High-precision polarization degree tester
By employing a rotating waveplate assembly and photoelectric switch detection in the polarization degree tester, combined with a collimator and limiting structure, the problem of insufficient measurement accuracy in traditional polarization degree testers is solved, achieving high-precision polarization degree measurement and system stability.
Patent Information
- Application Number
- CN202423231705.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-25
- Publication Date
- 2025-11-14
- Estimated Expiration
- 2034-12-25
AI Technical Summary
Existing polarization degree testers generally have a measurement accuracy of over 1%, which is insufficient to meet the requirements for high-precision polarization degree measurement.
The system employs a first and second waveplate assembly with rotatable mounting, combined with photoelectric switch detection, to ensure independent rotation and precise angle control of the waveplates. The beam is converted into a parallel beam by a collimator, and the system stability is improved by a limiting structure.
It achieves higher precision polarization degree measurement, improves the accuracy and reliability of measurement results, and enhances the structural stability and practicality of the tester.
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Figure CN223551177U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the technical field of optical testing equipment, and in particular to a high-precision polarization degree tester. Background Technology
[0002] High-precision polarization meters are widely used in optics, communications, and other fields to measure the polarization characteristics of light sources. With technological advancements, polarization meters are increasingly used in scientific research and industrial production, particularly in industries such as fiber optic communication, laser processing, and precision optical instrument manufacturing, where higher precision in polarization measurement is required. Traditional polarization measurement methods mainly include the Stokes vector method, the rotating waveplate method, and the fiber polarization scrambling method. These methods are widely used in various scenarios, driving the progress and development of related technologies.
[0003] However, existing polarization degree testers still have some problems in practical applications. In particular, the measurement accuracy of traditional Stokes vector method, rotating waveplate method and fiber polarization scrambling method is generally above 1%, and even in the best case, it can only reach 0.5%. Utility Model Content
[0004] In order to further improve the measurement accuracy of polarization degree, this application provides a high-precision polarization degree tester.
[0005] The high-precision polarization degree tester provided in this application adopts the following technical solution:
[0006] A high-precision polarization degree tester includes a base, on which a collimator, a first waveplate assembly, a second waveplate assembly, a polarizer assembly, and an optical power detector are sequentially arranged; the first waveplate assembly includes a first waveplate rotatably mounted, the second waveplate assembly includes a second waveplate rotatably mounted, and the polarizer assembly includes a polarizer fixedly mounted; the first waveplate, the second waveplate, the polarizer, and the detection end of the optical power detector are all located on the straight line of the output light of the collimator.
[0007] By adopting the above technical solution, the first and second waveplates have little impact on the optical power during independent rotation, thereby enabling high-precision measurement of the polarization degree of the light source and ensuring the accuracy and reliability of the measurement results.
[0008] Preferably, the first waveplate assembly includes a first mounting base mounted on the base and a first rotation drive mounted on the first mounting base, wherein the first waveplate is mounted at the output end of the first rotation drive; the first mounting base has a first opening, and the first waveplate is rotatably disposed within the first opening.
[0009] By adopting the above technical solution and setting a first rotation drive component, the independent rotation of the first wave plate can be achieved.
[0010] Preferably, the first mounting base is further provided with a slot, and the slot is connected to the first opening, and a first photoelectric switch is installed in the slot.
[0011] By adopting the above technical solution and setting a first photoelectric switch, the position and rotation angle of the first waveplate can be detected more accurately.
[0012] Preferably, the first waveplate assembly includes a second mounting base mounted on the base and a second rotation drive mounted on the second mounting base, the second waveplate being mounted at the output end of the second rotation drive; the second mounting base has a second opening, and the second waveplate is rotatably disposed within the second opening.
[0013] By adopting the above technical solution and setting a second rotation drive component, the independent rotation of the second wave plate can be achieved.
[0014] Preferably, the second mounting base is further provided with a slot, and the slot is connected to the second opening, and a second photoelectric switch is installed in the slot.
[0015] By adopting the above technical solution and setting a second photoelectric switch, the position and rotation angle of the second waveplate can be detected more accurately.
[0016] Preferably, the polarizer assembly further includes a third mounting base mounted on the base, and the polarizer is mounted on the third mounting base.
[0017] By adopting the above technical solution, the polarizer can be installed by setting a third mounting base.
[0018] Preferably, a limiting strip is provided on the base along the direction of the light output from the collimator, and the first mounting base, the second mounting base and the third mounting base are all provided with limiting grooves that are inserted and cooperate with the limiting strip.
[0019] By adopting the above technical solution, the precise alignment of the first mounting base, the second mounting base, and the third mounting device is ensured, thereby improving the structural stability and measurement accuracy of the entire tester.
[0020] Preferably, the first rotation drive member is detachably mounted on the first mounting base, and the second rotation drive member is detachably mounted on the second mounting base.
[0021] By adopting the above technical solutions, the daily maintenance and upgrading of the tester are facilitated, and the practicality and durability of the tester are improved.
[0022] In summary, this application includes at least one of the following beneficial technical effects:
[0023] 1. By using the first rotation drive and the second rotation drive in the first waveplate assembly and the second waveplate assembly, the independent rotation of the first waveplate and the second waveplate is realized, and the influence on the optical power during the rotation is minimal, effectively improving the accuracy of polarization degree measurement.
[0024] 2. The collimator converts the light beam emitted by the light source into a parallel beam, ensuring that the light propagates in the same direction as it passes through subsequent optical elements, thereby improving the accuracy of the measurement results.
[0025] 3. By detecting the rotation state of the first and second waveplates using photoelectric switches, precise control and monitoring of the waveplate rotation angle are achieved, further improving the reliability of the measurement. Attached Figure Description
[0026] Figure 1 This is a schematic diagram of the overall structure of an embodiment of this application;
[0027] Figure 2 This is a schematic diagram of the structure of the first waveplate assembly in the embodiments of this application;
[0028] Figure 3 This is a schematic diagram of the structure of the first waveplate assembly from another perspective in the embodiments of this application;
[0029] Figure 4 This is a schematic diagram of the structure of the second waveplate assembly in the embodiments of this application;
[0030] Figure 5 This is a schematic diagram of the structure of the polarizer assembly in the embodiments of this application;
[0031] Figure 6 This is an exploded structural diagram of an embodiment of this application.
[0032] Reference numerals: 1. Base; 11. Base plate; 12. First fixing plate; 13. Second fixing plate; 2. Collimator; 3. First waveplate assembly; 31. First waveplate; 32. First mounting base; 321. First mounting plate; 322. Second mounting plate; 323. First opening; 33. First rotation drive; 331. Mounting part; 34. First mounting groove; 35. First photoelectric switch; 4. Second waveplate assembly; 41. Second waveplate; 42. Second mounting base; 421. Second opening; 43. Second rotation drive; 44. Second photoelectric switch; 5. Polarizer assembly; 51. Polarizer; 52. Third mounting base; 521. Third opening; 6. Optical power detector; 7. Limiting groove; 8. Limiting strip. Detailed Implementation
[0033] The following is in conjunction with the appendix Figure 1-6 This application will be described in further detail.
[0034] This application discloses a high-precision polarization degree tester.
[0035] Reference Figure 1 A high-precision polarization degree tester includes a base 1. On the base 1, along the direction of light emitted from a light source, a collimator 2, a first waveplate assembly 3, a second waveplate assembly 4, a polarizer assembly 5, and an optical power detector 6 are sequentially arranged. The first waveplate assembly 3 includes a rotatably mounted first waveplate 31, the second waveplate assembly 4 includes a rotatably mounted second waveplate 41, and the polarizer assembly 5 includes a fixedly mounted polarizer 51. The light emitted from the light source passes sequentially through the collimator 2, the first waveplate 31, the second waveplate 41, and the polarizer 51 and is received by the optical power detector 6, thereby enabling the calculation of the polarization degree of the light source. Because the power changes of the first waveplate 31 and the second waveplate 41 during rotation are minimal, higher precision polarization degree measurement can be achieved.
[0036] Reference Figure 1 The base 1 includes a base plate 11 and a first fixing plate 12 and a second fixing plate 13 integrally formed on opposite sides of the base plate 11. The base plate 11 as a whole, the first fixing plate 12 and the second fixing plate 13 as a whole are all rectangular plates. The first fixing plate 12 and the second fixing plate 13 are respectively vertically installed on two sides along the length of the base plate 11, and the first fixing plate 12 and the second fixing plate 13 are both located on the same side of the base plate 11.
[0037] Reference Figure 1 The collimator 2 is cylindrical in shape and is fixed to the first mounting plate 321, with its axis aligned with the surface of the first mounting plate 321. The collimator 2 converts the light beam emitted by the light source into a parallel beam, ensuring that the beam's propagation direction remains consistent as it passes through subsequent optical elements, thus making the measurement results more accurate. The optical power detector 6 is fixedly mounted on the second mounting plate 322, with its detection end positioned close to the polarizer 51 to receive the light beam passing through the polarizer 51.
[0038] Reference Figure 1 , Figure 2 and Figure 3The first waveplate assembly 3 includes a first mounting base 32 and a first rotation drive 33 mounted on the first mounting base 32. The first waveplate 31 is mounted on the output end of the first rotation drive 33. The first mounting base 32 is generally L-shaped and includes an integrally formed first mounting plate 321 and a second mounting plate 322. The surface of the first mounting plate 321 is parallel to the surface of the base plate 11, and the first mounting plate 321 is mounted on the base plate 11 by bolts. The surface of the second mounting plate 322 is perpendicular to the surface of the base plate 11, and the second mounting plate 322 is located on the side of the first mounting plate 321 closer to the collimator 2.
[0039] The first rotation drive member 33 is cylindrical in shape, and its axis is parallel to the output light of the collimator 2. The second mounting plate 322 has a circular first opening 323 corresponding to the first wave plate 31. The output end of the first rotation drive member 33 is rotatably positioned within the first opening 323, and the circle of the first opening 323 is located on the rotation axis of the output end of the first rotation drive member 33. The first wave plate 31 is located on the axis of the first rotation drive member 33, thus enabling rotational adjustment of the first wave plate 31. Mounting portions 331 extend from opposite sides of the first rotation drive member 33 along the length of the base plate 11. The mounting portions 331 are detachably mounted on the first mounting base 32 using bolts and fasteners, achieving a stable connection between the first rotation drive member and the first mounting base 32.
[0040] Based on this, a first mounting groove 34 is formed on the top of the second mounting plate 322 away from the base plate 11. The first mounting groove 34 is connected to the first opening 323, and a first photoelectric switch 35 is fixedly installed in the mounting groove. The rotation center of the first wave plate 31 is located in the detection direction of the first photoelectric switch 35, so that the rotation state of the first wave plate 31 can be accurately detected, thereby realizing precise control and monitoring of the rotation angle of the first wave plate 31.
[0041] Reference Figure 4 The second waveplate assembly 4 and the first waveplate 31 have essentially the same structure, including a second mounting base 42, a second rotation drive 43, and a second photoelectric switch 44. The second waveplate 41 is located at the output end of the second rotation drive 43. A second opening 421 is provided on the second mounting base 42, and the second waveplate 41 is rotatably disposed within the second opening 421. The second mounting base 42 is located at the end of the first mounting base 32 away from the collimator 2, and the rotation centers of both the first waveplate 31 and the second waveplate 41 are located on the output light beam of the collimator 2.
[0042] By setting the first rotating mounting component and the second rotating mounting component, the first waveplate 31 and the second waveplate 41 can be rotated independently. During the rotation of the first waveplate 31 and the second waveplate 41, the influence on the optical power is very small, and there are no other components in the optical path that affect the optical path. This enables higher precision polarization degree measurement. At the same time, the rotatable first waveplate 31 and the second waveplate 41 can have more scrambling angles.
[0043] Reference Figure 5 The polarizer assembly 5 includes a third mounting base 52 for mounting the polarizer 51, and the structure of the third mounting base 52 is basically the same as that of the first mounting base 32. The third mounting base 52 has a third opening 521, and the polarizer 51 is mounted in the first opening 323 of the third mounting base 52.
[0044] Reference Figure 6 Preferably, the first mounting base 32, the second mounting base 42, and the third mounting base 52 are all provided with limiting grooves 7 in the direction near the base plate 11, and the length direction of the limiting grooves 7 is parallel to the length direction of the base plate 11. The side of the base plate 11 where the first mounting plate 321 is provided is provided with a limiting strip 8 along its own length direction, and the limiting strip 8 and the limiting groove 7 are inserted and matched, thereby ensuring that the first wave plate 31, the second wave plate 41, and the polarizer 51 are all located on the output light of the collimator 2.
[0045] The implementation principle of a high-precision polarization degree tester in this application embodiment is as follows: By setting a first wave plate 31 and a second wave plate 41 for rotational mounting, and minimizing their impact on optical power during rotation, higher precision polarization degree measurement is achieved; the collimator 2 converts the light beam emitted by the light source into a parallel light beam, ensuring that the propagation direction of the light beam remains consistent when passing through subsequent optical elements, further improving the accuracy of the measurement results; the limiting grooves 7 on the first mounting base 32, the second mounting base 42, and the third mounting base 52 are engaged with the limiting strips 8 on the base plate 11, ensuring that the first wave plate 31, the second wave plate 41, and the polarizer 51 are all located on the output light of the collimator 2, enhancing the stability and reliability of the system.
[0046] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.
Claims
1. A high-precision polarization degree tester, characterized in that: The device includes a base (1), on which a collimator (2), a first waveplate assembly (3), a second waveplate assembly (4), a polarizer assembly (5), and an optical power detector (6) are sequentially arranged. The first waveplate assembly (3) includes a first waveplate (31) that is rotatably mounted, the second waveplate assembly (4) includes a second waveplate (41) that is rotatably mounted, and the polarizer assembly (5) includes a polarizer (51) that is fixedly mounted. The detection ends of the first waveplate (31), the second waveplate (41), the polarizer (51), and the optical power detector (6) are all located on the straight line of the output light of the collimator (2).
2. The high-precision polarization degree tester according to claim 1, characterized in that: The first waveplate assembly (3) includes a first mounting base (32) mounted on the base (1) and a first rotation drive (33) mounted on the first mounting base (32). The first waveplate (31) is mounted on the output end of the first rotation drive (33). A first opening (323) is provided on the first mounting base (32), and the first waveplate (31) is rotatably disposed in the first opening (323).
3. The high-precision polarization degree tester according to claim 2, characterized in that: The first mounting base (32) is also provided with a slot, and the slot is connected to the first opening (323), and a first photoelectric switch (35) is installed in the slot.
4. A high-precision polarization degree tester according to claim 2, characterized in that: The first waveplate assembly (3) includes a second mounting base (42) mounted on the base (1) and a second rotation drive (43) mounted on the second mounting base (42). The second waveplate (41) is mounted on the output end of the second rotation drive (43). A second opening (421) is provided on the second mounting base (42), and the second waveplate (41) is rotatably disposed in the second opening (421).
5. A high-precision polarization degree tester according to claim 4, characterized in that: The second mounting base (42) is also provided with a slot, and the slot is connected to the second opening (421), and a second photoelectric switch (44) is installed in the slot.
6. A high-precision polarization degree tester according to claim 4, characterized in that: The polarizer assembly (5) further includes a third mounting base (52) mounted on the base (1), and the polarizer (51) is mounted on the third mounting base (52).
7. A high-precision polarization degree tester according to claim 6, characterized in that: A limiting strip (8) is provided on the base (1) along the direction of the light output from the collimator (2). The first mounting base (32), the second mounting base (42) and the third mounting base (52) are all provided with limiting grooves (7) that are inserted and cooperate with the limiting strip (8).
8. A high-precision polarization degree tester according to claim 4, characterized in that: The first rotation drive (33) is detachably mounted on the first mounting base (32), and the second rotation drive (43) is detachably mounted on the second mounting base (42).