discloses an abrasion resistance testing device for high-toughness leather boots.

[0046] Reference Figure 1 The abrasion resistance testing device for high-toughness leather boots includes a frame 1, on which a turntable 11 is rotatably mounted, and the abrasion resistance sample is placed on the turntable 11. A test rod 12 is vertically slidably mounted on the frame 1, and the test rod 12 rubs the abrasion resistance sample on the turntable 11. The frame 1 is equipped with a chip removal mechanism 2 for removing debris generated by the abrasion resistance sample.

[0047] Reference Figure 1 and Figure 2 The chip removal mechanism 2 includes a chip removal tube 21, a vacuum pump 22, a suction nozzle 23, a rotating assembly 24, and a chip collection assembly 25. The chip removal tube 21 is rotatably mounted on a frame 1 located on one side of the turntable 11. An adjustment assembly 3 is provided on the frame 1 for adjusting the height of the chip removal tube 21.

[0048] Reference Figure 1 and Figure 2 The adjusting assembly 3 includes an adjusting block 31, an adjusting screw 32, and an adjusting motor 33. The adjusting block 31 is vertically slidably mounted on the frame 1. The adjusting screw 32 is rotatably mounted on the frame 1 and is in a vertical position, and the adjusting screw 32 is threadedly connected to the adjusting block 31. The adjusting motor 33 is fixedly mounted on the frame 1, and its output shaft is connected to the adjusting screw 32.

[0049] Reference Figure 1 and Figure 2 An adjusting disc 34 is rotatably mounted on the upper surface of the adjusting block 31. A rotating motor 35 is fixedly mounted on the lower surface of the adjusting block 31, and the output shaft of the rotating motor 35 is vertically upward and fixedly connected to the center of the adjusting disc 34. The chip removal pipe 21 is rotatably mounted on the upper surface of the adjusting disc 34 via a rotating assembly 24.

[0050] Reference Figure 1 and Figure 2 The rotating assembly 24 includes a rotating shaft 26 and a rotating motor 27. The rotating shaft 26 is rotatably mounted on the upper surface of the adjusting disk 34. The chip removal tube 21 is fixedly mounted on the rotating shaft 26. The rotating motor 27 is fixedly mounted on the frame 1, and its output shaft is connected to the rotating shaft 26. The vacuum pump 22 is fixedly mounted on the chip removal tube 21, and the vacuum pump 22 evacuates the inside of the chip removal tube 21. The suction nozzle 23 is fixedly mounted on the end of the chip removal tube 21 away from the rotating shaft 26 and communicates with the inside of the chip removal tube 21. When the chip removal tube 21 is rotated to a horizontal position, the opening of the suction nozzle 23 is located above the surface of the turntable 11.

[0051] Reference Figure 1 and Figure 2While the rotating turntable 11 grinds the wear-resistant sample via the test rod 12, the rotating motor 27 starts, driving the rotating shaft 26 to rotate, which in turn drives the chip removal tube 21 to rotate. When the chip removal tube 21 rotates to a horizontal position, the suction nozzle 23 on the chip removal tube 21 is positioned above the wear-resistant sample. Then, the vacuum pump 22 starts to evacuate the inside of the chip removal tube 21. The chip removal tube 21, through the suction nozzle 23, adsorbs the debris generated during the grinding of the wear-resistant sample, thus completing the adsorption and cleaning of debris generated during the wear-resistant test. This reduces the probability of debris adversely affecting the test and ensures a clean and tidy working environment.

[0052] Reference Figure 2 The adjustment motor 33 starts and drives the adjustment screw 32 to rotate. The rotation of the adjustment screw 32 drives the adjustment block 31 to move. The movement of the adjustment block 31 drives the chip removal tube 21 to move up and down. Thus, by controlling the adjustment motor 33, the height of the chip removal tube 21 is adjusted, expanding the adaptability of the chip removal tube 21 to wear-resistant samples of different thicknesses.

[0053] Reference Figure 2 When the rotating motor 35 starts, it drives the adjusting plate 34 to rotate. The rotation of the adjusting plate 34 drives the chip removal tube 21 to rotate. Thus, by controlling the rotating motor 35, the position of the chip removal tube 21 in the horizontal direction can be adjusted, thereby expanding the adsorption range of the chip removal tube 21 for debris.

[0054] Reference Figure 1 and Figure 2 The chip collection assembly 25 is disposed on the chip removal pipe 21 and is used to collect the debris adsorbed by the chip removal pipe 21. The chip collection assembly 25 includes a filter plate 41, a chip collection box 42, a chip pusher plate 43, and a drive component 44. The filter plate 41 is fixedly installed on the inner wall of the chip removal pipe 21, and the filter plate 41 has filter holes for gas to pass through only. The chip collection box 42 is fixedly installed on the outer wall of the chip removal pipe 21. The side wall of the chip collection box 42 connected to the chip removal pipe 21 has a through hole 13 communicating with the inside of the chip removal pipe 21. The through hole 13 communicates with the surface of the filter plate 41.

[0055] Reference Figure 2 A horizontal sliding hole is provided on the side wall of the chip collection box 42 away from the chip removal pipe 21. A collection frame 14 is slidably installed on the chip collection box 42. The collection frame 14 is located in the sliding hole. A handle is fixedly installed on the outer side wall of the collection frame 14.

[0056] Reference Figure 1 and Figure 2The chip-pushing plate 43 is horizontally slidably mounted on the chip removal tube 21 via a drive component 44 and abuts against the surface of the filter plate 41. The drive component 44 includes a drive screw 45 and a drive motor 46. The drive screw is rotatably mounted on the inner top wall of the chip removal tube 21 and threadedly connected to the chip-pushing plate 43. The drive motor 46 is fixedly mounted on the outer side wall of the chip removal tube 21, and its output shaft is connected to the drive screw 45.

[0057] Reference Figure 1 and Figure 2 After the suction nozzle 23 draws debris into the debris removal tube 21, the filter plate 41 filters the debris onto its surface. Then, the drive motor 46 starts, driving the drive screw 45 to rotate. The rotation of the drive screw 45 moves the chip pusher 43, which pushes the debris on the filter plate 41 into the through hole 13 and accumulates in the collection frame 14 of the debris collection box 42, thus completing the debris collection and reducing the probability of debris clogging the filter plate 41. When the collection frame 14 is full of debris, the debris can be dumped by removing the handle from the collection frame 14, which is convenient, quick, and efficient.

[0058] The working principle of this application embodiment is as follows:

[0059] While the rotating turntable 11 grinds the wear-resistant sample via the test rod 12, the rotating motor 27 starts, driving the rotating shaft 26 to rotate, which in turn drives the chip removal tube 21 to rotate. When the chip removal tube 21 rotates to a horizontal position, the suction nozzle 23 on the chip removal tube 21 is positioned above the wear-resistant sample. Then, the vacuum pump 22 starts to evacuate the inside of the chip removal tube 21. The chip removal tube 21, through the suction nozzle 23, adsorbs the debris generated during the grinding of the wear-resistant sample, thus completing the adsorption and cleaning of debris generated during the wear-resistant test. This reduces the probability of debris adversely affecting the test and ensures a clean and tidy working environment.

[0060] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A test device for the abrasion resistance of high-toughness leather boots, characterized in that: The device includes a frame (1), on which a turntable (11) is rotatably mounted. A wear-resistant sample is placed on the turntable (11). A test rod (12) is vertically slidably mounted on the frame (1) and rubs the wear-resistant sample on the turntable (11). The frame (1) is equipped with a chip removal mechanism (2) for removing debris generated by the wear-resistant sample. The chip removal mechanism (2) includes: Chip removal tube (21), which is rotatably mounted on the frame (1); A vacuum pump (22) is installed on the chip removal tube (21) and the vacuum pump (22) evacuates the inside of the chip removal tube (21); The suction nozzle (23) is disposed on the chip removal tube (21) and communicates with the inside of the chip removal tube (21). When the chip removal tube (21) is rotated to a horizontal state, the opening of the suction nozzle (23) is located above the surface of the turntable (11). Rotating assembly (24), which is mounted on the frame (1) and is used to drive the chip removal tube (21) to rotate; A chip collection assembly (25) is disposed on a chip removal pipe (21) and is used to collect the chips adsorbed by the chip removal pipe (21).

2. The abrasion resistance testing device for high-toughness leather boots according to claim 1, characterized in that: The rotating assembly (24) includes: Rotary shaft (26), which is rotatably mounted on the frame (1) and connected to the chip removal pipe (21); A rotating motor (27) is mounted on a frame (1) and its output shaft is connected to a rotating shaft (26).

3. The abrasion resistance testing device for high-toughness leather boots according to claim 1, characterized in that: The chip collection assembly (25) includes: A filter plate (41) is provided with a chip removal tube (21) inside the filter plate (41), and filter holes for gas to pass through are provided on the filter plate (41). The chip collection box (42) is located on the outer wall of the chip removal tube (21). A through hole (13) communicating with the inside of the chip removal tube (21) is provided on the side wall of the chip collection box (42) connected to the chip removal tube (21). The through hole (13) is communicating with the surface of the filter plate (41). A chip pusher plate (43) is horizontally slidably disposed on the chip removal tube (21) and in contact with the surface of the filter plate (41); A drive unit (44) is disposed on the chip removal tube (21) and is used to drive the chip pusher plate (43) to move.

4. The abrasion resistance testing device for high-toughness leather boots according to claim 3, characterized in that: The driving element (44) includes: A drive screw (45) is rotatably mounted on the chip removal tube (21) and threadedly connected to the chip pusher plate (43); A drive motor (46) is mounted on the outer wall of the chip removal tube (21) and its output shaft is connected to the drive screw (45).

5. The abrasion resistance testing device for high-toughness leather boots according to claim 2, characterized in that: The frame (1) is provided with an adjustment assembly (3) for adjusting the height of the chip removal tube (21), the adjustment assembly (3) comprising: Adjusting block (31), which is vertically slidably mounted on frame (1), and chip removal pipe (21), rotating shaft (26) and rotating motor (27) are all mounted on adjusting block (31); Adjusting screw (32), the adjusting screw (32) is rotatably mounted on the frame (1) and is set in a vertical position, the adjusting screw (32) is threadedly connected to the adjusting block (31); An adjusting motor (33) is mounted on the frame (1) and its output shaft is connected to the adjusting screw (32).

6. The abrasion resistance testing device for high-toughness leather boots according to claim 5, characterized in that: An adjustment disk (34) is rotatably mounted on the adjustment block (31). The chip removal pipe (21), the rotating shaft (26), and the rotating motor (27) are all mounted on the adjustment disk (34). A reversing motor (35) is mounted on the adjustment block (31), and the output shaft of the reversing motor (35) is connected to the adjustment disk (34).

7. The abrasion resistance testing device for high-toughness leather boots according to claim 3, characterized in that: A horizontal sliding hole is provided on the outer wall of the chip collection box (42), and a collection frame (14) is slidably installed on the chip collection box (42). The collection frame (14) is located in the sliding hole, and a handle is provided on the outer wall of the collection frame (14).

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